eS 4 Meg x 4 bit CMOS Dynamic Random Access Memory * Access Times: 60 and 70ns + 32ms Refresh Rate * Low Operating Power Dissipation * Low Standby Power > Common lO * All Inputs/Outputs TTL Compatible Package Style > 24/28 Thinpack Flatpack > 24/28 Pin Flatpack Single +5 (+10%) Supply Operation PRM eCUeny veel oo Lo 26 VSS 0a12co bro 27004 0a23 co Es 2g 003 w 40 fC 25 CAS Rass CO fo 24.G\ nc 6CQ [4 23 A5 4108c5 fT 20 a8 A0 1c ES if A7 Al 11-4 PO 1g A6 a2 12-7 [T1745 a3 1300 FO gaa voc14C Fo is vss EDI444096C 4Megr4 Fast Page DRAM 4 Megabit x 4 Dynamic RAM 5U Fast Page The EDI444096C is a high perfomance, lov power CMOS Dynamic RAM organized as 4 Megabit x 4. During READ and WRITE cycles each bit is addressed through 22 address bits which are entered 11 at a time (A@- A10). RAS\ is used to latch the first 11 bits and CAS\, the second 11 bits. A READ or WRITE cydeis selected with the WA input. A logic HIGH on WA dictates READ mode, while a logic LOW on W\ dictates WRITE mode. During a WRITE cyde Data-inis latched by thefalling edgeaf WiorCASt whichever occurslast. IFW goeslow priartoCAS\ going LOW, the output pins remain open (HIGH-Z) until the next CAS\ cycle, regardless of the status of G\. If Wi goes LOW after data reaches the output pins, Data-out pins are activated andretain the selectedcell data aslongasC AS\ and Giremain LOW, regardess of Wi or RAS\. This late Wi pulse results in a DELAYED WRITE or READ-WRITE cyde. The four data inputs and four data outputs are routed through four pins using common I/O and pin direction is controlled by W\and Gl. FAST PAGE MODE operations allow faster data operations, READ, WRITE or READ-MODIFY-WRITE, within a row address. Allinputs and outputs are TTL compatible and operate from a single 5 volt supply. Note WALOW priorte CAS\ LOW, EW detection circuit output is a HlGH {EARLY WRITE). CAS\LOW priorto Wi LOW, EW detection circuit output isa LOW (LATE WRITE). Pin Names AG-A10 Address Inputs CASI Column Address Strobe RAS\ Raw Address Strobe wi Write Control Input G\ Quipul Enable DO1-DO4 Data Inputs/Ouiputs vcc Power (+5V410%) vss Ground NC No Connedion Electronic Designs Incorporated + One Research Drive + Westborough, MA 01581 USA + 508-366-5151 + FAX 508-836-4850 http://www. lectronic-designs.com 7 Endaanesc Rey 2d son ECO nas,sie MRE ea wt t CAS. Pow ale Sesae Amplifier contal Address | Buffers (14) FT ern en ent | pw Desoder | 208 a Data In 4 \_______te [fom AS Buffers be | bee patie OCS Enily White Detection Grout 4 =F >} Date un pat a w| Bules Yt) Py a Column n Decoder | oat , ~io yoo 2 vss Recommended DC Operating Conditions Note Vollage on any pin relative to VSS -L.0V to 7.0V Parameter m Mn TT Max Units Operating Temperature TA (Ambient) Supply Voltage vec 45 450 #55 V Industrial A0T to +85T Supply Vollage VSS 0 0 0 V Military -55C 10 +125. Input High Votage VIH_ 2.4 - Veer] V Storage Temperature (Ceramic) 645T to +150T InputLow Votage VIL -1.0- ag sv Power Dissipation 1 Watt Qulput Current 50 mA Notes: 1. All voltage values are with respect taV'SS. *Siress greater than those listed under "Absolute Maximum Ratings may cause pemanent damage tothe device Thisis.a cress rating only and functional operaion of the device at these or any other conditions qreater than those indicated inthe operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may aifect reliability. Swe PMs em eet (VCC = 5.0 410%) Nate 2 Parameter Sym Conditions Mn Typ Max Units Average Supply Current fram VCC IcC1 RAS, CASI Cycing 10 mA Operaing (Noles 3 4) TRC = TWC = Min, Quiput Open Supply Curent from VCC ICC2 RAS\ = CAS\= VIH, Quipuis Open 2 mA Standby RAS\ = CAS\ 2 VCC41?, Quiputs Open 2 mA Average Supply Current from VOC ICC3 RAS\ Cycing, CAS\= IH 100m Refreshing (Nate 3} TRC = Min, Quiputs Open Average Supply Current from VCC Icc4 RASt= VIL, CASI = Cycing 80 mA Fast Page Mode (Notes 3 4) TPC = Min, Quiputs Gpen Average Supply Current from VCC ICC CAS| before RAS\ Refresh Cycing 100 mA CASibefore RAS\ Refresh Made (Nate 3) TRC = Min Quiputs Open Input Curent Il OVS VIN S55V 2 2 WA All Other Input Pins= OV OM-Slale Output Curent 10 Q Floaing OVS V QUTS 55V -10 10 LA Quiput High Voltage VOH 1OH = -5mA 24 ve V Output Low Voltage VOL IOL= 4.2mA 0 = 04 V Notes: 2. Currert flowing intoan |C is positive, out is negative. 3, ICC fay), |CC3fay), |CCafay), and |OCE are dependent on eyele rate. Maximumeurtent is measured at the fastest eyde rate. 4, /CC' fay), and |CCa{ay) are dependent on outputloading Specified values are obtained wih the output open ED444096C 4Mog x4 Fast Page O A i 2 ERdddnec Rey 2 fon ECoR naasEDI444096C | 4Megu4d Fasi Page DRAM (f1.0MHz, VN=VCC or VSS) Parameter Sym Test Conditions Mn Typ Max Unit Address Input Capacitance CA VW= VSS 6G pF Input Capacitance (D) cD f= MHz & pF Input Capacitance (CAS WW, RAS) cc, CW, CR Vis 25nVims 7 pF Qulput Capacitance (Q) co VO = VSS f= 1MHz, Vi= 24mVims 8 opr The EDI444096C provides, in addition to namal Read, Wiite, and Read-modify-Wrte ACT = Adive VLD = Valid operations, a number of other funciions, eg. Fast Page Made, RAS\-only Refresh, and = NAC= Non-active APD = Applied Delayed Wiile. The inpul conditians for each are shown below. DNC= Don't care OPN = Open Inputs Input/Output Operation RAS = CAS\ WG Row Column OD Q Address Address Read ACT ACT NAC ACT APD APD OPN VLD Early Write* ACT ACT ACT DNC APD APD VLD OPN ReadModify-Write ACT ACT ACT ACT APD APD VLD VLD RAS\-only Refresh ACT NAC DNC DNC APD DNC DNC OPN Hidden Refresh ACT ACT DNC ACT APD DNC OPN VLD CAStbefore RAS\ Refresh ACT ACT ACT DNC DNC DNC DNC OPN Standby NAC DNC DNC DNC DNC DNC DNC OPN *Fast Page Mode | dentical (VCC=5. 0V210%8) Note ,11,12 60ns 7dns Parameter Sym Min Max Min Max Units Notes Access Time fram CAS\ Tcac 20 20 ns 67 Access Time from RAS| TRAC 60 70 ns 68 Column Address Access Time TCAA 35 Bb ns 6 Access Time from CAS\ Precharge TCPA 40 40 ns. Access Time from G\ TOEA 20 20 ns 6 Quiput Low Impedance Time from CAS\ law TCL? 3 3 ns 9 Oulput Disable Time ale CAS\Hidh TOFF 3 20 3 40 ns 10 Qutput Disable Time after Gi High TDISOE 3 20 3 0 ns 10 Notes: & Aninitial pause of 100usis required ater power-up, fallowedby any RAS\ only refresh or CAS\ before RAS\ refresh eycles with WA HIGH before proper device operation is achieved N ote tha: RAS\ may be cycled during the initial pause, Any RAS\ only refresh or CAS\ before RAS\ refresh eydes with Wi HIGH are required alter prolonged periods of RASK inactivity before proper device operation. Measured with a load circuit equivalert to 2TTL loads and 100pF. Assumes that TRCD > TRCD (max). Assumes that TRCD