Pseudo Differential Input, 1 MSPS,
10-/12-Bit ADCs in an 8-Lead SOT-23
AD7441/AD7451
Rev. D
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700 www.analog.com
Fax: 781.461.3113 ©2003–2010 Analog Devices, Inc. All rights reserved.
FEATURES
Fast throughput rate: 1 MSPS
Specified for VDD of 2.7 V to 5.25 V
Low power at maximum throughput rate:
4 mW maximum at 1 MSPS with VDD = 3 V
9.25 mW maximum at 1 MSPS with VDD = 5 V
Pseudo differential analog input
Wide input bandwidth:
70 dB SINAD at 100 kHz input frequency
Flexible power/serial clock speed management
No pipeline delays
High speed serial interface:
SPI®-/QSPI™-/MICROWIRE™-/DSP-compatible
Power-down mode: 1 μA maximum
8-lead SOT-23 and MSOP packages
APPLICATIONS
Transducer interface
Battery-powered systems
Data acquisition systems
Portable instrumentation
FUNCTIONAL BLOCK DIAGRAM
V
REF
T/H
CONTROL LOGIC
12-BIT
SUCCESSIVE
APPROXIMATION
ADC
GND
SCLK
SDATA
CS
V
DD
AD7441/AD7451
V
IN+
V
IN–
03153-001
Figure 1.
GENERAL DESCRIPTION
The AD7441/AD74511 are, respectively, 10-/12-bit high speed,
low power, single-supply, successive approximation (SAR),
analog-to-digital converters (ADCs) that feature a pseudo
differential analog input. These parts operate from a single
2.7 V to 5.25 V power supply and achieve very low power
dissipation at high throughput rates of up to 1 MSPS.
The AD7441/AD7451 contain a low noise, wide bandwidth,
differential track-and-hold (T/H) amplifier that handles input
frequencies up to 3.5 MHz. The reference voltage for these
devices is applied externally to the VREF pin and can range from
100 mV to VDD, depending on the power supply and what suits
the application.
The conversion process and data acquisition are controlled
using CS and the serial clock, allowing the device to interface
with microprocessors or DSPs. The input signals are sampled
on the falling edge of CS when the conversion is initiated.
The SAR architecture of these parts ensures that there are no
pipeline delays.
1 Protected by U.S. Patent Number 6,681,332.
PRODUCT HIGHLIGHTS
1. Operation with 2.7 V to 5.25 V Power Supplies.
2. High Throughput with Low Power Consumption.
With a 3 V supply, the AD7441/AD7451 offer 4 mW maxi-
mum power consumption for a 1 MSPS throughput rate.
3. Pseudo Differential Analog Input.
4. Flexible Power/Serial Clock Speed Management.
The conversion rate is determined by the serial clock,
allowing the power to be reduced as the conversion time
is reduced through the serial clock speed increase. These
parts also feature a shutdown mode to maximize power
efficiency at lower throughput rates.
5. Variable Voltage Reference Input.
6. No Pipeline Delays.
7. Accurate Control of Sampling Instant via CS Input and
Once-Off Conversion Control.
8. ENOB > 10 Bits Typically with 500 mV Reference.
AD7441/AD7451
Rev. D | Page 2 of 24
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications ....................................................................................... 1
Functional Block Diagram .............................................................. 1
General Description ......................................................................... 1
Product Highlights ........................................................................... 1
Revision History ............................................................................... 2
Specifications ..................................................................................... 3
Timing Specifications .................................................................. 7
Timing Diagrams .......................................................................... 7
Absolute Maximum Ratings ............................................................ 8
ESD Caution .................................................................................. 8
Pin Configurations and Function Descriptions ........................... 9
Typical Performance Characteristics ........................................... 10
Terminology .................................................................................... 12
Theory of Operation ...................................................................... 13
Circuit Information .................................................................... 13
Converter Operation .................................................................. 13
ADC Transfer Function ............................................................. 13
Typical Connection Diagram ................................................... 14
Analog Input ............................................................................... 14
Analog Input Structure .............................................................. 14
Digital Inputs .............................................................................. 15
Reference ..................................................................................... 15
Serial Interface ............................................................................ 16
Modes of Operation ....................................................................... 18
Normal Mode .............................................................................. 18
Power-Down Mode .................................................................... 18
Power vs. Throughput Rate ....................................................... 20
Microprocessor and DSP Interfacing ...................................... 20
Grounding and Layout Hints .................................................... 22
Evaluating Performance ............................................................ 22
Outline Dimensions ....................................................................... 23
Ordering Guide .......................................................................... 24
REVISION HISTORY
3/10—Rev. C to Rev. D
Changes to IDD Normal Mode (Operational) Parameter .................. 6
Updated Outline Dimensions ............................................................ 23
Changes to Ordering Guide ............................................................... 24
3/07—Rev. B to Rev. C
Changes to Table 5 ................................................................................. 9
Updated Layout .................................................................................... 12
Changes to Terminology Section....................................................... 12
Updated Outline Dimensions ............................................................ 23
Changes to Ordering Guide ............................................................... 24
2/05—Rev. A to Rev. B
Changes to Ordering Guide ............................................................... 24
2/04—Rev. 0 to Rev. A
Updated Format ..................................................................... Universal
Changes to General Description ....................................................... 1
Changes to Table 1 Footnotes ............................................................ 4
Changes to Table 2 Footnotes ............................................................ 6
Changes to Table 3 Footnotes ............................................................ 7
Changes to Table 5 .............................................................................. 9
Updated Figures 7, 8, and 9 .............................................................. 13
Changes to Figure 23 ......................................................................... 16
Changes to Reference Section .......................................................... 17
9/03—Revision 0: Initial Version
AD7441/AD7451
Rev. D | Page 3 of 24
SPECIFICATIONS
VDD = 2.7 V to 5.25 V; fSCLK = 18 MHz; fS = 1 MSPS; VREF = 2.5 V; TA = TMIN to TMAX, unless otherwise noted. Temperature ranges for A, B
versions: −40°C to +85°C.
Table 1. AD7451
Parameter Test Conditions/Comments A Version B Version Unit
DYNAMIC PERFORMANCE fIN = 100 kHz
Signal-to-Noise Ratio (SNR)1 VDD = 2.7 V to 5.25 V 70 70 dB min
Signal-to-(Noise + Distortion) (SINAD)1 VDD = 2.7 V to 3.6 V 69 69 dB min
V
DD = 4.75 V to 5.25 V 70 70 dB min
Total Harmonic Distortion (THD)1 V
DD = 2.7 V to 3.6 V; −78 dB typ −73 −73 dB max
V
DD = 4.75 V to 5.25 V; −80 dB typ −75 −75 dB max
Peak Harmonic or Spurious Noise1 V
DD = 2.7 V to 3.6 V; −80 dB typ −73 −73 dB max
V
DD = 4.75 V to 5.25 V; −82 dB typ −75 −75 dB max
Intermodulation Distortion (IMD)1 fa = 90 kHz; fb = 110 kHz
Second-Order Terms −80 −80 dB typ
Third-Order Terms −80 −80 dB typ
Aperture Delay1 5 5 ns typ
Aperture Jitter1 50 50 ps typ
Full-Power Bandwidth1, 2 @ −3 dB 20 20 MHz typ
@ −0.1 dB 2.5 2.5 MHz typ
DC ACCURACY
Resolution 12 12 Bits
Integral Nonlinearity (INL)1 ±1.5 ±1 LSB max
Differential Nonlinearity (DNL)1 Guaranteed no missed codes to 12 bits ±0.95 ±0.95 LSB max
Offset Error1 ±3.5 ±3.5 LSB max
Gain Error1 ±3 ±3 LSB max
ANALOG INPUT
Full-Scale Input Span VIN+VIN– VREF V
REF V
Absolute Input Voltage
VIN+ VREF VREF V
VIN–3 VDD = 2.7 V to 3.6 V −0.1 to +0.4 −0.1 to +0.4 V
V
DD = 4.75 V to 5.25 V −0.1 to +1.5 −0.1 to +1.5 V
DC Leakage Current ±1 ±1 μA max
Input Capacitance When in track-and-hold 30/10 30/10 pF typ
REFERENCE INPUT
VREF Input Voltage4 ±1% tolerance for specified performance 2.5 2.5 V
DC Leakage Current ±1 ±1 μA max
VREF Input Capacitance When in track-and-hold 10/30 10/30 pF typ
LOGIC INPUTS
Input High Voltage, VINH 2.4 2.4 V min
Input Low Voltage, VINL 0.8 0.8 V max
Input Current, IIN Typically 10 nA, VIN = 0 V or VDD ±1 ±1 μA max
Input Capacitance, CIN5 10 10 pF max
LOGIC OUTPUTS
Output High Voltage, VOH VDD = 4.75 V to 5.25 V; ISOURCE = 200 μA 2.8 2.8 V min
V
DD = 2.7 V to 3.6 V; ISOURCE = 200 μA 2.4 2.4 V min
Output Low Voltage, VOL ISINK = 200 μA 0.4 0.4 V max
Floating-State Leakage Current ±1 ±1 μA max
Floating-State Output Capacitance5 10 10 pF max
Output Coding Straight
(natural) binary
Straight
(natural) binary
AD7441/AD7451
Rev. D | Page 4 of 24
Parameter Test Conditions/Comments A Version B Version Unit
CONVERSION RATE
Conversion Time 888 ns with an 18 MHz SCLK 16 16 SCLK cycles
Track-and-Hold Acquisition Time1 Sine wave input 250 250 ns max
Full-scale step input 290 290 ns max
Throughput Rate 1 1 MSPS max
POWER REQUIREMENTS
VDD 2.7/5.25 2.7/5.25 V min/max
IDD6, 7
Normal Mode (Static) SCLK on or off 0.5 0.5 mA typ
Normal Mode (Operational) VDD = 4.75 V to 5.25 V 1.95 1.95 mA max
V
DD = 2.7 V to 3.6 V 1.45 1.45 mA max
Full Power-Down Mode SCLK on or off 1 1 μA max
Power Dissipation
Normal Mode (Operational) VDD = 5 V; 1.55 mW typical for 100 ksps6 9.25 9.25 mW max
V
DD = 3 V; 0.6 mW typical for 100 ksps6 4 4 mW max
Full Power-Down VDD = 5 V; SCLK on or off 5 5 μW max
V
DD = 3 V; SCLK on or off 3 3 μW max
1 See Terminology section.
2 Analog inputs with slew rates exceeding 27 V/μs (full-scale input sine wave > 3.5 MHz) within the acquisition time can cause the converter to return an incorrect result.
3 A small dc input is applied to VIN– to provide a pseudo ground for VIN+.
4 The AD7451 is functional with a reference input in the range of 100 mV to VDD.
5 Guaranteed by characterization.
6 See the Power vs. Throughput Rate section.
7 Measured with a full-scale dc input.
AD7441/AD7451
Rev. D | Page 5 of 24
VDD = 2.7 V to 5.25 V; fSCLK = 18 MHz; fS = 1 MSPS; VREF = 2.5 V; TA = TMIN to TMAX, unless otherwise noted. Temperature range for
B version: −40°C to +85°C.
Table 2. AD7441
Parameter Test Conditions/Comments B Version Unit
DYNAMIC PERFORMANCE fIN = 100 kHz
Signal-to-(Noise + Distortion) (SINAD)1 61 dB min
Total Harmonic Distortion (THD)1 2.7 V to 3.6 V; −77 dB typical −72 dB max
4.75 V to 5.25 V; −79 dB typical −73 dB max
Peak Harmonic or Spurious Noise1 2.7 V to 3.6 V; −80 dB typical −72 dB max
4.75 V to 5.25 V; −82 dB typical −74 dB max
Intermodulation Distortion (IMD)1 fa = 90 kHz, fb = 110 kHz
Second-Order Terms −80 dB typ
Third-Order Terms −80 dB typ
Aperture Delay1 5 ns typ
Aperture Jitter1 50 ps typ
Full-Power Bandwidth1, 2 @ −3 dB 20 MHz typ
@ −0.1 dB 2.5 MHz typ
DC ACCURACY
Resolution 10 Bits
Integral Nonlinearity (INL)1 ±0.5 LSB max
Differential Nonlinearity (DNL)1 Guaranteed no missed codes to 10 bits ±0.5 LSB max
Offset Error1 ±1 LSB max
Gain Error1 ±1 LSB max
ANALOG INPUT
Full-Scale Input Span VIN+VIN– VREF V
Absolute Input Voltage
VIN+ VREF V
VIN–3 VDD = 2.7 V to 3.6 V −0.1 to +0.4 V
V
DD = 4.75 V to 5.25 V −0.1 to +1.5 V
DC Leakage Current ±1 μA max
Input Capacitance When in track-and-hold 30/10 pF typ
REFERENCE INPUT
VREF Input Voltage4 ±1% tolerance for specified performance 2.5 V
DC Leakage Current ±1 μA max
VREF Input Capacitance When in track-and-hold 10/30 pF typ
LOGIC INPUTS
Input High Voltage, VINH 2.4 V min
Input Low Voltage, VINL 0.8 V max
Input Current, IIN Typically 10 nA, VIN = 0 V or VDD ±1 μA max
Input Capacitance, CIN5 10 pF max
LOGIC OUTPUTS
Output High Voltage, VOH VDD = 4.75 V to 5.25 V; ISOURCE = 200 μA 2.8 V min
V
DD = 2.7 V to 3.6 V; ISOURCE = 200 μA 2.4 V min
Output Low Voltage, VOL ISINK = 200 μA 0.4 V max
Floating-State Leakage Current ±1 μA max
Floating-State Output Capacitance5 10 pF max
Output Coding Straight (natural) binary
AD7441/AD7451
Rev. D | Page 6 of 24
Parameter Test Conditions/Comments B Version Unit
CONVERSION RATE
Conversion Time 888 ns with an 18 MHz SCLK 16 SCLK cycles
Track-and-Hold Acquisition Time1 Sine wave input 250 ns max
Step input 290 ns max
Throughput Rate 1 MSPS max
POWER REQUIREMENTS
VDD 2.7/5.25 V min/max
IDD6, 7
Normal Mode (Static) SCLK on or off 0.5 mA typ
Normal Mode (Operational) VDD = 4.75 V to 5.25 V 1.95 mA max
V
DD = 2.7 V to 3.6 V 1.45 mA max
Full Power-Down Mode SCLK on or off 1 μA max
Power Dissipation
Normal Mode (Operational) VDD = 5 V; 1.55 mW typ for 100 ksps6 9.25 mW max
V
DD = 3 V; 0.6 mW typ for 100 ksps6 4 mW max
Full Power-Down VDD = 5 V; SCLK on or off 5 μW max
V
DD = 3 V; SCLK on or off 3 μW max
1 See the Terminology section.
2 Analog inputs with slew rates exceeding 27 V/μs (full-scale input sine wave > 3.5 MHz) within the acquisition time can cause the converter to return an incorrect result.
3 A small dc input is applied to VIN– to provide a pseudo ground for VIN+.
4 The AD7441 is functional with a reference input in the range 100 mV to VDD.
5 Guaranteed by characterization.
6 See the Power vs. Throughput Rate section.
7 Measured with a full-scale dc input.
AD7441/AD7451
Rev. D | Page 7 of 24
TIMING SPECIFICATIONS1
VDD = 2.7 V to 5.25 V; fSCLK = 18 MHz; fS = 1 MSPS; VREF = 2.5 V; TA = TMIN to TMAX, unless otherwise noted.
Table 3.
Parameter Limit at TMIN, TMAX Unit Description
fSCLK2 10 kHz min
18 MHz max
tCONVERT 16 × tSCLK tSCLK = 1/fSCLK
888 ns max
tQUIET 60 ns min Minimum quiet time between end of a serial read and next falling edge of CS
t1 10 ns min Minimum CS pulse width
t2 10 ns min CS falling edge to SCLK falling edge setup time
t33 20 ns max Delay from CS falling edge until SDATA three-state disabled
t4 40 ns max Data access time after SCLK falling edge
t5 0.4 tSCLK ns min SCLK high pulse width
t6 0.4 tSCLK ns min SCLK low pulse width
t7 10 ns min SCLK edge to data valid hold time
t84 10 ns min SCLK falling edge to SDATA, three-state enabled
35 ns max SCLK falling edge to SDATA, three-state enabled
tPOWER-UP5 1 μs max Power-up time from full power-down
1 Guaranteed by characterization. All input signals are specified with tRISE = tFALL = 5 ns (10% to 90% of VDD) and timed from a voltage level of 1.6 V. See Figure 2, Figure 3,
and the Serial Interface section.
2 Mark/space ratio for the SCLK input is 40/60 to 60/40.
3 Measured with the load circuit of Figure 4 and defined as the time required for the output to cross 0.8 V or 2.4 V with VDD = 5 V and the time required for an output to
cross 0.4 V or 2.0 V for VDD = 3 V.
4 t8 is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 4. The measured number is then extrapolated
back to remove the effects of charging or discharging the 25 pF capacitor. This means that the time (t8) quoted in the timing characteristics is the true bus relinquish
time of the part and is independent of the bus loading.
5 See the Power-Up Time section.
TIMING DIAGRAMS
t
3
t
2
t
4
t
7
t
8
t
6
t
1
t
5
t
QUIET
t
CONVERT
CS
SCLK
SDATA
4 LEADING ZEROS THREE-STATE
12345 13141516
0 0 0 0 DB11 DB10 DB2 DB1 DB0
B
03153-002
Figure 2. AD7451 Serial Interface Timing Diagram
t
3
t
2
t
4
t
7
t
8
t
6
t
1
t
5
t
QUIET
t
CONVERT
CS
SCLK
SDAT
A
4 LEADING ZEROS 2 TRAILING ZEROS THREE-STATE
12345 13141516
0 0 0 0 DB9 DB8 DB0 0 0
B
03153-003
Figure 3. AD7441 Serial Interface Timing Diagram
AD7441/AD7451
Rev. D | Page 8 of 24
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 4.
Parameter Rating
VDD to GND −0.3 V to +7 V
VIN+ to GND −0.3 V to VDD + 0.3 V
VIN– to GND −0.3 V to VDD + 0.3 V
Digital Input Voltage to GND −0.3 V to +7 V
Digital Output Voltage to GND −0.3 V to VDD + 0.3 V
VREF to GND −0.3 V to VDD + 0.3 V
Input Current to any Pin Except Supplies1 ±10 mA
Operating Temperature Range
Commercial (A, B Version)
−40°C to +85°C
Storage Temperature Range −65°C to +150°C
Junction Temperature 150°C
θJA Thermal Impedance 205.9°C/W (MSOP)
211.5°C/W (SOT-23)
θJC Thermal Impedance 43.74°C/W (MSOP)
91.99°C/W (SOT-23)
Lead Temperature, Soldering
Vapor Phase (60 sec) 215°C
Infrared (15 sec) 220°C
ESD 1 kV
1 Transient currents of up to 100 mA do not cause SCR latch-up.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
1.6mA I
OL
200µA I
OH
1.6V
TO OUTPUT
PIN C
L
25pF
03153-004
Figure 4. Load Circuit for Digital Output Timing Specifications
ESD CAUTION
AD7441/AD7451
Rev. D | Page 9 of 24
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
V
DD
SCLK
SDATA
CS
8
7
6
5
V
REF 1
V
IN+ 2
V
IN– 3
GND
4
AD7441/
AD7451
TOP VIEW
(Not to Scale)
0
3153-006
Figure 5. 8-Lead MSOP Pin Configuration
VREF
VIN+
VIN–
GND
8
7
6
5
VDD 1
SCLK 2
SDATA 3
CS 4
AD7441/
AD7451
TOP VIEW
(Not to Scale)
0
3153-005
Figure 6. 8-Lead SOT-23 Pin Configuration
Table 5. Pin Function Descriptions
Pin. No.
Mnemonic Description
MSOP SOT-23
1 8 VREF Reference Input for the AD7441/AD7451. An external reference in the range of 100 mV to VDD must be
applied to this input. The specified reference input is 2.5 V. This pin is decoupled to GND with a capacitor
of at least 0.1 μF.
2 7 VIN+ Noninverting Analog Input.
3 6 VIN– Inverting Input. This pin sets the ground reference point for the VIN+ input. Connect to ground or to a dc
offset to provide a pseudo ground.
4 5 GND Analog Ground. Ground reference point for all circuitry on the AD7441/AD7451. All analog input signals
and any external reference signal are referred to this GND voltage.
5 4 CS Chip Select. Active low logic input. This input provides the dual function of initiating a conversion on
the AD7441/AD7451 and framing the serial data transfer.
6 3 SDATA Serial Data, Logic Output. The conversion result from the AD7441/AD7451 is provided on this output as
a serial data stream. The bits are clocked out on the falling edge of the SCLK input. The data stream of
the AD7451 consists of four leading zeros followed by the 12 bits of conversion data that are provided
MSB first; the data stream of the AD7441 consists of four leading zeros, followed by the 10 bits of con-
version data, followed by two trailing zeros. In both cases, the output coding is straight (natural) binary.
7 2 SCLK Serial Clock, Logic Input. SCLK provides the serial clock for accessing data from the part. This clock input
is also used as the clock source for the conversion process.
8 1 VDD Power Supply Input. VDD is 2.7 V to 5.25 V. This supply is decoupled to GND with a 0.1 μF capacitor and a
10 μF tantalum capacitor.
AD7441/AD7451
Rev. D | Page 10 of 24
TYPICAL PERFORMANCE CHARACTERISTICS
TA = 25°C, fS = 1 MSPS, fSCLK = 18 MHz, VDD = 2.7 V to 5.25 V, VREF = 2.5 V, unless otherwise noted.
75
55
60
65
70
10 100 1000
FREQUENCY (kHz)
SINAD (dB)
V
DD
= 5.25V
V
DD
= 4.75V
V
DD
= 3.6V
V
DD
= 2.7V
03153-007
Figure 7. SINAD vs. Analog Input Frequency for the AD7451 for
Various Supply Voltages
0
–120
–80
–100
–60
–40
–20
0 100 200 300 400 500 600 700 800 900 1000
SUPPLY RIPPLE FREQUENCY (kHz)
PSRR (dB)
100mV p-p SINE WAVE ON V
DD
NO DECOUPLING ON V
DD
V
DD
= 3V
V
DD
= 5V
03153-008
Figure 8. PSRR vs. Supply Ripple Frequency Without Supply Decoupling
FREQUENCY (kHz)
SNR (dB)
0 100 200
–100
–140
500
–20
0
–120
–40
–60
–80
8192 POINT FFT
f
SAMPLE
= 1MSPS
f
IN
= 100kSPS
SINAD = 71dB
THD = –82dB
SFDR = –83dB
300 400
03153-009
Figure 9. AD7451 Dynamic Performance for VDD = 5 V
DNL ERROR (LSB)
CODE
0.4
0 1024 2048 3072
0.2
0
–0.2
–0.4
–1.0
4096
0.6
0.8
1.0
–0.6
–0.8
03153-010
Figure 10. Typical DNL for the AD7451 for VDD = 5 V
INL ERROR (LSB)
CODE
0.4
0 1024 2048 3072
0.2
0
–0.2
–0.4
–1.0
4096
0.6
0.8
1.0
–0.6
–0.8
03153-011
Figure 11. Typical INL for the AD7451 for VDD = 5 V
COUNTS
CODES
0
2046 2047 2048 2049 2050 2051
27 CODES 24 CODES
1000
2000
3000
4000
5000
6000
7000
8000
9000
10000
9949
CODES
03153-012
Figure 12. Histogram of 10,000 Conversions of a DC Input for the AD7451
AD7441/AD7451
Rev. D | Page 11 of 24
5
CHANGE IN DNL (LSB)
–1.0
–0.5
0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
01234
4.0
VREF (V)
POSITIVE DNL
NEGATIVE DNL
03153-013
Figure 13. Change in DNL vs. VREF for VDD = 5 V
CHANGE IN INL (LSB)
–2
–1
0
1
2
3
4
01234
5
VREF (V)
5
POSITIVE DNL
NEGATIVE DNL
03153-014
Figure 14. Change in INL vs. VREF for VDD = 5 V
EFFECTIVE NUMBER OF BITS
6
7
8
9
10
11
012345
12
VREF (V)
VDD = 3V
VDD = 5V
03153-015
Figure 15. ENOB vs. VREF for VDD = 5 V and 3 V
SNR (dB)
0 100 200 300 400 500
0
–20
–40
–60
–80
–100
–120
–140
VREF (V)
8192 POINT FFT
fSAMPLE = 1MSPS
fIN = 100kSPS
SINAD = 61.7dB
THD = –81.7dB
SFDR = –82dB
03153-016
Figure 16. AD7441 Dynamic Performance
DNL ERROR (LSB)
0 256 512 768 1024
0.5
–0.5
–0.4
–0.3
–0.2
–0.1
0
0.1
0.2
0.3
0.4
CODE
0
3153-017
Figure 17. Typical DNL for the AD7441
INL ERROR (LSB)
0 256 512 768 1024
0.5
–0.5
–0.4
–0.3
–0.2
–0.1
0
0.1
0.2
0.3
0.4
CODE
0
3153-018
Figure 18. Typical INL for the AD7441
AD7441/AD7451
Rev. D | Page 12 of 24
TERMINOLOGY
Signal-to-(Noise + Distortion) Ratio (SINAD)
This is the measured ratio of SINAD at the output of the ADC.
The signal is the rms amplitude of the fundamental. Noise is
the sum of all nonfundamental signals up to half the sampling
frequency (fS/2), excluding dc. The ratio is dependent on the
number of quantization levels in the digitization process: the more
levels, the smaller the quantization noise. The theoretical SINAD
ratio for an ideal N-bit converter with a sine wave input is given by
Signal-to-(Noise + Distortion) = (6.02 N + 1.76) dB
Therefore, for 12-bit converters, the SINAD is 74 dB; for 10-bit
converters, the SINAD is 62 dB.
Total Harmonic Distortion (THD)
THD is the ratio of the rms sum of harmonics to the
fundamental. In the AD7441/AD7451, THD is
()
1
65432 V
VVVVV
THD 22222
log20dB ++++
=
where:
V1 is the rms amplitude of the fundamental.
V2, V3, V4, V5, and V6 are the rms amplitudes of the second to
the sixth harmonics.
Peak Harmonic or Spurious Noise
Peak harmonic (spurious noise) is defined as the ratio of the
rms value of the next largest component in the ADC output
spectrum (up to fS/2, excluding dc) to the rms value of the
fundamental. Normally, the value of this specification is
determined by the largest harmonic in the spectrum, but for
ADCs where the harmonics are buried in the noise floor, it is
a noise peak.
Intermodulation Distortion
With inputs consisting of sine waves at two frequencies, fa and
fb, an active device with nonlinearities creates distortion products
at sum and difference frequencies of mfa ± nfb where m, n = 0,
1, 2, 3, and so on. Intermodulation distortion terms are those in
which neither m nor n are equal to zero. For example, the second-
order terms include (fa + fb) and (fa − fb), while the third-order
terms include (2fa + fb), (2fa − fb), (fa + 2fb), and (fa − 2fb).
The AD7441/AD7451 are tested using the CCIF standard where
two input frequencies near the top end of the input bandwidth
are used. In this case, the second-order terms are usually dis-
tanced in frequency from the original sine waves while the
third-order terms are usually at a frequency close to the input
frequencies. As a result, the second- and third-order terms
are specified separately. The calculation of the intermodulation
distortion is as per the THD specification where it is the ratio of
the rms sum of the individual distortion products to the rms
amplitude of the sum of the fundamentals expressed in decibels.
Aperture Delay
This is the amount of time from the leading edge of the
sampling clock until the ADC actually takes the sample.
Aperture Jitter
This is the sample-to-sample variation in the effective point in
time at which the actual sample is taken.
Full Power Bandwidth
The full power bandwidth of an ADC is that input frequency
at which the amplitude of the reconstructed fundamental is
reduced by 0.1 dB or 3 dB for a full-scale input.
Integral Nonlinearity (INL)
This is the maximum deviation from a straight line passing
through the endpoints of the ADC transfer function.
Differential Nonlinearity (DNL)
This is the difference between the measured and the ideal 1 LSB
change between any two adjacent codes in the ADC.
Offset Error
This is the deviation of the first code transition (000…000 to
000…001) from the ideal (that is, AGND + 1 LSB).
Gain Error
This is the deviation of the last code transition (111…110 to
111…111) from the ideal (that is, VREF − 1 LSB) after the offset
error has been adjusted out.
Track-and-Hold Acquisition Time
The track-and-hold acquisition time is the minimum time
required for the track-and-hold amplifier to remain in track
mode for its output to reach and settle to within 0.5 LSB of the
applied input signal.
Power Supply Rejection Ratio (PSRR)
The power supply rejection ratio is defined as the ratio of the
power in the ADC output at full-scale frequency (f) to the
power of a 100 mV p-p sine wave applied to the ADC VDD
supply of Frequency fS. The frequency of this input varies from
1 kHz to 1 MHz.
PSRR (dB) = 10log(Pf/Pfs)
where:
Pf is the power at Frequency f in the ADC output.
Pfs is the power at Frequency fs in the ADC output.
AD7441/AD7451
Rev. D | Page 13 of 24
THEORY OF OPERATION
CIRCUIT INFORMATION
The AD7441/AD7451 are 10-/12-bit, high speed, low power,
single-supply, successive approximation, analog-to-digital con-
verters (ADCs) with a pseudo differential analog input. These
parts operate with a single 2.7 V to 5.25 V power supply and are
capable of throughput rates up to 1 MSPS when supplied with
an 18 MHz SCLK. The AD7441/AD7451 require an external
reference to be applied to the VREF pin.
The AD7441/AD7451 have a SAR ADC, an on-chip differential
track-and-hold amplifier, and a serial interface housed in either
an 8-lead SOT-23 or an MSOP package. The serial clock input
accesses data from the part and provides the clock source for
the SAR ADC. The AD7441/AD7451 feature a power-down
option for reduced power consumption between conversions.
The power-down feature is implemented across the standard
serial interface, as described in the Modes of Operation section.
CONVERTER OPERATION
The AD7441/AD7451 are SAR ADCs based around two
capacitive DACs. Figure 19 and Figure 20 show simplified
schematics of the ADC in the acquisition and conversion phase,
respectively. The ADC is comprised of control logic, an SAR,
and two capacitive DACs. In Figure 19 (acquisition phase), SW3
is closed, SW1 and SW2 are in Position A, the comparator is
held in a balanced condition, and the sampling capacitor arrays
acquire the differential signal on the input.
V
IN+
V
IN–
A
B
SW1
SW3
COMPARATOR
CONTROL
LOGIC
CAPACITIVE
DAC
CAPACITIVE
DAC
C
S
C
S
V
REF
SW2
B
A
03153-019
Figure 19. ADC Acquisition Phase
When the ADC starts a conversion (see Figure 20), SW3 opens
and SW1 and SW2 move to Position B, causing the comparator
to become unbalanced. Both inputs are disconnected once the
conversion begins. The control logic and the charge redistribu-
tion DACs are used to add and subtract fixed amounts of charge
from the sampling capacitor arrays to bring the comparator
back into a balanced condition. When the comparator is rebal-
anced, the conversion is complete. The control logic generates
the ADC output code. The output impedances of the sources
driving the VIN+ and VIN– pins must be matched; otherwise the
two inputs have different settling times, resulting in errors.
V
IN+
V
IN–
A
B
SW1
SW3
COMPARATOR
CONTROL
LOGIC
CAPACITIVE
DAC
CAPACITIVE
DAC
C
S
C
S
V
REF
SW2
B
A
03153-020
Figure 20. ADC Conversion Phase
ADC TRANSFER FUNCTION
The output coding for the AD7441/AD7451 is straight (natural)
binary. The designed code transitions occur at successive LSB
values (1 LSB, 2 LSB, and so on). The LSB size of the AD7451
is VREF/4096, and the LSB size of the AD7441 is VREF/1024. The
ideal transfer characteristic of the AD7441/AD7451 is shown in
Figure 21.
000...000
0V
ADC CODE
ANALOG INPUT
111...111
000...001
111...000
011...111
111...110
000...010
1LSB =
V
REF
/
4096 (AD7451)
1LSB = VREF/1024 (AD7441)
VREF1LSB1LSB
03153-021
Figure 21. AD7441/AD7451 Ideal Transfer Characteristic
AD7441/AD7451
Rev. D | Page 14 of 24
TYPICAL CONNECTION DIAGRAM
Figure 22 shows a typical connection diagram for the device.
In this setup, the GND pin is connected to the analog ground
plane of the system. The VREF pin is connected to the AD780,
a 2.5 V decoupled reference source. The signal source is connected
to the VIN+ analog input via a unity gain buffer. A dc voltage is
connected to the VIN– pin to provide a pseudo ground for the
VIN+ input. The VDD pin is decoupled to AGND with a 10 μF
tantalum capacitor in parallel with a 0.1 μF ceramic capacitor.
The reference pin is decoupled to AGND with a capacitor of at
least 0.1 μF. The conversion result is output in a 16-bit word
with four leading zeros followed by the MSB of the 12-bit or
10-bit result. The 10-bit result of the AD7441 is followed by two
trailing zeros.
AD7441/
AD7451
0.1µF
0.1µF
10µF
V
REF
V
DD
DC INPUT
VOLTAGE
V
IN+
SCLK
2.7V TO 5.25
V
SUPPLY
SERIAL
INTERFACE
µC/µP
SDATA
CS
GND
V
IN–
2.5V
AD780
V
REF
p-p
03153-022
Figure 22. Typical Connection Diagram
ANALOG INPUT
The AD7441/AD7451 have a pseudo differential analog input.
The VIN+ input is coupled to the signal source and must have an
amplitude of VREF p-p to make use of the full dynamic range of
the part. A dc input is applied to the VIN–. The voltage applied to
this input provides an offset from ground or a pseudo ground
for the VIN+ input. Pseudo differential inputs separate the analog
input signal ground from the ADC ground, allowing dc common-
mode voltages to be cancelled.
Because the ADC operates from a single supply, it is necessary
to level shift ground-based bipolar signals to comply with the
input requirements. An op amp (for example, the AD8021) can
be configured to rescale and level shift a ground-based (bipolar)
signal so that it is compatible with the input range of the AD7441/
AD7451 (see Figure 23).
When a conversion takes place, the pseudo ground corresponds
to 0, and the maximum analog input corresponds to 4096 for
the AD7451 and 1024 for the AD7441.
R
2.5
1.25V
0V
+1.25V
0V
–1.25V
R
3R
0.1µF
R
AD7441/
AD7451
V
IN+
V
IN+
V
IN–
V
REF
EXTERNAL
V
REF
(2.5V)
0
3153-023
Figure 23. Op Amp Configuration to Level Shift a Bipolar Input Signal
ANALOG INPUT STRUCTURE
Figure 24 shows the equivalent circuit of the analog input
structure of the AD7441/AD7451. The four diodes provide
ESD protection for the analog inputs. Care must be taken to
ensure that the analog input signals never exceed the supply
rails by more than 300 mV. This causes these diodes to become
forward-biased and start conducting into the substrate. These
diodes can conduct up to 10 mA without causing irreversible
damage to the part. The C1 capacitors (see Figure 24) are
typically 4 pF and can be attributed primarily to pin capaci-
tance. The resistors are lumped components made up of
the on resistance of the switches. The value of these resistors
is typically about 100 Ω. The C2 capacitors are the ADC
sampling capacitors and have a capacitance of 16 pF typically.
For ac applications, removing high frequency components from
the analog input signal through the use of an RC low-pass filter
on the relevant analog input pins is recommended. In applica-
tions where harmonic distortion and the signal-to-noise ratio
are critical, it is recommended that the analog input be driven
from a low impedance source. Large source impedances
significantly affect the ac performance of the ADC, which can
necessitate the use of an input buffer amplifier. The choice of
the amplifier is a function of the particular application.
C1
C2
R1
D
D
C1
C2
R1
D
D
VDD
V
DD
VIN+
VIN–
03153-024
Figure 24. Equivalent Analog Input Circuit;
Conversion Phase—Switches Open;
Track Phase—Switches Closed
AD7441/AD7451
Rev. D | Page 15 of 24
When no amplifier is used to drive the analog input, it is
recommended that the source impedance be limited to low
values. The maximum source impedance depends on the
amount of total harmonic distortion that can be tolerated.
The THD increases as the source impedance increases and
performance degrades.
Figure 25 shows a graph of THD vs. analog input signal
frequency for different source impedances.
0
–100
–90
–80
–70
–60
–50
–40
–30
–10
–20
10k 100k 1M
INPUT FREQUENCY (Hz)
THD (dB)
200
100
6210
TA = 25°C
VDD = 5V
03153-025
Figure 25. THD vs. Analog Input Frequency for Various Source Impedances
Figure 26 shows a graph of THD vs. analog input frequency for
various supply voltages while sampling at 1 MSPS with an SCLK
of 18 MHz. In this case, the source impedance is 10 Ω.
50
–90
–85
–80
–75
–70
–65
–60
–55
10 100 1000
INPUT FREQUENCY (kHz)
THD (dB)
TA = 25°C
VDD = 2.7V
VDD = 3.6V
VDD = 4.75V
VDD = 5.25V
03153-026
Figure 26. THD vs. Analog Input Frequency for Various Supply Voltages
DIGITAL INPUTS
The digital inputs applied to the AD7441/AD7451 are not limited
by the maximum ratings that limit the analog inputs. Instead,
the digital inputs applied, that is, CS and SCLK, can go to 7 V
and are not restricted by the VDD + 0.3 V limits as on the analog
input. The main advantage of the inputs not being restricted to
the VDD + 0.3 V limit is that power supply sequencing issues are
avoided. If CS or SCLK are applied before VDD, there is no risk
of latch-up as there would be on the analog inputs if a signal
greater than 0.3 V were applied prior to VDD.
REFERENCE
An external source is required to supply the reference to the
AD7441/AD7451. This reference input can range from 100 mV
to VDD. The specified reference is 2.5 V for the power supply
range 2.7 V to 5.25 V. The reference input chosen for an appli-
cation must never be greater than the power supply. Errors in
the reference source result in gain errors in the AD7441/AD7451
transfer function and add to the specified full-scale errors of the
part. A capacitor of at least 0.1 μF must be placed on the VREF
pin. Suitable reference sources for the AD7441/AD7451 include
the AD780 and the ADR421. Figure 27 shows a typical connec-
tion diagram for the VREF pin.
1
AD780
NC
8
2
V
IN
NC
7
3
GND
6
4
TEMP
5
OPSEL
TRIM
V
OUT
AD7441/
AD7451*
V
REF
2.5V
NC
V
DD
NC
V
DD
NC = NO CONNECT
10nF 0.1µF 0.1µF
0.1µF
*ADDITIONAL PINS OMITTED FOR CLARITY.
0
3153-027
Figure 27. Typical VREF Connection Diagram for VDD = 5 V
AD7441/AD7451
Rev. D | Page 16 of 24
SERIAL INTERFACE
Figure 2 and Figure 3 show detailed timing diagrams for the
serial interface of the AD7451 and the AD7441, respectively.
The serial clock provides the conversion clock and also controls
the transfer of data from the device during conversion.
CS initiates the conversion process and frames the data transfer.
The falling edge of CS puts the track-and-hold into hold mode
and takes the bus out of three-state. The analog input is sampled
and the conversion initiated at this point. The conversion requires
16 SCLK cycles to complete.
Once 13 SCLK falling edges have occurred, the track-and-hold
goes back into track mode on the next SCLK rising edge, as
shown at Point B in Figure 2 and Figure 3. On the 16th SCLK
falling edge, the SDATA line goes back into three-state.
If the rising edge of CS occurs before 16 SCLKs have elapsed,
the conversion is terminated and the SDATA line goes back into
three-state.
The conversion result from the AD7441/AD7451 is provided on
the SDATA output as a serial data stream. The bits are clocked
out on the falling edge of the SCLK input. The data stream of
the AD7451 consists of four leading zeros followed by 12 bits
of conversion data, provided MSB first. The data stream of the
AD7441 consists of four leading zeros, followed by the 10 bits
of conversion data, followed by two trailing zeros, which is also
provided MSB first. In both cases, the output coding is straight
(natural) binary.
Sixteen serial clock cycles are required to perform a conversion
and to access data from the AD7441/AD7451. CS going low
provides the first leading zero to be read in by the DSP or the
microcontroller. The remaining data is then clocked out on the
subsequent SCLK falling edges, beginning with the second leading
zero. Thus, the first falling clock edge on the serial clock pro-
vides the second leading zero. The final bit in the data transfer
is valid on the 16th falling edge, having been clocked out on the
previous (15th) falling edge. Once the conversion is complete
and the data has been accessed after the 16 clock cycles, it is
important to ensure that, before the next conversion is initiated,
enough time is left to meet the acquisition and quiet-time speci-
fications (see the and
sections). To achieve 1 MSPS with an 18 MHz clock, an 18-clock
burst performs the conversion and leaves enough time before the
next conversion for the acquisition and quiet time.
Timing Example 1 Timing Example 2
In applications with slower SCLKs, it is possible to read in data
on each SCLK rising edge; that is, the first rising edge of SCLK
after the CS falling edge has the leading zero provided, and the
15th SCLK edge has DB0 provided.
AD7441/AD7451
Rev. D | Page 17 of 24
Timing Example 2
Timing Example 1
Having fSCLK = 5 MHz and a throughput rate of 315 kSPS gives a
cycle time of
Having fSCLK = 18 MHz and a throughput rate of 1 MSPS gives a
cycle time of
1/Throughput = 1/315,000 = 3.174 μs
1/Throughput = 1/1,000,000 = 1 μs
A cycle consists of
A cycle consists of
t2 + 12.5 (1/fSCLK) + tACQUISITION = 3.174 μs
t2 + 12.5 (1/fSCLK) + tACQUISITION = 1 μs
Therefore, if t2 is 10 ns, then
Therefore, if t2 = 10 ns, then
10 ns + 12.5 (1/5 MHz) + tACQUISITION = 3.174 μs
tACQUISITION = 664 ns
10 ns + 12.5 (1/18 MHz) + tACQUISITION = 1 μs
tACQUISITION = 296 ns
This 664 ns satisfies the requirement of 290 ns for tACQUISITION.
This 296 ns satisfies the requirement of 290 ns for tACQUISITION.
From Figure 28, tACQUISITION comprises
From Figure 28, tACQUISITION comprises
2.5 (1/fSCLK) + t8 = tQUIET
2.5 (1/fSCLK) + t8 = tQUIET
where t8 = 35 ns. This allows a value of 129 ns for tQUIET,
satisfying the minimum requirement of 60 ns.
where t8 = 35 ns. This allows a value of 122 ns for tQUIET,
satisfying the minimum requirement of 60 ns.
As in this example and with other slower clock values, the signal
can already be acquired before the conversion is complete, but it
is still necessary to leave 60 ns minimum tQUIET between conver-
sions. In Example 2, the signal is fully acquired at approximately
Point C in Figure 28.
t2
t8
t6
t5
tCONVERT
CS
SCLK 12345 13141516
12.5(1/
fSCLK
)
tACQUISITION
1/THROUGHPUT
tQUIET
10ns
B C
03153-028
Figure 28. Serial Interface Timing Example
AD7441/AD7451
Rev. D | Page 18 of 24
MODES OF OPERATION
The operating mode of the AD7441/AD7451 is selected by
controlling the logic state of the CS signal during a conversion.
There are two operating modes: normal mode and power-down
mode. The point at which CS is pulled high after the conversion
is initiated determines whether the part enters power-down mode.
Similarly, if already in power-down, CS controls whether the
device returns to normal operation or remains in power-down.
These modes provide flexible power management options that
can optimize the power dissipation/throughput rate ratio for
differing application requirements.
NORMAL MODE
This mode is intended for fastest throughput rate performance.
The user does not have to worry about any power-up times with
the AD7441/AD7451 remaining fully powered up all the time.
Figure 29 shows the general diagram of the operation of the
AD7441/AD7451 in this mode. The conversion is initiated
on the falling edge of CS (see the section). To
ensure that the part remains fully powered up,
Serial Interface
CS must remain
low until at least 10 SCLK falling edges elapse after the falling
edge of CS.
If CS is brought high any time after the 10th SCLK falling edge,
but before the 16th SCLK falling edge, the part remains pow-
ered up, however the conversion is terminated and SDATA goes
back into three-state. Sixteen serial clock cycles are required to
complete the conversion and access the complete conversion
result. CS can idle high until the next conversion or can idle
low until sometime prior to the next conversion. Once a data
transfer is complete—that is, when SDATA has returned to
three-state—another conversion can be initiated after the
quiet time, tQUIET, elapses again bringing CS low.
110
CS
SCLK
S
DATA
16
4 LEADING ZEROS + CONVERSION RESULT
0
3153-029
Figure 29. Normal Mode Operation
POWER-DOWN MODE
This mode is intended for use in applications where slower
throughput rates are required; either the ADC is powered
down between each conversion or a series of conversions can
be performed at a high throughput rate and the ADC is then
powered down for a relatively long duration between these
bursts of conversions. When the AD7441/AD7451 are in
power-down mode, all analog circuitry is powered down.
For the AD7441/AD7451 to enter power-down mode, the
conversion process must be interrupted by bringing CS high
anywhere after the second falling edge of SCLK and before
the 10th falling edge of SCLK, as shown in . Figure 30
Once CS has been brought high in this window of SCLKs, the
part enters power-down, the conversion that was initiated by
the falling edge of CS is terminated, and SDATA goes back into
three-state. The time from the rising edge of CS to SDATA
three-state enabled is never greater than t8 (see the
section). If
Timing
Specifications CS is brought high before the second
SCLK falling edge, the part remains in normal mode and does
not power down. This avoids accidental power-down due to
glitches on the CS line.
To exit power-down mode and power up the AD7441/AD7451
again, a dummy conversion is performed. On the falling edge
of CS, the device begins to power up and continues to do so
as long as CS is held low until after the falling edge of the 10th
SCLK. The device is fully powered up after 1 μs has elapsed and,
as shown in , valid data results from the next
conversion.
Figure 31
110
SCLK
SDATA THREE-STATE
2
CS
0
3153-030
Figure 30. Entering Power-Down Mode
AD7441/AD7451
Rev. D | Page 19 of 24
CS
SCLK
SDATA
110 16 1 10 16
A
THIS PART IS FULLY POWERED
UP WITH V
IN
FULLY ACQUIRED
PART BEGINS
TO POWER UP
INVALID DATA VALID DATA
tPOWER-UP
03153-031
Figure 31. Exiting Power-Down Mode
If CS is brought high before the 10th falling edge of SCLK, the
AD7441/AD7451 again go back into power-down. This avoids
accidental power-up due to glitches on the CS line or an inad-
vertent burst of eight SCLK cycles while CS is low. So although
the device may begin to power up on the falling edge of CS, it
again powers down on the rising edge of CS as long as it occurs
before the 10th SCLK falling edge.
Power-Up Time
The power-up time of the AD7441/AD7451 is typically 1 μs,
which means that with any frequency of SCLK up to 18 MHz,
one dummy cycle is always sufficient to allow the device to
power up. Once the dummy cycle is complete, the ADC is fully
powered up and the input signal is acquired properly. The quiet
time, tQUIET, must still be allowed—from the point at which the
bus goes back into three-state after the dummy conversion to
the next falling edge of CS.
When running at the maximum throughput rate of 1 MSPS,
the AD7441/AD7451 power up and acquire a signal within
±0.5 LSB in one dummy cycle, that is, 1 μs. When powering up
from the power-down mode with a dummy cycle, as in Figure 31,
the track-and-hold, which was in hold mode while the part was
powered down, returns to track mode after the first SCLK edge
the part receives after the falling edge of CS. This is shown as
Point A in . Figure 31
Although at any SCLK frequency one dummy cycle is sufficient
to power up the device and acquire VIN, it does not necessarily
mean that a full dummy cycle of 16 SCLKs must always elapse
to power up the device and acquire VIN fully; 1 μs is sufficient to
power up the device and acquire the input signal.
For example, when a 5 MHz SCLK frequency is applied to the
ADC, the cycle time is 3.2 μs (that is, 1/(5 MHz) × 16). In one
dummy cycle, 3.2 μs, the part is powered up, and VIN is acquired
fully. However, after 1 μs with a five MHz SCLK, only five SCLK
cycles elapse. At this stage, the ADC is fully powered up and the
signal acquired. Therefore, in this case, the CS can be brought
high after the 10th SCLK falling edge and brought low again
after a time, tQUIET, to initiate the conversion.
When power supplies are first applied to the AD7441/AD7451,
the ADC can power up either in power-down mode or normal
mode. For this reason, it is best to allow a dummy cycle to elapse
to ensure that the part is fully powered up before attempting a
valid conversion. Likewise, if the user wants the part to power
up in power-down mode, then the dummy cycle can be used to
ensure the device is in power-down mode by executing a cycle
such as that shown in Figure 30. Once supplies are applied to
the AD7441/AD7451, the power-up time is the same as that
when powering up from power-down mode. It takes approxi-
mately 1 μs to power up fully in normal mode. It is not necessary
to wait 1 μs before executing a dummy cycle to ensure the
desired mode of operation. Instead, the dummy cycle can
occur directly after power is supplied to the ADC. If the first
valid conversion is then performed directly after the dummy
conversion, care must be taken to ensure that adequate
acquisition time has been allowed.
As mentioned earlier, when powering up from the power-down
mode, the part returns to track mode upon the first SCLK edge
applied after the falling edge of CS. However, when the ADC
powers up initially after supplies are applied, the track-and-
hold is already in track mode. This means (assuming one has
the facility to monitor the ADC supply current) that if the ADC
powers up in the desired mode of operation, a dummy cycle is
not required to change mode. Thus, a dummy cycle is also not
required to place the track-and-hold into track.
AD7441/AD7451
Rev. D | Page 20 of 24
POWER VS. THROUGHPUT RATE
By using the power-down mode on the device when not con-
verting, the average power consumption of the ADC decreases
at lower throughput rates. Figure 32 shows how, as the through-
put rate is reduced, the device remains in its power-down state
longer and the average power consumption reduces accordingly.
For example, if the AD7441/AD7451 are operated in continuous
sampling mode with a throughput rate of 100 kSPS and an SCLK
of 18 MHz, and the device is placed in the power-down mode
between conversions, then the power consumption during
normal operation equals 9.25 mW maximum (for VDD = 5 V).
If the power-up time is one dummy cycle (1 μs) and the remain-
ing conversion time is another cycle (1 μs), then the AD7441/
AD7451 can be said to dissipate 9.25 mW for 2 μs during each
conversion cycle. (This power consumption figure assumes a
very short time to enter power-down mode. This power figure
increases as the burst of clocks used to enter power-down mode
is increased). The AD7441/AD7451 consume just 5 μW for the
remaining 8 μs.
Calculate the power numbers in Figure 32 as follows:
If the throughput rate = 100 kSPS, then the cycle time = 10 μs,
and the average power dissipated during each cycle is
(2/10) × 9.25 mW = 1.85 mW
For the same scenario, if VDD = 3 V, the power dissipation
during normal operation is 4 mW maximum.
The AD7441/AD7451 can now be said to dissipate 4 mW for
2 μs during each conversion cycle.
The average power dissipated during each cycle with a
throughput rate of 100 kSPS is, therefore,
(2/10) × 4 mW = 0.8 mW
THROUGHPUT (kSPS)
100
0350
POWER (mW)
0.01 50 100 150 200 250 300
0.1
1
10 VDD = 5V
VDD = 3V
03153-032
Figure 32. Power vs. Throughput Rate for Power-Down Mode
For optimum power performance in throughput rates above
320 kSPS, it is recommended that the serial clock frequency be
reduced.
MICROPROCESSOR AND DSP INTERFACING
The serial interface on the AD7441/AD7451 allows the part to
be connected directly to a range of different microprocessors.
This section explains how to interface the AD7441/AD7451
with some of the more common microcontroller and DSP serial
interface protocols.
AD7441/AD7451 to ADSP-21xx
The ADSP-21xx family of DSPs is interfaced directly to the
AD7441/AD7451 without any glue logic required. The SPORT
control register is set up as follows:
TFSW = RFSW = 1 Alternate framing
INVRFS = INVTFS = 1 Active low frame signal
DTYPE = 00 Right justify data
SLEN = 1111 16-bit data-words
ISCLK = 1 Internal serial clock
TFSR = RFSR = 1 Frame every word
IRFS = 0
ITFS = 1
To implement power-down mode, SLEN is set to 1001 to issue
an 8-bit SCLK burst.
The connection diagram is shown in Figure 33. ADSP-21xx has
the TFS and RFS of the SPORT tied together, with TFS set as an
output and RFS set as an input. The DSP operates in alternate
framing mode, and the SPORT control register is set up as
described. The frame synchronization signal generated on the
TFS is tied to CS, and, as with all signal processing applications,
equidistant sampling is necessary. However, in this example,
the timer interrupt is used to control the sampling rate of the
ADC, and, under certain conditions, equidistant sampling
cannot be achieved.
AD7441/
AD7451*
ADSP-21xx*
SCLK
DR
RFS
TFS
SCLK
SDATA
CS
*ADDITIONAL PINS REMOVED FOR CLARITY.
0
3153-033
Figure 33. Interfacing to the ADSP-21xx
AD7441/AD7451
Rev. D | Page 21 of 24
AD7441/AD7451 to DSP56xxx
The timer registers, for example, are loaded with a value that
provides an interrupt at the required sample interval. When an
interrupt is received, a value is transmitted with TFS/DT (ADC
control word). The TFS is used to control the RFS and, there-
fore, the reading of data. The frequency of the serial clock is set
in the SCLKDIV register. When the instruction to transmit with
TFS is given, that is, AX0 = TX0, the state of the SCLK is checked.
The DSP waits until the SCLK has gone high, low, and high
before starting transmission. If the timer and SCLK values are
chosen such that the instruction to transmit occurs on or near
the rising edge of SCLK, then the data can either be transmitted
or wait until the next clock edge.
The connection diagram in Figure 35 shows how the AD7441/
AD7451 can be connected to the SSI (synchronous serial interface)
of the DSP56xxx family of DSPs from Motorola. The SSI is
operated in synchronous mode (SYN bit in CRB = 1) with
internally generated 1-bit clock period frame sync for both Tx
and Rx (Bit FSL1 = 1 and Bit FSL0 = 0 in CRB). Set the word
length to 16 by setting Bit WL1 = 1 and Bit WL0 = 0 in CRA. To
implement the power-down mode on the AD7441/AD7451, the
word length can be changed to eight bits by setting B it WL1 = 0
and Bit WL0 = 0 in CRA. Note that for signal processing applica-
tions, the frame synchronization signal from the DSP56xxx must
provide equidistant sampling.
For example, the ADSP-2111 has a master clock frequency of
16 MHz. If the SCLKDIV register is loaded with the value of 3,
an SCLK of 2 MHz is obtained and eight master clock periods
elapse for every one SCLK period. If the timer registers are
loaded with the value 803, 100.5 SCLKs occur between inter-
rupts and subsequently between transmit instructions. This
situation results in nonequidistant sampling, because the
transmit instruction occurs on an SCLK edge. If the number
of SCLKs between interrupts is a whole integer figure of N,
equidistant sampling is implemented by the DSP.
AD7441/
AD7451*
DSP56xxx*
SCLK
SRD
SR2
SCLK
SDATA
CS
*ADDITIONAL PINS REMOVED FOR CLARITY.
03153-035
Figure 35. Interfacing to the DSP56xxx
AD7441/AD7451 to TMS320C5x/C54x
The serial interface on the TMS320C5x/C54x uses a continuous
serial clock and frame synchronization signals to synchronize
the data transfer operations with peripheral devices such as the
AD7441/AD7451. The CS input allows easy interfacing between
the TMS320C5x/C54x and the AD7441/AD7451 without any
glue logic required. The serial port of the TMS320C5x/C54x is
set up to operate in burst mode with internal CLKx (Tx serial
clock) and FSx (Tx frame sync). The serial port control register
(SPC) must have the following setup: FO = 0, FSM = 1, MCM = 1,
and TXM = 1. The format bit, FO, can be set to 1 to set the word
length to eight bits in order to implement the power-down
mode on the AD7441/AD7451. The connection diagram is
shown in . Note that for signal processing applications,
the frame synchronization signal from the TMS320C5x/ C54x
must provide equidistant sampling.
Figure 34
AD7441/
AD7451*
TMS320C5x/
C54x*
CLKx
DR
FSx
FSR
SCLK
SDATA
CS
CLKR
*ADDITIONAL PINS REMOVED FOR CLARITY.
03153-034
Figure 34. Interfacing to the TMS320C5x/C54x
AD7441/AD7451
Rev. D | Page 22 of 24
GROUNDING AND LAYOUT HINTS
The printed circuit board that houses the AD7441/AD7451
must be designed so that the analog and digital sections are
separated and confined to certain areas of the board. This
facilitates the use of ground planes that can be easily separated.
A minimum etch technique is generally best for ground planes,
as it gives the best shielding. Digital and analog ground planes
must be joined in only one place: a star ground point estab-
lished as close to the GND pin on the AD7441/AD7451 as
possible.
Avoid running digital lines under the device, as this couples
noise onto the die. The analog ground plane must be allowed to
run under the AD7441/AD7451 to avoid noise coupling. The
power supply lines to the AD7441/AD7451 must use as large
a trace as possible to provide low impedance paths and reduce
the effects of glitches on the power supply line.
Fast switching signals like clocks must be shielded with digital
grounds to avoid radiating noise to other sections of the board,
and clock signals must never run near the analog inputs. Avoid
crossover of digital and analog signals. Traces on opposite sides
of the board must run at right angles to each other. This reduces
the effects of feedthrough on the board. A microstrip technique is
by far the best but is not always possible with a double-sided board.
In this technique, the component side of the board is dedicated
to ground planes while signals are placed on the solder side.
Good decoupling is also important. All analog supplies must
be decoupled with 10 μF tantalum capacitors in parallel with
0.1 μF capacitors to GND. To achieve the best from these
decoupling components, they must be placed as close as
possible to the device.
EVALUATING PERFORMANCE
The evaluation board package includes a fully assembled and
tested evaluation board, documentation, and software for con-
trolling the board from a PC via the evaluation board controller.
The evaluation board controller can be used in conjunction with
the AD7441 and the AD7451 evaluation boards, as well as with
many other Analog Devices, Inc. evaluation boards ending with
the CB designator, to demonstrate and evaluate the ac and dc
performance of the AD7441 and the AD7451.
The software allows the user to perform ac (fast Fourier transform)
and dc (histogram of codes) tests on the AD7441/AD7451. See
the AD7441/AD7451 application note that accompanies the
evaluation kit for more information.
AD7441/AD7451
Rev. D | Page 23 of 24
OUTLINE DIMENSIONS
COMPLIANT TO JEDEC STANDARDS MO-178-BA
121608-A
SEATING
PLANE
1.95
BSC
0.65 BSC
0.60
BSC
76
1234
5
3.00
2.90
2.80
3.00
2.80
2.60
1.70
1.60
1.50
1.30
1.15
0.90
0
.15 MAX
0
.05 MIN
1.45 MAX
0.95 MIN
0.22 MAX
0.08 MIN
0.38 MAX
0.22 MIN
0.60
0.45
0.30
PIN 1
INDICATOR
8
Figure 36. 8-Lead Small Outline Transistor Package [SOT-23]
(RJ-8)
Dimensions shown in millimeters
COMPLIANT TO JEDEC STANDARDS MO-187-AA
100709-B
0.80
0.55
0.40
4
8
1
5
0.65 BSC
0.40
0.25
1.10 MAX
3.20
3.00
2.80
COPLANARITY
0.10
0.23
0.09
3.20
3.00
2.80
5.15
4.90
4.65
PIN 1
IDENTIFIER
15° MAX
0.95
0.85
0.75
0.15
0.05
Figure 37. 8-Lead Mini Small Outline Package [MSOP]
(RM-8)
Dimensions shown in millimeters
AD7441/AD7451
Rev. D | Page 24 of 24
ORDERING GUIDE
Model1 Temperature Range Linearity Error (LSB)2 Package Description Package Option Branding
AD7451ARTZ-REEL7 −40°C to +85°C ± 1.5 8-Lead SOT-23 RJ-8 C3T
AD7451ARMZ −40°C to +85°C ± 1.5 8-Lead MSOP RM-8 C3T
AD7451BRMZ −40°C to +85°C ± 1 8-Lead MSOP RM-8 C3U
AD7441BRTZ-R2 −40°C to +85°C ± 0.5 8-Lead SOT-23 RJ-8 C4M
AD7441BRTZ-REEL7 −40°C to +85°C ± 0.5 8-Lead SOT-23 RJ-8 C4M
AD7441BRMZ −40°C to +85°C ± 0.5 8-Lead MSOP RM-8 C4M
EVAL-AD7451CBZ3 Evaluation Board
EVAL-CONTROL BRD24 Controller Board
1 Z = RoHS Compliant Part.
2 Linearity error here refers to integral nonlinearity error.
3 This can be used as a standalone evaluation board or in conjunction with the evaluation board controller for evaluation/demonstration purposes.
4 The evaluation board controller is a complete unit allowing a PC to control and communicate with all Analog Devices evaluation boards ending in the CB designators.
To order a complete evaluation kit, you must order the ADC evaluation board (EVAL-AD7451CB or EVAL-AD7441CB), the EVAL-CONTROL BRD2, and a 12 V ac
transformer. See the AD7451/AD7441 application note that accompanies the evaluation kit for more information.
©2003–2010 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D03153-0-3/10(D)