ZL50075 Data Sheet
6
Zarlink Semiconductor Inc.
C15 TDO Test Data (3.3 V Output)
Serial test data output.
D14 TCK Test Clock (5 V Tolerant Schmitt-Triggered Input with Internal
Pull-up)
Clock input used by TAP Controller. When not used, this input may
be left unconnected.
D16 TMS Test Reset (5 V Tolerant Schmitt-Triggered Input with Internal
Pull-up)
Input which controls the state transitions of the TAP Controller.
When not used, this pin is pulled high by an internal pull-up resistor
and may be left unconnected.
C17 TRST Test Mode Select (5 V Tolerant Inp ut with Internal Pull-up)
Asynchronously initializes the JTAG TAP controller by putting it in
the Test-Logic-Reset state. This pin should be pulsed low during
power-up to ensure that the device is in th e normal functional mode.
When JTAG is not being used, this pin should be pulled low during
normal operation.
Unused
U10, V9, V10, R12, L18,
A17, L3, P1, T12, K16 IC Internal Connections
In normal mode these pins MUST be connected low.
B13, C18, P17, T17, U11, V8 NC No Connection
In normal mode these pins MUST be left unconnected.
Power
E5, E6, E9, E12, F6, F7, F10,
F13, G7, G8, G9, G10, G11,
G12, G14, H1, H2, H5, H7,
H8, H9, H10, H11, H12, H15,
J6, J7, J8, J9, J10, J11, J12,
J13, J17, K7, K8, K9, K10,
K11, K12, K14, L5, L7, L8,
L9, L10, L11, L12, M7, M8,
M9, M10, M11, M12, N6, N7,
N10, N13, N14, P5, P6, P9,
P11, P12
VSS Ground
D5, D8, D15, E7, E10, E13,
F4, F8, F11, F14, G5, H6,
H13, J14, K5, L13, L6, M4,
M14, M15, N5, N8, N11, P7,
P10, P13, R8, R15
VDD_CORE Power Supply for the Core Logic: +1.8 V
Pin Description (continued)
Pin Name Description