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Product Description
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.
InP HBT
LDMOS
RF MEMS
SDA-2000
GaAs DISTRIBUTED AMPLIFIER
RFMD’s SDA-2000 is a directly coupled (DC) GaAs microwave monolithic
integrated circuit (MMIC) distributed driver amplifier die designed to sup-
port a wide array of high frequency commercial, military, and space appli-
cations. They are ideal for wideband amplifier gain blocks, modulators,
clock drivers, broadband automated test equipment (ATE), military, and
aerospace applications.
1
2
34
5
6
7
RFIN
RFOUT
VG2
VTI
VTO
VG21
VCAS
DC to 22GHz Operation
Output Voltage to 8VPP
Gain=12dB Typical
Noise Figure=5.5 dB Typical
410 mA Total Current
Applications
Drive for Single-Ended (SE) MZM
NRZ, DPSK, ODB, RZ
Clock Driver for RZ and CS Pulse
Carver
Broadband ATE
Military
Aerospace
DS110126
Die: 3.1mmx1.45mmx0.102mm
SDA-2000
GaAs Distrib -
uted Amplifier
Parameter Specification Unit Condition
Min. Typ. Max.
Electrical Specifications TA=+25°C, VDD= +8V, VG2= +3.5VDC,
IDD=410mA*
Operating Frequency DC 22 GHz 3dB BW
Gain 12 dB 10GHz
Output Voltage 8 VP-P
OIP3 at Mid-Band 38 dBm 10GHz
P1dB at Mid- Band 24 dBm 10GHz
Noise Figure at Mid-Band 6.0 dB 10GHz
Input Return Loss 20 dB
Output Return Loss 17.5
Supply Current 410 mA
Supply Voltage 8.0 VDC
*Adjust VTI between -2.0VDC to 0VDC to achieve IDD=410mA typical.
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7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.
SDA-2000
Typical Electrical Performance
(See section at the end of the data sheet for measurement comments)
Data Set for VDD =5.0V, VG2=2.2V
Absolute Maximum Ratings
Parameter Rating Unit
Drain Bias Voltage (VDD)+9.0V
DC
Gate Bias Voltage (VTI) -2 to +1 VDC
Gate Bias Voltage (VG2)(V
DD- 8.0) to VDD VDC
RF Input Power (VDD=+7.0VDC)dBm
Operating Junction Temperature (TJ)+175 °C
Continuous Power Dissipation
(T=+85°C) 5W
Thermal Resistance (Pad to Die Bot-
tom) 17 °C/W
Storage Temperature -40 to +150 °C
Operating Temperature -40 to +85 °C
ESD JESD22-A114 Human Body
Model (HBM) Class 0 (All Pads)
Caution! ESD sensitive device.
Exceeding any one or a combination of the Absolute Maximum Rating conditions may
cause permanent damage to the device. Extended application of Absolute Maximum
Rating conditions to the device may reduce device reliability. Specified typical perfor-
mance or functional operation of the device under Absolute Maximum Rating condi-
tions is not implied.
RoHS status based on EUDirective2002/95/EC (at time of this document revision).
The information in this publication is believed to be accurate and reliable. However, no
responsibility is assumed by RF Micro Devices, Inc. ("RFMD") for its use, nor for any
infringement of patents, or other rights of third parties, resulting from its use. No
license is granted by implication or otherwise under any patent or patent rights of
RFMD. RFMD reserves the right to change component circuitry, recommended appli-
cation circuitry and specifications at any time without prior notice.
S11 versus Frequency
-50
-45
-40
-35
-30
-25
-20
-15
-10
-5
0
02468101214161820222426
Fr e q ue ncy ( GHz)
S11 (dB)
-40C
25C
85C
0
2
4
6
8
10
12
14
16
0 2 4 6 8 10121416 1820 2224 26
Fr e q ue ncy ( GHz )
S21 (dB)
-40C
25C
85C
S12 versus Frequency
-80
-70
-60
-50
-40
-30
-20
-10
0
0 2 4 6 8 101214161820222426
Frequency (GHz)
S12 (dB)
-40C
25C
85C
S22 versus Frequency
-40
-35
-30
-25
-20
-15
-10
-5
0
0 2 4 6 8 101214161820222426
Frequency (GHz)
S22 dB
-40C
25C
85C
3 of 8DS110126
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.
SDA-2000
P1dB versus Frequency
0
5
10
15
20
25
30
0 2 4 6 8 1012141618202224
Frequency (GHz)
P1dB (dB)
25C
-40 C
85C
OIP3 vs Frequency
@ Pout = 5 dBm/tone (1.3 MHz tone spacing)
0
5
10
15
20
25
30
35
40
45
50
024681012141618202224
Frequency (GHz)
IP3 (dBm)
25c
-40c
85c
NF verses Frequency
0
2
4
6
8
10
12
14
16
024681012141618202224
Frequency (GHz)
NF (dB)
25C
-40c
85C
4 of 8 DS110126
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical
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SDA-2000
Die Drawing
1. All dimensions in microns
2. No connection required for unlabeled bond pads
3. Die thickness is 0.102mm (4 MIL)
4. Typical bond pad is 0.100mm square
5. Backside metallization: gold
6. Backside metal is ground
7. Bond pad metallization: gold
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SDA-2000
Bias Sequence (turn device on):
VTI - Apply negative -2.0 volts. (This shuts the device off.)
VG2 - Apply positive 3.5 volts.
VDD - Apply positive 8.0 volts to the RF output bias tee.
Important - Adjust VTI between -2 to +1.0 volts to achieve IDD=410mA nominal.
Bias Sequence (turn device off):
VTI - Return to negative -2.0 volts.
VDD - Remove positive 8.0 volts to the RF output bias tee.
VG2 - Remove positive 3.5 volts.
Pin Function Description Interface Schematic
1RFIN
RF Input. This pad is DC coupled and matched to 50 from DC to 22GHz. 50
microstrip transmission line on 0.127mm (5mil) thick alumina thin film sub-
strate is recommended for RF input and output. A DC blocking capacitor is
required for this connection. The calue of this capacitor will be based on the
desired frequency range of application.
2VG2
Each amplifier stage in the SDA-2OOO is a cascade configuration. The gate of
each upper FET in the cascade amplifiers is biased with the 3.5VDC (for
VDD=8V). The DC connection for the upper device gates runs across the length
of the die. Pads 2 and 5 are both on this DC connection but are on opposite ends
of the die. The VG2 connection can therefore be placed on either pad. A bypass
capacitor is recommended on both ends, pads 2 and 5.
3VTO
The output drain termination pad. This pad requires a 1000pF bypass capacitor
with the shortest wirebond length to prevent low frequency gain ripple.
4RFOUT and
VDD
RF Output. 50 microstrip transmission line on 0.127mm (5mil) thick alumina
thin film substrate is recommended for RF input and output. Connect the DC bias
(VDD) network to provide drain current (IDD).
Note: Drain Bias (VDD) must be applied through a broadband bias tee or external
bias network.
5VCAS
Each amplifier stage in the SDA-2OOO is a cascade configuration. The gate of
each upper FET in the cascade amplifiers is biased with the 3.5VDC (for
VDD=8V). The DC connection for the upper device gates runs across the length
of the die. Pads 2 and 5 are both on this DC connection but are on opposite ends
of the die. The VG2 connection can therefore be placed on either pad. A bypass
capacitor is recommended on both ends, pads 2 and 5.
6VG21
Not connected.
7VTI
Input gate voltage for the lower devices in the cascade amplifier. This pad also
serves as the RF ground for the input termination resistor. The DC voltage
applied to this pad will be between -2.0VDC (device is pinched OFF) to 0VDC (fully
ON). The value of this capacitor will effect the low frequency response of the
amplifier.
Die GND Ground connection. Connect die bottom directly to ground plane for best perfor-
mance. NOTE: The die should be connected directly to the ground plane with con-
ductive epoxy.
RFIN
1000 pF
1000 pF
1000 pF
RFOUT
RFOUT
VDD
Note: Drain Bias (VDD) must be applied
through a broadband bias tee or
external bias network
1000 pF
1000 pF
6 of 8 DS110126
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.
SDA-2000
Assembly Diagram
Application Circuit Schematic
SDA-2000 Product Image
1
RFIN
2
VG2
1000pF
3
1000pF
4RFOUT
VDD
NOTE
NOTE: Drain Bias (Vdd) must be applied through a broadband bias tee or
external bias network.
5
1000pF
6
7
1000pF
VTO
VTI
VG2 (optional)
7 of 8DS110126
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.
SDA-2000
8 of 8 DS110126
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.
SDA-2000
Measurement Technique
All data presented in this document represents the integrated circuit and accompanying bond wires.
All performance data reported in this document were measured in the following manner. Data was taken using a temperature
controlled probe station utilizing 150μm pitch GSG probes. The interface between the probes and integrated circuit was made
with a coplanar to microstrip ceramic test interface. The test interface was wire bonded to the die using 1mil diameter bond-
wires. The spacing between the test interface and the die was 200μm, and the bond wire loop height was 100μm. The calibra-
tion of the test fixture included the probes and test interfaces, so that the measurement reference plane was at the point of
bond wire attachment to the ceramic interface.
Ordering Information
Part Number Description Delivery Method Die/GelPak
SDA-2000 GaAs Distributed Amplifier, 22GHz GelPak 10 or more
SDA-2000SB Sample Bag, GaAs Distributed Amplifier, 22GHz GelPak 2