Revision Date: 4/9/2003
Revision Number: 1
Agilent MGA-61563/62563
MMIC Low Noise Amplifier
Reliability Data Sheet
Description
MGA-6x563 is a high performance GaAs MMIC low noise amplifier fabricated with Agilent Technologies E-
PHEMT (Enhancement mode - Pseudomorphic High Electron Mobility Transistor) process. Agilent E-pHemt
based sol utions achiev e hi gh effici ency and excel lent perf orm ance over both t he ent ire int erested power rang e
and a wide temperature range. The reliability of the device was tested at various stress intervals and the data is
shown bel ow.
Table 1. Life Tests
Demonstrated Performance
Test Name Stress Test
Condition Total Units
Tested Total Device
Hours No. of Failed
Units
High Temperat ure
Operating Life Tch = 150°C
DC Bias 72 72,000 0
A Failure criteria OF 20% parameter drift, 0.3dBm change in OIP3 and 0.5dB change in Noise Figure/Associated Gain was used.
Reliab ility P rediction Model
An exponential cumulative failure function (constant failure rate) model was used to predict the failure rate
and mean time to failure (MTTF) at various temperatures as shown in Table 2. The wear-out mechanism is
therefore not considered. The Arrhenius temperature de-rating equation is used. Agilent assumes no failure
mechanism cha nges between stresses and the use conditions. Bias and temperature condition are alterable
stresses and must be considered with the thermal resistance of the devices when determining the stress
condition. The failure rate will have a direct relationship to the bias life stress. The E-PHEMT die process was
tested to determine the activation energy of 2.2eV. Confidence intervals are based upon the chi-squared
prediction method associated with exponential distribution.
Table 2. Estimates for Var ious Channel Temperatu res are as follow s :
Channel
Temp. (°C) Point Typical
Performance
MTTF hours
90%
Confidence
MTTF hours
Point Typical
Performance
FIT
90%
Confidence
FIT
150 7.20 X 104 3.23 X 104 6,944 30,972
125 3.19 X 106 1.43 X 106 313 699
100 2.35 X 108 1.05 X 108 4.3 10
85 4.14 X 109 1.89 X 109 0.2 0.5
Point typical MTTF is simply the total device hours divided by the number of failures. However, in cases for which no failures are
observed, the point estimate is calculated under the assumption that one unit failed.
Revision Date: 4/9/2003
Revision Number: 1
Table 3. Produ ct Qualification - Operat ing Life Test & Envir o nmental Stress Test Results
Stress Conditions Duration
Units
Tested Units
Failed
Wet High Temperature
Operating Life (WHTOL) 85°C/85% RH, Vd = 3V 1000 hours 72 0
Temperature Cycle -65°C/150°C, 10 minutes dwell 500 cycles 72 0
Thermal Shock -65°C/150°C, 5 minutes dwell 500 cycles 72 0
Autoclave 121°C/100%RH, 15 psig 96 hours 72 0
Table 4. Thermal Resistance Information
Stress Product Theta Jc
MGA-61653 55.66°C/W
Therma l Resista nce MGA-62653 96.56°C/W
Table 5. Electrostatic Discharge (ESD) Classification Test Results Results
ESD Test Reference MGA-61653 MGA-62653
Human Body Model EIA/JESD22-A114-B 200V 250V
Machine Model EIA/JESD22-A115-A 40V 50V
Class 0 is HBM ESD voltage level <250V, Class 1A is voltage level between 250 and 500V
Class A is MM ESD voltage level <200V, Class B is voltage level between 200 and 400V, Class C is voltage level to >400V.
Notes: ESD sensitivity levels for Human Body Model and Machine Model necessitate the following handling
precautions:
1. Ensure Faraday cage or conductive shield bag is used during transportation processes.
2. If the static charge at SMT assembly station is above device sensitivity level, place an ionizer near to the
device for c harge neutra lization purposes.
3. Personal grounding must be worn at all time when handling the devices.
Moistu re Sensitivity Classif ication : Class 1
Preconditioning per JESD22-A113-B class 1 was performed on all devices prior to reliability testing except for
ESD cla ssification t est.
Flammability Rating: UL Class 94V-0
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Data subject to change.
Copyright © 2003 Agilent Technologies, Inc.
