IS61SF12832 IS61SF12836 ISSI (R) 128K x 32, 128K x 36 SYNCHRONOUS FLOW-THROUGH STATIC RAM FEATURES * Fast access times: 7.5 ns, 8 ns, 8.5 ns, 10 ns, and 12 ns * Internal self-timed write cycle * Individual Byte Write Control and Global Write * Clock controlled, registered address, data inputs and control signals * PentiumTM or linear burst sequence control using MODE input * Three chip enables for simple depth expansion and address pipelining * Common data inputs and data outputs * JEDEC 100-Pin TQFP and 119-pin PBGA package * Single +3.3V +10%, -5% power supply * Power-down snooze mode PRELIMINARY INFORMATION MARCH 2000 DESCRIPTION The ISSI IS61SF12832 and IS61SF12836 are high-speed synchronous static RAM designed to provide a burstable, high-performance memory for high speed networking and communication applications. It is organized as 131,072 words by 32 bits or 36 bits, fabricated with ISSI's advanced CMOS technology. The device integrates a 2-bit burst counter, high-speed SRAM core, and high-drive capability outputs into a single monolithic circuit. All synchronous inputs pass through registers controlled by a positive-edge-triggered single clock input. Write cycles are internally self-timed and are initiated by the rising edge of the clock input. Write cycles can be from one to four bytes wide as controlled by the write control inputs. Separate byte enables allow individual bytes to be written. BW1 controls DQa, BW2 controls DQb, BW3 controls DQc, BW4 controls DQd, conditioned by BWE being LOW. A LOW on GW input would cause all bytes to be written. Bursts can be initiated with either ADSP (Address Status Processor) or ADSC (Address Status Cache Controller) input pins. Subsequent burst addresses can be generated internally and controlled by the ADV (burst address advance) input pin. The mode pin is used to select the burst sequence order, Linear burst is achieved when this pin is tied LOW. Interleave burst is achieved when this pin is tied HIGH or left floating. FAST ACCESS TIME Symbol tKQ tKC Parameter Clock Access Time Cycle Time Frequency 7.5 7.5 8.5 117 8 8 10 100 8.5 8.5 11 90 10 10 15 66 12 12 15 66 Units ns ns MHz This document contains PRELIMINARY INFORMATION data. ISSI reserves the right to make changes to its products at any time without notice in order to improve design and supply the best possible product. We assume no responsibility for any errors which may appear in this publication. (c) Copyright 2000, Integrated Silicon Solution, Inc. Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION 04/12/00 Rev. 00B 1 IS61SF12832 IS61SF12836 ISSI (R) BLOCK DIAGRAM MODE Q0 CLK CLK A0' A0 BINARY COUNTER ADSC ADSP A16-A0 Q1 CE ADV A1' A1 128K x 32, 128K x 36 MEMORY ARRAY CLR 17 D Q 15 17 ADDRESS REGISTER CE CLK GW BWE BW4 D 32 or 36 32 or 36 Q DQd BYTE WRITE REGISTERS CLK BW3 D DQc Q BYTE WRITE REGISTERS CLK D BW2 Q DQb BYTE WRITE REGISTERS CLK BW1 D DQa Q BYTE WRITE REGISTERS CLK CE 4 Q CE2 D CE2 ENABLE REGISTER 32 or 36 INPUT REGISTERS CLK OE DQ[31:0] or DQ[35:0] CE CLK D Q ENABLE DELAY REGISTER CLK OE 2 Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION Rev. 00B 04/12/00 IS61SF12832 IS61SF12836 ISSI (R) PIN CONFIGURATION 100-Pin TQFP A6 A7 CE CE2 BW4 BW3 BW2 BW1 CE2 VCC GND CLK GW BWE OE ADSC ADSP ADV A8 A9 119-pin PBGA (Top View) 1 2 3 4 5 6 7 VCCQ A6 A4 ADSP A8 A16 VCCQ A B NC CE2 A3 ADSC A9 CE2 NC NC A7 A2 VCC A12 A15 NC DQc1 NC GND NC GND NC DQb8 DQc2 DQc3 GND CE GND DQb6 DQb7 VCCQ DQc4 GND OE GND DQb5 VCCQ DQc5 DQc6 BW3 ADV BW2 DQb4 DQb3 DQc7 DQc8 GND GW GND DQb2 DQb1 VCCQ VCC NC VCC NC VCC VCCQ DQd1 DQd2 GND CLK GND DQa7 DQa8 DQd4 DQd3 BW4 NC BW1 DQa5 DQa6 VCCQ DQd5 GND BWE GND DQa4 VCCQ DQd6 DQd7 GND A1 GND DQa3 DQa2 DQd8 NC GND A0 GND NC DQa1 NC A5 MODE VCC GND A13 NC NC NC A10 A11 A14 NC ZZ VCCQ NC NC NC NC NC VCCQ C D E F G H J K L M N P R T 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 1 79 2 78 3 77 4 76 5 75 6 74 7 73 8 72 9 71 10 70 11 69 12 68 13 67 14 66 15 65 16 64 17 63 18 62 19 61 20 60 21 59 22 58 23 57 24 56 25 55 26 54 27 53 28 52 29 51 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 NC DQb8 DQb7 VCCQ GND DQb6 DQb5 DQb4 DQb3 GND VCCQ DQb2 DQb1 GND NC VCC ZZ DQa8 DQa7 VCCQ GND DQa6 DQa5 DQa4 DQa3 GND VCCQ DQa2 DQa1 NC MODE A5 A4 A3 A2 A1 A0 NC NC GND VCC NC NC A10 A11 A12 A13 A14 A15 A16 U NC DQc1 DQc2 VCCQ GND DQc3 DQc4 DQc5 DQc6 GND VCCQ DQc7 DQc8 GND VCC NC GND DQd1 DQd2 VCCQ GND DQd3 DQd4 DQd5 DQd6 GND VCCQ DQd7 DQd8 NC 128K x 32 PIN DESCRIPTIONS A0, A1 Synchronous Address Inputs. These pins must tied to the two LSBs of the address bus. A2-A16 Synchronous Address Inputs CLK Synchronous Clock ADSP Synchronous Processor Address Status ADSC Synchronous Controller Address Status ADV Synchronous Burst Address Advance BW1-BW4 Individual Byte Write Enable BWE Synchronous Byte Write Enable Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION 04/12/00 Rev. 00B GW Synchronous Global Write Enable CE, CE2, CE2 Synchronous Chip Enable OE Output Enable DQa-DQd Synchronous Data Input/Output MODE Burst Sequence Mode Selection VCC +3.3V Power Supply GND Ground VCCQ Isolated Output Buffer Supply: +3.3V ZZ Snooze Enable 3 IS61SF12832 IS61SF12836 ISSI (R) PIN CONFIGURATION 100-Pin TQFP A6 A7 CE CE2 BW4 BW3 BW2 BW1 CE2 VCC GND CLK GW BWE OE ADSC ADSP ADV A8 A9 119-pin PBGA (Top View) 1 2 3 4 5 6 7 VCCQ A6 A4 ADSP A8 A16 VCCQ A B NC CE2 A3 ADSC A9 CE2 NC NC A7 A2 VCC A12 A15 NC DQc1 DQPc GND NC GND DQPb DQb8 DQc2 DQc3 GND CE GND DQb6 DQb7 VCCQ DQc4 GND OE GND DQb5 VCCQ DQc5 DQc6 BW3 ADV BW2 DQb4 DQb3 DQc7 DQc8 GND GW GND DQb2 DQb1 VCCQ VCC NC VCC NC VCC VCCQ DQd1 DQd2 GND CLK GND DQa7 DQa8 DQd4 DQd3 BW4 NC BW1 DQa5 DQa6 VCCQ DQd5 GND BWE GND DQa4 VCCQ DQd6 DQd7 GND A1 GND DQa3 DQa2 DQd8 DQPd GND A0 GND DQPa DQa1 NC A5 MODE VCC GND A13 NC NC NC A10 A11 A14 NC ZZ VCCQ NC NC NC NC NC VCCQ C D E F G H J K L M N P R T 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 1 79 2 78 3 77 4 76 5 75 6 74 7 73 8 72 9 71 10 70 11 69 12 68 13 67 14 66 15 65 16 64 17 63 18 62 19 61 20 60 21 59 22 58 23 57 24 56 25 55 26 54 27 53 28 52 29 51 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 DQPb DQb8 DQb7 VCCQ GND DQb6 DQb5 DQb4 DQb3 GND VCCQ DQb2 DQb1 GND NC VCC ZZ DQa8 DQa7 VCCQ GND DQa6 DQa5 DQa4 DQa3 GND VCCQ DQa2 DQa1 DQPa MODE A5 A4 A3 A2 A1 A0 NC NC GND VCC NC NC A10 A11 A12 A13 A14 A15 A16 U DQPc DQc1 DQc2 VCCQ GND DQc3 DQc4 DQc5 DQc6 GND VCCQ DQc7 DQc8 GND VCC NC GND DQd1 DQd2 VCCQ GND DQd3 DQd4 DQd5 DQd6 GND VCCQ DQd7 DQd8 DQPd 128K x 36 PIN DESCRIPTIONS A0, A1 4 Synchronous Address Inputs. These pins must tied to the two LSBs of the address bus. A2-A16 Synchronous Address Inputs CLK Synchronous Clock ADSP Synchronous Processor Address Status GW Synchronous Global Write Enable CE, CE2, CE2 Synchronous Chip Enable OE Output Enable DQa-DQd Synchronous Data Input/Output MODE Burst Sequence Mode Selection VCC +3.3V Power Supply GND Ground VCCQ Isolated Output Buffer Supply: +3.3V ADSC Synchronous Controller Address Status ADV Synchronous Burst Address Advance BW1-BW4 Individual Byte Write Enable ZZ Snooze Enable BWE Synchronous Byte Write Enable DQPa-DQPd Parity Data I/O Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION Rev. 00B 04/12/00 IS61SF12832 IS61SF12836 ISSI (R) TRUTH TABLE Operation Address Used CE Deselected, Power-down Deselected, Power-down Deselected, Power-down Deselected, Power-down Deselected, Power-down Read Cycle, Begin Burst Read Cycle, Begin Burst Write Cycle, Begin Burst Read Cycle, Continue Burst Read Cycle, Continue Burst Read Cycle, Continue Burst Read Cycle, Continue Burst Write Cycle, Continue Burst Write Cycle, Continue Burst Read Cycle, Suspend Burst Read Cycle, Suspend Burst Read Cycle, Suspend Burst Read Cycle, Suspend Burst Write Cycle, Suspend Burst Write Cycle, Suspend Burst None None None None None External External External Next Next Next Next Next Next Current Current Current Current Current Current CE2 CE2 ADSP ADSC ADV WRITE OE DQ H L L X X L L L X X H H X H X X H H X H X X L X L H H H X X X X X X X X X X X X X H X H X L L L X X X X X X X X X X X X X L L H H L H H H H X X H X H H X X H X L X X L L X L L H H H H H H H H H H H H X X X X X X X X L L L L L L H H H H H H X X X X X X Read Write Read Read Read Read Write Write Read Read Read Read Write Write X X X X X X X X L H L H X X L H L H X X High-Z High-Z High-Z High-Z High-Z Q Q D Q High-Z Q High-Z D D Q High-Z Q High-Z D D PARTIAL TRUTH TABLE Function Read Read Write Byte 1 Write All Bytes Write All Bytes GW BWE BW1 BW2 BW3 BW4 H H H H L H L L L X X H L L X X H H L X X H H L X X H H L X Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION 04/12/00 Rev. 00B 5 IS61SF12832 IS61SF12836 ISSI (R) INTERLEAVED BURST ADDRESS TABLE (MODE = VCC or No Connect) External Address A1 A0 1st Burst Address A1 A0 2nd Burst Address A1 A0 3rd Burst Address A1 A0 00 01 10 11 01 00 11 10 10 11 00 01 11 10 01 00 LINEAR BURST ADDRESS TABLE (MODE = GND) 0,0 A1', A0' = 1,1 0,1 1,0 ABSOLUTE MAXIMUM RATINGS(1) Symbol TBIAS TSTG PD IOUT VIN, VOUT VIN Parameter Temperature Under Bias Storage Temperature Power Dissipation Output Current (per I/O) Voltage Relative to GND for I/O Pins Voltage Relative to GND for for Address and Control Inputs VCC Voltage on Vcc Supply Relatiive to GND Value Unit -40 to +85 C -55 to +150 C 1.6 W 100 mA -0.5 to VCCQ + 0.3 V -0.5 to VCC + 0.5 V -0.5 to 4.6 V Notes: 1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. This device contains circuitry to protect the inputs against damage due to high static voltages or electric fields; however, precautions may be taken to avoid application of any voltage higher than maximum rated voltages to this high-impedance circuit. 3. This device contains circuitry that will ensure the output devices are in High-Z at power up. 6 Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION Rev. 00B 04/12/00 IS61SF12832 IS61SF12836 ISSI (R) OPERATING RANGE Range Commercial Ambient Temperature 0C to +70C VCC 3.3V +10%, -5% -40C to +85C 3.3V +10%, -5% Industrial DC ELECTRICAL CHARACTERISTICS(1) (Over Operating Range) Symbol Parameter Test Conditions Min. Max. Unit VOH Output HIGH Voltage IOH = -4.0 mA 2.4 -- V VOL Output LOW Voltage IOL = 8.0 mA -- 0.4 V VIH Input HIGH Voltage 2.0 VCC + 0.3 V VIL Input LOW Voltage -0.3 0.8 V ILI Input Leakage Current GND VIN VCCQ(2) Com. Ind. -2 -5 2 5 A ILO Output Leakage Current GND VOUT VCCQ, OE = VIH Com. Ind. -2 -5 2 5 A POWER SUPPLY CHARACTERISTICS (Over Operating Range) Symbol Parameter Test Conditions 7.5 Max. 8 Max. 8.5 Max. 10 Max. 12 Max. Unit ICC AC Operating Supply Current Device Selected, All Inputs = VIL or VIH OE = VIH, Vcc = Max. Cycle Time tKC min. Com. Ind. 270 -- 250 260 230 240 190 200 170 180 mA ISB Standby Current Device Deselected, Com. VCC = Max., Ind. All Inputs = VIH or VIL CLK Cycle Time tKC min. 50 -- 50 60 50 60 50 60 50 60 mA IZZ Power-down Mode Current ZZ = VCCQ Com. Clock Running Ind. All Inputs GND + 0.2V or Vcc - 0.2V 10 -- 10 15 10 15 10 15 10 15 mA Notes: 1. The MODE pin has an internal pullup. This pin may be a No Connect, tied to GND, or tied to VCC. 2. The MODE pin should be tied to Vcc or GND. It exhibits 10 A maximum leakage current when tied to GND + 0.2V or Vcc - 0.2V. Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION 04/12/00 Rev. 00B 7 IS61SF12832 IS61SF12836 ISSI (R) CAPACITANCE(1,2) Symbol Parameter CIN Input Capacitance COUT Input/Output Capacitance Conditions Max. Unit VIN = 0V 6 pF VOUT = 0V 8 pF Notes: 1. Tested initially and after any design or process changes that may affect these parameters. 2. Test conditions: TA = 25C, f = 1 MHz, Vcc = 3.3V. AC TEST CONDITIONS Parameter Input Pulse Level Input Rise and Fall Times Input and Output Timing and Reference Level Output Load Unit 0V to 3.0V 1.5 ns 1.5V See Figures 1 and 2 AC TEST LOADS 317 3.3V ZO = 50 OUTPUT Output Buffer 30 pF 50 1.5V Figure 1 8 5 pF Including jig and scope 351 Figure 2 Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION Rev. 00B 04/12/00 IS61SF12832 IS61SF12836 ISSI (R) READ/WRITE CYCLE SWITCHING CHARACTERISTICS (Over Operating Range) 7.5 8.5 Min. Max. 10 Min. Max. 12 Min. Max. Parameter fMAX(3) Clock Frequency -- 117 -- 100 -- 90 -- 66 -- 66 MHz tKC Cycle Time 8.5 -- 10 -- 11 -- 15 -- 15 -- ns tKH Clock High Time 3 -- 4 -- 4.5 -- 4.5 -- 4.5 -- ns tKL(3) Clock Low Time 3 -- 4 -- 4.5 -- 4.5 -- 4.5 -- ns Clock Access Time -- 7.5 -- 8 -- 8.5 -- 10 -- 12 ns Clock High to Output Invalid 2 -- 2 -- 2 -- 2 -- 2 -- ns tKQLZ Clock High to Output Low-Z 0 -- 0 -- 0 -- 0 -- 0 -- ns tKQHZ(1,2) Clock High to Output High-Z 2 3.5 2 3.5 2 3.5 2 3.5 2 3.5 ns (3) (3) tKQ (1) tKQX (1,2) (3) tOEQ Min. Max. 8 Min. Max. Symbol Unit Output Enable to Output Valid -- 3.5 -- 3.5 -- 3.5 -- 3.5 -- 5 ns (1,2) Output Enable to Output Low-Z 0 -- 0 -- 0 -- 0 -- 0 -- ns (1,2) tOEHZ Output Disable to Output High-Z -- 3.5 -- 3.5 -- 3.5 -- 3.5 -- 3.5 ns tAS(3) Address Setup Time 2 -- 2 -- 2 -- 2 -- 4 -- ns tSS(3) Address Status Setup Time 2 -- 2 -- 2 -- 2 -- 4 -- ns Write Setup Time 2 -- 2 -- 2 -- 2 -- 4 -- ns tCES Chip Enable Setup Time 2 -- 2 -- 2 -- 2 -- 4 -- ns tAVS(3) Address Advance Setup Time 2 -- 2 -- 2 -- 2 -- 4 -- ns tOELZ (3) tWS (3) (3) Address Hold Time 0.5 -- 0.5 -- 0.5 -- 0.5 -- 1.5 -- ns (3) Address Status Hold Time 0.5 -- 0.5 -- 0.5 -- 0.5 -- 1.5 -- ns Write Hold Time 0.5 -- 0.5 -- 0.5 -- 0.5 -- 1.5 -- ns Chip Enable Hold Time 0.5 -- 0.5 -- 0.5 -- 0.5 -- 1.5 -- ns Address Advance Hold Time 0.5 -- 0.5 -- 0.5 -- 0.5 -- 1.5 -- ns tAH tSH (3) tWH tCEH(3) (3) tAVH Notes: 1. Guaranteed but not 100% tested. This parameter is periodically sampled. 2. Tested with load in Figure 2. 3. Tested with load in Figure 1. Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION 04/12/00 Rev. 00B 9 IS61SF12832 IS61SF12836 ISSI (R) READ/WRITE CYCLE TIMING tKC CLK tSS tSH tKH tKL ADSP is blocked by CE inactive ADSP tSS tSH ADSC ADV tAS A16-A0 tAH RD1 WR1 tWS tWH tWS tWH RD2 RD3 GW BWE tWS tWH WR1 BW4-BW1 tCES tCEH tCES tCEH tCES tCEH CE Masks ADSP CE CE2 and CE2 only sampled with ADSP or ADSC CE2 Unselected with CE2 CE2 tOEHZ OE tKQX tOEQX DATAOUT High-Z 2c 2d tKQHZ tKQHZ 1a High-Z tDS Single Read Flow-through 10 2b tKQX tKQ DATAIN 2a 1a tKQLZ tDH Single Write Burst Read Unselected Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION Rev. 00B 04/12/00 IS61SF12832 IS61SF12836 ISSI (R) WRITE CYCLE SWITCHING CHARACTERISTICS (Over Operating Range) Symbol Parameter 7.5 Min. Max. 8 Min. Max. 8.5 Min. Max. 10 Min. Max. 12 Min. Max. (1) tKC Cycle Time 8.5 -- 10 -- 11 -- 15 -- 15 -- ns tKH(1) Clock High Time 3 -- 4 -- 4.5 -- 4.5 -- 4.5 -- ns tKL(1) Unit Clock Low Time 3 -- 4 -- 4.5 -- 4.5 -- 4.5 -- ns (1) Address Setup Time 2 -- 2 -- 2 -- 2 -- 4 -- ns (1) Address Status Setup Time 2 -- 2 -- 2 -- 2 -- 4 -- ns Write Setup Time 2 -- 2 -- 2 -- 2 -- 4 -- ns tAS tSS tWS(1) (1) tDS Data In Setup Time 2 -- 2 -- 2 -- 2 -- 4 -- ns (1) Chip Enable Setup Time 2 -- 2 -- 2 -- 2 -- 4 -- ns (1) tAVS Address Advance Setup Time 2 -- 2 -- 2 -- 2 -- 4 -- ns tAH(1) tCES Address Hold Time 0.5 -- 0.5 -- 0.5 -- 0.5 -- 1.5 -- ns (1) Address Status Hold Time 0.5 -- 0.5 -- 0.5 -- 0.5 -- 1.5 -- ns (1) Data In Hold Time 0.5 -- 0.5 -- 0.5 -- 0.5 -- 1.5 -- ns (1) tWH Write Hold Time 0.5 -- 0.5 -- 0.5 -- 0.5 -- 1.5 -- ns tCEH(1) Chip Enable Hold Time 0.5 -- 0.5 -- 0.5 -- 0.5 -- 1.5 -- ns tAVH(1) Address Advance Hold Time 0.5 -- 0.5 -- 0.5 -- 0.5 -- 1.5 -- ns tSH tDH Notes: 1. Tested with load in Figure 1. Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION 04/12/00 Rev. 00B 11 IS61SF12832 IS61SF12836 ISSI (R) WRITE CYCLE TIMING tKC CLK tSS tSH tKH tKL ADSP is blocked by CE1 inactive ADSP ADSC initiate Write ADSC ADV must be inactive for ADSP Write tAVS tAVH ADV tAS A16-A0 tAH WR1 WR3 WR2 tWS tWH tWS tWH tWS tWH GW BWE BW4-BW1 WR1 tCES tCEH tCES tCEH tCES tCEH tWS tWH WR2 WR3 CE1 Masks ADSP CE Unselected with CE2 CE2 and CE3 only sampled with ADSP or ADSC CE2 CE2 OE DATAOUT High-Z tDS DATAIN High-Z Single Write 12 tDH 1a BW4-BW1 only are applied to first cycle of WR2 2a 2b 2c 2d Burst Write 3a Write Unselected Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION Rev. 00B 04/12/00 IS61SF12832 IS61SF12836 ISSI (R) SNOOZE AND RECOVERY CYCLE SWITCHING CHARACTERISTICS (Over Operating Range) 7.5 8 Min. Max. 8.5 Min. Max. 10 Min. Max. 12 Min. Max. Symbol Parameter Min. Max. (3) tKC Cycle Time 8.5 -- 10 -- 11 -- 15 -- 15 -- ns tKH(3) Clock High Time 3 -- 4 -- 4.5 -- 4.5 -- 4.5 -- ns tKL(3) Clock Low Time 3 -- 4 -- 4.5 -- 4.5 -- 4.5 -- ns Clock Access Time -- 7.5 -- 8 -- 8.5 -- 10 -- 12 ns Clock High to Output Invalid 2 -- 2 -- 2 -- 2 -- 2 -- ns Clock High to Output Low-Z 0 -- 0 -- 0 -- 0 -- 0 -- ns Clock High to Output High-Z 2 3.5 2 3.5 2 3.5 2 3.5 2 3.5 ns Output Enable to Output Valid -- 3.5 -- 3.5 -- 3.5 -- 3.5 -- 5 ns tOELZ Output Enable to Output Low-Z 0 -- 0 -- 0 -- 0 -- 0 -- ns tOEHZ(1,2) (3) tKQ (1) tKQX tKQLZ(1,2) (1,2) tKQHZ (3) tOEQ (1,2) Unit Output Disable to Output High-Z -- 3.5 -- 3.5 -- 3.5 -- 3.5 -- 3.5 ns (3) Address Setup Time 2 -- 2 -- 2 -- 2 -- 4 -- ns (3) Address Status Setup Time 2 -- 2 -- 2 -- 2 -- 4 -- ns tCES Chip Enable Setup Time 2 -- 2 -- 2 -- 2 -- 4 -- ns tAH(3) Address Hold Time 0.5 -- 0.5 -- 0.5 -- 0.5 -- 1.5 -- ns tSH(3) Address Status Hold Time 0.5 -- 0.5 -- 0.5 -- 0.5 -- 1.5 -- ns tCEH Chip Enable Hold Time 0.5 -- 0.5 -- 0.5 -- 0.5 -- 1.5 -- ns tZZS ZZ Standby 2 -- 2 -- 2 -- 2 -- 2 -- cyc tZZREC ZZ Recovery 2 -- 2 -- 2 -- 2 -- 2 -- cyc tAS tSS (3) (3) Notes: 1. Guaranteed but not 100% tested. This parameter is periodically sampled. 2. Tested with load in Figure 2. 3. Tested with load in Figure 1. Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION 04/12/00 Rev. 00B 13 IS61SF12832 IS61SF12836 ISSI (R) SNOOZE AND RECOVERY CYCLE TIMING tKC CLK tSS tSH tAS tAH tKH tKL ADSP ADSC ADV A16-A0 RD2 RD1 GW BWE BW4-BW1 tCES tCEH tCES tCEH tCES tCEH CE CE2 CE2 tOEHZ tOEQ OE tOEQX tOELZ DATAOUT High-Z 1a tKQLZ tKQ DATAIN tKQX tKQHZ High-Z tZZS tZZREC ZZ Single Read 14 Snooze with Data Retention Read Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION Rev. 00B 04/12/00 IS61SF12832 IS61SF12836 ISSI (R) ORDERING INFORMATION Commercial Range: 0C to +70C Frequency Order Part Number Package 7.5 IS61SF12832-7.5TQ IS61SF12832-7.5B TQFP PBGA IS61SF12832-8TQ IS61SF12832-8B TQFP PBGA 8.5 IS61SF12832-8.5TQ IS61SF12832-8.5B TQFP PBGA 10 IS61SF12832-10TQ IS61SF12832-10B TQFP PBGA 12 IS61SF12832-12TQ IS61SF12832-12B TQFP PBGA 8 Industrial Range: -40C to +85C Frequency Order Part Number Package 8 IS61SF12832-8TQI TQFP 8.5 IS61SF12832-8.5TQI TQFP 10 IS61SF12832-10TQI TQFP 12 IS61SF12832-12TQI TQFP Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION 04/12/00 Rev. 00B 15 IS61SF12832 IS61SF12836 ISSI (R) ORDERING INFORMATION Commercial Range: 0C to +70C Frequency Order Part Number Package 7.5 IS61SF12836-7.5TQ IS61SF12836-7.5B TQFP PBGA IS61SF12836-8TQ IS61SF12836-8B TQFP PBGA 8.5 IS61SF12836-8.5TQ IS61SF12836-8.5B TQFP PBGA 10 IS61SF12836-10TQ IS61SF12836-10B TQFP PBGA 12 IS61SF12836-12TQ IS61SF12836-12B TQFP PBGA 8 Industrial Range: -40C to +85C Frequency Order Part Number Package 8 IS61SF12836-8TQI TQFP 8.5 IS61SF12836-8.5TQI TQFP 10 IS61SF12836-10TQI TQFP 12 IS61SF12836-12TQI TQFP ISSI (R) Integrated Silicon Solution, Inc. 2231 Lawson Lane Santa Clara, CA 95054 Tel: 1-800-379-4774 Fax: (408) 588-0806 E-mail: sales@issi.com www.issi.com 16 Integrated Silicon Solution, Inc. -- 1-800-379-4774 PRELIMINARY INFORMATION Rev. 00B 04/12/00