MM Series - MLCC for Medical Applications General Specifications The AVX MM series is a multi-layer ceramic capacitor designed for use in medical applications other than implantable/life support. These components have the design & change control expected for medical devices and also offer enhanced LAT including reliability testing and 100% inspection. APPLICATIONS Implantable, Non-Life Supporting Medical Devices * e.g. implanted temporary cardiac monitor, insulin pumps External, Life Supporting Medical Devices * e.g. heart pump external controller External Devices * e.g. patient monitoring, diagnostic equipment HOW TO ORDER Dielectric Code A = NP0 (C0G) C = X7R Capacitance Code (In pF) (2 significant digits + number of zeros) for values <10pF: letter R denotes decimal point. Example: 68pF = 680 8.2pF = 8R2 Capacitance Failure Rate Tolerance C = Standard B = 0.1pF Range C = 0.25pF D = 0.5pF *Contact AVX for others F = 1% (10pF) G = 2% (10pF) J = 5% K = 10% M = 20% T 2 A Termination Finish T = Plated Ni & Sn (NP0 only) Z = Flexiterm (X7R only) Packaging 2 = 7" Reel 4 = 13" Reel Special Code A = Standard *Contact AVX for others L W Rated Voltage Z = 10V Y = 16V 3 = 25V 5 = 50V 1 = 100V 2 = 200V V = 250V 7 = 500V C Size MM02 = 0402 MM03 = 0603 MM05 = 0805 MM06 = 1206 MM10 = 1210 MM08 = 1808 MM12 = 1812 MM20 = 2220 J T 100 A Z MM02 t COMMERCIAL VS MM SERIES PROCESS COMPARISON Administrative Design Dicing Lot Qualification Destructive Physical Analysis (DPA) Visual/Cosmetic Quality Commercial Standard part numbers; no restriction on who purchases these parts Minimum ceramic thickness of 0.020" on all X7R product Minimum ceramic thickness of 0.029" (0.74mm) Side & end margins = 0.003" min Side & end margins = 0.004" min Cover layers = 0.003" min As per EIA RS469 Increased sample plan - stricter criteria Standard process and inspection 100% inspection Increased sampling for accelerated wave solder on X7R and NP0 followed by lot by lot reliability testing AVX will qualify and notify customers before making any change to the following materials or processes: * Dielectric formulation, type, or supplier * Metal formulation, type, or supplier * Termination material formulation, type, or supplier * Manufacturing equipment type * Quality testing regime including sample size and accept/ reject criteria Application Robustness Standard sampling for accelerated wave solder on X7R dielectrics Design/Change Control Required to inform customer of changes in: * form * fit * function 113016 MM Series Specific series part number, used to control supply of product 125 MM Series - MLCC for Medical Applications NP0 (C0G) - Specifications & Test Methods Parameter/Test Operating Temperature Range Capacitance Insulation Resistance NP0 Specification Limits -55C to +125C Within specified tolerance <30 pF: Q 400+20 x Cap Value 30 pF: Q 1000 100,000M or 1000M - F, whichever is less Dielectric Strength No breakdown or visual defects Q Resistance to Flexure Stresses Appearance Capacitance Variation 5% or .5 pF, whichever is greater Q Meets Initial Values (As Above) Insulation Resistance Solderability Appearance Capacitance Variation Resistance to Solder Heat Thermal Shock Load Life Q Insulation Resistance Dielectric Strength Appearance Capacitance Variation Q Insulation Resistance Dielectric Strength Appearance Capacitance Variation Q (C=Nominal Cap) Insulation Resistance Dielectric Strength Appearance Capacitance Variation Load Humidity Q Insulation Resistance Dielectric Strength 126 No defects Measuring Conditions Temperature Cycle Chamber Freq.: 1.0 MHz 10% for cap 1000 pF 1.0 kHz 10% for cap > 1000 pF Voltage: 1.0Vrms .2V Charge device with rated voltage for 60 5 secs @ room temp/humidity Charge device with 300% of rated voltage for 1-5 seconds, w/charge and discharge current limited to 50 mA (max) Note: Charge device with 150% of rated voltage for 500V devices. Deflection: 2mm Test Time: 30 seconds 1mm/sec Initial Value x 0.3 95% of each terminal should be covered with fresh solder No defects, <25% leaching of either end terminal 90 mm Dip device in eutectic solder at 230 5C for 5.0 0.5 seconds 2.5% or .25 pF, whichever is greater Meets Initial Values (As Above) Dip device in eutectic solder at 260C for 60 seconds. Store at room temperature for 24 2 hours before measuring electrical properties. Meets Initial Values (As Above) Meets Initial Values (As Above) No visual defects Step 1: -55C 2 30 3 minutes 2.5% or .25 pF, whichever is greater Step 2: Room Temp 3 minutes Meets Initial Values (As Above) Step 3: +125C 2 30 3 minutes Meets Initial Values (As Above) Step 4: Room Temp 3 minutes Meets Initial Values (As Above) Repeat for 5 cycles and measure after 24 hours at room temperature No visual defects 3.0% or .3 pF, whichever is greater 30 pF: 10 pF, <30 pF: <10 pF: Q 350 Q 275 +5C/2 Q 200 +10C Initial Value x 0.3 (See Above) Meets Initial Values (As Above) Charge device with twice rated voltage in test chamber set at 125C 2C for 1000 hours (+48, -0). Remove from test chamber and stabilize at room temperature for 24 hours before measuring. No visual defects 5.0% or .5 pF, whichever is greater 30 pF: 10 pF, <30 pF: <10 pF: Q 350 Q 275 +5C/2 Q 200 +10C Initial Value x 0.3 (See Above) Meets Initial Values (As Above) Store in a test chamber set at 85C 2C/ 85% 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Remove from chamber and stabilize at room temperature for 24 2 hours before measuring. 113016 MM Series - MLCC for Medical Applications NP0/C0G Capacitance Range PREFERRED SIZES ARE SHADED SIZE Cap (pF) 0.5 1.0 1.2 1.5 1.8 2.2 2.7 3.3 3.9 4.7 5.6 6.8 8.2 10 12 15 18 22 27 33 39 47 56 68 82 100 120 150 180 220 270 330 390 470 560 680 820 1000 1200 1500 WVDC 0R5 1R0 1R2 1R5 1R8 2R2 2R7 3R3 3R9 4R7 5R6 6R8 8R2 100 120 150 180 220 270 330 390 470 560 680 820 101 121 151 181 221 271 331 391 471 561 681 821 102 122 152 WVDC SIZE 113016 0603 16 16 0805 25 50 100 16 25 50 100 16 0603 1206 25 50 100 16 25 25 50 100 16 25 0805 50 100 50 100 1206 127 MM Series - MLCC for Medical Applications X7R Specifications and Test Methods Parameter/Test Operating Temperature Range Capacitance Insulation Resistance X7R Specification Limits -55C to +125C Within specified tolerance 10% for 50V DC rating 12.5% for 25V DC rating 12.5% for 25V and 16V DC rating 12.5% for 10V DC rating 100,000M or 1000M - F, whichever is less Dielectric Strength No breakdown or visual defects Dissipation Factor Resistance to Flexure Stresses Appearance Capacitance Variation Dissipation Factor Insulation Resistance Solderability Resistance to Solder Heat Thermal Shock Load Life Load Humidity 128 Appearance Capacitance Variation Dissipation Factor Insulation Resistance Dielectric Strength Appearance Capacitance Variation Dissipation Factor Insulation Resistance Dielectric Strength Appearance Capacitance Variation Dissipation Factor Insulation Resistance Dielectric Strength Appearance Capacitance Variation Dissipation Factor Insulation Resistance Dielectric Strength No defects 12% Measuring Conditions Temperature Cycle Chamber Freq.: 1.0 kHz 10% Voltage: 1.0Vrms .2V Charge device with rated voltage for 120 5 secs @ room temp/humidity Charge device with 300% of rated voltage for 1-5 seconds, w/charge and discharge current limited to 50 mA (max) Note: Charge device with 150% of rated voltage for 500V devices. Deflection: 2mm Test Time: 30 seconds 1mm/sec Meets Initial Values (As Above) Initial Value x 0.3 95% of each terminal should be covered with fresh solder No defects, <25% leaching of either end terminal 90 mm Dip device in eutectic solder at 230 5C for 5.0 0.5 seconds 7.5% Meets Initial Values (As Above) Dip device in eutectic solder at 260C for 60 seconds. Store at room temperature for 24 2 hours before measuring electrical properties. Meets Initial Values (As Above) Meets Initial Values (As Above) No visual defects Step 1: -55C 2 30 3 minutes 7.5% Step 2: Room Temp 3 minutes Meets Initial Values (As Above) Step 3: +125C 2 30 3 minutes Meets Initial Values (As Above) Step 4: Room Temp 3 minutes Meets Initial Values (As Above) Repeat for 5 cycles and measure after 24 2 hours at room temperature No visual defects 12.5% Initial Value x 2.0 (See Above) Initial Value x 0.3 (See Above) Meets Initial Values (As Above) No visual defects 12.5% Charge device with 1.5 rated voltage ( 10V) in test chamber set at 125C 2C for 1000 hours (+48, -0) Remove from test chamber and stabilize at room temperature for 24 2 hours before measuring. Store in a test chamber set at 85C 2C/ 85% 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Initial Value x 2.0 (See Above) Initial Value x 0.3 (See Above) Remove from chamber and stabilize at room temperature and humidity for 24 2 hours before measuring. Meets Initial Values (As Above) 113016 MM Series - MLCC for Medical Applications X7R Capacitance Range PREFERRED SIZES ARE SHADED SIZE Cap pf 220 270 330 390 470 560 680 820 1000 1200 1500 1800 2200 2700 3300 3900 4700 5600 6800 8200 cap 0.010 uf 0.012 0.015 0.018 0.022 0.027 0.033 0.039 0.047 0.056 0.068 0.082 0.10 0.12 0.15 0.22 0.33 0.47 0.56 0.68 0.82 1.0 1.2 1.5 WVDC 221 271 331 391 471 561 681 821 102 122 152 182 222 272 332 392 472 562 682 822 103 123 153 183 223 273 333 393 473 563 683 823 104 124 154 224 334 474 564 684 824 105 125 155 WVDC SIZE 110116 0402 0603 0805 1206 1210 1808 1812 2220 16 25 50 10 16 25 50 100 200 10 16 25 50 100 200 250 10 16 25 50 100 200 250 500 10 16 25 50 100 200 250 500 50 100 200 50 100 200 250 25 50 100 16 25 50 10 16 25 50 100 200 10 16 25 50 100 200 250 10 16 25 50 100 200 250 500 10 16 25 50 100 200 250 500 50 100 200 50 100 200 250 25 50 100 0402 0603 0805 1206 1210 1808 1812 2220 129