Micropower, 3-Axis, 2 g/4 g/8 g Digital Output MEMS Accelerometer ADXL362 Data Sheet FEATURES GENERAL DESCRIPTION Ultralow power Power can be derived from coin cell battery 1.8 A at 100 Hz ODR, 2.0 V supply 3.0 A at 400 Hz ODR, 2.0 V supply 270 nA motion activated wake-up mode 10 nA standby current High resolution: 1 mg/LSB Built-in features for system-level power savings: Adjustable threshold sleep/wake modes for motion activation Autonomous interrupt processing, without need for microcontroller intervention, to allow the rest of the system to be turned off completely Deep embedded FIFO minimizes host processor load Awake state output enables implementation of standalone, motion activated switch Low noise down to 175 g/Hz Wide supply and I/O voltage ranges: 1.6 V to 3.5 V Operates off 1.8 V to 3.3 V rails Acceleration sample synchronization via external trigger On-chip temperature sensor SPI digital interface Measurement ranges selectable via SPI command Small and thin 3 mm x 3.25 mm x 1.06 mm package The ADXL362 is an ultralow power, 3-axis MEMS accelerometer that consumes less than 2 A at a 100 Hz output data rate and 270 nA when in motion triggered wake-up mode. Unlike accelerometers that use power duty cycling to achieve low power consumption, the ADXL362 does not alias input signals by undersampling; it samples the full bandwidth of the sensor at all data rates. The ADXL362 always provides 12-bit output resolution; 8-bit formatted data is also provided for more efficient single-byte transfers when a lower resolution is sufficient. Measurement ranges of 2 g, 4 g, and 8 g are available, with a resolution of 1 mg/LSB on the 2 g range. For applications where a noise level lower than the normal 550 g/Hz of the ADXL362 is desired, either of two lower noise modes (down to 175 g/Hz typical) can be selected at minimal increase in supply current. In addition to its ultralow power consumption, the ADXL362 has many features to enable true system level power reduction. It includes a deep multimode output FIFO, a built-in micropower temperature sensor, and several activity detection modes including adjustable threshold sleep and wake-up operation that can run as low as 270 nA at a 6 Hz (approximate) measurement rate. A pin output is provided to directly control an external switch when activity is detected, if desired. In addition, the ADXL362 has provisions for external control of sampling time and/or an external clock. APPLICATIONS Hearing aids Home healthcare devices Motion enabled power save switches Wireless sensors Motion enabled metering devices The ADXL362 operates on a wide 1.6 V to 3.5 V supply range, and can interface, if necessary, to a host operating on a separate, lower supply voltage. The ADXL362 is available in a 3 mm x 3.25 mm x 1.06 mm package. FUNCTIONAL BLOCK DIAGRAM VS VDDI/O INT1 INT2 3-AXIS MEMS SENSOR 12-BIT ADC DIGITAL LOGIC, FIFO, AND SPI MOSI MISO CS SCLK AXIS DEMODULATORS ANTIALIASING FILTERS ADXL362 10776-001 TEMPERATURE SENSOR GND Figure 1. Rev. E Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 (c)2012-2016 Analog Devices, Inc. All rights reserved. Technical Support www.analog.com ADXL362 Data Sheet TABLE OF CONTENTS Features .............................................................................................. 1 Device ID Register ..................................................................... 24 Applications ....................................................................................... 1 Device ID: 0x1D Register .......................................................... 24 General Description ......................................................................... 1 Part ID: 0xF2 Register................................................................ 24 Functional Block Diagram .............................................................. 1 Silicon Revision ID Register ..................................................... 24 Revision History ............................................................................... 3 X-Axis Data (8 MSB) Register .................................................. 24 Specifications..................................................................................... 4 Y-Axis Data (8 MSB) Register .................................................. 24 Absolute Maximum Ratings ............................................................ 6 Z-Axis Data (8 MSB) Register .................................................. 24 Thermal Resistance ...................................................................... 6 Status Register ............................................................................. 25 Package Information .................................................................... 6 FIFO Entries Registers ............................................................... 26 Recommended Soldering Profile ............................................... 6 X-Axis Data Registers ................................................................ 26 ESD Caution .................................................................................. 6 Y-Axis Data Registers ................................................................ 26 Pin Configuration and Function Descriptions ............................. 7 Z-Axis Data Registers ................................................................ 26 Typical Performance Characteristics ............................................. 8 Temperature Data Registers ...................................................... 26 Theory of Operation ...................................................................... 13 Soft Reset Register ...................................................................... 26 Mechanical Device Operation .................................................. 13 Activity Threshold Registers ..................................................... 27 Operating Modes ........................................................................ 13 Activity Time Register ............................................................... 27 Selectable Measurement Ranges ............................................... 13 Inactivity Threshold Registers .................................................. 27 Selectable Output Data Rates .................................................... 13 Inactivity Time Registers........................................................... 27 Power/Noise Tradeoff ................................................................ 14 Activity/Inactivity Control Register ........................................ 29 Power Savings Features .................................................................. 15 FIFO Control Register ............................................................... 30 Ultralow Power Consumption in All Modes .......................... 15 FIFO Samples Register .............................................................. 31 Motion Detection ....................................................................... 15 INT1/INT2 Function Map Registers ....................................... 31 FIFO ............................................................................................. 17 Filter Control Register ............................................................... 33 Communications ........................................................................ 17 Power Control Register.............................................................. 34 Additional Features ........................................................................ 18 Self Test Register ......................................................................... 35 Free Fall Detection ..................................................................... 18 Applications Information .............................................................. 36 External Clock ............................................................................ 18 Application Examples ................................................................ 36 Synchronized Data Sampling .................................................... 18 Power............................................................................................ 37 Self Test ........................................................................................ 18 FIFO Modes ................................................................................ 38 User Register Protection ............................................................ 18 Interrupts ..................................................................................... 39 Temperature Sensor ................................................................... 18 Using Synchronized Data Sampling ........................................ 40 Serial Communications ................................................................. 19 Using an External Clock ............................................................ 41 SPI Commands ........................................................................... 19 Using Self Test ............................................................................. 41 Multibyte Transfers .................................................................... 19 Operation at Voltages Other Than 2.0 V ................................ 41 Invalid Addresses and Address Folding .................................. 19 Mechanical Considerations for Mounting .............................. 41 Latency Restrictions ................................................................... 19 Axes of Acceleration Sensitivity ............................................... 42 Invalid Commands ..................................................................... 19 Layout and Design Recommendations ................................... 42 Register Map.................................................................................... 23 Outline Dimensions ....................................................................... 43 Register Details ............................................................................... 24 Ordering Guide .......................................................................... 43 Rev. E | Page 2 of 43 Data Sheet ADXL362 REVISION HISTORY 11/2016--Rev. D to Rev. E Changes to Endnote 3, Table 1 ........................................................ 5 Changes to Using Self Test Section and Table 22 Title ...............41 11/2015--Rev. C to Rev. D Change to Sensor Resonant Frequency Parameter, Table 1......... 4 Added Endnote 4, Table 1 ................................................................ 4 Changes to Figure 10 ........................................................................ 8 Changes to Selectable Measurement Ranges Section ................13 Changes to Bus Keepers Section ...................................................17 Changes to Figure 36 to Figure 40 ................................................20 Changes to Figure 41 and Figure 42 .............................................21 Changes to Table 10 ........................................................................22 Change to Start-Up Routine Section ............................................37 Change to Table 22 ..........................................................................41 Updated Outline Dimensions ........................................................43 12/2014--Rev. B to Rev. C Changes to Table 1 ............................................................................ 4 Changes to Figure 14 and Figure 15 ............................................... 9 Change to Serial Communications Section .................................19 Change to Table 10 ..........................................................................22 Changes to Soft Reset Register Section ........................................26 Changes to Example: Implementing Free Fall Detection Section ..............................................................................................37 Changes to Using Self Test Section and Table 22 ........................41 Changes to Figure 51 ......................................................................42 Updated Outline Dimensions ........................................................43 2/2013--Rev. A to Rev. B Change to Figure 7 ............................................................................ 8 Changes to Figure 11, Figure 12, and Figure 13 ............................ 9 Changes to Table 7 and Table 8 ..................................................... 14 Changes to Figure 31 ...................................................................... 16 Change to Table 10 .......................................................................... 22 Change to Bit 6, Table 12................................................................ 25 Changes to Inactivity Time Registers Section ............................. 28 Change to LINK/LOOP Bit, Table 13 ........................................... 29 Change to ODR Bit, Table 17......................................................... 33 Changes to Figure 43, Figure 44, and Figure 45 .......................... 36 Changes to Start-up Routine Section, Figure 46, and Figure 47 ........................................................................................... 37 Change to Figure 52 ........................................................................ 42 9/2012--Rev. 0 to Rev. A Moved Revision History Section..................................................... 3 Changes to Linking Activity and Inactivity Detection Section; Added Figure 31, Figure 32, and Figure 33, Renumbered Sequentially ...................................................................................... 16 Change to Table 13 .......................................................................... 29 Changes to Figure 44 ...................................................................... 36 Moved Power Supply Decoupling Section ................................... 37 Added Power Section, Power Supply Requirements Section, and Figure 47 ........................................................................................... 37 Updated Outline Dimensions........................................................ 43 Changes to Ordering Guide ........................................................... 43 8/2012--Revision 0: Initial Version Rev. E | Page 3 of 43 ADXL362 Data Sheet SPECIFICATIONS TA = 25C, VS = 2.0 V, VDD I/O = 2.0 V, 100 Hz ODR, HALF_BW = 0, 2 g range, acceleration = 0 g, default settings for other registers, unless otherwise noted. 1 Table 1. Parameter SENSOR INPUT Measurement Range Nonlinearity Sensor Resonant Frequency Cross Axis Sensitivity 2 OUTPUT RESOLUTION All g Ranges SENSITIVITY Sensitivity Calibration Error Sensitivity at XOUT, YOUT, ZOUT Scale Factor at XOUT, YOUT, ZOUT Sensitivity Change Due to Temperature 3 0 g OFFSET 0 g Output 4 0 g Offset vs. Temperature3 Normal Operation Low Noise Mode and Ultralow Noise Mode NOISE PERFORMANCE Noise Density Normal Operation Low Noise Mode Ultralow Noise Mode BANDWIDTH Low Pass (Antialiasing) Filter, -3 dB Corner Output Data Rate (ODR) SELF TEST Output Change 5 Test Conditions/Comments Each axis User selectable Percentage of full scale Min Typ Max Unit 2, 4, 8 0.5 3000 1.5 g % Hz % 12 Bits Each axis Each axis 2 g range 4 g range 8 g range 2 g range 4 g range 8 g range -40C to +85C Each axis XOUT, YOUT ZOUT 10 % mg/LSB mg/LSB mg/LSB LSB/g LSB/g LSB/g %/C +150 +250 mg mg 1 2 4 1000 500 250 0.05 -150 -250 35 50 XOUT, YOUT ZOUT XOUT, YOUT, ZOUT 0.5 0.6 0.35 mg/C mg/C mg/C XOUT, YOUT ZOUT XOUT, YOUT ZOUT XOUT, YOUT ZOUT VS = 3.5 V; XOUT, YOUT VS = 3.5 V; ZOUT 550 920 400 550 250 350 175 250 g/Hz g/Hz g/Hz g/Hz g/Hz g/Hz g/Hz g/Hz HALF_BW = 0 HALF_BW = 1 User selectable in 8 steps ODR/2 ODR/4 12.5 400 Hz Hz Hz XOUT YOUT ZOUT 230 -870 270 550 -550 535 870 -230 800 mg mg mg 1.6 1.6 2.0 2.0 3.5 VS V V POWER SUPPLY Operating Voltage Range (VS) I/O Voltage Range (VDD I/O) Rev. E | Page 4 of 43 Data Sheet Parameter Supply Current Measurement Mode Normal Operation Low Noise Mode Ultralow Noise Mode Wake-Up Mode Standby Power Supply Rejection Ratio (PSRR) Input Frequency 100 Hz to 1 kHz Input Frequency 1 kHz to 250 kHz Turn-On Time Power-Up to Standby Measurement Mode Instruction to Valid Data TEMPERATURE SENSOR Bias Average Standard Deviation Sensitivity Average Standard Deviation Sensitivity Repeatability Resolution ENVIRONMENTAL Operating Temperature Range ADXL362 Test Conditions/Comments Min Typ Max Unit 100 Hz ODR (50 Hz bandwidth) 6 1.8 3.3 13 0.27 0.01 A A A A A -13 -20 dB dB 5 4/ODR ms 350 290 0.065 0.0025 0.5 12 LSB LSB C/LSB C/LSB C Bits CS = 1.0 F, RS = 100 , CIO = 1.1 F, input is 100 mV sine wave on VS 100 Hz ODR (50 Hz bandwidth) @ 25C -40 +85 C All minimum and maximum specifications are guaranteed. Typical specifications may not be guaranteed. Cross axis sensitivity is defined as coupling between any two axes. -40C to +25C or +25C to +85C. 4 Different supplies and measurement range cause different offset. 5 Self test change is defined as the output change in g when self test is asserted. Different supplies cause different self test changes. These limits apply to the specific test conditions stated in Table 1. For variations over the full Vs supply range, see Table 22. 6 Refer to Figure 30 for current consumption at other bandwidth settings. 1 2 3 Rev. E | Page 5 of 43 ADXL362 Data Sheet ABSOLUTE MAXIMUM RATINGS RECOMMENDED SOLDERING PROFILE Table 2. Rating 5000 g 5000 g -0.3 V to +3.6 V -0.3 V to +3.6 V -0.3 V to VS Indefinite Figure 3 and Table 5 provide details about the recommended soldering profile. RAMP-UP 150C 260C -50C to +150C -50C to +150C RAMP-DOWN TIME Device Weight 18 mg Figure 2 and Table 4 provide details about the package branding for the ADXL362. For a complete listing of product availability, see the Ordering Guide section. Table 5. Recommended Soldering Profile Profile Feature Average Ramp Rate (TL to TP) Preheat Minimum Temperature (TSMIN) Maximum Temperature (TSMAX) Time (TSMIN to TSMAX)(tS) TSMAX to TL Ramp-Up Rate Time Maintained Above Liquidous (TL) Liquidous Temperature (TL) Time (tL) Peak Temperature (TP) Time Within 5C of Actual Peak Temperature (tP) Ramp-Down Rate Time 25C to Peak Temperature ESD CAUTION 10776-002 *362B Figure 2. Product Information on Package (Top View) Table 4. Package Branding Information Branding Key 362B #yww vvvv tS Figure 3. Recommended Soldering Profile PACKAGE INFORMATION # yww vv v v TSMIN t25C TO PEAK Table 3. Package Characteristics JC 85C/W tL TSMAX PREHEAT THERMAL RESISTANCE JA 150C/W TL 10776-003 2000 V (HBM) Stresses at or above those listed under Absolute Maximum Ratings may cause permanent damage to the product. This is a stress rating only; functional operation of the product at these or any other conditions above those indicated in the operational section of this specification is not implied. Operation beyond the maximum operating conditions for extended periods may affect product reliability. Package Type 16-Terminal LGA CRITICAL ZONE TL TO TP tP TP TEMPERATURE Parameter Acceleration (Any Axis, Unpowered) Acceleration (Any Axis, Powered) VS VDD I/O All Other Pins Output Short-Circuit Duration (Any Pin to Ground) ESD Short Term Maximum Temperature Four Hours One Minute Temperature Range (Powered) Temperature Range (Storage) Field Description Pin 1 indicator and device identifier Pb-free designator (#) and date code Factory lot code Rev. E | Page 6 of 43 Sn63/Pb37 3C/sec max Condition Pb-Free 3C/sec max 100C 150C 60 sec to 120 sec 3C/sec max 150C 200C 60 sec to 180 sec 3C/sec max 183C 60 sec to 150 sec 240 + 0/-5C 10 sec to 30 sec 217C 60 sec to 150 sec 260 + 0/-5C 20 sec to 40 sec 6C/sec max 6 minutes max 6C/sec max 8 minutes max Data Sheet ADXL362 RESERVED 3 SCLK 4 RESERVED 5 NC VS 14 ADXL362 TOP VIEW (Not to Scale) 13 GND 12 GND 11 INT1 10 RESERVED 9 6 7 8 INT2 NOTES 1. NC = NO CONNECT. THIS PIN IS NOT INTERNALLY CONNECTED. 10776-004 2 15 CS NC 16 MISO 1 MOSI VDDI/O GND PIN CONFIGURATION AND FUNCTION DESCRIPTIONS Figure 4. Pin Configuration (Top View) Table 6. Pin Function Descriptions Pin No. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Mnemonic VDD I/O NC Reserved SCLK Reserved MOSI MISO CS INT2 Reserved INT1 GND GND VS NC GND Description Supply Voltage for Digital I/O. No Connect. Not internally connected. Reserved. Can be left unconnected or connected to GND. SPI Communications Clock. Reserved. Can be left unconnected or connected to GND. Master Output, Slave Input. SPI serial data input. Master Input, Slave Output. SPI serial data output. SPI Chip Select, Active Low. Must be low during SPI communications. Interrupt 2 Output. INT2 also serves as an input for synchronized sampling. Reserved. Can be left unconnected, or connected to GND. Interrupt 1 Output. INT1 also serves as an input for external clocking. Ground. This pin must be grounded. Ground. This pin must be grounded. Supply Voltage. No Connect. Not internally connected. Ground. This pin must be grounded. Rev. E | Page 7 of 43 ADXL362 Data Sheet TYPICAL PERFORMANCE CHARACTERISTICS 40 PERCENTAGE OF POPULATION (%) PERCENT OF POPULATION (%) 25 20 15 10 5 35 30 25 20 15 10 -80 -70 -60 -50 -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 ZERO g OFFSET (mg) 0 10776-005 0 930 950 970 990 1010 1030 1050 1070 1090 1110 1130 SENSITIVITY (mg/LSB) Figure 5. X-Axis Zero g Offset at 25C, VS = 2 V 10776-008 5 Figure 8. X-Axis Sensitivity at 25C, VS = 2 V, 2 g Range 30 50 PERCENTAGE OF POPULATION (%) PERCENT OF POPULATION (%) 45 25 20 15 10 5 40 35 30 25 20 15 10 -80 -70 -60 -50 -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 ZERO g OFFSET (mg) 0 10776-006 970 990 1010 1030 1050 1070 1090 1110 1130 Figure 9. Y-Axis Sensitivity at 25C, VS = 2 V, 2 g Range 20 18 18 PERCENTAGE OF POPULATION (%) 16 16 14 12 10 8 6 4 2 14 12 10 8 6 4 2 -170 -140 -110 -80 -50 -20 10 40 70 ZERO g OFFSET (mg) 100 10776-007 PERCENT OF POPULATION (%) 950 SENSITIVITY (mg/LSB) Figure 6. Y-Axis Zero g Offset at 25C, VS = 2 V 0 930 0 975 990 1005 1020 1035 1050 1065 1080 1095 1110 1125 SENSITIVITY (mg/LSB) Figure 7. Z-Axis Zero g Offset at 25C, VS = 2 V Figure 10. Z-Axis Sensitivity at 25C, VS = 2 V, 2 g Range Rev. E | Page 8 of 43 10776-010 0 10776-009 5 ADXL362 150 20 100 OUTPUT (mg) 25 15 10 5 0 -1.0 -0.8 -0.6 -0.4 -0.2 0 0.2 0.4 0.6 0.8 1.0 ZERO g OFFSET TEMPERATURE COEFFICIENT (mg/C) -100 -60 -40 -20 0 20 40 60 80 100 TEMPERATURE (C) 10776-014 0 50 -50 10776-011 PERCENT OF POPULATION (%) Data Sheet Figure 14. X-Axis Zero g Offset vs. Temperature-- 16 Parts Soldered to PCB, ODR = 100 Hz, VS = 2 V Figure 11. X-Axis Zero g Offset Temperature Coefficient, VS = 2 V 35 150 100 25 OUTPUT (mg) PERCENT OF POPULATION (%) 30 20 15 50 0 10 -50 -1.0 -0.8 -0.6 -0.4 -0.2 0 0.2 0.4 0.6 0.8 1.0 ZERO g OFFSET TEMPERATURE COEFFICIENT (mg/C) -100 -60 10776-012 -20 0 20 40 60 80 100 TEMPERATURE (C) Figure 12. Y-Axis Zero g Offset Temperature Coefficient, VS = 2 V Figure 15. Y-Axis Zero g Offset vs. Temperature-- 16 Parts Soldered to PCB, ODR = 100 Hz, VS = 2 V 150 20 100 OUTPUT (mg) 25 15 10 5 50 0 -50 0 -0.5 -0.3 -0.1 0.1 0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7 1.9 ZERO g OFFSET TEMPERATURE COEFFICIENT (mg/C) -100 -60 10776-013 PERCENT OF POPULATION (%) -40 -40 -20 0 20 40 60 80 TEMPERATURE (C) Figure 16. Z-Axis Zero g Offset vs. Temperature-- 16 Parts Soldered to PCB, ODR = 100 Hz, VS = 2 V Figure 13. Z-Axis Zero g Offset Temperature Coefficient, VS = 2 V Rev. E | Page 9 of 43 100 10776-016 0 10776-015 5 ADXL362 Data Sheet 40 8 35 PERCENT OF POPULATION (%) 6 4 2 0 -2 -4 -6 25 20 15 10 -20 0 20 40 60 80 100 TEMPERATURE (C) 0 550 575 600 625 650 675 700 PERCENT OF POPULATION (%) 35 6 4 2 0 -2 -4 -6 30 25 20 15 10 -40 -20 0 20 40 60 80 100 0 -700 -675 -650 -625 -600 -575 -550 -525 -500 -475 -450 SELF TEST DELTA (mg) Figure 18. Y-Axis Sensitivity Deviation from 25C vs. Temperature-- 16 Parts Soldered to PCB, ODR = 100 Hz, VS = 2 V 10776-021 5 -8 10776-018 SENSITIVITY DEVIATION FROM 25C (%) 525 40 8 TEMPERATURE (C) Figure 21. Y-Axis Self Test Response at 25C, VS = 2 V 40 10 8 PERCENT OF POPULATION (%) 35 6 4 2 0 -2 -4 -6 30 25 20 15 10 5 -8 -40 -20 0 20 40 60 80 100 TEMPERATURE (C) 10776-019 SENSITIVITY DEVIATION FROM 25C (%) 500 Figure 20. X-Axis Self Test Response at 25C, VS = 2 V 10 -10 -60 475 SELF TEST DELTA (mg) Figure 17. X-Axis Sensitivity Deviation from 25C vs. Temperature-- 16 Parts Soldered to PCB, ODR = 100 Hz, VS = 2 V -10 -60 450 10776-020 -40 0 350 375 400 425 450 475 500 525 550 575 600 625 650 SELF TEST DELTA (mg) Figure 22. Z-Axis Self Test Response at 25C, VS = 2 V Figure 19. Z-Axis Sensitivity Deviation from 25C vs. Temperature-- 16 Parts Soldered to PCB, ODR = 100 Hz, VS = 2 V Rev. E | Page 10 of 43 10776-022 -10 -60 30 5 -8 10776-017 SENSITIVITY DEVIATION FROM 25C (%) 10 ADXL362 35 70 30 60 PERCENT OF POPULATION (%) 25 20 15 10 20 25 10 PERCENT OF POPULATION (%) 12 20 15 10 5 200 250 300 350 400 10776-026 150 8 6 4 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6 3.7 3.8 0 10776-024 2.7 -200 0 200 400 600 800 1000 TEMPERATURE SENSOR BIAS AT 25C (LSB) Figure 24. Current Consumption at 25C, Low Noise Mode, ODR = 100 Hz, VS = 2 V 10776-027 2 CURRENT CONSUMPTION (A) Figure 27. Temperature Sensor Response at 25C, VS = 2 V 40 30 35 PERCENT OF POPULATION (%) 35 25 20 15 10 5 30 25 20 15 10 5 8 9 10 11 12 13 14 15 16 CURRENT CONSUMPTION (A) 10776-025 0 100 Figure 26. Current Consumption at 25C, Wake-Up Mode, VS = 2 V 30 0 50 CURRENT CONSUMPTION (nA) Figure 23. Current Consumption at 25C, Normal Mode, ODR = 100 Hz, VS = 2 V PERCENT OF POPULATION (%) 30 0 10776-023 1.50 1.55 1.60 1.65 1.70 1.75 1.80 1.85 1.90 1.95 2.00 2.05 CURRENT CONSUMPTION (A) PERCENT OF POPULATION (%) 40 10 5 0 50 Figure 25. Current Consumption at 25C, Ultralow Noise Mode, ODR = 100 Hz, VS = 2 V 0 14.4 14.6 14.8 15.0 15.2 15.4 15.6 15.8 16.0 16.2 16.4 16.6 16.8 TEMPERATURE SENSOR SCALE FACTOR (LSB/C) Figure 28. Temperature Sensor Scale Factor, VS = 2 V Rev. E | Page 11 of 43 10776-028 PERCENT OF POPULATION (%) Data Sheet ADXL362 Data Sheet 25 20 15 10 5 0 -20 -16 -12 -8 -4 0 4 8 12 16 20 CLOCK FREQUENCY DEVIATION FROM IDEAL (%) 10776-029 PERCENT OF POPULATION (%) 30 Figure 29. Clock Frequency Deviation from Ideal at 25C, VS = 2 V Rev. E | Page 12 of 43 Data Sheet ADXL362 THEORY OF OPERATION The ADXL362 is a complete 3-axis acceleration measurement system that operates at extremely low power consumption levels. It measures both dynamic acceleration, resulting from motion or shock, and static acceleration, such as tilt. Acceleration is reported digitally and the device communicates via the SPI protocol. Builtin digital logic enables autonomous operation and implements functionality that enhances system level power savings. MECHANICAL DEVICE OPERATION The moving component of the sensor is a polysilicon surfacemicromachined structure that is built on top of a silicon wafer. Polysilicon springs suspend the structure over the surface of the wafer and provide a resistance against acceleration forces. Deflection of the structure is measured using differential capacitors that consist of independent fixed plates and plates attached to the moving mass. Acceleration deflects the structure and unbalances the differential capacitor, resulting in a sensor output whose amplitude is proportional to acceleration. Phase sensitive demodulation determines the magnitude and polarity of the acceleration. OPERATING MODES The ADXL362 has two operating modes: measurement mode for continuous, wide bandwidth sensing; and wake-up mode for limited bandwidth activity detection. In addition, measurement can be suspended altogether by placing the device in standby. Measurement Mode Measurement mode is the normal operating mode of the ADXL362. In this mode, acceleration data is read continuously and the accelerometer consumes less than 3 A (typical) across its entire range of output data rates of up to 400 Hz using a 2.0 V supply. All features described in this datasheet are available when operating the ADXL362 in this mode. The ability to continuously output data from the minimum 12.5 Hz to the maximum 400 Hz data rate while still delivering less than 3 A (typical) of current consumption is what defines the ADXL362 as an ultralow power accelerometer. Other accelerometers derive low current by using a specific low power mode that power cycles acceleration sensing. The result is a small effective bandwidth in the low power modes and undersampling of input data; therefore, unwanted aliasing can occur. Undersampling and aliasing do not occur with the ADXL362 because it continuously samples the full bandwidth of its sensor at all data rates. Wake-Up Mode Wake-up mode is ideal for simple detection of the presence or absence of motion at extremely low power consumption (270 nA at a 2.0 V supply voltage). Wake-up mode is useful particularly for implementation of a motion activated on/off switch, allowing the rest of the system to be powered down until activity is detected. Wake-up mode reduces current consumption to a very low level by measuring acceleration only about six times per second to determine whether motion is present. If motion is detected, the accelerometer can respond autonomously in the following ways: * * * * Switch into full bandwidth measurement mode Signal an interrupt to a microcontroller Wake up downstream circuitry, depending on the configuration In wake-up mode, all accelerometer features are available with the exception of the activity timer. All registers can be accessed, and real-time data can be read and/or stored in the FIFO. Standby Placing the ADXL362 in standby suspends measurement and reduces current consumption to 10 nA (typical). Pending interrupts and data are preserved and no new interrupts are generated. The ADXL362 powers up in standby with all sensor functions turned off. SELECTABLE MEASUREMENT RANGES The ADXL362 has selectable measurement ranges of 2 g, 4 g, and 8 g. Acceleration samples are always converted by a 12-bit ADC; therefore, sensitivity scales with g range. Ranges and corresponding sensitivity values are listed in Table 1. Data can temporarily not represent maximum gees while overranging but no damage is caused to the accelerometer when acceleration exceeds the corresponding range maximum. Table 2 lists the absolute maximum ratings for acceleration, indicating the acceleration level that can cause permanent damage to the device. SELECTABLE OUTPUT DATA RATES The ADXL362 can report acceleration data at various data rates ranging from 12.5 Hz to 400 Hz. The internal low-pass filter pole is automatically set to 1/4 or 1/2 the selected ODR (based on the HALF_BW setting) to ensure the Nyquist sampling criterion is met and no aliasing occurs. Rev. E | Page 13 of 43 ADXL362 Data Sheet Current consumption varies somewhat with output data rate as shown in Figure 30, remaining below 5.0 A over the entire range of data rates and operating voltages. CURRENT CONSUMPTION (A) 6 VS = 1.6V VS = 2.0V VS = 2.5V VS = 3.0V VS = 3.5V 5 POWER/NOISE TRADEOFF The ADXL362 offers a few options for decreasing noise at the expense of only a small increase in current consumption. The noise performance of the ADXL362 in normal operation, typically 7 LSB rms at 100 Hz bandwidth, is adequate for most applications, depending upon bandwidth and the desired resolution. For cases where lower noise is needed, the ADXL362 provides two lower noise operating modes that trade reduced noise for a somewhat higher current consumption. 4 3 Table 7 lists the current consumption and noise densities obtained for normal operation and the two lower noise modes at a typical 2.0 V supply. 2 1 0 100 200 300 400 OUTPUT DATA RATE (Hz) Table 7. Noise and Current Consumption: Normal Operation, Low Noise Mode, and Ultralow Noise Mode at VS = 2.0 V, ODR = 100 Hz 10776-030 0 Figure 30. Current Consumption vs. Output Data Rate at Several Supply Voltages Antialiasing The analog-to-digital converter (ADC) of the ADXL362 samples at the (user selected) output data rate. In the absence of antialiasing filtering, it aliases any input signals whose frequency is more than half the data rate. To mitigate this, a two-pole lowpass filter is provided at the input of the ADC. The user can set this antialiasing filter to a bandwidth that is at 1/2 the data rate or 1/4 the data rate. Setting the antialiasing filter pole to 1/2 of the output data rate provides less aggressive antialiasing filtering, but maximizes bandwidth and is adequate for most applications. Setting the pole to 1/4 of the data rate reduces bandwidth for a given data rate, but provides more aggressive antialiasing. The antialiasing filter of the ADXL362 defaults to the more conservative setting, where bandwidth is set to one-fourth the output data rate. Mode Normal Operation Low Noise Ultralow Noise Noise (g/Hz) Typical 550 400 250 Current Consumption (A) Typical 1.8 3.3 13 Operating the ADXL362 at a higher supply voltage also decreases noise. Table 8 lists the current consumption and noise densities obtained for normal operation and the two lower noise modes at the highest recommended supply, 3.3 V. Table 8. Noise and Current Consumption: Normal Operation, Low Noise Mode, and Ultralow Noise Mode at VS = 3.3 V, ODR = 100 Hz Mode Normal Operation Low Noise Ultralow Noise Rev. E | Page 14 of 43 Noise (g/Hz) Typical 380 280 175 Current Consumption (A) Typical 2.7 4.5 15 Data Sheet ADXL362 POWER SAVINGS FEATURES Designed for the most power conscious applications, the ADXL362 includes several features (as described in this section) for enabling power savings at the system level, as well as at the device level. ULTRALOW POWER CONSUMPTION IN ALL MODES At the device level, the most obvious power saving feature of the ADXL362 is its ultralow current consumption in all configurations. The ADXL362 consumes between 1.1 A (typical) and 5 A (typical) across all data rates up to 400 Hz and all supply voltages up to 3.5 V (see Figure 30). An even lower power, 270 nA (typical) motion triggered wake-up mode is provided for simple motion detection applications that require a power consumption lower than 1 A. In many applications, it is advantageous for activity detection to be based not on an absolute threshold, but on a deviation from a reference point or orientation. This is particularly useful because it removes the effect on activity detection of the static 1 g imposed by gravity. When an accelerometer is stationary, its output can reach 1 g, even when it is not moving. In absolute activity, when the threshold is set to less than 1 g, activity is immediately detected in this case. In the referenced configuration, activity is detected when acceleration samples are at least a user set amount above an internally defined reference for the user defined amount of time, as described in Equation 1. ABS(Acceleration - Reference) > Threshold At these current levels, the accelerometer consumes less power in full operation than the standby currents of many other system components, and is, therefore, optimal for applications that require continuous acceleration monitoring and very long battery life. Because the accelerometer is always on, it can act as a motion activation switch. The accelerometer signals to the rest of the system when to turn on, thereby managing power at the system level. Consequently, activity is detected only when the acceleration has deviated sufficiently from the initial orientation. The reference for activity detection is calculated when activity detection is engaged in the following scenarios: As important as its low operating current, the 10 nA (typical) standby current of the ADXL362 contributes to a much longer battery life in applications that spend most of their time in a sleep state and wake up via an external trigger. MOTION DETECTION The ADXL362 features built-in logic that detects activity (presence of acceleration above a threshold) and inactivity (lack of acceleration above a threshold). Activity and inactivity events can be used as triggers to manage the accelerometer mode of operation, trigger an interrupt to a host processor, and/or autonomously drive a motion switch. (1) When the activity function is turned on and measurement mode is engaged; If link mode is enabled: when inactivity is detected and activity detection begins; or If link mode is not enabled: when activity is detected and activity detection repeats. The referenced configuration results in a very sensitive activity detection that detects even the most subtle motion events. Fewer False Positives Ideally, the intent of activity detection is to wake up a system only when motion is intentional, ignoring noise or small, unintentional movements. In addition to being sensitive to subtle motion events, the ADXL362 activity detection algorithm is designed to be robust in filtering out undesired triggers. Detection of an activity or inactivity event is indicated in the status register and can be configured to generate an interrupt. In addition, the activity status of the device, that is, whether it is moving or stationary, is indicated by the AWAKE bit, described in the Using the AWAKE Bit section. The ADXL362 activity detection functionality includes a timer to filter out unwanted motion and ensure that only sustained motion is recognized as activity. The duration of this timer, as well as the acceleration threshold, are user adjustable from one sample (that is, no timer) to up to 20 seconds of motion. Activity and inactivity detection can be used when the accelerometer is in either measurement mode or wake-up mode. Note that the activity timer is operational in measurement mode only. In wake-up mode, one-sample activity detection is used. Activity Detection Inactivity Detection An activity event is detected when acceleration remains above a specified threshold for a specified time period. An inactivity event is detected when acceleration remains below a specified threshold for a specified time. Inactivity detection is also configurable as referenced or absolute. Referenced and Absolute Configurations Activity detection can be configured as referenced or absolute. When using absolute activity detection, acceleration samples are compared to a user set threshold to determine whether motion is present. For example, if a threshold of 0.5 g is set and the acceleration on the z-axis is 1 g for longer than the user defined activity time, the activity status asserts. When using absolute inactivity detection, acceleration samples are compared to a user set threshold for the user set time to determine the absence of motion. Inactivity is detected when enough consecutive samples are all below the threshold. The absolute configuration of inactivity must be used for implementing free fall detection. Rev. E | Page 15 of 43 ADXL362 Data Sheet When using referenced inactivity detection, inactivity is detected when acceleration samples are within a user specified amount of an internally defined reference (as described by Equation 2) for a user defined amount of time. AWAKE = 1 INACTIVITY INTERRUPT TRIGGERS (2) Referenced inactivity, like referenced activity, is particularly useful for eliminating the effects of the static acceleration due to gravity. With absolute inactivity, if the inactivity threshold is set lower than 1 g, a device resting motionless may never detect inactivity. With referenced inactivity, the same device under the same configuration detects inactivity. For example, if the accelerometer has been configured for 90 minutes, the accelerometer detects inactivity when it has been stationary for 90 minutes. The wide range of timer settings means that in applications where power conservation is critical, the system can be put to sleep after very short periods of inactivity. In applications where continuous operation is critical, the system stays on for as long as any motion is present. Linking Activity and Inactivity Detection The activity and inactivity detection functions can be used concurrently and processed manually by a host processor, or they can be configured to interact in several other ways, as follows. Default Mode The user must enable the activity and inactivity functions because these functions are not automatically enabled by default. After the user enables the activity and inactivity functions, the ADXL362 exhibits the following behavior when it enters default mode: Both activity and inactivity detection remain enabled and all interrupts must be serviced by a host processor; that is, a processor must read each interrupt before it is cleared and can be used again. AWAKE = 1 WAIT FOR PROCESSOR TO CLEAR INTERRUPT Figure 31. Flowchart Illustrating Activity and Inactivity Operation in Default Mode In linked mode, each interrupt must be serviced by a host processor before the next interrupt is enabled. Linked mode operation is illustrated in the flowchart in Figure 32. WAIT FOR ACTIVITY EVENT ACTIVITY INTERRUPT WAIT FOR PROCESSOR TO CLEAR INTERRUP AWAKE = 1 AWAKE = 0 WAIT FOR PROCESSOR TO CLEAR INTERRUPT INACTIVITY INTERRUPT WAIT FOR INACTIVITY EVENT Figure 32. Flowchart Illustrating Activity and Inactivity Operation in Linked Mode Loop Mode In loop mode, motion detection operates as described in the Linked Mode section, but interrupts do not need to be serviced by a host processor. This configuration simplifies the implementation of commonly used motion detection and enhances power savings by reducing the amount of power used in bus communication. Loop mode operation is illustrated in the flowchart in Figure 33. AWAKE = 1 WAIT FOR ACTIVITY EVENT Linked Mode Similarly, when inactivity is detected, the device is assumed to be stationary (or asleep). Thus, activity is expected as the next event; therefore, only activity detection operates. 10776-131 NOTES 1. THE AWAKE BIT DEFAULTS TO 1 WHEN ACTIVITY AND INACTIVITY ARE NOT LINKED. Loop mode operation is illustrated in the flowchart in Figure 32. In linked mode, activity and inactivity detection are linked to each other such that only one of the functions is enabled at any given time. As soon as activity is detected, the device is assumed to be moving (or awake) and stops looking for activity; rather, inactivity is expected as the next event. Therefore, only inactivity detection operates. WAIT FOR INACTIVITY EVENT 10776-132 The inactivity timer can be set to anywhere from 2.5 ms (a single sample at 400 Hz ODR) to almost 90 minutes (65,535 samples at 12.5 Hz ODR) of inactivity. A requirement for inactivity detection is that for whatever period of time the inactivity timer has been configured, the accelerometer detects inactivity only when it has been stationary for that amount of time. ACTIVITY INTERRUPT TRIGGERS WAIT FOR INACTIVITY EVENT AWAKE = 0 10776-133 ABS(Acceleration - Reference) < Threshold WAIT FOR PROCESSOR TO CLEAR INTERRUPT WAIT FOR ACTIVITY EVENT Figure 33. Flowchart Illustrating Activity and Inactivity Operation in Loop Mode Autosleep When in linked or loop mode, enabling autosleep causes the device to enter wake-up mode autonomously (see the Wake-Up Mode section) when inactivity is detected, and to reenter measurement mode when activity is detected. The autosleep configuration is active only if linked or loop modes are enabled. In the default mode, the autosleep setting is ignored. Rev. E | Page 16 of 43 Data Sheet ADXL362 Using the AWAKE Bit COMMUNICATIONS The AWAKE bit is a status bit that indicates whether the ADXL362 is awake or asleep. The device is awake when it has experienced an activity condition, and it is asleep when it has experienced an inactivity condition. SPI Instructions The awake signal can be mapped to the INT1 or INT2 pin, allowing the pin to serve as a status output to connect or disconnect power to downstream circuitry based on the awake status of the accelerometer. Used in conjunction with loop mode, this configuration implements a trivial, autonomous motion activated switch, as shown in Figure 43. If the turn-on time of downstream circuitry can be tolerated, this motion switch configuration can save significant system level power by eliminating the standby current consumption of the remainder of the application. This standby current can often exceed the full operating current of the ADXL362. The digital interface of the ADXL362 is implemented with system level power savings in mind. The following features enhance power savings: * * * FIFO The ADXL362 includes a deep 512-sample first in, first out (FIFO) buffer. The FIFO provides benefits primarily in two ways, as follows. System Level Power Savings Appropriate use of the FIFO enables system level power savings by enabling the host processor to sleep for extended periods of time while the accelerometer autonomously collects data. Alternatively, using the FIFO to collect data can unburden the host while it tends to other tasks. Data Recording/Event Context The FIFO can be used in a triggered mode to record all data leading up to an activity detection event, thereby providing context for the event. In the case of a system that identifies impact events, for example, the accelerometer can keep the entire system off while it stores acceleration data in its FIFO and looks for an activity event. When the impact event occurs, data that was collected prior to the event is frozen in the FIFO. The accelerometer can then wake the rest of the system and transfer this data to the host processor, thereby providing context for the impact event. Generally, the more context available, the more intelligent decisions a system can achieve, making a deep FIFO especially useful. The ADXL362 FIFO can store up to more than 13 seconds of data, providing a clear picture of events prior to an activity trigger. All FIFO modes of operation, as well as the structure of the FIFO and instructions for retrieving data from it, are described in further detail in the FIFO Modes section of this data sheet. Burst reads and writes reduce the number of SPI communication cycles required to configure the device and retrieve data. Concurrent operation of activity and inactivity detection enables "set it and forget it" operation. Loop mode further reduces communications power by enabling the clearing of interrupts without processor intervention. The FIFO is implemented such that consecutive samples can be read continuously via a multibyte read of unlimited length; thus, one read FIFO instruction can clear the entire contents of the FIFO. In many other accelerometers, each read instruction retrieves a single sample only. In addition, the ADXL362 FIFO construction allows the use of direct memory access (DMA) to read the FIFO contents. Bus Keepers The ADXL362 includes bus keepers on all pins that can be configured as digital inputs: MOSI, SCLK, CS, INT1, and INT2. Bus keepers prevent tristate bus lines from floating when nothing is driving them, thus preventing through current in any gate inputs that are on the bus. MSB Registers Acceleration and temperature measurements are converted to 12-bit values and transmitted via SPI using two registers per measurement. To read a full sample set of 3-axis acceleration data, six registers must be read. Many applications do not require the accuracy that 12-bit data provides and prefer, instead, to save system level power. The MSB registers XDATA, YDATA, and ZDATA enable this tradeoff. These registers contain the eight MSBs of the x-, y-, and z-axis acceleration data; reading them effectively provides 8-bit acceleration values. Importantly, only three (consecutive) registers must be read to retrieve a full data set, significantly reducing the time during which the SPI bus is active and drawing current. 12-bit and 8-bit data are available simultaneously so that both data formats can be used in a single application, depending on the needs of the application at a given time. For example, the processor can read 12-bit data when higher resolution is required, and switch to 8-bit data (simply by reading a different set of registers) when application requirements change. Rev. E | Page 17 of 43 ADXL362 Data Sheet ADDITIONAL FEATURES FREE FALL DETECTION SYNCHRONIZED DATA SAMPLING Many digital output accelerometers include a built-in free fall detection feature. In the ADXL362, this function can be implemented using the inactivity interrupt. Refer to the Applications Information section for more details, including suggested threshold and timing values. For applications that require a precisely timed acceleration measurement, the ADXL362 features an option to synchronize acceleration sampling to an external trigger. EXTERNAL CLOCK The ADXL362 has a built-in 51.2 kHz (typical) clock that, by default, serves as the time base for internal operations. ODR and bandwidth scale proportionally with the clock. The ADXL362 provides a discrete number of options for ODR, such as 100 Hz, 50 Hz, 25 Hz, and so forth, in factors of 2, (see the Filter Control Register section for a complete listing). To achieve data rates other than those provided, an external clock can be used at the appropriate clock frequency. The output data rate scales with the clock frequency, as shown in Equation 3. ODR ACTUAL = ODRSELECTED x f 51.2 kHz (3) For example, to achieve an 80 Hz ODR, select the 100 Hz ODR setting and provide a clock frequency that is 80% of nominal, or 41.0 kHz. The ADXL362 can operate with external clock frequencies ranging from the nominal 51.2 kHz down to 25.6 kHz to allow the user to achieve any desired output data rate. Alternatively, an external clock can improve clock frequency accuracy. The distribution of clock frequencies among a sampling of >1000 parts has a standard deviation of approximately 3%. To achieve tighter tolerances, a more accurate clock can be provided externally. Bandwidth automatically scales to 1/2 or 1/4 of the ODR (based on the HALF_BW setting), and this ratio is preserved, regardless of clock frequency. Power consumption also scales with clock frequency: higher clock rates increase power consumption. Figure 34 shows how power consumption varies with clock rate. 2.5 2.0 The ADXL362 incorporates a self test feature that effectively tests its mechanical and electronic systems simultaneously. When the self test function is invoked, an electrostatic force is applied to the mechanical sensor. This electrostatic force moves the mechanical sensing element in the same manner as acceleration, and it is additive to the acceleration experienced by the device. This added electrostatic force results in an output change on all three axes. USER REGISTER PROTECTION The ADXL362 includes user register protection for single event upsets (SEUs). An SEU is a change of state caused by ions or electromagnetic radiation striking a sensitive node in a microelectronic device. The state change is a result of the free charge created by ionization in or close to an important node of a logic element (for example, a memory bit). The SEU, itself, is not considered permanently damaging to transistor or circuit functionality, but it can create erroneous register values. The ADXL362 registers that are protected from SEU are Register 0x20 to Register 0x2E. SEU protection is implemented via a 99-bit error correcting (Hamming-type) code that detects both single- and double-bit errors. The check bits are recomputed any time a write to any of the protected registers occurs. At any time, if the stored version of the check bits is not in agreement with the current check bit calculation, the ERR_USER_REGS status bit is set. The SEU bit in the status register is set on power-up prior to device configuration; it clears upon the first register write to that device. TEMPERATURE SENSOR The ADXL362 includes an integrated temperature sensor that can monitor internal system temperature or improve the temperature stability of the device via calibration. For example, acceleration outputs vary with temperature at a rate of 0.5 mg/C (typical), but the relationship to temperature is repeatable and can be calibrated. To use the temperature sensor to monitor absolute temperature, it is recommended that its initial bias (its output at some known temperature) is measured and calibrated. 1.5 1.0 0.5 VS = 1.6V VS = 2.0V VS = 3.5V 0 43 44 45 46 47 48 49 50 51 EXTERNAL CLOCK FREQUENCY (kHz) 52 10776-031 CURRENT CONSUMPTION (A) 3.0 SELF TEST Figure 34. Current Consumption vs. External Clock Rate Rev. E | Page 18 of 43 Data Sheet ADXL362 SERIAL COMMUNICATIONS The ADXL362 communicates via a 4-wire SPI and operates as a slave. Ignore data that is transmitted from the ADXL362 to the master device during writes to the ADXL362. As shown in Figure 36 to Figure 40, the MISO pin is in a high impedance state, held by a bus keeper, except when the ADXL362 is sending read data (to conserve bus power). Wire the ADXL362 for SPI communication as shown in the connection diagram in Figure 35. The recommended SPI clock speeds are 1 MHz to 8 MHz, with 12 pF maximum loading. The SPI timing scheme follows CPHA = CPOL = 0. For correct operation of the device, the logic thresholds and timing parameters in Table 9 and Table 10 must be met at all times. Refer to Figure 41 and Figure 42 for visual diagrams of the timing parameters. ADXL362 PROCESSOR MULTIBYTE TRANSFERS Multibyte transfers, also known as burst transfers, are supported for all SPI commands: register read, register write, and FIFO read commands. It is recommended that data be read using multibyte transfers to ensure that a concurrent and complete set of x-, y-, and z-acceleration (and temperature, where applicable) data is read. The FIFO runs on the serial port clock during FIFO reads and can sustain bursting at the SPI clock rate as long as the SPI clock is 1 MHz or faster. DOUT MOSI DOUT Register Read/Write Auto-Increment MISO DIN SCLK DOUT A register read or write command begins with the address specified in the command and auto-increments for each additional byte in the transfer. To avoid address wrapping and side effects of reading registers multiple times, the auto-increment halts at the invalid Register Address 63 (0x3F). 10776-032 CS Figure 35. 4-Wire SPI Connection Diagram SPI COMMANDS The SPI port uses a multibyte structure wherein the first byte is a command. The ADXL362 command set is * * * It is recommended that an even number of bytes be read (using a multibyte transaction) because each sample consists of two bytes: 2 bits of axis information and 14 bits of data. If an odd number of bytes is read, it is assumed that the desired data was read; therefore, the second half of the last sample is discarded so a read from the FIFO always starts on a properly aligned evenbyte boundary. Data is presented least significant byte first, followed by the most significant byte. 0x0A: write register 0x0B: read register 0x0D: read FIFO Read and Write Register Commands The command structure for the read register and write register commands is as follows (see Figure 36 and Figure 37): </CS down> <command byte (0x0A or 0x0B)> <address byte> <data byte> <additional data bytes for multi-byte> ... </CS up> The read and write register commands support multibyte (burst) read/write access. The waveform diagrams for multibyte read and write commands are shown in Figure 38 and Figure 39. The ADXL362 has a 6-bit address bus, mapping only 64 registers in the possible 256 register address space. The addresses do not fold to repeat the registers at addresses above 64. Attempted access to register addresses above 64 are mapped to the invalid register at 63 (0x3F) and have no functional effect. Address 0x00 to Address 0x2E are for customer access, as described in the register map. Address 0x2F to Address 0x3F are reserved for factory use. LATENCY RESTRICTIONS Reading any of the data registers (0x08 to 0x0A or 0x0E to 0x15) clears the data ready interrupt. There can be as much as an 80 s delay from reading a register to the clearing of the data ready interrupt. Other register reads, register writes, and FIFO reads have no latency restrictions. Read FIFO Command Reading from the FIFO buffer is a command structure that does not have an address. </CS down> <command byte (0x0D)> <data byte> <data byte> ... </CS up> INVALID ADDRESSES AND ADDRESS FOLDING INVALID COMMANDS Commands other than 0x0A, 0x0B, and 0x0D have no effect. The MISO output remains in a high impedance state, and the bus keeper holds the MISO line at its last value. Rev. E | Page 19 of 43 ADXL362 Data Sheet CS 0 1 2 0 0 0 3 4 5 6 7 8 9 1 1 7 6 10 11 12 13 14 15 1 0 16 17 18 19 7 6 5 4 19 20 21 22 23 3 2 1 0 20 21 22 23 2 1 0 SCLK INSTRUCTION MOSI 0 1 0 8-BIT ADDRESS 8 B BIIT AD DD DRES SS 5 4 3 2 10776-239 DATA OUT MISO Figure 36. Register Read CS 0 1 2 0 0 0 3 5 6 7 8 9 10 0 1 0 7 6 5 4 11 12 13 14 15 16 17 18 1 0 7 6 5 SCLK S ES ESS D RE ADDR BIT ADDRESS 8 BI 8-BIT 0 1 4 3 DATA BYTE 2 4 3 10776-240 INSTRUCTION MOSI HIGH IMPEDANCE MISO Figure 37. Register Write (Receive Instruction Only) CS 0 1 0 0 2 3 4 6 7 8 9 1 1 7 6 5 10 11 12 13 14 15 16 17 18 19 20 21 22 23 SCLK 8-BIT ADDRESS 0 0 1 0 5 4 3 2 1 0 OUTPUT BYTE 1 7 MISO 6 5 4 3 2 OUTPUT BYTE n 1 0 7 6 5 7 6 5 4 3 2 1 0 1 0 10776-241 INSTRUCTION MOSI Figure 38. Burst Read CS 0 1 0 0 2 3 4 5 6 7 8 9 7 6 10 11 12 13 14 15 16 17 18 19 20 21 22 23 SCLK 0 1 0 1 0 5 4 3 2 1 0 7 6 5 4 3 2 DATA BYTE n 1 0 4 3 2 10776-242 0 DATA BYTE 1 8-BIT ADDRESS INSTRUCTION MOSI HIGH IMPEDANCE MISO Figure 39. Burst Write (Receive Instruction Only) CS 0 1 2 0 0 0 3 4 5 6 7 1 0 1 8 9 10 7 6 5 11 12 13 14 15 1 0 SCLK 0 1 OUTPUT BYTE 1 MISO 4 3 2 OUTPUT BYTE n Figure 40. FIFO Read Rev. E | Page 20 of 43 7 6 5 4 3 2 1 0 10776-243 INSTRUCTION MOSI Data Sheet ADXL362 tCSD CS tCSH CSS tCLE SCLK tSU MSB IN LSB IN 10776-244 MOSI tHD HIGH IMPEDANCE MISO Figure 41. Timing Diagram for SPI Receive Instructions CS tHIGH tLOW tCSH SCLK DON'T CARE tDIS tV MOSI MSB OUT LSB OUT 10776-245 MISO Figure 42. Timing Diagram for SPI Send Instructions (Shaded Portions of Figure 36, Figure 38, and Figure 40) Table 9. SPI Digital Input/Output Parameter Digital Input Low Level Input Voltage (VIL) High Level Input Voltage (VIH) Low Level Input Current (IIL) High Level Input Current (IIH) Digital Output Low Level Output Voltage (VOL) High Level Output Voltage (VOH) Low Level Output Current (IOL) High Level Output Current (IOH) 1 Test Conditions/Comments Min Limit 1 Max 0.3 x VDD I/O 0.7 x VDD I/O VIN = VDD I/O VIN = 0 V IOL = 10 mA IOH = -4 mA VOL = VOL, max VOH = VOH, min Limits based on characterization results, not production tested. Rev. E | Page 21 of 43 0.1 -0.1 0.2 x VDD I/O 0.8 x VDD I/O 10 -4 Unit V V A A V V mA mA ADXL362 Data Sheet Table 10. SPI Timing (TA = 25C, VS = 2.0 V, VDD I/O = 2.0 V) Parameter fCLK 3 CSS tCSH tCSD tSU tHD tHIGH tLOW tCLE tV tDIS 1 2 3 Min 2.4 100 20 20 20 20 50 50 25 0 0 Limit 1, 2 Max 8000 35 25 Unit kHz ns ns ns ns ns ns ns ns ns ns Description Clock Frequency CS Setup Time CS Hold Time CS Disable Time Data Setup Time Data Hold Time Clock High Time Clock Low Time Clock Enable Time Output Valid from Clock Low Output Disable Time Limits based on design targets; not production tested. The timing values are measured corresponding to the input thresholds (VIL and VIH) given in Table 9. The minimum limit is only necessary when using FIFO. Rev. E | Page 22 of 43 Data Sheet ADXL362 REGISTER MAP Table 11. Register Summary Reg 0x00 0x01 0x02 0x03 0x08 0x09 0x0A 0x0B Name DEVID_AD DEVID_MST PARTID REVID XDATA YDATA ZDATA STATUS Bits Bit 7 Bit 6 [7:0] [7:0] [7:0] [7:0] [7:0] [7:0] [7:0] [7:0] ERR_USER_ AWAKE REGS 0x0C FIFO_ENTRIES_L [7:0] 0x0D FIFO_ENTRIES_H [7:0] 0x0E XDATA_L [7:0] 0x0F XDATA_H [7:0] 0x10 YDATA_L [7:0] 0x11 YDATA_H [7:0] 0x12 ZDATA_L [7:0] 0x13 ZDATA_H [7:0] 0x14 TEMP_L [7:0] 0x15 TEMP_H [7:0] 0x16 Reserved [7:0] 0x17 Reserved [7:0] 0x1F SOFT_RESET [7:0] 0x20 THRESH_ACT_L [7:0] 0x21 THRESH_ACT_H [7:0] 0x22 TIME_ACT [7:0] 0x23 THRESH_INACT_L [7:0] 0x24 THRESH_INACT_H [7:0] 0x25 TIME_INACT_L [7:0] 0x26 TIME_INACT_H [7:0] 0x27 ACT_INACT_CTL [7:0] RES 0x28 FIFO_CONTROL [7:0] 0x29 FIFO_SAMPLES [7:0] 0x2A INTMAP1 [7:0] INT_LOW AWAKE 0x2B INTMAP2 0x2C FILTER_CTL 0x2D POWER_CTL 0x2E SELF_TEST Bit 5 Bit 4 Bit 3 DEVID_AD[7:0] DEVID_MST[7:0] PARTID[7:0] REVID[7:0] XDATA[7:0] YDATA[7:0] ZDATA[7:0] ACT FIFO_OVERRUN FIFO_ENTRIES_L[7:0] UNUSED XDATA_L[7:0] Reset 0xAD 0x1D 0xF2 0x01 0x00 0x00 0x00 INACT FIFO_WATER- FIFO_READY DATA_READY 0x40 MARK 0x00 FIFO_ENTRIES_H[1:0] 0x00 0x00 SX XDATA_H[3:0] 0x00 YDATA_L[7:0] 0x00 SX YDATA_H[3:0] 0x00 ZDATA_L[7:0] 0x00 SX ZDATA_H[3:0] 0x00 TEMP_L[7:0] 0x00 SX TEMP_H[3:0] 0x00 Reserved[7:0] 0x00 Reserved[7:0] 0x00 SOFT_RESET[7:0] 0x00 THRESH_ACT_L[7:0] 0x00 UNUSED THRESH_ACT_H[2:0] 0x00 TIME_ACT[7:0] 0x00 THRESH_INACT_L[7:0] 0x00 UNUSED THRESH_INACT_H[2:0] 0x00 TIME_INACT_L[7:0] 0x00 TIME_INACT_H[7:0] 0x00 LINKLOOP INACT_REF INACT_EN ACT_REF ACT_EN 0x00 UNUSED AH FIFO_TEMP FIFO_MODE 0x00 FIFO_SAMPLES[7:0] 0x80 INACT ACT FIFO_OVER- FIFO_WATER- FIFO_READY DATA_READY 0x00 RUN MARK [7:0] INT_LOW AWAKE INACT ACT FIFO_OVER- FIFO_WATER- FIFO_READY DATA_READY 0x00 RUN MARK [7:0] RANGE RES HALF_BW EXT_SAMPLE ODR 0x13 [7:0] RES EXT_CLK LOW_NOISE WAKEUP AUTOSLEEP MEASURE 0x00 [7:0] UNUSED ST 0x00 Rev. E | Page 23 of 43 Bit 2 Bit 1 Bit 0 RW R R R R R R R R R R R R R R R R R R R R W RW RW RW RW RW RW RW RW RW RW RW RW RW RW RW ADXL362 Data Sheet REGISTER DETAILS This section describes the functions of the ADXL362 registers. The ADXL362 powers up with default register values in the as shown in the Reset column of Table 11 in the Register Map section. Note that any changes to the registers before the POWER_CTL register (Register 0x00 to Register 0x2C) must be made with the device in standby. If changes are made while the ADXL362 is in measurement mode, they can be effective for only part of a measurement. X-AXIS DATA (8 MSB) REGISTER Address: 0x08, Reset: 0x00, Name: XDATA This register holds the eight most significant bits of the x-axis acceleration data. This limited resolution data register is used in power conscious applications where eight bits of data are sufficient: energy can be conserved by reading only one byte of data per axis, rather than two. DEVICE ID REGISTER Address: 0x00, Reset: 0xAD, Name: DEVID_AD Y-AXIS DATA (8 MSB) REGISTER This register contains the Analog Devices device ID, 0xAD. Address: 0x09, Reset: 0x00, Name: YDATA This register holds the eight most significant bits of the y-axis acceleration data. This limited resolution data register is used in power conscious applications where eight bits of data are sufficient: energy can be conserved by reading only one byte of data per axis, rather than two. DEVICE ID: 0x1D REGISTER Address: 0x01, Reset: 0x1D, Name: DEVID_MST This register contains the Analog Devices MEMS device ID, 0x1D. Z-AXIS DATA (8 MSB) REGISTER Address: 0x0A, Reset: 0x00, Name: ZDATA PART ID: 0xF2 REGISTER This register holds the eight most significant bits of the z-axis acceleration data. This limited resolution data register is used in power conscious applications where eight bits of data are sufficient: energy can be conserved by reading only one byte of data per axis, rather than two. Address: 0x02, Reset: 0xF2, Name: PARTID This register contains the device ID, 0xF2 (362 octal). SILICON REVISION ID REGISTER Address: 0x03, Reset: 0x01, Name: REVID This register contains the product revision ID, beginning with 0x01 and incrementing for each subsequent revision. Rev. E | Page 24 of 43 Data Sheet ADXL362 STATUS REGISTER Address: 0x0B, Reset: 0x40, Name: STATUS This register includes the following bits that describe various conditions of the ADXL362. Table 12. Bit Descriptions for STATUS Bits 7 Bit Name ERR_USER_REGS 6 AWAKE 5 INACT 4 ACT 3 FIFO_OVERRUN 2 FIFO_WATERMARK 1 FIFO_READY 0 DATA_READY Settings Description SEU Error Detect. 1 indicates one of two conditions: either an SEU event, such as an alpha particle of a power glitch, has disturbed a user register setting or the ADXL362 is not configured. This bit is high upon both startup and soft reset, and resets as soon as any register write commands are performed. Indicates whether the accelerometer is in an active (AWAKE = 1) or inactive (AWAKE = 0) state, based on the activity and inactivity functionality. To enable autosleep, activity and inactivity detection must be in linked mode or loop mode (LINK/LOOP bits in the ACT_INACT_CTL register); otherwise, this bit defaults to 1 and must be ignored. Inactivity. 1 indicates that the inactivity detection function has detected an inactivity or a free fall condition. Activity. 1 indicates that the activity detection function has detected an overthreshold condition. FIFO Overrun. 1 indicates that the FIFO has overrun or overflowed, such that new data replaces unread data. See the Using FIFO Interrupts section for details. FIFO Watermark. 1 indicates that the FIFO contains at least the desired number of samples, as set in the FIFO_SAMPLES register. See the Using FIFO Interrupts section for details. FIFO Ready. 1 indicates that there is at least one sample available in the FIFO output buffer. See the Using FIFO Interrupts section for details. Data Ready. 1 indicates that a new valid sample is available to be read. This bit clears when a FIFO read is performed. See the Data Ready Interrupt section for more details. Rev. E | Page 25 of 43 Reset 0x0 Access R 0x1 R 0x0 R 0x0 R 0x0 R 0x0 R 0x0 R 0x0 R ADXL362 Data Sheet FIFO ENTRIES REGISTERS Z-AXIS DATA REGISTERS These registers indicate the number of valid data samples present in the FIFO buffer. This number ranges from 0 to 512 or 0x00 to 0x200. FIFO_ENTRIES_L contains the least significant byte. FIFO_ENTRIES_H contains the two most significant bits. Bits[15:10] of FIFO_ENTRIES_H are unused (represented as X = don't care). These two registers contain the sign extended (SX) z-axis acceleration data. ZDATA_L contains the eight LSBs, and ZDATA_H contains the four MSBs of the 12-bit value. Address: 0x0C, Reset: 0x00, Name: FIFO_ENTRIES_L Address: 0x12, Reset: 0x00, Name: ZDATA_L Address: 0x0D, Reset: 0x00, Name: FIFO_ENTRIES_H Address: 0x13, Reset: 0x00, Name: ZDATA_H X-AXIS DATA REGISTERS These two registers contain the sign extended (SX) x-axis acceleration data. XDATA_L contains the eight least significant bits (LSBs), and XDATA_H contains the four most significant bits (MSBs) of the 12-bit value. The sign extension bits (B[15:12], denoted as SX in the XDATA_H bit map that follows) have the same value as the MSB (B11). Address: 0x0E, Reset: 0x00, Name: XDATA_L Address: 0x0F, Reset: 0x00, Name: XDATA_H Y-AXIS DATA REGISTERS These two registers contain the sign extended (SX) y-axis acceleration data. YDATA_L contains the eight LSBs and YDATA_H contains the four MSBs of the 12-bit value. The sign extension bits (B[15:12], denoted as SX in the YDATA_H bit map that follows) have the same value as the MSB (B11). Address: 0x10, Reset: 0x00, Name: YDATA_L The sign extension bits (B[15:12], denoted as SX in the ZDATA_H bit map that follows) have the same value as the MSB (B11). TEMPERATURE DATA REGISTERS These two registers contain the sign extended (SX) temperature sensor output data. TEMP_L contains the eight LSBs, and TEMP_H contains the four MSBs of the 12-bit value. The value is sign extended; therefore, Bits[B15:B12] of TEMP_H are all 0s or all 1s, based on the value of Bit B11. The sign extension bits (B[15:12], denoted as SX in the TEMP_H bit map that follows) have the same value as the MSB (B11). Address: 0x14, Reset: 0x00, Name: TEMP_L Address: 0x15, Reset: 0x00, Name: TEMP_H SOFT RESET REGISTER Address: 0x1F, Reset: 0x00, Name: SOFT_RESET Writing Code 0x52 (representing the letter, R, in ASCII or unicode) to this register immediately resets the ADXL362. All register settings are cleared, and the sensor is placed in standby. Interrupt pins are configured to a high output impedance mode and held to a valid state by bus keepers. This is a write-only register. If read, data in it is always 0x00. A latency of approximately 0.5 ms is required after soft reset. Address: 0x11, Reset: 0x00, Name: YDATA_H Rev. E | Page 26 of 43 Data Sheet ADXL362 ACTIVITY THRESHOLD REGISTERS To detect activity, the ADXL362 compares the absolute value of the 12-bit (signed) acceleration data with the 11-bit (unsigned) THRESH_ACT value. See the Motion Detection section for more information on activity detection. The term, THRESH_ACT, refers to an 11-bit unsigned value comprising the THRESH_ACT_L register, which holds its eight LSBs; and the THRESH_ACT_H register, which holds its three MSBs. THRESH_ACT is set in codes; the value in g depends on the measurement range setting that is selected. THRESH_ACT [g] = THRESH_ACT [codes]/Sensitivity [codes per g] Address: 0x20, Reset: 0x00, Name: THRESH_ACT_L When the accelerometer is in wake-up mode, the TIME_ACT value is ignored and activity is detected based on a single acceleration sample. INACTIVITY THRESHOLD REGISTERS To detect inactivity, the absolute value of the 12-bit acceleration data is compared with the 11-bit (unsigned) THRESH_INACT value. See the Motion Detection section for more information. The term, THRESH_INACT, refers to an 11-bit unsigned value comprised of the THRESH_INACT_L registers, which holds its eight LSBs and the THRESH_INACT_H register, which holds its three MSBs. This 11-bit unsigned value sets the threshold for inactivity detection. This value is set in codes; the value (in g) depends on the measurement range setting selected: Address: 0x21, Reset: 0x00, Name: THRESH_ACT_H THRESH_INACT [g] = THRESH_INACT [codes]/Sensitivity [codes per g] Address: 0x23, Reset: 0x00, Name: THRESH_INACT_L ACTIVITY TIME REGISTER Address: 0x22, Reset: 0x00, Name: TIME_ACT The activity timer implements a robust activity detection that minimizes false positive motion triggers. When the timer is used, only sustained motion can trigger activity detection. Refer to the Fewer False Positives section for additional information. Address: 0x24, Reset: 0x00, Name: THRESH_INACT_H The value in this register sets the number of consecutive samples that must have at least one axis greater than the activity threshold (set by THRESH_ACT) for an activity event to be detected. INACTIVITY TIME REGISTERS The time (in seconds) is given by the following equation: Time = TIME_ACT/ODR The 16-bit value in these registers sets the number of consecutive samples that must have all axes lower than the inactivity threshold (set by THRESH_INACT) for an inactivity event to be detected. The TIME_INACT_L register holds the eight LSBs and the TIME_INACT_H register holds the eight MSBs of the 16-bit TIME_INACT value. where: TIME_ACT is the value set in this register. ODR is the output data rate set in the FILTER_CTL register (Address 0x2C). The time in seconds can be calculated as Setting the activity time to 0x00 has the same result as setting this time to 0x01: Activity is detected when a single acceleration sample has at least one axis greater than the activity threshold (THRESH_ACT). Time = TIME_INACT/ODR where: TIME_INACT is the 16-bit value set by the TIME_INACT_L register (eight LSBs) and the TIME_INACT_H register (eight MSBs). ODR is the output data rate set in the FILTER_CTL register (Address 0x2C). Rev. E | Page 27 of 43 ADXL362 Data Sheet The 16-bit value allows for long inactivity detection times. The maximum value is 0xFFFF or 65,535 samples. At the lowest output data rate, 12.5 Hz, this equates to almost 90 minutes. In this configuration, the accelerometer must be stationary for 90 minutes before putting its system to sleep. Setting the inactivity time to 0x00 has the same result as setting this time to 0x01: Inactivity is detected when a single acceleration sample has all axes lower than the inactivity threshold (THRESH_INACT). Address: 0x25, Reset: 0x00, Name: TIME_INACT_L Address: 0x26, Reset: 0x00, Name: TIME_INACT_H Rev. E | Page 28 of 43 Data Sheet ADXL362 ACTIVITY/INACTIVITY CONTROL REGISTER Address: 0x27, Reset: 0x00, Name: ACT_INACT_CTL Table 13. Bit Descriptions for ACT_INACT_CTL Bits [7:6] [5:4] Bit Name UNUSED LINK/LOOP Settings X0 01 11 3 INACT_REF 2 INACT_EN 1 ACT_REF 0 ACT_EN Description Unused Bits. Default Mode. Activity and inactivity detection are both enabled, and their interrupts (if mapped) must be acknowledged by the host processor by reading the STATUS register. Autosleep is disabled in this mode. Use this mode for free fall detection applications. Linked Mode. Activity and inactivity detection are linked sequentially such that only one is enabled at a time. Their interrupts (if mapped) must be acknowledged by the host processor by reading the STATUS register. Loop Mode. Activity and inactivity detection are linked sequentially such that only one is enabled at a time, and their interrupts are internally acknowledged (do not need to be serviced by the host processor). To use either linked or looped mode, both ACT_EN (Bit 0) and INACT_EN (Bit 2) must be set to 1; otherwise, the default mode is used. For additional information, refer to the Linking Activity and Inactivity Detection section. Referenced/Absolute Inactivity Select. 1 = inactivity detection function operates in referenced mode. 0= inactivity detection function operates in absolute mode. Inactivity Enable. 1 = enables the inactivity (underthreshold) functionality. Referenced/Absolute Activity Select. 1 = activity detection function operates in referenced mode. 0 = activity detection function operates in absolute mode. Activity Enable. 1 = enables the activity (overthreshold) functionality. Rev. E | Page 29 of 43 Reset 0x0 0x0 Access RW RW 0x0 RW 0x0 RW 0x0 RW 0x0 RW ADXL362 Data Sheet FIFO CONTROL REGISTER Address: 0x28, Reset: 0x00, Name: FIFO_CONTROL Table 14. Bit Descriptions for FIFO_CONTROL Bits [7:4] 3 Bit Name UNUSED AH 2 FIFO_TEMP [1:0] FIFO_MODE Settings 00 01 10 11 Description Unused Bits. Above Half. This bit is the MSB of the FIFO_SAMPLES register, allowing FIFO samples a range of 0 to 511. Store Temperature Data to FIFO. 1 = temperature data is stored in the FIFO together with x-, y-, and z-axis acceleration data. Enable FIFO and Mode Selection. FIFO is disabled. Oldest saved mode. Stream mode. Triggered mode. Rev. E | Page 30 of 43 Reset 0x0 0x0 Access RW RW 0x0 RW 0x0 RW Data Sheet ADXL362 FIFO SAMPLES REGISTER INT1/INT2 FUNCTION MAP REGISTERS Address: 0x29, Reset: 0x80, Name: FIFO_SAMPLES The INT1 and INT2 registers configure the INT1/INT2 interrupt pins, respectively. Bits[B6:B0] select which function(s) generate an interrupt on the pin. If its corresponding bit is set to 1, the function generates an interrupt on the INT pin. Bit B7 configures whether the pin operates in active high (B7 low) or active low (B7 high) mode. The value in this register specifies the number of samples to store in the FIFO. The AH bit in the FIFO_CONTROL register (Address 0x28) is used as the MSB of this value. The full range of FIFO samples is 0 to 511. The default value of this register is 0x80 to avoid triggering the FIFO watermark interrupt (see the FIFO Watermark section for more information). The following bit map is duplicated from the FIFO Control Register section to indicate the AH bit. Any number of functions can be selected simultaneously for each pin. If multiple functions are selected, their conditions are OR'ed together to determine the INT pin state. The status of each individual function can be determined by reading the STATUS register. If no interrupts are mapped to an INT pin, the pin remains in a high impedance state, held to a valid logic state by a bus keeper. Address: 0x2A, Reset: 0x00, Name: INTMAP1 Table 15. Bit Descriptions for INTMAP1 Bits 7 6 5 4 3 2 1 0 Bit Name INT_LOW AWAKE INACT ACT FIFO_OVERRUN FIFO_WATERMARK FIFO_READY DATA_READY Settings Description 1 = INT1 pin is active low. 1 = maps the awake status to INT1 pin. 1 = maps the inactivity status to INT1 pin. 1 = maps the activity status to INT1 pin. 1 = maps the FIFO overrun status to INT1 pin. 1 = maps the FIFO watermark status to INT1 pin. 1 = maps the FIFO ready status to INT1 pin. 1 = maps the data ready status to INT1 pin. Rev. E | Page 31 of 43 Reset 0x0 0x0 0x0 0x0 0x0 0x0 0x0 0x0 Access RW RW RW RW RW RW RW RW ADXL362 Data Sheet Address: 0x2B, Reset: 0x00, Name: INTMAP2 Table 16. Bit Descriptions for INTMAP2 Bits 7 6 5 4 3 2 1 0 Bit Name INT_LOW AWAKE INACT ACT FIFO_OVERRUN FIFO_WATERMARK FIFO_READY DATA_READY Settings Description 1 = INT2 pin is active low. 1 = maps the awake status to INT2 pin. 1 = maps the inactivity status to INT2 pin. 1 = maps the activity status to INT2 pin. 1 = maps the FIFO overrun status to INT2 pin. 1 = maps the FIFO watermark status to INT2 pin. 1 = maps the FIFO ready status to INT2 pin. 1 = maps the data ready status to INT2 pin. Rev. E | Page 32 of 43 Reset 0x0 0x0 0x0 0x0 0x0 0x0 0x0 0x0 Access RW RW RW RW RW RW RW RW Data Sheet ADXL362 FILTER CONTROL REGISTER Address: 0x2C, Reset: 0x13, Name: FILTER_CTL Table 17. Bit Descriptions for FILTER_CTL Bits [7:6] Bit Name RANGE Settings 00 01 1X 5 4 RES HALF_BW 3 EXT_SAMPLE [2:0] ODR 000 001 010 011 100 101...111 Description Measurement Range Selection. 2 g (reset default) 4 g 8 g Reserved. Halved Bandwidth. Additional information is provided in the Antialiasing section. 1 = the bandwidth of the antialiasing filters is set to 1/4 the output data rate (ODR) for more conservative filtering. 0 = the bandwidth of the filters is set to 1/2 the ODR for a wider bandwidth. External Sampling Trigger. 1 = the INT2 pin is used for external conversion timing control. Refer to the Using Synchronized Data Sampling section for more information. Output Data Rate. Selects ODR and configures internal filters to a bandwidth of 1/2 or 1/4 the selected ODR, depending on the HALF_BW bit setting. 12.5 Hz 25 Hz 50 Hz 100 Hz (reset default) 200 Hz 400 Hz Rev. E | Page 33 of 43 Reset 0x0 Access RW 0x0 0x1 RW 0x0 RW 0x3 RW ADXL362 Data Sheet POWER CONTROL REGISTER Address: 0x2D, Reset: 0x00, Name: POWER_CTL Table 18. Bit Descriptions for POWER_CTL Bits 7 6 Bit Name Reserved EXT_CLK [5:4] LOW_NOISE Settings 00 01 10 11 3 WAKEUP 2 AUTOSLEEP [1:0] MEASURE 00 01 10 11 Description Reserved. External Clock. See the Using an External Clock section for additional details. 1 = the accelerometer runs off the external clock provided on the INT1 pin. Selects Power vs. Noise Tradeoff: Normal operation (reset default). Low noise mode. Ultralow noise mode. Reserved. Wake-Up Mode. See the Operating Modes section for a detailed description of wake-up mode. 1 = the part operates in wake-up mode. Autosleep. Activity and inactivity detection must be in linked mode or loop mode (LINK/LOOP bits in ACT_INACT_CTL register) to enable autosleep; otherwise, the bit is ignored. See the Motion Detection section for details. 1 = autosleep is enabled, and the device enters wake-up mode automatically upon detection of inactivity. Selects Measurement Mode or Standby. Standby. Reserved. Measurement mode. Reserved. Rev. E | Page 34 of 43 Reset 0x0 0x0 Access RW RW 0x0 RW 0x0 RW 0x0 RW 0x0 RW Data Sheet ADXL362 SELF TEST REGISTER Address: 0x2E, Reset: 0x00, Name: SELF_TEST Refer to the Self Test section for information on the operation of the self test feature, and see the Using Self Test section for guidelines on how to use this functionality. Table 19. Bit Descriptions for SELF_TEST Bits [7:1] 0 Bit Name UNUSED ST Settings Description Self Test. 1 = a self test force is applied to the x-, y-, and z-axes. Rev. E | Page 35 of 43 Reset 0x0 0x0 Access RW RW ADXL362 Data Sheet APPLICATIONS INFORMATION APPLICATION EXAMPLES Start-up Routine This section includes a few application circuits, highlighting useful features of the ADXL362. This routine assumes a 2 g measurement range and operation in wake-up mode. Device Configuration 1. This section outlines the procedure for configuring the device and acquiring data. In general, the procedure follows the sequence of the register map, starting with Register 0x20, THRESH_ACT_L. 2. 2. 3. 4. 5. 6. Set activity and inactivity thresholds and timers. a. Write to Register 0x20 to Register 0x26. b. To minimize false positive motion triggers, set the TIME_ACT register greater than 1. Configure activity and inactivity functions. a. Write to Register 0x27. Configure FIFO. a. Write to Register 0x28 and Register 0x29. Map interrupts. a. Write to Register 0x2A and Register 0x2B. Configure general device settings. a. Write to Register 0x2C. Turn measurement on. a. Write to Register 0x2D. 3. 4. 5. 6. Using External Timing Triggers Figure 44 shows an application diagram for using the INT1 pin as the input for an external clock. In this mode, the external clock determines all accelerometer timing, including the output data rate and bandwidth. Settings for each of the registers vary based on application requirements. For more information, see the Register Details section. Autonomous Motion Switch To enable this feature, at the end of the desired start-up routine, set Bit 6 in the POWER_CTL register; for example, write 0x42 to this register to enable the use of an external clock and place the accelerometer into measurement mode. VS MOSI MOSI MISO SCLK GND ADP195 VIN SPI INTERFACE CS REVERSE POLARITY PROTECTION VOUT GND LEVEL SHIFT AND SLEW RATE CONTROL LOAD 10776-041 EN EXTERNAL CLOCK INT1 INTERRUPT CONTROL INT2 MISO SCLK GND SPI INTERFACE CS Figure 45 is an application diagram for using the INT2 pin as a trigger for synchronized sampling. Acceleration samples are produced every time this trigger is activated. To enable this feature, near the end of the desired start-up routine, set Bit 3 in the FILTER_CTL register; for example, write 0x4B to this register to enable the trigger and configure the accelerometer for 8 g measurement range and 100 Hz ODR. VDD I/O INT1 VS ADXL362 Figure 44. INT1 Pin as the Input for the External Clock ADXL362 INT2 VDD I/O VS CIO VS AWAKE CIO CS VDD I/O CS INTERRUPT CONTROL VDD I/O VS The features of the ADXL362 make it ideal for use as an autonomous motion switch. The example outlined here implements a switch that, once configured, operates without the intervention of a host processor to intelligently manage system power. In this example, the awake signal, mapped to the INT2 pin, drives a high-side power switch, such as the ADP195, to control power to the downstream circuitry. 10776-042 1. Write 250 decimal (0xFA) to Register 0x20, and write 0 to Register 0x21: sets activity threshold to 250 mg. Write 150 decimal (0x96) to Register 0x23, and write 0 to Register 0x24: sets inactivity threshold to 150 mg. Write 30 decimal (0x1E) to Register 0x25: sets inactivity timer to 30 samples or about 5 seconds. Write 0x3F to Register 0x27: configures motion detection in loop mode and enables referenced activity and inactivity detection. Write 0x40 to Register 0x2B: map the AWAKE bit to INT2. The INT2 pin is tied to the gate of the switch. Write 0x0A to Register 0x2D: begins the measurement in wake-up mode. Figure 43. Awake Signal to Control Power to Downstream Circuitry Rev. E | Page 36 of 43 Data Sheet ADXL362 VDD I/O CS POWER Power Supply Decoupling CIO VS Figure 46 shows the recommended bypass capacitors for use with the ADXL362. VDD I/O ADXL362 SAMPLING TRIGGER MOSI MISO INT1 SCLK INT2 GND CS CIO CS ADXL362 MOSI Example: Implementing Free Fall Detection When an object is in true free fall, acceleration on all axes is 0 g. Thus, free fall detection is achieved by looking for acceleration on all axes to fall below a certain threshold (close to 0 g) for a certain amount of time. The inactivity detection functionality, when used in absolute mode, does exactly this. To use inactivity to implement free fall detection, set the value in THRESH_INACT to the desired free fall threshold. Values between 300 mg and 600 mg are recommended; the register setting for these values varies based on the g range setting of the device, as follows: THRESH_INACT = Threshold Value [g] x Scale Factor [LSB per g] When a free fall condition is detected, the inactivity status is set to 1 and, if the function is mapped to an interrupt pin, an inactivity interrupt triggers on that pin. Start-up Routine The following start-up routine configures the ADXL362 for a typical free fall application. This routine assumes a 8 g measurement range and 100 Hz output data rate. Thresholds and timing values can be modified to suit particular application needs. 6. SCLK INT2 GND SPI INTERFACE CS Figure 46. Recommended Bypass Capacitors A 0.1 F ceramic capacitor (CS) at VS and a 0.1 F ceramic capacitor (CIO) at VDD I/O placed as close as possible to the ADXL362. Supply pins are recommended to adequately decouple the accelerometer from noise on the power supply. It is also recommended that VS and VDD I/O be separate supplies to minimize digital clocking noise on the VS supply. If this is not possible, additional filtering of the supplies may be necessary. If additional decoupling is necessary, place a resistor or ferrite bead, no larger than 100 , in series with VS. Additionally, increasing the bypass capacitance on VS to a 1 F tantalum capacitor in parallel with a 0.1 F ceramic capacitor can also improve noise. Power Supply Requirements TIME_INACT = Time [sec] x Data Rate [Hz] 5. INTERRUPT CONTROL Ensure that the connection from the ADXL362 ground to the power supply ground has low impedance because noise transmitted through ground has an effect similar to noise transmitted through VS. Set the value in TIME_INACT to implement the minimum amount of time that the acceleration on all axes must be less than the free fall threshold to generate a free fall condition. Values between 100 ms and 350 ms are recommended; the register setting for this varies based on the output data rate. 4. MISO INT1 Many digital output accelerometers include a built-in free fall detection feature. In the ADXL362, implement this function using the inactivity interrupt. 2. 3. VDD I/O VS Figure 45. Using the INT2 Pin to Trigger Synchronized Sampling 1. VDD I/O VS SPI INTERFACE 10776-043 INTERRUPT CONTROL 10776-040 VS Write 0x96 (150 codes) to Register 0x23: sets free fall threshold to 600 mg. Write 0x03 to Register 0x25: sets free fall time to 30 ms. Write 0x04 to Register 0x27: enables absolute inactivity detection. Write 0x20 to Register 0x2A or Register 0x2B to map the inactivity interrupt to INT1 or INT2, respectively. Write 0x83 to Register 0x2C: configures the accelerometer to 8 g range, 100 Hz ODR (output data rate). Write 0x02 to Register 0x2D to begin measurement. The ADXL362 is designed to operate using supply voltage rails ranging from 1.8 V to 3.3 V. The operating voltage range (VS), specified in Table 1, ranges from 1.6 V to 3.5 V to account for inaccuracies and transients of up to 10% on the supply voltage. The ADXL362 does not require any particular start-up transient characteristics, except that it must always be started up from 0 V. When the device is in operation, any time power is removed from the ADXL362, or falls below the operating voltage range, the supplies (VS, VDD I/O, and any bypass capacitors) must be discharged completely before power is reapplied. To enable supply discharge, it is recommended to power the device from a microcontroller GPIO, connect a shutdown discharge switch to the supply (Figure 47), or use a voltage regulator with a shutdown discharge feature, such as the ADP160. Rev. E | Page 37 of 43 ADXL362 Data Sheet VS VIN VDD I/O CS The FIFO is placed into stream mode by setting the FIFO_MODE bits in the FIFO_CONTROL register (Address 0x28) to Binary Value 0b10. CIO VS R1 VDD I/O Triggered Mode ADXL362 MOSI MISO SHUTDOWN SCLK INT2 GND SPI INTERFACE CS NOTES 1. THE ADXL362 SUPPLIES MUST BE DISCHARGED FULLY EACH TIME THE VOLTAGE ON THEM DROPS BELOW THE SPECIFIED OPERATING RANGE. A SHUTDOWN SWITCH IS ONE WAY TO DISCHARGE THE SUPPLIES. 10776-141 INT1 Figure 47. Using a Switch to Discharge the ADXL362 Supplies FIFO MODES The FIFO is a 512-sample memory buffer that can save power, unburden the host processor, and autonomously record data. The 512 FIFO samples can be allotted as either: * * 170 sample sets of concurrent 3-axis data; or 128 sample sets of concurrent 3-axis and temperature data The FIFO operates in one of the four modes described in this section. FIFO Disabled In triggered mode, the FIFO saves samples surrounding an activity detection event. The operation is similar to a one-time run trigger on an oscilloscope. The number of samples to be saved prior to the activity event is specified in FIFO_SAMPLES (Register 0x29, along with the AH bit in the FIFO_CONTROL register, Address 0x28). Place the FIFO into triggered mode by setting the FIFO_MODE bits in the FIFO_CONTROL register (Address 0x28) to Binary Value 0b11. FIFO Configuration The FIFO is configured via Register 0x28 and Register 0x29. Settings are described in detail in the FIFO Control Register section. FIFO Interrupts The FIFO can generate interrupts to indicate when samples are available, when a specified number of samples has been collected, and when the FIFO overflows and samples are lost. See the Using FIFO Interrupts section for more information. Retrieving Data from FIFO When the FIFO is disabled, no data is stored in it and any data already stored in it is cleared. The FIFO is disabled by setting the FIFO_MODE bits in the FIFO_CONTROL register (Address 0x28) to Binary Value 0b00. Oldest Saved Mode In oldest saved mode, the FIFO accumulates data until it is full and then stops. Additional data is collected only when space is made available by reading samples out of the FIFO buffer. (This mode of operation is sometimes referred to as "First N.") The FIFO is placed into oldest saved mode by setting the FIFO_MODE bits in the FIFO_CONTROL register (Address 0x28) to Binary Value 0b01. Stream Mode In stream mode, the FIFO always contains the most recent data. The oldest sample is discarded when space is needed to make room for a newer sample. (This mode of operation is sometimes referred to as "Last N.") Stream mode is useful for unburdening a host processor. The processor can tend to other tasks while data is being collected in the FIFO. When the FIFO fills to a certain number of samples (specified by the FIFO_SAMPLES register along with the AH bit in the FIFO_CONTROL register), it triggers a FIFO watermark interrupt (if this interrupt is enabled). At this point, the host processor can read the contents of the entire FIFO and then return to its other tasks as the FIFO fills again. FIFO data is read by issuing a FIFO read command, described in the SPI Commands section. Data is formatted as a 16-bit value as represented in Table 20. When reading data, the least significant byte (Bits[B7:B0]) is read first, followed by the most significant byte (Bits[B15:B8]). Bits[B11:B0] represent the 12-bit, twos complement acceleration or temperature data. Bits[B13:B12] are sign extension bits, and Bits[B15:B14] indicate the type of data, as listed in Table 20. Table 20. FIFO Buffer Data Format B15 B14 Data Type: 00: X-Axis 01: Y-Axis 10: Z-Axis 11: Temp B13 B7 B5 B6 B12 Sign Extension B4 Data B11 MSB B10 B9 Data B8 B3 B2 B1 B0 LSB Because the data format is 16-bit, the data must be read from the FIFO two bytes at a time. When a multibyte read is performed, the number of bytes read must always be an even number. Multibyte reads of FIFO data can be performed with no limit on the number of bytes read. If additional bytes are read after the FIFO is empty, the data in the additional bytes are read as 0x00. Rev. E | Page 38 of 43 Data Sheet ADXL362 As each sample set is acquired, it is written into the FIFO in the following order: X-axis Y-axis Z-axis Temperature (optional) This pattern repeats until the FIFO is full, at which point the behavior depends on the FIFO mode (see the FIFO Modes section). If the FIFO has insufficient space for four data entries (or three entries if temperature is not being stored), then an incomplete sample set can be stored. FIFO data is output on a per datum basis. As each data item is read, the same amount of space is freed up in the stack. Again, this can lead to incomplete sample sets being present in the FIFO. For additional system level FIFO applications, refer to the AN-1025 Application Note, Utilization of the First In, First Out (FIFO) Buffer in Analog Devices, Inc. Digital Accelerometers. When a certain status condition is detected, the pin that condition is mapped to is activated. The configuration of the pin is active high by default so that when it is activated, the pin goes high. However, this configuration can be switched to active low by setting the INT_LOW bit in the appropriate INTMAPx register. The INT pins can be connected to the interrupt input of a host processor where interrupts are responded to with an interrupt routine. Because multiple functions can be mapped to the same pin, the STATUS register can determine which condition caused the interrupt to trigger. Clear interrupts in one of several ways, as follows: Reading the STATUS register (Address 0x0B) clears activity and inactivity interrupts. Reading from the data registers. Address 0x08 to Address 0x0A or Address 0x0E to Address 0x15 clears the data ready interrupt. Reading enough data from the FIFO buffer so that interrupt conditions are no longer met clears the FIFO ready, FIFO watermark, and FIFO overrun interrupts. INTERRUPTS Several of the built-in functions of the ADXL362 can trigger interrupts to alert the host processor of certain status conditions. This section describes the functionality of these interrupts. Interrupt Pins Interrupts can be mapped to either (or both) of two designated output pins, INT1 and INT2, by setting the appropriate bits in the INTMAP1 and INTMAP2 registers, respectively. All functions can be used simultaneously. If multiple interrupts are mapped to one pin, the OR combination of the interrupts determines the status of the pin. Both interrupt pins are push-pull low impedance pins with an output impedance of about 500 (typical) and digital output specifications, as shown in Table 21. Both pins have bus keepers that hold them to a valid logic state when they are in a high impedance mode. To prevent interrupts from being falsely triggered during configuration, disable interrupts while their settings, such as thresholds, timings, or other values, are configured. If no functions are mapped to an interrupt pin, that pin is automatically configured to a high impedance (high-Z) state. The pins are also placed in the high-Z state upon a reset. Table 21. Interrupt Pin Digital Output Parameter Digital Output Low Level Output Voltage (VOL) High Level Output Voltage (VOH) Low Level Output Current (IOL) High Level Output Current (IOH) 1 Test Conditions Min IOL = 500 A IOH = -300 A VOL = VOL, max VOH = VOH, min 0.8 x VDD I/O 500 Limit1 Max 0.2 x VDD I/O Limits based on design, not production tested. Rev. E | Page 39 of 43 -300 Unit V V A A ADXL362 Data Sheet Alternate Functions of Interrupt Pins Overrun The INT1 and INT2 pins can be configured for use as input pins instead of for signaling interrupts. INT1 is used as an external clock input when the EXT_CLK bit (Bit 6) in the POWER_CTL register (Address 0x2D) is set. INT2 is used as the trigger input for synchronized sampling when the EXT_SAMPLE bit (Bit 3) in the FILTER_CTL register (Address 0x2C) is set. One or both of these alternate functions can be used concurrently; however, if an interrupt pin is used for its alternate function, it cannot simultaneously be used for its primary function, to signal interrupts. The FIFO_OVERRUN bit (Bit 3) is set when the FIFO has overrun or overflowed, such that new data replaces unread data. This can indicate a full FIFO that has not yet been emptied or a clocking error caused by a slow SPI transaction. If the FIFO is configured to oldest saved mode, an overrun event indicates that there is insufficient space available for a new sample. External clocking and data synchronization are described in the Applications Information section. Activity and Inactivity Interrupts The ACT bit (Bit 4) and INACT bit (Bit 5) in the STATUS register are set when activity and inactivity are detected, respectively. Detection procedures and criteria are described in the Motion Detection section. Data Ready Interrupt The DATA_READY bit (Bit 0) is set when new valid data is available, and it is cleared when no new data is available. The DATA_READY bit is not set while any of the data registers, Address 0x08 to Address 0x0A and Address 0x0E to Address 0x15, are being read. If DATA_READY = 0 prior to a register read and new data becomes available during the register read, DATA_READY remains at 0 until the read is complete and, only then, is set to 1. If DATA_READY = 1 prior to a register read, it is cleared at the start of the register read. If DATA_READY = 1 prior to a register read and new data becomes available during the register read, DATA_READY is cleared to 0 at the start of the register read and remains at 0 throughout the read. When the read is complete, DATA_READY is set to 1. Using FIFO Interrupts FIFO Watermark The FIFO_WATERMARK bit (Bit 2) is set when the number of samples stored in the FIFO is equal to or exceeds the number specified in the FIFO_SAMPLES register (Address 0x29) together with the AH bit in the FIFO_CONTROL register (Bit 3, Address 0x28). The FIFO_WATERMARK bit is cleared automatically when enough samples are read from the FIFO, such that the number of samples remaining is lower than that specified. The FIFO_OVERRUN bit is cleared automatically when the contents of the FIFO are read. Likewise, when the FIFO is disabled, the FIFO_OVERRUN bit is cleared. USING SYNCHRONIZED DATA SAMPLING For applications that require a precisely timed acceleration measurement, the ADXL362 features an option to synchronize acceleration sampling to an external trigger. The EXT_SAMPLE bit (Bit 3) in the FILTER_CTL Register (Address 0x2C) enables this feature. When the EXT_SAMPLE bit is set to 1, the INT2 pin is automatically reconfigured for use as the sync trigger input. When external triggering is enabled, it is up to the system designer to ensure that the sampling frequency meets system requirements. Sampling too infrequently causes aliasing. Noise can be lowered by oversampling; however, sampling at too high a frequency may not allow enough time for the accelerometer to process the acceleration data and convert it to valid digital output. When Nyquist criteria are met, signal integrity is maintained. An internal antialiasing filter is available in the ADXL362 and can assist the system designer in maintaining signal integrity. To prevent aliasing, set the filter bandwidth to a frequency no greater than 1/2 the sampling rate. For example, when sampling at 100 Hz, set the filter pole to no higher than 50 Hz. The filter pole is set via the ODR bits in the FILTER_CTL register (Address 0x2C). The filter bandwidth is set to 1/2 the ODR and is set via these bits. Even though the ODR is ignored (as the data rate is set by the external trigger), the filter is still applied at the specified bandwidth. Because of internal timing requirements, the trigger signal applied to pin INT2 must meet the following criteria: * * * * * If the number of FIFO samples is set to 0, the FIFO watermark interrupt is set. To avoid unexpectedly triggering this interrupt, the default value of the FIFO_SAMPLES register is 0x80. FIFO Ready The FIFO_READY bit (Bit 1) is set when there is at least one valid sample available in the FIFO output buffer. This bit is cleared when no valid data is available in the FIFO. Rev. E | Page 40 of 43 The trigger signal is active high. The pulse width of the trigger signal must be at least 25 s. The trigger must be deasserted for at least 25 s before it is reasserted. The maximum sampling frequency that is supported is 625 Hz (typical). The minimum sampling frequency is set only by system requirements. Samples need not be polled at any minimum rate; however, if samples are polled at a rate lower than the bandwidth set by the antialiasing filter, then aliasing can occur. Data Sheet ADXL362 To use an external clock, the EXT_CLK bit (Bit 6) in the POWER_CTL register (Address 0x2D) must be set. Setting this bit reconfigures the INT1 pin to an input pin on which the clock can be provided. The external clock must operate at or below 51.2 kHz. Further information is provided in the External Clock section. USING SELF TEST The self test function, described in the Self Test section, is enabled via the ST bit in the SELF_TEST register, Address 0x2E. The required procedure for using the self test functionality is as follows: 2. 3. 4. 5. 6. 7. Configure the accelerometer to 8 g range, 100 Hz ODR, and clear the HALF_BW bit (Bit 4 of the FILTER_CTL register). Use any noise mode (normal mode, low noise mode, or ultralow noise mode). Read acceleration data for the x-, y-, and z-axes. Assert self test by setting the ST bit in the SELF_TEST register, Address 0x2E. Wait 4/ODR for the output to settle to its new value. Read acceleration data for the x-, y-, and z-axes. Compare to the values from Step 2, and convert the difference from LSB to mg by multiplying by the sensitivity. If the observed difference falls within the self test output change specification listed in Table 22, then the device passes self test and is deemed operational. Deassert self test by clearing the ST bit in the SELF_TEST register, Address 0x2E. Minimum 0.2 -2.8 0.2 Maximum 2.8 -0.2 2.8 Unit g g g OPERATION AT VOLTAGES OTHER THAN 2.0 V The ADXL362 is tested and specified at a supply voltage of VS = 2.0 V; however, it can be powered with a VS as high as 3.3 V nominal (3.5 V maximum) or as low as 1.8 V nominal (1.6 V minimum). Some performance parameters change as the supply voltage changes, including the supply current (see Figure 30), noise (see Table 7 and Table 8), offset, sensitivity, and self test output change (see Table 22). Figure 48 shows the potential effect on 0 g offset at varying supply voltage. Data for this figure was calibrated to show 0 mg offset at 2.0 V. 200 X-AXIS Y-AXIS Z-AXIS 150 100 50 0 -50 -100 1.5 2.5 2.0 3.0 3.5 VS (V) It is also recommended to average 4 to 16 samples to get the acceleration for self test on and self test off to alleviate the influence from noise. Figure 48. 0 g Offset vs. Supply Voltage MECHANICAL CONSIDERATIONS FOR MOUNTING The self test output change specification shown in Table 1 is only given for VS = 2.0 V and the test conditions listed in the Specifications section. Self test response in g is roughly proportional to the square of the supply voltage. At a higher supply voltage, the self test response can exceed 1 g. The configuration in Step 1 standardizes the self test for any applications that use conditions other than those stated in Table 1. Self test response also varies with different user settings such as ODR and bandwidth. Using an 8 g range ensures the accelerometer output does not clip during self test. The limits in Table 22 are applicable for all supply voltages and cover a wider set of configurations, and hence the limits are wider than those in Table 1. Mount the ADXL362 on the printed circuit board (PCB) in a location close to a hard mounting point of the PCB to the case. Mounting the ADXL362 at an unsupported PCB location, as shown in Figure 49, can result in large, apparent measurement errors due to undampened PCB vibration. Locating the accelerometer near a hard mounting point ensures that any PCB vibration at the accelerometer is above the mechanical sensor resonant frequency of the accelerometer and, therefore, effectively invisible to the accelerometer. Multiple mounting points, close to the sensor, and/or a thicker PCB also help to reduce the effect of system resonance on the performance of the sensor. ACCELEROMETERS PCB MOUNTING POINTS Figure 49. Incorrectly Placed Accelerometers Rev. E | Page 41 of 43 10776-044 1. Axis X Y Z 10776-144 The ADXL362 has a built-in clock that, by default, is used for clocked internal operations. If desired, an external clock can be provided and used. Table 22. Self Test Limits for Different Supply Voltages (Vs) From 1.6 V to 3.5 V, ZERO g OFFSET (mg) USING AN EXTERNAL CLOCK ADXL362 Data Sheet AXES OF ACCELERATION SENSITIVITY AZ AX 10776-045 AY Figure 50. Axes of Acceleration Sensitivity (Corresponding Output Increases When Accelerated Along the Sensitive Axis) XOUT = 1g YOUT = 0g ZOUT = 0g TOP XOUT = 0g YOUT = -1g ZOUT = 0g TOP TOP XOUT = 0g YOUT = 1g ZOUT = 0g GRAVITY TOP XOUT = 0g YOUT = 0g ZOUT = 1g XOUT = 0g YOUT = 0g ZOUT = -1g Figure 51. Output Response vs. Orientation to Gravity LAYOUT AND DESIGN RECOMMENDATIONS Figure 52 shows the recommended PCB land pattern. 0.9250 0.3000 3.3500 0.5000 3.5000 Figure 52. Recommended PCB Land Pattern (Dimensions shown in millimeters) Rev. E | Page 42 of 43 10776-047 0.8000 10776-046 XOUT = -1g YOUT = 0g ZOUT = 0g Data Sheet ADXL362 OUTLINE DIMENSIONS PIN 1 CORNER 3.30 3.25 3.15 1.00 REF 0.10 REF 3.10 3.00 2.90 0.50 BSC 0.375 REF 0.25 x 0.35 REF 13 1 14 16 8 6 9 5 0.475 x 0.25 REF BOTTOM VIEW TOP VIEW 0.3375 REF END VIEW 05-07-2015-C PKG-003967 1.14 1.06 1.00 SEATING PLANE Figure 53. 16-Terminal Land Grid Array [LGA] (CC-16-4) Dimensions shown in millimeters ORDERING GUIDE Model 1 ADXL362BCCZ-RL ADXL362BCCZ-RL7 ADXL362BCCZ-R2 EVAL-ADXL362Z EVAL-ADXL362Z-DB EVAL-ADXL362Z-MLP EVAL-ADXL362Z-S 1 Temperature Range -40C to +85C -40C to +85C -40C to +85C -40C to +85C -40C to +85C -40C to +85C -40C to +85C Package Description 16-Terminal Land Grid Array [LGA] 16-Terminal Land Grid Array [LGA] 16-Terminal Land Grid Array [LGA] Breakout Board Datalogger and Development Board Low Power Real-Time Evaluation System Satellite Board for Evaluation System Z = RoHS Compliant Part. (c)2012-2016 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D10776-0-11/16(E) Rev. E | Page 43 of 43 Package Option CC-16-4 CC-16-4 CC-16-4 Quantity 5,000 1,500 250