AOW12N50/AOWF12N50
500V, 12A N-Channel MOSFET
General Description Product Summary
V
DS
I
D
(at V
GS
=10V) 12A
R
DS(ON)
(at V
GS
=10V) < 0.52Ω
100% UIS Tested
100% R
g
Tested
Symbol
V
DS
V
GS
I
DM
I
AR
E
AR
E
AS
Peak diode recovery dv/dt dv/dt
T
J
, T
STG
T
L
Symbol
R
θ
JA
R
θCS
R
θJC
* Drain current limited by maximum junction temperature.
0.5 --
250
Junction and Storage Temperature Range
Maximum Junction-to-Ambient
A,D
300
-55 to 150
AOW12N50 AOWF12N50
65 65
Units
°C/W
Avalanche Current
C
454
Single plused avalanche energy
G
908
5.5
Repetitive avalanche energy
C
A
V±30Gate-Source Voltage
T
C
=100°C A
48Pulsed Drain Current
C
Continuous Drain
Current
T
C
=25°C I
D
The AOW12N50 & AOWF12N50 have been fabricated
using an advanced high voltage MOSFET process that is
designed to deliver high levels of performance and
robustness in popular AC-DC applications.By providing
low R
DS(on)
, C
iss
and C
rss
along with guaranteed avalanche
capability these parts can be adopted quickly into new and
existing offline power supply designs.
V
UnitsParameter
Absolute Maximum Ratings T
A
=25°C unless otherwise noted
600V@150℃
Drain-Source Voltage 500
AOWF12N50
Maximum Case-to-sink
A
mJ
°C/W
Derate above 25
o
C
Parameter
purpose, 1/8" from case for 5 seconds
Power Dissipation
B
P
D
T
C
=25°C W
Thermal Characteristics
W/
o
C
°C
mJ
V/ns
°C
28
2 0.22
5
Maximum Junction-to-Case 0.5 4.5 °C/W
AOW12N50
12 12*
8.4 8.4*
G
D
S
Top View
TO-262F
Bottom View
Top View
TO-262
Bottom View
GD
S
G
D
S
GD
S
G
D
S
Rev0: June 2010 www.aosmd.com Page 1 of 6
AOW12N50/AOWF12N50
Symbol Min Typ Max Units
500
600
BV
DSS
/∆TJ 0.54 V/
o
C
1
10
I
GSS
Gate-Body leakage current ±100 nΑ
V
GS(th)
Gate Threshold Voltage 3.3 3.9 4.5 V
R
DS(ON)
0.36 0.52 Ω
g
FS
16 S
V
SD
0.72 1 V
I
S
Maximum Body-Diode Continuous Current 12 A
I
SM
48 A
C
iss
1089 1361 1633 pF
C
oss
115 167 218 pF
C
rss
7 12.6 18 pF
R
g
1.8 3.6 5.4 Ω
Q
g
24 30.7 37 nC
Q
gs
6 7.6 9 nC
Q
gd
6 13.0 20 nC
t
D(on)
29 35 ns
t
r
69 83 ns
t
D(off)
82 98 ns
t
f
55.5 67 ns
t
rr
180 231 277 ns
Q
rr
2.2 2.82 3.4 µC
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
µA
V
DS
=0V, V
GS
=±30V
V
Drain-Source Breakdown Voltage I
D
=250µA, V
GS
=0V, T
J
=25°C
I
D
=250µA, V
GS
=0V, T
J
=150°C
BV
DSS
Body Diode Reverse Recovery Charge I
F
=12A,dI/dt=100A/µs,V
DS
=100V
Maximum Body-Diode Pulsed Current
Input Capacitance
Output Capacitance
Turn-On DelayTime
DYNAMIC PARAMETERS
Turn-On Rise Time
Diode Forward Voltage
Turn-Off DelayTime
V
GS
=10V, V
DS
=250V, I
D
=12A,
R
G
=25Ω
Gate resistance V
GS
=0V, V
DS
=0V, f=1MHz
Turn-Off Fall Time
Total Gate Charge
V
GS
=10V, V
DS
=400V, I
D
=12A
Gate Source Charge
Gate Drain Charge
V
DS
=5V
I
D
=250µA
V
DS
=400V, T
J
=125°C
Breakdown Voltage Temperature
Coefficient
I
DSS
Zero Gate Voltage Drain Current V
DS
=500V, V
GS
=0V
I
D
=250µA, V
GS
=0V
Electrical Characteristics (T
J
=25°C unless otherwise noted)
STATIC PARAMETERS
Parameter Conditions
Body Diode Reverse Recovery Time
Static Drain-Source On-Resistance V
GS
=10V, I
D
=6A
Reverse Transfer Capacitance
I
F
=12A,dI/dt=100A/µs,V
DS
=100V
V
GS
=0V, V
DS
=25V, f=1MHz
SWITCHING PARAMETERS
I
S
=1A,V
GS
=0V
V
DS
=40V, I
D
=6A
Forward Transconductance
A. The value of R
θJA
is measured with the device in a still air environment with T
A
=25°C.
B. The power dissipation P
D
is based on T
J(MAX)
=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper
dissipation limit for cases where additional heatsinking is used.
C. Repetitive rating, pulse width limited by junction temperature T
J(MAX)
=150°C, Ratings are based on low frequency and duty cycles to keep initial T
J
=25°C.
D. The R
θJA
is the sum of the thermal impedence from junction to case R
θJC
and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming a
maximum junction temperature of T
J(MAX)
=150°C. The SOA curve provides a single pulse rating.
G. L=60mH, I
AS
=5.5A, V
DD
=150V, R
G
=25Ω, Starting T
J
=25°C
Rev0: June 2010 www.aosmd.com Page 2 of 6
AOW12N50/AOWF12N50
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
40
1.0E-04
1.0E-03
1.0E-02
1.0E-01
1.0E+00
1.0E+01
1.0E+02
0.0 0.2 0.4 0.6 0.8 1.0
V
SD
(Volts)
Figure 6: Body-Diode Characteristics (Note E)
I
S
(A)
25°C
125°C
0
4
8
12
16
20
24
0 5 10 15 20 25 30
V
DS
(Volts)
Fig 1: On-Region Characteristics
I
D
(A)
V
GS
=5.5V
6V
10V
6.5V
0.1
1
10
100
2 4 6 8 10
V
GS
(Volts)
Figure 2: Transfer Characteristics
I
D
(A)
-55°C
V
DS
=40V
25°C
125°C
0.3
0.4
0.5
0.6
0.7
0.8
0 4 8 12 16 20 24 28
I
D
(A)
Figure 3: On-Resistance vs. Drain Current and Gate
Voltage
R
DS(ON)
(Ω)
V
GS
=10V
0
0.5
1
1.5
2
2.5
3
-100 -50 0 50 100 150 200
Temperature (°C)
Figure 4: On-Resistance vs. Junction Temperature
Normalized On-Resistance
V
GS
=10V
I
D
=6A
0.8
0.9
1
1.1
1.2
-100 -50 0 50 100 150 200
T
J
(°C)
Figure 5: Break Down vs. Junction Temperature
BV
DSS
(Normalized)
Rev0: June 2010 www.aosmd.com Page 3 of 6
AOW12N50/AOWF12N50
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
0
3
6
9
12
15
0 5 10 15 20 25 30 35 40 45
Q
g
(nC)
Figure 7: Gate-Charge Characteristics
V
GS
(Volts)
V
DS
=400V
I
D
=12A
1
10
100
1000
10000
0.1 1 10 100
V
DS
(Volts)
Figure 8: Capacitance Characteristics
Capacitance (pF)
C
iss
C
oss
C
rss
0.01
0.1
1
10
100
1 10 100 1000
V
DS
(Volts)
I
D
(Amps)
Figure 9: Maximum Forward Biased Safe
Operating Area for AOW12N50 (Note F)
10
µ
s
10ms
1ms
DC
R
DS(ON)
limited
T
J(Max)
=150°C
T
C
=25°C
100
µ
s
0.01
0.1
1
10
100
1 10 100 1000
V
DS
(Volts)
I
D
(Amps)
Figure 10: Maximum Forward Biased Safe
Operating Area for AOWF12N50 (Note F)
10
µ
s
10ms
1ms
0.1s
DC
R
DS(ON)
limited
T
J(Max)
=150°C
T
C
=25°C
100
µ
s
1s
0
3
6
9
12
15
0 25 50 75 100 125 150
T
CASE
(°C)
Figure 11: Current De-rating (Note B)
Current rating I
D
(A)
Rev0: June 2010 www.aosmd.com Page 4 of 6
AOW12N50/AOWF12N50
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
0.01
0.1
1
10
0.00001 0.0001 0.001 0.01 0.1 1 10 100
Pulse Width (s)
Figure 12: Normalized Maximum Transient Thermal Impedance for AOW12N50 (Note F)
Z
θJC
Normalized Transient
Thermal Resistance
D=T
on
/T
T
J,PK
=T
C
+P
DM
.Z
θJC
.R
θJC
R
θJC
=0.5°C/W
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
T
on
T
P
D
Single Pulse
0.001
0.01
0.1
1
10
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
Pulse Width (s)
Figure 13: Normalized Maximum Transient Thermal Impedance for AOWF12N50 (Note F)
Z
θJC
Normalized Transient
Thermal Resistance
D=T
on
/T
T
J,PK
=T
C
+P
DM
.Z
θJC
.R
θJC
R
θJC
=4.5°C/W
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
Single Pulse
T
on
T
P
D
Rev0: June 2010 www.aosmd.com Page 5 of 6
AOW12N50/AOWF12N50
-
+
VDC
Ig
Vds
DUT
-
+
VDC
Vgs
Vgs
10V
Qg
Qgs Qgd
Charge
Gate Charge Test Circuit & Waveform
-
+
VDC
DUT Vdd
Vgs
Vds
Vgs
RL
Rg
Vgs
Vds
10%
90%
Resistive Switching Test Circuit & Waveforms
t t
r
d(on)
t
on
t
d(off)
t
f
t
off
Vdd
Vgs
Id
Vgs
Rg
DUT
-
+
VDC
L
Vgs
Vds
Id
Vgs
BV
I
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms
Ig
Vgs
-
+
VDC
DUT
L
Vds
Vgs
Vds
Isd
Isd
Diode Recovery Test Circuit & Waveforms
Vds -
Vds +
I
F
AR
DSS
2
E = 1/2 LI
dI/dt
I
RM
rr
Vdd
Vdd
Q = - Idt
t
rr
AR
AR
Rev0: June 2010 www.aosmd.com Page 6 of 6