Notes:
1. Functional tests are conducted in accordance with MIL-STD-883 with the following input test conditions: VIH = VIH(min) + 20%, - 0%; VIL = VIL(max) + 0%, - 50%,
as specified herein, for TTL, CMOS, or Schmitt compatible inputs. Devices may be tested using any input voltage within the above specified range, but are guaranteed
to VIH(min) and VIL(max).
2. Supplied as a design limit but not guaranteed or tested.
3. Per MIL-PRF-38535, for current density 5.0E5 amps/cm2, the maximum product of load capacitance (per output buffer) times frequency should not exceed 3,765
pF/MHz.
4. Not more than one output may be shorted at a time for maximum duration of one second.
5. Capacitance measured for initial qualification and when design changes may affect the value. Capacitance is measured between the designated terminal and VSS at a
frequency of 1MHz and a signal amplitude of 50mV rms maximum.
6. Maximum allowable relative shift equals 50mV.
7. All specifications valid for the maximum radiation dose available for the respective device types.
8. Power dissipation specified per switching output.
9. Guaranteed by characterization, but not tested.
IOH29High level output current VIN = VDD or VSS
VOH = VDD-0.4V
VDD from 3.0V to 3.6V
-6 mA
Ptotal1 Power dissipation 2, 8 CL = 50pF
VDD = 4.5V to 5.5V
1.3 mW/
MHZ
Ptotal2 Power dissipation 2, 8 CL = 50pF
VDD = 3.0V to 3.6V
0.75 mW/
MHZ
IDDQ Quiescent Supply Current VIN = VDD or VSS
VDD from 3.0V to 5.5V
10 A
IDDQ Quiescent Supply Current
Delta
For input under test
VIN = VDD -2.1V
For all other inputs
VIN = VDD or VSS
VDD = 5.5V
1.6 mA
CIN Input capacitance 5 = 1MHz, VDD = 0V 15 pF
COUT Output capacitance 5 = 1MHz, VDD = 0V 15 pF