6N138,6N139
2014-09-01
1
TOSHIBA Photocoupler GaAAs Ired & Photo IC
6N138, 6N139
Current Loop Driver
Low Input Current Line Receiver
CMOS Logic Interface
The TOSHIBA 6N138 and 6N139 consists of a GaAAs infrared emitting
diode coupled with a split-Darlington output configuration.
A high speed GaAAs Ired manufactured with an unique LPE junction, has
the virtue of fast rise and fall time at low drive current.
Isolation voltage: 2500 Vrms (min)
Current transfer ratio
: 6N138 300% (min) (IF=1.6mA)
: 6N139 400% (min) (IF=0.5mA)
Switching time: 6N138 tPHL = 10μs (max)
tPLH = 35μs (max)
6N139 tPHL = 1μs (max)
tPLH = 7μs (max)
UL recognized: UL1577, file no. E67349
Pin Configuration (top view)
Schematic
Unit: mm
TOSHIBA 1110C4
Weight: 0.54 g (typ.)
1 : N.C.
2 : Anode
3 : C athode
4 : N.C.
5 : Gnd
6 : O utput
7 : O utput Base
8 : VCC
1
4
3
2
8
7
6
5
8
VCC
VO
7 GND
ICC
IB
IO
+
IF
VF
2
3
6
5
VB
-
Start of commercial production
1988/02
6N138,6N139
2014-09-01
2
Absolute Maximum Ratings (*) (Ta = 0°C to + 70°C)
Characteristic Symbol Rating Unit
LED
Forward current (Note 1) IF 20 mA
Pulse forward current IFP(*1)
40 mA
Total pulse forward current IFP(*2)
1 A
Reverse voltage VR 5 V
Diode power dissipation (Note 2) PD 35 mW
Detector
Output current (Note 3) IO 60 mA
Emitterbase reverse voltage VEB 0.5 V
Supply voltage VCC(*3)
0.5 to 18 V
Output voltage VO(*3)
0.5 to 18 V
Output power dissipation (Note 4) PO 100 mW
Operating temperature range Topr 0 to 70 °C
Storage temperature range Tstg 55 to 125 °C
Lead solder temperature (10s) (*4) T
sol 260 °C
Isolation voltage (1minute, R.H. 60%) BVS(**)
2500 Vrms
3540 Vdc
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc.).
(*) JEDEC registered data
(**) Not registered JEDEC
(*1) 50% duty cycle, 1ms pulse width
(*2) Pulse width 1μs, 300pps
(*3) 6N138 0.5 to 7V
(*4) 1.6mm below seating plane
6N138,6N139
2014-09-01
3
Electrical Characteristics
Over Recommended Temperature (Ta = 0°C to 70°C, unless otherwise noted)
Characteristic Symbol Test Condition Min (*5)Typ. Max Unit
Current transfer
ratio (Note 5, 6)
6N139
CTR(*)
IF=0.5mA, VO=0.4V
VCC=4.5V 400 800
%
IF=1.6mA, VO=0.4V
VCC=4.5V
500 900
6N138 300 600
Logic low output
voltage (Note 6)
6N139
VOL
IF=1.6mA, IO=6.4mA
VCC=4.5V 0.1 0.4
V
IF=5mA, IO=15mA
VCC=4.5V 0.1 0.4
IF=12mA, IO=24mA
VCC=4.5V 0.2 0.4
6N138 IF=1.6mA, IO=4.8mA
VCC=4.5V 0.1 0.4
Logic high output
current (Note 6)
6N139
IOH(*)
IF=0mA, VO=VCC=18V 0.05 100
μA
6N138 IF=0mA, VO=VCC=7V 0.05 250
Logic low supply current
(Note 6)
ICCL IF=1.6mA, VO=Open
VCC=5V 0.2 mA
Logic high supply current
(Note 6)
ICCH I
F=0mA, VO=Open, VCC=5V 10 nA
Input forward voltage VF(*) IF=1.6mA, Ta=25°C 1.65 1.7 V
Input reverse breakdown voltage BVR(*) IR=10μA, Ta=25°C 5 V
Temperature coefficient of forward voltage VF / Ta IF=1.6mA 1.9 mV / °C
Input capacitance CIN f=1MHz, VF=0 60 pF
Resistance (inputoutput) RIO VIO=500V (Note 7),
R.H. 60% 1012
Capacitance (inputoutput) CIO f=1MHz (Note 7) 0.6 pF
(**) JEDEC registered data.
(*5) All typical values are at Ta=25°C and VCC=5V, unless otherwise noted.
6N138,6N139
2014-09-01
4
Switching Specifications (Ta=25°C, VCC=5V, unless otherwise specified)
Characteristic Symbol
Test
Circuit Test Condition Min Typ. Max Unit
Propagation delay
time to logic low
at output (Note 6, 8)
6N139
tpHL(*) 1
IF=0.5mA, RL=4.7k 5 25
μs
IF=12mA, RL=270 0.2 1
6N138 IF=1.6mA, RL=2.2k 1 10
Propagation delay
time to logic high
at output (Note 6, 8)
6N139
tpLH(*) 1
IF=0.5mA, RL=4.7k 5 60
μs
IF=12mA, RL=270 1 7
6N138 IF=1.6mA, RL=2.2k 4 35
Common mode transient
immunity at logic high
level output (Note 9)
CMH 2
IF=0mA, RL=2.2k
VCM=400Vpp 500 V / μs
Common mode transient
immunity at logic low
level output (Note 9)
CML 2
IF=1.6mA
RL=2.2k
VCM=400Vpp
500 V / μs
(*)JEDEC registered data.
(Note 1): Derate linearly above 50°C freeair temperature at a rate of 0.4mA / °C
(Note 2): Derate linearly above 50°C freeair temperature at a rate of 0.7mW / °C
(Note 3): Derate linearly above 25°C freeair temperature at a rate of 0.7mA / °C
(Note 4): Derate linearly above 25°C freeair temperature at a rate of 2.0mW / °C
(Note 5): DC CURRENT TRANSFER RATIO is defined as the ratio of output collector current, IO, to the forward
LED input current, IF, times 100%.
(Note 6): Pin 7 open.
(Note 7): Device considered a twoterminal device: Pins 1, 2, 3, and 4 shorted together and Pins 5, 6, 7 and 8
shorted together.
(Note 8): Use of a resistor between pin 5 and 7 will decrease gain and delay time.
(Note 9): Common mode transient immunity in logic high level is the maximum tolerable (positive) dVCM / dt on
the leading edge of the common mode pulse, VCM, to assure that the output will remain in a logic high
state (i.e. VO > 2.0V).
Common mode transient immunity in Logic Low level is the maximum tolerable (negative) dVCM / dt on
the trailing edge of the common mode pulse signal, VCM, to assure that the output will remain in a logic
low state (i.e. VO < 0.8V).
6N138,6N139
2014-09-01
5
Test Circuit 1.
(*)CL is approximately 15pF which includes probe
and stray wiring capacitance.
Test Circuit 2.
4
+5V
VO
CL (*)
RL
IF
IF
0
VO
VOL
1.5V 1.5V
5V
t
r
tpHL
100Ω
10% Duty cycle
1 / f < 100
μ
s
IFMonito
r
F
7
6
5
1
2
3
8
Pulse gen.
Zo = 50Ω
tf= 5ns
5V
VO 10%
90%
90%
10%
tf
(Saturated
Res
p
onse
)
(Non-
Saturated
Res
p
onse
)
tpLH
VOL
VO
Switch at B: IF = 1.6mA
5V
VO
VCM
0V
tr, tf = 0.64μs
400V
tf
90%
10%
tr
Switch at A: IF = 0mA
A
VFF
IF
Pulse gen
B4
+5V
VO
RCC
RL
7
6
5
1
2
3
8
+
VCM
6N138,6N139
2014-09-01
6
RESTRICTIONS ON PRODUCT USE
Toshiba Corporation, and its subsidiaries and affiliates (collectively "TOSHIBA"), reserve the right to make changes to the information
in this document, and related hardware, software and systems (collectively "Product") without notice.
This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with
TOSHIBA's written permission, reproduction is permissible only if reproduction is without alteration/omission.
Though TOSHIBA works continually to improve Product's quality and reliability, Product can malfunction or fail. Customers are
responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and
systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily
injury or damage to property, including data loss or corruption. Before customers use the Product, create designs including the Product,
or incorporate the Product into their own applications, customers must also refer to and comply with (a) the latest versions of all
relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes for
Product and the precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for
the application with which the Product will be used with or for. Customers are solely responsible for all aspects of their own product
design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such design or
applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts, diagrams,
programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating parameters for
such designs and applications. TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS' PRODUCT DESIGN OR APPLICATIONS.
PRODUCT IS NEITHER INTENDED NOR WARRANTED FOR USE IN EQUIPMENTS OR SYSTEMS THAT REQUIRE
EXTRAORDINARILY HIGH LEVELS OF QUALITY AND/OR RELIABILITY, AND/OR A MALFUNCTION OR FAILURE OF WHICH
MAY CAUSE LOSS OF HUMAN LIFE, BODILY INJURY, SERIOUS PROPERTY DAMAGE AND/OR SERIOUS PUBLIC IMPACT
("UNINTENDED USE"). Except for specific applications as expressly stated in this document, Unintended Use includes, without
limitation, equipment used in nuclear facilities, equipment used in the aerospace industry, medical equipment, equipment used for
automobiles, trains, ships and other transportation, traffic signaling equipment, equipment used to control combustions or explosions,
safety devices, elevators and escalators, devices related to electric power, and equipment used in finance-related fields. IF YOU USE
PRODUCT FOR UNINTENDED USE, TOSHIBA ASSUMES NO LIABILITY FOR PRODUCT. For details, please contact your
TOSHIBA sales representative.
Do not disassemble, analyze, reverse-engineer, alter, modify, translate or copy Product, whether in whole or in part.
Product shall not be used for or incorporated into any products or systems whose manufacture, use, or sale is prohibited under any
applicable laws or regulations.
The information contained herein is presented only as guidance for Product use. No responsibility is assumed by TOSHIBA for any
infringement of patents or any other intellectual property rights of third parties that may result from the use of Product. No license to
any intellectual property right is granted by this document, whether express or implied, by estoppel or otherwise.
ABSENT A WRITTEN SIGNED AGREEMENT, EXCEPT AS PROVIDED IN THE RELEVANT TERMS AND CONDITIONS OF SALE
FOR PRODUCT, AND TO THE MAXIMUM EXTENT ALLOWABLE BY LAW, TOSHIBA (1) ASSUMES NO LIABILITY
WHATSOEVER, INCLUDING WITHOUT LIMITATION, INDIRECT, CONSEQUENTIAL, SPECIAL, OR INCIDENTAL DAMAGES OR
LOSS, INCLUDING WITHOUT LIMITATION, LOSS OF PROFITS, LOSS OF OPPORTUNITIES, BUSINESS INTERRUPTION AND
LOSS OF DATA, AND (2) DISCLAIMS ANY AND ALL EXPRESS OR IMPLIED WARRANTIES AND CONDITIONS RELATED TO
SALE, USE OF PRODUCT, OR INFORMATION, INCLUDING WARRANTIES OR CONDITIONS OF MERCHANTABILITY, FITNESS
FOR A PARTICULAR PURPOSE, ACCURACY OF INFORMATION, OR NONINFRINGEMENT.
GaAs (Gallium Arsenide) is used in Product. GaAs is harmful to humans if consumed or absorbed, whether in the form of dust or vapor.
Handle with care and do not break, cut, crush, grind, dissolve chemically or otherwise expose GaAs in Product.
Do not use or otherwise make available Product or related software or technology for any military purposes, including without limitation,
for the design, development, use, stockpiling or manufacturing of nuclear, chemical, or biological weapons or missile technology
products (mass destruction weapons). Product and related software and technology may be controlled under the applicable export
laws and regulations including, without limitation, the Japanese Foreign Exchange and Foreign Trade Law and the U.S. Export
Administration Regulations. Export and re-export of Product or related software or technology are strictly prohibited except in
compliance with all applicable export laws and regulations.
Please contact your TOSHIBA sales representative for details as to environmental matters such as the RoHS compatibility of Product.
Please use Product in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances,
including without limitation, the EU RoHS Directive. TOSHIBA ASSUMES NO LIABILITY FOR DAMAGES OR LOSSES
OCCURRING AS A RESULT OF NONCOMPLIANCE WITH APPLICABLE LAWS AND REGULATIONS.