ADC10D1000QML ADC10D1000QML Low Power, 10-Bit, Dual 1.0 GSPS or Single 2.0 GSPS A/D Converter Literature Number: SNAS466E ADC10D1000QML Low Power, 10-Bit, Dual 1.0 GSPS or Single 2.0 GSPS A/D Converter 1.0 General Description 2.0 Features The ADC10D1000 is the latest advance in National's UltraHigh-Speed ADC family of products. This low-power, highperformance CMOS analog-to-digital converter digitizes signals at 10-bit resolution at sampling rates of up to 1.0 GSPS in dual channel mode or 2.0 GSPS in single channel mode. The ADC10D1000 achieves excellent accuracy and dynamic performance while consuming a typical 2.9 Watts of power. This space grade, Radiation Tolerant part is rad hard to a single event latch up level of greater than 120MeV and a total dose (TID) of 100 krad(Si). The product is packaged in a hermatic 376 column thermally enhanced CCGA package rated over the temperature range of -55C to +125C. The ADC10D1000 builds upon the features, architecture and functionality of the 8-bit GHz family of ADCs. New features include an auto-sync feature for multi-chip synchronization, independent programmable15-bit gain and 12-bit offset adjustment per channel, LC tank filter on the clock input, and the option of two's complement format for the digital output data. The unique folding and interpolating architecture, the fully differential comparator design, the innovative design of the internal track-and-hold amplifier and the self-calibration scheme enable a very flat response of all dynamic parameters beyond Nyquist, producing a high 8.9 Effective Number of Bits (ENOB) with a 498 MHz input signal and a 1.0 GHz sample rate while providing a 10-18 Code Error Rate (C.E.R.) Consuming a typical 2.9 Watts in Non-Demultiplex Mode at 1.0 GSPS from a single 1.9 Volt supply, this device is guaranteed to have no missing codes over the full operating temperature range. Each channel has its own independent DDR Data Clock, DCLKI and DCLKQ, which are in phase when both channels are powered up, so that only one Data Clock could be used to capture all data, which is sent out at the same rate as the input sample clock. If the 1:2 Demultiplexed Mode is selected, a second 10-bit LVDS bus becomes active for each channel, such that the output data rate is sent out two times slower, but two times wider to relax data-capture timing margin. The two channels (I and Q) can also be interleaved (DES Mode) and used as a single 2.0 GSPS ADC to sample on the Q input. The output formatting is offset binary or two's complement and the Low Voltage Differential Signaling (LVDS) digital outputs are compatible with IEEE 1596.3-1996, with the exception of an adjustable common mode voltage between 0.8V and 1.2V. (c) 2010 National Semiconductor Corporation 300718 Total Ionizing Dose 100 krad(Si) Single Event Latch-up 120 Mev-cm2/mg Excellent accuracy and dynamic performance Low power consumption R/W SPI Interface for Extended Control Mode Internally terminated, buffered, differential analog inputs Ability to interleave the two channels to operate one channel at twice the conversion rate Test patterns at output for system debug Programmable 15-bit gain and 12-bit plus sign offset adjustments Option of 1:2 demuxed or 1:1 non-demuxed LVDS outputs Auto-sync feature for multi-chip systems Single 1.9V0.1V power supply 376 Ceramic Column Grid Array package (28.2mm x 28.2mm x 3.1mm with 1.27mm ball-pitch) 3.0 Key Specifications (Non-Demux Non-DES Mode, Fs = 1.0 GSPS, Fin = 248 MHz) 10 Bits Resolution Conversion Rate -- Dual channels at 1.0 GSPS (typ) -- Single channel at 2.0 GSPS (typ) 10 -18 (typ) Code Error Rate 9.0 bits (typ) ENOB 56.1 dBc (typ) SNR 63 dBc (typ) SFDR 2.8 GHz (typ) Full Power Bandwidth 0.2 LSB (typ) DNL Power Consumption 1.64W (typ) -- Single Channel Enabled 2.9W (typ) -- Dual Channels Enabled 6 mW (typ) -- Power Down Mode 4.0 Applications Data Acquisition Systems Wideband Communications Direct RF Down Conversion www.national.com ADC10D1000QML Low Power, 10-Bit, Dual 1.0 GSPS or Single 2.0 GSPS A/D Converter May 10, 2010 ADC10D1000QML 5.0 Ordering Information NS Part Number SMD Part Number NS Package Number Package Description CCC376A 376 Ceramic Column Grid Array CCC376A 376 Ceramic Column Grid Array CCC376A 376 Ceramic Column Grid Array ADC10D1000CCMLS Flight Part ADC10D1000CCRQV Flight Part TBD ADC10D1000CCMPR Pre-flight Prototype ADC10D1000CVAL Ceramic Evaluation Board 376 Ceramic Column Grid Array on Evaluation Board 6.0 Block Diagram 30071853 FIGURE 1. Simplified Block Diagram www.national.com 2 1.0 General Description ......................................................................................................................... 1 2.0 Features ........................................................................................................................................ 1 3.0 Key Specifications ........................................................................................................................... 1 4.0 Applications .................................................................................................................................... 1 5.0 Ordering Information ....................................................................................................................... 2 6.0 Block Diagram ................................................................................................................................ 2 7.0 Connection Diagram ........................................................................................................................ 6 8.0 Column Descriptions and Equivalent Circuits ....................................................................................... 7 9.0 Absolute Maximum Ratings ............................................................................................................ 15 10.0 Operating Ratings ....................................................................................................................... 15 11.0 Quality Conformance Inspection .................................................................................................... 15 12.0 Converter Electrical Characteristics ............................................................................................... 16 13.0 Specification Definitions ................................................................................................................ 26 14.0 Transfer Characteristic ................................................................................................................. 28 15.0 Timing Diagrams ......................................................................................................................... 29 16.0 Typical Performance Plots ............................................................................................................ 32 17.0 Functional Description .................................................................................................................. 38 17.1 OVERVIEW ......................................................................................................................... 38 17.2 POWER-ON RESET ............................................................................................................. 38 17.3 CONTROL MODES .............................................................................................................. 38 17.3.1 Non-Extended Control Mode ........................................................................................ 38 17.3.1.1 Non-Demultiplexed Mode Pin (NDM) ................................................................... 38 17.3.1.2 Dual Data Rate Phase Pin (DDRPh) .................................................................... 38 17.3.1.3 Calibration Pin (CAL) ......................................................................................... 39 17.3.1.4 Power Down I-channel Pin (PDI) ......................................................................... 39 17.3.1.5 Power Down Q-channel Pin (PDQ) ...................................................................... 39 17.3.1.6 Test Pattern Mode Pin (TPM) ............................................................................. 39 17.3.1.7 Full-Scale Input Range Pin (FSR) ....................................................................... 39 17.3.1.8 LVDS Output Common-mode Pin (VBG) ............................................................... 39 17.3.2 Extended Control Mode ............................................................................................... 40 17.3.2.1 The Serial Interface ........................................................................................... 40 17.4 FEATURES ......................................................................................................................... 43 17.4.1 Input Control and Adjust .............................................................................................. 44 17.4.1.1 Input Full-Scale Range Adjust ............................................................................ 44 17.4.1.2 Input Offset Adjust ............................................................................................ 44 17.4.1.3 DES/Non-DES Mode ......................................................................................... 44 17.4.1.4 Sampling Clock Phase Adjust ............................................................................. 44 17.4.1.5 LC Filter on Input Clock ..................................................................................... 44 17.4.2 Output Control and Adjust ............................................................................................ 44 17.4.2.1 DDR Clock Phase ............................................................................................. 45 17.4.2.2 LVDS Output Differential Voltage ........................................................................ 45 17.4.2.3 LVDS Output Common-Mode Voltage ................................................................. 45 17.4.2.4 Output Formatting ............................................................................................. 45 17.4.2.5 Demux/Non-demux Mode .................................................................................. 45 17.4.2.6 Test Pattern Mode ............................................................................................ 45 17.4.3 Calibration Feature ..................................................................................................... 46 17.4.3.1 Calibration Pins ................................................................................................ 46 17.4.3.2 How to Initiate a Calibration Event ....................................................................... 46 17.4.3.3 On-command Calibration ................................................................................... 46 17.4.3.4 Calibration Adjust .............................................................................................. 46 17.4.3.5 Calibration and Power-Down .............................................................................. 46 17.4.4 Power Down .............................................................................................................. 46 18.0 Applications Information ............................................................................................................... 47 18.1 THE ANALOG INPUTS ......................................................................................................... 47 18.1.1 Acquiring the Input ...................................................................................................... 47 18.1.2 The Reference Voltage and FSR .................................................................................. 47 18.1.3 Out-Of-Range Indication .............................................................................................. 47 18.1.4 AC-coupled Input Signals ............................................................................................ 47 18.1.5 Single-Ended Input Signals .......................................................................................... 48 18.2 THE CLOCK INPUTS ........................................................................................................... 48 18.2.1 CLK Coupling ............................................................................................................. 48 18.2.2 CLK Frequency .......................................................................................................... 48 18.2.3 CLK Level .................................................................................................................. 48 18.2.4 CLK Duty Cycle .......................................................................................................... 48 3 www.national.com ADC10D1000QML Table of Contents ADC10D1000QML 18.2.5 CLK Jitter .................................................................................................................. 18.2.6 CLK Layout ................................................................................................................ 18.3 THE LVDS OUTPUTS ........................................................................................................... 18.3.1 Common-mode and Differential Voltage ......................................................................... 18.3.2 Output Data Rate ........................................................................................................ 18.4 SYNCHRONIZING MULTIPLE ADC10D1000S IN A SYSTEM .................................................... 18.4.1 AutoSync Feature ....................................................................................................... 18.4.2 DCLK Reset Feature ................................................................................................... 18.5 SUPPLY/GROUNDING, LAYOUT AND THERMAL RECOMMENDATIONS ................................. 18.5.1 Power Planes ............................................................................................................. 18.5.1.1 Bypass Capacitors ............................................................................................ 18.5.1.1.1 Ground Plane ......................................................................................... 18.5.1.1.2 Power Supply Example ............................................................................ 18.6 THERMAL MANAGEMENT ................................................................................................... 18.7 TEMPERATURE SENSOR DIODE ......................................................................................... 18.8 RADIATION ENVIRONMENTS .............................................................................................. 18.8.1 Total Ionizing Dose ..................................................................................................... 18.8.2 Single Event Latch-Up and Functional Interrupt .............................................................. 18.8.3 Single Event Upset ..................................................................................................... 18.9 BOARD MOUNTING RECOMMENDATION ............................................................................. 19.0 Register Definitions ...................................................................................................................... 20.0 Revision History .......................................................................................................................... 21.0 Physical Dimensions .................................................................................................................... 48 48 48 49 49 49 49 49 50 50 50 50 50 52 53 53 53 53 53 54 55 61 62 List of Figures FIGURE 1. Simplified Block Diagram ............................................................................................................. 2 FIGURE 2. ADC10D1000 Connection Diagram ................................................................................................ 6 FIGURE 3. LVDS Output Signal Levels ......................................................................................................... 26 FIGURE 4. Input / Output Transfer Characteristic ............................................................................................. 28 FIGURE 5. Clocking in 1:4 Demux DES Mode ................................................................................................ 29 FIGURE 6. Clocking in 1:2 Demux Non-DES Mode* ......................................................................................... 29 FIGURE 7. Clocking in Non-Demux Mode Non-DES Mode** ............................................................................... 30 FIGURE 8. Clocking in Non-Demux Mode DES Mode ....................................................................................... 30 FIGURE 9. Data Clock Reset Timing ............................................................................................................ 31 FIGURE 10. On-Command Calibration Timing ................................................................................................ 31 FIGURE 11. Serial Interface Timing ............................................................................................................. 31 FIGURE 12. Serial Interface Timing (Zoom Start)*** ......................................................................................... 41 FIGURE 13. Serial Interface Timing (Zoom End)**** ......................................................................................... 41 FIGURE 14. Serial Data Protocol - Read Operation .......................................................................................... 42 FIGURE 15. Serial Data Protocol - Write Operation .......................................................................................... 42 FIGURE 16. DDR DCLK-to-Data Phase Relationship ........................................................................................ 45 FIGURE 17. AC-coupled Differential Input ..................................................................................................... 47 FIGURE 18. Single-Ended to Differential Conversion Using a Balun ...................................................................... 48 FIGURE 19. Differential Input Clock Connection .............................................................................................. 48 FIGURE 20. AutoSync Example ................................................................................................................. 49 FIGURE 21. DCLK RST +/- ....................................................................................................................... 50 FIGURE 22. Power and Grounding Example .................................................................................................. 51 FIGURE 23. CCGA Conceptual Drawing ....................................................................................................... 52 FIGURE 24. Typical Temperature Sensor Application ....................................................................................... 53 FIGURE 25. Landing Pattern Recommendation ............................................................................................... 54 List of Tables TABLE 1. Analog Front-End and Clock Pins .................................................................................................... 7 TABLE 2. Control and Status Pins ................................................................................................................ 9 TABLE 3. Power and Ground Pins ............................................................................................................... 12 TABLE 4. High-Speed Digital Outputs .......................................................................................................... 13 TABLE 5. Static Converter Characteristics ..................................................................................................... 16 TABLE 6. Dynamic Converter Characteristics ................................................................................................. 17 TABLE 7. Analog Input/Output and Reference Characteristics ............................................................................. 20 TABLE 8. Channel-to-Channel Characteristics ................................................................................................ 20 TABLE 9. LVDS CLK Input Characteristics .................................................................................................... 21 TABLE 10. Digital Control and Output Pin Characteristics ................................................................................... 21 TABLE 11. Power Supply Characteristics (1:2 Demux Mode) .............................................................................. 22 TABLE 12. AC Electrical Characteristics ........................................................................................................ 23 TABLE 13. Non-ECM Pin Summary ............................................................................................................. 38 TABLE 14. Serial Interface Pins .................................................................................................................. 40 TABLE 15. Command and Data Field Definitions ............................................................................................. 40 www.national.com 4 5 43 44 44 45 45 46 47 47 53 54 55 www.national.com ADC10D1000QML TABLE 16. Features and Modes ................................................................................................................ TABLE 17. LC Filter Code vs. fC ................................................................................................................. TABLE 18. LC Filter Bandwidth at 1GHz ....................................................................................................... TABLE 19. Test Pattern by Output Port in1:2 Demux Mode ................................................................................ TABLE 20. Test Pattern by Output Port inNon-Demux Mode ............................................................................... TABLE 21. Calibration Pins ....................................................................................................................... TABLE 22. Input Channel Samples Produced at Data Outputs in Demultiplexed Mode ............................................... TABLE 23. Input Channel Samples Produced at Data Outputs in Non-Demux Mode .................................................. TABLE 24. Temperature Sensor Recommendation .......................................................................................... TABLE 25. Solder Profile Specification ......................................................................................................... TABLE 26. Register Addresses .................................................................................................................. ADC10D1000QML 7.0 Connection Diagram 30071801 FIGURE 2. ADC10D1000 Connection Diagram The center ground pins are for thermal dissipation and must be soldered to a ground plane to ensure rated performance. For best performance, a common ground plane on multiple PC board layers is recommended. www.national.com 6 TABLE 1. Analog Front-End and Clock Pins Column Name H1/J1 N1/M1 VinI+/VinQ+/- U2/V1 CLK+/- V2/W1 Equivalent Circuit Description Differential Signal I- and Q-Inputs. In the NonDual Edge Sampling (Non-DES) Mode, each Iand Q-channel is sampled and converted by its respective converter with each positive transition of the CLK+/- input. In the DES Mode and Extended Control Mode (ECM), only the Q-channel may be selected for conversion by the DESQ Bit (Addr: 0h, Bit 6). In the DES mode the Q-channel input is converted on the positive and negative edge of the CLK input. Each I- and Q-channel input has an internal DCbias. Both channels must be AC coupled. In Non-ECM, the full-scale range of these inputs is determined by FSR (Pin Y3) and both I- and Qchannels have the same full-scale input range. In ECM, the full-scale input range of the I- and Qchannel inputs is independently determined by the setting of Addr: 3h and Addr: Bh, respectively. Note that the higher and lower full-scale input range setting in Non-ECM does not exactly correspond to the maximum and minimum full-scale input range in ECM. Additional features include: an input offset adjust, in Extended Control Mode. Differential Converter Sampling Clock. In the Non-DES Mode, the analog inputs are sampled on the positive transitions of this clock signal. In the DES Mode, the Q-channel is sampled on both transitions of this clock. This clock must be ACcoupled. Additional features include: LC filter on the clock input. Differential DCLK Reset. A positive pulse on this input is used to reset the DCLKI+/- and DCLKQ+/- outputs of two or more ADC10D1000s in order to synchronize them with other ADC10D1000s in the system. DCLKI+/- and DCLKQ+/- are always in phase with each other, unless one channel is powered down, and do not require a pulse from DCLK_RST+/- to become synchronized. The pulse applied here must meet timing relationships with respect to the CLK+/input. This feature may still be used while the chip is in the AutoSync Mode. DCLK_RST+/- 7 www.national.com ADC10D1000QML 8.0 Column Descriptions and Equivalent Circuits ADC10D1000QML Column B1 C1/D2 C3/D3 Name Equivalent Circuit Description Bandgap Voltage Output or LVDS Commonmode Voltage Select. This pin provides the bandgap output voltage and is capable of sourcing/ sinking 100 uA and driving a load of up to 80 pF. Alternately, this pin may be used to select the LVDS digital output common-mode voltage. If tied to logic-high, the higher LVDS common-mode voltage is selected. The lower value is the default. VBG External Reference and Input Termination Trim Resistor terminals. A 3.3 k 0.1% resistor should be connected between Rtrim+/-. The Rtrim resistor is used to establish the calibrated 100 input impedance of VinI+/-, VinQ+/- and CLK+/-. These impedances may be fine tuned by varying the value of the resistor by a corresponding percentage; however, the tuning range and performance is not guaranteed for such an alternate value. Rtrim+/- A 3.3 k 0.1% resistor should be connected between Rext+/-. The Rext resistor is used for setting internal temperature-independent bias currents; the value and precision of this resistor should not be compromised. Rext+/- Temperature Sensor Diode Positive (Anode) and Negative (Cathode) Terminals. This set of pins is used for die temperature measurements. E2/F3 www.national.com Tdiode+/- 8 Name Y4/W5 Y5/U6 V6/V7 Equivalent Circuit Description Reference Clock Input. When the AutoSync feature is active, and the ADC10D1000 is in Slave Mode, the internal divided clocks are synchronized with respect to this input clock. The delay on this clock may be adjusted when synchronizing multiple ADCs. This feature is available in ECM via Control Register (Addr: Eh). RCLK+/- Reference Clock Output 1 and 2. These signals provide a reference clock at a rate of CLK/4, when enabled, independently of whether the ADC is in Master or Slave Mode. They are used to drive the RCLK of another ADC10D1000, to enable automatic synchronization for multiple ADCs (AutoSync feature.) The impedance of each trace from RCOut1+/- and RCOut2+/- to the RCLK+/- of another ADC10D1000 should be 100 differential. Having two clock outputs allows the auto-synchronization to propagate as a binary tree. Use the DOC Bit (Addr: Eh, Bit 1) to enable/ disable this feature; default is disabled. RCOut1+/RCOut2+/- TABLE 2. Control and Status Pins Column D6 Name Equivalent Circuit Description Calibration Cycle Initiate. The user can command the device to execute a self-calibration cycle by holding this input high a minimum of tCAL_H after having held it low a minimum of tCAL_L. This pin is active in both ECM and Non-ECM. In ECM, this pin is logically OR'd with the CAL Bit (Addr: 0h, Bit 15) in the Control Register. Therefore, both pin and bit must be set low and then either can be set high to execute an on-command calibration. CAL Calibration Running Indication. This output is logichigh while the calibration sequence is executing. This output is logic-low while the calibration sequence is not running. B5 CalRun 9 www.national.com ADC10D1000QML Column ADC10D1000QML Column U3 V3 A4 A5 Y3 W4 www.national.com Name Equivalent Circuit Description Power Down I- and Q-channel. Setting either input to logic-high powers down the respective I- or Q-channel converter. Setting either input to logic-low brings the respective I- or Q-channel converter to a fully operational state after a finite time delay. This pin is active in both ECM and Non-ECM. In the ECM, either this pin or the PDI and PDQ Bit in the Control Register can be used to power-down the I- and Q-channel (Addr: 0h, Bit 11 and Bit 10), respectively. PDI PDQ TPM Test Pattern Mode. With this input at logic-high, the device continuously outputs a fixed, repetitive test pattern at the digital outputs. In the ECM, this input is ignored and the test pattern mode can only be activated through the Control Register by the TPM Bit (Addr: 0h, Bit 12). NDM Non-Demuxed Mode. Setting this input to logic-high causes the digital output bus to be in the 1:1 NonDemuxed Mode. Setting this input to logic-low causes the digital output bus to be in the 1:2 Demuxed Mode. This feature is pin-controlled only and remains active during ECM and Non-ECM. Full-Scale input Range Select. In Non-ECM, when this input is set to logic-low or logic-high, the full-scale differential input range for both I- and Q-channel inputs is set to the lower or higher value, respectively. In the ECM, this input is ignored and the full-scale range of the I- and Q-channel inputs is independently determined by the setting of Addr: 3h and Addr: Bh, respectively. Note that the higher and lower FSR value in Non-ECM does not precisely correspond to the maximum and minimum available selection in ECM; in ECM, the selection range is greater. FSR DDR Phase Select. This input, when logic-low, selects the 0-degree Data-to-DCLK phase relationship. When logic-high, it selects the 90-degree Data-to-DCLK phase relationship. This pin only has an effect when the chip is in 1:2 Demuxed Mode, e.g. the NDM pin is set to logic-low. In ECM, this input is ignored and the DDR phase is selected through the Control Register by the DPS Bit (Addr: 0h, Bit 14); the default is 0degree Data-to-DCLK phase relationship. DDRPh 10 B3 C4 C5 Name Equivalent Circuit Description ECE Extended Control Enable bar. Extended feature control through the SPI interface is enabled when this signal is asserted logic-low. In this case, most of the direct control pins have no effect. When this signal is de-asserted, i.e. logic-high, the SPI interface is disabled and the direct control pins are enabled. SCS Serial Chip Select bar. In ECM, when this signal is asserted logic-low, SCLK is used to clock in serial data which is present on the SDI input and to source serial data on the SDO output. When this signal is deasserted, i.e. logic-high, the SDI input is ignored and the SDO output is in tri-state mode. Serial Clock. In ECM, serial data is shifted into and out of the device synchronously to this clock signal. This clock may be disabled and held logic-low, so long as timing specifications are not violated when the clock is enabled or disabled. SCLK Serial Data-In. In ECM, serial data is shifted into the device on this pin while SCS signal is asserted (logiclow). B4 SDI Serial Data-Out. In ECM, serial data is shifted out of the device on this pin while SCS signal is asserted (logic-low). This output is in tri-state mode when SCS is de-asserted. A3 SDO W3 RSV Reserved: This pin is used for internal purposes and should be connected to GND through a 100K resistor. NONE 11 www.national.com ADC10D1000QML Column ADC10D1000QML TABLE 3. Power and Ground Pins Column A2, A6, B6, C7, D1, D8, D9, E1, F1, H4, N4, R1, T1, U8, U9, W6, Y2, Y6 G1, G3, G4, H2, J3, K3, L3, M3, N2, P1, P3, P4, R3, R4 Name VA VTC Equivalent Circuit NONE A8, B9, C8, V8, W9, Y8 VE NONE A1, A7, B2, B7, C2, C6, D4, D5, E4, K1, L1, T4, U4, U5, V4, V5, W2, W7, Y1, Y7, AA2thru AL11 F2, G2, H3, J2, K4, L4, M2, N3, P2, R2, T2, T3, U1 www.national.com Analog Power Supply for the Track-and-Hold and Clock circuitry. NONE VDR F4, L2, M4, U7 Analog Power Supply. This supply is tied to the ESD ring. Therefore, it must be powered up before or with any other supply. NONE A11, A15, C18, D11, D15, D17, J17, J20, R17, R20, T17, U11, U15, U16, Y11, Y15 D7, E3, J4, K2 Description Power Supply for the Output Drivers. VbiasI VbiasQ Power Supply for the Digital Encoder. NONE Bias Voltage I-channel. This is an externally decoupled bias voltage for the I-channel. Each pin should individually be decoupled with a 100nF capacitor via a low resistance, low inductance path to GND. NONE Bias Voltage Q-channel. This is an externally decoupled bias voltage for the Q-channel. Each pin should individually be decoupled with a 100nF capacitor via a low resistance, low inductance path to GND. Analog Ground Return. GND GNDTC NONE Analog Ground Return for the Track-and-Hold and Clock circuitry. NONE 12 Name Equivalent Circuit A10, A13, A17, A20, B10 B18, B19, B20, C10, C17, D10, D13, D16, E17, F17, F20, M17, M20, U10,U13, U17, V10, V17, V18, W10, W18, W19, W20, Y10, Y13, Y17, Y20 GNDDR NONE A9, B8, C9, V9, W8, Y9 GNDE NONE ADC10D1000QML Column Description Ground Return for the Output Driver. Ground Return for the Digital Encoder. TABLE 4. High-Speed Digital Outputs Column K19/K20 L19/L20 K17/K18 L17/L18 Name Equivalent Circuit Description Data Clock Output for the I- and Q-channel data bus. These differential clock outputs are used to latch the output data and should always be terminated with a 100 differential resistor. Delayed and non-delayed data outputs are supplied synchronously to this signal. In 1:2 Demux Mode or Non-Demux Mode, this signal is at 1/4 or 1/2 the input clock rate, respectively. DCLKI+/- and DCLKQ+/- are always in phase with each other, unless one channel is powered down and do not require a pulse from DCLK_RST+/- to become synchronized. DCLKI+/DCLKQ+/- Out-of-Range Output for the I- and Q-channel. This differential output is asserted logic-high while the overor under-range condition exists, i.e. the differential signal at each respective analog input exceeds the fullscale value. Each OR results refers to the current Data, with which it is clocked out. Each of these outputs should always be terminated with a 100 differential resistor placed as closely as possible to the differential receiver. ORI+/ORQ+/- 13 www.national.com ADC10D1000QML Column Name J18/J19 H19/H20 H17/H18 G19/G20 G17/G18 F18/F19 E19/E20 D19/D20 D18/E18 C19/C20 * M18/M19 N19/N20 N17/N18 P19/P20 P17/P18 R18/R19 T19/T20 U19/U20 U18/T18 V19/V20 DI9+/DI8+/DI7+/DI6+/DI5+/DI4+/DI3+/DI2+/DI1+/DI0+/* DQ9+/DQ8+/DQ7+/DQ6+/DQ5+/DQ4+/DQ3+/DQ2+/DQ1+/DQ0+/- I- and Q-channel Digital Data Outputs. In Non-Demux Mode, this LVDS data is transmitted at the sampling clock rate. In Demux Mode, these outputs provide 1/2 the data at 1/2 the sampling clock rate, synchronized with the delayed data, i.e. the other 1/2 of the data which was sampled one clock cycle earlier. Compared with the DId and DQd outputs, these outputs represent the later time samples. Each of these outputs should always be terminated with a 100 differential resistor placed as closely as possible to the differential receiver A18/A19 B17/C16 A16/B16 B15/C15 C14/D14 A14/B14 B13/C13 C12/D12 A12/B12 B11/C11 * Y18/Y19 W17/V16 Y16/W16 W15/V15 V14/U14 Y14/W14 W13/V13 V12/U12 Y12/W12 W11/V11 DId9+/DId8+/DId7+/DId6+/DId5+/DId4+/DId3+/DId2+/DId1+/DId0+/* DQd9+/DQd8+/DQd7+/DQd6+/DQd5+/DQd4+/DQd3+/DQd2+/DQd1+/DQd0+/- Delayed I- and Q-channel Digital Data Outputs. In Non-Demux Mode, these outputs are tri-stated. In Demux Mode, these outputs provide 1/2 the data at 1/2 the sampling clock rate, synchronized with the nondelayed data, i.e. the other 1/2 of the data which was sampled one clock cycle later. Compared with the DI and DQ outputs, these outputs represent the earlier time samples. Each of these outputs should always be terminated with a 100 differential resistor placed as closely as possible to the differential receiver. www.national.com Equivalent Circuit Description 14 10.0 Operating Ratings (Note 1, Note 2) (Note 1, Note 2) Supply Voltage (VA, VTC, VDR, VE) 2.2V Supply Difference max(VA /TC/DR /E) -min(VA /TC/DR/E) 0V to 100 mV Voltage on Any Input Pin -0.15V to (VA +0.15V) Voltage on VIN+, VIN-0.15V to 2.5V (Maintaining Common Mode) Ground Difference max(GNDTC/DR/E) -min(GNDTC/DR/E) 0V to 100 mV Input Current at Any Pin (Note 3) 50 mA Power Dissipation at TA 85C (Note 3) ESD Susceptibility (Note 4) Human Body Model Charged Device Model Machine Model Storage Temperature Ambient Temperature Range -55C TA +125C Supply Voltage (VA, VTC, VE) Driver Supply Voltage (VDR) VIN+, VIN- Voltage Range (Maintaining Common Mode) +1.8V to +2.0V +1.8V to VA 0V to 2.15V (100% duty cycle) 0V to 2.5V (10% duty cycle) Ground Difference max(GNDTC/DR/E) -min(GNDTC/DR/E) CLK Pins Voltage Range Differential CLK Amplitude 3.4 W 0V 0V to VA 0.4VP-P to 2.0VP-P Package Thermal Resistance 8000V 750V 250V -65C to +150C Package JA 376 Ceramic 10.4C / W Column Grid Array JB To Board 3.2C / W Solder process specifications in Section 18.9 BOARD MOUNTING RECOMMENDATION 11.0 Quality Conformance Inspection MIL-STD-883, Method 5005 - Group A Subgroup Description Temp (C) 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 12 Setting time at +25 13 Setting time at +125 14 Setting time at -55 15 www.national.com ADC10D1000QML 9.0 Absolute Maximum Ratings ADC10D1000QML 12.0 Converter Electrical Characteristics (Note 13) The following specifications apply after calibration for VA = VDR = VTC = VE = +1.9V; I- and Q-channels AC coupled, FSR Pin = High; CL = 10 pF; Differential AC coupled Sine Wave Input Clock, fCLK = 1 GHz at 0.5 VP-P with 50% duty cycle; VBG = Floating; Non-extended Control Mode; Rext = Rtrim = 3300 0.1%; Analog Signal Source Impedance = 100 Differential; 1:2 Demultiplex Non-DES Mode; I- and Q-channels; Duty Cycle Stabilizer on. Boldface limits apply for TA = TMIN to TMAX, unless otherwise noted. All other limits TA = 25C, unless otherwise noted. (Note 5, Note 6, Note 12) TABLE 5. Static Converter Characteristics Symbol Parameter Conditions Notes Typical Min Max Units Subgroups INL Integral Non-Linearity (Best fit) D.C. Coupled, 1 MHz Sine Wave Over-ranged 0.7 1.4 LSB 1, 2, 3 DNL Differential Non-Linearity D.C. Coupled, 1 MHz Sine Wave Over-ranged 0.2 0.5 LSB 1, 2, 3 10 bits 1, 2, 3 Resolution with No Missing Codes VOFF Offset Error VOFF_ADJ Input Offset Adjustment Range PFSE Positive Full-Scale Error (Note 8) 28.0 mV 1, 2, 3 NFSE Negative Full-Scale Error (Note 8) 28.0 mV 1, 2, 3 Out of Range Output Code www.national.com Extended Control Mode -2.8 LSB 45 mV (VIN+) - (VIN-) > + Full Scale 1023 1, 2, 3 (VIN+) - (VIN-) < - Full Scale 0 1, 2, 3 16 Symbol FPBW C.E.R. Parameter Full Power Bandwidth Noise Power Ratio Notes Typical Min Max Units Non-DES Mode 2.8 GHz DES Mode 1.3 GHz 10-18 Error/ Sample D.C. to 498 MHz 0.25 dBFS D.C. to 1.0 GHz 0.5 dBFS fc,notch = 325 MHz, notch width = 25 MHz 47.5 dB Code Error Rate Gain Flatness NPR Conditions Subgroups 1:2 Demux Non-DES Mode, Extended Control Mode, FM (14:0) = 7FFFh ENOB Effective Number of Bits fIN = 248 MHz, VIN = -0.5 dBFS, TA = 25C to TMax fIN = 248 MHz, VIN = -0.5 dBFS, TA = TMIN fIN = 498 MHz, VIN = -0.5 dBFS, TA = 25C to TMax fIN = 498 MHz, VIN = -0.5 dBFS, TA = TMIN SINAD Signal-to-Noise Plus Distortion Ratio fIN = 248 MHz, VIN = -0.5 dBFS, TA = 25C to TMax fIN = 248 MHz, VIN = -0.5 dBFS, TA = TMIN fIN = 498 MHz, VIN = -0.5 dBFS, TA = 25C to TMax fIN = 498 MHz, VIN = -0.5 dBFS, TA = TMIN SNR Signal-to-Noise Ratio fIN = 248 MHz, VIN = -0.5 dBFS, TA = 25C to TMax fIN = 248 MHz, VIN = -0.5 dBFS, TA = TMIN fIN = 498 MHz, VIN = -0.5 dBFS, TA = 25C to TMax fIN = 498 MHz, VIN = -0.5 dBFS, TA = TMIN THD Total Harmonic Distortion fIN = 248 MHz, VIN = -0.5 dBFS, TA =25C to TMAX fIN = 248 MHz, VIN = -0.5 dBFS, TA = TMIN fIN = 498 MHz, VIN = -0.5 dBFS, TA = 25C to TMAX fIN = 498 MHz, VIN = -0.5 dBFS, TA = TMIN 2nd Harm Second Harmonic Distortion 3rd Harm Third Harmonic Distortion 8.4 bits 4, 5 7.8 bits 6 8.2 bits 4, 5 7.8 bits 6 52.2 dB 4, 5 48.5 dB 6 51.0 dB 4, 5 48.8 dB 6 53.2 dBc 4, 5 49.4 dBc 6 52.0 dBc 4, 5 49.4 dBc 6 -59.0 dBc 4, 5 -56.0 dBc 6 -58.0 dBc 4, 5 -57.0 dBc 6 9.0 8.9 55.8 55.4 56.8 56.1 -68 -61 fIN = 248 MHz, VIN = -0.5 dBFS -75 dBc fIN = 498 MHz, VIN = -0.5 dBFS -68 dBc fIN = 248 MHz, VIN = -0.5 dBFS -72 dBc fIN = 498 MHz, VIN = -0.5 dBFS -67 dBc 17 www.national.com ADC10D1000QML TABLE 6. Dynamic Converter Characteristics ADC10D1000QML Symbol SFDR Parameter Spurious-Free Dynamic Range Conditions fIN = 248 MHz, VIN = -0.5 dBFS, TA = 25C to TMax fIN = 248 MHz, VIN = -0.5 dBFS, TA = TMIN fIN = 498 MHz, VIN = -0.5 dBFS, TA = 25C to TMax fIN = 498 MHz, VIN = -0.5 dBFS, TA = TMIN Notes Typical Units Subgroups 59.0 dBc 4, 5 53.0 dBc 6 57.5 dBc 4, 5 54.5 dBc 6 8.1 bits 4, 5 7.8 bits 6 8 bits 4, 5 7.7 bits 6 50.3 dB 4, 5 48.5 dB 6 49.8 dB 4, 5 48.0 dB 6 50.9 dBc 4, 5 49.0 dBc 6 50.5 dBc 4, 5 48.5 dBc 6 -59.5 dBc 4, 5 -58.5 dBc 6 -58.5 dBc 4, 5 -58.0 dBc 6 Min Max 63.0 63.0 1:2 Demux Non-DES Mode, Non-Extended Control Mode, FSR = VA ENOB Effective Number of Bits fIN = 248 MHz, VIN = -0.5 dBFS, TA = 25C to TMAX fIN = 248 MHz, VIN = -0.5 dBFS, TA = TMIN fIN = 498 MHz, VIN = -0.5 dBFS, TA = 25C to TMAX fIN = 498 MHz, VIN = -0.5 dBFS, TA = TMIN SINAD Signal-to-Noise Plus Distortion Ratio fIN = 248 MHz, VIN = -0.5 dBFS, TA = 25C to TMAX fIN = 248 MHz, VIN = -0.5 dBFS, TA = TMIN fIN = 498 MHz, VIN = -0.5 dBFS, TA = 25C to TMAX fIN = 498 MHz, VIN = -0.5 dBFS, TA = TMIN SNR Signal-to-Noise Ratio fIN = 248 MHz, VIN = -0.5 dBFS, TA = 25C to TMAX fIN = 248 MHz, VIN = -0.5 dBFS, TA = TMIN fIN = 498 MHz, VIN = -0.5 dBFS, TA = 25C to TMAX fIN = 498 MHz, VIN = -0.5 dBFS, TA = TMIN THD Total Harmonic Distortion fIN = 248 MHz, VIN = -0.5 dBFS, TA = 25C to TMAX fIN = 248 MHz, VIN = -0.5 dBFS, TA = TMIN fIN = 498 MHz, VIN = -0.5 dBFS, TA = 25C to TMAX fIN = 498 MHz, VIN = -0.5 dBFS, TA = TMIN 2nd Harm Second Harmonic Distortion 3rd Harm Third Harmonic Distortion www.national.com 8.9 8.9 55.3 55.3 55.6 55.9 -67.0 -64.3 fIN = 248 MHz, VIN = -0.5 dBFS -75 dBc fIN = 498 MHz, VIN = -0.5 dBFS -68 dBc fIN = 248 MHz, VIN = -0.5 dBFS -72 dBc fIN = 498 MHz, VIN = -0.5 dBFS -68 dBc 18 SFDR Parameter Spurious-Free Dynamic Range Conditions fIN = 248 MHz, VIN = -0.5 dBFS, TA = 25C to TMAX fIN = 248 MHz, VIN = -0.5 dBFS, TA = TMIN fIN = 498 MHz, VIN = -0.5 dBFS, TA = 25C to TMAX fIN = 498 MHz, VIN = -0.5 dBFS, TA = TMIN Notes Typical Units Subgroups 57.5 dBc 4, 5 53.0 dBc 6 57.5 dBc 4, 5 54.5 dBc 6 Min Max 66.7 66.7 Non-Demux Non-DES Mode, Non-Extended Control Mode, FSR = VA ENOB Effective Number of Bits fIN = 498 MHz, VIN = -0.5 dBFS 9.0 bits (min) SINAD Signal-to-Noise Plus Distortion Ratio fIN = 498 MHz, VIN = -0.5 dBFS 56.2 dB (min) SNR Signal-to-Noise Ratio fIN = 498 MHz, VIN = -0.5 dBFS 56.7 dBc (min) THD Total Harmonic Distortion fIN = 498 MHz, VIN = -0.5 dBFS -65.7 dBc (max) 2nd Harm Second Harmonic Distortion fIN = 498 MHz, VIN = -0.5 dBFS -75 dBc 3rd Harm Third Harmonic Distortion fIN = 498 MHz, VIN = -0.5 dBFS -68 dBc SFDR Spurious-Free Dynamic Range fIN = 498 MHz, VIN = -0.5 dBFS 67.6 dBc (min) 1:4 Demux DES Mode (Q-channel only), ECM, Offset/Gain Adjusted ENOB Effective Number of Bits fIN = 498 MHz, VIN = -0.5 dBFS 8.7 bits (min) SINAD Signal-to-Noise Plus Distortion Ratio fIN = 498 MHz, VIN = -0.5 dBFS 54.2 dB (min) SNR Signal-to-Noise Ratio fIN = 498 MHz, VIN = -0.5 dBFS 55.3 dBc (min) THD Total Harmonic Distortion fIN = 498 MHz, VIN = -0.5 dBFS 60.7 dBc (max) 2nd Harm Second Harmonic Distortion fIN = 498 MHz, VIN = -0.5 dBFS -78 dBc 3rd Harm Third Harmonic Distortion fIN = 498 MHz, VIN = -0.5 dBFS -67 dBc SFDR Spurious-Free Dynamic Range fIN = 498 MHz, VIN = -0.5 dBFS 63.6 dBc (min) 19 www.national.com ADC10D1000QML Symbol ADC10D1000QML TABLE 7. Analog Input/Output and Reference Characteristics Symbol VIN_FSR Parameter Analog Differential Input Full Scale Range Conditions Notes FSR Pin Y3 Low Typical 630 FSR Pin Y3 High 820 Min Max 560 680 750 890 Units Subgroups mVP-P 4, 5, 6 mVP-P 4, 5, 6 mVP-P 4, 5, 6 mVP-P 4, 5, 6 Extended Control Mode CIN RIN VBG TC_VBG FM(14:0) = 0000h 600 mVP-P FM(14:0) = 4000h (default) 790 mVP-P FM(14:0) = 7FFFh 980 mVP-P Analog Input Capacitance, Differential Non-DES Mode Each input pin to ground (Note 9, Note 10) 0.02 pF 1.6 pF Analog Input Capacitance, Differential DES Mode Each input pin to ground (Note 9, Note 10) 0.08 pF 2.2 pF Differential Input Resistance 103.5 Bandgap Reference Output Voltage IBG = 100 A Bandgap Reference Voltage Temperature Coefficient IBG = 100A 1.25 CLOAD VBG Maximum Bandgap Reference Load Capacitance 1, 2, 3 108 V 1, 2, 3 1.35 V 1, 2, 3 100 1.15 50 ppm/C 80 pF 1, 2, 3 TABLE 8. Channel-to-Channel Characteristics Symbol Parameter Conditions Notes Offset Match Typical Min Max Units 2 LSB Zero offset selected in Control Register 2 LSB Negative Full-Scale Match Zero offset selected in Control Register 2 LSB fIN = 1.0 GHz <1 Degree X-TALK Crosstalk from I-channel Q-channel (Aggressor) to Q-channel (Victim) Aggressor = 498 MHz F.S. Victim = 100 MHz F.S. -61 dB X-TALK I-channel Aggressor = 498 MHz F.S. Victim = 100 MHz F.S. -61 dB Positive Full-Scale Match Phase Matching (I, Q) Crosstalk from Q-channel (Aggressor) to I-channel (Victim) www.national.com 20 Subgroups Symbol VIN_CLK Parameter Differential Clock Input Level Conditions Notes Sine Wave Clock 0.6 Square Wave Clock CIN_CLK RIN_CLK Sampling Clock Input Capacitance Typical 0.6 Differential (Note 9, Note 10) Each input to ground Sampling Clock Input Resistance Min Max 0.4 2.0 0.4 2.0 Units Subgroups VP-P 1, 2, 3 VP-P 1, 2, 3 VP-P 1, 2, 3 VP-P 1, 2, 3 0.1 pF 1 pF 100 TABLE 10. Digital Control and Output Pin Characteristics Symbol Parameter Conditions Notes Typical Min Max Units Subgroups V 1, 2, 3 V 1, 2, 3 Digital Control Pins, (Cal, PDI, PDQ, TPM, NDM, FSR, DDRPh, ECE, SCLK, SDI, SCS) VIH VIL Logic High Input Voltage Logic Low Input Voltage DES, CalDly, CAL, PDI, PDQ, TPM, NDM, FSR, DDRPh, ECE, SCLK, SDI, SCS 0.7 x VA DES, CalDly, CAL, PDI, PDQ, TPM, NDM, FSR, DDRPh, ECE, SCLK, SDI, SCS IT Input Current VIN = GND, VIN = VA CIN_DIG Input Capacitance Each input to ground 0.3 x VA (Note 10, Note 11) 1 A 1.5 pF Digital Output Pins (Data, DCLKI, DCLKQ, ORI, ORQ) VOD LVDS Differential Output Voltage VBG = Floating, OVS = VA 520 VBG = Floating, OVS = GND 374 VBG = VA, OVS = VA 568 VBG = VA, OVS = GND VO DIFF VOS VOS 400 Change in LVDS Output Swing Between Logic Levels Output Offset Voltage Output Short Circuit Current ZO Differential Output Impedance VOH Logic High Output Level 700 160 560 340 760 190 600 mVP-P 1, 2, 3 mVP-P 1, 2, 3 mVP-P 1, 2, 3 mVP-P 1, 2, 3 mVP-P 1, 2, 3 mVP-P 1, 2, 3 mVP-P 1, 2, 3 mVP-P 1, 2, 3 1 mV VBG = Floating 0.8 V VBG = VA 1.2 V 1 mV 3.8 mA 100 Output Offset Voltage Change Between Logic Levels IOS 300 VBG = Floating; D+ and D- connected to 0.8V CalRun, SDO IOH = -400 A 21 (Note 10) 1.65 1.5 V 1, 2, 3 www.national.com ADC10D1000QML TABLE 9. LVDS CLK Input Characteristics ADC10D1000QML Symbol VOL Parameter Logic Low Output Level Conditions CalRun, SDO IOH = 400 A Notes Typical (Note 10) 0.15 Min Max Units Subgroups 0.3 V 1, 2, 3 Differential DCLK Reset Pins (DCLK_RST) VCMI_DRST DCLK_RST Common Mode Input Voltage VID_DRST Differential DCLK_RST Input Voltage RIN_DRST Differential DCLK_RST Input Resistance (Note 10) 1.25 0.15 V 0.6 VP-P 100 TABLE 11. Power Supply Characteristics (1:2 Demux Mode) Symbol IA Parameter Analog Supply Current Conditions Notes IDR IE Max Units Subgroups 890 951 mA 1, 2, 3 PDI = Low; PDQ = High 505 551 mA 1, 2, 3 PDI = High; PDQ = Low 505 551 mA 1, 2, 3 2 mA Track-and-Hold and Clock PDI = PDQ = Low Supply Current PDI = Low; PDQ = High 358 376 mA 1, 2, 3 220 241 mA 1, 2, 3 PDI = High; PDQ = Low 220 241 mA 1, 2, 3 Output Driver Supply Current Digital Encoder Supply Current PDI = PDQ = High 1 PDI = PDQ = Low 210 271 mA 1, 2, 3 PDI = Low; PDQ = High 111 141 mA 1, 2, 3 PDI = High; PDQ = Low 111 141 mA 1, 2, 3 PDI = PDQ = High 10 PDI = PDQ = Low 60 101 mA 1, 2, 3 PDI = Low; PDQ = High 30.5 56 mA 1, 2, 3 PDI = High; PDQ = Low 30.5 56 mA 1, 2, 3 PDI = PDQ = High PC Min PDI = PDQ = Low PDI = PDQ = High ITC Typical Power Consumption A 10 A PDI = PDQ = Low 2.9 3.22 W 1, 2, 3 PDI = Low; PDQ = High 1.64 1.88 W 1, 2, 3 PDI = High; PDQ = Low 1.64 1.88 W 1, 2, 3 PDI = PDQ = High www.national.com mA 6 22 mW Symbol Parameter Conditions Notes Typical Min Max Units Subgroups 1.0 GHz 9, 10, 11 MHz 9, 10, 11 MHz 9, 10, 11 Input Clock (CLK) fCLK (max) Maximum Input Clock Frequency fCLK (min) Minimum Input Clock Frequency Non-DES Mode 200 DES Mode Input Clock Duty Cycle tCL Input Clock Low Time tCH Input Clock High Time 250 fCLK(min) fCLK fCLK (max) 50 % 20 80 % 500 200 ps (min) 500 200 ps (min) DCLK Duty Cycle % (min) 50 % (max) Data Clock (DCLKI, DCLKQ) tSR Setup Time DCLK_RST 45 ps tHR Hold Time DCLK_RST 45 ps tPWR Pulse Width DCLK_RST 5 Input Clock Cycles (min) tSYNC_DLY DCLK Synchronization Delay 90 Mode 4 tLHT Differential Low-to-High Transition Time 10% to 90%, CL = 2.5 pF 220 ps tHLT Differential High-to-Low Transition Time 10% to 90%, CL = 2.5 pF 220 ps tSU Data-to-DCLK Set-Up Time DDR Mode, 90 DCLK 850 ps tH DCLK-to-Data Hold Time DDR Mode, 90 DCLK 850 ps tOSK DCLK-to-Data Output Skew 50% of DCLK Transition to 50% of Data Transition 75 ps 0 Mode 5 23 Input Clock Cycles www.national.com ADC10D1000QML TABLE 12. AC Electrical Characteristics ADC10D1000QML Symbol Parameter Conditions Notes Typical Min Max Units Subgroups Data Input to Output tAD Sampling (Aperture) Delay Input CLK+ Fall to Acquisition of Data tAJ Aperture Jitter tOD Input Clock-to Data Output 50% of Input Clock transition to Delay (in addition to tLAT) 50% of Data transition Latency in DI, DQ Outputs 1:2 Demux Non-DES Mode DId, DQd Outputs Latency in 1:4 Demux DES Mode tORR tWU ns 0.2 ps (rms) 2.4 ns 34 (Note 10) 35 DI Outputs Input Clock Cycles 34.5 (Note 10) 35 DQd Outputs Input Clock Cycles DI Outputs Latency in Non-Demux DES Mode DI Outputs Over Range Recovery Time Differential VIN step from 1.2V to 0V to get accurate conversion 34 (Note 10) DQ Outputs 34 34 (Note 10) DQ Outputs PD Low to Rated Accuracy Non-DES Mode Conversion (Wake-Up DES Mode Time) 34.5 4, 5, 6 4, 5, 6 4, 5, 6 4, 5, 6 35.5 Latency in Non-Demux Non-DES Mode 4, 5, 6 4, 5, 6 34 DQ Outputs DId Outputs tLAT 1.1 Input Clock Cycles 4, 5, 6 Input Clock Cycles 4, 5, 6 1 Input Clock Cycle 500 ns 1 s 15 MHz 4, 5, 6 4, 5, 6 Serial Port Interface fSCLK Serial Clock Frequency Serial Clock Low Time Serial Clock High Time 30 ns 9, 10, 11 30 ns 9, 10, 11 tSSU Serial Data to Serial Clock Rising Setup Time 2.5 ns (min) tSH Serial Data to Serial Clock Rising Hold Time 1 ns (min) tSCS SCS to Serial Clock Rising Setup Time 2.5 ns tHCS SCS to Serial Clock Falling Hold Time 1.5 ns tBSU Bus Turn-around Time 10 ns www.national.com 24 Parameter Conditions Notes Typical Min Max Units Subgroups Calibration tCAL Calibration Cycle Time Non-ECM 2.4x107 ECM CSS = 0b 2.3x107 Clock Cycles ECM; CSS = 1b CMS(1:0) = 00b 0.8x107 CMS(1:0) = 01b 1.5x107 CMS(1:0) = 10b (ECM default) 2.4x107 Clock Cycles tCAL_L CAL Pin Low Time See Figure 10 (Note 10) 1280 Clock Cycles 9, 10, 11 tCAL_H CAL Pin High Time See Figure 10 (Note 10) 1280 Clock Cycles 9, 10, 11 Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. There is no guarantee of operation at the Absolute Maximum Ratings. Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. Note 2: All voltages are measured with respect to GND = GNDDR = GNDE = GNDTC = 0V, unless otherwise specified. Note 3: When the input voltage at any pin exceeds the power supply limit; (i.e. less than GND or greater than VA), the current at that pin should be limited to 50 mA. In addition, over voltage at a pin must adhere to maximum voltage limits. Simultaneously over voltage at multiple pins require adherence to the maximum package power dissipation limits. Note 4: Human body model is 100 pF capacitor discharged through a 1.5 k resistor. Machine model is 220 pF discharged through ZERO Ohms. Charged device model simulates a pin slowly acquiring charge (such as from a device sliding down the feeder in an automated assembler) then rapidly being discharged. Note 5: The analog inputs are protected as shown below. Input voltage magnitudes beyond the Absolute Maximum Ratings may damage this device. 30071804 Note 6: To guarantee accuracy, it is required that VA, VTC, VE and VDR be well-bypassed. Each supply pin must be decoupled with separate bypass capacitors. Note 7: Typical figures are at TA = 25C, and represent most likely parametric norms. Test limits are guaranteed to National's AOQL (Average Outgoing Quality Level). Note 8: Calculation of Full-Scale Error for this device assumes that the actual reference voltage is exactly its nominal value. Full-Scale Error for this device, therefore, is a combination of Full-Scale Error and Reference Voltage Error. See Figure 4. For relationship between Gain Error and Full-Scale Error, see Specification Definitions for Gain Error. Note 9: The analog and clock input capacitances are die capacitances only. Additional package capacitances of 0.22 pF differential and 1.06 pF each pin to ground are isolated from the die capacitances by lead and bond wire inductances. Note 10: This parameter is guaranteed by design and/or characterization and is not tested in production. Note 11: The digital control pin capacitances are die capacitances only. Additional package capacitance of 1.6 pF each pin to ground are isolated from the die capacitances by lead and bond wire inductances. Note 12: The maximum clock frequency for Non-Demux Mode is 1 GHz. Note 13: Pre and post irradiation limits are identical to those listed in the "DC " and "AC" Parameters Electrical Characteristics, except that they are tested at Room Temperature. 25 www.national.com ADC10D1000QML Symbol ADC10D1000QML 13.0 Specification Definitions APERTURE (SAMPLING) DELAY is the amount of delay, measured from the sampling edge of the CLK input, after which the signal present at the input pin is sampled inside the device. APERTURE JITTER (tAJ) is the variation in aperture delay from sample-to-sample. Aperture jitter can be effectively considered as noise at the input. CODE ERROR RATE (C.E.R.) is the probability of error and is defined as the probable number of word errors on the ADC output per unit of time divided by the number of words seen in that amount of time. A C.E.R. of 10-18 corresponds to a statistical error in one word about every four (4) years. CLOCK DUTY CYCLE is the ratio of the time that the clock waveform is at a logic high to the total time of one clock period. DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1 LSB. It is measured at sample rate = 500 MSPS with a 1MHz input sine wave. EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE BITS) is another method of specifying Signal-to-Noise and Distortion Ratio, or SINAD. ENOB is defined as (SINAD - 1.76) / 6.02 and states that the converter is equivalent to a perfect ADC of this many (ENOB) number of bits. FULL POWER BANDWIDTH (FPBW) is a measure of the frequency at which the reconstructed output fundamental drops to 3 dB below its low frequency value for a full-scale input. GAIN ERROR is the deviation from the ideal slope of the transfer function. It can be calculated from Offset and FullScale Errors. The Positive Gain Error is the Offset Error minus the Positive Full-Scale Error. The Negative Gain Error is the Negative Full-Scale Error minus the Offset Error. The Gain Error is the Negative Full-Scale Error minus the Positive FullScale Error; it is also equal to the Positive Gain Error plus the Negative Gain Error. INTEGRAL NON-LINEARITY (INL) is a measure of worst case deviation of the ADC transfer function from an ideal straight line drawn through the ADC transfer function. The deviation of any given code from this straight line is measured from the center of that code value step. The best fit method is used. INTERMODULATION DISTORTION (IMD) is the creation of additional spectral components as a result of two sinusoidal frequencies being applied to the ADC input at the same time. It is defined as the ratio of the power in the second and third order intermodulation products to the power in one of the original frequencies. IMD is usually expressed in dBFS. LSB (LEAST SIGNIFICANT BIT) is the bit that has the smallest value or weight of all bits. This value is 30071846 FIGURE 3. LVDS Output Signal Levels LVDS OUTPUT OFFSET VOLTAGE (VOS) is the midpoint between the D+ and D- pins output voltage with respect to ground; i.e., [(VD+) +( VD-)]/2. See Figure 3. MISSING CODES are those output codes that are skipped and will never appear at the ADC outputs. These codes cannot be reached with any input value. MSB (MOST SIGNIFICANT BIT) is the bit that has the largest value or weight. Its value is one half of full scale. NEGATIVE FULL-SCALE ERROR (NFSE) is a measure of how far the first code transition is from the ideal 1/2 LSB above a differential -VIN/2 with the FSR pin low. For the ADC10D1000 the reference voltage is assumed to be ideal, so this error is a combination of full-scale error and reference voltage error. NOISE POWER RATIO (NPR) is the ratio of the sum of the power inside the notched bins to the sum of the power in an equal number of bins outside the notch, expressed in dB. OFFSET ERROR (VOFF) is a measure of how far the midscale point is from the ideal zero voltage differential input. Offset Error = Actual Input causing average of 8k samples to result in an average code of 511.5. OUTPUT DELAY (tOD) is the time delay (in addition to Pipeline Delay) after the falling edge of CLK+ before the data update is present at the output pins. OVER-RANGE RECOVERY TIME is the time required after the differential input voltages goes from 1.2V to 0V for the converter to recover and make a conversion with its rated accuracy. PIPELINE DELAY (LATENCY) is the number of input clock cycles between initiation of conversion and when that data is presented to the output driver stage. New data is available at every clock cycle, but the data lags the conversion by the Pipeline Delay plus the tOD. POSITIVE FULL-SCALE ERROR (PFSE) is a measure of how far the last code transition is from the ideal 1-1/2 LSB below a differential +VIN/2. For the ADC10D1000 the reference voltage is assumed to be ideal, so this error is a combination of full-scale error and reference voltage error. POWER SUPPLY REJECTION RATIO (PSRR) PSRR1 (D.C. PSRR) is the ratio of the change in full-scale error that results from a power supply voltage change from 1.8V to 2.0V. PSRR is expressed in dB. SIGNAL TO NOISE RATIO (SNR) is the ratio, expressed in dB, of the rms value of the input signal at the output to the rms value of the sum of all other spectral components below onehalf the sampling frequency, not including harmonics or DC. SIGNAL TO NOISE PLUS DISTORTION (S/(N+D) or SINAD) is the ratio, expressed in dB, of the rms value of the input signal at the output to the rms value of all of the other spectral components below half the input clock frequency, including harmonics but excluding DC. VFS / 2N where VFS is the differential full-scale amplitude VIN as set by the FSR input and "N" is the ADC resolution in bits, which is 10 for the ADC10D1000. LOW VOLTAGE DIFFERENTIAL SIGNALING (LVDS) DIFFERENTIAL OUTPUT VOLTAGE (VID and VOD) is two times the absolute value of the difference between the VD+ and VD - signals; each measured with respect to Ground. www.national.com 26 27 www.national.com ADC10D1000QML where Af1 is the RMS power of the fundamental (output) frequency and Af2 through Af10 are the RMS power of the first 9 harmonic frequencies in the output spectrum. - Second Harmonic Distortion (2nd Harm) is the difference, expressed in dB, between the RMS power in the input frequency seen at the output and the power in its 2nd harmonic level at the output. - Third Harmonic Distortion (3rd Harm) is the difference expressed in dB between the RMS power in the input frequency seen at the output and the power in its 3rd harmonic level at the output. SPURIOUS-FREE DYNAMIC RANGE (SFDR) is the difference, expressed in dB, between the rms values of the input signal at the output and the peak spurious signal, where a spurious signal is any signal present in the output spectrum that is not present at the input, excluding DC. TOTAL HARMONIC DISTORTION (THD) is the ratio expressed in dB, of the rms total of the first nine harmonic levels at the output to the level of the fundamental at the output. THD is calculated as ADC10D1000QML 14.0 Transfer Characteristic 30071822 FIGURE 4. Input / Output Transfer Characteristic www.national.com 28 ADC10D1000QML 15.0 Timing Diagrams 30071899 FIGURE 5. Clocking in 1:4 Demux DES Mode 30071859 FIGURE 6. Clocking in 1:2 Demux Non-DES Mode* 29 www.national.com ADC10D1000QML * The timing here is shown for the I-channel only. However, the Q-channel functions precisely the same as the I-channel, with VinQ+/-, DCLKQ+/-, DQd and DQ instead of VinI+/-, DCLKI+/-, DId and DI. Both I- and Q-channel use the same CLK+/-. 30071860 FIGURE 7. Clocking in Non-Demux Mode Non-DES Mode** ** The timing here is shown for the Q-channel only. However, for the Non-Demux Non-DES Mode, both I- and Q-channels may be used as input. For this case, the I-channel functions precisely the same as the Q-channel, with VinI+/-, DCLKI+/-, and DI instead of VinQ+/-, DCLKQ+/-, and DQ. Both I- and Q-channel use the same CLK+/-. 30071896 FIGURE 8. Clocking in Non-Demux Mode DES Mode www.national.com 30 ADC10D1000QML 30071820 FIGURE 9. Data Clock Reset Timing 30071825 FIGURE 10. On-Command Calibration Timing 30071819 FIGURE 11. Serial Interface Timing 31 www.national.com ADC10D1000QML 16.0 Typical Performance Plots VA = VDR = VTC = VE = 1.9V, fCLK = 1000 MHz, fIN = 498 MHz, TA= 25C, I-channel and Q-channel, unused channel terminated to AC ground and 1:2 Demux Non-DES Mode (1:1 Demux Mode has similar performance), unless otherwise stated. NPR plots Notch fC = 325 MHz and Notch width = 25 MHz. INL vs. CODE INL vs. TEMPERATURE 30071861 30071862 DNL vs. CODE DNL vs. TEMPERATURE 30071863 www.national.com 30071864 32 ADC10D1000QML ENOB vs. TEMPERATURE ENOB vs. SUPPLY VOLTAGE 30071865 30071866 ENOB vs. CLOCK FREQUENCY ENOB vs. INPUT FREQUENCY 30071867 30071868 SNR vs. TEMPERATURE SNR vs. SUPPLY VOLTAGE 30071869 30071870 33 www.national.com ADC10D1000QML SNR vs. CLOCK FREQUENCY SNR vs. INPUT FREQUENCY 30071871 30071872 THD vs. TEMPERATURE THD vs. SUPPLY VOLTAGE 30071873 30071874 THD vs. CLOCK FREQUENCY THD vs. INPUT FREQUENCY 30071875 www.national.com 30071876 34 ADC10D1000QML SFDR vs. TEMPERATURE SFDR vs. SUPPLY VOLTAGE 30071877 30071878 SFDR vs. CLOCK FREQUENCY SFDR vs. INPUT FREQUENCY 30071879 30071880 SPECTRAL RESPONSE AT FIN = 248 MHz SPECTRAL RESPONSE AT FIN = 498 MHz 30071881 30071882 35 www.national.com ADC10D1000QML CROSSTALK vs. SOURCE FREQUENCY FULL POWER BANDWIDTH 30071883 30071884 POWER CONSUMPTION vs. CLOCK FREQUENCY GAIN vs. TEMPERATURE FS PERCENT CHANGE 30071885 30071886 GAIN vs. TEMPERATURE ENOB GAIN vs. TEMPERATURE FS 30071887 www.national.com 30071888 36 ADC10D1000QML NPR vs. fC NOTCH AMPLITUDE vs. FREQUENCY 30071890 30071889 NPR vs. RMS NOISE LOADING LEVEL 30071891 37 www.national.com ADC10D1000QML able configuration and control of the device through the control pins. The ECM provides additional configuration and control options through a serial interface and a set of 16 registers. 17.0 Functional Description The ADC10D1000 is a versatile A/D Converter with an innovative architecture permitting very high speed operation. The controls available ease the application of the device to circuit solutions. Optimum performance requires adherence to the provisions discussed here and in the Applications Information Section. This section covers an overview and the control modes; Extended Control Mode (ECM) and Non Extended Control Mode (Non-ECM). 17.3.1 Non-Extended Control Mode In Non-extended Control Mode (Non-ECM), the Serial Interface is not active and all available functions are controlled via various pin settings. Non-ECM is selected by setting ECE (Pin B3) to logic high. Seven dedicated control pins provide a wide range of control for the ADC10D1000 and facilitate its operation. These control pins provide Demux Mode selection, DDR Phase selection, Calibration event initiation, Power Down I-channel, Power Down Q-channel, Test Pattern Mode selection, and Full-Scale input Range selection. In addition to this, a one dual-purpose control pin provides for LVDS output common-mode voltage selection. See Table 13 for a summary. 17.1 OVERVIEW The ADC10D1000 uses a calibrated folding and interpolating architecture that achieves a high 9.0 Effective Number of Bits (ENOB). The use of folding amplifiers greatly reduces the number of comparators and power consumption. Interpolation reduces the number of front-end amplifiers required, minimizing the load on the input signal and further reducing power requirements. In addition to correcting other non-idealities, on-chip calibration reduces the INL bow often seen with folding architectures. The result is an extremely fast, high performance, low power converter. The calibration registers are radiation hard and will not be upset by a heavy ion strike up to 120 MeV-cm2/mg. The analog input signal that is within the converter's input voltage range is digitized to ten bits at speeds of 200 MHz to 1300 MHz, typical. Differential input voltages below negative full-scale will cause the output word to consist of all zeroes. Differential input voltages above positive full-scale will cause the output word to consist of all ones. Either of these conditions at the I- or Q-channel will cause the Out-of-Range Ichannel or Q-channel output (ORI or ORQ), respectively, to output a logic-high signal. The device may be operated in one of two control modes: Extended Control Mode (ECM) or Non-Extended Control Mode (Non-ECM). In Non-ECM, the features of the device may be accessed via simple pin control. In ECM, an expanded feature set is available via the Serial Interface. Important new features include AutoSync for mulit-chip synchronization, programmable 15-bit input full-scale range and independant programmable 12-bit plus sign offset adjustment. Each channel has a selectable output demultiplexer which feeds two LVDS buses. If the 1:2 Demux Mode is selected, the output data rate is reduced to half the input sample rate on each bus. When Non-Demux Mode is selected, the output data rate on each channel is at the same rate as the input sample clock and only one 10-bit bus per channel is active. TABLE 13. Non-ECM Pin Summary Logic-Low Logic-High Floating NDM Demux Mode Non-demux Mode Not allowed 0 Mode 90 Mode Not allowed DDRPh CAL See Section 17.3.1.3 Calibration Pin (CAL) Not allowed PDI I-channel active Power down I-channel Not allowed PDQ Q-channel active Power down Q-channel Not allowed TPM Non-Test Pattern Mode Test Pattern Mode Not allowed FSR VBG* Lower FS input Higher FS input range range Not allowed Not allowed Higher LVDS Lower LVDS common-mode common-mode voltage voltage *Dual purpose pin. 17.3.1.1 Non-Demultiplexed Mode Pin (NDM) The Non-Demultiplexed Mode (NDM) Pin selects whether the ADC10D1000 is in Demux Mode (logic-low) or Non-Demux Mode (logic-high). In Non-demux Mode, the data from the input is produced at the data-rate at a single 10-bit output bus. In Demux Mode, the data from the input is produced at half the data-rate at twice the number of output buses. For NonDES Mode, each I- or Q-channel will produce its data on one or two buses for Non-demux or Demux Mode, respectively. For DES Mode, the Q-channel will produce its data on two or four buses for Non-demux or Demux Mode, respectively. This feature is pin-controlled only and remains active during both Non-ECM and ECM. See Table 13 for more information. 17.2 POWER-ON RESET The ADC10D1000's power-on reset has been disabled to ensure single effect functional interrupts do not occur during space operation. Therefore, the calibration routine at poweron is not reliable for the space version of the ADC10D1000. This means a manual calibration is always required after the parts is power-on and is stable. Specifically, the part must either be in Non-Extended Control mode or in Extended Control Mode with the configuration registers reset or written to the correct values, and then a manual calibration must be run before the ADC can be used to digitize data correctly. See section Section 17.4.3 Calibration Feature for more information on Calibration. 17.3.1.2 Dual Data Rate Phase Pin (DDRPh) The Dual Data Rate Phase (DDRPh) Pin selects whether the ADC10D1000 is in 0 Mode (logic-low) or 90 Mode (logichigh). In Dual Data Rate (DDR) Mode, the Data may transition either with the DCLK transition (0 Mode) or halfway between DCLK transitions (90 Mode). The Data is always in DDR Mode on the ADC10D1000. The DDRPh Pin selects 0 Mode or 90 Mode for both the I-channel: DI- and DId-to-DCLKI 17.3 CONTROL MODES The ADC10D1000 may be operated in one of two control modes: Non-extended Control Mode (Non-ECM) or Extended Control Mode (ECM). In the simpler Non-ECM (also sometimes referred to as Pin Control Mode), the user affects availwww.national.com Pin Name 38 This pin functions similarly to the PDI pin, except that it applies to the Q-channel. The PDI and PDQ pins function independently of each other to control whether each I- or Q-channel is powered down or active. This pin remains active in ECM. In ECM, either this pin or the PDQ bit (Addr: 0h; Bit: 10) in the Control Register may be used to power-down the I-channe. See Section 17.4.4 Power Down for more information. 17.3.1.3 Calibration Pin (CAL) The Calibration (CAL) Pin must be used to initiate an oncommand calibration event. The effect of calibration is to maximize the dynamic performance. To initiate an on-command calibration via the CAL pin, bring the CAL pin high for a minimum of tCAL_H input clock cycles after it has been low for a minimum of tCAL_L input clock cycles. The CAL pin should be held high when not in use to help insure no undesired calibrating in space environment. In ECM mode this pin remains active and is Logically OR'd with the CAL bit. To use this feature in ECM, use the CAL bit in the Configuration Register (Addr: 0h; Bit: 15). See Section 17.4.3 Calibration Feature for more information. 17.3.1.6 Test Pattern Mode Pin (TPM) The Test Pattern Mode (TPM) Pin selects whether the output of the ADC10D1000 is a test pattern (logic-high) or the converted input (logic-low). The ADC10D1000 can provide a test pattern at the four output buses independently of the input signal to aid in system debug. In TPM, the ADC is disengaged and a test pattern generator is connected to the outputs, including ORI and ORQ. See Section 17.4.2.6 Test Pattern Mode for more information. 17.3.1.7 Full-Scale Input Range Pin (FSR) The Full-Scale Input Range (FSR) Pin selects whether the full-scale input range for both the I- and Q-channel is higher (logic-high) or lower (logic-low). The input full-scale range is specified as VIN in Table 7. In Non-ECM, the full-scale input range for each I- and Q-channel may not be set independently, but it is possible to do so in ECM. In ECM, the full-scale input range may be set with 15-bits of precision; see FS_ADJ in Table 7. The device must be calibrated following a change in FSR to obtain optimal performance. To use this feature in ECM, use the Configuration Register (Addr: 3h and Bh). See Section 17.4.1 Input Control and Adjust for more information. 17.3.1.4 Power Down I-channel Pin (PDI) The Power Down I-channel (PDI) Pin selects whether the Ichannel is powered down (logic-high) or active (logic-low). The digital data output pins (both positive and negative) are put into a high impedance state when the I-channel is powered down. Upon return to the active state, the pipeline will contain meaningless information and must be flushed. The supply currents (typicals and limits) are available for the Ichannel powered down or active and may be found in Table 11. It is recommended that the user thoroughly understand how the PDI feature functions in relationship with the Calibration feature and control them appropriately for his application. This pin remains active in ECM. In ECM, either this pin or the PDI bit (Addr: 0h; Bit: 11) in the Control Register may be used to power-down the I-channel. See Section 17.4.4 Power Down Power Down for more information. 17.3.1.8 LVDS Output Common-mode Pin (VBG) The VBG Pin serves a dual purpose and may either provide the bandgap output voltage or select whether the LVDS output common-mode voltage is higher (logic-high) or lower (floating). The LVDS output common-mode voltage is specified as VOS and may be found in Table 10. This pin is always active, in both ECM and Non-ECM. See Section 17.4.2 Output Control and Adjust for more information. 17.3.1.5 Power Down Q-channel Pin (PDQ) The Power Down Q-channel (PDQ) Pin selects whether the Q-channel is powered down (logic-high) or active (logic-low). 39 www.national.com ADC10D1000QML phase relationship and for the Q-channel: DQ- and DQd-toDCLKQ phase relationship. To use this feature in ECM, use the DPS bit in the Configuration Register (Addr: 0h; Bit: 14). See Configuration Register 1 for more information. ADC10D1000QML SCS: Each assertion (logic-low) of this signal starts a new register access, i.e. the SDI command field must be ready. The user is required to de-assert this signal after the 24th clock. If the SCS is de-asserted before the 24th clock, no data read/write will occur. If the SCS is asserted longer than 24 clocks, data write will occur normally through the SDI input upon the 24th clock and the SDO output will hold the D0 bit until SCS is de-asserted. Setup and hold times, tSCS and tHCS, with respect to the SCLK must be observed. SCLK: This signal is used to register the input data (SDI) on the rising edge; and to source the output data (SDO) on the falling edge. The user may disable the clock and hold it in the low-state. There is no minimum frequency requirement for SCLK; see fSCLK in Table 12 for more details. SDI: Each register access requires a specific 24-bit pattern at this input, consisting of a command field and a data field. When in read mode, the data field is high impedance in case the bidirectional SDI/O option is used. Setup and hold times, tSH and tSSU, with respect to the SCLK must be observed. SDO: This output is normally tri-stated and is driven only when SCS is asserted, the first 8 bits of command data have been received and it is a READ operation. The data is shifted out, MSB first, starting with the 8th clock's falling edge. At the end of the access, when SCS is de-asserted, this output is tristated once again. If an invalid address is accessed, the data sourced will consist of all zeroes. Setup and hold times, tSH and tSSU, with respect to the SCLK must be observed. If it is a READ operation, there will be a bus turnaround time, tBSU, from when the last bit of the command field was read in until when the first bit of the data field is written out. Table 15 shows the Serial Interface bit definitions. 17.3.2 Extended Control Mode In Extended Control Mode (ECM), all available functions are controlled via the Serial Interface. In addition to this, several of the control pins remain active. See Table 16 for details. ECM is selected by setting ECE (Pin B3) to logic-low. The space version of the ADC10D1000 does not include a Power-on Reset. Therefore, when powered up in ECM, the registers will be in an unknown, random state. There are two ways to set the ECM registers: toggling the ECEb pin, and writing the registers. If the device is programmed into NonECM (by setting ECEb logic high), the registers are programmed to their default values. So, if the ECEb pin is set to logic high, then set to logic low (ECM), the device will be in ECM and the registers will have their default values. The second method is to simply explicitly write the default (or otherwise desired) values to the register in ECM. This is the recommended method. Four pins on the ADC10D1000 control the Serial Interface; SCS, SCLK, SDI and SDO. This section covers the Serial Interface. The Section 19.0 Register Definitions are located at the end of the datasheet so that they are easy to locate. 17.3.2.1 The Serial Interface The ADC10D1000 offers a Serial Interface that allows access to the sixteen control registers within the device. The Serial Interface is a generic 4-wire (optionally 3-wire) synchronous interface that is compatible with SPI type interfaces that are used on many micro-controllers and DSP controllers. Each serial interface access cycle is exactly 24 bits long. A registerread or register-write can be accomplished in one cycle. The signals are defined in such a way that the user can opt to simply join SDI and SDO signals in his system to accomplish a single, bidirectional SDI/O signal. A summary of the pins for this interface may be found in Table 14. See Figure 11 for the timing diagram and Table 12 for timing specification details. Control register contents are retained when the device is put into power-down mode. TABLE 15. Command and Data Field Definitions TABLE 14. Serial Interface Pins Pin Name C4 SCS (Serial Chip Select bar) C5 SCLK (Serial Clock) B4 SDI (Serial Data In) A3 SDO (Serial Data Out) www.national.com 40 Bit No. Name Comments 1 Read/Write (R/W) 1b indicates a read operation 0b indicates a write operation 2-3 Reserved Bits must be set to 10b 4-7 A<3:0> 16 registers may be addressed. The order is MSB first 8 X This is a "don't care" bit 9-24 D<15:0> Data written to or read from addressed register ADC10D1000QML 30071813 FIGURE 12. Serial Interface Timing (Zoom Start)*** ***SCSb transition from High to Low must occur tHCS after the falling edge of SCLK, and tSCS before the rising edge of SCLK. 30071814 FIGURE 13. Serial Interface Timing (Zoom End)**** ****SCSb transition from Low to High must occur tHCS after the 24th SCLK cycle during a low cycle. 41 www.national.com ADC10D1000QML The serial data protocol is shown for a read and write operation in Figure 14 and Figure 15, respectively. 30071892 FIGURE 14. Serial Data Protocol - Read Operation 30071893 FIGURE 15. Serial Data Protocol - Write Operation www.national.com 42 TABLE 16. Features and Modes Feature Non-ECM Control Pin Active in ECM ECM Default ECM State Input Control and Adjust Input Full-scale Adjust Setting Selected via FSR (Pin Y3) No Selected via the Config Reg (Addr: 3h and Bh) mid FSR value Input Offset Adjust Setting Not Available Not Applicable Selected via the Config Reg (Addr: 2h and Ah) Offset = 0mV LC Filter on Clock Not Available Not Applicable Selected via the Config Reg (Addr: Dh) LC Filter off Sampling Clock Phase Adjust Not Available Not Applicable Selected via the Config Reg (Addr: Ch and Dh) Phase adjust disable DES/Non-DES Mode Selection Not Available No Selected via DES bit (Addr: Ch and Dh Non-DES Mode No Selected via DPS in the Config Reg (Addr: 0h; Bit: 14) 0 Mode Not Applicable Selected via OVS in the Config Reg (Addr: 0h; Bit: 13) Higher amplitude Output Control and Adjust DDR Clock Phase Selection Selected via DDRPh (Pin W4) LVDS Differential Output Voltage Amplitude Higher amplitude only Selection LVDS Common-Mode Output Voltage Amplitude Selection Selected via VBG (Pin B1) Yes Not available Higher amplitude Output Formatting Selection Offset Binary only Not Applicable Selected via 2SC in the Config Reg (Addr: 0h; Bit: 4) Offset Binary Test Pattern Mode at Output Selected via TPM (Pin A4) No Selected via TPM in the Config Reg (Addr: 0h; Bit: 12) TPM not active Demux/Non-Demux Mode Selection Selected via NDM (Pin A5) Yes Not available N/A AutoSync Not Available Not Applicable DCLK RST Not Available Not Applicable Selected via the Config Master Mode, RCOut1/2 Reg (Addr: Eh) disabled Select via the Config Reg (Addr: Eh) DLCK Reset disabled Selected via CAL in the Config Reg (Addr: 0h; Bit: 15) N/A (CAL = 0) Calibration On-command Calibration Event Selected via CAL (Pin D6) Yes Power-Down Power down I-channel Selected via PDI (Pin U3) Yes Selected via PDI in the Config Reg (Addr: 0h; Bit: 11) I-channel operational Power down Q-channel Selected via PDQ (Pin V3) Yes Selected via PDQ in the Config Reg (Addr: 0h; Bit: 10) Q-channel operational 43 www.national.com ADC10D1000QML is a summary of the features available, as well as details for the control mode chosen. 17.4 FEATURES The ADC10D1000 offers many features to make the device convenient to use in a wide variety of applications. Table 16 ADC10D1000QML 17.4.1 Input Control and Adjust There are several features and configurations for the input of the ADC10D1000. This section covers Input Full Scale Range adjust, Input Offset adjust, DES/Non-DES Mode, sampling clock phase adjust, and LC filter on the sampling Clock. feature in ECM, to optimize DES mode performance. To adjust the I and Q channel offset, measure a histogram of the digital data and adjust the offset via the control register until the histogram is centered at code 511/512. Similarly, the full scale range of each channel may be adjusted for optimal performance. 17.4.1.1 Input Full-Scale Range Adjust The input full-scale range for the ADC10D1000 may be adjusted via Non-ECM or ECM. In Non-ECM, a control pin selects a higher or lower value; see Section 17.3.1.7 FullScale Input Range Pin (FSR) . See VIN in Table 7 for electrical specification details. In ECM, the input full-scale range may be selected with 15-bits of precision. See FS_ADJ also in Table 7 for details. Note that the higher and lower full-scale input range settings in Non-ECM do not correspond to the maximum and minimum full-scale input range settings in ECM. It is necessary to execute a manual calibration following any change of the input full-scale range. See Section 19.0 Register Definitions for information about the registers. 17.4.1.4 Sampling Clock Phase Adjust The sampling clock (CLK) phase may be delayed internally to the ADC up to 825 ps in ECM. This feature is intended to help the system designer remove small imbalances in clock distribution traces at the board level when multiple ADCs are used, or simplify complex system functions such as beam steering for phase array antennas. A clock-jitter cleaner is available only when the CLK phase adjust feature is used. This adjustment delays all clocks, including the DCLKs and output data, the user is strongly advised to use the minimal amount of adjustment and verify the net benefit of this feature in the system before relying on it. 17.4.1.5 LC Filter on Input Clock A LC bandpass filter is available on the ADC10D1000 sampling clock to clean jitter on the incoming clock. This feature is available when the CLK phase adjust is also used. This feature was designed to minimize the dynamic performance degradation resulting from additional clock jitter as much as possible. This feature is available in ECM via the LCF (LC Filter) bits in the Control Register (Addr: Dh, Bits 7:0). If the clock phase adjust feature is enabled, the sampling clock passes through additional gate delay, which adds jitter to the clock signal. The LC filter helps to remove this additional jitter, so it is only available when the clock phase adjust feature is also enabled. To enable both features, use SA (Addr: Dh, Bit 8). The LCF bits are thermometer encoded and may be used to set a filter center frequency ranging from 0.8 GHz to 1.5 GHz; See Table 17. 17.4.1.2 Input Offset Adjust The input offset adjust for the ADC10D1000 may be adjusted with 12-bits of precision plus sign via ECM. See Section 19.0 Register Definitions for information about the registers. 17.4.1.3 DES/Non-DES Mode The ADC10D1000 is available in Dual-Edge Sampling (DES) or Non-DES Mode. The DES Mode allows for the ADC10D1000's Q-channel input to be sampled by both channels' ADCs. One ADC samples the input on the rising edge of the input clock and the other ADC samples the same input on the falling edge of the input clock. A single input is thus sampled twice per input clock cycle, resulting in an overall sample rate of twice the input clock frequency, e.g. 2.0 GSPS with a 1.0 GHz input clock. SeeSection 17.3.1.1 Non-Demultiplexed Mode Pin (NDM) for information on how to select the desired mode. For the DES Mode, only the Q-channel may be used for the input. This may be selected in ECM by using the DES bit (Addr: 0h, Bit 7) to select the DES Mode and the DESQ bit (Addr: 0h, Bit: 6) to select the Q-channel as input. In this mode, the outputs must be carefully interleaved in order to reconstruct the sampled signal. If the device is programmed into the 1:4 Demux DES Mode, the data is effectively demultiplexed by 1:4. If the input clock is 1.0 GHz, the effective sampling rate is doubled to 2.0 GSPS and each of the 4 output buses has an output rate of 500 MHz. All data is available in parallel. To properly reconstruct the sampled waveform, the four words of parallel data that are output with each DCLK must be correctly interleaved. The sampling order is as follows, from the earliest to the latest: DQd, DId, DQ, DI. See Figure 5. If the device is programmed into the Non-demux DES Mode, two bytes of parallel data are output with each edge of the DCLK in the following sampling order, from the earliest to the latest: DQ, DI. See Figure 8. The performance of the ADC10D1000 in DES mode depends on how well the two channels are interleaved, i.e that the clock samples each channel with precisely a 50% duty cycle, each channel has the same offset (nominally code 511/512), and each channel has the same full scale range. The ADC10D1000 also includes an automatic clock phase background adjustment in DES Mode to automatically and continuously adjust the clock phase of the I- and Q-channels. This feature removes the need to adjust the clock phase setting manually and provides optimal performance in the DES Mode. A difference exists in the typical offset between the I and Q channels, which can be removed via the offset adjust www.national.com TABLE 17. LC Filter Code vs. fC LCF (7:0) LCF(7:0) fC (GHz) 0 0000 0000b 1.5 1 0000 0001b 1.4 2 0000 0011b 1.3 3 0000 0111b 1.2 4 0000 1111b 1.1 5 0001 1111b 1.0 6 0011 1111b 0.92 7 0111 1111b 0.85 8 1111 1111b 0.8 The LC Filter is a second-order bandpass filter, which has the following simulated bandwidth for a center frequency, fc at 1GHz, See Table 18 TABLE 18. LC Filter Bandwidth at 1GHz Bandwidth [dB] -3 -6 -9 -12 Bandwidth [MHz] 135 235 360 525 17.4.2 Output Control and Adjust There are several features and configurations for the output of the ADC10D1000 so that it may be used in many different applications. This section covers DDR clock phase, LVDS 44 (1:4 Demux DES Mode) or not demultiplexed (Non-Demux DES Mode). 17.4.2.1 DDR Clock Phase The ADC10D1000 output data is always delivered in Double Data Rate (DDR). With DDR, the DCLK frequency is half the data rate and data is sent to the outputs on both edges of DCLK; see Figure 16. The DCLK-to-Data phase relationship may be either 0 or 90. For 0 Mode, the Data transitions on each edge of the DCLK. Any offset from this timing is tOSK; see Table 12 for details. For 90 Mode, the DCLK transitions in the middle of each Data cell. Setup and hold times for this transition, tSU and tH, may also be found in Table 12. The DCLK-to-Data phase relationship may be selected via the DDRPh Pin in Non-ECM (see Section 17.3.1.2 Dual Data Rate Phase Pin (DDRPh)) or the DPS bit in the Configuration Register (Addr: 0h; Bit: 14) in ECM. 17.4.2.6 Test Pattern Mode The ADC10D1000 can provide a test pattern at the four output buses independently of the input signal to aid in system debug. In Test Pattern Mode, the ADC is disengaged and a test pattern generator is connected to the outputs, including ORI and ORQ. The test pattern output is the same in DES Mode or Non-DES Mode. Each port is given a unique 10-bit word, alternating between 1's and 0's. When the part is programmed into the Demux Mode, the test pattern's order will be as described in Table 19. TABLE 19. Test Pattern by Output Port in 1:2 Demux Mode Time 30071894 FIGURE 16. DDR DCLK-to-Data Phase Relationship 17.4.2.2 LVDS Output Differential Voltage The ADC10D1000 is available with a selectable higher or lower LVDS output differential voltage. This parameter is VOD and may be found in Table 10. The desired voltage may be selected via OVS Bit (Addr: 0h, Bit 13); see Section 19.0 Register Definitions for more information. In non-extended control mode only higher VOD is available. Qd Id Q I ORQ ORI Comments T0 000h 001h 002h 004h 0b 0b T1 3FFh 3FEh 3FDh 3FBh 1b 1b T2 000h 001h 002h 004h 0b 0b T3 3FFh 3FEh 3FDh 3FBh 1b 1b T4 000h 001h 002h 004h 0b 0b T5 000h 001h 002h 004h 0b 0b T6 3FFh 3FEh 3FDh 3FBh 1b 1b T7 000h 001h 002h 004h 0b 0b T8 3FFh 3FEh 3FDh 3FBh 1b 1b T9 000h 001h 002h 004h 0b 0b T10 000h 001h 002h 004h 0b 0b T11 3FFh 3FEh 3FDh 3FBh 1b 1b T12 000h 001h 002h 004h 0b 0b T13 ... ... ... ... ... ... Pattern Sequence n Pattern Sequence n+1 Pattern Sequence n+2 When the part is programmed into the Non-demux Mode, the test pattern's order is as described in Table 20. TABLE 20. Test Pattern by Output Port in Non-Demux Mode 17.4.2.3 LVDS Output Common-Mode Voltage The ADC10D1000 is available with a selectable higher or lower LVDS output common-mode voltage. This parameter is VOS and may be found in Table 10. See Section 17.3.1.8 LVDS Output Common-mode Pin (VBG) for information on how to select the desired voltage. Time I Q ORI ORQ T0 001h 000h 0b 0b T1 001h 000h 0b 0b T2 3FEh 3FFh 1b 1b T3 3FEh 3FFh 1b 1b 17.4.2.4 Output Formatting The formatting at the digital data outputs may be either offset binary or two's complement. The desired formatting must be set via the ECM; see Section 19.0 Register Definitions for more information. T4 001h 000h 0b 0b T5 3FEh 3FFh 1b 1b 17.4.2.5 Demux/Non-demux Mode The ADC10D1000 may be in one of two demultiplex modes: Demux Mode or Non-Demux Mode (also sometimes referred to as 1:1 Demux Mode). In Non-demux Mode, the data from the input is simply output at the sampling rate at which it was sampled on one 10-bit bus. In Demux Mode, the data from the input is output at half the sampling rate, on twice the number of buses. See Figure 1. Demux/Non-demux Mode may only be selected by the NDM pin; see Section 17.3.1.1 NonDemultiplexed Mode Pin (NDM). In Non-DES Mode, the output data from each channel may be demultiplexed by a factor of 1:2 (1:2 Demux Non-DES Mode). In DES Mode, the output data from both channels interleaved may be demultiplexed 45 T6 001h 000h 0b 0b T7 3FEh 3FFh 1b 1b T8 3FEh 3FFh 1b 1b T9 3FEh 3FFh 1b 1b T10 001h 000h 0b 0b T11 001h 000h 0b 0b T12 3FEh 3FFh 1b 1b T13 3FEh 3FFh 1b 1b T14 ... ... ... ... Comments Pattern Sequence n Pattern Sequence n+1 www.national.com ADC10D1000QML output differential and common-mode voltage, output formatting, Demux/Non-demux Mode, and Test Pattern Mode. ADC10D1000QML significantly, relative to the specific system performance requirements. Due to the nature of the calibration feature, it is recommended to avoid unnecessary activities on the device while the calibration is taking place. For example, do not read or write to the Serial Interface or use the DCLK Reset feature while calibrating the ADC. Doing so will impair the performance of the device until it is re-calibrated correctly. Also, it is recommended to not apply a strong narrow-band signal to the analog inputs during calibration because this may impair the accuracy of the calibration; broad spectrum noise is acceptable. 17.4.3 Calibration Feature The ADC10D1000 calibration must be run to achieve specified performance. The calibration procedure is exactly the same regardless of how it was initiated or when it is run. The DCLK outputs will be present during all phases of the calibration process. All data and over-range output bits are held at logic low during calibration. Calibration should be performed in the planned mode of operation. Calibration trims the analog input differential termination resistor, the CLK input resistor, and sets internal bias currents which affects the Linearity of the converter. This minimizes full-scale error, offset error, DNL and INL, resulting in maximizing the dynamic performance as measured by: SNR, THD, SINAD (SNDR) and ENOB. 17.4.3.4 Calibration Adjust The calibration event itself may be adjusted, for sequence and mode. This feature can be used if a shorter calibration time than the default is required; see tCAL in Table 12. However, the performance of the device, when using a shorter calibration time than the default setting, is not guaranteed. The calibration sequence may be adjusted via CSS (Addr: 4h, Bit 14). The default setting of CSS = 1b executes both RIN and RIN_CLK Calibration (using Rtrim) and internal linearity Calibration (using Rext). Executing a calibration with CSS = 0b executes only the internal linearity Calibration. The first time that Calibration is executed, it must be with CSS = 1b to trim RIN and RIN_CLK. However, once the device is at its operating temperature and RIN has been trimmed at least one time, it will not drift significantly. To save time in subsequent calibrations, trimming RIN and RIN_CLK may be skipped, i.e. by setting CSS = 0b. The mode may be changed, to save calibration execution time for the internal linearity Calibration. See tCAL in Table 12. Adjusting CMS(1:0) will select three different pre-defined calibration times. A larger amount of time will calibrate each channel more closely to the ideal values, but choosing shorter times will not significantly impact the performance. The fourth setting, CMS(1:0) = 11b, is not available. 17.4.3.1 Calibration Pins Table 21 is a summary of the pins used for calibration. See Section 8.0 Column Descriptions and Equivalent Circuits for complete pin information and Figure 10 for the timing diagram. TABLE 21. Calibration Pins Pin Name Function D6 CAL (Calibration) Initiate calibration event; see Section 17.3.1.3 Calibration Pin (CAL) B5 CalRun (Calibration Running) Indicates when calibration is running C1/D2 C3/D3 Rtrim+/External resistor used to (Input termination trim calibrate analog and CLK resistor) inputs Rext+/(External Reference resistor) External resistor used to calibrate internal linearity 17.4.3.5 Calibration and Power-Down If PDI and PDQ are simultaneously asserted during a calibration cycle, the ADC10D1000 will immediately power down. The calibration cycle will continue when either or both channels are powered back up, but the calibration will be compromised due to the incomplete settling of bias currents directly after power up. Therefore, a new calibration should be executed upon powering the ADC10D1000 back up. In general, the ADC10D1000 should be re-calibrated when either or both channels are powered back up, or after one channel is powered down. For best results, this should be done after the device has stabilized to its operating temperature. 17.4.3.2 How to Initiate a Calibration Event The calibration event must be initiated by holding the CAL pin low for at least tCAL_L clock cycles, and then holding it high for at least another tCAL_H clock cycles, as defined in Table 12. The minimum tCAL_L and tCAL_H input clock cycle sequences are required to ensure that random noise does not cause a calibration to begin when it is not desired. The time taken by the calibration procedure is specified as tCAL. In ECM, either the CAL bit (Addr: 0h; Bit: 15) or the CAL pin may be used to initiate a calibration event. 17.4.3.3 On-command Calibration An on-command calibration must be run after power up and whenever the FSR is changed. It is recommended to execute an on-command calibration whenever the settings or conditions to the device are altered significantly, in order to obtain optimal parametric performance. Some examples include: changing the FSR via either ECM or Non-ECM, power-cycling either channel, and switching into or out of DES Mode. For best performance, it is also recommended that an on-command calibration be run 20 seconds or more after application of power and whenever the operating temperature changes www.national.com 17.4.4 Power Down On the ADC10D1000, the I- and Q-channels may be powered down individually. This may be accomplished via the control pins, PDI and PDQ, or via ECM. In ECM, the PDI and PDQ pins are logically OR'd with the Control Register setting. See Section 17.3.1.4 Power Down I-channel Pin (PDI) and Section 17.3.1.5 Power Down Q-channel Pin (PDQ) for more information. 46 18.1 THE ANALOG INPUTS The ADC10D1000 will continuously convert any signal which is present at the analog inputs, as long as a CLK signal is also provided to the device. This section covers important aspects related to the analog inputs including: acquiring the input, the reference voltage and FSR, out-of-range indication, AC coupled signals, and single-ended input signals. 18.1.1 Acquiring the Input Data is acquired at the rising edge of CLK+ in Non-DES Mode and both the falling and rising edge of CLK+ in DES Mode. The digital equivalent of that data is available at the digital outputs a constant number of input clock cycles later for the DI, DQ, DId and DQd output buses, depending on the demultiplex mode which was chosen. See Pipeline Delay in Table 12. In addition to the Pipeline Delay, there is a constant output delay, tOD, before the data is available at the outputs. See tOD in Table 12 and the Timing Diagrams. For Demux Mode, the signal which is sampled at the input will appear at the output after a certain latency, as shown in Table 22. 18.1.3 Out-Of-Range Indication Differential input signals are digitized to 10 bits, based on the full-scale range. Signal excursions beyond the full-scale range (greater than +VIN/2 or less than -VIN/2) will be clipped at the output. An input signal which is above the FSR will result in all 1's at the output and an input signal which is below the FSR will result in all 0's at the output. When the conversion result is clipped for the I-channel input, the Out-of-Range Ichannel (ORI) output is activated such that ORI+ goes high and ORI- goes low for the time that the signal is out of range. This output is active as long as accurate data on either or both of the buses would be outside the range of 000h to 3FFh. The Q-channel has a separate ORQ which functions similarly. TABLE 22. Input Channel Samples Produced at Data Outputs in Demultiplexed Mode Data Outputs Non-DES Mode DES Mode (Q-channel only) DI I-channel sampled with rise of CLK, 34 cycles earlier. Q-channel sampled with rise of CLK, 34 cycles earlier. DQ Q-channel sampled with rise of CLK, 34 cycles earlier. Q-channel sampled with fall of CLK, 34.5 cycles earlier. DId I-channel sampled with rise of CLK, 35 cycles earlier. Q-channel sampled with rise of CLK, 35 cycles earlier. DQd Q-channel sampled with rise of CLK, 35 cycles earlier. Q-channel sampled with fall of CLK, 35.5 cycles earlier. 18.1.4 AC-coupled Input Signals The AC-coupled analog inputs require a precise commonmode voltage. This voltage, VCMO, is generated on-chip. For the ADC10D1000 used in a typical application, this may be accomplished by on-board capacitors shown in Figure 17 As a result, an analog input channel that is not used (e.g. in DES Mode) should be connected to AC ground, i.e. through capacitors to ground . Do not connect an unused analog input directly to ground. For Non-demux Mode, Table 23 is similarly shown. TABLE 23. Input Channel Samples Produced at Data Outputs in Non-Demux Mode Data Outputs Non-DES Mode DES Mode (Q-channel only) DI I-channel sampled with rise of CLK, 34 cycles earlier. Q-channel sampled with rise of CLK, 34 cycles earlier. DQ Q-channel sampled with rise of CLK, 34 cycles earlier. Q-channel sampled with fall of CLK, 34.5 cycles earlier. DId No output; high impedance. No output; high impedance. DQd No output; high impedance. No output; high impedance. 30071844 FIGURE 17. AC-coupled Differential Input The analog inputs for the ADC10D1000 are internally buffered, which simplifies the task of driving these inputs and the RC pole which is generally used at sampling ADC inputs is not required. If the user desires to place an amplifier circuit before the ADC, care should be taken to choose an amplifier with adequate noise and distortion performance, and adequate gain at the frequencies used for the application. 18.1.2 The Reference Voltage and FSR The full-scale analog differential input range (VIN_FSR) of the ADC10D1000 is derived from an internal 1.254V bandgap reference. In Non-ECM, this full-scale range has two settings 47 www.national.com ADC10D1000QML controlled by the FSR pin; (see Section 17.3.1.7 Full-Scale Input Range Pin (FSR). The FSR Pin operates on both I- and Q-channels. In ECM, the full-scale range may be independently set for each channel via Addr: 3h and Bh with 15 bits of precision; see Section 19.0 Register Definitions. The best SNR is obtained with a higher full-scale input range, but better distortion and SFDR are obtained with a lower full-scale input range. It is not possible to use an external analog reference voltage to modify the full-scale range, and this adjustment should only be done digitally, as described. A buffered version of the internal 1.254V bandgap reference voltage is made available at the VBG pin for the user. The VBG pin can drive a load of up to 80 pF and source or sink up to 100 A. It should be buffered if more current than this is required. The pin remains as a constant reference voltage regardless of what full-scale range is selected and may be used for a system reference. VBG is a dual-purpose pin and it may also be used to select a higher LVDS output commonmode voltage; see Section 17.4.2.3 LVDS Output CommonMode Voltage. 18.0 Applications Information ADC10D1000QML sample rates results in higher power consumption and die temperatures. If the fCLK 300MHz, enable LFS in control register (Addr: 0h Bit 8). 18.1.5 Single-Ended Input Signals It is not possible on the ADC10D1000 to accept single-ended signals. The best way to handle single-ended signals is to first convert them to differential signals before presenting them to the ADC. The easiest way to accomplish single-ended to differential signal conversion is with an appropriate balun-transformer, as shown in Figure 18. 18.2.3 CLK Level The input clock amplitude is specified as VIN_CLK in Table 9. Input clock amplitudes above this may result in increased input offset voltage. This would cause the converter to produce an output code other than the expected 511/512 when both input pins are at the same potential. Insufficient input clock levels will result in poor dynamic performance. Both of these results may be avoided by keeping the clock input amplitude within the specified limits of VIN_CLK. 18.2.4 CLK Duty Cycle The duty cycle of the input clock signal can affect the performance of any A/D Converter. The ADC10D1000 features a duty cycle clock correction circuit which can maintain performance over the 20%-to-80% specified clock duty cycle range. This feature is enabled by default and provides improved ADC clocking, especially in the Dual-Edge Sampling (DES) Mode. 30071843 FIGURE 18. Single-Ended to Differential Conversion Using a Balun When selecting a balun, it is important to understand the input architecture of the ADC. The impedance of the analog source should be matched to the ADC10D1000's on-chip 100 differential input termination resistor. The range of this termination resistor is specified as RIN in Table 7. 18.2.5 CLK Jitter High speed, high performance ADCs such as the ADC10D1000 require a very stable input clock signal with minimum phase noise or jitter. ADC jitter requirements are defined by the ADC resolution (number of bits), maximum ADC input frequency and the input signal amplitude relative to the ADC input full scale range. The maximum jitter (the sum of the jitter from all sources) allowed to prevent a jitter-induced reduction in SNR is found to be 18.2 THE CLOCK INPUTS The ADC10D1000 has a differential clock input, CLK+ and CLK-, which must be driven with an AC-coupled, differential clock signal. This provides the level shifting to the clock to be driven with LVDS, PECL, LVPECL, or CML levels. The clock inputs are internally terminated to 100 differential and selfbiased. This section covers coupling, frequency range, level, duty-cycle, jitter, and layout considerations. tJ(MAX) = ( VIN(P-P)/ VFSR) x (1/(2(N+1) x x fIN)) where tJ(MAX) is the rms total of all jitter sources in seconds, VIN(P-P) is the peak-to-peak analog input signal, VFSR is the full-scale range of the ADC, "N" is the ADC resolution in bits and fIN is the maximum input frequency, in Hertz, at the ADC analog input. tJ(MAX) is the square root of the sum of the squares (RSS) sum of the jitter from all sources, including: the ADC input clock, system, input signals and the ADC itself. Since the effective jitter added by the ADC is beyond user control, it is recommended to keep the sum of all other externally added jitter to a mimimum. 18.2.1 CLK Coupling The clock inputs of the ADC10D1000 must be capacitively coupled to the clock pins as indicated in Figure 19. 18.2.6 CLK Layout The ADC10D1000 clock input is internally terminated with a trimmed 100 resistor. The differential input clock line pair should have a characteristic impedance of 100 and (when using a balun), be terminated at the clock source in that (100) characteristic impedance. It is good practice to keep the ADC input clock line as short as possible, to keep it well away from any other signals and to treat it as a transmission line. Otherwise, other signals can introduce jitter into the input clock signal. Also, the clock signal can also introduce noise into the analog path if it is not properly isolated. 30071847 FIGURE 19. Differential Input Clock Connection The choice of capacitor values will depend on the clock frequency, capacitor component characteristics, and other system factors. 18.3 THE LVDS OUTPUTS The Data, ORI, ORQ, DCLKI and DCLKQ outputs are LVDS. The electrical specifications of the LVDS outputs are compatible with typical LVDS receivers available on ASIC and FPGA chips; but they are not IEEE or ANSI communications standards compliant due to the low +1.9V supply used on this chip. These outputs should be terminated with a 100 differential resister placed as closely to the receiver as possible. 18.2.2 CLK Frequency Although the ADC10D1000 is tested and its performance is guaranteed with a differential 1.0 GHz clock, it will typically function well with input clock frequency range; see fCLK(min) and fCLK(max) in Table 12. Operation up fCLK(max) is possible if the maximum ambient temperatures indicated are not exceeded. Operating at sample rates above fCLK(max) for the given ambient temperature may result in reduced device reliability and product lifetime. This is due to the fact that higher www.national.com 48 DCLK Reset. The AutoSync feature is new and designates one ADC10D1000 as the Master ADC and other ADC10D1000s in the system as Slave ADCs. The DCLK Reset feature performs the same function as the AutoSync feature, but is the first generation solution to synchronizing multiple ADCs in a system; it is disabled by default. For the application in which there are multiple Master and Slave ADC10D1000s in a system, AutoSync may be used to synchronize the Slave ADC10D1000(s) to each respective Master ADC10D1000 and the DCLK Reset may be used to synchronize the Master ADC10D1000s with each other. 18.3.1 Common-mode and Differential Voltage The LVDS outputs have selectable common-mode and differential voltage, VOS and VOD; see Table 10. See Section 17.4.2 Output Control and Adjust for more information. Selecting the higher VOS will also increase VOD by up to 40mV. The differential voltage, VOD, may be selected for the higher or lower value. For short LVDS lines and low noise systems, satisfactory performance may be realized with the lower VOD. This will also result in lower power consumption. If the LVDS lines are long and/or the system in which the ADC10D1000 is used is noisy, it may be necessary to select the higher VOD. 18.4.1 AutoSync Feature AutoSync is a new feature which continuously synchronizes the outputs of multiple ADC10D1000s in a system. It may be used to synchronize the DCLK and data outputs of one or more Slave ADC10D1000s to one Master ADC10D1000. Several advantages of this feature include: no special synchronization pulse required, any upset in synchronization is recovered upon the next DCLK cycle, and the Master/Slave ADC10D1000s may be arranged as a binary tree so that any upset will quickly propagate out of the system. An example system is shown below in Figure 20 which consists of one Master ADC and two Slave ADCs. For simplicity, only one DCLK is shown; in reality, there is DCLKI and DCLKQ, but they are always in phase with one another. 18.3.2 Output Data Rate The data is produced at the output at the same rate as it is sampled at the input. The minimum recommended input clock rate for this device is fCLK(MIN); see Table 12. However, it is possible to operate the device in 1:2 Demux Mode and capture data from just one 10-bit bus, e.g. just DI (or DId) although both DI and DId are fully operational. This will decimate the data by two and effectively halve the data rate. 18.4 SYNCHRONIZING MULTIPLE ADC10D1000S IN A SYSTEM The ADC10D1000 has two features to assist the user with synchronizing multiple ADCs in a system; AutoSync and 30071803 FIGURE 20. AutoSync Example In order to synchronize the DCLK (and Data) outputs of multiple ADCs, the DCLKs must transition at the same time, as well as be in phase with one another. The DCLK at each ADC is generated from the CLK after some latency, plus tOD minus tAD. Therefore, in order for the DCLKs to transition at the same time, the CLK signal must reach each ADC at the same time. To tune out any differences in the CLK path to each ADC, the tAD adjust feature may be used. However, using the tAD adjust feature will also affect when the DCLK is produced at the output. If the device is in Demux Mode, then there are four possible phases which each DCLK may be generated on because the typical CLK = 1GHz and DCLK = 250 MHz for this case. The RCLK signal controls the phase of the DCLK, so that each Slave DCLK is on the same phase as the Master DCLK The AutoSync feature may only be used via the Control Registers. 18.4.2 DCLK Reset Feature The DCLK reset feature is available via ECM, but is disabled by default. DCLKI and DCLKQ are always synchronized, by design, and do not require a pulse from DCLK_RST to become synchronized. The DCLK_RST signal must observe certain timing requirements, which are shown in Figure 9 of the Timing Diagrams. The DCLK_RST pulse must be of a minimum width and its deassertion edge must observe setup and hold times with respect to the CLK input rising edge. These timing specifications are listed as tPWR, tRS and tRH and may be found in Table 12. The DCLK_RST signal can be asserted asynchronously to the input clock. If DCLK_RST is asserted, the DCLK output is held in a designated state (logic-high) in Demux Mode: in Non-Demux Mode, the DCLK_RST signal is asserted, there may be a narrow pulse on the DCLK line during this reset event. When the DCLK_RST signal is de-asserted, there are 49 www.national.com ADC10D1000QML This section covers common-mode and differential voltage, and data rate. ADC10D1000QML single source will be split into individual sections of the power plane, with individual decoupling and connection to the different power supply buses of the ADC. Due to the low voltage but relatively high supply current requirement, the optimal solution may be to use a switching regulator to provide an intermediate low voltage, which is then regulated down to the final ADC supply voltage by a linear regulator. Please refer to the documentation provided for the ADC10D1000RB for additional details on specific regulators that are recommended for this configuration Power for the ADC should be provided through a broad plane which is located on one layer adjacent to the ground plane(s). Placing the power and ground planes on adjacent layers will provide low impedance decoupling of the ADC supplies, especially at higher frequencies. The output of a linear regulator should feed into the power plane through a low impedance multi-via connection. The power plane should be split into individual power peninsulas near the ADC. Each peninsula should feed a particular power bus on the ADC, with decoupling for that power bus connecting the peninsula to the ground plane near each power/ground pin pair. Using this technique can be difficult on many printed circuit CAD tools. To work around this, zero ohm resistors can be used to connect the power source net to the individual nets for the different ADC power buses. As a final step, the zero ohm resistors can be removed and the plane and peninsulas can be connected manually after all other error checking is completed. tSYNC_DLY CLK cycles of systematic delay and the next CLK rising edge synchronizes the DCLK output with those of other ADC10D1000s in the system. For 90 Mode (DDRPh = logichigh), the synchronizing edge occurs on the rising edge of CLK, 4 cycles after the first rising edge of CLK after DCLK_RST is released. For 0 Mode (DDRPh = logic-low), this is 5 cycles instead. The DCLK output is enabled again after a constant delay of tOD. For both Demux and Non-Demux Modes, there is some uncertainty about how DCLK comes out of the reset state for the first DCLK_RST pulse. For the second (and subsequent) DCLK_RST pulses, the DCLK will come out of the reset state in a known way. Therefore, if using the DCLK Reset feature, it is recommended to apply one "dummy" DCLK_RST pulse before using the second DCLK_RST pulse to synchronize the outputs. This recommendation applies each time the device or channel is powered-on. When the DCLK_RST function is not going to be used it is recommended to pull the DCLK+ pin to AGND through a 261 resister and to pull the DCLK- pin to VA through a 261 resister (See Figure 21). This will provide noise ammunity and prevent false resets. 18.5.1.1 Bypass Capacitors The general recommendation is to have one 100nF capacitor for each power/ground pin pair. The capacitors should be surface mount multi-layer ceramic chip capacitors similar to Panasonic part number ECJ-0EB1A104K. 18.5.1.1.1 Ground Plane Grounding should be done using continuous full ground planes to minimize the impedance for all ground return paths, and provide the shortest possible image/return path for all signal traces. 30071806 FIGURE 21. DCLK RST +/18.5.1.1.2 Power Supply Example The ADC10D1000RB uses continuous ground planes (except where clear areas are needed to provide appropriate impedance management for specific signals), see Figure 22. Power is provided on one plane, with the 1.9V ADC supply being split into multiple zones or peninsulas for the specific power buses of the ADC. Decoupling capacitors are connected between these power bus peninsulas and the adjacent power planes using vias. The capacitors are located as close to the individual power/ground pin pairs of the ADC as possible. In most cases, this means the capacitors are located on the opposite side of the PCB to the ADC. When using DCLK-RST to synchronize multiple ADC10D1000s, it is required that the Select Phase bits in the Control Register (Addr: Eh, Bits 3,4) be the same for each Slave ADC10D1000. 18.5 SUPPLY/GROUNDING, LAYOUT AND THERMAL RECOMMENDATIONS 18.5.1 Power Planes All supply buses for the ADC should be sourced from a common linear voltage regulator. This ensures that all power buses to the ADC are turned on and off simultaneously. This www.national.com 50 ADC10D1000QML 30071802 FIGURE 22. Power and Grounding Example 51 www.national.com ADC10D1000QML resistance. The center columns of the package are attached to the back of the die through a heat sink. Connecting these columns to the PCB ground planes with a low thermal resistance path is the best way to remove heat from the ADC. These pins should also be connected to the ground planes through low impedance path for electrical purposes. 18.6 THERMAL MANAGEMENT The Ceramic Column Grid Array (CCGA) package is a modified Ceramic Land Grid Array with an added heat sink. The signal columns on the outer edge are 1.27mm pitch, while the columns in the center attached to the heat sink are 1mm. The smaller pitch for the center columns is to improve the thermal 30071811 FIGURE 23. CCGA Conceptual Drawing www.national.com 52 18.8.1 Total Ionizing Dose Radiation hardness assured (RHA) products are those part numbers with a total ionizing dose (TID) level specified in the Ordering Information table on the front page. Testing and qualification of these products is done on a wafer level according to MIL-STD-883, Test Method 1019. Wafer level TID data is available with lot shipments. TABLE 24. Temperature Sensor Recommendation Number of External Devices Monitored Recommended Temperature Sensor 1 LM95235 2 LM95213 4 LM95214 18.8.2 Single Event Latch-Up and Functional Interrupt One time single event latch-up (SEL) and single event functional interrupt (SEFI) testing was preformed according to EIA/JEDEC Standard, EIA/JEDEC57. The linear energy transfer threshold (LETth) shown in the Key Specifications table on the front page is the maximum LET tested. A test report is available upon request. The LM95235/13/14 is an 11-bit digital temperature sensor with a 2-wire System Management Bus (SMBus) interface that can monitor the temperature of one/two/four remote diodes as well as its own temperature. The LM95235/13/14 can be used to accurately monitor the temperature of up to one/two/four external devices such as the ADC10D1000, a FPGA, other system components, and the ambient temperature. The LM95235/13/14 reports temperature in two different formats for +127.875C range and 0/255C range. The LM95235/13/14 has a Sigma-Delta ADC core which provides the first level of noise immunity. For improved performance in a noise environment, the LM9535/13/14 includes programmable digital filters for Remote Diode temperature readings. When the digital filters are invoked, the resolution for the Remote Diode readings increases to 0.03125C. For maximum flexibility and best accuracy, the LM95235/13/14 includes offset registers that allow calibration of other diode types. Diode fault detection circuitry in the LM95235/13/14 can detect the absence or fault state of a remote diode: whether D+ is shorted to the power supply, D- or ground, or floating. In the following typical application, the LM95213 is used to monitor the temperature of an ADC10D1000 as well as a FPGA. See Figure 24 18.8.3 Single Event Upset A report on single event upset (SEU) is available upon request. 30071897 FIGURE 24. Typical Temperature Sensor Application 53 www.national.com ADC10D1000QML 18.8 RADIATION ENVIRONMENTS Careful consideration should be given to environmental conditions when using a product in a radiation environment. 18.7 TEMPERATURE SENSOR DIODE The ADC10D1000 has an on-die temperature diode connected to pins Tdiode+/- which may be used to monitor the die temperature. National also provides a family of temperature sensors for this application which monitor different numbers of external devices, See Table 24. ADC10D1000QML eutectic solder. To much lead increases the effective melting point of the board side joint and makes it much more difficult to remove the part if module rework is required. Cool down rates and methods affect CCGA assemble yield and reliability. Picking up boards or opening the oven while solder joints are in molten state can disturb the solder joint. Boards should not be picked up until the solder joints have fully solidified. Board warping may potentially cause CCGA lifting off pads during cooling and this condition can also cause column cracking when severe. This warping is a result of a high differential cooling rate between the top and bottom of the board. Both conditions can be prevented by using even top and bottom cooling. 18.9 BOARD MOUNTING RECOMMENDATION Proper thermal profile is required to establish re-flow under the package and ensure all joints meet profile specifications, See Table 25. TABLE 25. Solder Profile Specification Range Up C/sec Peak Temp (Tpk) C Max Peak Temp C Ramp down C/sec 4C/sec 210C Tpk 215C 220C 5C/sec The 220C peak temperature is driven by the requirement to limit the dissolution of lead from the high-melt column to the 30071898 FIGURE 25. Landing Pattern Recommendation www.national.com 54 Eight read/write registers provide several control and configuration options in the Extended Control Mode. These registers have no effect when the device is in the Non-extended Control Mode. The ADC10D1000 does not have a Power-On Reset. The user can write the registers with the desired values, or in Extended Control Mode set ECEb Logic high setting resisters to the default values. TABLE 26. Register Addresses A3 A2 A1 A0 Hex Register Addressed 0 0 0 0 0h Configuration Register 1 0 0 0 1 1h Res 0 0 1 0 2h I-channel Offset 0 0 1 1 3h I-channel FSR 0 1 0 0 4h Res 0 1 0 1 5h Res 0 1 1 0 6h Res 0 1 1 1 7h Res 1 0 0 0 8h Res 1 0 0 1 9h Res 1 0 1 0 Ah Q-channel Offset 1 0 1 1 Bh Q-channel FSR 1 1 0 0 Ch Aperture Delay Coarse Adjust 1 1 0 1 Dh Aperture Delay Fine Adjust and LC Filter Adjust 1 1 1 0 Eh AutoSync 1 1 1 1 Fh Res Configuration Register 1 Addr: 0h (0000b) Bit 15 Name CAL DV Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bits 9 Bits 8 0 Default Values: 2000h 14 13 12 11 10 9 8 DPS OVS TPM PDI PDQ Res LFS 0 1 0 0 0 0 0 7 6 DES DESQ 0 0 5 4 Res 2SC 0 0 3 2 0 0 1 0 0 0 Res CAL: Calibration Enable. When this bit is set 1b, an on-command calibration cycle is initiated. This bit is not reset automatically upon completion of the cal cycle. Therefore, the user must reset this bit to 0b and then set it to 1b again to initiate another calibration event. This bit is logically OR'd with the CAL Pin; both bit and pin must be set to 0b before either is used to execute a calibration. DPS: DDR Phase Select. Set this bit to 0b to select the 0 Mode DDR Data-to-DCLK phase relationship and to 1b to select the 90 Mode. This bit has no effect when the device is in Non-Demux Mode. OVS: Output Voltage Select. This bit sets the differential voltage level for the LVDS outputs including Data, OR, RCOut1, RCOut2 and DCLK. 0b selects the lower level and 1b selects the higher level. See VOD in Table 10 for details. TPM: Test Pattern Mode. When this bit is set to 1b, the device will continually output a fixed digital pattern at the digital Data and OR outputs. When set to 0b, the device will continually output the converted signal, which was present at the analog inputs. See Section 17.4.2.6 Test Pattern Mode for details about the TPM pattern. PDI: Power-down I-channel. When this bit is set to 0b, the I-channel is fully operational, but when it is set to 1b, the I-channel is powered-down. The I-channel may be powered-down via this bit or the PDI Pin, which is active, even in ECM. PDQ: Power-down Q-channel. When this bit is set to 0b, the Q-channel is fully operational, but when it is set to 1b, the Q-channel is powered-down. The Q-channel may be powered-down via this bit or the PDQ Pin, which is active, even in ECM. Reserved. Must be set to 0b. LFS: Low Frequency Select. If the sampling Clock (CLK) is at or below 300MHz, set this bit to 1b. 55 www.national.com ADC10D1000QML 19.0 Register Definitions ADC10D1000QML Bit 7 Bit 6 Bit 5 Bit 4 Bits 3:0 DES: Dual-Edge Sampling Mode select. When this bit is set to 0b, the device will operate in the Non-DES Mode; when it is set to 1b, the device will operate in the DES Mode. See Section 17.4.1.3 DES/Non-DES Mode for more information about DES/Non-DES Mode. DESQ: DES Q-channel select. When the device is in DES Mode, this bit should be set to 1b selecting the Qchannel. Reserved 2SC: Two's Complement output. For the default setting of 0b, the data is output in Offset Binary format; when set to 1b, the data is output in Two's Complement format. Reserved. Must be set to 0b. Reserved Addr: 1h (0001b) Bit 15 Default Values: 2A00h 14 13 12 11 10 9 Bits 15:0 7 6 5 4 3 2 1 0 0 0 0 Reserved Name DV 8 0 0 1 0 1 0 1 0 0 0 0 0 0 11 10 9 8 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 Reserved. Must be set as shown. I-channel Offset Adjust Addr: 2h (0010b) Bit 15 13 Reserved Name DV Default Values: 0000h 14 0 0 12 OS 0 0 OM(11:0) 0 0 Bits 15:13 Reserved. Must be set to 0b. Bit 12 OS: Offset Sign. The default setting of 0b incurs a positive offset of a magnitude set by Bits 11:0 to the ADC output. Setting this bet to 1b incurs a negative offset of the set magnitude. Bits 11:0 OM(11:0): Offset Magnitude. These bits determine the magnitude of the offset set at the ADC output (straight binary coding). The range is from 0 mV for OM(11:0) = 0d to 45 mV for OM(11:0) = 4095d in steps of ~11 V. Monotonicity is guaranteed by design only for the 9MSBs. Code Offset [mV] 0000 0000 0000 (default) 0 1000 0000 0000 22.5 1111 1111 1111 45 I-channel Full Scale Range Adjust Addr: 3h (0011b) Bit 15 Default Values: 4000h 14 13 12 11 10 9 8 Name Res. DV 0 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 FM(14:0) 1 0 0 0 0 0 0 0 Bit 15 Reserved. Must be set to 0b. Bits 14:0 FM(14:0): FSR Magnitude. These bits increase the ADC full-scale range magnitude (straight binary coding.) The range is from 630 mV (0d) to 980 mV (32767d) with the default setting at 820 mV (162384d). Monotonicity is guaranteed by design only for the 9 MSBs. The mid-range (low) setting in ECM corresponds to the nominal (low) setting in Non-ECM. A greater range of FSR values is available in EC, i.e. FSR values above 820 mV. See Table 7 for characterization details. Code FSR [mV] 000 0000 0000 0000 630 100 0000 0000 0000 (default) 820 111 1111 1111 1111 980 www.national.com 56 Addr: 4h (0100b) Default Values: DA7Fh Bit 15 14 Name Res CSS DV 1 1 13 12 11 10 9 Reserved 0 1 1 8 7 6 5 CMS 0 1 4 3 2 1 0 1 1 1 Reserved 0 0 1 1 1 1 Bits 15 Bit 14 Reserved. Must be set as shown. CSS: Calibration Sequence Select. The default 1b selects the following calibration sequence: reset all previously calibrated elements to nominal values, do RIN Calibration, do internal linearity Calibration. Setting CSS = 0b selects the following calibration sequence: do not reset RIN to its nominal value, skip RIN calibration, do internal linearity Calibration. The calibration must be completed at least one time with CSS = 1b to calibrate RIN. Subsequent calibrations may be run with CSS = 0b (skip RIN calibration) or 1b (full RIN and internal linearity Calibration). Bits 13:10 Reserved. Must be set as shown. Bits 9:8 CMS (1:0): Calibration Mode Select. These bits affect the length of time taken to calibrate the internal linearity. See tCAL in Table 12. Bits 7:0 Reserved. Must be set as shown Reserved Addr: 5h (0101b) Bit 15 Default Values: XXXXh 14 13 12 11 10 9 DV Bits 15:0 8 7 6 5 4 3 2 1 0 X X X Reserved Name X X X X X X X X X X X X X 8 7 6 5 4 3 2 1 0 0 0 0 Reserved. Do not write. Reserved Addr: 6h (0110b) Bit Default Values: 1C70h 15 14 13 12 11 10 9 0 0 0 1 1 1 0 0 0 1 1 1 0 10 9 8 7 6 5 4 3 2 1 0 0 0 0 Reserved Name DV Bits 15:0 Reserved. Must be set as shown. Reserved Addr: 7h (0111b) Bit 15 Default Values: 0000h 14 13 12 11 Reserved Name DV Bits 15:0 0 0 0 0 0 0 0 0 0 0 0 0 0 8 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 Reserved. Must be set as shown. Reserved Addr: 8h (1000b) Bit Default Values: 0000h 15 14 13 12 11 10 9 0 0 0 0 0 0 0 Reserved Name DV Bits 15:0 0 0 Reserved. Must be set as shown. 57 www.national.com ADC10D1000QML Calibration Adjust ADC10D1000QML Reserved Addr: 9h (1001b) 15 Bit Default Values: 0000h 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 0 0 0 Reserved Name 0 DV Bits 15:0 0 0 0 0 0 0 0 0 0 0 0 0 10 9 8 7 6 5 4 3 2 1 0 0 0 0 0 0 Reserved. Must be set as shown. Q-channel Offset Adjust Addr: Ah (0110b) 15 Bit 14 Default Values: 0000h 13 Reserved Name 0 DV 0 12 11 OS 0 0 OM(11:0) 0 0 0 0 0 0 0 Bits 15:13 Reserved. Must be set to 0b. Bit 12 OS: Offset Sign. The default setting of 0b incurs a positive offset of a magnitude set by Bits 11:0 to the ADC output. Setting this bet to 1b incurs a negative offset of the set magnitude. Bits 11:0 OM(11:0): Offset Magnitude. These bits determine the magnitude of the offset set at the ADC output (straight binary coding). The range is from 0 mV for OM(11:0) = 0d to 45 mV for OM(11:0) = 4095d in steps of -11 V. Monotonicity is guaranteed by design only for the 9MSBs. Code Offset [mV] 0000 0000 0000 (default) 0 1000 0000 0000 22.5 1111 1111 1111 45 Q-channel Full-Scale Range Adjust Addr: Bh (0111b) Bit 15 Name Res DV 0 Bit 15 Bits 14:0 www.national.com Default Values: 4000h 14 13 12 11 10 9 8 1 0 0 0 0 0 0 7 6 5 4 3 2 1 0 0 0 0 0 0 0 0 FM(14:0) 0 Reserved. Must be set to 0b. FM(14:0): FSR Magnitude. These bits increase the ADC full-scale range magnitude (straight binary coding.) The range is from 630 mV (0d) to 980 mV (32767d) with the default setting at 820 mV (16384d). Monotonicity is guaranteed by design only for the 9 MSBs. The mid-range (low) setting in ECM corresponds to the nominal (low) setting in Non-ECM. A greater range of FSR values is available in ECM, i.e. FSR values above 820 mV. See Table 7for characterization details. Code FSR [mV] 000 0000 0000 0000 630 100 0000 0000 0000 (default) 820 111 1111 1111 1111 980 58 Addr: Ch (1100b) Bit Default Values: 0004h 15 14 13 12 11 0 0 0 0 0 Bits 15:4 Bit 3 Bit 2 Bits 1:0 9 8 7 6 5 4 0 0 0 0 0 CAM(11:0) Name DV 10 0 0 3 2 STA DCC 0 1 1 0 Reserved 0 0 CAM(11:0): Coarse Adjust Magnitude. This 12-bit value determines the amount of delay that will be applied to the input CLK signal. The range is 0 ps delay for CAM(11:0) = 0d to a maximum delay of 825 ps for CAM(11:0) = 2431d (95 ps due to PVT variation) in steps of ~340 fs. For code CAM(11:0) = 2432d and above, the delay saturates and the maximum delay applies. Additional, finer delay steps are available in register Dh. Either STA (Bit 3) or SA (Addr: Dh, Bit 8) must be selected to enable this function. STA: Select tAD Adjust. Set this bit to 1b to enable the tAD adjust feature. When using this feature, make sure that SA (Addr: Dh, Bit 8) is set to 0b. DCC: Duty Cycle Correct. This bit can be set to 0b to disable the automatic duty-cycle stabilizer feature of the chip. This feature is enabled by default. Reserved. Must be set to 0b. Aperture Delay Fine Adjust and LC Filter Adjust Addr: Dh (1101b) Bit 15 14 13 12 11 10 FAM(5:0) Name DV Default Values: 0000h 0 0 0 0 0 0 9 8 Res SA 0 0 7 6 5 4 3 2 1 0 0 0 0 LCF(7:0) 0 0 0 0 0 Bits 15:10 FAM(5:0): Fine Aperture Adjust Magnitude. This 6-bit value determines the amount of additional delay that will be applied to the input CLK when the Clock Phase Adjust feature is enabled via STA (Addr: Ch, Bit 3) or SA (Addr: Dh, Bit 8). The range is straight binary from 0 ps delay for FAM(5:0) = 0d to 2.3 ps delay for FAM(5:0) = 63d (300 fs due to PVT variation) in steps of ~36 fs. Bit 9 Reserved. Must be set to 0b. Bit 8 SA: Select tAD and LC filter Adjust. Set this bit to 1b to enable the tAD and LC filter adjust features. Using this bit is the same as enabling STA (Addr: Ch, Bit3), but also enables the LC filter to clean the clock jitter. Bits 7:0 LCF(7:0): LC tank select Frequency. Use these bits to select the center frequency of the LC filter on the Clock inputs. The range is from 0.8 GHz (255d) to 1.5 GHz (0d). Note that the tuning range is not binary encoded, and the eight bits are thermometer encoded, i.e. the mid value of 1.1 GHz tuning is achieved with LCF(7:0) = 0000 1111b. 59 www.national.com ADC10D1000QML Aperture Delay Coarse Adjust ADC10D1000QML AutoSync Addr: Eh (1110b) Bit Default Values: 0003h 15 14 13 12 0 0 0 0 Bits 15:6 Bit 5 Bits 4:3 Bit 2 Bit 1 Bit 0 10 9 8 7 6 0 0 0 0 DRC(9:0) Name DV 11 0 0 5 Res. 0 4 3 SP(1:0) 0 0 2 1 0 ES DOC DR 0 1 1 DRC(9:0): Delay Reference Clock (9:0). These bits may be used to increase the delay on the input reference clock when synchronizing multiple ADCs. The minimum delay is 0s (0d) to 1000 ps (629d). The delay remains the maximum of 1000 ps for any codes above or equal to 639d. Reserved. Must be set to 0b. SP(1:0): Select Phase. These bits select the phase of the reference clock which is latched. The codes correspond to the following phase shift: 00 = 0 01 = 90 10 = 180 11 = 270 ES: Enable Slave. Set this bit to 1b to enable the Slave Mode of operation. In this mode, the internal divided clocks are synchronized with the reference clock coming from the master ADC. The master clock is applied on the input pins RCLK+/-. If this bit is set to 0b, then the device is in Master Mode. DOC: Disable Output reference Clocks. Setting this bit to 0b sends a CLK/4 signal on RCOut1 and RCOut2. The default setting of 1b disables these output drivers. This bit functions as described, regardless of whether the device is operating in Master or Slave Mode, as determined by ES (Bit 2). DR: Disable Reset. The default setting of 0b leaves the DCLK_RST functionality disabled. Set this bit to 1b to enable DCLK_RST functionality. Reserved Addr: Fh (1111b) Bit 15 14 Default Values: XXXXh 13 12 11 10 9 Bits 15:0 www.national.com 7 6 5 4 3 2 1 0 X X X X X X X Reserved Name DV 8 X X X X X X X X Reserved. Do not write. 60 X Date Released Revision Section Changes 02/11/09 A Initial Release New Product Data Sheet Release (ECN SENT FOR APPROVAL 02/05/09 - Edit #: 16) 03/18/09 B Connection Diagram, Table 3. Section 8.0 Following Pin names corrected VA, GND and - DCLK_RST+/- diagram, Section 18.0, GNDDR. Section 8.0 - Update DCLK_RST+/paragraph 18.4.2. diagram, Section 18.0 - paragraph added to 18.4.2 and new figure. Revision A will be Archived. 4/20/09 C Features, Key Specifications, Table 10 Electricals. 05/28/09 D Absolute Maximum Ratings and Operating Absolute Maximum Ratings added Voltage on VIN +, V -. Operating Ratings changed V +, V Ratings, Electrical Section Table 12, IN IN IN Section 19 Reserved Addr: Fh Voltage Range. Range. Remove Note 10 reference from Table 12 tOSK, Correction to Reserved Addr: Fh. Revision C will be Archived. 09/11/09 E Electrical Section Table 12 Calibration (Tcal), 17.0 Section, 19.0 Section (top register 4h) Addr: 4h (0100b) POR state: DA7Fh 05/10/2010 F Ordering Information Table, Table 6, Table Added reference to MPR and CVAL NSPN. Table 10 Electrical Section. Sections 15.0, 17.0, 6 section 1:2 Demux Non-DES Mode, Extended 17.4.3, 19.0 Configuration Register 1 Bit 6 Control Mode, FM (14:0) = 7FFFh SNR Limit and 1:2 Demux Non-DES Mode, Non-Extended Control Mode, FSR = VA. Table 10 Digital Control Pins. Update Figure 11, Added New Figure 12 and 13, Renumbered previous Figure 12 and 13 to Figure 14 and 15 etc. Changed paragraph 17.4.3. Configuration Register 1- Bit 6 paragraph. Revision E will be Archived. 61 Moved reference to radiation to Features from Key Specifications. Table 10 Electricals: VOH typo limit move to Min., Added parameters VCMI_DRST, VID_DRST, RIN_DRST. Revision B will be Archived. Added Conditions to Tcal parameter, 17.0 Section New paragraph 17.4.3.4 and renumbered, Changed table 4h and title from Reserved to Calibration Adjust in 19.0 Section. Revision D will be Archived. www.national.com ADC10D1000QML 20.0 Revision History ADC10D1000QML 21.0 Physical Dimensions inches (millimeters) unless otherwise noted NOTES: UNLESS OTHERWISE SPECIFIED REFERENCE JEDEC REGISTRATION MS-034, VARIATION BAL-2. 376 Ceramic Column Grid Array Package NS Package Number CCC376A www.national.com 62 ADC10D1000QML Notes 63 www.national.com ADC10D1000QML Low Power, 10-Bit, Dual 1.0 GSPS or Single 2.0 GSPS A/D Converter Notes For more National Semiconductor product information and proven design tools, visit the following Web sites at: www.national.com Products Design Support Amplifiers www.national.com/amplifiers WEBENCH(R) Tools www.national.com/webench Audio www.national.com/audio App Notes www.national.com/appnotes Clock and Timing www.national.com/timing Reference Designs www.national.com/refdesigns Data Converters www.national.com/adc Samples www.national.com/samples Interface www.national.com/interface Eval Boards www.national.com/evalboards LVDS www.national.com/lvds Packaging www.national.com/packaging Power Management www.national.com/power Green Compliance www.national.com/quality/green Switching Regulators www.national.com/switchers Distributors www.national.com/contacts LDOs www.national.com/ldo Quality and Reliability www.national.com/quality LED Lighting www.national.com/led Feedback/Support www.national.com/feedback Voltage References www.national.com/vref Design Made Easy www.national.com/easy www.national.com/powerwise Applications & Markets www.national.com/solutions Mil/Aero www.national.com/milaero PowerWise(R) Solutions Serial Digital Interface (SDI) www.national.com/sdi Temperature Sensors www.national.com/tempsensors SolarMagicTM www.national.com/solarmagic PLL/VCO www.national.com/wireless www.national.com/training PowerWise(R) Design University THE CONTENTS OF THIS DOCUMENT ARE PROVIDED IN CONNECTION WITH NATIONAL SEMICONDUCTOR CORPORATION ("NATIONAL") PRODUCTS. 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