IRFE130
2www.irf.com
Thermal Resistance
Parameter Min Typ Max Units Test Conditions
RthJC Junction to Case — — 5.0
RthJ-PCB Junction to PC Board — — 19"" Soldered to a copper clad PC board
°C/W
Source-Drain Diode Ratings and Characteristics
Parameter Min Typ Max Units Test Conditions
ISContinuous Source Current (Body Diode) — — 8.0
ISM Pulse Source Current (Body Diode) ➀—— 32
VSD Diode Forward Voltage — — 1.5 V Tj = 25°C, IS =8.0A, VGS = 0V ➃
trr Reverse Recovery Time — — 300 nS Tj = 25°C, IF =8.0A, di/dt ≤100A/µs
QRR Reverse Recovery Charge — — 970 µc VDD ≤50V ➃
ton Forward Turn-On Time Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD.
A
For footnotes refer to the last page
Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified)
Parameter Min Typ Max Units Test Conditions
BVDSS Drain-to-Source Breakdown Voltage 100 — — V VGS = 0V, ID = 1.0mA
∆BVDSS/∆TJTemperature Coefficient of Breakdown — 0.11 — V/°C Reference to 25°C, ID = 1.0mA
Voltage
RDS(on) Static Drain-to-Source On-State — — 0.18 VGS = 10V, ID =5.0A➃
Resistance — — 0.207 VGS =10V, ID =8.0A ➃
VGS(th) Gate Threshold Voltage 2.0 — 4.0 V VDS = VGS, ID =250µA
gfs Forward Transconductance 3.0 — — S ( ) V
DS > 15V, IDS =5.0A➃
IDSS Zero Gate Voltage Drain Current — — 25 VDS=80V, VGS=0V
— — 250 VDS =80V
VGS = 0V, TJ = 125°C
IGSS Gate-to-Source Leakage Forward — — 100 VGS =20V
IGSS Gate-to-Source Leakage Reverse — — -100 VGS =-20V
QgTotal Gate Charge — — 2 9 VGS =10V, ID= 8.0A
Qgs Gate-to-Source Charge — — 6.5 nC VDS =50V
Qgd Gate-to-Drain (‘Miller’) Charge — — 17
td(on) Turn-On Delay Time — — 30 VDD =50V, ID =8.0A,
trRise Time — — 7 5 RG =7.5Ω
td(off) Turn-Off Delay Time — — 40
tfFall Time — — 45
LS + LDTotal Inductance — 6.1 —
Ciss Input Capacitance — 660 VGS = 0V, VDS =25V
Coss Output Capacitance — 260 — pF f = 1.0MHz
Crss Reverse Transfer Capacitance — 5 1 —
nA
Ω
nH
ns
µA
Ω
Measured from the center of
drain pad to center of source
pad