REVISIONS
LTR DESCRIPTION DATE (YR-MO-DA) APPROVED
A
Table I; for power supply rejection ratio test, change limit from
“0.01 %/V minimum” to “0.01 %/V maximum”.
Changes in accordance with N.O.R. 5962-R011-94.
93-10-18 M. A. FRYE
B Drawing updated to reflect current requirements. Redrawn. - ro 02-01-08 R. MONNIN
C
Make changes to 1.2.4, 1.4, and Table IIA. Add junction temperature and
power dissipation limits under 1.3. Add Table IIB. Under paragraphs 4.2.1 and
4.4.2.1, delete test condition B and substitute test condition D.
Add subgroups 4, 5, 6, 10, and 11 to Table I and Table IIA. - ro
11-02-28 C SAFFLE
REV
SHEET
REV
SHEET
REV STATUS REV C C C C C C C C C C C
OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11
PMIC N/A PREPARED BY
DAN WONNELL
DLA LAND AND MARITIME
COLUMBUS, OHIO 4321 8-3990
http://www.dscc.dla.mil
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
CHECKED BY
SANDRA ROONEY
APPROVED BY
MICHAEL A. FRYE
MICROCIRCUIT, LINEAR, CONVERTER,
VOLTAGE-TO-FREQUENCY, FREQUENCY-TO-
VOLTAGE, MONOLITHIC SILICON
DRAWING APPROVAL DATE
93-10-01
AMSC N/A
REVISION LEVEL
C
SIZE
A
CAGE CODE
67268
5962-93222
SHEET 1 OF 11
DSCC FORM 2233
APR 97 5962-E235-10
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-93222
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
C
SHEET
2
DSCC FORM 2234
APR 97
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and
M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part
or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.2 PIN. The PIN is as shown in the following example:
5962 - 93222 01 V E A
Federal
stock class
designator
RHA
designator
(see 1.2.1)
Device
type
(see 1.2.2)
Device
class
designator
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
\ / (see 1.2.3)
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A
specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type Generic number Circuit function
01 AD652 V/F and F/V converter
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as
follows:
Device class Device requirements documentation
M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-
JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A
Q or V Certification and qualification to MIL-PRF-38535
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Package style
E GDIP1-T16 16 Dual-in-line
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,
appendix A for device class M.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-93222
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
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1.3 Absolute maximum ratings. 1/
Supply voltage (+VS to -VS) ...................................................................................... 36 V dc
Open collector output voltage (above digital ground) ................................................ 36 V dc
Open collector output current .................................................................................... 50 mA
Lead temperature (soldering 10 seconds) ................................................................. 300C
Maximum junction temperature (TJ) .......................................................................... +160C
Power dissipation (PD) ............................................................................................. 540 mW
Storage temperature range ....................................................................................... -65C to +150C
Thermal resistance junction-to-case (ΘJC) ................................................................ 25C/W
Thermal resistance junction-to ambient (ΘJA) ........................................................... 100C/W 2/
1.4 Recommended operating conditions.
Supply voltage (±VS) ................................................................................................. ±6 V to ±15 V
Ambient operating temperature range ....................................................................... -55C to +125C
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
______
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ Measurement taken under absolute worst case condition of still air while mounted above the printed circuit board (PCB) to
minimize PCB mounting heat sink effects.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-93222
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
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APR 97
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of
supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of
MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of
product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime’s agent,
and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore
documentation shall be made available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 57 (see MIL-PRF-38535, appendix A).
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-93222
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
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TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/
-55C TA +125C
±VS = 15 V
Group A
subgroups
Device
type
Limits
Unit
unless otherwise specified Min Max
Linearity error 2/ 3/ LE
fCLOCK = 1 MHZ,
VIN = .01 V; 1.0 V to 9.4 V
in 1.05 V steps
1,2,3 01 0.02
% of
FS
fCLOCK = 4 MHZ,
VIN = .01 V; 1.0 V to 9.4 V
in 1.05 V steps
0.05
Gain error 2/ AE
fCLOCK = 1 MHZ,
VIN = .01 V, 9.4 V
1 01 1
% of
FS
fCLOCK = 4 MHZ,
VIN = .01 V, 9.4 V
1.5
Gain temperature
coefficient TCA fCLOCK = 1 MHZ,
VIN = .01 V, 9.4 V
2,3 01
50 ppm/C
fCLOCK = 4 MHZ,
VIN = .01 V, 9.4 V
75
Power supply rejection 3/
ratio PSRR 12 V VS 18 V,
fCLOCK = 4 MHZ
1
01
0.01
%/V
2,3 0.04
Input offset voltage 4/
(transfer function, RTI) VIO VIN = 0.1 V, 9.4 V,
fCLOCK = 1 MHz, 4 MHZ
1 01
3 mV
Input offset voltage (RTI)
temperature coefficient TCVIO f
CLOCK = 1 MHZ 2,3 01
50 V/C
Input resistor RIN 1 01 19.8 20.2
k
Input resistor temperature TCRIN 2,3 01
100 ppm/C
Op amp input bias 3/
current
IIB V
IN = 0 V, inverting input 1 01
20 nA
2,3
40
VIN = 0 V,
noninverting input 1,2,3 50
Op amp input offset 3/
current IOS V
IN = 0 V 1,2,3 01 70 nA
Op amp input offset 3/
voltage VOS V
IN = 0 V 1,2,3 01 3 mV
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-93222
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
C
SHEET
6
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics – Continued.
Test
Symbol
Conditions 1/
-55C TA +125C
±VS = 15 V
Group A
subgroups
Device
type
Limits
Unit
unless otherwise specified Min Max
Op amp output voltage 3/
range VR VS = 15 V, op amp
railed high
1,2 01 11
V
3 10.3
VS = 15 V, op amp
railed low
1,3 -1
2 -0.6
Max clock frequency 3/ fCLOCK V
IN = 0.01 V, 9.4 V 4,5,6 01 4 MHz
Clock threshold voltage VCT Referred to DIGITAL GND
pin 1,2,3 01 0.8 2.0 V
Clock input current 3/ IC CLOCK IN pin = 0 V 1,2,3 01 20 A
Low level output 3/
voltage 1 VOL1 I
OUT = 15 mA 1,2,3 01 0.8 V
IOUT = 10 mA 0.4
Low level output voltage 2 VOL2 I
OUT = 8 mA 1,2,3 0.4
Leakage current 3/ IL V
OUT = 36 V 1,2,3 01 10
A
Reference voltage VREF I
REF = 0 mA 1 01 4.95 5.05 V
Reference voltage
temperature coefficient TCVREF I
REF = 0 mA 2,3 01
100 ppm/C
Quiescent current 3/ ISS V
S = 15 V, VIN = 0.1 V 1,2,3 01
15 mA
Delay time positive clock 3/
edge to output pulse tD fCLOCK = 200 kHz,
COS pin to +VS pin
9 01 150 250
ns
10,11 150 350
Output pulse width 3/ tPW C
OS = 300 pF 9,10,11 01 1 2
s
1/ 0.1 F decoupling capacitors from +VS to ground and –VS to ground.
2/ Nonlinearity is defined as the deviation from a straight line from zero to full scale, expressed as a fraction of full scale.
3/ Additional test parameters applicable to final electrical and group A subgroups 2, 3, 5, 6, 10, and 11 for device class V
only.
4/ Offset is guaranteed adjustable to zero using a 10 k potentiometer on both TRIM pins with the wiper connected
to +VS through a 250 k resistor.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-93222
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
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SHEET
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Device type 01
Case outline E
Terminal
number Terminal symbol
1 +VS
2 TRIM
3 TRIM
4 OP AMP OUT
5 OP AMP -IN
6 OP AMP +IN
7 10 V IN
8 -VS
9 COS
10 CLOCK IN
11 FREQ OUT
12 DIGITAL GND
13 ANALOG GND
14 COMP -IN
15 COMP +IN
16 COMP REF
FIGURE 1. Terminal connections.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-93222
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
C
SHEET
8
DSCC FORM 2234
APR 97
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control
and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1015 of MIL-STD-883.
(2) TA = +125C, minimum.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
4.2.2 Additional criteria for device classes Q and V.
a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for
device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed
for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a. Tests shall be as specified in table IIA herein.
b. Subgroups 7 and 8, in table I, method 5005 of MIL-STD-883 shall be omitted.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-93222
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
C
SHEET
9
DSCC FORM 2234
APR 97
TABLE IIA. Electrical test requirements.
Test requirements Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device
class M
Device
class Q
Device
class V
Interim electrical
parameters (see 4.2)
1 1 1
Final electrical
parameters (see 4.2)
1,2,3,4,9 1/ 1,2,3,4,9 1/ 2/ 1,2,3, 1/ 2/ 3/
4,5,6,9,10,11
Group A test
requirements (see 4.4)
1,2,3,4,9 1,2,3,4,9 2/ 1,2,3, 2/
4,5,6,9,10,11
Group C end-point electrical
parameters (see 4.4)
1 1 1,2,3, 3/
4,5,6,9,10,11
Group D end-point electrical
parameters (see 4.4)
1 1 1,2,3,4,5,6,
9,10,11
Group E end-point electrical
parameters (see 4.4)
--- --- ---
1/ PDA applies to subgroup 1.
2/ See table I for specific subgroups 2, 3, 5, 6, 10, and 11 parameters applicable only to device class V.
3/ Delta limits as specified in table IIB shall be required where specified, and the delta limits
shall be computed with reference to the zero hour electrical parameters (see table I).
TABLE IIB. Burn-in and operating life test delta parameters. TA = +25C. 1/ 2/
Parameters Symbol Condition Delta limits
Quiescent current ISS V
S = 15 V, VIN = 0.1 V 1.7 mA
Op amp input offset voltage VOS V
IN = 0 V 0.5 mV
Gain error AE fCLOCK = 4 MHz,
VIN = 0.01 V, 9.4 V 0.25% FSR
Clock input current IC CLOCK IN pin = 0 V 2.5 A
Leakage current IL VOUT = 36 V 1 A
1
/ Deltas are performed at room temperature.
2
/ 240 hour burn-in and 1,000 hour operating group C life test.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-93222
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
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SHEET
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APR 97
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a. Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control and
shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
b. TA = +125C, minimum.
c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein).
a. End-point electrical parameters shall be as specified in table IIA herein.
b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested.
All device classes must meet the postirradiation end-point electrical parameter limits as defined in table I at
T
A = +25C 5C, after exposure, to the subgroups specified in table IIA herein.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
Q and V or MIL-PRF-38535, appendix A for device class M.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor
prepared specification or drawing.
6.1.2 Substitutability. Device class Q devices will replace device class M devices.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires
configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and
this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic
devices (FSC 5962) should contact DLA Land and Maritime -VA, telephone (614) 692-0547.
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
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DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
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6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime -VA, Columbus, Ohio 43218-3990,
or telephone (614) 692-0540.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-HDBK-1331.
6.6 Sources of supply.
6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.
The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DLA Land and Maritime -VA and
have agreed to this drawing.
6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.
The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been
submitted to and accepted by DLA Land and Maritime -VA.
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 11-02-28
Approved sources of supply for SMD 5962-93222 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information
bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime
maintains an online database of all current sources of supply at http://www.dscc.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-9322201MEA 24355 (2) AD652SQ/883B
5962-9322201VEA 24355 (4) AD652SQ/QMLV
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item acquisition.
Items acquired to this number may not satisfy the
performance requirements of this drawing.
Vendor CAGE Vendor name
number and address
24355 (2) Analog Devices
Route 1 Industrial Park
P.O. Box 9106
Norwood, MA 02062
Point of contact: 804 Woburn Street
Wilmington, MA 01887-3462
24355 (4) Analog Devices
Route 1 Industrial Park
P.O. Box 9106
Norwood, MA 02062
Point of contact: 7910 Triad Center Drive
Greensboro, NC 27409-9605
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
