CPV364M4K
PRELIMINARY
PD- 5.042
Short Circuit Rated UltraFast IGBT
IGBT SIP MODULE
Features
Description
3
6
71319
18
15
10 164
9
12
D1 D3 D5
D2 D4 D6
Q1
Q2
Q3
Q4
Q5
Q6
1
Output Current in a Typical 20 kHz Motor Drive
Product Summary
• Short Circuit Rated UltraFast: Optimized for high
operating frequencies >5.0 kHz , and Short Circuit
Rated to 10µs @ 125°C, VGE = 15V
• Fully isolated printed circuit board mount package
Switching-loss rating includes all "tail" losses
• HEXFREDTM soft ultrafast diodes
• Optimized for high operating frequency (over 5kHz)
See Fig. 1 for Current vs. Frequency curve
11 ARMS per phase (3.1 kW total) with TC = 90°C, TJ = 125°C, Supply Voltage 360Vdc,
Power Factor 0.8, Modulation Depth 115% (See Figure 1)
The IGBT technology is the key to International Rectifier's advanced line of
IMS (Insulated Metal Substrate) Power Modules. These modules are more
efficient than comparable bipolar transistor modules, while at the same time
having the simpler gate-drive requirements of the familiar power MOSFET.
This superior technology has now been coupled to a state of the art materials
system that maximizes power throughput with low thermal resistance. This
package is highly suited to motor drive applications and where space is at a
premium.
7/18/97
IMS-2
Absolute Maximum Ratings
Parameter Max. Units
VCES Collector-to-Emitter Voltage 600 V
IC @ TC = 25°C Continuous Collector Current 24
IC @ TC = 100°C Continuous Collector Current 13 A
ICM Pulsed Collector Current 48
ILM Clamped Inductive Load Current 48
tsc Short Circuit Withstand Time 9.3 µ s
VGE Gate-to-Emitter Voltage ±20 V
VISOL Isolation Voltage, any terminal to case, 1 min 2500 VRMS
PD @ TC = 25°C Maximum Power Dissipation, each IGBT 63 W
PD @ TC = 100°C Maximum Power Dissipation, each IGBT 25
TJOperating Junction and -55 to +150
TSTG Storage Temperature Range °C
Soldering Temperature, for 10 sec. 300 (0.063 in. (1.6mm) from case)
Mounting torque, 6-32 or M3 screw. 5-7 lbf•in ( 0.55-0.8 N•m)
Parameter Typ. Max. Units
RθJC (IGBT) Junction-to-Case, each IGBT, one IGBT in conduction ––– 2.0
RθJC (DIODE) Junction-to-Case, each diode, one diode in conduction ––– 3.0 °C/W
RθCS (MODULE) Case-to-Sink, flat, greased surface 0.10 –––
Wt Weight of module 20 (0.7) ––– g (oz)
Thermal Resistance
CPV364M4K
Parameter Min. Typ. Max. Units Conditions
V(BR)CES Collector-to-Emitter Breakdown Voltage600 ––– ––– V VGE = 0V, IC = 250µA
V(BR)CES/TJTemperature Coeff. of Breakdown Voltage –– 0.63 ––– V/°C VGE = 0V, IC = 1.0mA
VCE(on) Collector-to-Emitter Saturation Voltage ––– 1.80 2.3 IC = 13A VGE = 15V
––– 1.80 ––– V IC = 24A See Fig. 2, 5
––– 1.56 ––– IC = 13A, TJ = 150°C
VGE(th) Gate Threshold Voltage 3.0 ––– 6.0 VCE = VGE, IC = 250µA
VGE(th)/TJTemperature Coeff. of Threshold Voltage –– -13 –– mV/°C VCE = VGE, IC = 250µA
gfe Forward Transconductance 11 18 ––– S VCE = 100V, IC = 10A
ICES Zero Gate Voltage Collector Current –– ––– 250 µA VGE = 0V, V CE = 600V
––– ––– 3500 VGE = 0V, VCE = 600V, TJ = 150°C
VFM Diode Forward Voltage Drop ––– 1.3 1.7 V IC = 15A See Fig. 13
––– 1.2 1.6 IC = 15A, TJ = 150°C
IGES Gate-to-Emitter Leakage Current ––– ––– ±100 nA VGE = ±20V
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
QgTotal Gate Charge (turn-on) 11 0 1 70 IC = 13A
Qge Gate - Emitter Charge (turn-on) 14 21 nC V CC = 400V See Fig.8
Qgc Gate - Collector Charge (turn-on) 49 74 VGE = 15V
td(on) Turn-On Delay Time 50
trRise Time 3 0 TJ = 25°C
td(off) Turn-Off Delay Time 110 170 IC = 13A, VCC = 480V
tfFall Time 91 140 VGE = 15V, RG = 10
Eon Turn-On Switching Loss 0.56 Energy losses include "tail"
Eoff Turn-Off Switching Loss 0.28 mJ and diode reverse recovery
Ets Total Switching Loss 0.84 1.1 See Fig. 9,10, 18
tsc Short Circuit Withstand Time 10 µ s VCC = 360V, TJ = 125°C
VGE = 15V, RG = 10 , VCPK < 500V
td(on) Turn-On Delay Time 47 TJ = 150°C, See Fig. 11,18
trRise Time 3 0 IC = 13A, VCC = 480V
td(off) Turn-Off Delay Time 250 VGE = 15V, RG = 10
tfFall Time 150 Energy losses include "tail"
Ets Total Switching Loss 1.28 mJ and diode reverse recovery
LEInternal Emitter Inductance 7.5 nH Measured 5mm from package
Cies Input Capacitance 1600 VGE = 0V
Coes Output Capacitance 130 pF VCC = 30V See Fig. 7
Cres Reverse Transfer Capacitance 55 ƒ = 1.0MHz
trr Diode Reverse Recovery Time 42 60 ns T J = 25°C See Fig.
74 120 TJ = 125°C 14 IF = 15A
Irr Diode Peak Reverse Recovery Current 4.0 6.0 A TJ = 25°C See Fig.
6.5 10 TJ = 125°C 15 VR = 200V
Qrr Diode Reverse Recovery Charge 80 18 0 nC TJ = 25°C See Fig.
220 600 TJ = 125°C 16 di/dt = 200Aµs
di(rec)M/dt Diode Peak Rate of Fall of Recovery 188 A/µs TJ = 25°C See Fig.
During tb 160 TJ = 125°C 17
Switching Characteristics @ TJ = 25°C (unless otherwise specified)
ns
ns
CPV364M4K
0.1 1 10 100
0
2
4
6
8
10
12
14
16
18
f, Frequency (KHz)
LOAD CURRENT (A)
Fig. 1 - Typical Load Current vs. Frequency
(Load Current = IRMS of fundamental)
Tc = 90°C
Tj = 125°C
Power Factor = 0.8
M odulation D epth = 1.15
V cc = 50% of Rated Voltage
0.00
0.59
1.17
1.76
Total Output Power (kW)
3.51
5.27
2.34
2.93
4.10
4.68
Fig. 2 - Typical Output Characteristics Fig. 3 - Typical Transfer Characteristics
1
10
100
1 10
V , Collector-to-Emitter Voltage (V)
I , Collector-to-Emitter Current (A)
CE
C
V = 15V
20µs PULSE WIDTH
GE
T = 25 C
J°
T = 150 C
J°
1
10
100
5678910
V , Gate-to-Emitter Voltage (V)
I , Collector-to-Emitter Current (A)
GE
C
V = 50V
5µs PULSE WIDTH
CC
T = 25 C
J°
T = 150 C
J°
CPV364M4K
-60 -40 -20 0 20 40 60 80 100 120 140 160
1.0
2.0
3.0
4.0
T , Junction Temperature ( C)
V , Collector-to-Emitter Voltage(V)
J°
CE
V = 15V
80 us PULSE WIDTH
GE
I = A26
C
I = A13
C
I = A6.5
C
Fig. 4 - Maximum Collector Current vs.
Case Temperature
Fig. 6 - Maximum IGBT Effective Transient Thermal Impedance, Junction-to-Case
0
5
10
15
20
25
25 50 75 100 125 150
Maximu m DC Co ll e c tor Cu rren t (A)
T , C ase Te m peratu re (°C )
C
V = 15V
GE
A
0.01
0.1
1
10
0.00001 0.0001 0.001 0.01 0.1 1 10
t , Rec t a ngular Pu lse Du ration (s ec)
1
thJC
D = 0.50
0.01
0.02
0.05
0.10
0.20
SINGLE PULSE
(T HERMAL RESPONSE)
Therm al R espon se (Z )
P
t2
1
t
DM
Notes :
1. D uty fac tor D = t / t
2. P ea k T = P x Z + T
12
JDM thJC C
Fig. 5 - Typical Collector-to-Emitter Voltage
vs. Junction Temperature
CPV364M4K
Fig. 7 - Typical Capacitance vs.
Collector-to-Emitter Voltage Fig. 8 - Typical Gate Charge vs.
Gate-to-Emitter Voltage
Fig. 9 - Typical Switching Losses vs. Gate
Resistance Fig. 10 - Typical Switching Losses vs.
Junction Temperature
010 20 30 40 50
0.5
1.0
1.5
R , Gate Resistance (Ohm)
Total Switching Losses (mJ)
G
V = 480V
V = 15V
T = 25 C
I = 13A
CC
GE
J
C
°
RG , Gate Resistance ( Ω ) -60 -40 -20 0 20 40 60 80 100 120 140 160
0.1
1
10
T , Junction Temperature ( C )
Total Switching Losses (mJ)
J°
R = Ohm
V = 15V
V = 480V
G
GE
CC I = A
26
C
I = A
13
C
I = A
6.5
C
10
020 40 60 80 100 120
0
4
8
12
16
20
Q , Total Gate Charge (nC)
V , Gate-to-Emitter Voltage (V)
G
GE
V= 400V
I = 13A
CC
C
1 10 100
0
500
1000
1500
2000
2500
3000
V , Collector-to-Emitter Voltage (V)
C, Capacitance (pF)
CE
V
C
C
C
=
=
=
=
0V,
C
C
C
f = 1MHz
+ C
+ C
C SHORTED
GE
ies ge gc , ce
res gc
oes ce gc
Cies
Coes
Cres
CPV364M4K
Fig. 11 - Typical Switching Losses vs.
Collector-to-Emitter Current Fig. 12 - Turn-Off SOA
Fig. 13 - Maximum Forward Voltage Drop vs. Instantaneous Forward Current
1
10
100
0.8 1.2 1.6 2.0 2.4
FM
F
Instantan eous Forw ard C urrent - I (A)
F orwa rd V olta ge Drop - V (V)
T = 150°C
T = 125°C
T = 25 ° C
J
J
J
1
10
100
1000
1 10 100 1000
C
CE
I , Co llec to r-to - Emitte r Curre n t ( A )
SAF E OPERATING AREA
V = 20V
T = 125°C
GE
J
V , Co ll e c to r-to-Emitte r Vo lta g e (V)
A
0 5 10 15 20 25 30
0.0
1.0
2.0
3.0
4.0
I , Collector-to-emitter Current (A)
Total Switching Losses (mJ)
C
R = Ohm
T = 150 C
V = 480V
V = 15V
G
J
CC
GE
°
10
CPV364M4K
Fig. 14 - Typical Reverse Recovery vs. dif/dt Fig. 15 - Typical Recovery Current vs. dif/dt
Fig. 16 - Typical Stored Charge vs. dif/dt Fig. 17 - Typical di(rec)M/dt vs. di f/dt
100
1000
100 1000
f
di /d t - (A s )
d i(rec )M/d t - (A/ µ s )
I = 5.0A
I = 15A
I = 30A
F
F
F
V = 200V
T = 125°C
T = 25°C
R
J
J
0
200
400
600
800
100 1000
f
d i /dt - ( A s)
RR
Q - ( n C )
I = 30A
I = 15 A
I = 5.0A
F
F
F
V = 200V
T = 12C
T = 25°C
R
J
J
1
10
100
100 1000
f
d i /d t - (A/ µ s )
I - ( A )
IRRM
I = 5.0 A
I = 15A
I = 30 A
F
F
F
V = 200V
T = 125°C
T = 25°C
R
J
J
20
40
60
80
100
100 1000
f
di /dt - (A/µs)
t - (ns)
rr
I = 30A
I = 15A
I = 5.0A
F
F
F
V = 200V
T = 125°C
T = 25°C
R
J
J
CPV364M4K
t1
Ic
Vce
t1 t2
90% Ic
10 % Vc e
td(off) tf
Ic 5% Ic
t1+5µS
Vce ic dt
90% Vge
+Vge
E off =
Fig. 18b - Test Waveforms for Circuit of Fig. 18a, Defining
Eoff, td(off), tf
Vce ie dt
t2
t1
5% Vc e
Ic
Ipk
Vcc 10% Ic
Vce
t1 t2
DUT VOLTAGE
AND CURRENT
G ATE VO LTAGE D .U.T.
+Vg
10% +Vg
90% Ic
trtd(on)
DIODE REVERSE
RECOVERY ENERGY
tx
E on =
Er ec = t4
t3
Vd id dt
t4
t3
DIODE RE COV ERY
WAVEFORMS
Ic
Vpk
10% Vcc
Irr
10 % Ir r Vcc
trr
Q rr = trr
tx
id d t
Same type
device as
D.U.T.
D.U.T.
430µF
80%
of Vce
Fig. 18a - Test Circuit for Measurement of
ILM, Eon, Eoff(diode), trr, Qrr, Irr, td(on), tr, td(off), tf
Fig. 18c - Test Waveforms for Circuit of Fig. 18a,
Defining Eon, td(on), tr
Fig. 18d - Test Waveforms for Circuit of Fig. 18a,
Defining Erec, trr, Qrr, Irr
CPV364M4K
Vg GATE SIGN AL
DE VICE UNDER TE ST
CURRENT D.U.T.
VO L T A G E IN D .U.T .
CURRENT IN D1
t0 t1 t2
D.U.T.
V *
c
50V
L
1000V
6000µF
100 V
Figure 19. Clamped Inductive Load Test
Circuit
Figure 20. Pulsed Collector Current
Test Circuit
RL=480V
4 X IC @25°C
0 - 480V
Figure 18e. Macro Waveforms for Figure 18a's Test Circuit
CPV364M4K
Case Outline  IMS-2
Notes:
Repetitive rating: VGE=20V; pulse width limited by maximum junction temperature (figure 20)
VCC=80%(VCES), VGE=20V, L=10µH, RG = 10(Figure 19)
Pulse width 80µs; duty factor 0.1%.
Pulse width 5.0µs, single shot.
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371
http://www.irf.com/ Data and specifications subject to change without notice. 7/97
Dimens ions in Millimeters and (Inc hes)
IMS-2 Package Outline (13 Pins)
7.87 ( .310)
5.46 (.215)
1.27 (.050)
6.10 (.240)
3.05 ± 0.38
(.120 ± .015)
0.51 (.020)
0.38 (.015)
62.43 (2.458)
53.85 (2.120)
3.91 (.154)
2X
21.97 (.865)
3.94 (.155)
4.06 ± 0.51
(.160 ± .020)
5.08 (.200)
6X
1.27 (.050)
13X
2.54 ( .100)
6X 0.76 ( .030)
13X
1 2 3 4 5 6 7 8 9 10 1 1 1 2 13 14 1 5 1 6 17 18 19
NOTES:
1. Tolerance unless otherwise
specified ± 0.254 (.010).
2. Controlling Dimension: Inch.
3. Dimensions are shown in
Millimeter (Inches).
4. Terminal numbers are shown
for reference only.