2SP0325x2Ax-CM1800DY-34S
Preliminary Data Sheet
www.IGBT-Driver.com Page 6
Footnotes to the Key Data
1) Both supply voltages VDC and VCC should be applied in parallel.
2) The gate current is limited by the gate resistors located on the driver and the internal gate resistance
of the IGBT module.
3) If the specified value is exceeded, this indicates a driver overload. It should be noted that the driver is
not protected against overload.
4) This limit is due to active clamping. Refer to “Description & Application Manual for 2SP0325T SCALE-2
IGBT Drivers” (electrical interface) or “Description & Application Manual for 2SP0325V SCALE-2 IGBT
Drivers” (fiber-optic interface).
5) Undervoltage monitoring of the primary-side supply voltage (VCC to GND). If the voltage drops below
this limit, a fault is transmitted to the corresponding output(s) (2SP0325T and 2SP0325V) and the
IGBTs are switched off (only 2SP0325T).
6) The input impedance can be modified (customer-specific solution).
7) Turn-on and turn-off threshold values can be modified (customer-specific solution).
8) The pulse width resulting from the direct output of the gate drive unit for half-bridge short circuits
(excluding the delay of the gate resistors) is the sum of the response time plus the delay to IGBT
turn-off. The short-circuit time may vary depending on the exact short-circuit conditions. Note that
Mitsubishi’s short-circuit SOA CMH-10028 does not allow short-circuit inductances smaller than 10uH
for external short circuits with CM1800DY-34S 300G, and that Mitsubishi’s short-circuit SOA
CMH-10029 does not allow short-circuit inductances smaller than 5uH for external short circuits with
CM1800DY-34S 302G.
9) The turn-off event of the IGBT is delayed by the specified time after the response time.
10) Factory set value. The blocking time can be reduced with an external resistor. Refer to “Description &
Application Manual for 2SP0325T SCALE-2 IGBT Drivers”.
11) Measured from the transition of the turn-on or turn-off command at the driver input to direct output
of the gate drive unit (excluding the delay of the gate resistors).
12) Including the delay of the external fiber-optic links. Measured from the transition of the turn-on or
turn-off command at the optical transmitter on the host controller side to the direct output of the gate
drive unit (excluding the delay of the gate resistors).
13) Output rise and fall times are measured between 10% and 90% of the nominal output swing with an
output load of 1Ω (rise time)/2Ω (fall time) and 660nF. The values are given for the driver side of the
gate resistors.
14) Transmission delay of the fault state from the secondary side to the primary status outputs.
15) Measured on the host side. The fault status on the secondary side is automatically reset after the
specified time.
16) Including the delay of the external fiber-optic links. Measured from the transition of the turn-on or
turn-off command at the optical transmitter on the host controller side to the transition of the
acknowledge signal at the optical receiver on the host controller side.
17) The gate resistors can be leaded or surface mounted. CONCEPT reserves the right to determine which
type will be used. Typically, higher quantities will be produced with SMD resistors and small quantities
with leaded resistors.
18) With “Yes”, a dv/dt feedback reduces the rate of rise of the collector-emitter voltage of the IGBTs at
turn-off. For more information, refer to the “Description & Application Manual for 2SP0325T SCALE-2
IGBT Drivers” (electrical interface), or the “Description & Application Manual for 2SP0325V SCALE-2
IGBT Drivers” (fiber-optic interface). With “No”, no dv/dt feedback is implemented.
19) HiPot testing (= dielectric testing) must generally be restricted to suitable components. This gate
driver is suited for HiPot testing. Nevertheless, it is strongly recommended to limit the testing time to
1s slots as stipulated by EN 50178. Excessive HiPot testing at voltages much higher than 1200VAC(eff)
may lead to insulation degradation. No degradation has been observed over 1min. testing at
5000VAC(eff). Every production sample shipped to customers has undergone 100% testing at the given
value for 1s.
20) This specification guarantees that the drive information will be transferred reliably even at a high DC-
link voltage and with ultra-fast switching operations.