
IGBT MODULE
MBN1200D33C
Silicon N-channel IGBT OUTLINE DRAWING
6-M8
3-M4
8-φ7
Weight:1,200g
Unit in mm
FEATURES
∗ High speed, low loss IGBT module.
∗ Low driving power due to low input
capacitance MOS gate.
∗ Low noise due to ultra soft fast recovery diode.
∗ High reliability, high durability module.
∗ High thermal fatigue durability.
(delta Tc=70°C, N>20,000cycles)
∗ Isolated head sink (terminal to base).
CIRCUIT DIAGRAM
TERMINALS
G
EEEE
CCCC
ABSOLUTE MAXIMUM RATINGS (Tc=25oC )
Item Symbol Unit MBN1200D33C
Collector Emitter Voltage VCES V 3,300
Gate Emitter Voltage VGES V ±20
DC IC 1,200
Collector Current 1ms ICp A 2,400
DC IF 1,200
Forward Current 1ms IFM A 2,400
Junction Temperature T
j oC -40 ~ +125
Storage Temperature T
stg oC -40 ~ +125
Isolation Voltage V
ISO V
RMS 6,000(AC 1 minute)
Terminals (M4/M8) - 2/10 (1)
Screw Torque Mounting (M6) - N·m 6 (2)
Notes: (1) Recommended Value 1.8±0.2/9±1N·m (2) Recommended Value 5.5±0.5N·m
ELECTRICAL CHARACTERISTICS
Item Symbol Unit Min. Typ. Max. Test Conditions
- - 12 VCE=3,300V, VGE=0V, Tj=25oC
Collector Emitter Cut-Off Current I CES mA - 30 60 VCE=3,300V, VGE=0V, Tj=125oC
Gate Emitter Leakage Current IGES nA -500 - +500 VGE=±20V, VCE=0V, Tj=25oC
Collector Emitter Saturation Voltage VCE(sat) V - 4.8 5.4 IC=1,200A, VGE=15V, Tj=125oC
Gate Emitter Threshold Voltage VGE(TO) V 4.0 5.5 6.5 VCE=10V, IC=1,200mA, Tj=25oC
Input Capacitance Cies nF - 140 - VCE=10V, VGE=0V, f=100kHz, Tj=25oC
Rise Time tr - 2.0 3.2 VCC=1,650V, Ic=1,200A
Turn On Time ton - 2.9 3.8 L=100nH
Fall Time tf - 1.7 3.2 RG=3.3Ω (3)
Switching Times
Turn Off Time toff
µs
- 3.5 5.6 VGE=±15V, Tj=125oC
Peak Forward Voltage Drop VFM V - 2.5 2.75 Ic=1,200A, VGE=0V, Tj=125oC
Reverse Recovery Time trr µs - 0.8 1.4
Vcc=1,650V, Ic=1,200A, L=100nH
Tj=125oC
Turn On Loss Eon(10%) J/P 2.1 2.75
Turn Off Loss Eoff(10%) J/P 1.6 2.1
Reverse Recovery Loss Err(10%) J/P 1.5 2.1
VCC=1,650V, Ic=1,200A, L=100nH
RG=3.3Ω (3)
VGE=±15V, Tj=125oC
IGBT Rth(j-c) - - 0.008
Thermal Impedance FWD Rth(j-c) oC/W - - 0.016 Junction to case
Notes:(3) RG value is the test condition’s value for evaluation of the switching times, not recommended value.
Please, determine the suitable RG value after the measurement of switching waveforms
(overshoot voltage, etc.) with appliance mounted.
* Please contact our representatives at order.
* For improvement, specifications are subject to change without notice.
* For actual application, please confirm this spec sheet is the newest revision.
PDE-N1200D33C-1