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DATA SH EET
Product data sheet
Supersedes data of April 1996
1996 Sep 17
DISCRETE SEMICONDUCTORS
BAW62
High-speed diode
M3D17
6
1996 Sep 17 2
NXP Semiconductors Product data sheet
High-speed diode BAW62
FEATURES
Hermetically sealed leaded glass
SOD27 (DO-35) package
High switching speed: max. 4 ns
Continuous reverse voltage:
max. 75 V
Repetitive peak reverse voltage:
max. 75 V
Repetitive peak fo rward current:
max. 450 mA.
APPLICATIONS
High-speed s witching
Fast logic applications.
DESCRIPTION
The BAW62 is a high-speed switching diode fabricated in planar technology,
and encapsulated in the hermetically sealed leade d glass SOD27 (DO-35)
package.
Fig.1 Simplified outline (SOD27; DO-35) and symbol.
The diode is type branded.
handbook, halfpage
MAM246
ka
LIMITING VALUES
In accordance with th e Absolute Maximum Ratin g S ystem (IEC 134).
Note
1. Device mounted on an FR4 printed circuit-board; lead length 10 mm.
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VRRM repetitive peak reverse voltage 75 V
VRcontinuous revers e voltage 75 V
IFcontinuous forward current see Fig.2; note 1 250 mA
IFRM repetitive peak forward current 450 mA
IFSM non-repetitive peak forward current square wave; Tj = 25 °C prior to
surge; see Fig.4
t = 1 μs4 A
t = 1 ms 1 A
t = 1 s 0.5 A
Ptot total power dissipation Tamb = 25 °C; note 1 350 mW
Tstg storage temperature 65 +200 °C
Tjjunction temperature 200 °C
1996 Sep 17 3
NXP Semiconductors Pr oduct data shee t
High-speed diode BAW62
ELECTRICAL CHARACTERISTIC S
Tj = 25 °C; unless otherwise specified.
THERMAL CHARACTE RISTICS
Note
1. Device mounted on a printed circuit-board without metallization pad.
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
VFforward voltage see Fig.3
IF = 5 mA 620 750 mV
IF = 100 mA 1 000 mV
IF = 100 mA; Tj = 100 °C930 mV
IRreverse current see Fig.5
VR = 20 V 25 nA
VR = 50 V 200 nA
VR = 75 V 5 μA
VR = 20 V; Tj = 150 °C50 μA
VR = 75 V; Tj = 150 °C100 μA
Cddiode capacitan ce f = 1 MHz; VR = 0; see Fig.6 2pF
trr reverse recove ry time when switched from IF = 10 mA to
IR = 10 mA; RL = 100 Ω; measured
at IR = 1 mA; see Fig.7
4ns
Vfr forward recove ry voltage when switched from IF = 50 mA;
tr = 20 ns; see Fig.8 2.5 V
SYMBOL PARAMETER CONDITIONS VALUE UNIT
Rth j-tp thermal resistance from junction to tie-point lead length 10 mm 240 K/W
Rth j-a thermal resistance from junction to ambient lead length 10 mm; note 1 500 K/W
1996 Sep 17 4
NXP Semiconductors Pr oduct data shee t
High-speed diode BAW62
GRAPHICAL DATA
Fig.2 Maximum permis sible continuous forward
current as a func tion of ambient
temperature.
handbook, halfpage
0 100 200
300
200
0
100
MBG448
Tamb (oC)
IF
(mA)
Device mounted on an FR4 printed-circuit board; lead length 10 mm. (1) Tj = 175 °C; typical values.
(2) Tj = 25 °C; typical values.
(3) Tj = 25 °C; maximum values.
Fig.3 Forward current as a function of forward
voltage.
handbook, halfpage
012
600
0
200
400
MBG464
VF (V)
IF
(mA)
(1) (2) (3)
Fig.4 Maximum permissible non-repetitive peak forward current as a function of p uls e duration.
Based on square wave currents.
Tj = 25 °C prior to surge.
handbook, full pagewidth
MBG704
10 tp (μs)
1
IFSM
(A)
10
2
10
1
10
4
10
2
10
3
10
1
1996 Sep 17 5
NXP Semiconductors Pr oduct data shee t
High-speed diode BAW62
Fig.5 Reverse current as a function of junction
temperature.
(1) VR = 75 V; maximum values.
(2) VR = 75 V; typical values.
(3) VR = 20 V; typical values.
handbook, halfpage
0 100 Tj (oC) 200
103
102
101
102
10 (1) (2)
1
IR
(μA)
MGD006
(3)
Fig.6 Diode capacitance as a function of reverse
voltage; typical values.
f = 1 MHz; Tj = 25 °C.
handbook, halfpage
01020
1.2
1.0
0.6
0.4
0.8
MGD004
VR (V)
Cd
(pF)
1996 Sep 17 6
NXP Semiconductors Pr oduct data shee t
High-speed diode BAW62
Fig.7 Reverse reco very voltage test circuit and waveforms.
(1) IR = 1 mA.
handbook, full pagewidth
trr
(1)
IFt
output signal
trt
tp
10%
90%
VR
input signal
V = V I x R
RF S
R = 50
SΩIF
D.U.T.
R = 50
iΩ
SAMPLING
OSCILLOSCOPE
MGA881
Fig.8 Forward recovery voltage test circuit and waveforms.
trt
tp
10%
90%
I
input
signal
R = 50
SΩ
I
R = 50
iΩ
OSCILLOSCOPE
Ω1 k Ω450
D.U.T.
MGA882
Vfr
t
output
signal
V
1996 Sep 17 7
NXP Semiconductors Pr oduct data shee t
High-speed diode BAW62
PACKAGE OUTLINE
Fig.9 SOD27 (DO-35).
Dimensions in mm.
mla428 -
1
25.4 min
4.25
max
1.85
max 25.4 min
0.5
6
ma
x
1996 Sep 17 8
NXP Semiconductors Product data sheet
High-speed diode BAW62
DATA SHEET STATUS
Notes
1. Please consult the most rec en tly issued document before initiating or co mpleting a design.
2. The product s tatus of device(s) described in this document may have changed since this document was pub lis hed
and may differ in case of multiple devices. The latest product status information is available on th e Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for pro duct
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production T his document contains the product specification.
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Applications Applications that are described herein for
any of these products are for illustrative purposes only.
NXP Semiconductors makes no representation or
warranty that such applications will be suitable for the
specified use witho ut fu rth e r testing or modification .
Limiting values Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) may cause permanent damage to
the device. Limiting values are stress ratings only and
operation of the device at these or any other conditions
above those given in the Characteristics sections of this
document is not implied. Exposure to limiting values for
extended periods may affect device reliability.
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Quick refer ence data The Quick reference data is an
extract of th e product data given in the Limiting values an d
Characteristics sections of this docu ment, and as such is
not complete, exhaus tive or legally binding.
NXP Semiconductors
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© NXP B.V. 2009
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The information pr e sent ed in this document d oes not form part o f an y quotation or cont ra ct, is b elieve d t o b e a ccur ate a nd re li a ble and may be chan ged
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Customer notification
This data sheet was changed to reflect the new company name NXP Semiconductors. No changes were
made to the content, except for the legal definitions and disclaimers.
Printed in The Netherlands 1996 Sep 17