1.35V DDR3L SDRAM SODIMM
MT18KSF51272HZ – 4GB
MT18KSF1G72HZ – 8GB
Features
DDR3L functionality and operations supported as
defined in the component data sheet
204-pin, small outline dual in-line memory module
(SODIMM) with ECC
Fast data transfer rates: PC3-12800, PC3-10600
4GB (512 Meg x 72), 8GB (1 Gig x 72)
VDD = 1.35V (1.283–1.45V)
VDD = 1.5V (1.425–1.575V)
Backward compatible to VDD = 1.5V ±0.075V
VDDSPD = 3.0–3.6V
Supports ECC error detection and correction
Nominal and dynamic on-die termination (ODT) for
data, strobe, and mask signals
Dual-rank
On-board I2C temperature sensor with integrated
serial presence-detect (SPD) EEPROM
Fixed burst chop (BC) of 4 and burst length (BL) of 8
via the mode register set (MRS)
Selectable BC4 or BL8 on-the-fly (OTF)
Gold edge contacts
Halogen-free
Fly-by topology
Terminated control, command, and address bus
Figure 1: 204-Pin SODIMM
(MO-268 R/C D1)
Module height: 30mm (1.181in)
Options Marking
Operating temperature
Commercial (0°C TA +70°C) None
Package
204-pin DIMM (halogen-free) Z
Frequency/CAS latency
1.25ns @ CL = 11 (DDR3-1600) -1G6
1.5ns @ CL = 9 (DDR3-1333) -1G4
Table 1: Key Timing Parameters
Speed
Grade
Industry
Nomenclature
Data Rate (MT/s) tRCD
(ns)
tRP
(ns)
tRC
(ns)CL = 11 CL = 10 CL = 9 CL = 8 CL = 7 CL = 6 CL = 5
-1G6 PC3-12800 1600 1333 1333 1066 1066 800 667 13.125 13.125 48.125
-1G4 PC3-10600 1333 1333 1066 1066 800 667 13.125 13.125 49.125
-1G1 PC3-8500 1066 1066 800 667 13.125 13.125 50.625
-1G0 PC3-8500 1066 800 667 15 15 52.5
-80B PC3-6400 800 667 15 15 52.5
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Features
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Products and specifications discussed herein are subject to change by Micron without notice.
Table 2: Addressing
Parameter 4GB 8GB
Refresh count 8K 8K
Row address 32K A[14:0] 64K A[15:0]
Device bank address 8 BA[2:0] 8 BA[2:0]
Device configuration 2Gb (256 Meg x 8) 4Gb (512 Meg x 8)
Column address 1K A[9:0] 1K A[9:0]
Module rank address 2 S#[1:0] 2 S#[1:0]
Table 3: Part Numbers and Timing Parameters – 4GB Modules
Base device: MT41K256M8,1 2Gb 1.35V DDR3L SDRAM
Part Number2
Module
Density Configuration
Module
Bandwidth
Memory Clock/
Data Rate
Clock Cycles
(CL-tRCD-tRP)
MT18KSF51272HZ-1G6__ 4GB 512 Meg x 72 12.8 GB/s 1.25ns/1600 MT/s 11-11-11
MT18KSF51272HZ-1G4__ 4GB 512 Meg x 72 10.6 GB/s 1.5ns/1333 MT/s 9-9-9
Table 4: Part Numbers and Timing Parameters – 8GB Modules
Base device: MT41K512M8,1 4Gb 1.35V DDR3L SDRAM
Part Number2
Module
Density Configuration
Module
Bandwidth
Memory Clock/
Data Rate
Clock Cycles
(CL-tRCD-tRP)
MT18KSF1G72HZ-1G6__ 8GB 1 Gig x 72 12.8 GB/s 1.25ns/1600 MT/s 11-11-11
MT18KSF1G72HZ-1G4__ 8GB 1 Gig x 72 10.6 GB/s 1.5ns/1333 MT/s 9-9-9
Notes: 1. The data sheet for the base device can be found on Micron’s web site.
2. All part numbers end with a two-place code (not shown) that designates component and PCB revisions. Con-
sult factory for current revision codes. Example: MT18KSF1G72HZ-1G6P1.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Features
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Pin Assignments
Table 5: Pin Assignments
204-Pin DDR3 SODIMM Front 204-Pin DDR3 SODIMM Back
Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol Pin Symbol
1 VREFDQ 53 VSS 105 A1 157 DM5 2 VSS 54 DQ28 106 A2 158 VSS
3 VSS 55 DQ24 107 A0 159 DQ42 4 DQ4 56 DQ29 108 BA1 160 DQ46
5 DQ0 57 DQ25 109 VDD 161 DQ43 6 DQ5 58 VSS 110 VDD 162 DQ47
7 DQ1 59 DM3 111 CK0 163 VSS 8 VSS 60 DQS3# 112 CK1 164 VSS
9 VSS 61 VSS 113 CK0# 165 DQ48 10 DQS0# 62 DQS3 114 CK1# 166 DQ52
11 DM0 63 DQ26 115 VDD 167 DQ49 12 DQS0 64 VSS 116 VDD 168 DQ53
13 DQ2 65 DQ27 117 A10/AP 169 VSS 14 VSS 66 DQ30 118 NC 170 VSS
15 DQ3 67 VSS 119 BA0 171 DQS6# 16 DQ6 68 DQ31 120 NC 172 DM6
17 VSS 69 CB0 121 WE# 173 DQS6 18 DQ7 70 VSS 122 RAS# 174 DQ54
19 DQ8 71 CB1 123 VDD 175 VSS 20 VSS 72 CB4 124 VDD 176 DQ55
21 DQ9 73 VSS 125 CAS# 177 DQ50 22 DQ12 74 CB5 126 ODT0 178 VSS
23 VSS 75 DQS8# 127 S0# 179 DQ51 24 DQ13 76 DM8 128 ODT1 180 DQ60
25 DQS1# 77 DQS8 129 S1# 181 VSS 26 VSS 78 VSS 130 A13 182 DQ61
27 DQS1 79 VSS 131 VDD 183 DQ56 28 DM1 80 CB6 132 VDD 184 VSS
29 VSS 81 CB2 133 DQ32 185 DQ57 30 RESET# 82 CB7 134 DQ36 186 DQS7#
31 DQ10 83 CB3 135 DQ33 187 VSS 32 VSS 84 VREFCA 136 DQ37 188 DQS7
33 DQ11 85 VDD 137 VSS 189 DM7 34 DQ14 86 VDD 138 VSS 190 VSS
35 VSS 87 CKE0 139 DQS4# 191 DQ58 36 DQ15 88 NF/A151140 DM4 192 DQ62
37 DQ16 89 CKE1 141 DQS4 193 DQ59 38 VSS 90 A14 142 DQ38 194 DQ63
39 DQ17 91 BA2 143 VSS 195 VSS 40 DQ20 92 A9 144 DQ39 196 VSS
41 VSS 93 VDD 145 DQ34 197 SA0 42 DQ21 94 VDD 146 VSS 198 EVENT#
43 DQS2# 95 A12 147 DQ35 199 VDDSPD 44 DM2 96 A11 148 DQ44 200 SDA
45 DQS2 97 A8 149 VSS 201 SA1 46 VSS 98 A7 150 DQ45 202 SCL
47 VSS 99 A5 151 DQ40 203 VTT 48 DQ22 100 A6 152 VSS 204 VTT
49 DQ18 101 VDD 153 DQ41 50 DQ23 102 VDD 154 DQS5#
51 DQ19 103 A3 155 VSS 52 VSS 104 A4 156 DQS5
Note: 1. Pin 88 is NF for 4GB; A15 for 8GB.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Pin Assignments
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Pin Descriptions
The pin description table below is a comprehensive list of all possible pins for all DDR3
modules. All pins listed may not be supported on this module. See Pin Assignments for
information specific to this module.
Table 6: Pin Descriptions
Symbol Type Description
Ax Input Address inputs: Provide the row address for ACTIVE commands, and the column ad-
dress and auto precharge bit (A10) for READ/WRITE commands, to select one location
out of the memory array in the respective bank. A10 sampled during a PRECHARGE
command determines whether the PRECHARGE applies to one bank (A10 LOW, bank
selected by BAx) or all banks (A10 HIGH). The address inputs also provide the op-code
during a LOAD MODE command. See the Pin Assignments table for density-specific ad-
dressing information.
BAx Input Bank address inputs: Define the device bank to which an ACTIVE, READ, WRITE, or
PRECHARGE command is being applied. BA define which mode register (MR0, MR1,
MR2, or MR3) is loaded during the LOAD MODE command.
CKx,
CKx#
Input Clock: Differential clock inputs. All control, command, and address input signals are
sampled on the crossing of the positive edge of CK and the negative edge of CK#.
CKEx Input Clock enable: Enables (registered HIGH) and disables (registered LOW) internal circui-
try and clocks on the DRAM.
DMx Input Data mask (x8 devices only): DM is an input mask signal for write data. Input data
is masked when DM is sampled HIGH, along with that input data, during a write ac-
cess. Although DM pins are input-only, DM loading is designed to match that of the
DQ and DQS pins.
ODTx Input On-die termination: Enables (registered HIGH) and disables (registered LOW) termi-
nation resistance internal to the DDR3 SDRAM. When enabled in normal operation,
ODT is only applied to the following pins: DQ, DQS, DQS#, DM, and CB. The ODT input
will be ignored if disabled via the LOAD MODE command.
Par_In Input Parity input: Parity bit for Ax, RAS#, CAS#, and WE#.
RAS#, CAS#, WE# Input Command inputs: RAS#, CAS#, and WE# (along with S#) define the command being
entered.
RESET# Input
(LVCMOS)
Reset: RESET# is an active LOW asychronous input that is connected to each DRAM
and the registering clock driver. After RESET# goes HIGH, the DRAM must be reinitial-
ized as though a normal power-up was executed.
Sx# Input Chip select: Enables (registered LOW) and disables (registered HIGH) the command
decoder.
SAx Input Serial address inputs: Used to configure the temperature sensor/SPD EEPROM ad-
dress range on the I2C bus.
SCL Input Serial clock for temperature sensor/SPD EEPROM: Used to synchronize communi-
cation to and from the temperature sensor/SPD EEPROM on the I2C bus.
CBx I/O Check bits: Used for system error detection and correction.
DQx I/O Data input/output: Bidirectional data bus.
DQSx,
DQSx#
I/O Data strobe: Differential data strobes. Output with read data; edge-aligned with
read data; input with write data; center-aligned with write data.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Pin Descriptions
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Table 6: Pin Descriptions (Continued)
Symbol Type Description
SDA I/O Serial data: Used to transfer addresses and data into and out of the temperature sen-
sor/SPD EEPROM on the I2C bus.
TDQSx,
TDQSx#
Output Redundant data strobe (x8 devices only): TDQS is enabled/disabled via the LOAD
MODE command to the extended mode register (EMR). When TDQS is enabled, DM is
disabled and TDQS and TDQS# provide termination resistance; otherwise, TDQS# are
no function.
Err_Out# Output
(open drain)
Parity error output: Parity error found on the command and address bus.
EVENT# Output
(open drain)
Temperature event: The EVENT# pin is asserted by the temperature sensor when crit-
ical temperature thresholds have been exceeded.
VDD Supply Power supply: 1.35V (1.283–1.45V) backward-compatible to 1.5V (1.425–1.575V). The
component VDD and VDDQ are connected to the module VDD.
VDDSPD Supply Temperature sensor/SPD EEPROM power supply: 3.0–3.6V.
VREFCA Supply Reference voltage: Control, command, and address VDD/2.
VREFDQ Supply Reference voltage: DQ, DM VDD/2.
VSS Supply Ground.
VTT Supply Termination voltage: Used for control, command, and address VDD/2.
NC No connect: These pins are not connected on the module.
NF No function: These pins are connected within the module, but provide no functional-
ity.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Pin Descriptions
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DQ Map
Table 7: Component-to-Module DQ Map, Front
Component
Reference
Number
Component
DQ Module DQ
Module Pin
Number
Component
Reference
Number
Component
DQ Module DQ
Module Pin
Number
U1 0 2 13 U2 0 23 50
1 0 5 1 21 42
2 3 15 2 19 51
3 5 6 3 20 40
4 7 18 4 22 48
5 4 4 5 16 37
6 6 16 6 18 49
7 1 7 7 17 39
U3 0 CB2 81 U4 0 42 159
1 CB1 71 1 45 150
2 CB3 83 2 46 160
3 CB4 72 3 40 151
4 CB6 80 4 43 161
5 CB0 69 5 44 148
6 CB7 82 6 47 162
7 CB5 74 7 41 153
U5 0 59 193 U6 0 14 34
1 57 185 1 9 21
2 62 192 2 11 33
3 56 183 3 8 19
4 58 191 4 10 31
5 61 182 5 13 24
6 63 194 6 15 36
7 60 180 7 12 22
U7 0 29 56 U8 0 38 142
1 26 63 1 33 135
2 28 54 2 35 147
3 31 68 3 37 136
4 25 57 4 39 144
5 27 65 5 32 133
6 24 55 6 34 145
7 30 66 7 36 134
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
DQ Map
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Table 7: Component-to-Module DQ Map, Front (Continued)
Component
Reference
Number
Component
DQ Module DQ
Module Pin
Number
Component
Reference
Number
Component
DQ Module DQ
Module Pin
Number
U9 0 55 176 U10 0 57 185
1 53 168 1 59 193
2 54 174 2 56 183
3 52 166 3 62 192
4 51 179 4 60 180
5 48 165 5 63 194
6 50 177 6 61 182
7 49 167 7 58 191
Table 8: Component-to-Module DQ Map, Back
Component
Reference
Number
Component
DQ Module DQ
Module Pin
Number
Component
Reference
Number
Component
DQ Module DQ
Module Pin
Number
U11 0 45 150 U12 0 CB1 71
1 42 159 1 CB2 81
2 40 151 2 CB4 72
3 46 160 3 CB3 83
4 41 153 4 CB5 74
5 47 162 5 CB7 82
6 44 148 6 CB0 69
7 43 161 7 CB6 80
U13 0 21 42 U14 0 0 5
1 23 50 1 2 13
2 20 40 2 5 6
3 19 51 3 3 15
4 17 39 4 1 7
5 18 49 5 6 16
6 16 37 6 4 4
7 22 48 7 7 18
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
DQ Map
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© 2011 Micron Technology, Inc. All rights reserved.
Table 8: Component-to-Module DQ Map, Back (Continued)
Component
Reference
Number
Component
DQ Module DQ
Module Pin
Number
Component
Reference
Number
Component
DQ Module DQ
Module Pin
Number
U16 0 53 168 U17 0 33 135
1 55 176 1 38 142
2 52 166 2 37 136
3 54 174 3 35 147
4 49 167 4 36 134
5 50 177 5 34 145
6 48 165 6 32 133
7 51 179 7 39 144
U18 0 26 63 U19 0 9 21
1 29 56 1 14 34
2 31 68 2 8 19
3 28 54 3 11 33
4 30 66 4 12 22
5 24 55 5 15 36
6 27 65 6 13 24
7 25 57 7 10 31
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
DQ Map
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Functional Block Diagram
Figure 2: Functional Block Diagram
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DM CS# DQS DQS#
U1
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U14
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
U17
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U8
DQS0
DQS0#
DM0
DQS4
DQS4#
DM4
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
U6
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U19
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
U4
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U11
DQS1
DQS1#
DM1
DQS5
DQS5#
DM5
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
U2
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U13
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
U16
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U9
DQS2
DQS2#
DM2
DQS6
DQS6#
DM6
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
U7
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U18
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
U10
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U5
DQS3
DQS3#
DM3
DQS7
DQS7#
DM7
CB0
CB1
CB2
CB3
CB4
CB5
CB6
CB7
U3
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
U12
DQS8
DQS8#
DM8
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
ZQ
S1#
S0#
Rank 0: U1–U4, U6, U7, U10, U16, U17
Rank 1: U5, U8, U9, U11–U14, U18, U19
DM CS# DQS DQS# DM CS# DQS DQS# DM CS# DQS DQS#
DM CS# DQS DQS# DM CS# DQS DQS# DM CS# DQS DQS# DM CS# DQS DQS#
DM CS# DQS DQS# DM CS# DQS DQS# DM CS# DQS DQS# DM CS# DQS DQS#
DM CS# DQS DQS# DM CS# DQS DQS# DM CS# DQS DQS# DM CS# DQS DQS#
DM CS# DQS DQS# DM CS# DQS DQS#
BA[2:0]
A[15/14:0]
RAS#
CAS#
WE#
CKE0
CKE1
ODT0
ODT1
RESET#
BA[2:0]: DDR3 SDRAM
A[15/14:0]: DDR3 SDRAM
RAS#: DDR3 SDRAM
CAS#: DDR3 SDRAM
WE#: DDR3 SDRAM
CKE0: Rank 0
CKE1: Rank 1
ODT0: Rank 0
ODT1: Rank 1
RESET#: DDR3 SDRAM
Rank 0
CK0
CK0#
CK1
CK1#
VREFCA
VSS
DDR3 SDRAM
DDR3 SDRAM
VDD
VDDSPD Temperature sensor/
SPD EEPROM
VTT
DDR3 SDRAM
DDR3 SDRAM
VREFDQ
Clock, control, command, and address line terminations:
Rank 1
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
ZQ
VSS
ZQ
VSS
ZQ
VSS
ZQ
VSS
ZQ
VSS
ZQ
VSS
ZQ
VSS
ZQ
VSS
ZQ
VSS
A0
Temperature
sensor/
SPD EEPROM
A1 A2
SA0 SA1
SDA
SCL
EVT
U15
EVENT#
Control, command,
and address termination
DDR3
SDRAM
VTT
DDR3
SDRAM
VDD
VSS
CK
CK#
CKE[1:0], A[15/14:0],
RAS#, CAS#, WE#,
ODT[1:0], BA[2:0],
S#[1:0]
Note: 1. The ZQ ball on each DDR3 component is connected to an external 240Ω ±1% resistor
that is tied to ground. It is used for the calibration of the component’s ODT and output
driver.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Functional Block Diagram
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General Description
DDR3 SDRAM modules are high-speed, CMOS dynamic random access memory mod-
ules that use internally configured 8-bank DDR3 SDRAM devices. DDR3 SDRAM mod-
ules use DDR architecture to achieve high-speed operation. DDR3 architecture is essen-
tially an 8n-prefetch architecture with an interface designed to transfer two data words
per clock cycle at the I/O pins. A single read or write access for the DDR3 SDRAM mod-
ule effectively consists of a single 8n-bit-wide, one-clock-cycle data transfer at the inter-
nal DRAM core and eight corresponding n-bit-wide, one-half-clock-cycle data transfers
at the I/O pins.
DDR3 modules use two sets of differential signals: DQS, DQS# to capture data and CK
and CK# to capture commands, addresses, and control signals. Differential clocks and
data strobes ensure exceptional noise immunity for these signals and provide precise
crossing points to capture input signals.
Fly-By Topology
DDR3 modules use faster clock speeds than earlier DDR technologies, making signal
quality more important than ever. For improved signal quality, the clock, control, com-
mand, and address buses have been routed in a fly-by topology, where each clock, con-
trol, command, and address pin on each DRAM is connected to a single trace and ter-
minated (rather than a tree structure, where the termination is off the module near the
connector). Inherent to fly-by topology, the timing skew between the clock and DQS sig-
nals can be easily accounted for by using the write-leveling feature of DDR3.
Temperature Sensor with Serial Presence-Detect EEPROM
Thermal Sensor Operations
The temperature from the integrated thermal sensor is monitored and converts into a
digital word via the I2C bus. System designers can use the user-programmable registers
to create a custom temperature-sensing solution based on system requirements. Pro-
gramming and configuration details comply with JEDEC standard No. 21-C page 4.7-1,
"Definition of the TSE2002av, Serial Presence Detect with Temperature Sensor."
Serial Presence-Detect EEPROM Operation
DDR3 SDRAM modules incorporate serial presence-detect. The SPD data is stored in a
256-byte EEPROM. The first 128 bytes are programmed by Micron to comply with JE-
DEC standard JC-45, "Appendix X: Serial Presence Detect (SPD) for DDR3 SDRAM Mod-
ules." These bytes identify module-specific timing parameters, configuration informa-
tion, and physical attributes. The remaining 128 bytes of storage are available for use by
the customer. System READ/WRITE operations between the master (system logic) and
the slave EEPROM device occur via a standard I2C bus using the DIMM’s SCL (clock)
SDA (data), and SA (address) pins. Write protect (WP) is connected to VSS, permanently
disabling hardware write protection. For further information refer to Micron technical
note TN-04-42, "Memory Module Serial Presence-Detect."
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
General Description
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Electrical Specifications
Stresses greater than those listed may cause permanent damage to the module. This is a
stress rating only, and functional operation of the module at these or any other condi-
tions outside those indicated in each device's data sheet is not implied. Exposure to ab-
solute maximum rating conditions for extended periods may adversely affect reliability.
Table 9: Absolute Maximum Ratings
Symbol Parameter Min Max Units
VDD VDD supply voltage relative to VSS –0.4 1.975 V
VIN, VOUT Voltage on any pin relative to VSS –0.4 1.975 V
Table 10: Operating Conditions
Symbol Parameter Min Nom Max Units Notes
VDD VDD supply voltage 1.283 1.35 1.45 V
1.425 1.5 1.575 V 1
VREFCA(DC) Input reference voltage command/address bus 0.49 × VDD 0.5 × VDD 0.51 × VDD V
VREFDQ(DC) I/O reference voltage DQ bus 0.49 × VDD 0.5 × VDD 0.51 × VDD V
IVTT Termination reference current from VTT –600 600 mA
VTT Termination reference voltage (DC) – command/
address bus
0.49 × VDD -
20mV
0.5 × VDD 0.51 × VDD +
20mV
V 2
IIInput leakage current; Any in-
put 0V VIN VDD; VREF input
0V VIN 0.95V (All other pins
not under test = 0V)
Address inputs,
RAS#, CAS#,
WE#, BA
–36 0 36 µA
S#, CKE, ODT,
CK, CK#
–18 0 18
DM –4 0 4
IOZ Output leakage current; 0V
VOUT VDD; DQ and ODT are
disabled; ODT is HIGH
DQ, DQS, DQS#,
CB
–10 0 10 µA
IVREF VREF supply leakage current;
VREFDQ = VDD/2 or VREFCA = VDD/2
(All other pins not under test = 0V)
–18 0 18 µA
TAModule ambient operating temperature 0 70 °C 3, 4
TCDDR3 SDRAM component case operating temper-
ature
0 95 °C 3, 4, 5
Notes: 1. Module is backward-compatible with 1.5V operation. Refer to device specification for
details and operation guidance.
2. VTT termination voltage in excess of the stated limit will adversely affect the command
and address signals’ voltage margin and will reduce timing margins.
3. TA and TC are simultaneous requirements.
4. For further information, refer to technical note TN-00-08: “Thermal Applications,”
available on Micron’s Web site.
5. The refresh rate is required to double when 85°C < TC 95°C.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Electrical Specifications
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DRAM Operating Conditions
Recommended AC operating conditions are given in the DDR3 component data sheets.
Component specifications are available at micron.com. Module speed grades correlate
with component speed grades, as shown below.
Table 11: Module and Component Speed Grades
DDR3 components may exceed the listed module speed grades; module may not be available in all listed speed grades
Module Speed Grade Component Speed Grade
-2G1 -093
-1G9 -107
-1G6 -125
-1G4 -15E
-1G1 -187E
-1G0 -187
-80C -25E
-80B -25
Design Considerations
Simulations
Micron memory modules are designed to optimize signal integrity through carefully de-
signed terminations, controlled board impedances, routing topologies, trace length
matching, and decoupling. However, good signal integrity starts at the system level.
Micron encourages designers to simulate the signal characteristics of the system's
memory bus to ensure adequate signal integrity of the entire memory system.
Power
Operating voltages are specified at the DRAM, not at the edge connector of the module.
Designers must account for any system voltage drops at anticipated power levels to en-
sure the required supply voltage is maintained.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
DRAM Operating Conditions
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IDD Specifications
Table 12: DDR3 IDD Specifications and Conditions – 4GB (Die Revision K)
Values are for the MT41K256M8 DDR3L SDRAM only and are computed from values specified in the 2Gb 1.35V (256 Meg x
8) component data sheet
Parameter Symbol 1600 1333 Units
Operating current 0: One bank ACTIVATE-to-PRECHARGE IDD01459 450 mA
Operating current 1: One bank ACTIVATE-to-READ-to-PRECHARGE IDD11576 558 mA
Precharge power-down current: Slow exit IDD2P02216 216 mA
Precharge power-down current: Fast exit IDD2P12252 252 mA
Precharge quiet standby current IDD2Q2360 360 mA
Precharge standby current IDD2N2378 378 mA
Precharge standby ODT current IDD2NT1387 369 mA
Active power-down current IDD3P2378 378 mA
Active standby current IDD3N2576 540 mA
Burst read operating current IDD4R1954 846 mA
Burst write operating current IDD4W1981 873 mA
Refresh current IDD5B11728 1719 mA
Self refresh temperature current: MAX TC = 85°C IDD62216 216 mA
Self refresh temperature current (SRT-enabled): MAX TC = 95°C IDD6ET2270 270 mA
All banks interleaved read current IDD711512 1458 mA
Reset current IDD82252 252 mA
Notes: 1. One module rank in the active IDD, the other rank in IDD2P0.
2. All ranks in this IDD condition.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
IDD Specifications
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Table 13: DDR3 IDD Specifications and Conditions – 8GB (Die Revision E)
Values are for the MT41K512M8 DDR3L SDRAM only and are computed from values specified in the 4Gb 1.35V (512 Meg x
8) component data sheet
Parameter Symbol 1600 1333 Units
Operating current 0: One bank ACTIVATE-to-PRECHARGE IDD01657 585 mA
Operating current 1: One bank ACTIVATE-to-READ-to-PRECHARGE IDD11756 720 mA
Precharge power-down current: Slow exit IDD2P02324 324 mA
Precharge power-down current: Fast exit IDD2P12576 504 mA
Precharge quiet standby current IDD2Q2576 504 mA
Precharge standby current IDD2N2576 522 mA
Precharge standby ODT current IDD2NT1513 477 mA
Active power-down current IDD3P2684 630 mA
Active standby current IDD3N2684 630 mA
Burst read operating current IDD4R11575 1422 mA
Burst write operating current IDD4W11287 1152 mA
Refresh current IDD5B12277 2214 mA
Self refresh temperature current: MAX TC = 85°C IDD62360 360 mA
Self refresh temperature current (SRT-enabled): MAX TC = 95°C IDD6ET2450 450 mA
All banks interleaved read current IDD712142 1872 mA
Reset current IDD82360 360 mA
Notes: 1. One module rank in the active IDD, the other rank in IDD2P0.
2. All ranks in this IDD condition.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
IDD Specifications
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Table 14: DDR3 IDD Specifications and Conditions – 8GB (Die Revision P)
Values are for the MT41K512M8 DDR3L SDRAM only and are computed from values specified in the 4Gb 1.35V (512 Meg x
8) component data sheet
Parameter Symbol 1600 Units
Operating current 0: One bank ACTIVATE-to-PRECHARGE IDD01342 mA
Operating current 1: One bank ACTIVATE-to-READ-to-PRECHARGE IDD11477 mA
Precharge power-down current: Slow exit IDD2P02180 mA
Precharge power-down current: Fast exit IDD2P12198 mA
Precharge quiet standby current IDD2Q2270 mA
Precharge standby current IDD2N2288 mA
Precharge standby ODT current IDD2NT1270 mA
Active power-down current IDD3P2270 mA
Active standby current IDD3N2360 mA
Burst read operating current IDD4R1900 mA
Burst write operating current IDD4W1999 mA
Refresh current IDD5B11458 mA
Self refresh temperature current: MAX TC = 85°C IDD62270 mA
Self refresh temperature current (SRT-enabled): MAX TC = 95°C IDD6ET2417 mA
All banks interleaved read current IDD711260 mA
Reset current IDD82234 mA
Notes: 1. One module rank in the active IDD, the other rank in IDD2P0.
2. All ranks in this IDD condition.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
IDD Specifications
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Temperature Sensor with Serial Presence-Detect EEPROM
The temperature sensor continuously monitors the module's temperature and can be
read back at any time over the I2C bus shared with the SPD EEPROM. Refer to JEDEC
standard No. 21-C page 4.7-1, "Definition of the TSE2002av, Serial Presence Detect with
Temperature Sensor."
Serial Presence-Detect
For the latest SPD data, refer to Micron's SPD page: micron.com/SPD.
Table 15: Temperature Sensor with SPD EEPROM Operating Conditions
Parameter/Condition Symbol Min Max Units
Supply voltage VDDSPD 3.0 3.6 V
Supply current: VDD = 3.3V IDD 2.0 mA
Input high voltage: Logic 1; SCL, SDA VIH VDDSPD x 0.7 VDDSPD + 1 V
Input low voltage: Logic 0; SCL, SDA VIL –0.5 VDDSPD x 0.3 V
Output low voltage: IOUT = 2.1mA VOL 0.4 V
Input current IIN –5.0 5.0 µA
Temperature sensing range –40 125 °C
Temperature sensor accuracy (class B) –1.0 1.0 °C
Table 16: Temperature Sensor and SPD EEPROM Serial Interface Timing
Parameter/Condition Symbol Min Max Units
Time bus must be free before a new transition can
start
tBUF 4.7 µs
SDA fall time tF 20 300 ns
SDA rise time tR 1000 ns
Data hold time tHD:DAT 200 900 ns
Start condition hold time tH:STA 4.0 µs
Clock HIGH period tHIGH 4.0 50 µs
Clock LOW period tLOW 4.7 µs
SCL clock frequency tSCL 10 100 kHz
Data setup time tSU:DAT 250 ns
Start condition setup time tSU:STA 4.7 µs
Stop condition setup time tSU:STO 4.0 µs
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Temperature Sensor with Serial Presence-Detect EEPROM
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EVENT# Pin
The temperature sensor also adds the EVENT# pin (open-drain). Not used by the SPD
EEPROM, EVENT# is a temperature sensor output used to flag critical events that can be
set up in the sensor’s configuration register.
EVENT# has three defined modes of operation: interrupt mode, compare mode, and
critical temperature mode. Event thresholds are programmed in the 0x01 register using
a hysteresis. The alarm window provides a comparison window, with upper and lower
limits set in the alarm upper boundary register and the alarm lower boundary register,
respectively. When the alarm window is enabled, EVENT# will trigger whenever the
temperature is outside the MIN or MAX values set by the user.
The interrupt mode enables software to reset EVENT# after a critical temperature
threshold has been detected. Threshold points are set in the configuration register by
the user. This mode triggers the critical temperature limit and both the MIN and MAX of
the temperature window.
The compare mode is similar to the interrupt mode, except EVENT# cannot be reset by
the user and returns to the logic HIGH state only when the temperature falls below the
programmed thresholds.
Critical temperature mode triggers EVENT# only when the temperature has exceeded
the programmed critical trip point. When the critical trip point has been reached, the
temperature sensor goes into comparator mode, and the critical EVENT# cannot be
cleared through software.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Temperature Sensor with Serial Presence-Detect EEPROM
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Module Dimensions
Figure 3: 204-Pin DDR3 SODIMM
3.8 (0.150)
MAX
Pin 1
67.75 (2.667)
67.45 (2.656)
20.0 (0.787)
TYP
1.8 (0.071)
(2X)
0.6 (0.024)
TYP
0.45 (0.018)
TYP
2.0 (0.079) R
(2X)
Pin 203
Pin 204 Pin 2
Front view
2.0 (0.079)
TYP
6.0 (0.236)
TYP
63.6 (2.504)
TYP
2.55 (0.10)
TYP
1.0 (0.039)
TYP
30.15 (1.187)
29.85 (1.175)
Back view
1.10 (0.043)
0.90 (0.035)
39.0 (1.535)
TYP
21.0 (0.827)
TYP
3.0 (0.12)
TYP
4.0 (0.157)
TYP
24.8 (0.976)
TYP
45° 4X
U1 U2
U6 U7
U3 U4
U8 U9
U5
U10 U11 U12
U15
U17
U16
U13 U14
U19
U18
Notes: 1. All dimensions are in millimeters (inches); MAX/MIN or typical (TYP) where noted.
2. The dimensional diagram is for reference only.
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-4000
www.micron.com/products/support Sales inquiries: 800-932-4992
Micron and the Micron logo are trademarks of Micron Technology, Inc.
All other trademarks are the property of their respective owners.
This data sheet contains minimum and maximum limits specified over the power supply and temperature range set forth herein.
Although considered final, these specifications are subject to change, as further product development and data characterization some-
times occur.
4GB, 8GB (x72, ECC, DR) 204-Pin DDR3L SODIMM
Module Dimensions
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