ICS841S104I-02 Data Sheet CRYSTAL-TO-HCSL 156.25MHZ or 155.52MHz CLOCK SYNTHESIZER
ICS841S104BGI-02 REVISION A JUNE 18, 2010 7 ©2010 Integrated Device Technology, Inc.
AC Electrical Characteristics
Table 7. AC Characteristics, VDD = 3.3V ± 5%, TA = -40°C to 85°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE: Characterized using 19.44MHz and 25MHz crystals.
NOTE 1: Refer to phase jitter plot.
NOTE 2: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at the differential cross
points.
NOTE 4: Measurement taken from differential waveform.
NOTE 5: TSTABLE is the time the differential clock must maintain a minimum ± 150mV differential voltage after rising/falling edges before it is
allowed to drop back into the VRB ±100mV differential range.
NOTE 6: Measurement taken from single-ended waveform.
NOTE 7: Defined as the maximum instantaneous voltage including overshoot. See Parameter Measurement Information Section.
NOTE 8: Defined as the minimum instantaneous voltage including undershoot. See Parameter Measurement Information Section.
NOTE 9: Measured at crossing point where the instantaneous voltage value of the rising edge of SRCT equals the falling edge of SRCC.
NOTE 10: Refers to the total variation from the lowest crossing point to the highest, regardless of which edge is crossing. Refers to all crossing
points for this measurement.
NOTE 11: Defined as the total variation of all crossing voltages of rising SRCT and falling SRCC, This is the maximum allowed variance in
Vcross for any particular system.
NOTE 12: Measured from -150mV to +150mV on the differential waveform (SRCT minus SRCC). The signal must be monotonic through the
measurement region for rise and fall time. The 300mV measurement window is centered on the differential zero crossing.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
fMAX Output Frequency Using 25MHz Crystal 156.25 MHz
Using 19.44MHz Crystal 155.52 MHz
tjit(Ø) Phase Jitter, RMS (Random);
NOTE 1
19.44MHz crystal, ƒ = 155.52MHz,
Integration Range: 12kHz – 20MHz 0.849 ps
25MHz crystal, ƒ = 156.25MHz,
Integration Range: 12kHz – 20MHz 0.691 ps
tsk(o) Output Skew; NOTE 2, 3 30 ps
tjit(cc) Cycle-to-Cycle Jitter; NOTE 2 PLL Mode 25 ps
tLPLL Lock Time 100 ms
VRB
Ring-back Voltage Margin;
NOTE 4, 5 -100 100 mV
VMAX Voltage High; NOTE 6, 7 1150 mV
VMIN Voltage Low; NOTE 6, 8 -300 mV
VCROSS
Absolute Crossing Voltage;
NOTE 6, 9, 10 250 550 mV
∆VCROSS
Total Variation of VCROSS over
all edges; NOTE 6, 9, 11 150 mV
Rise/Fall Edge Rate;
NOTE 6, 12
Measured between
150mV to +150mV 0.6 4.0 V/ns
odc Output Duty Cycle 48 52 %