MIL SPECS The documentation and process conversion measures necessary to i | | | | comply with this revision shall be | | completed by | 1. SCOPE 1.1 Scope. SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER, MILITARY SPECIFICATION Tcfooo0o1es ofo3a34 4 &j TYPES 1N1184, 1N1186, 1N1188, 1N1190, 1N3766, 1N3768, 1N1184R, 1N1186R, 1N1188R, 1N1190R, 1N3766R, 1N3768R, JAN, JANTX, AND JANTXV This specification is approved for use by all Depart- ments and Agencies of the Department of Defense. | INCH=POUND | MIL-S-19500/2978 0 0 MIL-S-19500/297A 6 October 1969 This specification covers the detail] requirements for silicon semiconductor power rectifier diodes. MIL-S-19500. 1.2 Physical dimensions. See figure 1 (D0-5). 1.3 Maximum ratings. Three levels of product assurance are provided for each device as specified in | } qT | I | { I | Type [Vp(non-rep) | Yp | Vem | Ig i/ | ig(surge) { Barometeric [ try i | i | | Te = 150C [ at 1/120.s_ | pressure | ! Tc = 150C (reduced) Vpk} Vv dc V (pk) A_dc A mmHg us | 1N1184 | 120 | 100 | 100 i 35 | 500 | 8 | 10 | 1N1186 | 240 {| 200 | 200 | 35 | 500 | 8 { 10 | 1N1188 | 480 i 400 | 400 | 35 | 500 | 8 | 10 | 1N1190 | 720 | 600 | 600 | 36 | 500 | 16 | 10 | 1N3766 | 960 f 800 | 800 | 35 I 500 | 30 } 10 ! 1N3768 ! 1200 1000 ! 1000 |! 35 ! 500 ! 54 ! 10 1/ Derate linearly 1.4 A dc/C between Tc = 150C to Tc = 175C. Storage temperature: Te = -65C to +175C Operating temperature: Tc = -65C to +150C 1.4 Primary electrical characteristics. Rgyc = -8-C/W maximum. [Beneficial comments Crecommendations, additions, deletions) and any pertinent data which imay be of use in improving this document should be addressed to: |Center (RBE-2), Griffiss AFB, NY 13441-5700 by using the self-addressed Standardization Rome Air Development {Document Improvement Proposal (DD Form 1426) appearing at the end of this document or {by letter. AMSC N/A DISTRIBUTION STATEMENT A, Approved for public release; distribution is unlimited. FSC 5961MIL SPECS Ic OOO00125 g003835 & 5 MIL~-S-19500/ 2978 2. APPLICABLE DOCUMENTS 2.1 Government documents. 2,1,1 Specifications standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards and supplement thereto, cited in the solicitation (see 6.2). SPECIFICATION MILITARY MIL-S-19500 - Semiconductor Devices, General Specification for. STANDARDS FEDERAL FED-STD-H28 - Screw Thread Standards for Federal Services. MILITARY MIL-STD-750 - Test Methods for Semiconductor Devices. (Unless otherwise indicated, copies of federal and military specifications, standards, and handbooks are available from the Naval Publications and Forms Center, (ATTN: NPODS), 5801 Tabor Avenue, Philadelphia, PA 19120-5099. ) 2.2 Order of precedence, In the event of a conflict between the text of this document and the references cited herein (except for related associated detail specifications, specification sheets, or MS standards), the text of this document shall take precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtainea. 3. REQUIREMENTS 3.1 Detail specification. The individual item requirements shall be in accordance with MIL-S-19500, and as specified herein. Lot accumulation period shall be three months in lieu of six weeks. . 3.2 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein sha e as specified in -$- . 3.3. Design, construction, and physical dimensions. The design, construction, and physical dimensions shal? be as specified tn MIL-S-19500, and figure 1 herein. 3.4 Marking, Marking shall be in accordance with MIL-S-19500, except at the option of the manufacturer, the following marking may be omitted from the body of the rectifier (diode). 3.4.1 Polarity. The polarity shall be indicated by a graphic symbol with the arrow pointing toward the negative end for forward bias. The reversed units shall also be marked with an R following the last digit in the type number, 4. QUALITY ASSURANCE PROVISIONS 4,1 Sampling and inspection. Sampling and inspection shall be in accordance with MIL-S-19500, and as specified herein.1 MIL SPECS ic Qoo012e5 G00343b 4 MIL-S-19500/2978 - M E SEE NOTE 4 ae L GDIA K , | ~ .250(6.35 mm)-28UNF - 2A | F DIA. THD NF OPTIONAL aN Ty \ eS ie ZL L doe a + . Cc D r1C het 9 see notes | FLAT [I Dimensions Inches Millimeters Dim Min Max Min Max -~-= 1,000 << 25.40 --- 450 --- 11.43 A 8 Cc 0 E F G H J K L M NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. 3. Units must not be damaged by torque of 30 inch-pounds applied to .250-28 UNF~2B nut assembled on thread. 4. Diameter of unthreaded portion .249 (6.32 mm) max and .220 (5.59 mm) min. 5. Complete threads to extend to within 2-1/2 threads of seating plane. 6. Angular orientation of this terminal is undefined. 7. Max pitch diameter of plated threads shall be basic pftch diameter .2268 (5.76 mm) reference FED-STD-H28 (Screw Thread Standards For Federal Services) A chamfer or undercut on one or both ends of the hex portion is optional; minimum base diameter at seating plane .600 inch (15.24 mm). FIGURE 1. Physical dimensions.MIL SPECS IC ff aooo1es go03a37 T MIL -S-19500/ 297B 4,2 Qualification inspection. Qualification inspection shall be in accordance with MIL-S-19500, and as specified Herein. Tests in either polarity shall be sufficient to obtain qualification approval of both polarities. 4.3 Screening {JANTX and JANTXV levels only). Screening shall be in accordance with MIL-S-19500 (tabTe IT) and as specified herein. The following measurements shal] be made in accordance with table | herein. Devices that exceed the limits of table I herein shall not be acceptable. Measurement of MIL-S-19500) JANTX and JANTXV levels | Screen (see table II ] { | | | | | { | | | | | i/ Surge (see 4.3.1) | | Thermal response (see 4.3.2) | | | T | | 4 | Not applicable | | | | | | | 9 Veo and Ipy 2/ ! | I | | 10 | MIL-STD-750, method 1038, | | test condition A; t = 48 hrs | T | | | Subgroup 2 of table I herein, Veo and Ipq; | | 11 | aVeo = 1 V(pk) from initial value; | | | alp, = #40 uA de or 100 percent from the = | | | initial value, whichever is greater. 3/ ] T T | 12 Not applicable | | i | | 13 | Not applicable | | | 1/ Surge shall precede thermal response. These tests shall be performed anytime after screen 3 and before screen 9. 2/ Ipy measurement shall not be indicative of an open condition. 3/ PDA of screen 13 shall apply to screen 11. 4.3.1 Surge current. Surge current, see MIL-STD-750, method 4066. Ig = 0; Vpy(w) = 0; Ipsm = 500a; six surges; Ta = 25 C, tp = 8.3 ms, one surge per minute maximum. 4.3.2 Thermal response {ave measurements). The aVp measurements shal] be performed in accordance with metho 0 -STD-750." The aVe conditions and maximum Vp limit shall be derived by each vendor. The chosen aVe measurement and conditions for each device in the qualification lot shall be submitted in the qualification report and a thermal response curve shal] be plotted. The chosen aVr values shall be considered final after the manufacturer has had the opportunity to test five consecutive lots. Heating current (Ij) > rated Ip. tp = 250 ms, 4.4 Quality conformance inspection. Quality conformance inspection shall be in accordance with MIL-S-19500, and as specified herein.MIL SPECS cf Qoo01e5 0003434 1 MIL-S-19500/297B 4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-S-19500, and table Therein. (End-point electrical measurements shall be in accordance with the applicable steps of table V herein. } 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in table [Vb (JANTX and JANTXY) of MIL-S-19500, and table I] herein. Electrical measurements (end points) and delta requirements shall be in accordance with the applicable steps of table V herein. 4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for Subgroup testing in table V of MIL-S-19500, and table III herein. Electrical measurements (end points) and delta requirements shall be in accordance with the applicable steps of table V herein. 4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows. 4.5.1 DC intermittent operation life. A cycle shall consist of an "on" period, when power is applied suddeniy, not gfadually, to the device for the time necessary to achieve a delta case temperature of 85.C +15 C -5 C followed by an off" period, when the power is suddenly removed, for cooling. Auxiliary (forced) cooling is permitted during the off period only. 30'S < tHeating < 60 s, P = Vp x Ip or P = Vepx x Tay if using sine wave current. 0C full wave current (or equivalent half sine wave current) shall be used for the power required during the on period. The test power, or current, shal] be at least the free air rating. Within the time interval of 50 cycles before to 500 cycles after the termination of the test, the sample units shall be removed from the specified test conditions and allowed to reach room ambient conditions. Specified end-point measurements for qualification and quality conformance inspection shall be completed within 96 hours after removal of sample units from the specified test conditions. Additional readings may be taken at the discretion of the manufacturer. 5. PACKAGING 5,1 roegeaging requirements. The requirements for packaging shall be in accordance with MIL-S- . 6. NOTES (This section contains information of a general or explanatory nature that may be helpful, but is not mandatory. ) 6.1 Notes. The notes specified in MIL-S-19500 are applicable to this specification. 6.2 Acquisition requirements. Acquisition documents must specify the following: a. Title, number, and date of the specification. b. Issue of DODISS to be cited in the solicitation, and if required, the specific issue of individual doucment referenced (see 2.1.1). Cc. Lead finish may be specified (see 3.3.1).IcJfooo0125 0003839 3 & MIL SPECS MIL-S -19500/297B Group A inspection. TABLE I. vo 9 vo x YX o - oO 3 a uv = > > > =z <= 2 i a pene P = P- x wo ~ oO ao % . = uw = NAN 4 - we Pe = c ' ' t ' ad ' J I ' = , t 1 om = a ON > we uw a oe P => > a _ ~ | >< >< QO leer a efwaz=z -e Kee 4 Pw meee a" a 3 > _ w Po x e u Bu a o 0e- oO a ae s a oc wo a0 > > > ~ - wr 4 ao] E 3 Zo oc oO wD OQ c = eH oom Uv om S85 = nm Mm Oo Oromo OPM 3 orm Ww? oO am ovine cm es = =o s ' OO Pad Pad - Pad 4 ov w w w " Ve Eue Eugo " ews = Yo ov a vo cs aye O Sn oO rn o oan _ YP Ore cC> ~~ o>~ re a uo oO a aoe ron oO wo wo 5 5 $s 8 68 3 Qo w N +t tt + z Z = ee eae eee ~ wv D o oo] c rm _ tJ o a eo > od c wo a oO 3 n- c wv wn nad wv o er a x o rD DH co S 3 c *) ov o v iad we o> - r s+) oO 4 Ec wm Pp Sw 3 3 S a a - we . & oO jo - oo n al UO - o a al wo 3 o c 3 cw a] > > O 2 wv 3 ae oO ae o oOo oS n Er o| x wo -| Oo os ow x a od wy toa a On - a x x na wo DD pk a a on 2 3 a s > aQ wo 2 a ; 3 3c 3 = z= ar ow s oa vy s nn nn L >a a mo > nl o oO @ = a 2 > koow ~ x oe = see MIL-S-19500. 1/ For LTPD numbers(design verification) See footnotes at end of table. MIL SPECS Ici O0001e5 0003840 T a MIL -S-19500/297B TABLE If. Group B inspection for JANTX and JANTXV. TT + MIL-STD-750 [Qualification and [SmalT Tot qualityl | Inspection [ } Tlarge lot quality | conformance | | [Method | Conditions [conformance | inspection n/c | | | | jinspection LTPD | 1 | | { | | { | | I I I | | Subgroup 1 2/ | | | ! | | | \Solderability | 2026 ! | | | | [Resistance to solvents | 1022 | | [ | | | | i | | | Subgroup 2 | | | | { {Thermal shock | 1051 |Test condition C | | | | (temperature cycling) | [T(high) = +175C | i | ! {10 cycles | {Surge current | 4066 {Tc = 150C | | | | | Vp = Rated Vp (see 1,3) | | | | | |six 1/120s. surges. | | | | | Itp = 8.3 ms. | | | | | [l' surge per minute maximum. | | | | | lig(surge) = 500 A dc | | | | | superimposed on | | [ | | {to = 35 A dc | | Hermetic seal | 1071 ! \ | | Fine leak | | | { | | Gross leak | | ! | { [Electrical measurements | ISee table V, steps l, 2, i | | | ] land 3 i | I | Subgroup 3 2/_s| | | | | ~ | | {DC intermittent | 1037 |.25 Rated Ig < lo applied | | | | operation life | |< Rated Ip (see 4.5.1) | | | | | |Z000 cycles | | | | | {Electrical measurements | |See table V, steps 1, 2, | | i | | land 3 | | | | | | | | | Steady-state DC blocking! 1038 [Condition A; 340 hours | | | Pe | | | | {Electrical measurements | Is ee table V, steps 1 | { | nd 2 | | | Subgroup 4 | i | | | | | i |Decap internal visual |! 2075 | | { | i | | |MIL SPECS Ifoocoo12s 0003841 1 & MIL-S-19500/297B TABLE II. Group B inspection for JANTX and JANTXV - Continued. Electrical measurements See table V, steps 1 a nd 2 | i MIL-STD-750 [Qualification and (StalT Tot quatityt | Inspection | | Tlarge lot quality | conformance = | | | Method | Condi tions {conformance | inspection n/c | | | | linspection LTPD 1/| V | | | | | | | | Subgroup 5 1 | | |Not applicable | | | Subgroup 6 ! ! [High temperature | 1032. |T,q = +175C minimum | | | Unonoperating) | [ - | | | | | | | | | { | | | | | | | | | | i | | | | | | 1/ For LTPD numbers, see MIL-S-19500. _2/ A separate sample may be pulled for each test. TABLE III. Group C inspection. MIL-STD-750 TQualification and |Smal? Tot qualityl Inspection | large lot quality | conformance | | Method | Conditions {conformance { inspection n/c | | | linspection LTPD 1/| VV | 1 Subgroup 1 | | | Physical dimensions 2066 [See figure 1 Subgroup 2 | | Thermal shock 1056s| (glass strain) Terminal strength 2036 {Test condition B {method B; t= 155 lweight = 15 Ib (Test condition D1 {Torque = 3 1b-in; [t= 18s Bending stress Terminal torque {Test condition D2 |Torque = 30 Ib-in It = 15s | | Stud torque | | | | | | | | | | | | | | | | | | | | | | | | | | | See footnotes at end of table.MIL SPECS TC oogo12s o0o3za42 3 y MIL -S-19500/297B TABLE III. Group C inspection - Continued. MIL-STD-750 TQualification and [Small Tot quality] Inspection ~Tlarge lot quality | conformance ne ee ee ee ee sa eee ee a ee Method Conditions |conformance | inspection n/c linspection LTPD 1/| 1/ Subgroup 2 - Continued Hermetic seal 1071 Fine leak Gross leak Moisture resistance 1021 Electrical measurements Subgroup 3 hock S Vibration, variable frequency Constant acceleration Subgroup 4 Salt atmosphere (corrosion) Subgroup 5 N/A Subgroup 6 DC intermittent operation life Electrical measurements Subgroup 7 | ] [ | | I { | | | | | | | | | | | | | [ | | | | | | Electrical measurements | | { | | | { | | | | | | | | | | | | | I { Not applicable | i 2016 2056 2006 1041 1037 See table V, steps 1, 2, and 3 500 G 10,000 G See table IV, steps l and 2 .25 Rated Ig < Ig applied < Rated Ig see 5,1) BO00 cycles See table VY, steps 1, 3, and 4 ri nw i a i ee ee | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | i | | | | | | | | | | i 12/0 | | I | | | | | | | | | | | | [ | | | | | | | | i | | | | | | | | | | | | | | | | | | | | | | | | | 1/ For LTPD numbers, see MIL-S-19500.MIL SPECS rcp oooo12s ooozaya s MIL-S-19500/297B TABLE IV. Group E inspection (all quality levels) for qualification only. (reduced) 1 t = 60 s. While the test is being performed Ip shall be monitored and shall not exceed 35 mA dc. Te = 25C ] T MIL-STD-750 Qualification and [Smal]? Jot quality] | Inspection | | large lot quality | conformance | | | Method | Conditions |conformance | inspection n/c | | | | linspection LTPD | | | | | | | | I ] I | | | Subgroup 1 i | | 10 | 6/0 ! | i _ [Thermal shock i 1056 {0C to 100C, 100 cycles | | | (glass strain) | |! [Hermetic sea] 1071 | ! | | [Electrical measurements | iSee table V, steps 1, 2, | | | | | land 3 | i | | | i | | | i Subgroup 2 | | ! 5 12/0 | | [Steady-state DC blocking | 1038 Condition A; 1,000 hours | | | | life { or | ~ | | | i | 1049 s| i | | | | | | i | [Electrical measurements | [See table V, steps 1 | | [ L | Jand 4 i | | i | | | i i | Subgroup 3 ! 5/0 1/0 |DPA l {Photos of cross sections | | | ! i Ishall be submitted in thel | | | | Iqualification report. | | | | | [Vendors shal] retain | | | | ! {duplicate photos. | | Subgroup 4 | ! 10 ! 6/0 | {Thermal resistance [ 3101 [Rego = .8 C/W maximum = | | | | | Im = 50 mA | | | | | [ly = 50 A | | | | | [ty = 400 ms | | I ! pee ! | Subgroup 5 ! ! | 10 ! 6/0 | Barometric pressure | 1001 |! 5mm Hg = Pressure ! ! ! | | | | | | | | | | | | | | | | | | | | | | | | | | l | | | | | | | | | 10MIL SPECS TCMoooo1e5 voosza44 MIL-S-19500/297B TABLE V, Groups A, B, and C electrical) end-point measurements. IVa = Rated Va(dc) | (see 1.3) | } | MIL -S510-/30 4 | Limits | | | Step | Inspection (Method Conditions T Symbol T Min | Max T Unit { | { | ] I 1 | | | | 1 | | 1. [Forward voltage | 4011 lig = 110 a(pk) Veo | --- | 1.40 | V(pk) | | | | |(pulse); pulse | | | I | | | i Iwidth = 8.3 ms, duty | | { | | | | | {cycle = 2% maximum | | { | | | | | | | | | 2. [Reverse current | 4016 [DC method IIpy | --- | 101 pA de | | | [Vp = Rated Vp(dc) | | | | | | | [ I(see 1.3) | | | | | { i | | . | { | | | 3. | Thermal response | 3101 [See 4.3.2 | aVe ! ! m dc | { | | | 4, |Reverse current | 4016 [DC method 11p3 | | 20 | wA de | | | { | { | | | | { | i | | | | | | | / Devices which exceed the group A limits for this test shall be rejected. llMIL SPECS 1c OOO0O01e5 O0038645 4 i MIL-S-19500/297B 6.3 Substitution information. Devices covered by this specification are substitutable for the manufacturer's and uSers part numbers. This information in no way implies that manufacturer's part numbers are suitable as a substitute for the military part or identifying number. Military Manufacturer's Manufacturer's and part or identifying CAGE code user's part number number | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | { | | | | | { | | | | { em ec es ee ne en ee ee ee ee ee ee ee | | | I | | | | | | | | | | | | | | | | | | | | | | | | | | I | | | | | | | | | | 12MIL SPECS Ic] gooooieS 0003844 OU MIL-S-19500/297B 6.4 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect to the previous issue due to the extensiveness of the changes. CONCLUDING MATERIAL Custodians: Preparing activity: Army - ER Air Force - 17 Navy - EC Air Force - 17 Agent: NASA - NA DLA - ES Review activities: (Project 5961-1063) Army - AR, MI Navy - SH Air Force - 11, 85 DLA - ES User activities: Army - SM Navy - AS, CG, MC, OS Air Force - 19 13