19
X7R Dielectric
General Specications
X7R formulations are called “temperature stable” ceramics and
fall into EIA Class II materials. X7R is the most popular of these
intermediate dielectric constant materials. Its temperature
variation of capacitance is within ±15% from -55°C to +125°C.
This capacitance change is non-linear.
Capacitance for X7R varies under the inuence of electrical
operating con-ditions such as voltage and frequency.
X7R dielectric chip usage covers the broad spectrum of
industrial applications where known changes in capacitance
due to applied voltages are acceptable.
PART NUMBER (see page 2 for complete part number explanation)
0805 5 C 10 3 M
NOTE: Contact factory for availability of Termination and Tolerance Options for Specic Part Numbers.
Contact factory for non-specied capacitance values.
042718
A T 2 A
Size
(L” x W)
Voltage
4V = 4
6.3V = 6
10V = Z
16V = Y
25V = 3
50V = 5
100V = 1
200V = 2
500V = 7
Dielectric
X7R = C
Capacitance
Code (In pF)
2 Sig. Digits +
Number of Zeros
Capacitance
Tolerance
J = ± 5%*
K = ±10%
M = ± 20%
*≤1µF only,
contact factory for
additional values
Terminations
T = Plated Ni and Sn
7 = Gold Plated*
Z= FLEXITERM®**
*Optional termination
**See FLEXITERM®
X7R section
Failure
Rate
A = Not
Applicable
Packaging
2 = 7” Reel
4 = 13” Reel
Contact
Factory For
Multiples
Special
Code
A = Std.
Product
19
20
X7R Dielectric
Specications and Test Methods
042718
20
Parameter/Test X7R Specication Limits Measuring Conditions
Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber
Capacitance Within specied tolerance Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
For Cap > 10µF, 05Vrm @ 120Hz
Dissipation Factor
≤ 10% for ≥ 50V DC rating≤ 12.5% for 25V DC rating
≤ 12.5% for 25V and 16V DC rating
≤ 12.5% for ≤ 10V DC rating
Insulation Resistance 100,000MΩ or 1000MΩ - µF,
whichever is less
Charge device with rated voltage for
120 ± 5 secs @ room temp/humidity
Dielectric Strength No breakdown or visual defects
Charge device with 250% of rated voltage for
1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated
voltage for 500V devices.
Resistance to
Flexure
Stresses
Appearance No defects Deection: 2mm
Test Time: 30 seconds
Capacitance
Variation
≤ ±12%
Dissipation
Factor
Meets Initial Values (As Above)
Insulation
Resistance
≥ Initial Value x 0.3
Solderability ≥ 95% of each terminal should be covered
with fresh solder
Dip device in eutectic solder at 230 ± 5ºC
for 5.0 ± 0.5 seconds
Resistance to
Solder Heat
Appearance No defects, <25% leaching of either end terminal
Dip device in eutectic solder at 260ºC for 60seconds.
Store at room temperature for 24 ± 2hours before
measuring electrical properties.
Capacitance
Variation
≤ ±7.5%
Dissipation
Factor
Meets Initial Values (As Above)
Insulation
Resistance
Meets Initial Values (As Above)
Dielectric
Strength
Meets Initial Values (As Above)
Thermal
Shock
Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes
Capacitance
Variation
≤ ±7.5% Step 2: Room Temp ≤ 3 minutes
Dissipation
Factor
Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes
Insulation
Resistance
Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes
Dielectric
Strength
Meets Initial Values (As Above) Repeat for 5 cycles and measure after
24 ± 2 hours at room temperature
Load Life
Appearance No visual defects Charge device with 1.5 rated voltage (≤ 10V) in
test chamber set at 125ºC ± 2ºC for 1000 hours
(+48, -0)
If RV > 10V then Life Test voltage will be 2xRV
but there are exceptions (please contact AVX for
further details on exceptions)
Remove from test chamber and stabilize at room
temperature for 24 ± 2 hours before measuring.
Capacitance
Variation
≤ ±12.5%
Dissipation
Factor
≤ Initial Value x 2.0 (See Above)
Insulation
Resistance
≥ Initial Value x 0.3 (See Above)
Dielectric
Strength
Meets Initial Values (As Above)
Load
Humidity
Appearance No visual defects Store in a test chamber set at 85ºC ± 2ºC/
85% ± 5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at room
temperature and humidity for
24 ± 2 hours before measuring.
Capacitance
Variation
≤ ±12.5%
Dissipation
Factor
≤ Initial Value x 2.0 (See Above)
Insulation
Resistance
≥ Initial Value x 0.3 (See Above)
Dielectric
Strength
Meets Initial Values (As Above)
100917 5
C0G (NP0) Dielectric
Specifications and Test Methods
Parameter/Test NP0 Specification Limits Measuring Conditions
Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber
Capacitance Within specified tolerance Freq.: 1.0 MHz ± 10% for cap 1000 pF
Q<30 pF: Q≥ 400+20 x Cap Value 1.0 kHz ± 10% for cap > 1000 pF
≥30 pF: Q≥ 1000 Voltage: 1.0Vrms ± .2V
Insulation Resistance 100,000MΩ or 1000MΩ - µF, Charge device with rated voltage for
whichever is less 60 ± 5 secs @ room temp/humidity
Charge device with 250% of rated voltage for
Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated
voltage for 500V devices.
Appearance No defects Deflection: 2mm
Capacitance Test Time: 30 seconds
Resistance to Variation ±5% or ±.5 pF, whichever is greater
Flexure Q Meets Initial Values (As Above)
Stresses
Insulation Initial Value x 0.3
Resistance
Solderability 95% of each terminal should be covered Dip device in eutectic solder at 230 ± 5ºC
with fresh solder for 5.0 ± 0.5 seconds
Appearance No defects, <25% leaching of either end terminal
Capacitance
Variation ±2.5% or ±.25 pF, whichever is greater
Dip device in eutectic solder at 260ºC for 60
Q Meets Initial Values (As Above) seconds. Store at room temperature for 24 ± 2
Resistance to
hours before measuring electrical properties.
Solder Heat Insulation Meets Initial Values (As Above)
Resistance
Dielectric Meets Initial Values (As Above)
Strength
Appearance No visual defects Step 1: -55ºC ± 30 ± 3 minutes
Capacitance
Variation ±2.5% or ±.25 pF, whichever is greater Step 2: Room Temp 3 minutes
Q Meets Initial Values (As Above) Step 3: +125ºC ± 30 ± 3 minutes
Thermal
Shock Insulation Meets Initial Values (As Above) Step 4: Room Temp 3 minutes
Resistance
Dielectric Meets Initial Values (As Above) Repeat for 5 cycles and measure after
Strength 24 hours at room temperature
Appearance No visual defects
Capacitance
Variation ±3.0% or ± .3 pF, whichever is greater Charge device with twice rated voltage in
30 pF: Q≥ 350 test chamber set at 125ºC ± 2ºC
Load Life Q≥10 pF, <30 pF: Q≥ 275 +5C/2 for 1000 hours (+48, -0).
(C=Nominal Cap) <10 pF: Q≥ 200 +10C
Insulation Initial Value x 0.3 (See Above) Remove from test chamber and stabilize at
Resistance room temperature for 24 hours
Dielectric Meets Initial Values (As Above) before measuring.
Strength
Appearance No visual defects
Capacitance
Variation ±5.0% or ± .5 pF, whichever is greater Store in a test chamber set at 85ºC ± 2ºC/
30 pF: Q 350 85% ± 5% relative humidity for 1000 hours
Load Q ≥10 pF, <30 pF: Q≥ 275 +5C/2 (+48, -0) with rated voltage applied.
Humidity <10 pF: Q≥ 200 +10C
Insulation Initial Value x 0.3 (See Above) Remove from chamber and stabilize at
Resistance room temperature for 24 ± 2 hours
Dielectric Meets Initial Values (As Above) before measuring.
Strength
21
X7R Dielectric
Capacitance Range
PREFERRED SIZES ARE SHADED
NOTE: Contact factory for non-specied capacitance values
*EIA 01005
**Contact Factory for Specications
100518
SIZE 0101* 0201 0402 0603 0805 1206
Soldering Reow Only Reow Only Reow/Wave Reow/Wave Reow/Wave Reow/Wave
Packaging Paper/Embossed All Paper All Paper All Paper Paper/Embossed Paper/Embossed
(L) Length mm 0.40 ± 0.02
(0.016 ± 0.0008)
0.60 ± 0.03
(0.024 ± 0.001)
1.00 ± 0.10
(0.040 ± 0.004)
1.60 ± 0.15
(0.063 ± 0.006)
2.01 ± 0.20
(0.079 ± 0.008)
3.20 ± 0.20
(0.126 ± 0.008)
(in)
(W) Width mm 0.20 ± 0.02
(0.008 ± 0.0008)
0.30 ± 0.03
(0.011 ± 0.001)
0.50 ± 0.10
(0.020 ± 0.004)
0.81 ± 0.15
(0.032 ± 0.006)
1.25 ± 0.20
(0.049 ± 0.008)
1.60 ± 0.20
(0.063 ± 0.008)
(in)
(t) Terminal mm 0.10± 0.04
(0.004 ± 0.0016)
0.15 ± 0.05
(0.006 ± 0.002)
0.25 ± 0.15
(0.010 ± 0.006)
0.35 ± 0.15
(0.014 ± 0.006)
0.50 ± 0.25
(0.020 ± 0.010)
0.50 ± 0.25
(0.020 ± 0.010)
(in)
WVDC 16 6.3 10 16 25 50 6.3 10 16 25 50 6.3 10 16 25 50 100 200 6.3 10 16 25 50 100 200 6.3 10 16 25 50 100 200 500
Cap 100 101 B A A A A A C C C G G G
(pF) 150 151 B A A A A A C C C G G G
220 221 B A A A A A C C C G G G E E E E E E E
330 331 B A A A A A C C C G G G J J J J J J K
470 471 B A A A A A C C C G G G J J J J J J K
680 681 B A A A A C C C G G G J J J J J J K
1000 102 B A A A A C C C C G G G J J J J J J K
1500 152 B A A A A C C C C G G J J J J J J J J J J J J M
2200 222 B A A A A C C C C G G J J J J J J J J J J J J M
3300 332 A A A A C C C C G G J J J J J J J J J J J J M
4700 472 A A A A C C C C G G J J J J J J J J J J J J M
6800 682 A A A A C C C C G G J J J J J J J J J J J J P
Cap 0.01 103 A A A A C C C C G G G J J J J J J J J J J J J J P
(µF) 0.015 153 C C C C G G G J J J J J J J J J J J J M Q
0.022 223 C C C C G G G J J J J J N J J J J J M Q
0.033 333 C C C C G G J J J J J N N J J J J J M Q
0.047 473 C C C C G G G J J J J J N N J J J J J M
0.068 683 C C C C G G G J J J J J N N J J J J J P
0.1 104 C C C C G G G G J J J J J N N J J J J P P
0.15 154 G G G G J J J N N J J J J Q
0.22 224 C C C G G J J J J J N N N J J J J Q
0.33 334 J J J J N N N N N J J M P Q
0.47 474 C C J J J J J N N N N N M M M P Q
0.68 684 J J J N N N M M
1.0 105 C J J J J J N N N N M M
2.2 225 J J J P P P P** Q Q Q Q Q**
4.7 475 J P P P Q Q Q Q
10 106 P P P Q Q X X
22 226 Q Q Q
47 476 Q Q X
100 107
WVDC 16 6.3 10 16 25 50 6.3 10 16 25 50 6.3 10 16 25 50 100 200 6.3 10 16 25 50 100 200 6.3 10 16 25 50 100 200 500
SIZE 0101 0201 0402 0603 0805 1206
Letter A B C E G J K M N P Q X Y Z
Max. 0.33 0.22 0.56 0.71 0.90 0.94 1.02 1.27 1.40 1.52 1.78 2.29 2.54 2.79
Thickness (0.013) (0.009) (0.022) (0.028) (0.035) (0.037) (0.040) (0.050) (0.055) (0.060) (0.070) (0.090) (0.100) (0.110)
PAPER EMBOSSED
22
SIZE
Soldering
Packaging
(L) Leng th
(W) Width
(t) Terminal mm
mm
(in.)
mm
(in.)
(in.)
W VD C
Cap 100 101
(pF) 150 151
220 221
33 0 331
470 471
680 681
2200 222
33 00 3 32
1000 102
1500 152
4700 472
68 00 68 2
Cap 0.01 103
F) 0.015 153
0.022 223
0.033 333
0.047 473
0.0 58 6 83
0.1 104
0.15 15 4
0.22 224
0.3 3 33 4
0.47 474
0.6 8 68 4
1.0 105
1.5 155
2.2 225
3.3 335
4.7 475
10 106
22 226
47 476
100 107
WVDC
SIZE
10
J
J
J
J
J
J
J
J
J
J
J
J
J
J
J
M
M
N
N
X
X
Z
Z
Z
Z
16
J
J
J
J
J
J
J
J
J
J
J
J
J
J
J
M
M
N
N
X
X
Z
Z
Z
1210
Reow Only
Paper/Embossed
3.30 ± 0.4
(0.130± 0.016)
2.50 ± 0.20
(0.098 ± 0.008)
0.50 ± 0.25
(0.020 ± 0.010)
25
J
J
J
J
J
J
J
J
J
J
J
J
J
J
J
M
P
P
Z
Z
Z
Z
Z
Z
50
J
J
J
J
J
J
J
J
J
J
J
J
J
J
J
M
X
X
Z
Z
Z
Z
Z
1210
100
J
J
J
J
J
J
J
J
J
J
J
J
M
P
Q
Q
X
Z
Z
Z
Z
200
J
J
J
J
J
J
J
J
J
J
M
M
Z
Z
500
M
M
M
M
M
M
P
Q
Q
Q
Q
X
16
Z
25
K
K
K
K
K
K
K
K
K
K
K
M
M
Z
Z
Z
Z
1812
Reow Only
All Embossed
4.50 ± 0.30
(0.177 ± 0.012)
3.20 ± 0.20
(0.126 ± 0.008)
0.61 ± 0.36
(0.024 ± 0.014)
50
K
K
K
K
K
K
K
K
K
K
K
M
M
Z
Z
Z
Z
100
K
K
K
K
K
K
K
K
K
M
P
Q
X
Z
Z
Z
1812
200
K
K
K
K
K
K
K
P
P
X
X
Z
500
K
P
P
X
Z
Z
Z
Z
Z
1825
Reow Only
All Embossed
4.50 ± 0.30
(0.177 ± 0.012)
6.40 ± 0.40
(0.252 ± 0.016)
0.61 ± 0.36
(0.024 ± 0.014)
50
M
M
M
M
M
M
M
M
M
M
M
M
M
Q
100
M
M
M
M
M
M
M
M
M
M
M
P
P
1825
200
M
M
M
M
M
M
M
M
M
25
Z
2220
Reow Only
All Embossed
5.70 ± 0.40
(0.225 ± 0.016)
5.00 ± 0.40
(0.197 ± 0.016)
0.64 ± 0.39
(0.025 ± 0.015)
50
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
Z
100
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
Z
Z
Z
2220
200
X
X
X
X
X
X
X
X
X
X
X
500
X
X
X
X
X
X
X
X
X
X
X
2225
Reow Only
All Embossed
5.72 ± 0.25
(0.225 ± 0.010)
6.35 ± 0.25
(0.250 ± 0.010)
0.64 ± 0.39
(0.025 ± 0.015)
50
M
M
M
M
M
M
M
M
M
M
M
M
M
M
M
100
P
P
P
P
P
P
P
P
P
P
P
P
P
X
X
2225
200
P
P
P
P
P
P
P
X
X
X
X
X
X
Z
Z
X7R Dielectric
Capacitance Range
PREFERRED SIZES ARE SHADED
NOTE: Contact factory for non-specied capacitance values
042718
10 16 25 50 100 200 500 16 25 50 100 200 500 50 100 200 25 50 100 200 500 50 100 200
22
Letter
Max.
Thickness
A
0.33
(0.013)
B
0.22
(0.009)
C
0.56
(0.022)
E
0.71
(0.028)
K
1.02
(0.040)
M
1.27
(0.050)
N
1.40
(0.055)
P
1.52
(0.060)
Q
1.78
(0.070)
X
2.29
(0.090)
Y
2.54
(0.100)
Z
2.79
(0.110)
G
0.90
(0.035)
J
0.94
(0.037)
EMBOSSED
PAPER