Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015
Features
Integrated Temperature Sensor (TS) + 4-Kbit Serial EEPROM
JEDEC JC42.4 (TSE2004av) DIMM Serial Presence Detect (SPD) + TS
compliant
Low voltage operation
Optimized for VCC range of 1.7V to 3.6V
2-wire serial interface: I2C Fast Mode Plus (FM+) compatible
100kHz, 400kHz, and 1MHz compatibility
Bus Timeout supported
Schmitt Trigger, filtered inputs for noise suppression
Industry standard green (Pb/Halide-free/RoHS compliant) package options
8-pad Ultra Thin DFN (2 x 3 x 0.6mm)
8-pad Very Very Thin DFN (2 x 3 x 0.8mm)
Temperature Sensor Features
Highly accurate B-grade temp. measurements requiring no external
components
±1.0°C accuracy (maximum) over the +75°C to +95°C range
±2.0°C accuracy (maximum) over the +40°C to +125°C range
±3.0°C accuracy (maximum) over the -20°C to +125°C range
11-bit ADC temperature-to-digital converter with 0.125°C resolution
Programmable hysteresis threshold: off, 0°C, 1.5°C, 3°C, and 6°C
Low operating current
Temperature sensor active ~0.2mA (typical)
Serial EEPROM Features
Integrates 4-Kbits of Serial EEPROM
Internally organized into four quadrants of 128-bytes each
Individual Reversible Software Write Protection on all four 128-byte quadrants
Supports byte and Page Write operations
Self-timed write cycle (5ms maximum)
High-reliability
Endurance: 1,000,000 write cycles
Data retention: 100 years
Low operating current
Serial EEPROM Write ~1.5mA (typical)
Serial EEPROM Read ~0.2mA (typical)
AT30TSE004A
Integrated Temperature Sensor with Serial EEPROM
DATASHEET
AT30TSE004A [DATASHEET]
Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015
2
Table of Contents
1. Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
2. Pin Descriptions and Pinouts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
3. Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
4. Device Communication . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
4.1 Start Condition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
4.2 Stop Condition. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
4.3 Acknowledge (ACK) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
4.4 No-Acknowledge (NACK) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
4.5 Standby Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
4.6 Device Reset and Initialization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
4.6.1 Power-Up Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
4.7 Timeout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
4.8 2-wire Software Reset. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
5. Device Addressing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
6. Temperature Sensor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
6.1 Functional Description. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
6.1.1 EVENT Output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
6.1.2 Alarm Window . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
6.2 Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
6.2.1 Pointer Register (8-bit Write Only, Address = N/A) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
6.2.2 Capability Register (16-bit Read-only, Address = 00h) . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
6.2.3 Configuration Register (16-bit Read/Write, Address = 01h) . . . . . . . . . . . . . . . . . . . . . . . 15
6.2.4 Upper Limit Register (16-bit Read/Write, Address = 02h) . . . . . . . . . . . . . . . . . . . . . . . . . 18
6.2.5 Lower Limit Register (16-bit Read/Write, Address = 03h) . . . . . . . . . . . . . . . . . . . . . . . . . 19
6.2.6 Critical Alarm Register (16-bit Read/Write, Address = 04h) . . . . . . . . . . . . . . . . . . . . . . . 20
6.2.7 Temperature Register (16-bit Read-only, Address = 05h) . . . . . . . . . . . . . . . . . . . . . . . . 21
6.2.7.1 Temperature Register Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
6.2.8 Manufacturer ID Register (16-bit Read-only, Address = 06h) . . . . . . . . . . . . . . . . . . . . . . 23
6.2.9 Device ID Register (16-bit Read-only, Address = 07h) . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
6.3 Temperature Sensor Write Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
6.4 Temperature Sensor Read Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
7. Serial EEPROM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
7.1 Memory Organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
7.1.1 Set Page Address and Read Page Address Commands . . . . . . . . . . . . . . . . . . . . . . . . . 26
7.2 Serial EEPROM Write Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
7.2.1 Byte Write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
7.2.2 Page Write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
7.2.3 Acknowledge (ACK) Polling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
7.2.4 Write Cycle Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
7.3 Write Protection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
7.3.1 Set RSWP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
7.3.2 Clear RSWP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
7.3.3 Read RSWP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
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7.4 Serial EEPROM Read Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
7.4.1 Current Address Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
7.4.2 Random Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
7.4.3 Sequential Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
8. Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
8.1 Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
8.2 DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
8.3 AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
8.4 Temperature Sensor Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
8.5 Pin Capacitance(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
9. Ordering Code Detail . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
10. Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
11. Part Markings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
12. Package Drawings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
12.1 8MA2 — 8-pad UDFN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
12.2 8MAA — 8-pad WDFN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
13. Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
AT30TSE004A [DATASHEET]
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1. Description
The Atmel® AT30TSE004A is a combination Serial EEPROM and temperature sensor device containing 4096-
bits of Serially Electrically Erasable and Programmable Read-Only Memory (EEPROM) organized as 512-bytes
of eight bits each. The Serial EEPROM operation is tailored specifically for DRAM memory modules with Serial
Presence Detect (SPD) to store a module’s vital product data such as the module’s size, speed, voltage, data
width, and timing parameters.
The AT30TSE004A is protocol compatible with the legacy JEDEC TSE2002av specification (2-Kbit) devices
enabling the AT30TSE004A to be utilized in legacy applications without any software changes. The Serial
EEPROM deploys special software commands to allow users to identify and set which half of the memory the
internal address counter is located. This special page addressing method used to select the upper or lower half
of the Serial EEPROM is the key to the legacy compatibility; however, there is one minor exception to the legacy
compatibility as the AT30TSE004A does not support the Permanent Write Protection feature because it was
removed from the JEDEC TSE2004a (DDR4) specification.
In addition, the Serial EEPROM incorporates a Reversible Software Write Protection (RSWP) feature enabling
the ability to selectively write protect any or all of the four 128-byte quadrants. Once the RSWP is set, it can only
be reversed by sending a special software command sequence.
The integrated temperature sensor converts temperatures from -20C to +125C to a digital word and provides
an accuracy of ±1°C (max.) in the temperature range +75C to +95C. The temperature sensor continuously
monitors temperature and updates the data in the Temperature Register at least eight times per second. The
temperature data is latched internally by the device and may be read by software via a bus Master at anytime
(even when the Serial EEPROM is busy writing data to the memory).
The AT30TSE004A incorporates flexible user programmable internal registers to configure the temperature
sensor’s performance and response to over and under temperature conditions. The device contains flexible
programmable high, low, and critical temperature limits. The EVENT pin is an active low output and can be
configured to operate as an Interrupt or as a Comparator output. The Manufacturer and Device ID Registers
provide the ability to confirm the identity of the device. The AT30TSE004A supports the industry standard 2-wire
I2C FM plus (Fast Mode +) serial interface allowing device communication to operate up to 1MHz. A bus timeout
feature is supported for both temperature sensor and Serial EEPROM operations to help prevent system lock-
ups. The AT30TSE004A is available in space saving 8-lead UDFN and WDFN packages.
The UDFN is the recommended and preferred package.
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Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015
2. Pin Descriptions and Pinouts
Table 2-1. Pin Descriptions
Figure 2-1. Pinout
Note: UDFN is the recommended and preferred package. The metal pad on the bottom of the UDFN/WDFN
package is not internally connected to a voltage potential. This pad can be a “no connect” or connected to GND.
Symbol Name and Function
Asserted
State Type
SCL
Serial Clock: The SCL pin is used to provide a clock to the device and is used
to control the flow of data to and from the device. Command and input data
present on the SDA pin is always latched in on the rising edge of SCL, while
output data on the SDA pin is always clocked out on the falling edge of SCL.
The SCL pin must either be forced high when the serial bus is idle or pulled-high
using an external pull-up resistor.
Input
SDA
Serial Data: The SDA pin is an open-drain bidirectional input/output pin used to
serially transfer data to and from the device.
The SDA pin must be pulled-high using an external pull-up resistor (not to
exceed 8K in value) and may be wire-ORed with any number of other
open-drain or open-collector pins from other devices on the same bus.
Input/
Output
EVENT
EVENT: The EVENT pin is an open-drain output pin used to indicate when the
temperature goes beyond the user-programmed temperature limits. The EVENT
pin can be operated in one of three different modes; either Interrupt,
Comparator, or Critical Alarm Modes. The ALERT pin must be pulled-high using
an external pull-up resistor for proper operation.
Output
A2, A1, A0
Device Address Inputs: The A0, A1, and A2 pins are used to select the device
address and corresponds to the three Least-Significant Bits (LSB) of the I2C
FM+ seven bit slave address. These pins can be directly connected to VCC or
GND in any combination, allowing up to eight devices on the same bus.
The A0 pin is also an overvoltage tolerant pin, allowing up to 10V to support the
Reversible Software Write Protection (RSWP) feature (see Section 7.3 “Write
Protection” on page 32).
Input
VCC
Device Power Supply: The VCC pin is used to supply the source voltage to the
device. Operations at invalid VCC voltages may produce spurious results and
should not be attempted.
Power
GND Ground: The ground reference for the power supply. GND should be connected
to the system ground. Power
UDFN / WDFN
Top View
A
0
A
1
A
2
GND
V
CC
EVENT
SCL
SDA
8
7
6
5
1
2
3
4
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3. Block Diagram
rosneSerutarepmeTMORPEElaireS
EEPROM Quadrant 0
EEPROM Quadrant 1
EEPROM Quadrant 2
EEPROM Quadrant 3
SPA = 0, (00h-7Fh)
SPA = 1, (00h-7Fh)
SPA= 1, (80h-FFh)
SPA = 0, (80h-FFh)
2
A
1
A
0
ADNG
V
CC
EVENT
SCL SDA
Selected Resolution
Temp. Range
Accuracy
EVENT Shutdown
Timeout
Output Feature
A/D
Converter
Band Gap
Temperature
Sensor
Capability
Configuration
Critical Alarm Trip
Device ID
Manufacturer ID
Temperature
Upper Alarm Trip
Lower Alarm Trip
Timeout
Pointer
Register
H.V Pump/Timing
Y Address Decoder
Write Protect Circuitry
X Address
Decoder
Memory
Control Logic
Serial
Control Logic
I2C
Interface
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4. Device Communication
The AT30TSE004A operates as a slave device and utilizes a simple 2-wire digital serial interface, compatible
with the I2C Fast Mode Plus (I2C FM+) protocol, to communicate with a host controller, commonly referred to as
the bus Master. The Master initiates and controls all Read and Write operations to the slave devices on the
serial bus, and both the Master and the slave devices can transmit and receive data on the bus.
The serial interface is comprised of just two signal lines: the Serial Clock (SCL) and the Serial Data (SDA). The
SCL pin is used to receive the clock signal from the Master, while the bidirectional SDA pin is used to receive
command and data information from the Master, as well as, to send data back to the Master. Data is always
latched into the AT30TSE004A on the rising edge of SCL and is always output from the device on the falling
edge of SCL. Both the SCL and SDA pin incorporate integrated spike suppression filters and Schmitt Triggers to
minimize the effects of input spikes and bus noise.
All command and data information is transferred with the Most-Significant Bit (MSB) first. During the bus
communication, one data bit is transmitted every clock cycle, and after eight bits (one byte) of data has been
transferred, the receiving device must respond with either an acknowledge (ACK) or a no-acknowledge (NACK)
response bit during a ninth clock cycle (ACK/NACK clock cycle) generated by the Master; therefore, nine clock
cycles are required for every one byte of data transferred. There are no unused clock cycles during any Read or
Write operation so there must not be any interruptions or breaks in the data stream during each data byte
transfer and ACK or NACK clock cycle.
During data transfers, data on the SDA pin must only change while SCL is low, and the data must remain stable
while SCL is high. If data on the SDA pin changes while SCL is high, then either a Start or a Stop condition will
occur. Start and Stop conditions are used to initiate and end all serial bus communication between the Master
and the slave devices.The number of data bytes transferred between a Start and a Stop condition is not limited
and is determined by the Master.
In order for the serial bus to be idle, both the SCL and SDA pins must be in the Logic 1 state at the same time.
4.1 Start Condition
A Start condition occurs when there is a high-to-low transition on the SDA pin while the SCL pin is stable in the
Logic 1 state. The Master uses a Start condition to initiate any data transfer sequence, and the Start condition
must precede any command. AT30TSE004A will continuously monitor the SDA and SCL pins for a Start
condition, and the device will not respond unless one is given. Please refer to Figure 4-1 on page 8 for more
details.
4.2 Stop Condition
A Stop condition occurs when there is a low-to-high transition on the SDA pin while the SCL pin is stable in the
Logic 1 state. The Master uses the Stop condition to end a data transfer sequence to the AT30TSE004A which
will subsequently return to the idle state. The Master can also utilize a repeated Start condition instead of a Stop
condition to end the current data transfer if the Master will perform another operation. Please refer to Figure 4-1
on page 8 for more details.
4.3 Acknowledge (ACK)
After every byte of data is received, AT30TSE004A must acknowledge to the Master that it has successfully
received the data byte by responding with an ACK. This is accomplished by the Master first releasing the SDA
line and providing the ACK/NACK clock cycle (a ninth clock cycle for every byte). During the ACK/NACK clock
cycle, the AT30TSE004A must output a Logic 0 (ACK) for the entire clock cycle such that the SDA line must be
stable in the Logic 0 state during the entire high period of the clock cycle. Please refer to Figure 4-1 on page 8
for more details.
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4.4 No-Acknowledge (NACK)
When the AT30TSE004A is transmitting data to the Master, the Master can indicate that it is done receiving data
and wants to end the operation by sending a NACK response to the AT30TSE004A instead of an ACK
response. This is accomplished by the Master outputting a Logic 1 during the ACK/NACK clock cycle, at which
point the AT30TSE004A will release the SDA line so that the Master can then generate a Stop condition.
In addition, the AT30TSE004A can use a NACK to respond to the Master instead of an ACK for certain invalid
operation cases such as an attempt to Write to a read-only register (e.g. an attempt to Write to the Temperature
Register).
Figure 4-1. Start, Stop, and ACK
4.5 Standby Mode
The AT30TSE004A incorporates a low-power Standby Mode which is enabled:
Upon power-up or
After the receipt of the Stop condition and the completion of any internal operations.
4.6 Device Reset and Initialization
The AT30TSE004A incorporates an internal Power-On Reset (POR) circuit to help prevent inadvertent
operations during power-up and power-down cycles. On a cold power-up, the supply voltage must rise
monotonically between VPOR(max) and VCC(min) without any ring back to ensure a proper power-up (see Figure
4-2 on page 9). Once the supply voltage has passed the VPOR(min) threshold, the device’s internal reset process
is initiated. Completion of the internal reset process occurs within the tINIT time listed in Table 4.6.1 on page 9.
Upon completion of the internal reset process, the device will have the following power-on default conditions:
Temperature sensor starts monitoring temperature continuously.
Pointer Register = 00h
Upper Limit, Lower Limit, and Critical Alarm Registers are set to 0C.
EVENT pin is pulled high by the external pull up resistor.
Operational mode is Comparator.
Hysteresis level is set to 0C.
EVENT pin polarity is set low.
EVENT output is disabled and not asserted.
Serial EEPROM’s SPA = 0.
SCL
SDA
SDA
Must Be
Stable
SDA
Change
Allowed
SDA
Change
Allowed
Acknowledge
Valid
Stop
Condition
Start
Condition
12 89
SDA
Must Be
Stable Acknowledge Window
The transmitting device (Master or Slave) must
release the SDA line at this point to allow the
the receiving device (Master or Slave) to drive
the SDA line low to ACK the previous 8-bit word.
The receiver (Master or Slave)
must release the SDA line at
this point to allow the transmitter
to continue sending new data.
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Table 6-1 on page 13 shows the power-on register default values. The Upper Limit, Lower Limit, Critical Alarm,
and Configuration Registers should be programmed to their user desired values before the temperature sensor
can properly function. Before selecting the device and issuing protocol, a valid and stable supply voltage must
be applied and no protocol should be issued to the device for the time specified by the tINIT parameter. The
supply voltage must remain stable and valid until the end of the protocol transmission, and for a Serial EEPROM
Write instruction, until the end of the internal write cycle.
Figure 4-2. Power-Up Timing
4.6.1 Power-Up Conditions
Do Not Attempt
Device Access
During This Time
V
CC
Cold
Power-On Reset
Warm
Power-On Reset
VPOR (max)
VCC (min)
Time
tPOFF
tINIT
tPOR
Device Access
Permitted
VPOR (min)
Symbol Parameter Min Max Units
tPOR Power-on Reset Time 10.0 ms
vPON Power-on Reset Threshold 1.6 V
vPOFF Power-off Threshold for Warm Power-on Cycle 0.9 V
tPOFF Warm Power Cycle Off Time 1.0 ms
tINIT Time from Power-On to First Command 10.0 ms
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4.7 Timeout
The AT30TSE004A supports the industry standard bus Timeout feature on both temperature sensor and Serial
EEPROM operations to help prevent potential system bus hang-ups. The device resets its serial interface and
will stop driving the bus (will let SDA float high) if the SCL pin is held low for more than the minimum Timeout
(tOUT) specification. The AT30TSE004A will be ready to accept a new Start condition before the maximum tOUT
has elapsed (see Figure 4-3). This feature does require a minimum SCL clock speed of 10kHz to avoid any
timeout issues.
Figure 4-3. Timeout
4.8 2-wire Software Reset
After an interruption in protocol, power loss, or system reset, any 2-wire part can be reset by following these
steps:
1. Create a Start condition.
2. Clock nine cycles.
3. Create another Start condition followed by Stop condition as shown in Figure 4-4.
Figure 4-4. 2-wire Software Reset
Device will release Bus and
be ready to accept a new
Start Condition within this Time
tTIMEOUT (MAX)
tTIMEOUT (MIN)
SCL
SCL
SDA
9
8321
Start
Condition
Start
Condition
Stop
Condition
Dummy Clock Cycles
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5. Device Addressing
The AT30TSE004A is designed to allow the Serial EEPROM and the temperature sensor to operate in parallel
while executing valid command protocol. For example, when the temperature sensor is busy during a
temperature conversion cycle, it is possible to perform any Serial EEPROM operation during this time and vice
versa.
The device requires a 7-bit device address and a Read/Write select bit following a Start condition from the
Master to initiate communication with either the temperature sensor or the Serial EEPROM. The device address
byte is comprised of a 4-bit device type identifier followed by three device address bits (A2, A1,and A0) and a
R/W bit and is clocked by the Master on the SDA pin with the Most Significant Bit first (see Table 5-1).
The AT30TSE004A will respond to three unique device type identifiers. The device type identifier of
‘1010’(Ah) is necessary to select the device for reading or writing. The device type identifier of ‘0110’(6h)
has multiple purposes. First, it is used to access the page address function which determines what the internal
address counter is set to. For more information on accessing the page address function, please refer to Section
7.1.1 “Set Page Address and Read Page Address Commands” on page 26 The device type identifier of
‘0110’(6h) is also used to access the Software Write Protection feature of the device. Information on the
Software Write Protection functionality can be found in Section 7.3 “Write Protection” on page 32.
Table 5-1. AT30TSE004A Device Address Byte
The software device address bits (A2, A1, and A0) must match their corresponding hard-wired device address
inputs (A2, A1 and A0) allowing up to eight devices on the bus at the same time (see Table 5-2). The eighth bit of
the address byte is the R/W operation selection bit. A Read operation is selected if this bit is a Logic 1, and a
Serial EEPROM Write operation is selected if this bit is a Logic 0. Upon a compare of the device address byte,
the AT30TSE004A will output an ACK during the ninth clock cycle; if a compare is not true, the device will output
a NACK during the ninth clock cycle and return the device to the low-power Standby Mode.
Table 5-2. Device Address Combinations
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
Function Device Type Identifier Device Address Read/Write
Serial EEPROM
Read/Write 1 0 1 0 A2 A1 A0 R/W
Serial EEPROM Write
Protection and Page
Address Functions
0 1 1 0 A2 A1 A0 R/W
Temperature Sensor 0 0 1 1 A2 A1 A0 R/W
Software Device Address Bits Hard-wired Device Address Inputs
A2, A1, A0 A2A1A0
0 0 0 GND GND GND
0 0 1 GND GND VCC
0 1 0 GND VCC GND
0 1 1 GND VCC VCC
1 0 0 VCC GND GND
1 0 1 VCC GND VCC
1 1 0 VCC VCC GND
1 1 1 VCC VCC VCC
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6. Temperature Sensor
6.1 Functional Description
The temperature sensor consists of a Delta-Sigma Analog to Digital Converter (ADC) with a band gap type
temperature sensor that monitors and updates its temperature measurement at least eight times per second
converting the temperature readings into digital data bits and latching them into the Temperature Register that
can be read via the 2-wire I2C FM+ serial interface.
The device communicates over a 2-wire I2C FM+ interface with a Master consisting of a Serial Clock (SCL) and
a Serial Bidirectional Data Bus (SDA) with clock frequencies up to 1MHz. The Master generates the SCL signal
and is used by the AT30TSE004A to receive and send serial data on the SDA line with the Most Significant Bit
transferred first. A pull-up resistor is required on the SDA pin since it has an open drain configuration.
6.1.1 EVENT Output
The EVENT pin has three operating modes depending on the configuration settings:
Interrupt Mode
Comparator Mode
Critical Alarm (Crit_Alarm) Mode
While in Interrupt Mode, once a temperature reaches a boundary limit, the AT30TSE004A asserts the EVENT
pin. The EVENT pin will remain asserted until the system clears the interrupt by writing a Logic 1 to the EVTCLR
bit five in the Configuration Register. When the temperature drops below specified limits, the device returns
back to either Interrupt or Comparator Mode as programmed in the Configuration Register’s EVTMOD bit zero.
In Comparator Mode, the EVENT pin remains asserted until the error condition that caused the pin to be
asserted no longer exists and the EVENT pin will clear itself. In the Crit_Alarm Mode, when the measured
temperature exceeds Crit_Alarm limit, the EVENT pin will remain asserted until the temperature drops below the
Crit_Alarm limit minus hysteresis (see Figure 6-1 on page 17). All event thresholds use hysteresis as
programmed in the Configuration Register.
6.1.2 Alarm Window
The Alarm Window consists of the Upper Limit Register and Lower Limit Register. The Upper Limit Register
holds the upper temperature trip point and the Lower Limit Register holds the lower temperature trip point. After
the EVENT pin control is enabled, the EVENT output will be triggered upon entering and exiting from this
window.
6.2 Register Descriptions
This section describes all the temperature sensor registers that are used in the AT30TSE004A. The
AT30TSE004A contains several registers that are user accessible and/or programmable and utilized for latching
the temperature readings, storing high, low, and critical temperature limits, configuring the temperature sensor
performance, and reporting temperature sensor status.
These registers include a Capability Register, Configuration Register, Upper Limit Register, Lower Limit
Register, Critical Alarm Register, Temperature Register, Manufacturer Identification Register, and a Device
Identification/Device Revision Register.
The AT30TSE004A utilizes an 8-bit Pointer Register to access the 16-bit registers. Table 6-1 indicates the
Write/Read access capability for each register.
Note: Reading from a Write-only register will result in reading Logic 0 data, and writing to a Read-only register will have
no impact even though the Write sequence will be acknowledged by the device.
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Table 6-1. Registers
Note: 1. Write operations to reserve registers should be avoided as it may cause undesirable results.
6.2.1 Pointer Register (8-bit Write Only, Address = N/A)
The AT30TSE004A utilizes a Pointer Register to select and access all the data registers shown on Table 6-1.
The Pointer Register is an 8-bit Write-only register (see Table 6-2). The power-on default value is 00h which is
the address location for the Capability Register.
Table 6-2. Pointer Register
Register Address Read/Write Section Power-On Default
Pointer Register n/a W 6.2.1 00h
Capability Register 00h R 6.2.2 00F7h
Configuration Register 01h R/W 6.2.3 0000h
Upper Limit Register 02h R/W 6.2.4 0000h
Lower Limit Register 03h R/W 6.2.5 0000h
Critical Alarm Register 04h R/W 6.2.6 0000h
Temperature Register 05h R 6.2.7 N/A
Manufacturer I.D. Register 06h R 6.2.8 1114h
Device I.D./Device Revision Register 07h R 6.2.9 2200h
Reserved (1) 08h to 0Fh R/W N/A N/A
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
Symbol Pointer Register Value
R/W W W W W W W W W
Default Value 0 0 0 0 0 0 0 0
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6.2.2 Capability Register (16-bit Read-only, Address = 00h)
This register is a 16-bit read-only register used to specify the functional capabilities of the temperature sensor.
The AT30TSE004A is capable of measuring temperature with ±1C over the active range and ±2C over the
monitor range. The Capability Register functions are described in Table 6-3 and Table 6-4.
Table 6-3. Capability Register Bit Distribution
Table 6-4. Capability Register Bit Description
Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8
Symbol RFU
Default Value 0 0 0 0 0 0 0 0
R/W Access R R R R R R R R
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
Symbol EVSD TMOUT VHV TPRES RANGE SACC ICAP
Default Value 1 1 1 1 0 1 1 1
R/W Access R R R R R R R R
Bit Symbol Description
15:8 RFU Reserved for Future Use and must be Logic 0.
7 EVSD
Event Output Status During Shutdown Mode:
1 = The EVENT pin output is deasserted (not driven) when entering Shutdown Mode and will
remain deasserted upon exit from Shutdown Mode until the next temperature measurement
sample is taken. In Interrupt Mode, the EVENT pin maybe asserted when existing Shutdown if
a pending Interrupt has not be cleared.
6 TMOUT Timeout:
1 = BusTimeout supported within the range 25 to 35ms.
5 VHV
A0 Pin High Voltage:
1 = The A0 pin supports a maximum voltage up to 10V.
4:3 TPRES Temperature Resolution:
10 =Supports 0.125C (11-bit resolution).
2 RANGE 1 = Can read temperatures below 0°C and sets appropriate sign bit.
1 SACC
Supported Accuracy:
1 = Supports a B-grade accuracy of ±1C over the active range (75C to 95C) and 2C over the
monitor range (40C to 125C).
0 ICAP Interrupt Capability:
1 = Supports Interrupt capabilities.
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6.2.3 Configuration Register (16-bit Read/Write, Address = 01h)
The AT30TSE004A incorporates a 16-bit Configuration Register allowing the user to set key operational
features of the temperature sensor. The Configuration Register functions are described in Table 6-5 and
Table 6-6.
Table 6-5. Configuration Register Bit Distribution
Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8
Symbol RFU HYSTENB SHTDWN
Default Value 00000000
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
Symbol CRTALML WINLOCK EVTCLR EVTSTS EVTOUT CRITEVT EVTPOL EVTMOD
Default Value 00000000
R/W Access R/W R/W W R R/W R/W R/W R/W
Table 6-6. Configuration Register Bit Description
Bit Symbol Description
15:11 RFU Reserved for Future Use and must be Logic 0.
10:9 HYSTENB
Hysteresis Enable:
00 = 0C Disable hysteresis (Power-on default)
01 = 1.5C Enable hysteresis
10 = 3.0C Enable hysteresis
11 = 6.0C Enable hysteresis
The purpose of these bits is to control the hysteresis applied to the temperature limit trip point
boundaries. The above hysteresis applies to all limits when temperature drops below the user
specified temperature limit trip points.
Note: Hysteresis applies to decreasing temperature only. Once the temperature is above
a given threshold, the temperature must drop below the boundary limit minus
hysteresis in order for a Comparator EVENT to be cleared.
Example: If these two bits are set to ‘01’ for 1.5C and the Upper Limit is set to 85C, as
temperature rises above 85C, bit 14 of the Temperature Register will be set to a
Logic 1. Bit 14 will remain set until the temperature drops below the threshold
(85C) minus the hysteresis value(83.5C).
Note: Hysteresis is also applied to the EVENT pin functionality. This bit cannot be
changed if the Crit_Alarm or Alarm Window Lock bits is set.
8 SHTDWN
Shutdown Mode:
0 = The temperature sensor is enabled for continuous conversion (power-on default).
1 = The temperature sensor is disabled.
To save power in Shutdown Mode, the temperature sensor is not active and will not generate
interrupts or update the temperature data. The EVENT pin is deasserted (not driven).
This bit cannot be set to a Logic 1 if either of the Crit_Alarm or Alarm Window Lock bits is set,
however, it can be cleared at any time. The device will respond to protocol commands and the
bus timeout is active when in Shutdown Mode.
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7CRTALML
Crit_Alarm Lock bit:
0 = The Crit_Alarm Register can be updated (power-on default).
1 = The Crit_Alarm Register is locked and cannot be updated.
This bit locks the Critical Alarm Register from being updated.
Once set, it can only be cleared to a Logic 0 by an internal Power-On Reset.
6 WINLOCK
Alarm Window Lock bit:
0 = The Upper Limit and Lower Limit Registers can be updated (power-on default).
1 = The Upper and Lower Limit Registers are locked and cannot be updated.
Once set, it can be only be cleared to a Logic 0 by an internal Power-On Reset.
5 EVTCLR
EVENT Clear:
0 = Has no effect (power-on default).
1 = Clears (releases) the active EVENT pin in Interrupt Mode.
This bit will clear the EVENT pin after it has been enabled. This bit is a
write-only bit and will read as a Logic 0 and is ignored when in Comparator Mode.
4 EVTSTS
EVENT Pin Output Status:
0 = The EVENT output is not asserted by the device (power-on default).
1 = The EVENT output is asserted due to a limit or alarm condition.
3EVTOUT
EVENT Output Control:
0 = The EVENT output is disabled and will not generate interrupts (power-on default).
1 = The EVENT output is enabled.
This bit cannot be altered if the Crit_Alarm or the Alarm Window Lock bits is set.
2 CRITEVT
Critical Temperature only:
0 = The EVENT output is asserted if the measured temperature is above the Upper Limit or
Critical Alarm, or is below the Lower Limit (power-on default).
1 = The EVENT output is asserted only for a Critical Alarm violation when the temperature is
greater then the Crit_Alarm.
This bit cannot be altered if the Alarm Window Lock bit is set.
1 EVTPOL
EVENT Polarity:
0 = The EVENT pin is active low (power-on default).
1 = The EVENT pin is active high.
This bit cannot be altered if the Crit_Alarm or the Alarm Window Lock bit is set.
A pull-up resistor is required on this pin to achieve the Logic 1 state.
0 EVTMOD
EVENT Mode:
0 = The EVENT pin will operate in Comparator Mode (power-on default).
1 = The EVENT pin will operate in Interrupt Mode.
This bit cannot be altered if the Crit_Alarm or the Alarm Window Lock bit is set.
Table 6-6. Configuration Register Bit Description (Continued)
Bit Symbol Description
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Figure 6-1. EVENT Pin Mode Functionality
Crit_Alarm
Upper Limit
Measured
Temperature
Lower Limit
EVENT Pin in
I
nterrupt Mode”
(Active Low)
EVENT Pin in
“Crit_Alarm
Only Mode”
(Active High)
EVENT Pin in
“Comparator
Mode”
(Active Low)
Software Resets Interrupt
Switches to
Comparator
Mode
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6.2.4 Upper Limit Register (16-bit Read/Write, Address = 02h)
The Upper Limit Register holds the user programmed upper temperature boundary trip point in 2’s complement
format (0.125C resolution) that can be utilized to monitor the temperature in an operating window between the
Upper Limit Register and the Lower Limit Register settings (see Table 6-7 and Table 6-9). When the
temperature increases above this trip point, drops below, or is equal to the trip point (minus any hysteresis set),
then the EVENT pin is asserted (if enabled). This register is read-only if the Alarm Window Lock (WINLOCK) bit
six in the Configuration Register is set to a Logic 1.
Table 6-7. Upper Limit Register Bit Distribution
Table 6-8. Upper Limit Register Bit Description
Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8
Symbol RFU SIGN ALMWINH
Default Value 00000000
R/W Access R R R R/W R/W R/W R/W R/W
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
Symbol ALMWINH RFU
Default Value 00000000
R/W Access R/W R/W R/W R/W R/W R/W R R
Bit Symbol Description
15:13 RFU Reserved for Future Use. Read as Logic 0.
12 SIGN
Sign bit:
0 = The temperature is greater than or equal to 0°C.
1= The temperature is less than 0°C.
11:2 ALMWINH
Upper Limit temperature bits:
Represented in 2’s complement format.
Read-only access if Alarm Window is locked (Configuration Register bit 6 high).
R/W access if the Alarm Window is unlocked.
0:1 RFU Reserved for Future Use. Read as Logic 0.
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6.2.5 Lower Limit Register (16-bit Read/Write, Address = 03h)
The Lower Limit Register holds the user programmed lower temperature boundary trip point in 2’s complement
format (0.125C resolution) that can be utilized to monitor the temperature in an operating window (see
Table 6-7 and Table 6-9). When the temperature decreases below this trip point minus any hysteresis set or
increases to meet or exceed this trip point, then the EVENT pin is asserted (if enabled).
This register becomes read-only if the Alarm Window Lock (WINLOCK) bit six in the Configuration Register is
set to a Logic 1.
Table 6-9. Lower Limit Register Bit Distribution
Table 6-10. Lower Limit Register Bit Description
Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8
Symbol RFU SIGN ALMWINL
Default Value 0 0 0 0 0 0 0 0
R/W Access R R R R/W R/W R/W R/W R/W
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
Symbol ALMWINL RFU
Default Value 0 0 0 0 0 0 0 0
R/W Access R/W R/W R/W R/W R/W R/W R R
Bit Symbol Description
15:13 RFU Reserved for Future Use. Read as Logic 0.
12 SIGN
Sign bit:
0 = The temperature is greater than or equal to 0°C.
1 = The temperature is less than 0°C.
11:2 ALMWINL
Lower Limit temperature bits:
Represented in 2’s complement format.
Read-only access if Alarm Window is locked (Configuration Register bit 6 high).
R/W access if the Alarm Window is unlocked.
0:1 RFU Reserved for Future Use. Read as Logic 0.
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6.2.6 Critical Alarm Register (16-bit Read/Write, Address = 04h)
The Critical Alarm Register holds the user programmed Critical Alarm temperature boundary trip point in
2’s complement format (0.125°C resolution) that can be utilized to monitor the temperature (see Table 6-11 and
Table 6-12). When the temperature increases above this trip point, the EVENT pin will be asserted (if enabled).
It will remain asserted until temperature decreases below or equal to the trip point minus any hysteresis set.
This register becomes read-only if the Critical Alarm Lock Bit (CRTALML) bit seven in the Configuration
Register is set to a Logic 1.
Table 6-11. Critical Alarm Register Bit Distribution
Table 6-12. Critical Alarm Register Bit Description
Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8
Symbol RFU SIGN CRITEVT
Default Value 0 0 0 0 0 0 0 0
R/W Access R R R R/W R/W R/W R/W R/W
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
Symbol CRITEVT RFU
Default Value 0 0 0 0 0 0 0 0
R/W Access R/W R/W R/W R/W R/W R/W R R
Bit Symbol Description
15:13 RFU Reserved for Future Use. Read as Logic 0.
12 SIGN
Sign bit:
0 = The temperature is greater than or equal to 0°C.
1 = The temperature is less than 0°C.
11:2 CRITEVT
Critical Alarm temperature bits:
Represented in 2’s complement format.
Read-only access if Alarm Window is locked (Configuration Register bit 6 high).
R/W access if the Alarm Window is unlocked.
0:1 RFU Reserved for Future Use. Read as Logic 0.
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6.2.7 Temperature Register (16-bit Read-only, Address = 05h)
The Temperature Register holds the internal temperature measurement data represented in 2’s complement
format allowing for resolution equal to 0.125C (least significant bit). The upper three bits (15, 14, and 13) of the
Temperature Register indicates the trip status of the current temperature and most important, are not affected
by the status of the output of the EVENT pin (see Table 6-13 and Table 6-14).
Table 6-13. Temperature Register Bit Distribution
Table 6-14. Temperature Register Bit Description
Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8
Symbol CRITHIGH ALMHIGH ALMLOW SIGN 128°C 64°C 32°C 16°C
Default Value 0 0 0 0 0 0 0 0
R/W Access R R R R R R R R
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
Symbol 8°C 4°C 2°C 1°C 0.5°C 0.25°C 0.125°C RFU
Default Value 0 0 0 0 0 0 0 0
R/W Access R R R R R R R R
Bit Symbol Description
15 CRITHIGH
0 = The temperature is less than the Critical Alarm Register setting.
1 = The temperature is greater than or equal to Critical Alarm Register setting.
When this bit is set to a Logic 1, it will automatically clear once the measured temperature
decreases below or is equal to the trip point minus any hysteresis set.
14 ALMHIGH
0 = The temperature is below the Upper Limit Register setting.
1 = The temperature is above the Upper Limit Register setting.
When the bit is set to a Logic 1, it will automatically clear once the measured temperature
decreases below or is equal to the trip point minus any hysteresis set.
13 ALMLOW
0 = The temperature is above the Lower Limit Register setting.
1 = The temperature is below the Lower Limit Register setting.
When the bit is set to a Logic 1, it will automatically clear once the measured temperature
increases above or is to equal to the trip point.
12 SIGN
Sign bit:
0 = The temperature is greater than or equal to 0°C.
1 = The temperature is less than 0°C.
11:1 TEMP
Temperature bits:
Represented in 2’s complement format.
The encoding of bits B11 through B2 is the same as in the limit and alarm registers.
0 RFU Reserved for Future Use. Read as Logic 0.
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6.2.7.1 Temperature Register Format
This section will clarify the Temperature Register format and temperature bit value assignments utilized for
temperature for the following registers: Upper Limit, Lower Limit, Critical Alarm, and Temperature Registers.
The temperatures expressed in the Upper Limit, Lower Limit, Critical Alarm, and Temperature Registers are
indicated in 2’s complement format. In each of the temperature limit registers, bits 12 through bit two are utilized
for temperature settings, or in the case of the Temperature Register, holds the internal temperature
measurement with bits 12 through bit one allowing 0.125ºC resolution.
Table 6-15 indicates the Temperature Register’s assigned bit values utilized for temperature and shows
examples for the Temperature Register bit values for various temperature readings.
Table 6-15. Temperature Register Format
Table 6-16. Temperature Register Examples
Position Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
Bit Value SIGN 128°C 64°C 32°C 16°C 8°C 4°C 2°C 1°C 0.5°C 0.25°C 0.125°C X
Temperature Register Value Examples
Temperature Binary (Bit 15 – Bit 0)
+125°C xxx0 0111 1101 00xx
+99.75°C xxx0 0110 0011 11xx
+85°C xxx0 0101 0101 00xx
+39°C xxx0 0010 0111 00xx
+15.75°C xxx0 0000 1111 11xx
+0.25°C xxx0 0000 0000 01xx
0°C xxx0 0000 0000 00xx
-0.25°C xxx1 1111 1111 11xx
-1°C xxx1 1111 1110 00xx
-20°C xxx1 1110 1100 00xx
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6.2.8 Manufacturer ID Register (16-bit Read-only, Address = 06h)
The Manufacturer ID Register contains the PCI SIG number assigned to Atmel (1114h) as shown in Table 6-17.
Table 6-17. Manufacturer ID Register Bit Distribution
6.2.9 Device ID Register (16-bit Read-only, Address = 07h)
The upper or high order byte is used to specify the device identification and the low byte is used to specify the
device revision. The Device ID for the AT30TSE004A is 2200h (see Table 6-18).
Table 6-18. Device ID Register Bit Distribution
Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8
Symbol Manufacturer ID
Default Value 00010001
R/W Access R R R R R R R R
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
Symbol Manufacturer ID
Default Value 00010100
R/W Access R R R R R R R R
Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8
Symbol Device ID
Default Value 0 0 1 0 0 0 1 0
R/W Access R R R R R R R R
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
Symbol Device Revision
Default Value 0 0 0 0 0 0 0 0
R/W Access R R R R R R R R
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6.3 Temperature Sensor Write Operations
Writing to the Temperature Register of the AT30TSE004A is accomplished through a modified Write operation
for two data bytes. To maintain 2-wire compatibility, the 16-bit registers are accessed through a Pointer Register
requiring the TS Write sequence to include a Pointer Register byte following the device address byte to write the
two data bytes. Figure 6-2 illustrates the entire Write transaction.
Figure 6-2. Temperature Sensor Register Write Operation
SCL
SDA
Start
by
Master
ACK
from
Slave
ACK
from
Slave
Device Address Byte Pointer Register Byte
MSB MSB
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
0 0 1 1 A2 A1 A0 0 0 0
Start
by
Master
ACK
from
Slave
ACK
from
Slave
Most Significant Data Byte Least Significant Data Byte
Stop
by
Master
MSB MSB
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
D15 D14 D13 D12 D11 D10 D9 D8 0 D7 D6 D5 D4 D3 D2 D1 D0 0
P7 P6 P5 P4 P3 P2 P1 P0
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6.4 Temperature Sensor Read Operations
Reading data from the temperature sensor may be accomplished in one of two ways:
If the location latched in the Pointer Register is correct (for normal operation, it is expected the same
address will be read repeatedly to read the temperature from the Temperature Register), the Register
Pointer Word Read sequence should be utilized as shown in Figure 6-3. To perform a Register Pointer
Word Read, the Master transmits a Start condition followed by a device address byte with the R/W select
bit to a Logic 1. The AT30TSE004A should respond with an ACK and will transmit the most significant
data byte. The Master should send an ACK followed by the device transmitting the least significant data
byte. To end the Read operation, the Master sends a NACK followed by a Stop condition.
If it is desired to Read a Random Register or simply change to read a different register from the
temperature sensor, then the Preset Pointer Register Word Read protocol sequence should be followed
and is shown in Figure 6-4. The Preset Pointer Register Word Read sequence allows the Pointer Register
to be preloaded with the correct register address to gain access to the desired register to be read. To
perform a Preset Pointer Register Word Read, the Master transmits a Start condition followed by a device
address byte (with the R/W select bit to a Logic 0) and a Pointer Register byte to the AT30TSE004A.
Once the device address and Pointer Register bytes are clocked in and acknowledged by the
AT30TSE004A, the Master must generate another Start condition. The Master transmits another device
address byte (with the R/W select bit to a Logic 1) followed by an ACK by the AT30TSE004A and the
device transmitting the most significant data byte. The Master should send a ACK followed by the device
transmitting the least significant data byte. To end the Read operation, the Master should send a NACK
followed by a Stop condition.
Figure 6-3. Register Pointer Word Read
Figure 6-4. Preset Pointer Register Word Read
SCK
SDA
Start
by
Master
ACK
from
Slave
NACK
from
Master
Stop
by
Master
ACK
from
Master
Device Address Byte Most Significant Data Byte Least Significant Data Byte
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
0 0 1 1 A2 A1 A0 1 0 D15 D14 D13 D12 D11 D10 D9 D8 0 D7 D6 D5 D4 D3 D2 D1 D0 1
MSB MSB MSB
SCL
SDA
Start
by
Master
Start
by
Master
ACK
from
Slave
ACK
from
Slave
Device Address Byte Pointer Register Byte
MSB MSB
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
0 0 1 1 A2 A1 A0 0 0 0
ACK
from
Slave
Device Address Byte
MSB
1 2 3 4 5 6 7 8 9
0 0 1 1 A2 A1 A0 1 0
NACK
from
Master
ACK
from
Master
Most Significant Data Byte Least Significant Data Byte
Stop
by
Maste
r
MSB MSB
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
D15 D14 D13 D12 D11 D10
D9 D8 0 D7 D6 D5 D4 D3 D2 D1 D0 1
P7 P6 P5 P4 P3 P2 P1 P0
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26
7. Serial EEPROM
7.1 Memory Organization
To provide the greatest flexibility and backwards compatibility with the previous generations of SPD devices, the
AT30TSE004A memory organization is organized into two independent 2-Kbit memory arrays. Each 2-Kbit
(256-byte) section is internally organized into two independent quadrants of 128 bytes with each quadrant
comprised of eight pages of 16 bytes. Including both memory sections, there are four 128-byte quadrants
totaling 512 bytes. The Memory Array organization details are shown in Section on page 6 and Table 7-1.
7.1.1 Set Page Address and Read Page Address Commands
The AT30TSE004A incorporates an innovative memory addressing technique that utilizes a Set Page Address
(SPA) and Read Page Address (RPA) commands to select and verify the desired half of the memory is enabled
to perform Write and Read operations.
Example: If SPA = 0, then the first-half or lower 256 bytes of the Serial EEPROM is selected allowing
access to Quadrant 0 and Quadrant 1. Alternately, if SPA = 1, then the second-half or upper 256
bytes of the Serial EEPROM is selected allowing access to Quadrant 2 and Quadrant 3.
Table 7-1. Set Page Address and Memory Organization
Note: Due to the requirement for the A0 pin to be driven to VHV, the SPA and the RPA commands are fully supported in a
single DIMM (isolated DIMM) end application or a single DIMM programming station only.
Setting the Set Page Address (SPA) value selects the desired half of the EEPROM for performing Write or Read
operations. This is done by sending the SPA as seen in Figure 7-1. The SPA command sequence requires the
Master to transmit a Start condition followed by sending a control byte of ‘011011*0’ where the ‘*’ in the bit
7 position will dictate which half of the EEPROM is being addressed. A ‘0’ in this position (or 6Ch) is required
to set the page address to the first half of the memory and a ‘1’ (or 6Eh) is necessary to set the page address
to the second half of the memory. After receiving the control byte, the AT30TSE004A should return an ACK and
the Master should follow by sending two data bytes of don’t care values. The AT30TSE004A responds with a
ACK to each of these two data bytes although the JEDEC TSE2004av specification allows for either an ACK or
NACK response. The protocol is completed by the Master sending a Stop condition to end the operation.
Figure 7-1. Set Page Address (SPA)
Block Set Page Address (SPA) Memory Address Locations
Quadrant 0 0 00h to 7Fh
Quadrant 1 0 80h to FFh
Quadrant 2 1 00h to 7Fh
Quadrant 3 1 80h to FFh
SCL
SDA
Start
by
Master
ACK
from
Slave
ACK
from
Slave
Stop
by
Master
ACK
from
Slave
Control Byte Address Byte Data Byte
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
0 1 1 0 1 1 * 0 0 X X X X X X X X 0 X X X X X X X X 0
MSB MSB MSB
Bit * = 1: Indicates the page address is located in the second half of the memory.
Bit * = 0: Indicates the page address is located in the first half of the memory.
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Reading the state of the SPA can be accomplished via the Read Page Address (RPA) command. The Master
can issue the RPA command to determine if the AT30TSE004A’s internal address counter is located in the first
2-Kbit section or the second 2-Kbit memory section based upon the device’s ACK or NACK response to the
RPA command.
The RPA command sequence requires the Master to transmit a Start condition followed by a control byte of
‘01101101’(6Dh). The device’s current address counter (page address) is located in the first half of the
memory if the AT30TSE004A responds with an ACK to the RPA command. Alternatively, if the device’s
response to the RPA command is a NACK, indicates the page address is located in the second half of the
memory (see Figure 7-2). Following the control byte and the device’s ACK or NACK response, the
AT30TSE004A should transmit two data bytes of don’t care values. The Master should NACK on these two data
bytes followed by the Master sending a Stop condition to end the operation.
After power-up, the SPA is set to zero indicating internal address counter is located in the first half of the
memory. Performing a software reset (see Section 4.8 “2-wire Software Reset” on page 10) will also set the
SPA to zero.
The AT30TSE004A incorporates a Reversible Software Write Protect (RSWP) feature that allows the ability to
selectively write protect data stored in any or all of the four Serial EEPROM 128-byte quadrants. See
Section 7.3 “Write Protection” on page 32 for more information on the RSWP feature.
Figure 7-2. Read Page Address (RPA)
SCL
SDA
Start
by
Master
ACK or NACK
from
Slave
NACK
from
Master
Stop
by
Master
NACK
from
Master
Control Byte Most Significant Data Byte Least Significant Data Byte
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
0 1 1 0 1 1 0 1 * X X X X X X X X 1 X X X X X X X X 1
MSB MSB MSB
Bit * = 1: NACK indicates the device’s internal address counter is located in the second half of the memory.
Bit * = 0: ACK indicates the device’s internal address counter is located in the first half of the memory.
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28
7.2 Serial EEPROM Write Operations
The 4-Kbit Serial EEPROM within the AT30TSE004A supports single Byte Write and Page Write operations up to the
maximum page size of 16 bytes in one operation. The only difference between a Byte Write and a Page Write
operation is the amount of data bytes loaded. Regardless of whether a Byte Write or Page Write operation is
performed, the internally self-timed write cycle will take the same amount of time to write the data to the addressed
memory location(s). Temperature sensor operations can be accessed during the write cycle to read the Temperature
Register or perform any other temperature sensor function.
Caution: All Byte Write and Page Write operations should be preceded by the SPA and or RPA commands to
ensure the internal address counter is located in the desired half of the memory.
If a Byte Write or Page Write operation is attempted to a protected quadrant, then the AT30TSE004A will
respond (ACK or NACK) to the Write operation according to Table 7-2.
Table 7-2. Serial EEPROM Acknowledge Status When Writing Data or Defining Write Protection
Quadrant
Status
Instruction
Sent
Instruction
Response
Word
Address
Sent
Word
Address
Response
Data Word
Sent
Data Word
Response
Write
Cycle
Write Protected
with Set RSWP
Set RSWP NACK Don’t Care NACK Don’t Care NACK No
Clear RSWP ACK Don’t Care ACK Don’t Care ACK Yes
Byte Write or
Page Write to
Protected Quadrant
ACK Word
Address ACK Data NACK No
Not Protected
Set RSWP or
Clear RSWP ACK Don’t Care ACK Don’t Care ACK Yes
Byte Write or
Page Write ACK Word
Address ACK Data ACK Yes
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7.2.1 Byte Write
Following the Start condition from the Master, the device type identifier (‘1010’), the device address bits and
the R/W select bit (set to a Logic 0) are clocked onto the bus by the Master (see Figure 7-3). This indicates to
the addressed device that the Master will follow by transmitting a byte with the word address. The
AT30TSE004A will respond with an ACK during the ninth clock cycle. Then the next byte transmitted by the
Master is the 8-bit word address of the byte location to be written into the Serial EEPROM. After receiving an
ACK from the AT30TSE004A, the Master transmits the data word to be programmed followed by an ACK from
the AT30TSE004A. The Master ends the Write sequence with a Stop condition during the 10th clock cycle to
initiate the internally self-timed write cycle. A Stop condition issued during any other clock cycle during the Write
operation will not trigger the internally self-timed write cycle. Once the write cycle begins, the pre-loaded data
word will be programmed in the amount of time not to exceed the tWR specification. The tWR time is defined in
more detail in Section 7.2.4 on page 31. During this time, the Master should wait a fixed amount of time set to
the tWR specification, or for time sensitive applications, an ACK polling routine can be implemented (see
Figure 7-5 on page 31). All inputs are ignored by the Serial EEPROM during the write cycle and the Serial
EEPROM will not respond until the write cycle is complete. The Serial EEPROM will increment its internal
address counter each time a byte is written.
Note: The temperature sensor operations can be accessed during the write cycle to read the Temperature Register or
perform any other temperature sensor function.
Figure 7-3. Byte Write to Serial EEPROM
SCL
SDA
Device Address Byte Word Address Byte Data Word
Start
by
Master
ACK
from
Slave
ACK
from
Slave
MSB MSB
ACK
from
Slave
Stop
by
Maste
r
MSB
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
1 0 1 0 A2 A1 A0 0 0 A7 A6 A5 A4 A3 A2 A1 A0 0 D7 D6 D5 D4 D3 D2 D1 D0 0
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7.2.2 Page Write
The 4-Kbit Serial EEPROM is capable of writing up to 16 data bytes at a time executing the Page Write protocol
sequence (see Figure 7-4). A partial or full Page Write operation is initiated the same as a Byte Write operation
except that the Master does not send a Stop condition after the first data word is clocked in. Instead, after the
Serial EEPROM has acknowledged receipt of the first data word, the Master can transmit up to fifteen more data
words. The device will respond with an ACK after each data word is received. The lower four bits of the data
word address are internally incremented following the receipt of each data word. The higher data word address
bits are not incremented, retaining the memory page row location. When the internally generated word address
reaches the page boundary, then the following data word is placed at the beginning of the same page. If more
than sixteen data words are transmitted to the Serial EEPROM, the data word address will roll-over and the
previous data will be overwritten. The address roll-over during a Write sequence is from the last byte of the
current page to the first byte of the same page.
The Master ends the Page Write sequence with a Stop condition during the 10th clock cycle to initiate the
internally self-timed write cycle. A Stop condition issued during any other clock cycle during the Write operation
will not trigger the internally self-timed write cycle. Once the write cycle begins, the pre-loaded data words will
be programmed in the amount of time not to exceed the tWR specification. All inputs are ignored by the Serial
EEPROM during the write cycle and the Serial EEPROM will not respond until the write cycle is complete. The
tWR time is defined in more detail in Section 7.2.4 on page 31. During this time, the Master should wait a fixed
amount of time set to the tWR specification, or for time sensitive applications, an ACK polling routine can be
implemented (see Figure 7-5 on page 31).
Figure 7-4. Page Write to Serial EEPROM
SCL
SDA
Start
by
Master
ACK
from
Slave
ACK
from
Slave
Device Address Byte Word Address Byte
MSB MSB
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
1 0 1 0 A2 A1 A0 0 0 0
ACK
from
Slave
ACK
from
Slave
Stop
by
Master
ACK
from
Slave
Data Word (n) Data Word (n+1) Data Word (n+15)
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
D7 D6 D5 D4 D3 D2 D1 D0 0 D7 D6 D5 D4 D3 D2 D1 D0 0 D7 D6 D5 D4 D3 D2 D1 D0 0
MSB MSB MSB
A7 A6 A5 A4 A3 A2 A1 A0
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7.2.3 Acknowledge (ACK) Polling
An ACK polling routine can be implemented to optimize time sensitive applications that would not prefer waiting
the fixed maximum write cycle time and would prefer to know immediately when the Serial EEPROM write cycle
has completed to start a subsequent operation. Once the internally self timed write cycle has started (the Stop
condition during the 10th clock cycle at the end of the Write sequence), the Serial EEPROM inputs are disabled
and ACK polling can be initiated (see Figure 7-5). An ACK polling routine involves sending a valid Start
condition followed by the device address byte. While the write cycle is in progress, the device will not respond
with an ACK indicating the Serial EEPROM is busy writing data. Once complete, the device will ACK and the
next device operation can be started.
Note: The temperature sensor operations can be accessed during the write cycle to read the Temperature Register or
perform any other user desired temperature sensor operation.
Figure 7-5. Acknowledge Polling Flow Chart
7.2.4 Write Cycle Timing
The length of the self timed write cycle, or tWR, is defined as the amount of time from a valid Stop condition that
begins the internal write sequence to the Start condition of the first device address byte sent to the
AT30TSE004A that it subsequently responds to with an ACK. Figure 7-6 has been included to show this
measurement.
Figure 7-6. Write cycle Timing
Did
the Device
ACK?
Send Any
Write
Protocol
Send
Stop
Condition
to Initiate
Write Cycle
Send Start
Condition
Followed
by Valid
Device Address
Byte
Continue to
Next Operation
NO
YES
tWR
Stop
Condition
Start
Condition
Data Word n
ACKD0
SDA
Stop
Conditio
n
SCL 89
ACK
First Acknowledge from the device
to a valid device address sequence after
write cycle is initiated. The minumum t
WR
can only be determined through
the use of an ACK Polling routine.
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7.3 Write Protection
The AT30TSE004A incorporates a Reversible Software Write Protection (RSWP) feature that allows the ability
to selectively write protect data stored in each of the four independent 128-byte Serial EEPROM quadrants.
Table 7-3 identifies the memory quadrant identifier with its associated quadrant, SPA and memory address
locations.
The AT30TSE004A has three RSWP software commands:
Set RSWP command for setting the RSWP.
Clear RSWP command for resetting all of the quadrants that are software write protected.
Read RSWP command for reading the RSWP status.
Table 7-3. Serial EEPROM Memory Organization
7.3.1 Set RSWP
Setting the RSWP is enabled by sending the Set RSWP command, similar to a normal Write command to the
device which programs the Write Protection to the target quadrant. The Set RSWP sequence requires sending
a control byte of ‘0110MMM0’ (where the ‘M’ represents the memory quadrant identifier for the target quadrant
to be write-protected) with the R/W bit set to a Logic 0. In conjunction with sending the protocol, the A0 pin must
be connected to VHV for the duration of RSWP sequence (see Figure 7-7 and Section 8.2). The Set RSWP
command acts on a single quadrant only as specified in the Set RSWP command and can only be reversed by
issuing the Clear RSWP command and will unprotect all quadrants in one operation (see Table 7-4).
Example: If Quadrant 0 and Quadrant 3 are to be write-protected, two separate Set RSWP commands
would be required; however, only one Clear RSWP command is needed to clear and unprotect
both quadrants.
Table 7-4. Set RSWP and Clear RSWP
Notes: 1. X = Don’t care but recommend to be hard-wired to VCC or GND.
2. See Section 8.2 for the VHV values.
3. Due to the requirement for the A0 pin to be driven to VHV, the Set RSWP and Clear RSWP commands are fully
supported in a single DIMM (isolated DIMM) end application or single DIMM programming station only.
Block SPA Address Locations
Memory Quadrant
Identifier
Quadrant 0 0 00h to 7Fh 001
Quadrant 1 0 80h to FFh 100
Quadrant 2 1 00h to 7Fh 101
Quadrant 3 1 80h to FFh 000
Function
Pin
Control Byte
Device Type Identifier
Memory Quadrant
Identifier R/W
A2A1A0Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
Set RSWP, Quadrant 0 X X
VHV 0 1 1 0
0 0 1 0
Set RSWP, Quadrant 1 X X 1 0 0 0
Set RSWP, Quadrant 2 X X 1 0 1 0
Set RSWP, Quadrant 3 X X 0 0 0 0
Clear RSWP X X 0 1 1 0
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Figure 7-7. Set RSWP and Clear RSWP
7.3.2 Clear RSWP
Similar to the Set RSWP command, the reversible write protection on all quadrants can be reversed or
unprotected by transmitting the Clear RSWP command. The Clear RSWP sequence requires the Master to
send a Start condition followed by sending a control byte of ‘01100110’ (66h) with the R/W bit set to a Logic 0.
The AT30TSE004A should respond with an ACK. The Master transmits a word address byte and data bytes
with don’t care values. The AT30TSE004A will respond with either an ACK or NACK to both the word address
and data word. In conjunction with sending the protocol, the A0 pin must be connected to VHV for the duration of
the Clear RSWP command (see Figure 7-7 and Section 8.2). To end the Clear RSWP sequence, the Master
sends a Stop condition.
Caution: The write protection of individual quadrants cannot be reversed separately, and executing the Clear
RSWP command will clear the write protection on all four quadrants leaving all quadrants with no
software write protection.
7.3.3 Read RSWP
The Read RSWP command allows the ability to check a quadrant’s write protection status. To find out if the
Software Write Protection has been set to a specific quadrant, the same procedure that was used to set the
quadrant’s write protection can be utilized except that the R/W select bit is set to a Logic 1, and the A0 pin is not
required to have VHV (see Table 7-6).
The Read RSWP sequence requires sending a control byte of ‘0110MMM1’ (where the ‘M’ represents the
memory quadrant identifier for the quadrant to be read) with the R/W bit set to a Logic 1 (see Figure 7-8).
If the RSWP has not been set, then the AT30TSE004A responds to the control byte with an ACK, and responds
to the word address byte and data word with a NACK. If the RSWP has been set, the AT30TSE004A responds
to all three bytes (control, word address, and data bytes) with a NACK as shown in Table 7-5.
Table 7-5. Serial EEPROM Acknowledge When Reading Protection Status
SCL
SDA
Start
by
Master
ACK
from
Slave
ACK or NACK
from
Slave
Stop
by
Maste
r
ACK or NACK
from
Slave
Control Byte Word Address Byte Data Word
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
0 1 1 0 M M M 0 0 X X X X X X X X 0/1 X X X X X X X X 0/1
MSB MSB MSB
X = Don’t care
M = Memory Quadrant Identifier
Quadrant
Status
Instruction
Sent
Instruction
Response
Word Address
Sent
Word Address
Response
Data Word
Sent
Data Word
Response
Write Protected Read RSWP NACK Don’t Care NACK Don’t Care NACK
Not Protected Read RSWP ACK Don’t Care NACK Don’t Care NACK
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34
Table 7-6. Read RSWP
Notes: 1. X= Don’t care but recommend to be hard-wired to VCC or GND.
2. See Section 8.2 for the VHV values.
Figure 7-8. Read RSWP
7.4 Serial EEPROM Read Operations
All Read operations are initiated by the Master transmitting a Start bit, a device type identifier of ‘1010’ (Ah),
three software address bits (A2, A1, and A0) that match their corresponding hard-wired address pins (A2, A1,
and A0), and the R/W select bit with a Logic 1 state. In the following clock cycle, the device should respond with
an ACK. The subsequent protocol depends on the type of Read operation desired. There are three Read
operations:
Current Address Read
Random Address Read
Sequential Read
Caution: All Read operations should be preceded by the SPA and or RPA commands to ensure the desired half of
the memory is selected. The reason this is important, for example, during a Sequential Read operation
on the last byte in the first half of the memory (address FFh) with SPA=0 (indicating first half is selected),
the internal address counter will roll-over to address 00h in the first half of memory as opposed to the first
byte in the second half of the memory. For more information on the SPA and RPA commands, see
Section 7.1.1 “Set Page Address and Read Page Address Commands” on page 26.
Function
Pin
Control Byte
Device Type Identifier
Memory Quadrant
Identifier R/W
A2A1A0B7 B6 B5 B4 B3 B2 B1 B0
Read RSWP, Quadrant 0 X X
0, 1
or
VHV
0 1 1 0
0 0 1 1
Read RSWP, Quadrant 1 X X 1 0 0 1
Read RSWP, Quadrant 2 X X 1 0 1 1
Read RSWP, Quadrant 3 X X 0 0 0 1
SCK
SDA
Start
by
Master
ACK or NACK
from
Slave
NACK
from
Master
Stop
by
Master
NACK
from
Master
Control Byte Word Address Byte Data Byte
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
0 1 1 0 M M M 1 0/1 X X X X X X X X 1 X X X X X X X X 1
MSB MSB MSB
X = Don’t care
M = Memory Quadrant Identifier
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7.4.1 Current Address Read
Following a Start condition, the Master only transmits the device address byte with the R/W select bit set to a
Logic 1 (see Figure 7-9). The AT30TSE004A should respond with an ACK and then serially transmits the data
word addressed by the internal address counter. The internal data word address counter maintains the last
address accessed during the last Read or Write operation, incremented by one. This address stays valid
between operations as long as power to the device is maintained. The address roll-over during a Read is from
the last byte of the last page to the first byte of the first page of the addressed 2-Kbit (depends on the current
SPA setting). To end the command, the Master does not respond with an ACK but does generate a following
Stop condition.
Figure 7-9. Current Address Read from Serial EEPROM
7.4.2 Random Read
A Random Read operation allows the Master to access any memory location in a random manner and requires
a dummy write sequence to preload the starting data word address. To perform a Random Read, the device
address byte and the word address byte are transmitted to the AT30TSE004A as part of the dummy Write
sequence (see Figure 7-10). Once the device address byte and data word address are clocked in and
acknowledged by the AT30TSE004A, the Master must generate another Start condition. The Master initiates a
Current Address Read by sending another device address byte with the R/W select bit to a Logic 1. The
AT30TSE004A acknowledges the device address byte, increments its internal address counter and serially
clocks out the first data word. The device will continue to transmit sequential data words as long as the Master
continues to ACK each data word. To end the sequence, the Master responds with a NACK and a Stop
condition.
Figure 7-10. Random Read from Serial EEPROM
SCL
SDA
Device Address Byte Data Word (n)
Start
by
Master
ACK
from
Slave
NACK
from
Master
Stop
by
Master
MSB MSB
1 0 1 0 A2 A1 A0 1 0 D7 D6 D5 D4 D3 D2 D1 D0 1
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
SCL
SDA
Start
by
Master
ACK
from
Slave
ACK
from
Slave
Device Address Byte Word Address Byte
MSB MSB
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
1 0 1 0 A2 A1 A0 0 0 0
Dummy Write
Start
by
Master
ACK
from
Slave
NACK
from
Master
Device Address Byte Data Word (n)
Stop
by
Maste
r
MSB MSB
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
1 0 1 0 A2 A1 A0 1 0 D7 D6 D5 D4 D3 D2 D1 D0 1
A7 A6 A5 A4 A3 A2 A1 A0
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36
7.4.3 Sequential Read
A Sequential Read operation is initiated in the same way as a Random Read operation, except after the
AT30TSE004A transmits the first data word, the Master responds with an ACK (instead of a NACK followed by
a Stop condition). As long as the AT34TSE004A receives an ACK, it will continue to increment the data word
address and serially clock out the sequential data words (see Figure 7-11). When the internal address counter is
at the last byte of the last page, the data word address will roll-over to the beginning of the selected 2-Kbit array
(depending on the SPA setting) starting at address zero, and the Sequential Read operation will continue. The
Sequential Read operation is terminated when the Master responds with a NACK followed by a Stop condition.
Figure 7-11. Sequential Read from Serial EEPROM
SCL
SDA
Start
by
Master
ACK
from
Slave
ACK
from
Master
Device Address Byte Data Word (n)
MSB MSB
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
1 0 1 0 A2 A1 A0 1 0 D7 D6 D5 D4 D3 D2 D1 D0 0
ACK
from
Master
NACK
from
Master
Stop
by
Master
ACK
from
Master
Data Word (n+1) Data Word (n+2) Data Word (n+x)
1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9 1 2 3 4 5 6 7 8 9
D7 D6 D5 D4 D3 D2 D1 D0 0 D7 D6 D5 D4 D3 D2 D1 D0 0 D7 D6 D5 D4 D3 D2 D1 D0 1
MSB MSB MSB
37
AT30TSE004A [DATASHEET]
Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015
8. Electrical Specifications
8.1 Absolute Maximum Ratings*
8.2 DC Characteristics
Applicable over recommended operating range: TAI = -20°C to +125°C, VCC = 1.7V to 3.6V (unless otherwise noted).
Notes: 1. VIL min and VIH max are reference only and are not tested.
2. TS in Shutdown mode.
3. Serial EEPROM inactive, TS in Shutdown mode.
Temperature under Bias. . . . . . . -40°C to +125°C
Storage Temperature . . . . . . . . -65°C to +150°C
Supply voltage
with respect to ground . . . . . . . . . . -0.5V to +4.3V
A0 Pin . . . . . . . . . . . . . . . . . . . . . -0.5V to +12.0V
All other input voltages
with respect to ground . . . . . . -0.5V to VCC + 0.5V
EVENT Pin . . . . . . . . . . . . . .-0.5V to VCC + 0.3V
All other output voltages
with respect to ground . . . . . . -0.5V to VCC + 0.5V
*Notice: Stresses beyond those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
Functional operation of the device at these ratings or any
other conditions beyond those indicated in the operational
sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods
may affect device reliability. Voltage extremes referenced in
the “Absolute Maximum Ratings” are intended to
accommodate short duration undershoot/overshoot
conditions and does not imply or guarantee functional
device operation at these levels for any extended period of
time.
Pull-up voltages applied to the EVENT Pin that exceed the
“Absolute Maximum Ratings” may forward bias the ESD
protection circuitry. Doing so may result in improper device
function and may corrupt temperature measurements.
Symbol Parameter Test Condition Min Typ Max Units
VCC1 Supply Voltage 1.7 3.6 V
VCC2 Supply Voltage 2.2 3.6 V
ICC1 Supply Current(2) VCC = 3.6V Read at 100kHz 0.4 1.0 mA
ICC2 Supply Current(2) VCC = 3.6V Write at 100kHz 1.5 3.0 mA
ICC3 Temp Sensor VCC = 3.6V EE Inactive 0.2 0.5 mA
ISB Standby Current(3) VCC = 1.7V VIN = VCC or VSS 1.6 3.0 μA
VCC = 3.6V VIN = VCC or VSS 1.6 4.0 μA
ILI Input Leakage Current VIN = VCC or VSS 0.1 2.0 μA
ILO Output Leakage Current VOUT = VCC or VSS 0.1 2.0 μA
VIL Input Low Level(1) -0.5 0.3 * VCC V
VIH Input High Level(1) 0.7 * Vcc Vcc + 0.5 V
VOL1 Low-Level Output Voltage
Open-Drain
VCC > 2V IOL = 3mA 0.4 V
VOL2 VCC 2V IOL = 2mA 0.2 * VCC V
IOL Low-Level Output Current
VOL = 0.4V Freq 400kHz 3.0 mA
VOL = 0.6V Freq 400kHz 6.0 mA
VOL = 0.4V Freq > 400kHz 20.0 mA
VHV A0 Pin High Voltage VHV - VCC 4.8V 7 10 V
VHYST1 Input Hysteresis (SDA, SCL) VCC < 2V 0.10 * VCC V
VHYST2 Input Hysteresis (SDA, SCL) VCC 2V 0.05 * VCC V
AT30TSE004A [DATASHEET]
Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015
38
8.3 AC Characteristics
Notes: 1. This parameter is ensured by characterization only.
2. The minimum frequency is specified at 10kHz to avoid activating the timeout feature.
Figure 8-1. SCL: Serial Clock
SDA: Serial Data I/O
Applicable over recommended operating range: TAI = -20°C to +125°C, VCC = 1.7V to 3.6V, CL = 1 TTL Gate and 100μF
(unless otherwise noted).
Symbol Parameter
VCC < 2.2V VCC 2.2V
Units
100kHz 400kHz 1000kHz
Min Max Min Max Min Max
fSCL Clock Frequency, SCL 10(2) 100 10(2) 400 10(2) 1000 kHz
tLOW Clock Pulse Width Low 4700 1300 500 ns
tHIGH Clock Pulse Width High 4000 600 260 ns
tINoise Suppression Time 50 50 50 ns
tBUF
Time the bus must be free before a
new transmission can start(1) 4700 1300 500 ns
tHD.STA Start Hold Time 4000 600 260 ns
tSU.STA Start Set-up Time 4700 600 260 ns
tHD.DI Data In Hold Time 0 0 0 ns
tSU.DAT Data In Set-up Time 250 100 50 ns
tRInputs Rise Time(1) 1000 20 300 120 ns
tFInputs Fall Time(1) 300 20 300 120 ns
tSU.STO Stop Set-up Time 4000 600 260 ns
tHD.DAT Data Out Hold Time 200 3450 200 900 0 350 ns
tWR Write Cycle Time 5 5 5 ms
tOUT Timeout Time 25 35 25 35 25 35 ms
EEPROM
Write Endurance 25°C, Page Mode(1) 1,000,000 Write
Cycles
SCL
SDA
tF
tHIGH
tLOW tLOW
tR
tBUF
tSU.STO
tSU.DAT
tHD.DAT
tHD.STA
tSU.STA
39
AT30TSE004A [DATASHEET]
Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015
8.4 Temperature Sensor Characteristics
8.5 Pin Capacitance(1)
Note: 1. This parameter is ensured by characterization only.
Applicable over recommended operating range: TAI = -20°C to +125°C, VCC = 1.7V to 3.6V (unless otherwise noted).
Symbol Parameter Test Condition
Freq. 400kHz Freq. > 400kHz
UnitsMin Typ Max Min Typ Max
TACC
TS Accuracy
(B-grade)
+75°C < Ta < +95°C ±0.5 ±1.0 ±0.5 ±1.0 °C
+40°C < Ta < +125°C ±1.0 ±2.0 ±1.0 ±2.0 °C
-20°C < Ta < +125°C ±2.0 ±3.0 ±2.0 ±3.0 °C
TCONV TS Conversion Time 75.0 125.0 75.0 125.0 ms
TRES TS Resolution 0.125 0.125 °C
Applicable over recommended operating range from TA = +25°C, f = 1MHz, VCC = 1.7V – 3.6V.
Symbol Test condition Max Units Conditions
CI/O Input/Output Capacitance (SDA, EVENT) 8 pF VI/O = 0V
CIN Input Capacitance (A0, A1, A2, SCL) 6 pF VIN = 0V
AT30TSE004A [DATASHEET]
Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015
40
9. Ordering Code Detail
10. Ordering Information
Notes: 1. Consistent with the general semiconductor market trend, Atmel will supply devices with either gold or copper
bond wires to increase manufacturing flexibility and ensure a long-term continuity of supply. There is no
difference in product quality, reliability, or performance between the two variations.
2. T = Tape and Reel
UDFN and WDFN= 5,000 per reel
AT30TSE004A-MA5M-T
Atmel Designator
Product Family
Device Density
Shipping Carrier Option
Device Grade
Package Option
4 = 4-kilobit
30TSE = Digital Temperature Sensor
with Integrated EEPROM
B = Bulk (Tubes)
T = Tape and Reel
5 = Green, NiPdAu Lead Finish
Temperature Range
(-20°C to +125°C)
MA = 8-lead, 2.0 x 3.0 x 0.6mm (UDFN)
MAA = 8-lead, 2.0 x 3.0 x 0.8mm (WDFN
)
Sensor Type
Device Revision
M = 1.7V to 3.6V
Voltage Option
Ordering Code(1) Package Lead Finish
Operating
Voltage Max. Frequency
Operational
Range
AT30TSE004A-MA5M-T(2) 8MA2
NiPdAu 1.7V to 3.6V 1000kHz –20C to 125C
AT30TSE004A-MAA5M-T(2) 8MAA
Package Type
8MA2 8-lead, 2.0 x 3.0 x 0.6mm, Thermally Enhanced Plastic Ultra Thin Dual Flat No Lead (UDFN)
8MAA 8-lead, 2.0 x 3.0 x 0.8mm, Thermally Enhanced Plastic Very Very Thin Dual Flat No Lead (WDFN)
41
AT30TSE004A [DATASHEET]
Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015
11. Part Markings
DRAWING NO. REV. TITLE
30TSE004A A
3/8/13
30TSE004ASM, AT30TSE004A Package Marking Information
Package Mark Contact:
DL-CSO-Assy_eng@atmel.com
AT30TSE004A: Package Marking Information
Catalog Number Truncation
AT30TSE004A Truncation Code ###: T8A
Date Codes Voltages
Y = Year M = Month WW = Work Week of Assembly % = Minimum Voltage
2: 2012 6: 2016 A: January 02: Week 2 M: 1.7V min
3: 2013 7: 2017 B: February 04: Week 4
4: 2014 8: 2018 ... ...
5: 2015 9: 2019 L: December 52: Week 52
Country of Assembly Lot Number Grade/Lead Finish Material
@ = Country of Assembly AAA...A = Atmel Wafer Lot Number 5: Industrial
(-20°C to 125°C)
NiPdAu
Trace Code Atmel Truncation
XX = Trace Code (Atmel Lot Numbers Correspond to Code) AT: Atmel
Example: AA, AB.... YZ, ZZ ATM: Atmel
ATML: Atmel
8-lead UDFN
T8A
5M@
YXX
2.0 x 3.0 mm Body
Note 2: Package drawings are not to scale
Note 1: Designates pin 1
8-lead WDFN
T8A
5M@
YXX
2.0 x 3.0 mm Body
AT30TSE004A [DATASHEET]
Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015
42
12. Package Drawings
12.1 8MA2 — 8-pad UDFN
DRAWING NO. REV. TITLE GPC
8MA2 G
11/26/14
8MA2, 8-pad 2 x 3 x 0.6mm Body, Thermally
Enhanced Plastic Ultra Thin Dual Flat No-Lead
Package (UDFN)
YNZ
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
A 0.50 0.55 0.60
A1 0.0 0.02 0.05
A2 - - 0.55
D 1.90 2.00 2.10
D2 1.40 1.50 1.60
E 2.90 3.00 3.10
E2 1.20 1.30 1.40
b 0.18 0.25 0.30 3
C 1.52 REF
L 0.30 0.35 0.40
e 0.50 BSC
K 0.20 - -
TOP VIEW
SIDE VIEW
BOTTOM VIEW
Package Drawing Contact:
packagedrawings@atmel.com
C
E
Pin 1 ID
D
8
7
6
5
1
2
3
4
A
A1
A2
D2
E2
e (6x)
L (8x)
b (8x)
Pin#1 ID
K
1
2
3
4
8
7
6
5
Notes: 1. This drawing is for general information only. Refer to
Drawing MO-229, for proper dimensions, tolerances,
datums, etc.
2. The Pin #1 ID is a laser-marked feature on Top View.
3. Dimensions b applies to metallized terminal and is
measured between 0.15 mm and 0.30 mm from the
terminal tip. If the terminal has the optional radius on
the other end of the terminal, the dimension should
not be measured in that radius area.
4. The Pin #1 ID on the Bottom View is an orientation
feature on the thermal pad.
43
AT30TSE004A [DATASHEET]
Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015
12.2 8MAA — 8-pad WDFN
DRAWING NO. REV. TITLE GPC
8MAA A
09/11/12
8MAA, 8-pad 2.0 x 3.0mm Body, 0.50mm Pitch
Very, Very Thin Dual No Lead Package
(WDFN) (Sawn)
YRV
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL MIN NOM MAX NOTE
A 0.70 0.75 0.80
A1 0.00 0.02 0.05
A2 0.45 0.55 0.65
A3 2.0 REF
D 1.90 2.00 2.10
D2 1.20 - 1.60
E 2.90 3.00 3.10
E2 1.20 - 1.60
b 0.18 0.25 0.30 2
L 0.30 0.45
e 0.50 BSC
TOP VIEW
SIDE VIEW
BOTTOM VIEW
Package Drawing Contact:
packagedrawings@atmel.com
Notes: 1. This drawing is for general information only. Refer to JEDEC
Drawing MO-229, WCED-3, for proper dimensions,
tolerances, datums, etc.
2. Dimension b applies to metallized terminal and is measured
between 0.15 mm and 0.30 mm from the terminal tip. If the
terminal has the optional radius on the other end of the terminal,
the dimension should not be measured in that radius area.
3. Soldering the large thermal pad is optional, but not recommended.
No electrical connection is accomplished to the device through
this pad, so if soldered it should be tied to ground
A2
b
(8X)
Pin 1 ID
Pin 1
Index
Area
A1
A3
D
E
A
L (8X)
e (6X)
1.50 REF.
D2
E2
AT30TSE004A [DATASHEET]
Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015
44
13. Revision History
FunctionZZ_Summary Notes
Doc. Rev. Date Comments
8868D 10/2015 Updated the Set Page Address and Read Page Address Commands, AC Characteristics
table, and the 8MA2 package drawing.
8868C 12/2013 Updated Section, “Power-up Conditions” and Figure, “Power-up Timing”.
8868B 07/2013 Updated the Absolute Maximum Ratings.
8868A 04/2013 Initial document release.
X
XXX
XX
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© 2015 Atmel Corporation. / Rev.: Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015.
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