LY62W5128
Rev. 1.11 512K X 8 BIT LOW POWER CMOS SRAM
Lyontek Inc. reserves the rights to change the specifications and products without notice.
5F, No. 2, Industry E. Rd. IX, Science-Based Industrial Park, Hsinchu 300, Taiwan.
TEL: 886-3-6668838
FAX: 886-3-6668836
5
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Notes:
1. VIH(max) = VCC + 3.0V for pulse width less than 10ns.
2. VIL(min) = VSS - 3.0V for pulse width less than 10ns.
3. Over/Undershoot specifications are characterized, not 100% tested.
4. Typical values are included for reference only and are not guaranteed or tested.
Typical values are measured at VCC = VCC(TYP.) and TA = 25℃
5. This parameter is measured at VCC = 3.0V
CAPACITANCE (TA = 25 , f℃ = 1.0MHz)
PARAMETER SYMBOL MIN. MA
UNIT
Input Capacitance CIN -6 pF
Input/Output Capacitance CI/O -8 pF
Note : These parameters are guaranteed by device characterization, but not production tested.
AC TEST CONDITIONS
Input Pulse Levels 0.2V to VCC -0.2V
Input Rise and Fall Times 3ns
Input and Output Timing Reference Levels 1.5V
Output Load CL= 30pF + 1TTL, IOH
IOL = -2mA/4m
AC ELECTRICAL CHARACTERISTICS
(1) READ CYCLE
PARAMETER SYM. LY62W5128-55 LY62W5128-70 UNIT
MIN. MAX. MIN. MAX.
Read Cycle Time tRC 55 - 70 - ns
ddress Access Time tAA - 55 - 70 ns
Chip Enable Access Time tACE - 55 - 70 ns
Output Enable Access Time tOE - 30 - 35 ns
Chip Enable to Output in Low-Z tCLZ* 10 - 10 - ns
Output Enable to Output in Low-Z tOLZ*5 - 5 - ns
Chip Disable to Output in High-Z tCHZ* - 20 - 25 ns
Output Disable to Output in High-Z tOHZ* - 20 - 25 ns
Output Hold from Address Change tOH 10 - 10 - ns
(2) WRITE CYCLE
PARAMETER SYM. LY62W5128-55 LY62W5128-70 UNIT
MIN. MAX. MIN. MAX.
Write Cycle Time
WC 55 - 70 - ns
ddress Valid to End of Write tAW 50 - 60 - ns
Chip Enable to End of Write tCW 50 - 60 - ns
ddress Set-up Time tAS 0-0- ns
Write Pulse Width
WP 45 - 55 - ns
Write Recovery Time
WR 0-0- ns
Data to Write Time Overlap tDW 25 - 30 - ns
Data Hold from End of Write Time tDH 0-0- ns
Output Active from End of Write tOW*5 - 5 - ns
Write to Output in High-Z
WHZ* - 20 - 25 ns
*These parameters are guaranteed by device characterization, but not production tested.