FSTU32160AMTDX - Fairchild Semiconductor

June 1999

Revised December 2000

FSTU32160A 16-Bit to 32-Bit Multiplexer/Demultiplexer Bus Switch with

−

2V Undershoot Protection

FSTU32160A

16-Bit to 32-Bit Multiplexer/Demultiplexer Bus Switch

with −2V Undershoot Protection

General Description

The Fairchild Switch FSTU32160A is a 16-bit to 32-bit

high-speed CMOS TTL-compatible multiplexer/demulti-

plexer bus switch. The low on resistance of the switch

allows inputs to be connected to outputs without adding

propagati on delay or generatin g additional ground boun ce

noise.

The device can be used in applications where two buses

need to be addressed simultaneously. The FSTU32160A is

designe d so that t he A Port demultipl exes into B1 or B2 or

both. The A and B Po rts have “under shoot hardened” cir-

cuit prot ectio n to sup por t an extended ran ge to 2 .0V b elow

ground. Fairchild’s integrated Undershoot Hardened Cir-

cuit, UHC senses u ndershoot at t he I/O’s, and respon ds

by preventing voltage differentials from developing and

turning on the switch.

Two select (S1, S2) inputs provide switch enable control.

When S1, S2 are HIGH, the device precharges the B Port

to a selectab le bias vol tage (Bi as V) to minim ize live i nser-

tion noise.

Features

■Undershoot hardened to −2V (A and B Ports).

■4Ω switch connection between two ports.

■Minimal propagation delay through the switch.

■Low lCC.

■Zero bounce in flow-through mode.

■Control inputs compatible with TTL level.

■See Applications Note AN-5008 for details

Ordering Code:

Devices also available in Tape and R eel. Speci fy by append ing the suffix let t er “X” to the ordering code.

UHC is a trademark of Fairchild Semiconductor Corporation.

Order Number Package Number Package Description

FSTU 32160AMTD MTD56 56-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 6.1m m Wide

www.fairchildsemi.com 2

FSTU32160A

Connection Diagram Pin Descriptio ns

Truth Table

Logic Diagram

Pin Name Description

S1, S2Select Inputs

ABus A

B1, B2Bus B

Inputs Function

S1S2

LH x A = x B1

HL x A = x B2

LLx A = x B1 and x B2

H H x B1, x B2 = Bia s V

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FSTU32160A

Absolute Maximum Ratings(Note 1) Recommended Operating

Conditions (Note 4)

Note 1: The “A bsolute Maximum Ratings” are thos e values bey ond which

the saf ety of the device cannot be gu aranteed. Th e device shou ld not be

operated at these limits. The parametric values defined in the Electrical

Characteristics tables are not guaranteed at the absolute maximum rating.

The “R ecomm ended Ope rating Co ndition s” table will define the condit ions

for actu al device operation.

Note 2: VS is t he voltage observed/applie d at either the A or B Ports acros s

the switch.

Note 3: The input and output negative voltage ratings may be exceeded if

the in put and output diode cu rrent ratings are observ ed.

Note 4: Unused control inputs must be held HIGH or LOW. They may not

float.

DC Electrical Characteristics

Note 5: Ty pic al values are at VCC = 5.0V and TA = +25°C

Note 6: Measured by the voltage drop between A and B pins at the indicated current through the switch. On resistance is determined by the lower of the

voltages on the tw o (A or B) pins.

Supply Voltage (VCC)−0.5 V to +7.0V

DC Switch Voltage (VS) (Note 2) −2.0V to +7.0V

BiasV Voltage Range −0.5V to +7.0V

DC Input Control Pin Voltage

(VIN) (Note 3) −0.5V to +7.0V

DC Input Diode Current (lIK) VIN < 0V −50 mA

DC Output Current (IOUT)128 mA

DC VCC/GND Current (ICC/IGND)+/− 100 mA

Storage Temperature Range (TSTG)−65°C to +150 °C

Power Su pply Ope rat i ng (VCC) 4.0V to 5.5V

Precharge Supply (BiasV) 1.5 to VCC

Input Voltage (VIN) 0V to 5.5V

Output Voltage (VOUT) 0V to 5.5V

Input Rise and Fall Time (tr, tf)

Switch Control Input 0nS/V to 5nS/V

Switch I/O 0nS/V to DC

Free Air Operating Temperature (TA)−40 °C to +85 °C

Symbol Parameter

TA = −40 °C to +85 °C

Units ConditionsVCC Min Typ Max

(V) (Note 5)

VIK Clamp Diode Voltage 4.5 −1.2 V IIN = −18mA

VIH HIGH Level Input Voltage 4.0–5.5 2.0 V

VIL LOW Level Input Voltage 4.0–5.5 0.8 V

IIInput Leakage Current 5.5 ±1.0 µA0 ≤ VIN ≤ 5.5V

010µAV

IN = 5.5V

IOOutput Current 4.5 0.25 mA BiasV = 2.4V

BX = 0

IOZH, IOZL OFF-STATE Leakage Current 5.5 ±1.0 µA0 ≤ A ≤ VCC, V

BiasV1 = BiasV2 = 5.5V

IOZH, IOZL OFF-STATE Leakage Current 5.5 ±1.0 µA0 ≤ B ≤ VCC, V

BiasV1 = BiasV2 = Floating

RON Switch On Resistance 4.5 4 7 ΩVIN = 0V, IIN = 64 mA

(Note 6) 4.5 4 7 ΩVIN = 0V, IIN = 30 mA

4.5 8 14 ΩVIN = 2.4V, IIN = 15 mA

4.0 11 20 ΩVIN = 2.4V, IIN = 15 mA

ICC Quiescent Supply Current 5.5 3 µAV

IN = VCC or GND, IOUT = 0

∆ ICC Increase in ICC per Input 5.5 2.5 mA One input at 3.4V

Other inputs at VCC or GND

IBIAS Bias Pin Leakage Current 5.5 ±1.0 µASEL

1, SEL2 = 0V

BX = 0V, BiasVX = 5.5V

VIKU Voltage Undershoot 5.5 −2.0 V 0.0 mA ≥ IIN ≥ −50 mA

SEL1, SEL 2 = 5.5V

www.fairchildsemi.com 4

FSTU32160A

AC Electrical Characteristi cs

Note 7: This parameter is guaranteed by design but is not tested. The bus switch contributes no propagation delay other than the RC delay of the typical On

resistance of th e s w it c h and the 50pF load capacit ance, when driven by an ideal v oltage so urc e (zero out put impedance).

Capacitance (Note 8)

Note 8: TA = +25°C, f = 1 Mhz, Capac it ance is ch aracterized but not te s te d.

Undershoot Characteristic (Note 9)

Note 9: This is intended to characte rize t he de v ice’s protective capabilities by maintaining output signal integrity during an input transient voltage undershoot

event.

FIGURE 1.

Device Test Conditions Transient

Input Voltage (VIN) Waveform

Symbol Parameter

TA = −40 °C to +85 °C,

CL = 50 pF, RU= RD = 500ΩUnits Conditions Figure

No.

VCC = 4.5 − 5.5V VCC = 4.0V

Min Max Min Max

tPHL, tPLH A or B, to B or A (Note 7) 0.25 0.25 ns VI = OPEN Figures

2, 3

tPZH Output Enable Time, 0.5 4.0 4.5 ns VI = OPEN for tPZH Figures

2, 3

SEL to A, B BiasV = GND

tPZL Output Enable Time, 1.0 4.8 5.5 ns VI = 7V for tPZL Figures

2, 3

SEL to A, B BiasV = 3V

tPHZ Output Disable Time, 1.0 5.9 6.9 ns VI = Open for tPHZ Figures

2, 3

SEL to A, B BiasV = GND

tPLZ Output Disable Time, 1.0 7.4 7.0 ns VI = 7V for tPLZ Figures

2, 3

SEL to A, B BiasV = 3V

Symbol Parameter Typ Max Units Conditions

CIN Control Pin Input Capacitance 4 pF VCC = 5.0V

CI/O OFF Input/Output Capacitance “OFF State”8pFV

CC = 5.0V, Swi tch OFF

Symbol Parameter Min Typ Max Units Conditions

VOUTU Output Voltage During Undershoot 2.5 VOH − 0.3 V Figure 1

Parameter Value Units

VIN See Waveform V

R1 - R2100K Ω

VTRI 11.0 V

VCC 5.5 V

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FSTU32160A

AC Loading and Waveforms

Note: Input driven by 50Ω source terminated in 50Ω

Note: CL includes load and stray capacitance, CL = 50 pF

Note: Input PRR = 1.0 M H z, t W = 500 ns

FIGURE 2. AC Test Circuit

FIGURE 3. AC Waveforms

www.fairchildsemi.com 6

FSTU32160A 16-Bit to 32-Bit Multiplexer/Demultiplexer Bus Switch with

−

2V Undershoot Protection

Physical Dimensions inches (millimeters) unless otherwise noted

56-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 6.1mm Wide

Package Number MTD56

Technology Description

The Fairchild Switch fam ily derives from and embodies Fairchild’s proven s witch technolog y used for seve ral years in its

74LVX3L384 (FST3384) bus switch product.

Fairchild does not assu me any responsibility for use of any circuitry de scribed, no circuit patent licenses are implied and

Fairchild reserves the right at any time without notice to change said circuitry and specifications.

LIFE SUPPORT POLICY

FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT

DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD

SEMICONDUCTOR CORPORATION. As used herein:

1. Life suppor t de vices o r syste ms are devices or syste ms

which, (a) are intended for surgical implant into the

body, or (b) support or sustain life, and (c) whose failure

to perform when properly used in accordance with

instructions for use provided in the labeling, can be rea-

sonably expected to result in a significant injury to the

user.

2. A critical compon ent i n any compon ent of a lif e supp ort

device or system whose failure to perform can be rea-

sonabl y ex pect ed to ca use the fa ilu re of the li fe su pp ort

device or system, or to affect its safety or effectiveness.