IAmerican Microsystems, Inc., reserves the right to change the detail specifications as may be required to permit improvements in the design of its products. 3.1.02
FS6372
FS6372FS6372
FS6372
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or ICROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ISO9001
ISO9001ISO9001
ISO9001
1.0 Features
Fully compatible with FS6370 (EEPROM-based) and
FS6377 (register-based) devices.
Three on-chip PL Ls with Referenc e an d Fee dback
Dividers set by internal ROM look-up table
Four independently programmable muxes and post
dividers
Selectable po wer -do wn of PLLs and shutd o wn of
output clock drivers
Tristate outputs for board testing
Can be optimized for reference clock (instead of
crystal) input
5V to 3.3V operation
Commercial (FS6372) and industrial (FS6372i) tem-
perature ranges
2.0 Description
The FS6372 is a CMOS clock generator IC designed to
minimize cost and component count in a variety of elec-
tronic systems. Three phase-locked loops feeding four
muxes and post di viders pro vide a high degree of f lexibil-
ity.
Figure 1: Pin Configuration
116
2
3
4
5
6
7
8
15
14
13
12
11
10
9
VSS
SELECT
PD
VSS
XIN
XOUT/REFIN
OE
VDD n/c
CLK_D
VSS
CLK_C
CLK_B
VDD
CLK_A
VDD
FS6372-xx
16-pin (0.150”) SOIC
Figure 2: Block Diagram
ROM
Power Down
Control
Post
Divider C
Post
Divider B
FS6372
PD
Post
Divider A
CLK_A
CLK_B
CLK_C
Reference
Oscillator PLL A
PLL B
XOUT
XIN
PLL C
Post
Divider D
CLK_D
SELECT
OE
Mux
A
Mux
B
Mux
C
Mux
D
3.1.02
FS6372
FS6372FS6372
FS6372
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or ICROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
Table 1: Pin Descriptions
Key: AI = Analog Input; AO = Analog Output; DI = Digital Input; DIU = Input with Internal Pull-Up; DID = Input with Internal Pull-Down; DIO = Digital Input/Output; DI-3 = T hree-Level Digital Input,
DO = Digital Output; P = Power/Ground; # = Active Low pin
PIN TYPE NAME DESCRIPTION
1 P VSS Ground
2DI
USELECT Selects diff erent devic e funct i on (refer to specific variation of FS6372-xx for details )
3DI
UPD Power-Down Input
4 P VSS Ground
5 AI XIN Crystal Oscillator Input
6 AO XOUT / REFIN Crystal Oscillator Output / Reference Clock Input
7DI
UOE Output Enable Input
8 P VDD Power Supply (5V to 3.3V)
9 - N/C No Connect
10 DO CLK_D D Clock Output
11 P VSS Ground
12 DO CLK_C C Clock Output
13 DO CLK_B B Cl ock Output
14 P VDD Power Supply (5V t o 3.3V)
15 DO CLK_A A Cl ock Output
16 P VDD Power Supply (5V t o 3.3V)
3.1.02
3
FS6372
FS6372FS6372
FS6372
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or ICROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ISO9001
ISO9001ISO9001
ISO9001
3.0 Electrical Specifications
Table 2: Absolute Maximum Ratings
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. These conditions represent a stress rating only, and functional operation of the device at
these or any other conditions above the operational limits noted in this specification is not implied. Exposure to maximum rating conditions for extended conditions may affect device performance,
functionality, and reliability.
PARAMETER SYMBOL MIN. MAX. UNITS
Supply Voltage, dc (VSS = ground) VDD VSS-0.5 7 V
Input Voltage, dc VIVSS-0.5 VDD+0.5 V
Output Voltage, dc VOVSS-0.5 VDD+0.5 V
Input Clamp Current, dc (V I < 0 or VI > V DD)I
IK -50 50 mA
Output Clamp Current, dc (VI < 0 or VI > VDD)I
OK -50 50 mA
Storage Temperature Range (non-condensing) TS-65 150 °C
Ambient Temperature Range, Under Bias TA-55 125 °C
Junction Temperature TJ150 °C
Lead Temperature (soldering, 10s) 260 °C
Input Static Disc harge Voltage Protection (MIL-STD 883E, Method 3015.7) 2 kV
CAUTION: ELECTROSTATIC SENSITIVE DEVICE
Permanent damage res ulting in a loss of functi onality or performance may occur if this devi ce is subjected to a high-energy elec-
trostatic discharge.
Table 3: Operating Conditions
PARAMETER SYMBOL CONDITIONS/DESCRIPTION MIN. TYP. MAX. UNITS
5V ± 10% 4.5 5 5.5
Supply Voltage VDD 3.3V ± 10% 3 3.3 3.6 V
Commercial 0 70
Ambient Operating Temperature Range TAIndustrial -40 85 °C
Crystal Resonator Frequency fXIN 527MHz
Crystal Resonator Load Capacitanc e CXL Paral l el resonant , A T cut 18 pF
Output Driver Load Capacitance CL15 pF
AMERICAN MICROSYSTEMS, INC.
March 2002
3.1.02
4
FS6372
FS6372FS6372
FS6372
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or ICROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ISO9001
ISO9001ISO9001
ISO9001
Table 4: DC Electrical Specifications
Unless otherwise stated, VDD = 5.0V ± 10%, no load on any output, and ambient temperature range TA = 0°C to 70°C. Parameters denoted with an asterisk ( * ) represent nominal characterization
data and are not currently production tested to any specific limits. MIN and MAX characterization data are ± 3σ from typical. Negative currents indicate current flows out of the device.
PARAMETER SYMBOL CONDITIONS/DESCRIPTION MIN. TYP. MAX. UNITS
Overall
Supply Current, Dynamic, with
Loaded Outputs IDD VDD = 5.5V, fCLK = 50MHz, CL = 15pF 43 mA
Supply Current, Static IDDL VDD = 5.5V, device powered down 0.3 mA
Power-Down, Output Enable Pins (PD, OE)
VDD = 5.5V 3.85 VDD+0.3
High-Level Input V olt age VIH VDD = 3.6V 2.52 VDD+0.3 V
VDD = 5.5V VSS-0.3 1.65
Low-Level Input V oltage VIL VDD = 3.6V VSS-0.3 1.08 V
VDD = 5.5V 2.20
Hysteresis Voltage Vhys VDD = 3.6V 1.44 V
High-Level Input Current IIH -1 1 µA
Low-Level Input Current (pul l-up) IIL VIL = 0V -20 -36 -80 µA
Select (SELECT)
VDD = 5.5V 2.4 VDD+0.3
High-Level Input V olt age VIH VDD = 3.6V 2.0 VDD+0.3 V
VDD = 5.5V VSS-0.3 0.8
Low-Level Input V oltage VIL VDD = 3.6V VSS-0.3 0.8 V
High-Level Input Current IIH -1 1 µA
Low-Level Input Current (pul l-up) IIL -20 -36 -80 µA
Crystal Oscillator Feedback (XIN)
VDD = 5.5V 2.9
Threshold Bias Voltage VTH VDD = 3.6V 1.7 V
VDD = 5.5V 54 µA
High-Level Input Current IIH VDD = 5.5V, oscillator powered down 5 15 mA
Low-Level Input Current IIL VDD = 5.5V -25 -54 -75 µA
Crystal Loadi ng Capaci tance * CL(xtal) As seen by an external crystal connected to XIN and
XOUT 18 pF
Input Loading Capacitance * CL(XIN) As seen by an external clock driver on XOUT; XIN
unconnected 36 pF
3.1.02
5
FS6372
FS6372FS6372
FS6372
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or ICROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ISO9001
ISO9001ISO9001
ISO9001
Table 5: DC Electrical Specifications, continued
Unless otherwise stated, VDD = 5.0V ± 10%, no load on any output, and ambient temperature range TA = 0°C to 70°C. Parameters denoted with an asterisk ( * ) represent nominal characterization
data and are not currently production tested to any specific limits. MIN and MAX characterization data are ± 3σ from typical. Negative currents indicate current flows out of the device.
PARAMETER SYMBOL CONDITIONS/DESCRIPTION MIN. TYP. MAX. UNITS
Crystal Oscillator Drive (XOUT)
High-Level Output Sourc e Current I OH VDD = V(XIN) = 5.5V, VO = 0V 10 21 30 mA
Low-Level Output Sink Current IOL VDD = 5.5V, V(XIN) = 0V, VO = 5.5V -10 -21 -30 mA
Clock Outputs (CLK_A, CLK_B, CL K_C, CLK_D)
High-Level Output Sourc e Current I OH VO = 2.4V -125 mA
Low-Level Output Sink Current IOL VO = 0.4V 23 mA
zOH VO = 0.5VDD; output drivi ng hi gh 29
Output Impedance zOL VO = 0.5VDD; output drivi ng l ow 27
Tristate Output Current IZ-10 10 µA
Short Circuit S ource Current * ISCH VDD = 5.5V, VO = 0V; shorted for 30s, max. -150 mA
Short Circuit S i nk Current * ISCL VDD = VO = 5.5V, shorted for 30s, max. 123 m A
Figure 3: CLK_A, CLK_B, CL K_C, CLK_D Clock Outputs
Low Drive Current (mA) High Drive Current (mA)
Voltage
(V) MIN. TYP. MAX. Voltage
(V) MIN. TYP. MAX.
0 0 0 0 0 -87 -112 -150
0.2 9 11 12 0.5 -85 -110 -147
0.5 22 25 29 1 -83 -108 -144
0.7 29 34 40 1.5 -80 -104 -139
1 39 46 55 2 -74 -97 -131
1.2 44 52 64 2.5 -65 -88 -121
1.5 51 61 76 2.7 -61 -84 -116
1.7 55 66 83 3 -53 -77 -108
2 60 73 92 3.2 -48 -71 -102
2.2627797 3.5-39-62-92
2.5 65 81 104 3.7 -32 -55 -85
2.7 65 83 108 4 -21 -44 -74
3 66 85 112 4.2 -13 -36 -65
3.5 67 87 117 4.5 0 -24 -52
4 68 88 119 4.7 -15 -43
4.5 69 89 120 5 0 -28
5 91 121 5.2 -11
5.5 123 5.5 0
-200
-150
-100
-50
0
50
100
150
- 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5
Output Voltage (V)
Output Current (mA)
MIN
TYP
MAX
The data in this table represents nominal characterization data only.
AMERICAN MICROSYSTEMS, INC.
March 2002
3.1.02
6
FS6372
FS6372FS6372
FS6372
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or ICROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ISO9001
ISO9001ISO9001
ISO9001
Table 6: AC Timing Specifications
Unless otherwise stated, VDD = 5.0V ± 10%, no load on any output, and ambient temperature range TA = 0°C to 70°C. Parameters denoted with an asterisk ( * ) represent nominal characterization
data and are not currently production tested to any specific limits. MIN and MAX characterization data are ± 3σ from typical.
PARAMETER SYMBOL CONDITIONS/DESCRIPTION CLOCK
(MHz) MIN. TYP. MAX. UNITS
Overall
VDD = 5.5V 0.8 150
Output Frequency * fOVDD = 3.6V 0.8 100 MHz
VDD = 5.5V 40 230
VCO Frequency * fVCO VDD = 3.6V 40 170 MHz
VO = 0. 5V to 4.5V ; CL = 15pF 1.9
Rise Time * trVO = 0. 3V to 3.0V ; C L = 15pF 1.6 ns
VO = 4. 5V to 0.5V ; CL = 15pF 1.8
Fall Time * tfVO = 3.0V to 0. 3V; CL = 15pF 1.5 ns
Tristate Enable Delay * tPZL, tPZH 18ns
Tristate Disable Delay * tPLZ, tPHZ 18ns
Clock Stabilization Time * tSTB Output active from power-up, via PD pin 100 µs
Clock Outputs (PLL A clock via CLK_A pin)
Duty Cycle * Ratio of pulse width (as measured from rising edge to next
falling edge at 2.5V) to one clock period 100 45 55 %
On rising edges 500µs apart at 2.5V relative to an ideal
clock, CL=15pF, fXIN=14.318MHz, NF=220, NR=63, NPx=50,
No other PLLs active 100 45
Jitter, Long Term (σy(τ)) * tj(LT) On rising edges 500µs apart at 2.5V relative to an ideal
clock, CL=15pF, fXIN=14.318MHz, NF=220, NR=63, NPx=50,
all other PLLs active (B=60MHz, C=40MHz, D=14.318MHz) 50 165 ps
From rising edge to the next rising edge at 2.5V, CL=15pF,
fXIN=14.318MHz, NF=220, NR=63, NPx=50,
No other PLLs active 100 110
Jitter, Period (peak-peak) * tj(P) From rising edge to the next rising edge at 2.5V, CL=15pF,
fXIN=14.318MHz, NF=220, NR=63, NPx=50, all other PLLs
active (B=60MHz, C=40MHz, D=14.318MHz) 50 390 ps
3.1.02
7
FS6372
FS6372FS6372
FS6372
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or ICROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ISO9001
ISO9001ISO9001
ISO9001
Table 7: AC Timing Specifications, continued
Unless otherwise stated, VDD = 5.0V ± 10%, no load on any output, and ambient temperature range TA = 0°C to 70°C. Parameters denoted with an asterisk ( * ) represent nominal characterization
data and are not currently production tested to any specific limits. MIN and MAX characterization data are ± 3σ from typical.
PARAMETER SYMBOL CONDITIONS/DESCRIPTION CLOCK
(MHz) MIN. TYP. MAX. UNITS
Clock Outputs (PLL B clock via CLK_B pin)
Duty Cycle * Ratio of pulse width (as measured from rising edge to
next falling edge at 2.5V) to one clock period 100 45 55 %
On rising edges 500µs apart at 2.5V relative to an ideal
clock, CL=15pF, fXIN=14.318MHz, NF=220, NR=63,
NPx=50, No other PLLs active 100 45
Jitter, Long Term (σy(τ)) * tj(LT) On rising edges 500µs apart at 2.5V relative to an ideal
clock, CL=15pF, fXIN=14.318MHz, NF=220, NR=63,
NPx=50, all other PLLs active (A=50MHz, C=40MHz,
D=14.318MHz) 60 75 ps
From rising edge to the next rising edge at 2.5V,
CL=15pF, fXIN=14.318MHz, NF=220, NR=63, NPx=50,
No other PLLs active 100 120
Jitter, Period (peak-peak) * tj(P) From rising edge to the next rising edge at 2.5V,
CL=15pF, fXIN=14.318MHz, NF=220, NR=63, NPx=50, all
other PLLs active (A=50MHz, C=40MHz, D=14.318MHz) 60 400 ps
Clock Outputs (PLL_C clock via CLK_C pin)
Duty Cycle * Ratio of pulse width (as measured from rising edge to
next falling edge at 2.5V) to one clock period 100 45 55 %
On rising edges 500µs apart at 2.5V relative to an ideal
clock, CL=15pF, fXIN=14.318MHz, NF=220, NR=63,
NPx=50, No other PLLs active 100 45
Jitter, Long Term (σy(τ)) * tj(LT) On rising edges 500µs apart at 2.5V relative to an ideal
clock, CL=15pF, fXIN=14.318MHz, NF=220, NR=63,
NPx=50, all other PLLs active (A=50MHz, B=60MHz,
D=14.318MHz) 40 105 ps
From rising edge to the next rising edge at 2.5V,
CL=15pF, fXIN=14.318MHz, NF=220, NR=63, NPx=50,
No other PLLs active 100 120
Jitter, Period (peak-peak) * tj(P) From rising edge to the next rising edge at 2.5V,
CL=15pF, fXIN=14.318MHz, NF=220, NR=63, NPx=50, all
other PLLs active (A=50MHz, B=60MHz, D=14.318MHz) 40 440 ps
Clock Outputs (Crystal Oscillator via CLK_D pin)
Duty Cycle * Ratio of pulse width (as measured from rising edge to
next falling edge at 2.5V) to one clock period 14.318 45 55 %
On rising edges 500µs apart at 2.5V relative to an ideal
clock, CL=15pF, fXIN=14.318MHz, No other PLLs active 14.318 20
Jitter, Long Term (σy(τ)) * tj(LT) From rising edge to the next rising edge at 2.5V,
CL=15pF, fXIN=14.318MHz, all other PLLs active
(A=50MHz, B=60MHz, C=40MHz) 14.318 40 ps
From rising edge to the next rising edge at 2.5V,
CL=15pF, fXIN=14.318MHz, No other PLLs active 14.318 90
Jitter, Period (peak-peak) * tj(P) From rising edge to the next rising edge at 2.5V,
CL=15pF, fXIN=14.318MHz, all other PLLs active
(A=50MHz, B=60MHz, C=40MHz) 14.318 450 ps
AMERICAN MICROSYSTEMS, INC.
March 2002
3.1.02
8
FS6372
FS6372FS6372
FS6372
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or ICROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ISO9001
ISO9001ISO9001
ISO9001
4.0 Package Information
Table 8: 16-pin SOIC (0.150") Package Dimensions
DIMENSIONS
INCHES MILLIMETERS
MIN. MAX. MIN. MAX.
A 0.061 0.068 1.55 1.73
A1 0.004 0.0098 0.102 0.249
A2 0.055 0.061 1.40 1.55
B 0.013 0.019 0.33 0.49
C 0.0075 0.0098 0.191 0.249
D 0.386 0.393 9.80 9.98
E 0.150 0.157 3.81 3.99
e 0.050 BSC 1.27 BSC
H 0.230 0.244 5.84 6.20
h 0.010 0.016 0.25 0.41
L 0.016 0.035 0.41 0.89
Θ0°8°0°8°
Be
DA
1
SEATING PLANE
HE
16
1ALL RADII:
0.005" TO 0.01"
BASE PLANE
A
2
C
L
θ
7° typ.h x 45°
A
AMERICAN MICROSYSTEMS, INC.
R
Table 9: 16-pin SOIC (0.150") Package Characteristics
PARAMETER SYMBOL CONDITIONS/DESCRIPTION TYP. UNITS
Thermal Impedance, Junction to Free-Air
16-pin 0.150” SOIC ΘJA Air flow = 0 m/s 110 °C/W
Corner lead 4.0
Lead Inductanc e, Self L11 Center lead 3.0 nH
Lead Inductanc e, Mutual L12 Any lead to any adjacent l ead 0.4 nH
Lead Capacitance, Bulk C11 Any lead to VSS 0.5 pF
3.1.02
9
FS6372
FS6372FS6372
FS6372
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or ICROM-Bas ed 3-PLL Cloc k Gen erat or IC
ROM-Bas ed 3-PLL Cloc k Gen erat or IC
ISO9001
ISO9001ISO9001
ISO9001
5.0 Ordering Information
5.1 Device Ordering Codes
DEVICE NUMBER ORDERING CODE PACKAGE TYPE OPERATING
TEMPERATURE RANGE SHIPPING
CONFIGURATION
11486-802 16-pin (0.150”) SOIC
(Small Outl i ne Package) 0°C to 70°C (Commercial) Tape-and-Reel
11486-812 16-pin (0.150”) SOIC
(Small Outl i ne Package) 0°C to 70°C (Commercial) Tubes
11486-902 16-pin (0.150”) SOIC
(Small Outl i ne Package) -40°C to 85°C (Industrial) Tape-and-Reel
FS6372
11486-912 16-pin (0.150”) SOIC
(Small Outl i ne Package) -40°C to 85°C (Industrial) Tubes
Copyright © 2000 American Microsystems, Inc.
Devices sold by AMI are covered b y the warranty and pat ent indem nific ation pro visions ap pearing in its T erms of Sale
only. AMI m akes no warrant y, express, s tatutory im plied or b y descript ion, r egarding th e infor m ation set f orth here in or
regarding t he f r eed om of the des cr ibed de vic es from patent inf r ingement. AMI mak es no warranty of merchantabi l it y or
fitness for any pur poses. AMI reser ves the right to discont inue pro duction and c hange s pecific ations and prices a t any
time and without notice. AMI’s products are intended for use in commercial applications. Applications requiring ex-
tended tem perature range, u nusual environm enta l requirem ents, or h igh reliab ilit y applications , such as m ilitary, m edi-
cal life-s uppor t or life-s ustaining e qu ipment, are s p ec if ic ally not recomm ended without add itional pr oc ess ing by AMI f or
such applications.
American Microsystems, Inc., 2300 Buckskin Rd., Pocatello, ID 83201, (208) 233-4690, FAX (208) 234-6796,
WWW Add ress: http://www.amis.com E-mail: t
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