SUD50P04-15
Vishay Siliconix
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2 Document Number: 71176
S-00830—Rev. A, 24-Apr-00
Parameter Symbol Test Condition Min Typ Max Unit
Static
Drain-Source Breakdown Voltage V(BR)DSS VGS = 0 V, ID = –250 mA–40 V
Gate Threshold V oltage VGS(th) VDS = VGS, ID = –250 mA –1.0
Gate-Body Leakage IGSS VDS = 0 V, VGS = "20 V "100 nA
Zero Gate Voltage Drain Current
VDS = –40 V, VGS = 0 V –1
DSS VDS = –40 V, VGS = 0 V, TJ = 125C –50 m
On-State Drain CurrentaID(on) VDS = –5 V, VGS = –10 V –120 A
VGS = –10 V, ID = –30 A 0.012 0.015
Drain-Source On-State ResistancearDS(on) VGS = –10 V, ID = –30 A, TJ = 125C 0.024 W
VGS = –4.5 V, ID = –20 A 0.018 0.023
Forward T ransconductance agfs VDS = –15 V, ID = –30 A 20 S
Dynamicb
Input Capacitance Ciss 5400
Output Capacitance Coss VGS = 0 V, VDS = –25 V, f = 1 MHz 640 pF
Reverse T ransfer Capacitance Crss 300
Total Gate ChargecQg
85 130
Gate-Source ChargecQgs VDS = –20 V, VGS = –10 V, ID = –50 A 25 nC
Gate-Drain ChargecQgd 15
T urn-On Delay Timectd(on)
15 25
Rise T ime ctrVDD = –20 V, RL = 0.4 W
380 580
T urn-Off Delay T imectd(off)
ID^ –50 A, VGEN = –10 V, RG = 2.5 W75 115
Fall T imectf140 210
Source-Drain Diode Ratings and Characteristic (TC = 25C)
Pulsed Current ISM –150 A
Diode Forward V oltage aVSD IF = –50 A, VGS = 0 V –1.2 –1.5 V
Source-Drain Reverse Recovery T ime trr IF = –50 A, di/dt = 100 A/ms 40 80 ns
Notes
a. Pulse test; pulse width v300 ms, duty cycle v2%.
b. Guaranteed by design, not subject to production testing.
c. Independent of operating temperature.