TEST CIRCUIT
RELIABILITY SPECIFICATIONS
1. Initial
1.1 Physical Dimensions: Mil Std 883 M2016
1.2 Gross/Fine Leak: JESD22-A109, Mil Std 883 M1014
1.3 Electrical Characterization: Per Specification/Datasheet
1.4 Electrical Test: Per Specification/Datasheet
2. Mechanical
2.1 Mechanical Shock: JESD22-B104
TYPE JT 2.5X2.0 TEMPERATURE COMPENSATED CRYSTAL OSCILLATOR
VER. A
JT2553P0016.369000
16-Dec-15
2.2 Vibration Variable Frequency: JESD22-B103
2.3 Solderability: JESD22-B102-D
3.Environmental
3.1 Highly Accelerated Stress Testing: JESD22-A110/A118
3.2 Temp Cycle: JESD22-A104
3.3
Resistance to Solder Heat: J-STD-020C
3.4 Low Temperature Storage: JESD22-A108
3.5 High Temperature Storage Life / Bake: JESD22-A103
3.6 Temperature Bias and Operating Life: JESD22-A108
3.7 ESD Testing: JESD22-A114/A115/C101
3.8 Latch Up test: JESD78
SUGGESTED IR REFLOW PROFILE
*As per IPC-JEDEC J-STD-020D
E0-R-4-014 Rev. E Page 2