1
Features
Operating Supply Range 3.0V to 3.6V
Power Dissipation 1W Max
Low-power Sleep Mode (<0.5 mW)
RF Data Channel
Automatic Gain Control or Programmable Gain Mode
Wide Bandwidth VGA
VGA Accepts Inputs from 30 - 300 mV Peak-to-Peak Differential (PPD),
60 - 600 mVPPD or 110 - 1100 mVPPD
Programmable Equalization via 7th-order Equiripple Filter with Programmable
Symmetric Zeros
Programmable 5-to-1 Filter Cutoff Range
Data Slicer with DC Restore Circuit
Wide Frequency Range Clock Extraction
Frequency Synthesizer with Independent 7-bit M and 6-bit N Dividers,
Better than 1% Resolution
Highly Programmable to Accommodate DVD (1 - 5X) and CD (6 - 30X)
Write Asymmetry Measurement for Adjusting Write Mode Power
Data Recovery Supports CLV, ZCLV, ZCAV Recording
Optional Internally Generated Timing for AGC and Timing Recovery
Servo Algebra Functions
45 MHz Bandwidth for Differential Phase Tracking Detector
Land and Groove Detector for DVD RAM
Supports One Beam Push-pull Tracking Output
Supports One Beam Differential Phase Tracking
Focus Error Signal Output
Focus OK Signal
Track Crossing Detection
Mirror Signal Output
Wobble Detection for DVD RAM, DVD+RW
Header Detection for DVD RAM
Description
The AT78C1503 is a programmable DVD/CD channel responsible for servo algebra,
gain control, equalization, bit detection and clock extraction for CD-ROM, DVD-ROM,
DVD+RW and DVD-RAM data. Programmable features allow data rates up to 5X
DVD. Also for DVD-RAM functionality, the channel serves the write path providing 1X
write clock (WCLK) and pit asymmetry detection. The CMOS channel operates from a
single 3.3V supply and is fully programmable through a serial interface for both CD
and DVD modes.
DVD/CD Read
Channel
AT78C1503
Rev. 1214C–03/00
AT78C1503
2
Figure 1. AT78C1503 Block Diagram
SYNTHESIZER
FREQUENCY
MUX
FOCUS OK
SERIAL
REGISTER
TP1 TP2
RFP/N
RG
WG
PD
MODE
CONTROL
Slow
Arithmetic and
Push-pull
Focus Error
Mirror
Detector
Normalization
Tracking
SENA SCLK SDAT
MIRROR
RDSZ
REXT
2
TRK
FE
ID12
FOK
TE
TZC
WBL
ID34
Wobble
Detector
Land Groove
Detector SLOWSUM
Sum or
Difference
(IDSEL)
SERREG
CAGC
Control
(RF Sequencer)
AGC
Control
Voltage
Loop Cap
fcdac/range boostdac
RFDRP
FO2_CD
FO1_CD
TR2_CD
TR1_CD
2
2
2
2
2
2
RFGEN
F
H
G
E
DATA5
DATA4
RCLK
FREF
DATA6
DATA7
DATA1
DATA0
DATA2
DATA3
DATA
PLL
AGC
Control
D/SE
127
TEST
VREF
D/SE
D/SE
D/SE 1
1
1
1
AGCLZ
AGCFST
AGCHLD
IDSEL
AP/N
BP/N
CP/N
DP/N
PGC
PGC
PGC
PGC
MUX
VGA
7th Order
Filter/
Equalizer
Differential
Tracking
Detector
Auto
Inv
TRACK OK
TRACK
ZERO
CROSS
MUX
DC
Restore
8.5X +
-
Σ
Σ
AT78C1503
3
Figure 2. Chip Pin Out
IDFIELD
RFP
RFN
FO1P
FO1N
FO2P
FO2N
TR1P
TR1N
TR2P
TR2N
FOHG
REXT
VDD1
VSS1
FO1_CD
FO2_CD
TR1_CD
TR2_CD
VDD6
SS_H
VSS6
REFFRONT
REFBACK
LENSPOS
TRCST
VDD3
VSS3
VDD11
VSS11
DATA7
DATA6
DATA5
DATA4
DATA3
DATA2
DATA1
DATA0
RCLK
RFDROP
VDD5
VSS5
FREF
VDD7
VSS7
VDD4
VSS4
SCLK
SDATA
SENA
ATP1
FE
TE
SLOWSUM
PORB
VSS8
VDD8
IDSEL
LHIPWR
SHLD
ADCSTRT
BWUP
BWDWN
IDINT
PD
RG
VSS9
VDD9
WOBBLE
ID12
ID34
TZC
TOK
FOK
MIRROR
CAGC
RDSZ
AGCLZ
VDD10
VSS10
AGCFST
AGCHLD
TP1P
TP1N
TP2P
TP2N
VSS2
VDD2
CDCRP
CDCRN
TSDDTP2P
TSDDTP2N
TSDDTP1P
TSDDTP1N
TRSIN1P
TRSIN1N
TRSIN2P
TRSIN2N
WG
WCLK
AT78C1503
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
100
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
80
79
78
77
76
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
AT78C1503
4
Functional Description
The AT78C1503 is a programmable DVD/CD channel
responsible for servo algebra, gain control, equalization, bit
detection and clock extraction for CD-ROM, DVD-ROM,
DVD+RW and DVD-RAM data. Programmable features
allow data rates up to 5X DVD. Also for DVD-RAM func-
tionality, the channel serves the write path providing laser
power control and pit asymmetry detection. The CMOS
channel operates from a single 3.3V supply and is fully pro-
grammable through a serial interface for both CD and DVD
modes. The IC contains two separate processing channels.
One for RF signal detection and synchronization, and the
other for focus and tracking servo control. These are
referred to as the RF channel and the servo channel
respectively
RF Channel Overall Description
The RF channel consists of gain control, equalization, bit
detection and clock extraction and is shown in the block
diagram of Figure 1. The readback signal is internally AC
coupled from the preamplifier to the channel input
RFP/RFN. A variable gain amplifier (VGA) is used for gain
control of the readback signal. A 7th order equiripple fil-
ter/equalizer is used for noise filtering and equalization of
the signal before detection. The output of the equalizer
feeds a fixed gain of 8.5 bringing the internal level up to
approximately 750 mV peak-to-peak differential (mVppd).
The output of the 8.5X amplifier enters the AGC control
block which closes the AGC loop to maintain a 750 mVppd
slicer input level while RF P/N is allowed to vary ten to one.
The data slicer has a programmable slicing level or an
adaptive DC restore system to maintain a DC free output of
the slicer. The data slicer output is a digital stream and is
sent to the clock extraction and synchronization circuitry.
Clock extraction is performed with the data PLL which is
operated in phase/frequency mode during write and idle
modes and phase only mode when reading data. An on
board frequency synthesizer is used for locking the data
PLL to a close initial frequency upon start up. Various test
outputs are provided to aid the evaluation of the system. In
addition an offset calibration routine executed on power up
eliminates the need for internal AC coupling by correcting
internal offsets over the parts operating conditions.
Gain Control
The front-end gain control on the AT78C1503 consists of
five differential Variable Gain Amplifiers (VGAs). They
include a VGA for the RF path and four Programmable
Gain Control (PGC) amplifiers for A, B, C and D inputs. The
voltage gain range for the VGAs can be programmed by
setting the VGAMODE<1:0> control bits (see Figure 3).
There are two primary modes of operation for the RF path:
Automatic Gain Control (AGC) mode and Programmable
Gain Control (PGC) mode.
In AGC mode (PGCEN=0), the master VGA is part of the
AGC loop. The loop also contains the 7th order
filter/equalizer, a fixed high-gain stage, an amplitude
detector, a dual rate charge-pump, an internal loop
filter/capacitor and an exponentiator (see Figure 3). The
VGA voltage gain is adjusted by the feedback control loop
such that the signal at the input of the amplitude detector is
about 750 mVppd. Gain tracking is achieved by applying
the same gain control signals to the four slave VGAs.
Figure 3. AGC Loop Block Diagram
In PGC mode (PGCEN=1), the master VGA gain is set
directly by programming the PGC DAC through the serial
interface (see Table 5). Once again, gain control signals
are shared between the master and the four slave VGAs.
The AGC loop is of the peak sampling type in which
asymmetric charge/discharge currents are used. These
currents are programmable through bits AGCQP<3:0> (see
Table 4). They are derived from the internal bandgap
voltage reference and the external resistor REXT, resulting
in a near zero temperature coefficient. The absolute value
is process dependent varying with the internal bandgap
voltage (±5%) as well as due to tolerance of the external
resistor. The charge current continuously charges up the
AGC capacitor. A 16X discharge current results for the
duration the signal is above the 100% threshold (i.e. 750
mVppd). The large discharge/charge ratio causes the loop
to adjust the VGA gain based on the peak amplitude of the
signal. As a result, the peaks of the signal are locked to a
known voltage (i.e. 750 mVppd).
RF in VGA FILTER
EQUALIZER 8.5X
QPUMP AMPLITUDE
DETECTOR
EXP
CAGC
350pF
To
Detector
internal
AT78C1503
5
Figure 4. RF AGC Timing Sequence using the On-chip Sequencer
AGC mode is initiated when either read gate (RG) or
IDFIELD transition high. Initially, the input impedance is
reduced (LOWZ=1) and the AGC loop is set in hold mode
so that no gain corrections are made. An external AGCHLD
pin is also provided for the user to initiate AGC loop hold
whenever desired. After a user programmable duration,
controlled by bits AGCLZTM<3:0>, the LOWZ signal goes
low. Conversely, it is also possible to set the LOWZ signal
low, through the external AGCLZ pin. Following LOWZ, a
user programmable period is set aside to allow the internal
ac-coupling networks to recover. This duration is controlled
by programming bits ACCPLTM<5:0>. Next, the AGC goes
into a fast acquisition mode. During fast acquisition mode,
the charge pump current, and consequently the AGC loop
bandwidth, is scaled up by a factor of 4 as compared to
normal operation. The loop capacitor is quickly
charged/discharged until the lock voltage is 750 mVppd.
This period is set by either the external AGCFST pin (high)
or by programming bits AGCFSTTM<5:0>. After fast mode,
normal AGC operation starts and continues until RG goes
low. Figure 4 illustrates a typical timing sequence for the
AGC loop using the on-chip RF sequencer. For a more
comprehensive description of user programmable timing,
please refer to the section on the RF sequencer.
The RF signal, whether in AGC or PGC mode, is generated
in a few different ways. If RFGEN is low, an externally gen-
erated differential RF signal is ac-coupled to the master
VGA at pins RFP/N. At the same time, A, B, C and D differ-
ential signals are also ac-coupled to each of the four slave
VGAs at pins AP/N, BP/N, CP/N and DP/N respectively.
For single-ended input, all signals are ac-coupled to the
respective positive pin while the negative pin is connected
to a small-signal ground.
It is also possible to generate the RF signal internally by
summing the four individual signals A, B, C and D. This is
achieved by setting the control bit RFGEN high. The RF
signal in this case is A+B+C+D. However, if the IDSEL con-
trol signal is also asserted while RFGEN is high, then the
RF signal is generated as a difference instead of a sum.
This happens during headers or ID fields on a DVD RAM.
The RF signal in this case is A+B-(C+D). The IDSEL signal
has no effect on the RF path if RFGEN is low. Under these
circumstances, it is assumed that the preamp is capable of
generating the difference. For a complete description of
various modes and the respective RF signals, please see
Table 19.
The AGC loop has one test point, which can be monitored
by the user. The test point designated as TP1 is dedicated
to the AGC circuitry. TP1 allows the user to monitor the
inputs and outputs of all five VGAs, the signals out of the
three summer/buffers and the input/output of the high gain
amplifier. The test point has a selection bit TP1EN, and
address bits TP1<5:0>, which are selected via the serial
register. The test point map for TP1 is given in Table 6. The
test point gains are lower than unity. This means that test
point output signals are scaled-down versions of the
internal signals being monitored. TP1 has a gain of 0.8 v/v
from the internal nodes. This gain must be used in
calculating certain absolute voltages stated in the spec, for
example, the AGC lock voltage of 750 mVppd.
An additional serial register bit, AGCCALTPON, is provided
to configure the test point as if the calibration routine is
being used. The address mapping changes according to
Table 7. Calibration is an internal offset cancellation
scheme used at various points throughout the channel.
During calibration, the unbuffered output node of each of
the five VGAs is offset corrected. The fixed, high-gain
amplifier is also calibrated in a similar fashion. For more
information on calibration, please refer to the calibration
section.
RF Dropout Detector
The RF Dropout detector is used to sense when the RF
signal has dropped below a programmable level for a
RG or IDFIELD
LOWZ/HOLD
1-15 Clocks (AGCLZZTM<3:0>)
AC Coupling Recovery
1-63 Clocks (ACCPLTM<5:0>)
1-63 Clocks (AGCFSTTM<5:0>)
AGC Fast
AT78C1503
6
specified amount of time. The RF dropout detector gets its
input from the 8.5 V/V gain stage immediately before the
DC restore block. There is a programmable window
detector which the RF signal passes through. The absolute
value of this window has the following value:
(RFDTH<4:0>+1)*3.5 mV+115 mV. The result of this
comparison is captured by comparators clocked at the
synthesizer clock rate divided by two. The output of the
window comparator enters a counter in which the duration
of the assertion of the window detector is monitored. If the
window detector output remains asserted, longer than
RFDROPCNT<4:0> system clocks, the RFDROP pin will
be asserted. The assertion of the window detector
indicates the RF signal is below the programmed value.
The RF dropout detector clock is the synthesizer rate
divided by two.
Once the signal has been restored in amplitude, the
RFDROP pin will be deasserted. There is no attempt to
make use of this signal internal to the channel.
In order for the RF dropout to operate the RFDROPEN bit
must be programmed high. When this bit is low, the
dropout detector will be powered down.
7th-order Filter/Equalizer
The on board filter/equalizer is implemented as a 7 pole 2
symmetric zero 0.05 degree equiripple phase low-pass
filter. Cutoff frequency for the filter spans 4 - 26 MHz in 6
coarse steps, set by serial register 9, FLTRRANGE<2:0>,
with fine control within each coarse step controlled by a 6-
bit dac; FCDAC<4:0>. Two programmable zeros provide
user controlled boost up to 14dB from the low frequency
gain. The two zeros may be set to track one another,
ASYMBST=0, to provide flat group delay independent of
boost or the zeros can be programmed independently
thereby providing group delay adjustment, ASYMBST=1. In
the case of symmetric boost, BST1<3:0> controls the
amount of boost; see Table 30. For asymmetric zeros,
BST1<3:0> and BST2<3:0> independently control the two
zeros. Group delay variation is maintained within ±4% out
to 1.5 times the cutoff frequency when ASYMBST=0.
Individual Q adjust is also provided for the three biquads
which make up the filter. These Qs can be independently
adjusted if a slightly different transfer function other than
the equiripple is desired. The amount of Q adjust is
determined by serial registers BQD1-3Q<3:0>, see Table
31.
When boost greater than 7 dB above the DC level is
required, the gain through the filter needs to be reduced in
order to reduce the amount of signal distortion originating
from the filter. The bit FLTRGAIN should, therefore, be set
high when more than 7dB of gain is required, this will
reduce the signal amplitude through the filter by a factor of
two.
The filter cutoff is stabilized over supply and temperature
variations by using an external resistor and an internal con-
trol loop. Absolute cutoff is guaranteed within ±10% of the
specified value. The filter is incorporated into the AGC loop
along with a final gain of 8.5 V/V amplifier to bring the final
detector input up to 750 mVppd. The signals at every point
throughout the Continuous Time Filter (CTF) are available
via TP2 for testing and system evaluation, see Table 8.
RF Data Detector and DC Restore
The output of the high gain amplifier inside the AGC loop is
the input to the RF detector. The detector can be operated
in three distinct modes controlled by bits DETMODE<1:0>
(see Table 10). These modes are DC-restore mode, Com-
parator mode and Write Power Test mode.
During normal operation (DC-restore mode), the detector is
a slicer with the slicing threshold set automatically by an
internal feed back loop. This is depicted in Figure 4.
Figure 5. Data Slicer with DC Restore
The loop consists of a charge pump and an external inte-
grating capacitor. The digital output of the slicer is
integrated and subtracted from the input removing any
baseline variation. The charge pump current is programma-
ble and can be set through bits DETCPI<1:0> and
DETKCP<1:0> in the serial register. In comparator mode,
the feedback loop is disabled and the slicing threshold is
set manually by programming a DETTHRSH. Lastly, in
Write Power Test mode, the detector is used in asymmetry
detection for determining written pit asymmetry. In this
mode the feedback loop is disabled, the loop filter/capacitor
is reset to zero and the digital output of the slicer is inte-
grated. The resulting voltage is then used to adjust the
write power to be within some desirable range.
A number of detector internal signals can be monitored at
test point TSDD1<3:0> (see Table 14). These include, the
voltage on the loop filter/capacitor, the input to the slicer
input, and the digital output of the slicer.
SLICER
Detector
Output
Vth
0
Vth
DAC
C
QPUMP
EQ
Data
-
+
2
2
2
AT78C1503
7
Timing Recovery PLL
The digital data out of the RF data detector is input to the
data PLL. The purpose of the data PLL is to extract the
system clock from the detected data and synchronize the
clock and detected data. The data PLL consists of
phase/frequency comparator, phase only comparator, 2 to
1 multiplexer, charge pump, internal loop filter and VCO.
Two outputs are generated. One is the retimed data
available to the controller on a 4 or 8-bit bus and two is the
recovered clock with frequency equal to the recovered
channel data rate divided by 4 or 8, depending on the
NIBBLE bit state. Prior to the start of a read operation, the
data PLL VCO is locked to the frequency synthesizer
output which is programmed to the desired channel rate.
This sets the data PLL VCO close to the desired frequency
for read back. Locking the two PLLs is accomplished by
choosing the frequency synthesizer output and the data
PLL VCO as the inputs to the data PLL phase/frequency
detector (PFD).
The timing recovery system operates in two modes of
operation. When the SYNCSRCH bit is programmed high
the data recovery VCO clock is initially slaved to the
synthesizer output. A MAXPERIOD counter is updated at
each data transition. The PERIOD counter counts the
number of clock cycles between transitions and resets at
each transition. The MAXPERIOD register holds the
maximum of its present value or the PERIOD counter value
at a transition. If the VCO is at the proper frequency, the
MAXPERIOD counter value will be 14 in DVD ROM, DVD
RAM and DVD+RW modes of operation. This corresponds
to the 14T sync frames in the data. If the MAXPERIOD
counter value is not 14, the data recovery ICO current
DAC, DRDAC, will be adjusted to set the VCO frequency
so the longest time between transitions is 14 clock cycles.
The MAXPERIOD counter is validated over a period TBD
clock cycles. After the MAXPERIOD counter has
maintained 14 as the maximum for TBD clock cycles the
DRDAC is set to within 7% of the proper frequency. The
number of clock cycles between 14T patterns is counted by
an 11-bit counter. When the DRDAC is set to the proper
current, the time between 14T patterns is 1456 clock
cycles. This signifies the Timing recovery VCO is operating
at the correct frequency and the data recovery PLL will Pull
in. The DRDAC is incrementally adjusted to realize the time
between 14T patterns being 1456 clock cycles. The
controller is able to read the DRDAC setting and the
MAXPERIOD counter via the serial register to assist setup
of the equalizer and detector.
When the 78C1503 is operated in CD mode the ICO DAC
is adjusted to cause the MAXPERIOD counter value to
equal 11 clock cycles between transitions. Again, the MAX-
PERIOD counter value may be read by the serial register.
If the SYNCSRCH bit is programmed low all control of the
synthesizer and VCO is done by the controller.
When RG is asserted the detector output is used instead of
the frequency synthesizer output for the phase comparison.
In this mode the phase only comparator is used. The loop
filter is implemented with on-chip components, the transient
characteristics of the loop are set internally based on the
DVD readback rate. The loop filter components and charge
pump currents are programmed using the serial register.
The loop filter component values and currents are chosen
such that the loop filter damping factor equals 1.2. The loop
filter crossover frequency is nominally set to 1% of the data
rate during acquisition and 0.5% of the data rate during
track. The loop filter charge pump current values and loop
filter component values are listed in Table 17. A block dia-
gram of the data PLL is shown in Figure 6.
Figure 6. Timing Recovery Phase Locked Loop
Frequency Synthesizer PLL
The frequency synthesizer generates a frequency
reference for the timing recovery PLL in all write and idle
modes and also generates a frequency reference for
writing data in a DVD/RAM application. A block diagram of
the synthesizer is shown in Figure 7. The frequency
synthesizer consists of phase/frequency comparator,
charge pump, internal loop filter, VCO and internal dividers
for generating all frequencies needed for DVD and CD
operation. The frequency can be programmed with an
accuracy better than 1%. The internal loop filter is fully
differential to suppress common mode noise.
PFD
Synthesizer
Output
QP VCO
PD
Detector
Output
WRITE/IDLE
READ
Recovered Data
Cp
Cs
R
AT78C1503
8
Figure 7. Synthesizer Phase Locked Loop
An external CMOS level clock reference (FREF) divided by
a programmable 7-bit counter (M) and is used as a stable
reference input to the phase frequency detector. The
second input to the phase detector is the VCO divided by
N+1, where N is an 6-bit programmable counter value. The
CLOCK output comes from the VCO divided by P+1,
although this 3-bit counter can divide by one. Frequencies
from 25 MHz to 150 MHz are supported with better than 1%
resolution. The external frequency reference, FREF can
also be divided by two before it is sent into the M counter
set by FREFBY2 bit. The CLOCK frequency output to the
data recovery section of the AT78C1503 is:
FCLOCK =[(FREF or FREF/2)(N+1)]/[(M+1)(P+1)]
TR and Synthesizer Loop Parameters
The product of the two above parameters gives:
TR and Synthesizer Loop Equations
where:
ωn = loops natural frequency (rad/s)
ζ = damping factor
In = Charge pump current divided by average number
of bit times per VCO update (A). For reading random
data, divide charge pump current by four to get In.
Cs = series capacitor in loop filter (F)
R = resistor in loop filter (W)
Kvco = VCO gain (rad/sV)
Cp = Cs/20 (F)
Figure 8. Photo Diode Array
V-to-I gm = 98 mA/V (HiGM = 1),
70 mA/V (HiGM = 0)
KICO = 50% of fc/100 mA
gm KICO = KVCO = 49% of fc/V (HiGM = 1),
35% of fc/V (HiGM = 0)
PFD QP VCO
1/(N+1)
CLOCK
1/(M+1)
FREF or
Cp
Cs
R
1/(P+1)
FREF/2 ωnIn Kvco()2π()
Cs
--------------------------------------------=
ζR2()In Cs Kvco⋅⋅()2π()=
A D
B C
FG
EH
Track
Direction
AT78C1503
9
Figure 9. Fast Servo Arithmetic
Servo Channel Description
The AT78C1503 servo channel can process data from two
types of photodiode arrays. The most common type is the
A,B,C,D only array. The other type of array is an 8 element
array (see Figure 8) in which Differential Push Pull tracking
or Push Pull tracking may be used. As shown in Figure 1,
there are 4 differential signals: AP/N, BP/N, CP/N, DP/N.
These inputs can also be used in a single ended fashion by
not connecting the negative side and also setting bit TBD in
the serial register to indicate that a single ended interface
has been selected. In addition to the differential A, B, C and
D input signals the outputs of the E, F, G and H photo
diodes are connected as single ended input signals to the
78C1503 to be used in the Differential Push-Pull tracking
algebra.
Servo algebra is performed for focus, push-pull tracking,
differential phase tracking, tangential push pull and
land/groove detection. The input signals on the A, B, C and
D pins are used to internally generate the astigmatic focus
and tracking error signals. Additionally the input pins E, F,
G and H may be used to internally generate the differential
push-pull tracking signal.
A block diagram of the fast servo arithmetic functions are
shown in Figure 9 and a block diagram of the slow servo
arithmetic functions are shown in Figure 11.
Fast Servo Arithmetic Functions
Differential Phase Tracking
The Differential Phase Tracking block diagram shown in
Figure 9 generates the servo tracking error for DVD ROM.
Differential inputs A, B, C and D, are AC-coupled using on-
chip capacitors. The AC-coupling pole is nominally set to 6
kHz. Each of these differential signals then goes through a
Programmable Gain Control (PGC) set up via the serial
register. The PGCs are followed by adjustable delays
nominally set to TBD ns. The delays on the signals from the
front of the detector, A and D, are adjusted to an amount α
that is greater than the nominal delay, whereas the delays
on signals from B and C signals are adjusted to α,=less than
the nominal delay. The delayed signals are followed by two
high-speed summers to generate the diagonal sums A+C &
B+D. The output signals of the summers is delayed by a
different nominal value plus and minus an adjustable
amount, β.=That is, the output A+C is delayed by a nominal
amount plus an adjustable amount, β,=and the output B+D
is delayed by the same nominal value minus β.The
adjustable delays are realized with second-order all pass
Bessel filters.
The signal level coming out of the second set of delays is
typically between 100-150 mVppd. Each of the two
diagonal sums is buffered, amplified and equalized. The
equalizer transfer function is depicted in Figure 10 and
includes a zero followed by two poles. The zero and the
two poles track the DVD setting according to Table 20.
Equalized diagonal sums (A+C & B+D) are sliced around a
fixed threshold and phase compared to generate pump-up
and pump-down pulses. The phase comparator output is
automatically disabled when no transitions are detected on
either one of its two inputs.
Following the phase comparator is a low-pass filter which
integrates the pump-up and pump-down pulses to generate
the differential phase tracking error signal. The low-pass
filter consists of a charge-pump and on-chip integrating
capacitors. The pole frequency is programmable from 30
kHz to about 2.5 MHz. When DPDDIVSEL is high, the pole
frequency can be set directly through bits DPDDIVhi<3:0>
(see Table 23). When DPDDIVSEL is low, however, the
low-pass cutoff frequency is adjusted automatically by an
up/down counter. This feature allows the low-pass filter
bandwidth to track seek speeds during seek mode. A user-
2
2
2
2
B+D
A+C LPF
2
2
LPF
QP
CP/N
DP/N
AP/N
BP/N
VGA
VGA
VGA
VGA
VGA
VGA
EQ
EQ
PD TE
2
2
DPDKPGC<3:0> 4
DPDVGABYP DPDLPFBYP
From serial register
Differential to single-ended
converter plus VGA
UP
DN
DPDKSEVGA<3:0>
4
DEL
DEL
DEL
DEL
DEL1
DEL1
AT78C1503
10
programmable DAC allows up to ± 250 mV of offset
correction at the charge-pump output to compensate for
any mismatches in the two signal paths.
The low-pass filter output is fed into a differential-to-single-
ended converter followed by another VGA. This VGA has a
gain range from 0.5V/V up to 4V/V controlled by bits
DPDKSEVGA<3:0> (see Table 21). The final output is
centered around 1.5V with a range of about ± 500 mV. This
output is muxed-in with the TE (tracking error) signal for
DVD RAM.
Figure 10. Differential Phase Tracking EQ Transfer
Function
20 dB/decade
-20 dB/decade
20 dB/decade
1 2 3 4 5 MHz
3.4 MHz 17 MHz 40 MHz
0 dB
AT78C1503
11
Slow Servo Arithmetic Functions
Figure 11 shows the top level diagram for the slow servo.
The first block has inputs A, B, C, D,E, F, G and H. The
functionality is as follows:
First there is a Sample and Hold function on all the 4
inputs. The S/H is done from an external CMOS input pin
TBD. The minimum amount of time for the Hold state is 30
ns, and it should not exceed 200 ns. The minimum amount
of time for the Sample state depends on how much the sig-
nal changes between samples. For example if ak+1 - ak is
half of the dynamic range on FO1,2 TR1,2, then the sample
state should not be less than 20 ns. In reality the S/H signal
will be slew rate limited by the CMOS I/O input.
Second there is a Differential to Single ended conversion
and a VGA function on each input. The reference for the
D2S function is referenced from the supply and it varies
from VDD-1.5V to VDD-2V via a 3-bit D/A. This reference is
also sent as an output off chip, in case it needs to be used
to a reference in a preamp. The VGA range is between 0.3
to 4 (16 exponentially spaced steps) with a worst case
bandwidth of 15 MHz. The VGA outputs go also to ID
Detector, Wobble Detector, and Mirror Field Detector
blocks. There is also an option which resets the values of
A, B, C and D to their midrange point (ex. 0V differential).
This option is used for electronic offset correction on the
Focus Error and Tracking Error signal described later in
this section.
For the slow servo each of the four inputs contains a single
pole low-pass filter with a programmable cutoff frequency
between 150-500 kHz. The cutoff frequency is
programmable with a 3-bit SR control which does not track
the channel data rate.
Next block is a Voltage to Current converter followed by a
±30% gain adjust (4 bits + sign) and a ± 30% offset adjust
(4 bits + sign) on each individual channel. The input signals
A,B,C,D will get the gain and offset adjustment.
These gain and offset adjusted signals are now summed
together and the sum feeds a digitally controlled AGC loop
(also known as the normalization loop). Maintaining a con-
stant output voltage at the output of the AGC loop
normalizes the input to the focus and push-pull tracking
error signals, so the error signals are not dependent on the
strength of the light returned to the photo-diodes. This nor-
malization alleviates differences due to media reflectivity.
This loop consists of a VGA, counter (7 bits) and compara-
tors. The clock for the counter is selectable: It can either be
a divide by 3*X of the data rate (X ranges between 3 and
16) or a divide by 3*Y of the oscillator frequency (Y ranges
between 1 and 16). The reason behind the two different
clock domains is that when the normalization loop is used
for normal operation (read, erase, write) collecting data
along the tracks, will be desirable for the loop bandwidth to
follow the data rate. For the Tracking error during a seek
however, it might be desirable for the loop bandwidth to be
independent of data rate. The normalization loop has a fast
acquisition mode controlled by 2 bits TBD. Depending on
this setting the counter can count by either 1,2,4,8 every
time when the error signal exceeds a threshold which is
also programmable by 2 bits TBD. This feature helps the
normalization loop track fast slewing signals in the
A+B+C+D signal.
Focus error signal (FE) FE = (A+C)-(B+D). The FE signal is
then passed through a VGA which is slaved to the normal-
ization loop. The dynamic range on the FE is between 0.5
to 2.5V centered around 1.5V. There is also a +-0.5V offset
added to the FE signal using a 3-bit + sign D/A. In addition,
the gain on the Focus Error is adjustable between 1 to 5
using a 3-bit gain adjust (exponentially spaced). There is
high gain chip input TBD which flips between gain = 1 and
the gain set by the 3-bit gain adjust. For the gain of 1 set-
ting the FE is linear and covers 0.5 - 2.5 range. For a gain
higher than 1 the FE will saturate.
Push Pull Tracking error signal (PPTK) is PPTK = (A+B)-
(C+D). The PPTK signal is then passed through a VGA
which is slaved to the normalization loop. The dynamic
range on the PPTK is between 0.5 to 2.5V centered around
1.5V. There is also a ±0.5V offset added to the PPTK sig-
nal using a 3-bit + sign D/A. In addition, the gain on the
Tracking error is adjustable between 1 to 5 using a 3-bit
gain adjust (exponentially spaced). For the gain of 1 setting
the PPTK is linear and covers 0.5-2.5 range. For a gain
higher than 1, the PPTK will saturate.
The Differential Push Pull tracking error is
DPPTK=(A+B+E+F) - (C+D+G+H). The differential Push
Pull Tracking error signal is passed through a VGA slaved
to the normalization loop and conditioned similarly to the
PPTK error signal as described above.
The Track Zero Crossing (TZC) signal is needed for
counting tracks during a seek operation. Part of the TZC
function is an Average Detector function (see Figure 11)
which follows the average of either the PPTK or DFTE
(Differential Phase tracking error) signals. The architecture
of the Average Detect Function (ADF) is similar to the
normalization loop. The only difference is that rather than
keeping a constant output, this loop follows the input with
different bandwidths. The clock frequency for this ADF
block is a divide by 2*X of the crystal, where X is between 1
and 2048. The maximum clock frequency however should
not exceed 8 MHz. This bandwidth is controlled by 2 input
pins (BWUP, BWDWN). When each of these pins is
toggled by the servo chip the bandwidth of the ADF macro
goes UP or DOWN by a factor of 2. There are 11 steps for
the bandwidth.
AT78C1503
12
Figure 11. Slow Servo Arithmetic
This big bandwidth range is helpful because it can track in
real time, the head velocity during a seek. When BWUP
and BWDWN are both high, the loop bandwidth point to a
location in the serial register. The comparator which
compares the output of the ADF block with the incoming
signal (PPTK or DFTE) has a programmable hysteresis
with a maximum value between 50 to 300 mV. For a given
setting the hysteresis goes down at 6dB/octave (4 points)
as soon as TZC bandwidth equals the bandwidth at the
front end of the servo block (200K to 500K). The total range
that the hysteresis varies is 4 to 1. This is done in order to
reduce the hysteresis of the comparator as signals faster
than the servo LPF setting (200K-500K) are passed
through the system. For example assume the front end LP
is set at 200K and the comparator hysteresis is set at 100
mV. Then, as the bandwidth of the TZC goes higher than
200K the hysteresis is as shown Table 19.
The mirror circuit for DVD ROM has the same function as
the Track Zero Crossing. The only difference is that its input
is the total sum A+B+C+D. This circuit shares the same
BWUP, BWDWN inputs as the TZC circuit and also shares
the same register location for the default bandwidth. The
hysteresis, however, for its output comparator is a different
register location (50 - 300 mV).
The total sum A+B+C+D is sent off chip to the servo
controller. The dynamic range is 0.5 to 2.5 volts. On the
same output pin, we also mux A, B, C and D, in order to
perform the ±30% gain and offset adjust discussed earlier.
The bandwidth of the total sum output is 100 kHz.
There is also the REFBACK reference pin, (typically 1.5V
from ground), which when configured as an output, reflects
the reference of the signals going to the servo ADC. When
the reference is configured as an input, (with a SR bit TBD)
then the external reference is used to output the signals to
the servo ADC.
The mirror field detector is different from the mirror for DVD
ROM. This circuit monitors the total sum before the 200-
500k LP and using a programmable threshold comparator
controlled by bits TDB in the SR flags the mirror field.
The focus OK and track OK signals output a CMOS logic
high signal during write when the focus error signal or
tracking error signal is too large. The signals are derived
from the WRITE gate input signal being TRUE and their
respective error signals being greater than a preset value.
This is schematically drawn in Figure 12 for the focus OK
signal.
Figure 12. Focus NOK
ID Header Detection
The ID header detection circuit determines when a header
has occurred in the case of DVD RAM media. After gain
adjustment, AC coupling and lowpass filtering the
difference channel, left minus right halves of photo detector
array, will produce a DC shifted signal indicating the
presence of the DVD RAM header. The standard DVD
RAM format also includes a second header, immediately
VGA
comparator/
DAC
A + B + C + D
FE
PPTK
counter
LandGrvDet
ID12
level
DAC
-1
ID34
>
<
(A + B)-(C + D)
BPF WBL
wbl
thrsh
>
Slowsum
MIRROR
DVD
ROM
>
variable
thresh
Mirror
Field
MUX
4
FO1,2 TR1,2
Average
Detector
>
Hysteresis
Comparator
Threshold
TZC
Average
Detector
>
Hysteresis
Comparator
Threshold
MUX
PPTK
DFTE
OFFSET
OFFSET
FO1_CD
FO2_CD
TR1_CD
TR2_CD
VGA
VGA
S/H/D2S
VGA/LPF/
V21/Gain
& Offset
Adjust
A
B
C
D
E
F
G
H
Σ
Σ
>
&
WRITE
Vfcsnok
FCS
FOK
<
Vfcsok
&
inv
+
AT78C1503
13
proceeding the first, with opposite polarity which the
detector will also sense. Once a header occurs, the
assertion and deassertion of the ID12 and ID34 pins will
coincide with the detection of the first header and second
header, respectively. The polarity of the tracking error (TE
pin) will also be adjusted to correspond to the proper
land/groove polarity which is determined by the sign of the
DC shift of the first header. The beginning of a header also
can start a new RF sequence, which will provide the RF
data recovery path with the correctly timed control signals.
The RF sequencer is explained in the next section.
The difference signal used by the ID detector is generated
automatically from the input signals. The difference signal
is the sum AP/N+BP/N-(CP/N+DP/N). The difference
signal passes through a fixed gain of 3 V/V before passing
through a programmable gain stage with transfer function
equal to IDWBLVGA*0.25 V/V. This difference signal is
internally AC coupled with a pole at 2 kHz. The signal then
goes to a 2nd order lowpass filter which has a DC gain of 2
V/V. The cutoff frequency of the lowpass filter is set by the
IDWBLFLTR<2:0> bits and has a value of
(IDWBLFLTR+1)*100 kHz which allows for DVD RAM X1
through X8 headers to be detected. After filtering, the
signal goes to a window comparator which is clocked at a
synthesizer divided by 8 rate. The absolute value of the
window threshold is set by the IDSLC<3:0> bits and has a
value of IDSLCE*26.2 mV. When the signal exceeds the
programmed window, it triggers the ID detector state
machine.
The analog signal polarity for ID12 determines if the push-
pull tracking error is negated or not, i.e. indicating the start
of a land or a groove. If the polarity is positive, then a
groove region is being entered and the polarity of the
tracking error is not negated. If the polarity of the signal is
negative, then a land region is being entered and the sign
of the tracking error is negated. The POLPOL bit (Polarity
of the Polarity), allows an inversion of the above stated
logic in the case that an inversion has occurred along the
signal path.
The SNGLHDR bit is provided if the media being read has
only a single header. This allows the ID detector state
machine to be reset following only one header.
The IDINT serial register bit gets logically ORed with the
IDINT pin which enables the internal ID detector to trigger
the RF sequencer. If neither one of these signals are
asserted, the RF sequencer will not be triggered by the
detected header BUT the ID12/ID34 pins are still active as
is the polarity switching of the RAM tracking error.
The IDHLD bit allows the part to disable the ID detector
from functioning except when the IDSEL pin is asserted.
This in effect forces the part to qualify a valid header with
the IDSEL pin. This is helpful once header timing is
acquired and the controller can assert IDSEL at
approximately the correct time when a header is about to
occur as this prevents possible false triggering of the ID
detector during user data periods.
The IDFLDSRCE bit controls what signal will become the
output on the IDFIELD pin. When IDFLDSRCE is low, the
IDFIELD pin tracks the IDSEL input directly. When
IDFLDSRCE is high, the IDFIELD output will brought high
upon the assertion of ID12 and return low upon the
deassertion of ID34. In the case of SNGLHDR being high,
IDFIELD will be brought low upon the deassertion of
ID12.This allows the channel to generate its own IDFIELD
signal upon start-up of the system if this signal should be
required by the preamp before the controller knows the
exact timing of the RAM headers.
All ID detector functionality will be disabled if the mode con-
trol bits, SRVMOD<3:0>, are such that RAM media is not
selected.
For test purposes the BY_ACBYP bit is provided which
shorts the signal path around the AC coupling capacitor.
This allows DC testing of the ID and Wobble paths.
HDRTSTEN allows the ID detector state machine to be
tested. When asserted, the AGCLZ pin functions as the
positive window comparator output, AGCFST functions as
the negative window comparator output and AGCHLD
functions as the wobble comparator output. Using these
pins the detector and RF sequencer can be tested by a
purely digital means.
RF Sequencer
The RF sequencer provides the capability to internally
control the RF paths timing sequence when entering a
header area for RAM or user data for any supported media.
The RF signals which it controls are the AGCs LOWZ,
HOLD and Fast RECovery signals and also the signal to
indicate the need to switch to data mode in the timing
recovery block. When enabled, the sequencers outputs are
logically ORed with the corresponding external pins and is
especially useful at start-up when the controller doesnt
know the exact laser position yet.
The sequencer may be started in several ways, all of which
may be enabled or disabled. In DVD RAM header mode,
the sequencer may be started with the assertion of the
internally generated ID12 and ID34 or the external input pin
IDSEL. The choice of which mode the sequencer starts
with is determined by the state of the ID internal (IDINT)
pin. If IDINT is asserted, logically high, the internally gener-
ated ID12 signal is used to start the sequencer. This is
useful under the condition that the controller does not yet
know the laser location, or the controller does not contain
the circuitry required to generate the control signals, or the
user believes the channel can more accurately detect the
AT78C1503
14
headers than the controller can time them. If IDINT is not
asserted, it is set logically low, then the external pin IDSEL
may be used to start the RF sequencer. This mode is use-
ful if the controller does not contain the required logic to
generate the RF signals or if fewer inter-connects between
the controller and channel were desired. In all types of
media, the RF sequencer may also be started with the
assertion of the pin RG.
The RF sequencers system clock is derived from the fre-
quency synthesizer divided by four so it is therefore
clocked at a nibble rate with respect to the RF channel rate.
As stated above, the start signal for the sequencer can be
one of several possibilities. The lengths of each timing field
are user programmable and are all stated in terms of nibble
rate. Figure 1 shows the generated signals and the amount
of programmability for each field.
LOWZ/HOLD line is shown starting asserted. This would
be the typical case when entering a RAM header or a user
data field. As stated above, the start signal can be either
the RG pin or one of several ID header indicators. In the
case of RAM headers, the LOWZ needs to be asserted in
order for the on-chip AC Coupling to reject the large DC
shift present in the header. Once the DC shift has passed,
the AC coupling pole is internally reduced at a controlled
rate in order for no DC offset to be stored on the AC
coupling capacitors. The amount of time to allow the AC
coupling pole to be brought down is controlled by the
ACCPLTM bits. Once the pole has been reduced an AGC
fast attack mode is entered. The details of this mode are
explained in the AGC section. The amount of time to
remain in this state is controlled by the AGCFSTTM bits.
After the AGCFSTTM has timed out, the DC restore block
and timing recovery PLL are allowed to begin reading user
data. The RSTTM allows the sequencer to deassert the
ID12/ID34 lines. This is useful when the exact length of
headers are known so that the analog ID detector does not
need to accurately detect the end of the RAM headers.
There are several other control bits for the sequencer
which will now be described. For standard DVD RAM
media there are two DC shifted headers immediately fol-
lowing one another. For non-standard RAM media, where
only a single header is present, the SNGLHDR bit should
be programmed high. This allows the sequencer to only
time-out a single header, rather than the assumed two
headers. This feature is used when the HDRATMG,
(Header Auto-timing Bit), is asserted. When the auto timing
feature is enabled, only the leading edge of the header, i.e.
ID12, needs to be accurately detected by the ID detector.
Since the user knows the exact length of the headers on
the media, the RSTTM can be programmed to accurately
put the RF path in LOWZ mode when the header is com-
pleted. This is useful since the analog detector may be
susceptible to noise and ma,y therefore, not time-out at the
exact time. When in double header mode, SNGLHDR=0,
the sequencer will automatically generate the second RF
sequence when headers 3/4 are present independent of
ID34 signal.
The RAMREAD bit allows an internal signal which controls
the source for the timing recovery to be controlled by the
sequencer to properly set the reference for the timing
recovery when reading RAM media. This bit needs to be
programmed low when a RAM data read operation is first
started and then may be programmed high while reading
RAM data. When RAMREAD is high, the timing recovery
PLL will automatically go into a phase/frequency mode
when entering a header. This allows very fast frequency
acquisition onto the preamble present at the beginning of
RAM headers. The sequencer will also automatically put
the timing recovery into a coast mode between headers
and also in the gap fields present at the beginning and end
of the headers, before and after user data.
The sequencer can also produce the required timing
sequence off the leading edge of RG when RGSTRT, RG
start, bit is low. When this bit is high, no sequence will be
generated from the leading edge of RG and it is assumed
that the controller is providing the proper AGC timing
signals.
The DATREFST, (Data Reference Start Bit), allows the
internal signal, which controls the reference, either the
synthesizer or data, for the timing recovery to come directly
from the IDFIELD or RG pins when DATREFST is high.
This will effectively bypass all sequencer signals which
control the timing recovery block. A DISSQCR bit is also
provided to disable the entire sequencer when it is
programmed high.
When not in RAM mode, internal logic will also prevent the
sequencer from starting on any other signal other than RG.
AT78C1503
15
Figure 13. RF Path Timing Sequence
Wobble Signal Detect
The wobble signal passes through the same signal path as
the ID header signal up through the AC coupling. The
wobble signal is extracted with a bandpass filter, 2 zeros
and three poles. While operating with DVD RAM media the
filter passband is centered at (IDWBLFLTR+1)*157 KHz
with 20 dB of passband gain. The center of the bandpass
filter for DVD+RW media the passband is centered at
(IDWBLFLTR+1)*817.5 KHz. The output of the fifth order
bandpass filter is the input to the Wobble PLL block. A
block diagram is shown in Figure 1. The output of the
bandpass filter is the input to the Wobble Clock generation
block and to a threshold comparator which is compared to
the WBLLVL<1:0> setting. The output of the comparator is
clocked with the 2X wobble clock, which is derived from the
wobble signal squared. If the output of the bandpass filter is
larger than the programmed level the output of the
WOBBLE data flip-flop will be high. The input of the flip-flop
and output are input to an XOR gate to determine the
phase transitions in the ADIP signal.
The comparator trip point is determined by a combination
of the WBL EN bit and WBL<1:0>. If WBL EN is low, then
the comparators reference level is set to zero and the
WOBBLE signal appears ideally with a 50/50 duty cycle,
during the monotone wobble signal, and will detect the. If
WBL EN is high, then the comparators trip point is shifted
from zero to the value shown in Table 33.
The BLKWBL bit allows the wobble pin to be held low while
reading through a DVD RAM header. The HDRTSTEN,
header test enable bit, allows the wobble path logic to be
tested. When it is programmed high, the AGCHLD pin will
appear at the WOBBLE pin output. The WOBBLE signal
will be disabled if not in a DVD RAM mode, see Table 27.
Figure 14. Wobble PLL Block Diagram
Start Signal
LOWZ/HOLD
1-15 Clocks (AGCLZTM<3:0>)
AC Coupling Recovery
1-63 Clocks (ACCPLTM<5:0>)
RF Sequencer Reset
1-255 Clocks (RSTTM<7:0>)
1-63 Clocks (AGCFSTTM<5:0>)
AGC Fast
A+B-(C+D)
BP1 ( )2PD
BP2 VCO
Delay
Hysteresis
Comparator
Loop
filter T- F F
D-FF
Wobble
Clock
Wobble
Data
XOR
AT78C1503
16
Offset Cancellation Block
The offset cancellation block allows the part to
automatically cycle through many points in the part and
remove electronic offsets which may be present. These
electronic offsets in the signal path would cause larger
signal distortion to be present, than if they are removed.
Several charge pump currents are also calibrated, which
again, allows for very small DC offsets to be present on the
integrating capacitors. The center frequencies of the two
PLLs are also trimmed to optimized the given range that
their filters operate over. Finally, on-chip resistors are
calibrated to remove any process variations. All calibration
points can be seen in Table 2 which describes each
individual calibration point. All resulting offset calibration
values may be read out by the user similar to any other
serial register read operation. Likewise, the user may
program any of these offset values manually in the serial
register just like any other memory location.
Any one or all of the calibration points can be cancelled per
calibrator pass. The CALSTRT<5:0> bits determine which
calibration point the calibrator will begin at and likewise the
CALEND<5:0> bits determine where the calibrator will end.
Therefore, by programming the CALSTRT and CALEND
bits to different values any or all of the points may be
calibrated.
The calibration sequence starts when the CALBGN,
calibration begin, bit is programmed from low to high. It is
necessary to reprogram CALBGN low, in order to prepare
for a second calibration cycle. Once the transition of
CALBGN is detected the calibrator begins to cycle through
the chosen points. As the calibrator is running, serial
register access to memory locations 97 through 115 must
be avoided as the calibrator takes control of theses serial
register locations while running. The ADCEN bit must
always be programmed low when calibrating as this puts
the calibrator into ADC mode.
The calibrator normally runs off from a FREF divided by 4
clock and requires 50 clock cycles per calibration point.
The user can determine the amount of system time
required for a full calibration given the FREF frequency and
the number of calibration points. In every calibration offset
register space the LSB is named CALCLK. When this bit is
programmed low, the calibrator system clock is as
described above. If this bit is programmed low for a particu-
lar calibration point, then that calibration point will have a
reduced system clock rate given by Table 32. This allows
different system clocks to be used for different calibration
points as several of the points need to be ran slower, such
as the PLL center frequency.
All calibration points have default values chosen for related
gains and DACS. If a value other than the default is
required, the CALUSESR, CALSRVUSESR and
CALPLLUSESR bits can be programmed high to use
values from the serial register. The CALUSESR forces all
AGC related calibration points to use the PGC setting from
the serial register. The CALUSESR also forces the LPF
cutoff frequency to be determined from the serial register.
The CALSRVUSESR bit forces the slow servo related
calibration points to have their gains originate from the
serial register and finally the CALPLLUSESR forces the
PLLs to have their settings come from the serial register.
Normally all three of these bits should be programmed low
and the default values used.
For test purposes, all internal calibration signals may be
brought out of the CMOS test points, DATA<7:0>.
ADC Block
The ADC analog to digital converter block allows the part to
digitized many of its own analog signals. The ADC uses the
calibrators 7-bit SAR (Successive Approximation
Register), algorithm to digitize the output points shown in
Table 34. The ADC can be used both for testing the part
and possible self diagnostics when in a larger system.
In order to put the calibrator into the ADC mode the
ADCEN bit needs to be programmed high. To begin an
ADC cycle, the ADCSTRT pin is then toggled from low to
high. This pin may be returned low after 1 µS even though
the ADC cycle may not be complete. The ADC will then dig-
itize the selected point and write the final value back into
memory location 119. The final ADC value may also be
brought directly out on the DATA<6:0> lines by program-
ming the ADCOUTEN bit high. DATA<7> will toggle after
the final value is stable on the DATA<6:0> lines and may
therefore be used as a clock line to latch in the ADC value.
The ADC will only convert one point per ADCSTRT pulse
unlike the calibrator which cycles through many points.
Four different input ranges are selectable at the input of the
ADC. This allows signals of different amplitudes to use the
full range of the ADC. The ADCGAIN<1:0> bits control this
range setting according to Table 35. The translation of final
digital value of the ADC thus depends on the range setting.
The digital value is a sign magnitude representation thus
the MSB represents the sign while the 6 LSB have a full
scale reading dependent upon ADCGAIN.
The ADCINTSHRT bit allows the ADC to store any elec-
tronic offset all the way from the signal source. It forces the
same short circuitry to be used as when the part is being
calibrated when programmed high. With ADCINTSHRT is
programmed low, the ADC removes any offset which is
present from the pin to the input of the ADC comparator
and thus gives the actual value present on the pin. It should
also be noted that with ADCSEL set to 7, the TRSIN1P
AT78C1503
17
input is selected which allows for any external signal to be
converted.
In conjunction with the ADC function which digitizes various
outputs, the part also has the capability to force DC offset
voltages at all the signal inputs. This is very useful for DC
tests in which many of the internal gains gain can be
verified with no external hardware. A DC value can be
forced at the input and the resulting output at any of the test
points can be digitized by the ADC and read out the serial
register interface. The FORCEVIN, force voltage input, bit
enables current sources and switches the input AC
coupling blocks to generate zero TC voltages. While this bit
is programmed high, no attempt should be made to use the
part with actual data. The FORCESEL<2:0> bits determine
which input will have the offset voltage on it, see Table 36.
The amount of offset is determined by FORCEVAL<2:0>
bits, see Table 37. Since the RF path and the slow servo
path internally use different input stages, their respective
offset voltages are different as shown with the two separate
columns in Table 37.
Figure 15. Serial Port Timing Diagram
SENA
SCLK
RNW A0 A1 A2 A3 A4 A5 A6 D0 D1 D2 D3 D4 D5 D6 D7
SDATA
TEC
TPW
AT78C1503
18
*Disclaimer to users of this table. The location of some (if not all) of the bits in this serial register will probably change. Write
your code in order to minimize the impact of such changes, e.g., define these bit locations in only one place in your
program.
Table 1. Serial Register Bit Map
Reg Bit(s) Name
Description
** All Bits Active-high unless otherwise noted.
** All DACs Linear unless otherwise noted.
0
7 AGCCALTPON Enable cal test point selection, disable TP1<5:0> from controlling the outputs
on TP1 respectively
6 TP1EN Test Point 1 Enable
5:0 TP1ser<5:0> Test Point 1 (AGC) Selection; see Table 6
1
7Unused
6 TP2EN Test Point 2 Enable
5:0 TP2ser<5:0> Test Point 2 (LPF) Selection; see Table 8
2
7 DETSHRTR Short a 60k resistor across the detector charge pump output
6 TSDDEN Test Point TSDD1 & TSDD2 Enable
5:0 TSDD1ser<5:0> Test Point TSDD1 (DCR, DPD, TR) Selection; see Table 18
3
7Unused
6 TPSHRTser Short all test points
5:0 TSDD2ser<5:0> Test Point TSDD2 (DPD, TR, SYNTH) Selection; see Table 23
47 ACCPL_SLOW
6:0 ANSEser<6:0> Analog Single Ended Selection; see Table 24
5
7 SLEEPser Sleep bit, get ORd with the PORB pin to power down entire part
6:1 Unused<5:0>
0 PGCEN Programmable Gain Mode Enable for the AGC
6
7:4 AGCQP<3:0> AGC loop charge pump currents; see Table 4
3 FLTRBYP Bypass low-pass filter inside the AGC loop
2 AGCHBW Enable AGC High Band Width mode during fast recovery
1 SQLCHser Squelch
0Unused
7
7:4 PGC<3:0> Programmable gain magnitude for front-end VGAs; see Table 5
3:2 VGAMODE<1:0> Input range select for front-end VGAs; see Table 3
1 RF_ACBYP Bypass ac-coupling capacitors
0 8P5X_ACBYP Bypass ac-coupling capacitors for the high-gain amplifier
AT78C1503
19
8
7:5 BST1<3:0> RF LPF zero 1 location see Table 30
4:2 BST2<3:0> RF LPF zero 2 location, see Table 30
1 ASYMBST
RF LPF asymmetric boost; if asserted, the zeros in the LPF are adjusted
independently thus allowing adjustable group delay, if not asserted BST1<3:0>
controls the symmetric zeros
0FLTRGAIN RF LPF Gain. Allows the signal through the LPF to be halved;
this is necessary for boost settings over 7 dB
9
7:5 FLTRRANGE<2:0> RF LPF Range. Sets the course LPF cutoff; see Table 29
4:0 FCDAC<4:0> RF LPF Cutoff. Sets the fine LPF cutoff within the range specified by
FLTRRANGE<2:0>
10
7:6 DETKCPI<1:0> Detector charge pump current; see Table 10
5:4 DETKCP<1:0> Detector charge pump current multiplier; see Table 10
3 DETRST Reset the detector loop filter
2 DETQPUP Detector charge pump, pump-up in test mode
1 DETQPDN Detector charge pump, pump-down in test mode
0Unused
11
7:5 DETQPOFRNG<2:0> Detector charge pump offset DAC gain
4:2 DETTHRRNG<2:0> Slicer threshold range in open-loop mode
1:0 DETMODE<1:0> Detector mode selection; see Table 9
12 7Unused
6:0 DETTHRSH<6:0> Slicer threshold in open-loop mode
13
7Unused
6 CALPLLUSEser Calibrator use serial register location for PLLs
5:0 CALSTRT<5:0> Calibrator start point, allows the calibrator to begin at any
point according to Table 2
14
7 CALUSESRser Calibrator use serial register values
6 CALSRVUSESRser Calibrator use serial register values for servo
5:0 CALEND<5:0> Calibrator end point; allows the calibrator to end at any
point according toTable 2
15
7 CALBGN Calibration Begin; toggling this bit from low to high starts a calibration cycle
6:5 CALCLK<1:0>
Calibration Clock Setting; determines the calibrator system clock if CALCLK bit
is high for the particular calibration address; if CALCLK bit is low then calibrator
system clock equals FREF divided by four; seeTable 32
4:0 RFDTH<4:0> RD Dropout Threshold; set the minimum signal level that the RF signal need to
drop below to qualify as a dropout
Table 1. Serial Register Bit Map
Reg Bit(s) Name
Description
** All Bits Active-high unless otherwise noted.
** All DACs Linear unless otherwise noted.
AT78C1503
20
16
7 RDSZEN Enable Read Size Buffer
6 RDSZSEL Select Read Size Buffer Output (1 = AGC cap voltage, 0 = Detector loop filter
voltage)
5 RFDROPEN RF Dropout Enable. Enables the RF Dropout to operate
4:0 RFDROPCNT<4:0> RF Dropout Count. Duration that the dropout detector looks for lack of signal
before asserting the RFDROP relative to the synthesizer divided by 2 cycles
17 7:0 ACQ_CNT<7:0> Acquisition Count. Following the rising edge of RG, acquisition mode lasts
(Acquisition Count +1)×4×TR VCO cycles
18
7:3 DRDAC<4:0 Sets VCO center frequency. Also sets PLL filter components and charge pump
currents for automatically selected mode. See Table 17
2:1 TrSyMf<1:0> Manual TR and Synthesizer PLL Filter and QP Current Selector. See Table 12
0 NIBBLE Parallel data out 4 bits wide when high, 8 bits wide otherwise
19 7:4 ACQ_FLT<7:4> Manual TR PLL Filter R Acquisition mode setting. See Table 12, Table 13
3:0 ACQ_FLT<3:0> Man TR PLL Filter Cs Acquisition mode setting. See Table 12, Table 16
20 7:4 TRK_FLT<7:4> Manual TR PLL Filter R Tracking mode setting. See Table 12, Table 13
3:0 TRK_FLT<4:0> Manual TR PLL Filter Cs Tracking mode setting. See Table 12, Table 16
21 7:4 TRK_CPI<3:0> Manual TR Tracking Charge Pump Current, see Table 11, Table 12
3:0 ACQ_CPI<3:0> Manual TR Acquisition Charge Pump Current, see Table 11, Table 12
22
7 PD_FE TR Phase detector active on data falling edge only
6 PD_RE TR Phase detector active on data rising edge only
5 NRZ Recovered data in NRZ format (NRZ high)
Recovered data 1 on transition, 0 otherwise (DVD format) (NRZ low)
4 R_DAT Reset Data flip-flops in detector
3 TRS_PD Set PD flip-flop in TR phase-frequency detector
2 TRS_PU Set PU flip-flop in TR phase-frequency detector
1 TRR_PUPD Reset PU and PD flip-flops in TR phase-frequency detector
0 TRR_DIV4 Reset Divide by 4 flip-flops in TR phase-frequency detector
23
7 TR_HDT Gives TR high damping ratio (1.6) during tracking mode
6 WatchCal TR and Synthesizer calibration error signal appears on test point
5 EXTRV External Clock replaces TR VCO
4 EXDATA External Data muxed into TR detector
3:2 RST_MNP<1:0> Reset Synthesizers M, N and P counters
1 SLEEP_SY Independently sleeps Synthesizer
0 SLEEP_TR Independently sleeps TR
24 7:4 SYN_FLT<7:4> Manual Synthesizer PLL Filter R setting. See Table 12, Table 13
3:0 SYN_FLT<3:0> Manual Synthesizer PLL Filter Cs setting. See Table 12, Table 16
Table 1. Serial Register Bit Map
Reg Bit(s) Name
Description
** All Bits Active-high unless otherwise noted.
** All DACs Linear unless otherwise noted.
AT78C1503
21
25
7 ShortCsT Short TRs PLL Filter cap, Cs
6 ShortCsS Short Synthesizers PLL Filter cap, Cs
5Unused
4 SYHIDMP Synthesizer PLL Filter Hi Damping; increase default R by 50%
3:0 SYN_CPI<3:0> Manual Synthesizer Charge Pump Current, see Table 11, Table 12
26
7Unused
6 FREFBY2 Divide the frequency reference input on the FREF pin by 2
5 EXSYV External Synthesizer VCO substituted for regular Synthesizer VCO
4 EXSYCK External Reference Clock muxd into Synthesizer detector
3 SYS_PD Set PD flip-flop in Synthesizer phase-frequency detector
2 SYS_PU Set PU flip-flop in Synthesizer phase-frequency detector
1 SYR_PUPD Reset PU and PD ffs in Synthesizer phase-frequency detector
0 SYR_DIV4 Reset Divide by 4 ffs in Synthesizer phase-frequency detector
27 7 P<2> Synthesizer P count MSB
6:0 M<6:0> Synthesizer M count
28 7:6 P<1:0> Synthesizer P count two LSBs
5:0 N<5:0> Synthesizer N count
29 7:3 Unused
2:0 SELEXTRM<2:0> Trim bandgap voltage to 1.2 volts
30 7:4
3:0 BQD1Q<3:0> Adjusts Biquad1s Q in the RF LPF; see table XXX
31 7:4 BQD3Q<3:0> Adjusts Biquad2s Q in the RF LPF; see table XXX
3:0 BQD2Q<3:0> Adjusts Biquad3s Q in the RF LPF; see table XXX
32
7 BLKWBL Holds Wobble output low when in RAM header
6 IDINITser Allows an internally detected header to start sequencer
5 RGSTRT RG Start. Allows the rising edge of RG to start sequencer
4:1 AGCLZTM<3:0> Synthesizer nibble count for sequencer LOWZ time
0 SNGLHDR Puts sequencer in single header mode, if HDRATMG is
asserted, only one header sequence is timed out
33
7:2 ACCPLTM<5:0> Synthesizer nibble count for sequencer fast recovery time
1DATREFST Timing recovery data reference start, when high, the oring
of RG and IDSEL go straight to timing recovery PLL
0 HDRATMG Header auto-timing, when high the sequencer controls the
AGC and TR PLL control lines
Table 1. Serial Register Bit Map
Reg Bit(s) Name
Description
** All Bits Active-high unless otherwise noted.
** All DACs Linear unless otherwise noted.
AT78C1503
22
34
7:2 AGCFSTTM<5:0> Synthesizer nibble count for sequencer TR reference time
1 SIDTSTINPUT
0 DISSQCR Disable Sequencer
35 7:0 RSTTM<7:0>
Synthesizer nibble count for sequencer reset time; useful to automatically
turning off headers, this has NO effect when reading
user data
36
7:4 IDWBLVGA<3:0> ID/Wobble VGA Gain, Set ID/Wobble gain according to table XX
3 IDWBLACBYP ID/Wobble AC coupling bypass, this is used for testing in order
to get DC signal to the ID and Wobble filters
2 IDHLD ID Hold, when high ID12 and ID34 outputs can only change when
IDSEL is asserted
1 HDRTSTEN Header Test Enable, allows testing of the ID detector state
machine
0POLPOL
Polarity of the Polarity, allows the polarity of the land/groove
transition to be programmed. When low, if first header is positive,
the polarity of the tracking error is positive, when high, the
tracking error is inverted
37
7:4 IDSLCE<3:0> ID Slice level, Determines the level that is necessary to qualify
a valid header, see table XXX
3:2 WBL<1:0>
Wobble Slice Level, Determines the level that is necessary
to qualify the wobble signal following the BPF, see table XXX,
this level is dependent on the WBLEN bit
1 WBLEN Wobble Level Enable, when low, the wobble slicer compares
around zero, when high the slicer input depends on WBL<1:0>
0 RAMREAD RAM Read, Forces the TR PLL to switch to phase/frequency mode during the
header preambles
38
7:5 IDWBLFLTR<2:0> ID/WOBLE Filter, Controls the ID filters LPF cutoff and the WOBBLE filter
bandpass center frequency
4 IDFLDSRCE ID Field Source, Determines whether the IDFIELD will follow IDSEL pin or the
internally generated ID header signal
3 ANSESI2PIN
2:0 Unused
39
7 RFGEN Generate the RF signal internally using FO1, FO2, TR1 & TR2
6:3 SRVMOD<3:0>
2 SENDEDDVDser
1 PRMPINVDVDser
0 PRMPINVCDser
Table 1. Serial Register Bit Map
Reg Bit(s) Name
Description
** All Bits Active-high unless otherwise noted.
** All DACs Linear unless otherwise noted.
AT78C1503
23
40
7 CMOSTP03EN CMOS Test Points 0-3 Enable; when asserted, NRZ<3:0> function as CMOS
test outputs according to Table 25
6 CMOSTP47EN CMOS Test Points 4-7 Enable; when asserted, NRZ<4:7> function as CMOS
test outputs according to Table 25
5:1 CMOSTP<4:0> CMOS Test Point Selection; choose which digital signals to output on
NRZ<7:0> pins dependent on CMOSTP03EN and CMOSTP47EN
0 ANSETPON
41 7:4 TRMVREFIN<3:0>
3:0 TRMVREFOUTn<3:0>
42
7SINTREFin
6SINTREFOUT
5 ENANSEIN
4 ENTSTSUM
3:0 TSTSUM<3:0>
43
7TSTMOD
6TSTLD
5TSTUD
4TSTRSTser
3 AVGLPFSEL
2 DIS_LBW_SS
1BWUPser
0 BWDWNser
44 7:4 STRTDIVhi<3:0>
3:0 STOPDIVlo<3:0>
45 7:4 ACMCNTmir<3:0>
3:0 ACMCNTtzc<3:0>
46 7:4 AVGHYSTmir<3:0>
3:0 AVGHYSTtzc<3:0>
47
7:2 AGCTZCser<5:0>
1 SAGCTZCser
0LOWGAVGtzc
48
7:2 AGCMIRser<5:0>
1SAGCMIRser
0LOWGAVGmir
Table 1. Serial Register Bit Map
Reg Bit(s) Name
Description
** All Bits Active-high unless otherwise noted.
** All DACs Linear unless otherwise noted.
AT78C1503
24
49 7:4 GSEL<3:0>
3:0 BWSEL<3:0>
50 7:4 GSEL_CDTR<3:0>
3:0 BWSEL_CDTR<3:0>
51 7:3 FO1KGADJN<4:0>
2:0 RTRMFE<2:0>
52
7:3 FO1KOFADJ<4:0>
2FOI2VHIG
1 SGNFEOFF
0Unused
53 7:3 FO2KGADJN<4:0>
2:0 FEOFF<2:0>
54 7:3 FO3KOFADJ<4:0>
2:0 SHINPSEL<2:0>
55 7:3 TR1KGADJN<4:0>
2:0 RTRMTE<2:0>
56
7:3 TR1KOFADJ<4:0>
2TRI2VHIG
1 SGNTEOFF
0 SELTE
57 7:3 TR2KGADJN<4:0>
2:0 TEOFF<2:0>
58 7:3 TR2KOFADJ<4:0>
2:0 Unused
59 7:3 TR1CDKGADJN<4:0>
2:0 Unused
60 7:3 TR1CDKOFADJ<4:0>
2:0 Unused
61
7:3 TR2CDKGADJN<4:0>
2 SELRAMSUM_ZC
1:0 Unused
62
7:3 TR2CDKOFADJ<4:0>
2 NRM_HIRANGE
1:0 WINNRM<1:0>
Table 1. Serial Register Bit Map
Reg Bit(s) Name
Description
** All Bits Active-high unless otherwise noted.
** All DACs Linear unless otherwise noted.
AT78C1503
25
63 7:2 TRMNRM<5:0>
1:0 KTHNRM<1:0>
64
7 SELHBSFO12
6 SELHBSTR12
5 NRLOWG
4:3 NRCTMOD<1:0>
2SRVWRENB
1 SRVHOLDDIS
0 SRVLDDSB
65
7:3 SRVDIVCLK<4:0>
2 SRVSELCLK
1 ENNRMHOLD
0MRFLDV84
66
7:3 GSEL_LENSP<4:0>
2 ENLENSP
1 POLENSP
0EN_IDFHOLD
67 7:4 FEGI2VHIG<3:0>
3:0 FEGI2VHOG<3:0>
68 7:4 TEGI2VHIG<3:0>
3:0 TEGI2VHOG<3:0>
69 7:4 FEGOUT<3:0>
3:0 TEGOUT<3:0>
70 7:4 SSGI2V<3:0>
3:0 SSGOUT<3:0>
71 7:4 GHBSUMN<3:0>
3:0 KTHMIR<3:0>
72 7:4 KTHFOKRD<3:0>
3:0 KTHFOKWR<3:0>
73 7:4 KTHTOKRD<3:0>
3:0 KTHTOKWR<3:0>
74
7 NRWRDTR
6:1 NRDATAR<6:0>
0 DFLT71<0>
Table 1. Serial Register Bit Map
Reg Bit(s) Name
Description
** All Bits Active-high unless otherwise noted.
** All DACs Linear unless otherwise noted.
AT78C1503
26
75
7 NRWRDTR
6:1 NRDATAR<6:0>
0 DFLT71<0>
76
7 DPDVGABYP Bypass front-end VGAs inside the DPD
6:5 DPDVGAMODE<1:0> Mode selection for front-end VGAs inside the DPD
4:1 DPDKPGC<3:0> Gain selection for front-end VGAs inside the DPD
0Unused
77
7 DPDLPFBYP Bypass 1st order low-pass filter inside the equalizer
6:4 DPDFC<2:0> DVD setting (1 through 5)
3 DPDQPSQLCH Squelch DPD charge pump output
2 DPDENRMRES Enable loop filter resistor removal during DPD hold
1 DPDRMRES Remove loop filter resistor
0Unused
78
7:5 DPDQPRNG<2:0> DPD charge pump offset DAC gain
4:3 DPDCPI<1:0> DPD charge pump current; see Table 10
2:1 DPDKCP<1:0> DPD charge pump current multiplier; see Table 10
0 DPDPDRST Reset phase detector inside the DPD
79
7 DPDACLEAD Test signal; diagonal (A+C) leads diagonal (B+D)
6 DPDDISACT Test signal; disable (A+C) input to the phase detector
5 DPDDISBDT Test signal; disable (B+D) input to the phase detector
4 DPDDISHLD Disable missing pulse detector
3:0 DPDKSEVGA<3:0> Single-ended VGA gain selection; see Table 21
80
7:4 DPDFCDAC<3:0> ±20% adjust on equalizer pole/zero frequency; see Table 22;
3 DPDDIVSEL Low-pass filter bandwidth divide-by factor
2:0 Unused
81 7:4 DPDDIVhi<3:0> Bandwidth divider (high value)
3:0 DPDDIVlo<3:0> Bandwidth divider (low value)
82
7 ADCEN ADC Enable. Switches the calibrator from calibration mode to ADC mode when
programmed high
6:5 ADCGAIN<1:0> ADC Gain. Determines the maximum ADC input, see Table 35
4 ADCOUTEN ADC Output Enable. Allows the ADC final value to be strobes out on NRZ<7:0>
pins
3 ADCINTSHRT ADC Internal Short. When this pin is high, the internal short circuitry normally
used during offset calibration is also used by the ADC.
2 ADCSELser<2:0> ADC Input Selection. Determines which pin will be converted by the ADC, see
Table 34
Table 1. Serial Register Bit Map
Reg Bit(s) Name
Description
** All Bits Active-high unless otherwise noted.
** All DACs Linear unless otherwise noted.
AT78C1503
27
83 7:0 Unused
Calibration Serial Register Locations
96 7:0 Unused
97 7:3 VGA0OFF<4:0>
2:1 Unused
0CALCLK
98 7:3 VGA1OFF<4:0>
2:1 Unused
0CALCLK
99 7:3 VGA2OFF<4:0>
2:1 Unused
0CALCLK
100 7:3 VGA3OFF<4:0>
2:1 Unused
0CALCLK
101 7:3 VGA4OFF<4:0>
2:1 Unused
0CALCLK
102 7:2 A10OFF<5:0>
1Unused
0CALCLK
103 7:6 RESOFF<1:0>
5:1 Unused
0CALCLK
104 7:1 FLTINOFF<6:0>
0CALCLK
105 7:1 BQD2OFF<6:0>
0CALCLK
106 7:1 DCROFF<6:0>
0CALCLK
107 7:3 DPDVGA1OFF<4:0>
2:1 Unused
Table 1. Serial Register Bit Map
Reg Bit(s) Name
Description
** All Bits Active-high unless otherwise noted.
** All DACs Linear unless otherwise noted.
AT78C1503
28
0CALCLK
108 7:3 DPDVGA2OFF<4:0>
2:1 Unused
0CALCLK
109 7:1 DPDQPOFF<6:0>
0CALCLK
110 7:1 SYQPOFF<6:0>
0CALCLK
111 7:1 TRQPOFF<6:0>
0CALCLK
112 7:3 SYICOTRM<4:0>
2:1 Unused
1CALCLK
113 7:3 TRICOTRM<4:0>
2:1 Unused
1CALCLK
114 7:1 TRMFE<6:0>
0CALCLK
115 7:1 TRMTE<6:0>
0CALCLK
116 7:0 Unused
117 7:0 Unused
118 7:0 Unused
119 7:0 Unused
Table 2. Serial Register Calibration Address Space
Serial Register Address Cal Decode <5:0> Number of Bit(s)
Description
(** DACs Must Be Sign Magnitude **)
96 0 Test NA
97 1 4:0 VGA0 Internal Node
98 2 4:0 VGA1
99 3 4:0 VGA2
100 4 4:0 VGA3
101 5 4:0 VGA4
102 6 5:0 Amp10 Output
Table 1. Serial Register Bit Map
Reg Bit(s) Name
Description
** All Bits Active-high unless otherwise noted.
** All DACs Linear unless otherwise noted.
AT78C1503
29
103 7 1:0 Resistor DAC
104 8 5:0 Filter Input
105 9 5:0 Filter Midpoint (BQD2 Output)
106 10 5:0 DCR Charge Pump offset
107 11 5:0 DPD VGA (A+C)
108 12 5:0 DPD VGA (B+D)
109 13 5:0 DPD Charge Pump offset
110 14 6:0 Synthesizer Charge Pump offset
111 15 6:0 TR Charge Pump offset
112 16 4:0 SynthTR VCO center frequency
113 17 4:0 TR VCO center frequency
114 18
115 19
116 20
117 21
118 22
119 23
Table 2. Serial Register Calibration Address Space
Serial Register Address Cal Decode <5:0> Number of Bit(s)
Description
(** DACs Must Be Sign Magnitude **)
AT78C1503
30
Table 3. RF Input Range Selection
VGAMODE <1:0> Operating Mode
00 110-1100 mV
01 60-600 mV
10 30-300 mV
11 30-300 mV
Table 4. Charge Pump Current Selection (charging
current)
AGCQP <3:0> Charging current (µA)
0000 11.25
0001 13.125
0010 15.00
0011 16.875
0100 18.75
0101 20.625
0110 22.50
0111 24.375
1000 26.25
1001 28.125
1010 30.00
1011 31.875
1100 33.75
1101 35.625
1110 37.50
1111 39.375
Table 5. PGC Mode Gain Settings
PGC <3:0>
VGA Voltage Gain
Low Moderate High
0000 0.06 0.121 0.474
0001 0.067 0.134 0.528
0010 0.075 0.150 0.592
0011 0.084 0.169 0.667
0100 0.096 0.191 0.759
0101 0.109 0.219 0.870
0110 0.126 0.253 1.008
0111 0.148 0.296 1.181
1000 0.176 0.352 1.404
1001 0.212 0.424 1.694
1010 0.261 0.523 2.085
1011 0.330 0.660 2.627
1100 0.429 0.858 3.408
1101 0.581 1.162 4.590
1110 0.830 1.660 6.505
1111 1.280 2.558 9.917
Table 6. TP 1 Selection Address Non Calibration Mode
and (AGCCALTPON = 0)
TP1 <5:0> Test signal
000000 VGA0 Input
000001 VGA0 Output
000010 VGA1 Input
000011 VGA1 Output
000100 VGA2 Input
000101 VGA2 Output
000110 VGA3 Input
000111 VGA3 Output
001000 VGA4 Input
001001 VGA4 Output
001010 DTR1 (Differential Tracking 1)
001011 DTR2 (Differential Tracking 2)
001100 AC couple Input
001101 AMP10 Input
001110 AMP10 Output
001111 NA
Table 7. Test Point 1 Calibration Selection Address
(AGCCALTPON = 1)
TP1 <5:0> Gain
000000 NA
000001 VGA0 internal node
000010 VGA1 internal node
000011 VGA2 internal node
Table 5. PGC Mode Gain Settings
PGC <3:0>
VGA Voltage Gain
Low Moderate High
AT78C1503
31
000100 VGA3 Internal Node
000101 VGA4 Internal Node
000110 AMP10 Output
Table 8. Test Point 2 Mapping
TP2 <5:0> Test Point 2 Signal
32 Filter Input (from VGA)
33 Filter Input (re-referenced)
34 BQD1 Internal
35 BQD1 Output (Unbuffered)
36 BQD2 Input (BQD1 Output buffered)
37 BQD2 Internal
38 BQD2 Output, LP Input
39 LP Output, BQD3 Input
40 BQD3 Internal
41 BQD3 Output (Unbuffered)
42 BQD3 Output (Buffered)
Table 9. Detector Modes of Operation
DETMODE <1:0> Operating Mode
00 DC Restore Mode
01 Write Power Test Mode
10 Dont use
11 Comparator Mode
Table 10. Detector Charge Pump Currents
DETCPI<1:0>, DETKCP<1:0> Current (µA)
0000 4.86
0001 5.69
0010 6.80
0011 8.46
0100 9.20
0101 10.76
0110 12.88
0111 16.01
Table 7. Test Point 1 Calibration Selection Address
(AGCCALTPON = 1)
TP1 <5:0> Gain 1000 19.32
1001 22.60
1010 27.05
1011 33.62
1100 38.40
1101 44.93
1110 53.76
1111 66.82
Table 11. Manual Charge Pump currents vs. QPI DAC
Setting
QPI DAC Current (µA)
0000 4.86
0001 5.69
0010 6.80
0011 8.46
0100 9.20
0101 10.76
0110 12.88
0111 16.01
1000 19.32
1001 22.60
1010 27.05
1011 33.62
1100 38.40
1101 44.93
1110 53.76
1111 66.82
Table 12. Manual PLL Filter and QP Current Selection
TrSyMf Selection
00 All Automatic
01 Only Synthesizer R & QPI Manual
10 Only Synthesizer R, C & QPI Manual
11 TR & Synthesizer All Manual
Table 10. Detector Charge Pump Currents
DETCPI<1:0>, DETKCP<1:0> Current (µA)
AT78C1503
32
Table 13. Manual PLL Filter R Settings
TrSyMf (Binary) R (K)
0000 0.5
xxx1 Add 17.8
xx1x Add 26.8
x1xx Add 18.3
1xxx Add 22.3
Table 14. TSSD Test Point 1 Mapping
TSDD1 <3:0> TR, Synthesizer, DC Restore, DPD Test
Point 1
0 DC Restore Slicer Input
1 DC Restore Capacitor Voltage
2 DPD VGA Input (A+C)
3 DPD VGA Output (A+C)
4 DPD LP Filter Output (A+C)
5 DPD Equalizer Output (A+C)
6 DPD Comparator Output (A+C)
7
8 TR Pump Up
9 Synthesizer Pump Up
10 TR Raw Data (Input data from DC Restore
block)
11 Recovered Clock (recovered from raw data
stream)
12 (FLTB) TR Loop Filter, buffered
13 (FCSB) TR Loop Filter Large Cap, buffered
14 (FLTU) TR Loop Filter, unbuffered
15 (FCSU) TR Loop Filter Large Cap,
unbuffered
Table 15. TSDD Test Point 2 Mapping
TSDD2 <3:0> TR, Synthesizer, DC Restore, DPD Test
Point 2
0 DPD VGA Input (B+D)
1 DPD VGA Output (B+D)
2 DPD LP Filter Output (B+D)
3 DPD Equalizer Output (B+D)
4 DPD Comparator Output (B+D)
5 Synthesizer N, differential signal
6 Synthesizer M, differential signal
7 Synthesizer VCO/4, differential signal
8 TR Pump Down
9 Synthesizer Pump Down
10 TR Recovered Data (serial stream)
11 Synthesizer VCO
12 (FLTB) Synthesizer Loop Filter, buffered
13 (FCSB) Synthesizer Loop Filter Large Cap,
buffered
14 (FLTU) Synthesizer Loop Filter, unbuffered
15 (FCSB) Synthesizer Loop Filter Large Cap,
unbuffered
Table 16. Manual PLL Filter Cs Settings
(Note: Cp = Cs/20)
Cs DAC
(Binary)
Cs DAC
(Decimal)
Cs
(pF)
0000 0 0
0001 1 0
0010 2 54.5
0011 3 44.5
0100 4 36.4
0101 5 29.8
0110 6 24.5
0111 7 20.0
1000 8 16.5
1001 9 13.5
1010 10 11.0
1011 11 9.0
1100 12 9.0
1101 13 9.0
1110 14 9.0
1111 15 9.0
Table 15. TSDD Test Point 2 Mapping
TSDD2 <3:0> TR, Synthesizer, DC Restore, DPD Test
Point 2
AT78C1503
33
Table 17. TR and Synthesizer Automatic Loop Filter and Charge Pump Settings
Data Rate DAC VCO Fc (MHz) R (K)Charge Pump (µA) Cs (pF) fn(KHz) z
3 or less Off 42.8 20 0 NA NA
4 24.7 42.8 20 54.5 144 1.05
5 27.3 42.8 20 54.5 151 1.11
6 30.2 42.8 20 44.5 176 1.05
7 33.4 42.8 20 44.5 185 1.11
8 37.0 42.8 20 36.4 215 1.05
9 40.9 42.8 20 36.4 226 1.11
10 45.2 42.8 20 29.8 263 1.05
11 50.0 42.8 20 29.8 277 1.11
12 54.9 42.8 20 24.5 320 1.05
13 60.7 42.8 20 24.5 336 1.11
14 67.0 42.8 20 20.0 391 1.05
15 74.1 42.8 20 20.0 411 1.11
16 81.8 42.8 20 16.5 475 1.05
17 90.3 42.8 20 16.5 500 1.11
18 99.8 42.8 20 13.5 581 1.05
19 110.1 42.8 20 13.5 611 1.11
20 122.8 42.8 20 11.0 711 1.05
21 134.8 42.8 20 11.0 748 1.11
22 148.8 42.8 20 9.0 869 1.05
23 163.9 42.8 20 9.0 913 1.11
Table 18. Input/Servo Modes
Input Mode12345
Description of
Operation Mode
Custom Ring
Focus Mode
DVD ROM with
Ring Focus
Standard DVD
ROM
Standard DVD
RAM A,B,C,D Mode
FO1P/N A+B+C+D A+B+C+D A+C A+C A
FO2P/N E+F+G+H E+F+G+H B+D B+D B
TR1P/N A+B+E+F A+C+E+G A+C A+B C
TR2P/N C+D+G+H B+D+F+H B+D C+D D
AT78C1503
34
Table 19. Track Zero Cross
TZC Bandwidth Comparator Hysteresis
128 k 100 mV
256k 70 mV
512k 50 mV
1M 35 mV
Table 20. DPD Equalizer Pole/Zero Frequencies
DPDFC<3:0>
Frequency (MHz)
Zero Pole1 Pole2
000 1 3.4 10
001 2 6.8 20
010 3 10.2 30
011 4 13.6 40
1xx 5 17 50
Table 21. DPD Single-ended VGA Gain
DPDKSEVGA
<2:0>
Voltage Gain (V/V)
DPDKSEVGA<3>
= 0
DPDKSEVGA<3>
= 1
000 0.25 0.5
001 0.5 1.0
010 0.75 1.5
011 1.0 2.0
100 1.25 2.5
101 1.5 3.0
110 1.75 3.5
111 2.0 4.0
Table 22. DPD Equalizer Cutoff Frequency Adjust
DPDFCDAC<3:0> Cutoff Frequency
0000 Fc
0001 +3.12%
0010 +6.24%
0011 +9.36%
0100 +12.48%
0101 +15.6%
0110 +18.72%
0111 +21.84%
1000 Fc
1001 -3.12%
1010 -6.24%
1011 -9.36%
1100 -12.48%
1101 -15.6%
1110 -18.72%
1111 -21.84%
Table 23. DPD Low-pass Filter Cutoff Frequency
(DPDDIVSEL = 1)
DPDDIVhi<3:0> Frequency (kHz)
0000 2500
0001 1300
0010 660
0011 340
0100 180
0101 100
0110 60
0111 40
1xxx 30
Table 24. Analog Single-ended Test Point
ANSE TP<5:0> Analog Single Ended Test Point
0 AVGHYSTtzcp
1 AVGHYSTtzcn
2 AVGHYSTmirp
3 AVGHYST,irn
4
5
6
7
8
9
10
11 IDWBL VGA Output
12 IDWBL Filter Input
Table 22. DPD Equalizer Cutoff Frequency Adjust
AT78C1503
35
13 ID LPF Output
14 WOBBLE BPF Output
15 ID Level P
16 ID Level N
17 Wobble Level
18 DPD SE VGA Output
19
20
21
22
23
24
25
26
27
28
29
30
31 DACs From Here Down
32 VGA1 PGC DAC
33 VGA2 AGC Qpump DAC
34 FCDAC
35 DC Restore 1
36 DC Restore 2
37 TR ICO Bias
38 SY ICO Bias
39 DPD VGA PGC DAC
40 DPD QP DAC
41 RF Drop DAC
42 TR QP Offset DAC
43 SY QP Offset DAC
44 DPD Gm HI
45 DPD Gm LO
46
47
48
Table 24. Analog Single-ended Test Point
ANSE TP<5:0> Analog Single Ended Test Point
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
Table 24. Analog Single-ended Test Point
ANSE TP<5:0> Analog Single Ended Test Point
AT78C1503
36
Table 25. Digital CMOS Test Points
CMOS
TP<4:0>
DATA7 DATA6 DATA5 DATA4 DATA3 DATA2 DATA1 DATA0
0 CALON CALUESR SHORTcal LTCH WSTROBE COMP UPDATE CLKbit
1 Calibration ADDR<5:0> INCADDR CNTDONE
2 MSBset Calibration OFFSETout<7:1>
3Synthesizer M Counter <7:0>
4Synthesizer N Counter <7:0>
5 AcqNtrk PuPdClr Synthesizer P Counter <2:0>
6TR Acquisition Mode Counter <7:0>
7DPD
8DPD
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
Table 26. TR and Synthesizer Test Input 1 Mapping
TR and Synthesizer Test Input 1
Replace TR VCO if serial register bit EXTRV is true
Replace Synthesizer VCO if serial register bit EXSYV is true
Table 27. TR and Synthesizer Test Input 2 Mapping
TR and Synthesizer Test Input 2
Replace Raw Data Input to TR if serial register bit EXDATA is
true
Replace Synthesizer VCO if serial register bit EXSYCK is true
Table 28. Servo Mode
TR and Synthesizer Test Input 2
AT78C1503
37
Table 29. Filter Range
FLTRRANGE<2:0> LPF Cutoff (MHz)
0 2.6 - 3.8
1 3.9 - 5.8
2 5.8 - 8.7
3 7.8 - 11.8
4 11.58 - 17.3
5 17.4 - 26
Table 30. LPF Boost Settings
BST<2:0>
(ASYMBST=0)
Maximum Boost above
Unboosted -3db Point (dB)
00
1+1
2+3
3+5.8
4+9
5+12
6+15
7+17
Table 31. Filter Biquad Q Adjustment
BQD1-3<3:0>
Table 32. Calibrator System Clock
CALCLK<1:0> FREF divide by
032
164
2 256
3 512
Table 33. Wobble Comparator Level
WBLLVL<1:0> Level
0 0 +52 mV
0 1 +104 mV
1 0 -52 mV
1 1 -104 mV
Table 34. ADC Input Selection
ADCVAL<2:0> ADC Signal ADC Reference
0 ANSE As required by signal
1 TP1 0V Differential
2 TP2 0V Differential
3 TSDD1 0V Differential
4 TSDD2 0V Differential
5 VBG REFBACK
6 RDSZ REFBACK
7 TRSIN1P REFBACK
Table 35. ADC Maximum Signal Range Settings
ADCGAIN<1:0> Maximum ADC Input Signal (Vdiffpp)
0 0.125
1 0.25
20.5
31.0
Table 36. Input Voltage Offset Selection
FORCESEL<2:0> Selected Input
0FO1
1FO2
2TR1
3TR2
4CDFO1
5CDFO2
6 CDTR1
7 CDTR2
AT78C1503
38
Electrical Specifications
Operating Conditions: VDD = 3.0 - 3.6 volts and TA = 0 - 70°C
Table 37. Forced Input Voltage Amplitude
FORCEVAL<2:0> RF Offset (mV) Servo Offset (mV)
05055
1 100 170
2 200 280
3 400 400
4-50-55
5 -100 -170
6 -200 -280
7 -400 -400
Table 37. Forced Input Voltage Amplitude
FORCEVAL<2:0> RF Offset (mV) Servo Offset (mV)
Supply Specifications
Parameter Sym Conditions Min Typ Max Units
Supply Voltage VDD 3.0 3.3 3.6 V
Supply Current IDD 275 mA
Sleep Mode Current IDDS 100 µA
Digital Input/Output (CMOS Compatible)
Parameter Sym Conditions Min Typ Max Units
High-level Input Voltage VIH VDD-0.5 V
Low-level Input voltage VIL 0.5 V
High/Low Level Input
Current 10 mA
High-level Output Voltage VOH IOH = 0.5 mA VDD-0.2 V
Low-level Output Voltage VOL IOL = 0.5 mA 0.4
Bandgap Reference
Parameter Sym Conditions Min Typ Max Units
Output Voltage VBG 1.15 1.2 1.25 V
Reference Resistor REXT Reference resistor from VBG to VSS (ground) 16.2 k
AT78C1503
39
Variable Gain Amplifier (VGA)
Parameter Sym Conditions Min Typ Max Units
Gain Range 110V/V
Input Dynamic Range
(Low-mode) DRL 30 300 mV
Input Dynamic Range
(High-mode) DRH 60 600 mV
Bandwidth AGCBW -3dB 100 MHz
AGC Control Sensitivity AGC mode 20 dB/V
AGC Locking Voltage
(Input to data slicer) VAGC Peak-to-peak differential input to slicer
in AGC mode 1V
Total Harmonic Distortion THD Measured at the detector input. 750
mVppd lock in AGC mode 2%
Common Mode Rejection Ratio CMRR Vin = 250 mV common mode @10 MHz 40 dB
Power Supply Rejection Ratio PSRR Vsup = 250 mV @10 MHz 40 dB
7th Order Equiripple Filter/Equalizer
Parameter Sym Conditions Min Typ Max Units
Filter Cutoff Frequency
Programmability Fc 4.4 22 MHz
Filter Boost Range Fb Measured from low
frequency gain 013dB
Cutoff frequency
Accuracy All frequency ranges -10 +10 %
Boost Accuracy All frequency ranges -2 +2 dB
Group Delay Variation All frequency ranges -4 +4 %
Data Phase Locked Loop
Parameter Sym Conditions Min Typ Max Units
Frequency Supported 26 146 MHz
RMS Jitter TBD degrees
Pull-in Range -2.5 +2.5 % of Fc
Frequency Synthesizer
Parameter Sym Conditions Min Typ Max Units
Frequency Supported 26 146 MHz
External Source 15 40 MHz
AT78C1503
40
Serial Register
Parameter Sym Conditions Min Typ Max Units
Serial Clock Frequency SCLK 0.01 20 MHz
SENA to SCLK
Set-up Time TEC Transition time serial enable to serial clock 10 ns
SCLK Pulse Width TPW 20 ns
SCLK to SDATA
Hold Time THCD 10 ns
SDATA to SCLK
Set-up Time TSDC 10 ns
Table 38. Pin List
Pin # Pin Name Type Description
1 IDFIELD Output Signal to preamp to drive ID select
2 RFP Analog Input High-speed signal input
3 RFN Analog Input High-speed signal input
4 FO1P Differential Input Focus 1 Positive
5 FO1N Differential Input Focus 1 Negative
6 FO2P Differential Input Focus 2 Positive
7 FO2N Differential Input Focus 2 Negative
8 TR1P Differential Input Track 1 Positive
9 TR1N Differential Input Track 1 Negative
10 TR2P Differential Input Track 2 Positive
11 TR2N Differential Input Track 2 Negative
12 FOHG
13 REXT Passive Passive for 0 TC current reference
14 VDD1 +3.3V Supply DPD, IBIAS
15 VSS1 0 V Supply DPD, IBIAS
16 FO1_CD Analog Input Focus 1, CD Input
17 FO2_CD Analog Input Focus 2, CD Input
18 TR1_CD Analog Input Track 1, CD Input
19 TR2_CD Analog Input Track 2, CD Input
20 VDD6 +3.3V Supply Slow Servo Analog
21 SS_H
22 VSS6 0V Supply Slow Servo Analog
23 REFFRONT Input/Output Servo Front-end reference level
24 REFBACK Input/Output Servo Back-end reference level
25 LENSPOS Analog Input Lens position error input
AT78C1503
41
26 ATP1 Analog Input Servo Analog Test Point
27 FE Analog Output Focus Error Output
28 TE Analog Output Tracking Error Output
29 SLOWSUM Analog Output Low-pass filtered sum of photodetector outputs
30 PORB
31 VSS8 Servo DACs
32 VDD8 Servo DACs
33 IDSEL Input ID field select
34 LHIPWR Input Laser High Power
35 SHLD Input Servo Hold
36 ADCSTRT Digital Input Start on-chip 6-bit ADC
37 BWUP Digital Input Bandwidth Up
38 BWDN Digital Input Bandwidth Down
39 IDINT Input Mode select of sequencer
40 PD Input Power Down
41 RG Input User Data Read Gate
42 VSS9 Servo DAC rings
43 VDD9 Servo DAC Rings
44 WOBBLE Digital Output WOBBLE Detect Output
45 ID12 Digital Output ID Field 12 Detected
46 ID34 Digital Output ID Field 34 Detected
47 TZC Digital Output Track Zero Crossing
48 TOK Digital Output Track OK
49 FOK Digital Output Focus OK
50 MIRROR Output Mirror Detect (ROM)/Mirror Field Detect (RAM)
51 SENA Input Serial Data Enable; must be high to read or write serial registers
52 SDATA Input/Output Serial Data, input (write data) or output (read data)
53 SCLK Input Serial Data Clock
54 VSS4 ESD Ring, Digital Ring
55 VDD4 ESD Ring, Digital Ring
56 VSS7 Slow Servo Digital, Synthesizer Dividers
57 VDD7 Slow Servo Digital, Synthesizer Dividers
58 FREF Digital Input Reference Clock Input to Synthesizer
59 VSS5 0V Supply Digital I/O Supply
60 VDD5 3.3V Supply Digital I/O Supply
61 RFDROP Digital Output RF Dropout detected
Table 38. Pin List
Pin # Pin Name Type Description
AT78C1503
42
62 RCLK Digital Output Recovered clock divided by 4 or 8
63 DATA0 Output Recovered data out, Bit 0 (last in time)
64 DATA1 Output Recovered data out, Bit 1
65 DATA2 Output Recovered data out, Bit 2
66 DATA3 Output Recovered data out, Bit 3
67 DATA4 Output Recovered data out, Bit 4
68 DATA5 Output Recovered data out, Bit 5
69 DATA6 Output Recovered data out, Bit 6
70 DATA7 Output Recovered data out, Bit 7 (first in time)
71 VSS11 0V Supply Digital I/O Ring
72 VDD11 +3.3V Supply Digital I/O Ring
73 VSS3 0V Supply TR CML, Synthesizer CML, DC Restore
74 VDD3 +3.3V Supply TR CML, Synthesizer CML, DC Restore
75 TRCST Input Timing recovery coast
76 WCLK Output Write Clock
77 WG Input Write Gate (enables Write Clock)
78 TRSIN2N Differential Input Timing Recovery/Synthesizer test input
79 TRSIN2P Differential Input Timing Recovery/Synthesizer test input
80 TRSIN1N Differential Input Timing Recovery/Synthesizer test input
81 TRSIN1P Differential Input Timing Recovery/Synthesizer test input
82 TSDDTP1N Test Output TR/Detector/Phase Detector test point
83 TSDDTP1P Test Output TR/Detector/Phase Detector test point
84 TSDDTP2N Test Output TR/Detector/Phase Detector test point
85 TSDDTP2P Test Output TR/Detector/Phase Detector test point
86 CDCRN Analog Detector Duty Cycle Feedback Cap
87 CDCRP Analog Detector Duty Cycle Feedback Cap
88 VDD2 +3.3V Supply RF Frontend Ring
89 VSS2 0V Supply RF Frontend Ring
90 TP2N Differential Output Test Point 2 Output
91 TP2P Differential Output Test Point 2 Output
92 TP1N Differential Output Test Point 1 Output
93 TP1P Differential Output Test Point 1 Output
94 AGCHLD Digital Input AGC Hold Input
95 AGCFST Digital Input AGC Fast Recovery Input
96 VSS10 AGC, LPF
97 VDD10 AGC, LPF
Table 38. Pin List
Pin # Pin Name Type Description
AT78C1503
43
98 AGCLZ Digital Input Low Z Control for AGC Input
99 RDSZ Analog Output AGC Cap/Detector Cap Voltage Outputs
100 CAGC Passive External Capacitor for AGC Loop
Table 38. Pin List
Pin # Pin Name Type Description
Table 39. Supply Pins
Supply Pin Circuitry
VDD/SS1 DPD, IBIAS, RTRIM
VDD/SS2 RF Frontend Ring
VDD/SS3 TR & Synthesizer CML, DC Restore, RF Dropout Analog
VDD/SS4 ESD & Digital Ring
VDD/SS5 Digital I/O Supply
VDD/SS6 Servo Analog
VDD/SS7 Servo, Synthesizer and RF Dropout Digital, CMOSTPMUX, Serial Registers 1&3, Calibrator
VDD/SS8 Servo DACs
VDD/SS9 Servo DAC Rings
VDD/SS10 AGC, LPF
VDD/SS11 Digital I/O Ring
AT78C1503
44
Ordering Information
Ordering Code Package Operation Range
AT78C1503-100TC 100 Pin TQFP Commercial (0°C to 70°C)
AT78C1503-100LC 100 Pin LQFP Commercial (0°C to 70°C)
Package Type
100T 100-Lead, Thin Quad Flat Pack (TQFP)
100L 100-Lead, Low Quad Flat Pack (LQFP)
AT78C1503
45
Packaging Information
PIN 1 ID
0.56(0.022)
0.44(0.018)
16.25(0.640)
15.75(0.620)
0.27(0.011)
0.17(0.007)
14.10(0.555)
13.90(0.547)
0.15(0.006)
0.05(0.002)
0.75(0.030)
0.45(0.018)
0-7
0.20(0.008)
0.10(0.004)
1.05(0.041)
0.95(0.037)
100T, 100-lead, Thin Quad Flat Pack (TQFP)
Dimensions in Inches and (Millimeters)
100L, 100-lead, Low Quad Flat Pack (LQFP)
Dimensions in Millimeters
PIN 1 ID
0.56
0.44
16.25
15.75
0.27
0.17
14.10
13.90
0.15
0.05
0.75
0.45
0-7
0.20
0.10
1.45
1.35
© Atmel Corporation 2000.
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