Features
1 of 8
Optimum Technology
Matching® Applied
GaAs HBT
InGaP HBT
GaAs MESFET
SiGe BiCMOS
Si BiCMOS
SiGe HBT
GaAs pHEMT
Si CMOS
Si BJT
GaN HEMT
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Product Description
7628 Thorndike Road, Greensboro, NC 27409-9421 · For sales or technical
support, contact RFMD at (+1) 336-678-5570 or sales-support@rfmd.com.
RF MEMS
SGB-2433(Z)
DC to 4GHZ ACTIVE BIAS GAIN BLOCK
RFMD’s SGB-2433 is a high performance SiGe HBT MMIC amplifier utilizing a Dar-
lington configuration with an active bias network. The active bias network provides
stable current over temperature and process Beta variations. Designed to run
directly from a 3Vto5V supply the SGB-2433 does not require a drop resistor as
compared to typical Darlington amplifiers. This robust amplifier features a Class 1C
ESD rating, low thermal resistance, and unconditional stability. The SGB-2433 prod-
uct is designed for high linearity 3V gain block applications that require small size
and minimal external components. It is on chip matched to 50Ω and an external
bias inductor choke is required for the application band.
VCC
NC
NC
GND
NC
NC
NC
Vbias
NC
NC
NC
RFIN
NC
RFOUT
NC
NC
Active
Bias
High Reliability SiGe HBT
Technology
Robust Class 1C ESD
Simple and Small Size
P1dB=6.9dBm at 1950MHz
IP3=18.0dBm at 1950MHz
Low Thermal
Resistance=221C/W
Applications
3V Battery Operated Applica-
tions
LO Buffer Amp
RF Pre-Driver and RF Receive
Path
EDS-103083 Rev H
Preliminary
9
RFMD Green, RoHS Compliant, Pb-Free (Z Part Number)
Package: 3 x3 QFN, 16-Pin
SGB-2433(Z)
DC to 4GHz
Active Bias
Gain Block
Parameter Specification Unit Condition
Min. Typ. Max.
Small Signal Gain 19.1 dB 850MHz
15.7 17.2 18.7 dB 1950MHz
16.2 dB 2400 MHz
Output Power at 1dB Compression 7.7 dBm 850MHz
5.4 6.9 dBm 1950MHz
6.2 dBm 2400MHz
Output Third Order Intercept Point 19.5 dB 850MHz
16.0 18.0 dB 1950MHz
18.0 dB 2400MHz
Noise Figure 3.5 4.5 dB 1950MHz
Frequency of Operation DC 4000 MHz
Current, IC21.0 25.0 29.0 mA
Input Return Loss 10.0 13.4 dB 1950MHz
Output Return Loss 10.0 13.6 dB 1950MHz
Thermal Resistance 221 °C/W junction to backside
Test Conditions: Z0=50Ω, VCC=3V, IC=25mA, T=30°C