SPEER ELECTRONICS, INC.
TELEPHONE: 814-362-5536 FAX: 814-362-8883
61
CHIP INDUCTOR
KQ0402/KQ0603/KQ0805/KQ1008
ENVIRONMENTAL & MECHANICAL CHARACTERISTICS
PARAMETER MAXIMUM ▲▲ L TEST METHODS
Dielectric No evidence of flaming, 5 seconds at DC 500V applied
Withstanding Voltage fuming, or breakdown between both terminals and film.
Insulation Resistance 1000MΩ and over 1 minute at DC 100V measured
between both terminals and film.
Flammability IEC 695-2-2 Withstands needle-flame test.
Terminal No evidence of Terminals shall withstand a pull of
Pull Strength damage 10 N in a horizontal direction
Terminal No evidence of Specimen shall be soldered
Bending Strength breakdown on bend test board and force applied to the
opposite side to cause a 10mm deflection
(KQ0603 - 3mm deflection)
Vibration ▲▲ L/L within ±5% 2 hours in each direction of
▲ ▲ Q/Q within ±10% X, Y, Z, on PCB at a frequency
range of 10 - 55 - 10Hz with
1.5mm amplitude
Dropping No evidence of damage Dropping 1m on the ground of
▲ ▲ L/L within ±5% concrete 1 time.
▲ ▲ Q/Q within ±10%
Resistance to No evidence of outer damage Immerse in solder at 260 ± 5 °C
Soldering Heat ▲▲ L/L within ±5% for 10 ± 1 seconds
▲▲ Q/Q within ±10%
Solderability 95% of the terminal should be Immerse in the solder at 230 ± 5°C
covered with new solder for 3 ± 0.5 seconds
Resistance to No damage and marking Accordance with MIL -STD - 202
Solvents must remain legible Method 215
Low Temperature No evidence of damage Store at -40 ± 2°C, for 1000 hours
Storage ▲▲ L/L within ±5%
▲▲ Q/Q within ±10%
High Temperature No evidence of damage Store at +125 ± 2°C, for 1000 hours
Storage ▲▲ L/L within ±5%
▲▲ Q/Q within ±10%
Moisture Endurance No evidence of damage Temperature 40 ± 2°C, 90-95%RH
▲▲ L/L within ±5% for 1000 hours
▲▲ Q/Q within ±10%
Load Life No evidence of damage Biased to full rated current at
▲▲ L/L within ±5% +125°C for 1000 hours
▲▲ Q/Q within ±10%
High Temperature No evidence of damage Biased to 10% rated current at
High Humidity ▲▲ L/L within ±5% +85°C, 85% RH for 1000 hours
▲▲ Q/Q within ±10%
Thermal Shock No evidence of damage 100 cycles between
▲▲ L/L within ±5% -40°C/hour and + 125°C/hour
▲▲ Q/Q within ±10%
Temperature ▲▲ L/L within ±5% ▲▲ L/L to be measured at the
Characteristics temperatures between -40°C and
+125°C as based on the inductance
at 20°C
Unless otherwise specified, measurements shall be performed within 2 hours after leaving test samples for more than one hour at the
normal temperature and at the normal humidity.
CHIP
INDUCTORS