SPEER ELECTRONICS, INC.
TELEPHONE: 814-362-5536 FAX: 814-362-8883
59
CHIP INDUCTOR
KQ1008
THIN FILM CHIP INDUCTOR
KQ 1008 TE 10N K
Type Size Code Packaging Nominal Inductance Tolerance
Air Core 0.98 x .087 x .071 in. TE: Embossed Taping 10N : 10nH G: ±2%
Winding Form 2.5 x 2.2 x 1.8 mm None: Bulk R10 : 0.1uH J: ±5%
1R0 : 1.0 uH K: ±10%
M: ±20%
CHIP INDUCTOR
- Surface Mount 1008 Style
- Flat top suitable for High Speed Pick and
Place Components
- Excellent High Frequency Applications
- High Q Factors and Self-Resonant
Frequency Values
- Inductance Value Marked on Part
- SMT Lab Kit Available
DIMENSIONS
ORDERING & SPECIFYING INFORMATION*
MM
INCH
MARKING ON INDUCTOR CHIP
*Please Note: KSE’s Part Numbers Do Not Contain any Spaces or Hyphens.
DIMENSIONS L W Wt H Ht
2.5 2.2 2.0 1.8 0.45
±0.2 ±0.2 ±0.1 ±0.2 ±0.15
.098 0.87 .079 .071 .018
±0.008 ±0.004 ±0.006
VALUE CODE
10nH to 82nH 10N to 82N
0.1uH to 1.0uH R10 to 1R0 “R” indicates the decimal point
No tolerance of inductance shall be indicated.
H
W
LHt.
Wt.
CHIP
INDUCTORS
SPEER ELECTRONICS, INC.
TELEPHONE: 814-362-5536 FAX: 814-362-8883
60
Ind.
CHIP INDUCTOR
KQ1008
THIN FILM CHIP INDUCTOR
STANDARD APPLICATIONS
1500
1300
1000
25
7.9
375
160
60
45 100
22
20 25
50
50
1000
1600
50
NA
NA
Quality
Inductance Factor SRF DC. Allowable Meas.
TYPE Tolerance (%) Q. Freq. MHz Res ΩCurrent Freq.
G J K M min.
(MHz)
(min) max mA max. Mhz
KQ1008TE10N 10nH 4100 0.08
KQ1008TE12N 12nH 500 3300 0.09
KQ1008TE15N 15nH 3000 0.10
KQ1008TE18N 18nH 2500 0.11
KQ1008TE22N 22nH 2400 0.12
KQ1008TE27N 27nH 0.13
KQ1008TE33N 33nH 0.14
KQ1008TE39N 39nH 0.15
KQ1008TE47N 47nH 350 0.16
KQ1008TE56N 56nH 65 0.18
KQ1008TE68N 68nH 0.20
KQ1008TE82N 82nH 0.22
KQ1008TER10 0.10µH 60 0.56
KQ1008TER12 0.12µH 950 0.63 800
KQ1008TER15 0.15µH 850 0.70
KQ1008TER18 0.18µH 750 0.77 750
KQ1008TER22 0.22µH 700 0.84 720
KQ1008TER27 0.27µH 600 0.91 690
KQ1008TER33 0.33µH 570 1.05 660
KQ1008TER39 0.39µH 500 1.12 630
KQ1008TER47 0.47µH 450 1.19 600
KQ1008TER56 0.56µH 415 1.33 580
KQ1008TER62 0.62µH 1.40 560
KQ1008TER68 0.68µH 1.47 540
KQ1008TER75 0.75µH 360 1.54 520
KQ1008TER82 0.82µH 350 1.61 500
KQ1008TER91 0.91µH 320 1.68 480
KQ1008TE1R0 1.0µH 35 290 1.75 460
KQ1008TE1R2 1.2µH 250 2.0 440
KQ1008TE1R5 1.5µH 200 2.3 420
KQ1008TE1R8 1.8µH 28 2.6 400
KQ1008TE2R2 2.2µH 2.8 380
KQ1008TE2R7 2.7µH 140 3.2 360
KQ1008TE3R3 3.3µH 110 3.4 350
KQ1008TE3R9 3.9µH 100 3.6 340
KQ1008TE4R7 4.7µH 90 4.0 330
KQ1008TE5R6 5.6µH 80 2.2 150
KQ1008TE6R8 6.8µH 15 7.9 70 2.5 150
KQ1008TE8R2 8.2µH 65 2.8 150
KQ1008TE100 10.µH 60 3.2 150
CHIP
INDUCTORS
SPEER ELECTRONICS, INC.
TELEPHONE: 814-362-5536 FAX: 814-362-8883
61
CHIP INDUCTOR
KQ0402/KQ0603/KQ0805/KQ1008
ENVIRONMENTAL & MECHANICAL CHARACTERISTICS
PARAMETER MAXIMUM ▲▲ L TEST METHODS
Dielectric No evidence of flaming, 5 seconds at DC 500V applied
Withstanding Voltage fuming, or breakdown between both terminals and film.
Insulation Resistance 1000MΩ and over 1 minute at DC 100V measured
between both terminals and film.
Flammability IEC 695-2-2 Withstands needle-flame test.
Terminal No evidence of Terminals shall withstand a pull of
Pull Strength damage 10 N in a horizontal direction
Terminal No evidence of Specimen shall be soldered
Bending Strength breakdown on bend test board and force applied to the
opposite side to cause a 10mm deflection
(KQ0603 - 3mm deflection)
Vibration ▲▲ L/L within ±5% 2 hours in each direction of
▲ ▲ Q/Q within ±10% X, Y, Z, on PCB at a frequency
range of 10 - 55 - 10Hz with
1.5mm amplitude
Dropping No evidence of damage Dropping 1m on the ground of
▲ ▲ L/L within ±5% concrete 1 time.
▲ ▲ Q/Q within ±10%
Resistance to No evidence of outer damage Immerse in solder at 260 ± 5 °C
Soldering Heat ▲▲ L/L within ±5% for 10 ± 1 seconds
▲▲ Q/Q within ±10%
Solderability 95% of the terminal should be Immerse in the solder at 230 ± 5°C
covered with new solder for 3 ± 0.5 seconds
Resistance to No damage and marking Accordance with MIL -STD - 202
Solvents must remain legible Method 215
Low Temperature No evidence of damage Store at -40 ± 2°C, for 1000 hours
Storage ▲▲ L/L within ±5%
▲▲ Q/Q within ±10%
High Temperature No evidence of damage Store at +125 ± 2°C, for 1000 hours
Storage ▲▲ L/L within ±5%
▲▲ Q/Q within ±10%
Moisture Endurance No evidence of damage Temperature 40 ± 2°C, 90-95%RH
▲▲ L/L within ±5% for 1000 hours
▲▲ Q/Q within ±10%
Load Life No evidence of damage Biased to full rated current at
▲▲ L/L within ±5% +125°C for 1000 hours
▲▲ Q/Q within ±10%
High Temperature No evidence of damage Biased to 10% rated current at
High Humidity ▲▲ L/L within ±5% +85°C, 85% RH for 1000 hours
▲▲ Q/Q within ±10%
Thermal Shock No evidence of damage 100 cycles between
▲▲ L/L within ±5% -40°C/hour and + 125°C/hour
▲▲ Q/Q within ±10%
Temperature ▲▲ L/L within ±5% ▲▲ L/L to be measured at the
Characteristics temperatures between -40°C and
+125°C as based on the inductance
at 20°C
Unless otherwise specified, measurements shall be performed within 2 hours after leaving test samples for more than one hour at the
normal temperature and at the normal humidity.
CHIP
INDUCTORS
