LTC2248/LTC2247/LTC2246
1
224876fa
FEATURES
DESCRIPTIO
U
APPLICATIO S
U
TYPICAL APPLICATIO
U
Sample Rate: 65Msps/40Msps/25Msps
Single 3V Supply (2.7V to 3.4V)
Low Power: 205mW/120mW/75mW
74.3dB SNR
90dB SFDR
No Missing Codes
Flexible Input: 1V
P-P
to 2V
P-P
Range
575MHz Full Power Bandwidth S/H
Clock Duty Cycle Stabilizer
Shutdown and Nap Modes
Pin Compatible Family
125Msps: LTC2253 (12-Bit), LTC2255 (14-Bit)
105Msps: LTC2252 (12-Bit), LTC2254 (14-Bit)
80Msps: LTC2229 (12-Bit), LTC2249 (14-Bit)
65Msps: LTC2228 (12-Bit), LTC2248 (14-Bit)
40Msps: LTC2227 (12-Bit), LTC2247 (14-Bit)
25Msps: LTC2226 (12-Bit), LTC2246 (14-Bit)
10Msps: LTC2225 (12-Bit), LTC2245 (14-Bit)
32-Pin (5mm × 5mm) QFN Package
14-Bit, 65/40/25Msps
Low Power 3V ADCs
The LTC
®
2248/LTC2247/LTC2246 are 14-bit 65Msps/
40Msps/25Msps, low power 3V A/D converters designed
for digitizing high frequency, wide dynamic range signals.
The LTC2248/LTC2247/LTC2246 are perfect for demand-
ing imaging and communications applications with AC
performance that includes 74.3dB SNR and 90dB SFDR
for signals at the Nyquist frequency.
DC specs include ±1LSB INL (typ), ±0.5LSB DNL (typ) and
no missing codes over temperature. The transition noise
is a low 1LSB
RMS
.
A single 3V supply allows low power operation. A separate
output supply allows the outputs to drive 0.5V to 3.6V
logic.
A single-ended CLK input controls converter operation. An
optional clock duty cycle stabilizer allows high perfor-
mance at full speed for a wide range of clock duty cycles.
+
INPUT
S/H
CORRECTION
LOGIC
OUTPUT
DRIVERS
14-BIT
PIPELINED
ADC CORE
CLOCK/DUTY
CYCLE
CONTROL
FLEXIBLE
REFERENCE
D13
D0
CLK
REFH
REFL
ANALOG
INPUT
2249 TA01a
OVDD
OGND
INPUT FREQUENCY (MHZ)
0
SNR (dBFS)
200
2249 TAO1b
50 100 150
75
74
73
72
71
70
LTC2248: SNR vs Input Frequency,
–1dB, 2V Range, 65Msps
Wireless and Wired Broadband Communication
Imaging Systems
Ultrasound
Spectral Analysis
Portable Instrumentation
, LTC and LT are registered trademarks of Linear Technology Corporation.
All other trademarks are the property of their respective owners.
LTC2248/LTC2247/LTC2246
2
224876fa
ABSOLUTE AXI U RATI GS
W
WW
U
PACKAGE/ORDER I FOR ATIO
UUW
OVDD = VDD (Notes 1, 2)
Supply Voltage (V
DD
) ................................................. 4V
Digital Output Ground Voltage (OGND) ....... 0.3V to 1V
Analog Input Voltage (Note 3) ..... 0.3V to (V
DD
+ 0.3V)
Digital Input Voltage .................... 0.3V to (V
DD
+ 0.3V)
Digital Output Voltage ................ 0.3V to (OV
DD
+ 0.3V)
Power Dissipation............................................ 1500mW
Operating Temperature Range
LTC2248C, LTC2247C, LTC2246C........... 0°C to 70°C
LTC2248I, LTC2247I, LTC2246I ..........40°C to 85°C
Storage Temperature Range ..................65°C to 125°C
The denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C. (Note 4)
LTC2248 LTC2247 LTC2246
PARAMETER CONDITIONS MIN TYP MAX MIN TYP MAX MIN TYP MAX UNITS
Resolution 14 14 14 Bits
(No Missing Codes)
Integral Differential Analog Input –4 ±144±144±14 LSB
Linearity Error (Note 5)
Differential Differential Analog Input –1 ±0.5 1 1 ±0.5 1 1 ±0.5 1 LSB
Linearity Error
Offset Error (Note 6) –12 ±21212±21212±212 mV
Gain Error External Reference 2.5 ±0.5 2.5 2.5 ±0.5 2.5 2.5 ±0.5 2.5 %FS
Offset Drift ±10 ±10 ±10 µV/°C
Full-Scale Drift Internal Reference ±30 ±30 ±30 ppm/°C
External Reference ±5±5±5 ppm/°C
Transition Noise SENSE = 1V 1 1 1 LSB
RMS
CO VERTER CHARACTERISTICS
U
T
JMAX
= 125°C, θ
JA
= 34°C/W
EXPOSED PAD IS GND (PIN 33)
MUST BE SOLDERED TO PCB
32 31 30 29 28 27 26 25
910 11 12
TOP VIEW
UH PACKAGE
32-LEAD (5mm × 5mm) PLASTIC QFN
13 14 15 16
17
18
19
20
21
22
23
24
8
7
6
5
4
3
2
1AIN+
AIN
REFH
REFH
REFL
REFL
VDD
GND
D10
D9
D8
OVDD
OGND
D7
D6
D5
VDD
VCM
SENSE
MODE
OF
D13
D12
D11
CLK
SHDN
OE
D0
D1
D2
D3
D4
33
ORDER PART NUMBER
Consult LTC Marketing for parts specified with wider operating temperature ranges.
*The temperature grade is identified by a label on the shipping container.
LTC2248CUH
LTC2248IUH
LTC2247CUH
LTC2247IUH
LTC2246CUH
LTC2246IUH
Order Options Tape and Reel: Add #TR
Lead Free: Add #PBF Lead Free Tape and Reel: Add #TRPBF
Lead Free Part Marking: http://www.linear.com/leadfree/
QFN PART MARKING*
2248
2248
2247
2247
2246
2246
LTC2248/LTC2247/LTC2246
3
224876fa
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
V
IN
Analog Input Range (A
IN+
– A
IN
) 2.7V < V
DD
< 3.4V (Note 7) ±0.5V to ±1V V
V
IN,CM
Analog Input Common Mode (A
IN+
+ A
IN
)/2 Differential Input (Note 7) 1 1.5 1.9 V
Single Ended Input (Note 7) 0.5 1.5 2 V
I
IN
Analog Input Leakage Current 0V < A
IN+
, A
IN
< V
DD
–1 1 µA
I
SENSE
SENSE Input Leakage 0V < SENSE < 1V –3 3 µA
I
MODE
MODE Pin Leakage –3 3 µA
t
AP
Sample-and-Hold Acquisition Delay Time 0 ns
t
JITTER
Sample-and-Hold Acquisition Delay Time Jitter 0.2 ps
RMS
CMRR Analog Input Common Mode Rejection Ratio 80 dB
Full Power Bandwidth Figure 8 Test Circuit 575 MHz
The denotes the specifications which apply over the full operating temperature range,
otherwise specifications are at TA = 25°C. AIN = –1dBFS. (Note 4)
LTC2248 LTC2247 LTC2246
SYMBOL PARAMETER CONDITIONS MIN TYP MAX MIN TYP MAX MIN TYP MAX UNITS
SNR Signal-to-Noise Ratio 5MHz Input 74.3 74.4 74.5 dB
12.5MHz Input 72.9 74.2 dB
20MHz Input 72.9 74.4 dB
30MHz Input 72.5 74.3 dB
70MHz Input 74.3 73.9 73.4 dB
140MHz Input 73.9 73.3 73 dB
SFDR 5MHz Input 90 90 90 dB
12.5MHz Input 76 90 dB
20MHz Input 76 90 dB
30MHz Input 76 90 dB
70MHz Input 85 85 85 dB
140MHz Input 80 80 80 dB
SFDR 5MHz Input 95 95 95 dB
12.5MHz Input 84 95 dB
20MHz Input 84 95 dB
30MHz Input 84 95 dB
70MHz Input 95 95 95 dB
140MHz Input 90 90 90 dB
S/(N+D) 5MHz Input 74.3 74.4 74.5 dB
12.5MHz Input 72.2 74.2 dB
20MHz Input 72.2 74.3 dB
30MHz Input 72 74.2 dB
70MHz Input 74.1 73.6 73.4 dB
140MHz Input 71.9 71.9 71.8 dB
I
MD
Intermodulation f
IN1
= 28.2MHz 90 90 90 dB
Distortion f
IN2
= 26.8MHz
A ALOG I PUT
UU
DY A IC ACCURACY
U
W
The denotes the specifications which apply over the full operating temperature range, otherwise
specifications are at TA = 25°C. (Note 4)
Signal-to-Noise
Plus Distortion
Ratio
Spurious Free
Dynamic Range
4th Harmonic
or Higher
Spurious Free
Dynamic Range
2nd or 3rd
Harmonic
LTC2248/LTC2247/LTC2246
4
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DIGITAL I PUTS A D DIGITAL OUTPUTS
UU
The denotes the specifications which apply over the
full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4)
I TER AL REFERE CE CHARACTERISTICS
UU U
(Note 4)
POWER REQUIRE E TS
WU
The denotes the specifications which apply over the full operating temperature
range, otherwise specifications are at TA = 25°C. (Note 8)
LTC2248 LTC2247 LTC2246
SYMBOL PARAMETER CONDITIONS MIN TYP MAX MIN TYP MAX MIN TYP MAX UNITS
V
DD
Analog Supply (Note 9) 2.7 3 3.4 2.7 3 3.4 2.7 3 3.4 V
Voltage
OV
DD
Output Supply (Note 9) 0.5 3 3.6 0.5 3 3.6 0.5 3 3.6 V
Voltage
IV
DD
Supply Current 68.3 80 40 48 25 30 mA
P
DISS
Power Dissipation 205 240 120 144 75 90 mW
P
SHDN
Shutdown Power SHDN = H, 2 2 2 mW
OE = H, No CLK
P
NAP
Nap Mode Power SHDN = H, 15 15 15 mW
OE = L, No CLK
PARAMETER CONDITIONS MIN TYP MAX UNITS
V
CM
Output Voltage I
OUT
= 0 1.475 1.500 1.525 V
V
CM
Output Tempco ±25 ppm/°C
V
CM
Line Regulation 2.7V < V
DD
< 3.4V 3 mV/V
V
CM
Output Resistance –1mA < I
OUT
< 1mA 4
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
LOGIC INPUTS (CLK, OE, SHDN)
V
IH
High Level Input Voltage V
DD
= 3V 2V
V
IL
Low Level Input Voltage V
DD
= 3V 0.8 V
I
IN
Input Current V
IN
= 0V to V
DD
–10 10 µA
C
IN
Input Capacitance (Note 7) 3 pF
LOGIC OUTPUTS
OV
DD
= 3V
C
OZ
Hi-Z Output Capacitance OE = High (Note 7) 3 pF
I
SOURCE
Output Source Current V
OUT
= 0V 50 mA
I
SINK
Output Sink Current V
OUT
= 3V 50 mA
V
OH
High Level Output Voltage I
O
= –10µA 2.995 V
I
O
= –200µA2.7 2.99 V
V
OL
Low Level Output Voltage I
O
= 10µA 0.005 V
I
O
= 1.6mA 0.09 0.4 V
OV
DD
= 2.5V
V
OH
High Level Output Voltage I
O
= –200µA 2.49 V
V
OL
Low Level Output Voltage I
O
= 1.6mA 0.09 V
OV
DD
= 1.8V
V
OH
High Level Output Voltage I
O
= –200µA 1.79 V
V
OL
Low Level Output Voltage I
O
= 1.6mA 0.09 V
LTC2248/LTC2247/LTC2246
5
224876fa
TI I G CHARACTERISTICS
UW
The denotes the specifications which apply over the full operating temperature
range, otherwise specifications are at TA = 25°C. (Note 4)
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: All voltage values are with respect to ground with GND and OGND
wired together (unless otherwise noted).
Note 3: When these pin voltages are taken below GND or above V
DD
, they
will be clamped by internal diodes. This product can handle input currents
of greater than 100mA below GND or above V
DD
without latchup.
Note 4: V
DD
= 3V, f
SAMPLE
= 65MHz (LTC2248), 40MHz (LTC2247), or
25MHz (LTC2246), input range = 2V
P-P
with differential drive, unless
otherwise noted.
Note 5: Integral nonlinearity is defined as the deviation of a code from a
straight line passing through the actual endpoints of the transfer curve.
The deviation is measured from the center of the quantization band.
Note 6: Offset error is the offset voltage measured from –0.5 LSB when
the output code flickers between 00 0000 0000 0000 and
11 1111 1111 1111.
Note 7: Guaranteed by design, not subject to test.
Note 8: V
DD
= 3V, f
SAMPLE
= 65MHz (LTC2248), 40MHz (LTC2247), or
25MHz (LTC2246), input range = 1V
P-P
with differential drive.
Note 9: Recommended operating conditions.
LTC2248 LTC2247 LTC2246
SYMBOL PARAMETER CONDITIONS MIN TYP MAX MIN TYP MAX MIN TYP MAX UNITS
f
s
Sampling Frequency (Note 9) 165140125MHz
t
L
CLK Low Time Duty Cycle Stabilizer Off 7.3 7.7 500 11.8 12.5 500 18.9 20 500 ns
Duty Cycle Stabilizer On 5 7.7 500 5 12.5 500 5 20 500 ns
(Note 7)
t
H
CLK High Time Duty Cycle Stabilizer Off 7.3 7.7 500 11.8 12.5 500 18.9 20 500 ns
Duty Cycle Stabilizer On 5 7.7 500 5 12.5 500 5 20 500 ns
(Note 7)
t
AP
Sample-and-Hold 0 0 0 ns
Aperture Delay
t
D
CLK to DATA delay C
L
= 5pF (Note 7) 1.4 2.7 5.4 1.4 2.7 5.4 1.4 2.7 5.4 ns
Data Access Time C
L
= 5pF (Note 7) 4.3 10 4.3 10 4.3 10 ns
After OE
BUS Relinquish Time (Note 7) 3.3 8.5 3.3 8.5 3.3 8.5 ns
Pipeline 5 5 5 Cycles
Latency
LTC2248: Typical DNL,
2V Range, 65Msps
LTC2248: Typical INL,
2V Range, 65Msps
CODE
0
INL ERROR (LSB)
12288
2248 G01
4096 8192 16384
2.0
1.5
1.0
0.5
0
0.5
1.0
1.5
2.0
CODE
0
DNL ERROR (LSB)
12288
2248 G02
4096 8192 16384
1.00
0.75
0.50
0.25
0
0.25
0.50
0.75
1.00
TYPICAL PERFOR A CE CHARACTERISTICS
UW
LTC2248/LTC2247/LTC2246
6
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FREQUENCY (MHz)
0
AMPLITUDE (dB)
2248 G03
510152025
30
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
FREQUENCY (MHz)
0
AMPLITUDE (dB)
2248 G04
510152025
30
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
FREQUENCY (MHz)
0
AMPLITUDE (dB)
2248 G05
510152025
30
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
FREQUENCY (MHz)
0
AMPLITUDE (dB)
2248 G06
510152025
30
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
FREQUENCY (MHz)
0
AMPLITUDE (dB)
2248 G06a
510152025
30
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
CODE
8196 8197 8198 8199 8200 8201 8202 8203
121
1596
9042
21824
20412
10224
2116
172
COUNT
2248 G08
25000
20000
15000
10000
5000
0
INPUT FREQUENCY (MHz)
0
SNR (dBFS)
200
2248 G09
50 100 150
75
74
73
72
71
70
INPUT FREQUENCY (MHz)
0
100
95
90
85
80
75
70
65
150
2248 G10
50 100 200
SFDR (dBFS)
TYPICAL PERFOR A CE CHARACTERISTICS
UW
LTC2248: 8192 Point FFT,
fIN = 5MHz, –1dB, 2V Range,
65Msps
LTC2248: 8192 Point FFT,
fIN = 30MHz, –1dB, 2V Range,
65Msps
LTC2248: 8192 Point FFT,
fIN = 70MHz, –1dB, 2V Range,
65Msps
LTC2248: 8192 Point FFT,
fIN = 140MHz, –1dB, 2V Range,
65Msps
LTC2248: Grounded Input
Histogram, 65Msps
LTC2248: SNR vs Input Frequency,
–1dB, 2V Range, 65Msps
LTC2248: SFDR vs Input Frequency,
–1dB, 2V Range, 65Msps
LTC2248: 8192 Point 2-Tone FFT,
fIN = 28.2MHz and 26.8MHz,
–1dB, 2V Range, 65Msps
LTC2248/LTC2247/LTC2246
7
224876fa
SAMPLE RATE (Msps)
I
VDD
(mA)
2248 G15
80
75
70
65
60
55
50 020 40 50
10 30 60 70 80
2V RANGE
1V RANGE
CLOCK DUTY CYCLE (%)
SNR AND SFDR (dBFS)
2247 G12
100
95
90
85
80
75
7030 40 50 55
35 45 60 65 70
SAMPLE RATE (Msps)
50
SNR AND SFDR (dBFS)
110
100
90
80
70
60 100
2248 G11
60 70 80 90010
20 30 40 110
SFDR: DCS ON
SNR: DCS ON
SNR: DCS OFF
SFDR: DCS OFF
INPUT LEVEL (dBFS)
–60 50
SNR (dBc AND dBFS)
–40 20–30 –10 0
2248 G13
INPUT LEVEL (dBFS)
60 50 40 20–30 –10 0
2248 G14
80
70
60
50
40
30
20
10
0
SFDR (dBc AND dBFS)
120
110
100
90
80
70
60
50
40
30
20
dBFS
dBFS
dBc
dBc
90dBc SFDR
REFERENCE LINE
SAMPLE RATE (Msps)
I
OVDD
(mA)
2248 G16
6
5
4
3
2
1
0020 40 50
10 30 60 70 80
CODE
0
INL ERROR (LSB)
12288
2247 G01
4096 8192 16384
2.0
1.5
1.0
0.5
0
0.5
1.0
1.5
2.0
CODE
0
DNL ERROR (LSB)
12288
2247 G02
4096 8192 16384
1.00
0.75
0.50
0.25
0
0.25
–0.50
–0.75
–1.00
FREQUENCY (MHz)
AMPLITUDE (dB)
2247 G03
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120 05101520
SNR
SFDR
TYPICAL PERFOR A CE CHARACTERISTICS
UW
LTC2248: SNR and SFDR vs
Sample Rate, 2V Range,
fIN = 5MHz, –1dB
LTC2248: SNR and SFDR vs
Clock Duty Cycle, 65Msps
LTC2248: SNR vs Input Level,
fIN = 30MHz, 2V Range, 65Msps
LTC2248: IOVDD vs Sample Rate,
5MHz Sine Wave Input, –1dB,
OVDD = 1.8V
LTC2248: IVDD vs Sample Rate,
5MHz Sine Wave Input, –1dB
LTC2247: Typical INL,
2V Range, 40Msps
LTC2247: Typical DNL,
2V Range, 40Msps
LTC2247: 8192 Point FFT,
fIN = 5MHz, –1dB, 2V Range,
40Msps
LTC2248: SFDR vs Input Level,
fIN = 30MHz, 2V Range, 65Msps
LTC2248/LTC2247/LTC2246
8
224876fa
TYPICAL PERFOR A CE CHARACTERISTICS
UW
FREQUENCY (MHz)
0
AMPLITUDE (dB)
2247 G04
5101520 05101520 05101520
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
FREQUENCY (MHz)
AMPLITUDE (dB)
2247 G05
FREQUENCY (MHz)
AMPLITUDE (dB)
2247 G06
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
CODE
8184 8185 8186 818781888189 8190 81918192
546 36
15714
24558
14833
640
4641
30
COUNT
2247 G08
30000
25000
20000
15000
10000
5000
0
INPUT FREQUENCY (MHz)
0
SNR (dBFS)
200
2247 G09
50 100 150
75
74
73
72
71
70
4520
FREQUENCY (MHz)
0
AMPLITUDE (dB)
2247 G07
5 101520
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
SAMPLE RATE (Msps)
0
SNR AND SFDR (dBFS)
110
100
90
80
70
60 80
2247 G11
40
20 60
SNR
SFDR
INPUT FREQUENCY (MHz)
0
100
95
90
85
80
75
70
65
150
2247 G10
50 100 200
SFDR (dBFS)
INPUT LEVEL (dBFS)
–60 50
SNR (dBc AND dBFS)
–40 20–30 –10 0
2247 G12
80
70
60
50
40
30
20
10
0
dBFS
dBc
LTC2247: 8192 Point FFT,
fIN = 30MHz, –1dB, 2V Range,
40Msps
LTC2247: 8192 Point FFT,
fIN = 70MHz, –1dB, 2V Range,
40Msps
LTC2247: 8192 Point FFT,
fIN = 140MHz, –1dB, 2V Range,
40Msps
LTC2247: 8192 Point 2-Tone FFT,
fIN = 21.6MHz and 23.6MHz,
–1dB, 2V Range, 40Msps
LTC2247: Grounded Input
Histogram, 40Msps
LTC2247: SNR vs Input Frequency,
–1dB, 2V Range, 40Msps
LTC2247: SFDR vs Input Frequency,
–1dB, 2V Range, 40Msps
LTC2247: SNR and SFDR vs
Sample Rate, 2V Range,
fIN = 5MHz, –1dB
LTC2247: SNR vs Input Level,
fIN = 5MHz, 2V Range, 40Msps
LTC2248/LTC2247/LTC2246
9
224876fa
CODE
0
INL ERROR (LSB)
12288
2246 G01
4096 8192 16384
2.0
1.5
1.0
0.5
0
0.5
1.0
1.5
2.0
CODE
0
DNL ERROR (LSB)
12288
2246 G02
4096 8192 16384
FREQUENCY (MHz)
0
AMPLITUDE (dB)
2246 G03
246810
12
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
FREQUENCY (MHz)
0
AMPLITUDE (dB)
2246 G04
246810
12
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
FREQUENCY (MHz)
0
AMPLITUDE (dB)
2246 G05
246810
12
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
FREQUENCY (MHz)
0
AMPLITUDE (dB)
2246 G06
246810
12
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
1.00
0.75
0.50
0.25
0
0.25
–0.50
–0.75
–1.00
INPUT LEVEL (dBFS)
60 50 40 20–30 –10 0
2247 G13
SNR (dBc AND dBFS)
120
110
100
90
80
70
60
50
40
30
20
dBFS
dBc
90dBc SFDR
REFERENCE LINE
SAMPLE RATE (Msps)
0
I
VDD
(mA)
40
2247 G14
10 20 30 50
50
45
40
35
30
2V RANGE
1V RANGE
SAMPLE RATE (Msps)
0
I
OVDD
(mA)
2
3
40
2247 G15
1
010 20 30 50
4
LTC2247: IOVDD vs Sample Rate,
5MHz Sine Wave Input, –1dB,
OVDD = 1.8V
LTC2247: IVDD vs Sample Rate,
5MHz Sine Wave Input, –1dB
TYPICAL PERFOR A CE CHARACTERISTICS
UW
LTC2247: SFDR vs Input Level,
fIN = 5MHz, 2V Range, 40Msps
LTC2246: Typical INL,
2V Range, 25Msps LTC2246: Typical DNL,
2V Range, 25Msps
LTC2246: 8192 Point FFT,
fIN = 5MHz, –1dB, 2V Range,
25Msps
LTC2246: 8192 Point FFT,
fIN = 30MHz, –1dB, 2V Range,
25Msps
LTC2246: 8192 Point FFT,
fIN = 70MHz, –1dB, 2V Range,
25Msps
LTC2246: 8192 Point FFT,
fIN = 140MHz, –1dB, 2V Range,
25Msps
LTC2248/LTC2247/LTC2246
10
224876fa
CODE
8179 8180 8181 8182 8183 8184 8185 8186
3227
278
18803
22016
853
6919
43
COUNT
2246 G08
25000
20000
15000
10000
5000
0
INPUT FREQUENCY (MHz)
0
SNR (dBFS)
200
2246 G09
50 100 150
75
74
73
72
71
70
13373
FREQUENCY (MHz)
0
AMPLITUDE (dB)
2246 G07
246810
12
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–110
–120
SAMPLE RATE (Msps)
I
VDD
(mA)
2246 G14
35
30
25
20
15
010 20
515
25 30 35 010 20
515
25 30 35
2V RANGE
1V RANGE
INPUT LEVEL (dBFS)
SNR (dBc AND dBFS)
2246 G12
80
70
60
50
40
30
20
10
0
–60 –40
–50 –20
–30 –10 0
SAMPLE RATE (Msps)
0
SNR AND SFDR (dBFS)
110
100
90
80
70
60
2246 G11
10 20 30 40 50
SNR
INPUT FREQUENCY (MHz)
0
100
95
90
85
80
75
70
65
150
2246 G10
50 100 200
SFDR (dBFS)
INPUT LEVEL (dBFS)
60 50 40 20–30 –10 0
2246 G13
SFDR (dBc AND dBFS)
120
110
100
90
80
70
60
50
40
30
20
dBFS
dBc
90dBc SFDR
REFERENCE LINE
SAMPLE RATE (Msps)
I
OVDD
(mA)
2246 G15
3
2
1
0
dBFS
dBc
SFDR
TYPICAL PERFOR A CE CHARACTERISTICS
UW
LTC2246: 8192 Point 2-Tone FFT,
fIN = 10.9MHz and 13.8MHz,
–1dB, 2V Range, 25Msps
LTC2246: Grounded Input
Histogram, 25Msps
LTC2246: SNR vs Input Frequency,
–1dB, 2V Range, 25Msps
LTC2246: SFDR vs Input
Frequency, –1dB, 2V Range,
25Msps
LTC2246: SNR and SFDR vs
Sample Rate, 2V Range,
fIN = 5MHz, –1dB
LTC2246: SNR vs Input Level,
fIN = 5MHz, 2V Range, 25Msps
LTC2246: IOVDD vs Sample Rate,
5MHz Sine Wave Input, –1dB,
OVDD = 1.8V
LTC2246: IVDD vs Sample Rate,
5MHz Sine Wave Input, –1dB
LTC2246: SFDR vs Input Level,
fIN = 5MHz, 2V Range, 25Msps
LTC2248/LTC2247/LTC2246
11
224876fa
UU
U
PI FU CTIO S
A
IN
+ (Pin 1): Positive Differential Analog Input.
A
IN
- (Pin 2): Negative Differential Analog Input.
REFH (Pins 3, 4): ADC High Reference. Short together and
bypass to pins 5, 6 with a 0.1µF ceramic chip capacitor as
close to the pin as possible. Also bypass to pins 5, 6 with
an additional 2.2µF ceramic chip capacitor and to ground
with a 1µF ceramic chip capacitor.
REFL (Pins 5, 6): ADC Low Reference. Short together and
bypass to pins 3, 4 with a 0.1µF ceramic chip capacitor as
close to the pin as possible. Also bypass to pins 3, 4 with
an additional 2.2µF ceramic chip capacitor and to ground
with a 1µF ceramic chip capacitor.
V
DD
(Pins 7, 32): 3V Supply. Bypass to GND with 0.1µF
ceramic chip capacitors.
GND (Pin 8): ADC Power Ground.
CLK (Pin 9): Clock Input. The input sample starts on the
positive edge.
SHDN (Pin 10): Shutdown Mode Selection Pin. Connect-
ing SHDN to GND and OE to GND results in normal
operation with the outputs enabled. Connecting SHDN to
GND and OE to V
DD
results in normal operation with the
outputs at high impedance. Connecting SHDN to V
DD
and
OE to GND results in nap mode with the outputs at high
impedance. Connecting SHDN to V
DD
and OE to V
DD
results in sleep mode with the outputs at high impedance.
OE (Pin 11): Output Enable Pin. Refer to SHDN pin
function.
D0 – D13 (Pins 12, 13, 14, 15, 16, 17, 18, 19, 22, 23, 24,
25, 26, 27): Digital Outputs. D13 is the MSB.
OGND (Pin 20): Output Driver Ground.
OV
DD
(Pin 21): Positive Supply for the Output Drivers.
Bypass to ground with 0.1µF ceramic chip capacitor.
OF (Pin 28): Over/Under Flow Output. High when an over
or under flow has occurred.
MODE (Pin 29): Output Format and Clock Duty Cycle
Stabilizer Selection Pin. Connecting MODE to GND selects
offset binary output format and turns the clock duty cycle
stabilizer off. 1/3 V
DD
selects offset binary output format
and turns the clock duty cycle stabilizer on. 2/3 V
DD
selects
2’s complement output format and turns the clock duty
cycle stabilizer on. V
DD
selects 2’s complement output
format and turns the clock duty cycle stabilizer off.
SENSE (Pin 30): Reference Programming Pin. Connecting
SENSE to V
CM
selects the internal reference and a ±0.5V
input range. V
DD
selects the internal reference and a ±1V
input range. An external reference greater than 0.5V and
less than 1V applied to SENSE selects an input range of
±V
SENSE
. ±1V is the largest valid input range.
V
CM
(Pin 31): 1.5V Output and Input Common Mode Bias.
Bypass to ground with 2.2µF ceramic chip capacitor.
GND (Exposed Pad) (Pin 33): ADC Power Ground. The
exposed pad on the bottom of the package needs to be
soldered to ground.
LTC2248/LTC2247/LTC2246
12
224876fa
FUNCTIONAL BLOCK DIAGRA
UU
W
SHIFT REGISTER
AND CORRECTION
DIFF
REF
AMP
REF
BUF
2.2µF
1µF1µF
0.1µF
INTERNAL CLOCK SIGNALSREFH REFL
CLOCK/DUTY
CYCLE
CONTROL
RANGE
SELECT
1.5V
REFERENCE
FIRST PIPELINED
ADC STAGE
FIFTH PIPELINED
ADC STAGE
SIXTH PIPELINED
ADC STAGE
FOURTH PIPELINED
ADC STAGE
SECOND PIPELINED
ADC STAGE
REFH REFL
CLK OE
M0DE
OGND
OV
DD
224876 F01
INPUT
S/H
SENSE
V
CM
A
IN
A
IN+
2.2µF
THIRD PIPELINED
ADC STAGE
OUTPUT
DRIVERS
CONTROL
LOGIC
SHDN
OF
D13
D0
Figure 1. Functional Block Diagram
tAP
N + 1
N + 2 N + 4
N + 3 N + 5
N
ANALOG
INPUT
tH
tD
tL
N – 4 N – 3 N – 2 N – 1
CLK
D0-D13, OF
224876 TD01
N – 5 N
Timing Diagram
TI I G DIAGRA
UWW
LTC2248/LTC2247/LTC2246
13
224876fa
DYNAMIC PERFORMANCE
Signal-to-Noise Plus Distortion Ratio
The signal-to-noise plus distortion ratio [S/(N + D)] is the
ratio between the RMS amplitude of the fundamental input
frequency and the RMS amplitude of all other frequency
components at the ADC output. The output is band limited
to frequencies above DC to below half the sampling
frequency.
Signal-to-Noise Ratio
The signal-to-noise ratio (SNR) is the ratio between the
RMS amplitude of the fundamental input frequency and
the RMS amplitude of all other frequency components
except the first five harmonics and DC.
Total Harmonic Distortion
Total harmonic distortion is the ratio of the RMS sum of all
harmonics of the input signal to the fundamental itself. The
out-of-band harmonics alias into the frequency band
between DC and half the sampling frequency. THD is
expressed as:
THD = 20Log ((V2
2
+ V3
2
+ V4
2
+ . . . Vn
2
)/V1)
where V1 is the RMS amplitude of the fundamental fre-
quency and V2 through Vn are the amplitudes of the
second through nth harmonics. The THD calculated in this
data sheet uses all the harmonics up to the fifth.
Intermodulation Distortion
If the ADC input signal consists of more than one spectral
component, the ADC transfer function nonlinearity can
produce intermodulation distortion (IMD) in addition to
THD. IMD is the change in one sinusoidal input caused by
the presence of another sinusoidal input at a different
frequency.
If two pure sine waves of frequencies fa and fb are applied
to the ADC input, nonlinearities in the ADC transfer func-
tion can create distortion products at the sum and differ-
ence frequencies of mfa ± nfb, where m and n = 0, 1, 2, 3,
etc. The 3rd order intermodulation products are 2fa + fb,
2fb + fa, 2fa – fb and 2fb – fa. The intermodulation
distortion is defined as the ratio of the RMS value of either
APPLICATIO S I FOR ATIO
WUUU
input tone to the RMS value of the largest 3rd order
intermodulation product.
Spurious Free Dynamic Range (SFDR)
Spurious free dynamic range is the peak harmonic or
spurious noise that is the largest spectral component
excluding the input signal and DC. This value is expressed
in decibels relative to the RMS value of a full scale input
signal.
Input Bandwidth
The input bandwidth is that input frequency at which the
amplitude of the reconstructed fundamental is reduced by
3dB for a full scale input signal.
Aperture Delay Time
The time from when CLK reaches mid-supply to the instant
that the input signal is held by the sample and hold circuit.
Aperture Delay Jitter
The variation in the aperture delay time from conversion to
conversion. This random variation will result in noise
when sampling an AC input. The signal to noise ratio due
to the jitter alone will be:
SNR
JITTER
= –20log (2π • f
IN
• t
JITTER
)
CONVERTER OPERATION
As shown in Figure 1, the LTC2248/LTC2247/LTC2246 is
a CMOS pipelined multistep converter. The converter has
six pipelined ADC stages; a sampled analog input will
result in a digitized value five cycles later (see the Timing
Diagram section). For optimal AC performance the analog
inputs should be driven differentially. For cost sensitive
applications, the analog inputs can be driven single-ended
with slightly worse harmonic distortion. The CLK input is
single-ended. The LTC2248/LTC2247/LTC2246 has two
phases of operation, determined by the state of the CLK
input pin.
Each pipelined stage shown in Figure 1 contains an ADC,
a reconstruction DAC and an interstage residue amplifier.
In operation, the ADC quantizes the input to the stage and
the quantized value is subtracted from the input by the
LTC2248/LTC2247/LTC2246
14
224876fa
DAC to produce a residue. The residue is amplified and
output by the residue amplifier. Successive stages operate
out of phase so that when the odd stages are outputting
their residue, the even stages are acquiring that residue
and vice versa.
When CLK is low, the analog input is sampled differentially
directly onto the input sample-and-hold capacitors, inside
the “Input S/H” shown in the block diagram. At the instant
that CLK transitions from low to high, the sampled input is
held. While CLK is high, the held input voltage is buffered
by the S/H amplifier which drives the first pipelined ADC
stage. The first stage acquires the output of the S/H during
this high phase of CLK. When CLK goes back low, the first
stage produces its residue which is acquired by the
second stage. At the same time, the input S/H goes back
to acquiring the analog input. When CLK goes back high,
the second stage produces its residue which is acquired
by the third stage. An identical process is repeated for the
third, fourth and fifth stages, resulting in a fifth stage
residue that is sent to the sixth stage ADC for final
evaluation.
Each ADC stage following the first has additional range to
accommodate flash and amplifier offset errors. Results
from all of the ADC stages are digitally synchronized such
that the results can be properly combined in the correction
logic before being sent to the output buffer.
SAMPLE/HOLD OPERATION AND INPUT DRIVE
Sample/Hold Operation
Figure 2 shows an equivalent circuit for the LTC2248/
LTC2247/LTC2246 CMOS differential sample-and-hold.
The analog inputs are connected to the sampling capaci-
tors (C
SAMPLE
) through NMOS transistors. The capacitors
shown attached to each input (C
PARASITIC
) are the summa-
tion of all other capacitance associated with each input.
During the sample phase when CLK is low, the transistors
connect the analog inputs to the sampling capacitors and
they charge to and track the differential input voltage.
When CLK transitions from low to high, the sampled input
voltage is held on the sampling capacitors. During the hold
phase when CLK is high, the sampling capacitors are
APPLICATIO S I FOR ATIO
WUUU
disconnected from the input and the held voltage is passed
to the ADC core for processing. As CLK transitions from
high to low, the inputs are reconnected to the sampling
capacitors to acquire a new sample. Since the sampling
capacitors still hold the previous sample, a charging glitch
proportional to the change in voltage between samples will
be seen at this time. If the change between the last sample
and the new sample is small, the charging glitch seen at
the input will be small. If the input change is large, such as
the change seen with input frequencies near Nyquist, then
a larger charging glitch will be seen.
Single-Ended Input
For cost sensitive applications, the analog inputs can be
driven single-ended. With a single-ended input the har-
monic distortion and INL will degrade, but the SNR and
DNL will remain unchanged. For a single-ended input, A
IN+
should be driven with the input signal and A
IN
should be
connected to 1.5V or V
CM
.
Common Mode Bias
For optimal performance the analog inputs should be
driven differentially. Each input should swing ±0.5V for
the 2V range or ±0.25V for the 1V range, around a
common mode voltage of 1.5V. The V
CM
output pin (Pin
31) may be used to provide the common mode bias level.
V
CM
can be tied directly to the center tap of a transformer
to set the DC input level or as a reference level to an op amp
differential driver circuit. The V
CM
pin must be bypassed to
ground close to the ADC with a 2.2µF or greater capacitor.
Figure 2. Equivalent Input Circuit
V
DD
V
DD
V
DD
15
15
C
PARASITIC
1pF
C
PARASITIC
1pF
C
SAMPLE
4pF
C
SAMPLE
4pF
LTC2248/47/46
A
IN
+
A
IN
CLK
224876 F02
LTC2248/LTC2247/LTC2246
15
224876fa
Input Drive Impedance
As with all high performance, high speed ADCs, the
dynamic performance of the LTC2248/LTC2247/LTC2246
can be influenced by the input drive circuitry, particularly
the second and third harmonics. Source impedance and
reactance can influence SFDR. At the falling edge of CLK,
the sample-and-hold circuit will connect the 4pF sampling
capacitor to the input pin and start the sampling period.
The sampling period ends when CLK rises, holding the
sampled input on the sampling capacitor. Ideally the input
circuitry should be fast enough to fully charge
the sampling capacitor during the sampling period
1/(2F
ENCODE
); however, this is not always possible and the
incomplete settling may degrade the SFDR. The sampling
glitch has been designed to be as linear as possible to
minimize the effects of incomplete settling.
For the best performance, it is recommended to have a
source impedance of 100 or less for each input. The
source impedance should be matched for the differential
inputs. Poor matching will result in higher even order
harmonics, especially the second.
Input Drive Circuits
Figure 3 shows the LTC2248/LTC2247/LTC2246 being
driven by an RF transformer with a center tapped second-
ary. The secondary center tap is DC biased with V
CM
,
setting the ADC input signal at its optimum DC level.
Terminating on the transformer secondary is desirable, as
this provides a common mode path for charging glitches
caused by the sample and hold. Figure 3 shows a 1:1 turns
ratio transformer. Other turns ratios can be used if the
source impedance seen by the ADC does not exceed 100
for each ADC input. A disadvantage of using a transformer
is the loss of low frequency response. Most small RF
transformers have poor performance at frequencies be-
low 1MHz.
Figure 4 demonstrates the use of a differential amplifier to
convert a single ended input signal into a differential input
signal. The advantage of this method is that it provides low
frequency input response; however, the limited gain band-
width of most op amps will limit the SFDR at high input
frequencies.
APPLICATIO S I FOR ATIO
WUUU
Figure 5. Single-Ended Drive
Figure 3. Single-Ended to Differential Conversion
Using a Transformer
25
25
25
25
0.1µF
AIN+
AIN
12pF
2.2µF
VCM
LTC2248/47/46
ANALOG
INPUT
0.1µFT1
1:1
T1 = MA/COM ETC1-1T
RESISTORS, CAPACITORS
ARE 0402 PACKAGE SIZE
224876 F03
Figure 4. Differential Drive with an Amplifier
25
25
12pF
2.2µF
VCM
LTC2248/47/46
224876 F04
++
CM
ANALOG
INPUT
HIGH SPEED
DIFFERENTIAL
AMPLIFIER AIN+
AIN
25
0.1µF
ANALOG
INPUT
VCM
AIN
+
AIN
1k
12pF
224876 F05
2.2µF
1k
25
0.1µF
LTC2248/47/46
Figure 5 shows a single-ended input circuit. The imped-
ance seen by the analog inputs should be matched. This
circuit is not recommended if low distortion is required.
The 25 resistors and 12pF capacitor on the analog inputs
serve two purposes: isolating the drive circuitry from the
sample-and-hold charging glitches and limiting the
wideband noise at the converter input.
LTC2248/LTC2247/LTC2246
16
224876fa
For input frequencies above 70MHz, the input circuits of
Figure 6, 7 and 8 are recommended. The balun trans-
former gives better high frequency response than a flux
coupled center tapped transformer. The coupling capaci-
tors allow the analog inputs to be DC biased at 1.5V. In
Figure 8, the series inductors are impedance matching
elements that maximize the ADC bandwidth.
APPLICATIO S I FOR ATIO
WUUU
Figure 6. Recommended Front End Circuit for
Input Frequencies Between 70MHz and 170MHz
25
2512
12
0.1µF
A
IN+
A
IN
8pF
2.2µF
V
CM
LTC2248/47/46
ANALOG
INPUT
0.1µF
0.1µF
T1
T1 = MA/COM, ETC 1-1-13
RESISTORS, CAPACITORS
ARE 0402 PACKAGE SIZE
224876 F06
Figure 8. Recommended Front End Circuit for
Input Frequencies Above 300MHz
25
25
0.1µF
A
IN+
A
IN
2.2µF
V
CM
LTC2248/47/46
ANALOG
INPUT
0.1µF
0.1µF
T1
T1 = MA/COM, ETC 1-1-13
RESISTORS, CAPACITORS
ARE 0402 PACKAGE SIZE
224876 F07
25
25
0.1µF
A
IN+
A
IN
2.2µF
V
CM
LTC2248/47/46
ANALOG
INPUT
0.1µF
0.1µF
T1
T1 = MA/COM, ETC 1-1-13
RESISTORS, CAPACITORS, INDUCTORS
ARE 0402 PACKAGE SIZE
224876 F08
6.8nH
6.8nH
Figure 7. Recommended Front End Circuit for
Input Frequencies Between 170MHz and 300MHz
V
CM
REFH
SENSE
TIE TO V
DD
FOR 2V RANGE;
TIE TO V
CM
FOR 1V RANGE;
RANGE = 2 • V
SENSE
FOR
0.5V < V
SENSE
< V
CM
1.5V
REFL
2.2µF
2.2µF
INTERNAL ADC
HIGH REFERENCE
BUFFER
0.1µF
224876 F09
LTC2248/47/46
4
DIFF AMP
1µF
1µF
INTERNAL ADC
LOW REFERENCE
1.5V BANDGAP
REFERENCE
1V 0.5V
RANGE
DETECT
AND
CONTROL
1.1
1.5
Figure 9. Equivalent Reference Circuit
Reference Operation
Figure 9 shows the LTC2248/LTC2247/LTC2246 refer-
ence circuitry consisting of a 1.5V bandgap reference, a
difference amplifier and switching and control circuit. The
internal voltage reference can be configured for two pin
selectable input ranges of 2V (±1V differential) or 1V
(±0.5V differential). Tying the SENSE pin to V
DD
selects
the 2V range; tying the SENSE pin to V
CM
selects the 1V
range.
The 1.5V bandgap reference serves two functions: its
output provides a DC bias point for setting the common
mode voltage of any external input circuitry; additionally,
the reference is used with a difference amplifier to gener-
ate the differential reference levels needed by the internal
ADC circuitry. An external bypass capacitor is required for
the 1.5V reference output, V
CM
. This provides a high
frequency low impedance path to ground for internal and
external circuitry.
The difference amplifier generates the high and low refer-
ence for the ADC. High speed switching circuits are
connected to these outputs and they must be externally
bypassed. Each output has two pins. The multiple output
LTC2248/LTC2247/LTC2246
17
224876fa
APPLICATIO S I FOR ATIO
WUUU
pins are needed to reduce package inductance. Bypass
capacitors must be connected as shown in Figure 9.
Other voltage ranges in-between the pin selectable ranges
can be programmed with two external resistors as shown
in Figure 10. An external reference can be used by applying
its output directly or through a resistor divider to SENSE.
It is not recommended to drive the SENSE pin with a logic
device. The SENSE pin should be tied to the appropriate
level as close to the converter as possible. If the SENSE pin
is driven externally, it should be bypassed to ground as
close to the device as possible with a 1µF ceramic capacitor.
Input Range
The input range can be set based on the application. The
2V input range will provide the best signal-to-noise perfor-
mance while maintaining excellent SFDR. The 1V input
range will have better SFDR performance, but the SNR will
degrade by 5.8dB. See the Typical Performance Charac-
teristics section.
Driving the Clock Input
The CLK input can be driven directly with a CMOS or TTL
level signal. A sinusoidal clock can also be used along with
Figure 10. 1.5V Range ADC
CLK
50
0.1µF
0.1µF
4.7µF
1k
1k
FERRITE
BEAD
CLEAN
SUPPLY
SINUSOIDAL
CLOCK
INPUT
224876 F11
NC7SVU04
LTC2248/47/46
Figure 11. Sinusoidal Single-Ended CLK Drive
a low-jitter squaring circuit before the CLK pin (see
Figure 11).
The noise performance of the LTC2248/LTC2247/LTC2246
can depend on the clock signal quality as much as on the
analog input. Any noise present on the clock signal will
result in additional aperture jitter that will be RMS summed
with the inherent ADC aperture jitter.
In applications where jitter is critical, such as when digitiz-
ing high input frequencies, use as large an amplitude as
possible. Also, if the ADC is clocked with a sinusoidal
signal, filter the CLK signal to reduce wideband noise and
distortion products generated by the source.
Figures 12 and 13 show alternatives for converting a
differential clock to the single-ended CLK input. The use of
a transformer provides no incremental contribution to
phase noise. The LVDS or PECL to CMOS translators
provide little degradation below 70MHz, but at 140MHz
will degrade the SNR compared to the transformer solu-
tion. The nature of the received signals also has a large
VCM
SENSE
1.5V
0.75V
2.2µF
12k
1µF
12k
224876 F10
LTC2248/47/46
Figure 12. CLK Drive Using an LVDS or PECL to CMOS Converter
CLK
100
0.1µF
4.7µF
FERRITE
BEAD
CLEAN
SUPPLY
IF LVDS USE FIN1002 OR FIN1018.
FOR PECL, USE AZ1000ELT21 OR SIMILAR
224876 F12
LTC2248/
LTC2247/
LTC2246
CLK
5pF-30pF
ETC1-1T
0.1µF
VCM
FERRITE
BEAD
DIFFERENTIAL
CLOCK
INPUT
224876 F13
LTC2248/
LTC2247/
LTC2246
Figure 13. LVDS or PECL CLK Drive Using a Transformer
LTC2248/LTC2247/LTC2246
18
224876fa
APPLICATIO S I FOR ATIO
WUUU
bearing on how much SNR degradation will be experi-
enced. For high crest factor signals such as WCDMA or
OFDM, where the nominal power level must be at least 6dB
to 8dB below full scale, the use of these translators will
have a lesser impact.
The transformer in the example may be terminated with
the appropriate termination for the signaling in use. The
use of a transformer with a 1:4 impedance ratio may be
desirable in cases where lower voltage differential signals
are considered. The center tap may be bypassed to ground
through a capacitor close to the ADC if the differential
signals originate on a different plane. The use of a capaci-
tor at the input may result in peaking, and depending on
transmission line length may require a 10 to 20 ohm
series resistor to act as both a low pass filter for high
frequency noise that may be induced into the clock line by
neighboring digital signals, as well as a damping mecha-
nism for reflections.
Maximum and Minimum Conversion Rates
The maximum conversion rate for the LTC2248/LTC2247/
LTC2246 is 65Msps (LTC2248), 40Msps (LTC2247), and
25Msps (LTC2246). For the ADC to operate properly, the
CLK signal should have a 50% (±5%) duty cycle. Each half
cycle must have at least 7.3ns (LTC2248), 11.8ns
(LTC2247), and 18.9ns (LTC2246) for the ADC internal
circuitry to have enough settling time for proper operation.
An optional clock duty cycle stabilizer circuit can be used
if the input clock has a non 50% duty cycle. This circuit
uses the rising edge of the CLK pin to sample the analog
input. The falling edge of CLK is ignored and the internal
falling edge is generated by a phase-locked loop. The input
clock duty cycle can vary from 40% to 60% and the clock
duty cycle stabilizer will maintain a constant 50% internal
duty cycle. If the clock is turned off for a long period of
time, the duty cycle stabilizer circuit will require a hundred
clock cycles for the PLL to lock onto the input clock. To use
the clock duty cycle stabilizer, the MODE pin should be
connected to 1/3V
DD
or 2/3V
DD
using external resistors.
The lower limit of the LTC2248/LTC2247/LTC2246 sample
rate is determined by droop of the sample-and-hold cir-
cuits. The pipelined architecture of this ADC relies on Figure 14. Digital Output Buffer
LTC2248/47/46
224876 F12
OVDD
VDD VDD
0.1µF
43TYPICAL
DATA
OUTPUT
OGND
OVDD 0.5V
TO 3.6V
PREDRIVER
LOGIC
DATA
FROM
LATCH
OE
Table 1. Output Codes vs Input Voltage
A
IN+
– A
IN
D13 – D0 D13 – D0
(2V Range) OF (Offset Binary) (2’s Complement)
>+1.000000V 1 11 1111 1111 1111 01 1111 1111 1111
+0.999878V 0 11 1111 1111 1111 01 1111 1111 1111
+0.999756V 0 11 1111 1111 1110 01 1111 1111 1110
+0.000122V 0 10 0000 0000 0001 00 0000 0000 0001
0.000000V 0 10 0000 0000 0000 00 0000 0000 0000
–0.000122V 0 01 1111 1111 1111 11 1111 1111 1111
–0.000244V 0 01 1111 1111 1110 11 1111 1111 1110
–0.999878V 0 00 0000 0000 0001 10 0000 0000 0001
–1.000000V 0 00 0000 0000 0000 10 0000 0000 0000
<–1.000000V 1 00 0000 0000 0000 10 0000 0000 0000
storing analog signals on small valued capacitors. Junc-
tion leakage will discharge the capacitors. The specified
minimum operating frequency for the LTC2248/LTC2247/
LTC2246 is 1Msps.
DIGITAL OUTPUTS
Table 1 shows the relationship between the analog input
voltage, the digital data bits, and the overflow bit.
Digital Output Buffers
Figure 14 shows an equivalent circuit for a single output
buffer. Each buffer is powered by OV
DD
and OGND, iso-
lated from the ADC power and ground. The additional
N-channel transistor in the output driver allows operation
down to low voltages. The internal resistor in series with
the output makes the output appear as 50 to external
circuitry and may eliminate the need for external damping
resistors.
LTC2248/LTC2247/LTC2246
19
224876fa
APPLICATIO S I FOR ATIO
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As with all high speed/high resolution converters, the
digital output loading can affect the performance. The
digital outputs of the LTC2248/LTC2247/LTC2246 should
drive a minimal capacitive load to avoid possible interac-
tion between the digital outputs and sensitive input cir-
cuitry. The output should be buffered with a device such as
an ALVCH16373 CMOS latch. For full speed operation the
capacitive load should be kept under 10pF.
Lower OV
DD
voltages will also help reduce interference
from the digital outputs.
Data Format
Using the MODE pin, the LTC2248/LTC2247/LTC2246
parallel digital output can be selected for offset binary or
2’s complement format. Connecting MODE to GND or
1/3V
DD
selects offset binary output format. Connecting
MODE to 2/3V
DD
or V
DD
selects 2’s complement output
format. An external resistor divider can be used to set the
1/3V
DD
or 2/3V
DD
logic values. Table 2 shows the logic
states for the MODE pin.
Output Driver Power
Separate output power and ground pins allow the output
drivers to be isolated from the analog circuitry. The power
supply for the digital output buffers, OV
DD
, should be tied
to the same power supply as for the logic being driven. For
example if the converter is driving a DSP powered by a 1.8V
supply, then OV
DD
should be tied to that same 1.8V supply.
OV
DD
can be powered with any voltage from 500mV up to
3.6V. OGND can be powered with any voltage from GND up
to 1V and must be less than OV
DD
. The logic outputs will
swing between OGND and OV
DD
.
Output Enable
The outputs may be disabled with the output enable pin, OE.
OE high disables all data outputs including OF. The data ac-
cess and bus relinquish times are too slow to allow the
outputs to be enabled and disabled during full speed op-
eration. The output Hi-Z state is intended for use during long
periods of inactivity.
Sleep and Nap Modes
The converter may be placed in shutdown or nap modes
to conserve power. Connecting SHDN to GND results in
normal operation. Connecting SHDN to V
DD
and OE to V
DD
results in sleep mode, which powers down all circuitry
including the reference and typically dissipates 1mW. When
exiting sleep mode it will take milliseconds for the output
data to become valid because the reference capacitors have
to recharge and stabilize. Connecting SHDN to V
DD
and OE
to GND results in nap mode, which typically dissipates
15mW. In nap mode, the on-chip reference circuit is kept
on, so that recovery from nap mode is faster than that from
sleep mode, typically taking 100 clock cycles. In both sleep
and nap modes, all digital outputs are disabled and enter
the Hi-Z state.
Table 2. MODE Pin Function
Clock Duty
MODE Pin Output Format Cycle Stablizer
0 Offset Binary Off
1/3V
DD
Offset Binary On
2/3V
DD
2’s Complement On
V
DD
2’s Complement Off
Overflow Bit
When OF outputs a logic high the converter is either
overranged or underranged.
LTC2248/LTC2247/LTC2246
20
224876fa
Grounding and Bypassing
The LTC2248/LTC2247/LTC2246 requires a printed cir-
cuit board with a clean, unbroken ground plane. A multi-
layer board with an internal ground plane is recom-
mended. Layout for the printed circuit board should en-
sure that digital and analog signal lines are separated as
much as possible. In particular, care should be taken not
to run any digital track alongside an analog signal track or
underneath the ADC.
High quality ceramic bypass capacitors should be used at
the V
DD
, OV
DD
, V
CM
, REFH, and REFL pins. Bypass capaci-
tors must be located as close to the pins as possible. Of
particular importance is the 0.1µF capacitor between
REFH and REFL. This capacitor should be placed as close
to the device as possible (1.5mm or less). A size 0402
ceramic capacitor is recommended. The large 2.2µF ca-
pacitor between REFH and REFL can be somewhat further
away. The traces connecting the pins and bypass capaci-
tors must be kept short and should be made as wide as
possible.
The LTC2248/LTC2247/LTC2246 differential inputs should
run parallel and close to each other. The input traces
should be as short as possible to minimize capacitance
and to minimize noise pickup.
Heat Transfer
Most of the heat generated by the LTC2248/LTC2247/
LTC2246 is transferred from the die through the bottom-
side exposed pad and package leads onto the printed
circuit board. For good electrical and thermal perfor-
mance, the exposed pad should be soldered to a large
grounded pad on the PC board. It is critical that all ground
pins are connected to a ground plane of sufficient area.
Clock Sources for Undersampling
Undersampling raises the bar on the clock source and the
higher the input frequency, the greater the sensitivity to
clock jitter or phase noise. A clock source that degrades
SNR of a full-scale signal by 1dB at 70MHz will degrade
SNR by 3dB at 140MHz, and 4.5dB at 190MHz.
In cases where absolute clock frequency accuracy is
relatively unimportant and only a single ADC is required,
a 3V canned oscillator from vendors such as Saronix or
Vectron can be placed close to the ADC and simply
connected directly to the ADC. If there is any distance to
the ADC, some source termination to reduce ringing that
may occur even over a fraction of an inch is advisable. You
must not allow the clock to overshoot the supplies or
performance will suffer. Do not filter the clock signal with
a narrow band filter unless you have a sinusoidal clock
source, as the rise and fall time artifacts present in typical
digital clock signals will be translated into phase noise.
The lowest phase noise oscillators have single-ended
sinusoidal outputs, and for these devices the use of a filter
close to the ADC may be beneficial. This filter should be
close to the ADC to both reduce roundtrip reflection times,
as well as reduce the susceptibility of the traces between
the filter and the ADC. If you are sensitive to close-in phase
noise, the power supply for oscillators and any buffers
must be very stable, or propagation delay variation with
supply will translate into phase noise. Even though these
clock sources may be regarded as digital devices, do not
operate them on a digital supply. If your clock is also used
to drive digital devices such as an FPGA, you should locate
the oscillator, and any clock fan-out devices close to the
ADC, and give the routing to the ADC precedence. The
clock signals to the FPGA should have series termination
at the driver to prevent high frequency noise from the
FPGA disturbing the substrate of the clock fan-out device.
If you use an FPGA as a programmable divider, you must
re-time the signal using the original oscillator, and the re-
timing flip-flop as well as the oscillator should be close to
the ADC, and powered with a very quiet supply.
For cases where there are multiple ADCs, or where the
clock source originates some distance away, differential
clock distribution is advisable. This is advisable both from
the perspective of EMI, but also to avoid receiving noise
from digital sources both radiated, as well as propagated
in the waveguides that exist between the layers of multi-
layer PCBs. The differential pairs must be close together
and distanced from other signals. The differential pair
should be guarded on both sides with copper distanced at
least 3x the distance between the traces, and grounded
with vias no more than 1/4 inch apart.
APPLICATIO S I FOR ATIO
WUUU
LTC2248/LTC2247/LTC2246
21
224876fa
APPLICATIO S I FOR ATIO
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1
2
C8
0.1µF
C11
0.1µF
3
4
5
V
DD
7
V
DD
V
DD
GND
9
32
V
CM
31
30
29
33
JP2
OE
10
11
8
C7
2.2µF
C6
1µF
C9
1µF
C4
0.1µF
C2
8.2pF
V
DD
V
DD
V
DD
GND
JP1
SHDN
C15
2.2µFC16
0.1µF
C18
0.1µF
C25
4.7µF
E2
V
DD
3V
E4
PWR
GND
V
DD
V
CC
22554 TA02
C17 0.1µF
C20
0.1µF
C19
0.1µF
C14
0.1µF
R10
33
E1
EXT REF
R14
1k
R15
1k
R16
1k
R7
1k
R8
49.9
R3
24.9
R2
12.4
R6
12.4
R1
OPT
R4
24.9
R5
50
T1
ETC1-1T
C1
0.1µF
C3
0.1µF
J3
CLOCK
INPUT
NC7SVU04
NC7SVU04
C13
0.1µF
C10
0.1µF
C5
4.7µF
6.3V
L1
BEAD
V
DD
C12
0.1µF
R9
1k
J1
ANALOG
INPUT
A
IN+
A
IN
REFH
REFH
6REFL
REFL
V
DD
CLK
SHDN
V
DD
V
CM
SENSE
MODE
GND
LTC2248/LTC2247/
LTC2246
OE
D12
D11
GND
D0
D1
D2
D3
D5
D4
D6
D8
D9
D13
OF
OV
DD
V
CC
OGND
D10
D7
26
25
12
13
14
15
17
16
18
22
23
27
28
21
20
24
19
OE1
I
0
OE2
LE1
LE2
V
CC
V
CC
V
CC
GND
GND
GND
I
1
I
2
I
4
I
3
I
5
I
7
I
8
I
12
I
11
I
10
I
13
I
14
I
15
I
9
O11
O10
I
6
V
CC
O0
GND
GND
GND
V
CC
V
CC
GND
34
45
39
42
25
48
24
1
47
46
44
43
41
40
38
37
36
35
33
32
30
29
27
26
V
CC
28
74VCX16373MTD
31
21
15
18
10
4
7
R
N1C
33
2
3
5
6
8
9
11
12
13
14
16
17
19
20
22
23
GND
O1
O2
O4
O3
O5
O7
O8
O12
O13
O14
O15
O9
O6
25
23
27
29
31
33
35
37
39
21
19
15
17
13
9
7
1
3
5
2
4
11
26
24
30
28
34
32
38
40
39
37
35
33
31
29
27
25
23
21
19
17
15
13
11
9
7
5
3
1
40
3201S-40G1
38
36
34
32
30
28
26
24
22
20
18
16
14
12
10
8
6
4
2
36
A3
A2
A1
A0
SDA
WP
V
CC
1
2
3
4
8
24LC025
7
6
5
SCL
22
20
16
18
14
10
8
6
12
1
2
3
5
••
4
V
CM
12
V
DD
V
DD
34
2/3V
DD
56
1/3V
DD
78
GND
JP4 MODE
12
V
DD
34
V
CM
V
DD
V
CM
56
EXT
REF
JP3 SENSE
R
N1B
33
R
N1A
33
R
N2D
33
R
N2C
33
R
N2B
33
R
N2A
33
R
N3D
33
R
N3C
33
R
N3B
33
R
N3A
33
R
N4D
33
R
N4B
33
R
N4A
33
R13
10k
R11
10k
R12
10k
R
N4C
33
R
N1D
33
C28
1µF
C27
0.01µF
V
CC
V
DD
NC7SV86P5X
BYP
GND
ADJ
OUT
SHDN
GND
IN
1
2
3
4
8
LT1763
7
6
5
GND
R18
100k
R17
105k
C26
10µF
6.3V
E3
GND C21
0.1µF
C22
0.1µF
C23
0.1µF
C24
0.1µF
Evaluation Circuit Schematic of the LTC2248/LTC2247/LTC2246
LTC2248/LTC2247/LTC2246
22
224876fa
APPLICATIO S I FOR ATIO
WUUU
Silkscreen Top Topside
Inner Layer 2 GND Inner Layer 3 Power
LTC2248/LTC2247/LTC2246
23
224876fa
APPLICATIO S I FOR ATIO
WUUU
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen-
tation that the interconnection of its circuits as described herein will not infringe on existing patent rights.
5.00 ± 0.10
(4 SIDES)
NOTE:
1. DRAWING PROPOSED TO BE A JEDEC PACKAGE OUTLINE
M0-220 VARIATION WHHD-(X) (TO BE APPROVED)
2. DRAWING NOT TO SCALE
3. ALL DIMENSIONS ARE IN MILLIMETERS
4. DIMENSIONS OF EXPOSED PAD ON BOTTOM OF PACKAGE
DO NOT INCLUDE MOLD FLASH. MOLD FLASH, IF PRESENT,
SHALL NOT EXCEED 0.20mm ON ANY SIDE
5. EXPOSED PAD SHALL BE SOLDER PLATED
6. SHADED AREA IS ONLY A REFERENCE FOR PIN 1 LOCATION
ON THE TOP AND BOTTOM OF PACKAGE
PIN 1
TOP MARK
(NOTE 6)
0.40 ± 0.10
0.23 TYP
(4 SIDES)
31
1
2
32
BOTTOM VIEW—EXPOSED PAD
3.45 ± 0.10
(4-SIDES)
0.75 ± 0.05 R = 0.115
TYP
0.25 ± 0.05
(UH) QFN 0603
0.50 BSC
0.200 REF
0.00 – 0.05
0.70 ±0.05
3.45 ±0.05
(4 SIDES)
4.10 ±0.05
5.50 ±0.05
0.25 ± 0.05
PACKAGE OUTLINE
0.50 BSC
RECOMMENDED SOLDER PAD LAYOUT
UH Package
32-Lead Plastic QFN (5mm × 5mm)
(Reference LTC DWG # 05-08-1693)
PACKAGE DESCRIPTIO
U
Bottomside Silkscreen Bottom
LTC2248/LTC2247/LTC2246
24
224876fa
Linear Technology Corporation
1630 McCarthy Blvd., Milpitas, CA 95035-7417
(408) 432-1900
FAX: (408) 434-0507
www.linear.com
© LINEAR TECHNOLOGY CORPORATION 2004
LT 0106 REV A • PRINTED IN USA
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