LC717A10PJ
No.A2214-2/14
Specifications
Absolute Maximum Ratings at Ta = +25C
Parameter Symbol Ratings (VSS = 0V) Unit Remarks
Supply voltage VDD -0.3 to +6.5 V
Input voltage VIN -0.3 to VDD+0.3 V *1
Output voltage VOUT -0.3 to VDD+0.3 V *2
Power dissipation Pd max 160 mW Ta = +105C,
Mounted on a substrate *3
Peak output current IOP ±8 mA Per a pin
Duty ratio 50% *2
Total output current IOA ±40 mA LSI outputs total value
Duty ratio 25% *2
*1) Apply to Cin0 to 15, Cref, CrefAdd, nRST, SCL, SDA, SA0, SA1, SCK, SI, nCS
*2) Apply to Cdrv, SDA, SO, INTOUT
*3) Single-layer glass epoxy board (76.1114.31.6t mm)
Recommended Operating Conditions
Parameter Symbol Conditions min typ max Unit Remarks
Operating supply voltage VDD 2.6 5.5 V
Supply ripple + noise Vpp ±20 mV *1
Operating temperature Topr -40 25 105 C
*1) We recommend connecting large and small capacitance between VDD and VSS.
In this case, the small capacitance is equal to or more than 0.1F, and layout nearby LSI.
Electrical Characteristics at VSS = 0V, VDD = 2.6 to 5.5V, Ta -40 to +105C
* Unless otherwise specified, the Cdrv drive frequency is fCDRV = 143kHz.
* Not tested at low temperature before shipment.
Parameter Symbol Conditions min typ max Unit Remarks
Capacitance detection resolution N 8 bit
Output noise RMS NRMS minimum gain setting ±1.0 LSB *1 *3
Input offset capacitance
adjustment range
CoffRANGE ±8.0 pF *1 *3
Input offset capacitance
adjustment resolution
CoffRESO 8 bit
Cin offset drift CinDRIFT minimum gain setting ±8 LSB *1
Cin detection sensitivity CinSENSE minimum gain setting 0.052 0.108 LSB/fF *2
Cin pin leak current ICin Cin = Hi-Z ±25 ±500 nA
Cin allowable parasitic input
capacitance
CinSUB Cin against VSS 30 pF *1 *3
Cdrv drive frequency fCDRV 100 143 186 kHz
VDD = 5V ±3%, 54.8kHz
setting 50.4 59.45 68.5 kHz *1
nRST minimum pulse width tNRST 1 s
Power-on reset time tPOR 20 ms
Power-on reset operation
condition: Hold time
tPOROP 10 ms *1
Power-on reset operation
condition: Input voltage
VPOROP 0.1 V *1
Power-on reset operation
condition: Power supply rise rate
tVDD 0V to VDD 1 V/ms *1
Long interval time TIVAL 40 101 162 ms
Continued to the next page.
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed,
damage may occur and reliability may be affected.
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended
Operating Ranges limits may affect device reliability.