LTC6801 Independent Multicell Battery Stack Fault Monitor FEATURES DESCRIPTION Qualified for Automotive Applications nn Monitors Up to 12 Li-Ion Cells in Series (60V Max) nn Stackable Architecture Enables > 1000V Systems nn 1% Maximum Overvoltage Detection Level Error nn Adjustable Overvoltage and Undervoltage Detection nn Self Test Features Guarantee Accuracy nn Robust Fault Detection Using Differential Signals nn Simple Pin-Strapped Configuration Allows Battery Monitoring without a Microcontroller nn 15.5ms to Monitor All Cells in a System nn Programmable Response Time nn Two Temperature Monitor Inputs nn Low Power Idle Mode nn 36-Lead SSOP Package The LTC(R)6801 is a multicell battery monitoring IC incorporating a 12-bit ADC, a precision voltage reference, sampled comparator, and a high voltage input multiplexer. The LTC6801 can monitor as many as 12 series connected battery cells for overvoltage, undervoltage, and overtemperature conditions, indicating whether the cells are within specified parameters. The LTC6801 generates a clock output when no fault conditions exist. Differential clocking provides high noise immunity and ensures that battery stack fault conditions cannot be hidden by frozen bits or short circuit conditions. nn APPLICATIONS Redundant Battery Monitor Hybrid Electric Vehicles nn Battery Backup Systems nn Power Systems Using Multiple Battery Cells nn nn All registered trademarks and trademarks are the property of their respective owners. Each LTC6801 can operate with a battery stack voltage up to 60V and multiple LTC6801 devices can be stacked to monitor each individual cell in a long battery string. When multiple devices are stacked, the status signal of each LTC6801 can be daisy-chained, without opto-couplers or isolators, providing a single status output for the entire battery string. The LTC6801 is configurable by external pin strapping. Adjustable overvoltage and undervoltage thresholds support various Li-Ion chemistries. Selectable measurement times allow users to save power. BLOCK DIAGRAM 2 3 12 13 14 0V Detection Level Error LTC6801 1 V+ 1.0 0.6 C11 0.4 ADC MUX C2 12 CONTROL LOGIC "CELLS GOOD" C1 ENABLE INPUT ISOLATION VTEMP1 VTEMP2 15 16 VREF 17 REFERENCE CLOCK SIGNAL INPUT ENABLES THE LTC6801 STATUS OUTPUT 0.2 0 -0.2 -0.6 -0.8 -1.0 -40 -25 -10 5 20 35 50 65 80 95 110 125 TEMPERATURE (C) 22 6801 TA01a 5 TYPICAL UNITS -0.4 20 V- NEXT LOWER CELL PACK + V = 43.2V 0.8 OV = 4.116V C12 ERROR (%) NEXT HIGHER CELL PACK 6801 TA01b CLOCK SIGNAL OUTPUT INDICATES SYSTEM "OK" NTC NTC Rev. D Document Feedback For more information www.analog.com 1 LTC6801 ABSOLUTE MAXIMUM RATINGS PIN CONFIGURATION (Note 1) TOP VIEW Total Supply Voltage (V+ to V-)..................................60V Input Voltage (Relative to V-) C1............................................................. -0.3V to 9V C12............................................V+ -0.3V to V+ + 0.3V All Other Pins (Not C Inputs).................... -0.3V to 7V Voltage Between Inputs Cn to Cn-1*............................................... -0.3V to 9V C12 to C8................................................ -0.3V to 25V C8 to C4.................................................. -0.3V to 25V C4 to V-.................................................. -0.3V to 25V Operating Temperature Range LTC6801I..............................................-40C to 85C LTC6801H........................................... -40C to 125C Specified Temperature Range LTC6801I..............................................-40C to 85C LTC6801H........................................... -40C to 125C Junction Temperature............................................ 150C Storage Temperature Range................... -65C to 150C V+ 1 36 OV1 C12 2 35 OV0 C11 3 34 UV1 C10 4 33 UV0 C9 5 32 HYST C8 6 31 CC1 C7 7 30 CC0 C6 8 29 SLT C5 9 28 SLTOK C4 10 27 DC C3 11 26 EOUT C2 12 25 EOUT C1 13 24 SIN V- 14 23 SIN VTEMP1 15 22 SOUT VTEMP2 16 21 SOUT VREF 17 20 EIN VREG 18 19 EIN G PACKAGE 36-LEAD PLASTIC SSOP TJMAX = 150C, JA = 70C/W *n = 2 to 12 ORDER INFORMATION TUBE TAPE AND REEL PART MARKING* PACKAGE DESCRIPTION SPECIFIED TEMPERATURE RANGE LTC6801IG#PBF LTC6801IG#TRPBF LTC6801G 36-Lead Plastic SSOP -40C to 85C LTC6801IG#3ZZPBF LTC6801IG#3ZZTRPBF LTC6801G 36-Lead Plastic SSOP -40C to 85C LTC6801HG#PBF LTC6801HG#TRPBF LTC6801G 36-Lead Plastic SSOP -40C to 125C LTC6801HG#3ZZPBF LTC6801HG#3ZZTRPBF LTC6801G 36-Lead Plastic SSOP -40C to 125C Contact the factory for parts specified with wider operating temperature ranges. Tape and reel specifications. Some packages are available in 500 unit reels through designated sales channels with #TRMPBF suffix. Versions of the LTC6801 models are available with controlled manufacturing to support the quality and reliability requirements of automotive applications. These models are available with #WTRPBF, #WPBF or #ZZPBF suffix and are listed in ADI's ARPL. Note that these automotive models may have specifications that differ from the commercial models; therefore designers should review the Electrical Characteristics section of this data sheet carefully. Only the automotive grade products shown are available for use in automotive applications. Contact your local Analog Devices account representative for specific product ordering information and to obtain the specific Automotive Reliability reports for these models. 2 Rev. D For more information www.analog.com LTC6801 ELECTRICAL CHARACTERISTICS The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25C, V+ = 43.2V, V- = 0V unless otherwise noted. SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS DC Specifications VERR Overvoltage (OV) or Undervoltage (UV) Detection Level Error (Note 2) 2.106V VCELL 4.498V 2.106V VCELL 4.498V 1.531V VCELL < 2.106V 1.531V VCELL < 2.106V VCELL = 0.766V VCELL = 0.766V l -0.8 -1 -1 -1.3 -1.5 -2 l 10 l l 0.8 1 1 1.3 1.5 2 % % % % % % 50 V VS Supply Voltage, V+ Relative to V- VERR Specifications Met VCELL Cell Voltage Range Full Scale Voltage Range VCM Common Mode Voltage Range Measured Relative to V- VERR Specifications Met Range of Inputs Cn, n = 3 to 11 Range of Input C2 Range of Input C1 l l l 1.8 1.2 0 5*n 10 5 VTV Temperature Input Detection Level Error (Relative to VREF /2) 10V < V+ < 50V l -13 17 mV HYS UV/OV Detection Hysteresis Error (Relative to Selected Value) 10V < V+ < 50V l -25 25 % VREF Reference Pin Voltage VREF Pin Loaded With 100k to V- l 3.043 3.038 3.073 3.078 V V VREG IM IQS 3.058 3.058 V V V V Reference Voltage Temperature Coefficient 8 Reference Voltage Hysteresis 50 ppm Reference Voltage Long Term Drift 60 ppm/khr Regulator Pin Voltage 10V < VS < 50V, No Load LTC6801IG LTC6801HG 10V < VS < 50V, ILOAD = 4mA LTC6801IG LTC6801HG Regulator Pin Short Circuit Current Limit IB 5 Input Bias Current Supply Current, Monitor Mode Supply Current, Idle In/Out of Pins C1 Thru C12 When Measuring Cells During Self Test When Measuring Cells When Idle l l 4.5 4.5 5 5 l l 4.1 4.1 4.8 4.8 l 5 9 l -10 100 1 ppm/C 5.5 5.7 V V V V mA 10 A A nA Current Into the V+ Pin While Monitoring for UV and OV Conditions, FENA = 10kHz Continuous Monitoring Continuous Monitoring Monitor Every 130ms (Note 3) Monitor Every 500ms (Note 3) 600 500 110 50 750 750 200 100 1000 1100 320 160 A A A A l 23 20 23 20 30 30 30 30 42 45 42 48 A A A A l 13 15.5 19 ms l 2 40 kHz l 25 500 s l 40 60 % l l l Current into the V+ Pin When Idle, FENA = 0 LTC6801IG l LTC6801HG LTC6801 Timing Specifications TCYCLE Measurement Cycle Time FENA Valid EIN/EIN Frequency TENA Valid EIN/EIN Period = 1/ FENA DCENA Valid EIN/EIN Duty Cycle DC = CC1 = CC0 = VREG FENA = 40kHz Rev. D For more information www.analog.com 3 LTC6801 ELECTRICAL CHARACTERISTICS The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at T = 25C, V+ = 43.2V, V- = 0V unless otherwise noted. A SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS LTC6801 Single Ended Digital I/O Specifications (SLT, SLTOK Pins) VIH Digital Input Voltage High SLT Pin l VIL Digital Input Voltage Low SLT Pin l 2 0.5 V V VODL Digital Output Voltage Low, Open Drain SLT Pin, 10k to VREG l 0.3 V VOH Digital Output Voltage High SLTOK Pin, 10k to V- l VOL Digital Output Voltage Low SLTOK Pin, 10k to VREG l IPU-ST Pull-Up Current SLT Pin l 2.5 l 1.7 VREG - 0.3 V 5 0.3 V 10 A LTC6801 Differential Digital Input Specifications (SIN/SIN, EIN/EIN Pins) (See Figure 1) VIDH Minimum Differential Input Voltage High Differential Voltage Applied Between SIN and SIN or EIN and EIN V VIDL Minimum Differential Input Voltage Low -1.7 V VIL Valid Input Voltage Low Low Side of Differential Signal, Ref. to V- l 0 1.2 V VIH Valid Input Voltage High High Side of Differential Signal, Ref. to V- l 2.5 6 V VDHYS Differential Input Hysteresis VOPEN Open Circuit Voltage l 2 2.5 RINCM Input Resistance, Common Mode l 100 150 k RINDIFF Input Resistance, Differential l 200 300 k l 1 Between SIN to SIN, EIN to EIN V 3 V LTC6801 Differential Digital Output Specifications (SOUT/SOUT, EOUT/EOUT Pins) VODH Digital Output Voltage High Output Pins Loaded With 100k to V- l VREG - 0.4 VODL Digital Output Voltage Low Output Pins Loaded With 100k to VREG l V 0.4 V LTC6801 Three-Level Digital Input Specifications (OV0, OV1, UV0, UV1, HYST, DC, CC0 and CC1 Pins) V3IH Three-Level Digital Input Voltage High l VREG - 0.3 V3IM Three-Level Digital Input Voltage Mid l VREF - 0.3 V V3IL Three-Level Digital Input Voltage Low 0.3 V IPU Pull-Up Current Pins DC, CC0, CC1, UV0 and UV1 l 0.5 1 2 A IPD Pull-Down Current Pins HYST, OV0 and OV1 l 0.5 1 2 A VREF + 0.3 l Note 1: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to any Absolute Maximum Rating condition for extended periods may affect device reliability and lifetime. V Note 2: VCELL refers to the voltage applied across the following pin combinations: Cn to Cn - 1 for n = 2 to 12, C1 to V-. Note 3: Guaranteed by continuous monitoring supply current specifications, not subject to test. EIN VIDH (VALID HIGH WHEN EIN - EIN VIDH) MAX, VIH MAX, VIL V- = 0V TENA MIN, VIH EIN VIDL (VALID LOW WHEN EIN - EIN VIDL) 6801 F01 Figure 1. Differential Input Specifications 4 Rev. D For more information www.analog.com LTC6801 TYPICAL PERFORMANCE CHARACTERISTICS Supply Current, Monitor Mode Supply Current, Monitor Mode 250 800 DC PIN TIED TO VREG 780 fENA = 10kHz 85C 760 Supply Current, Idle Mode 40 CC1 = CC0 = VREG fENA = 10kHz 35 200 700 680 DC PIN = VREF 150 100 -40C 660 DC PIN = V- 50 640 ISUPPLY (A) 25C ISUPPLY (A) 620 600 10 20 30 V+ (V) 40 50 0 60 10 20 30 V+ (V) 40 50 250 V+ = 60V DC PIN = VREF 150 100 DC PIN = V- 50 6801 G04 0.8 UV = 2.106V 0.4 ERROR (%) ERROR (%) 0.6 5 TYPICAL UNITS 60 V+ = 35V V+ = 10V 20 15 5 0 -40 -25 -10 5 20 35 50 65 80 95 110 125 TEMPERATURE (C) 6801 G06 Supply Current 800 V+ = 43.2V V+ = 43.2V 780 CONTINUOUS MEAS MODE 0.8 OV = 4.116V -0.2 50 V+ = 60V 25 0V Detection Level Error 1.0 V+ = 43.2V 0 40 6801 G05 UV Detection Level Error 0.2 V+ (V) 10 V+ = 60V V+ = 35V V+ = 10V 0 -40 -25 -10 5 20 35 50 65 80 95 110 125 TEMPERATURE (C) 600 -40 -25 -10 5 20 35 50 65 80 95 110 125 TEMPERATURE (C) 0.4 30 Supply Current, Idle Mode 35 620 0.6 20 40 30 V+ = 10V 640 1.0 10 6801 G03 ISUPPLY (A) ISUPPLY (A) ISUPPLY (A) V+ = 35V 680 660 0 60 CC1 = CC0 = VREG fENA = 10kHz 740 700 15 5 200 720 -40C 20 Supply Current, Monitor Mode Supply Current, Monitor Mode 800 760 25 6801 G02 6801 G01 DC PIN TIED TO VREG 780 fENA = 10kHz 85C 10 85C 25C -40C 760 5 TYPICAL UNITS 0.2 0 -0.2 720 680 -0.4 660 -0.6 -0.6 640 -0.8 -0.8 620 -1.0 -40 -25 -10 5 20 35 50 65 80 95 110 125 TEMPERATURE (C) -1.0 -40 -25 -10 5 20 35 50 65 80 95 110 125 TEMPERATURE (C) 600 6801 G08 25C 700 -0.4 6801 G07 85C 740 ISUPPLY (A) ISUPPLY (A) 740 720 25C 30 -40C 1 10 fENA (kHz) 100 6801 G09 Rev. D For more information www.analog.com 5 LTC6801 TYPICAL PERFORMANCE CHARACTERISTICS 3.0 25C 85C -40C 2.0 1.5 1.0 0.5 0 0 8.0 CONTINUOUS MEAS MODE CC1 = CC0 = VREG 16.5 16.0 V+ = 10V 15.5 V+ = 60V 15.0 14.5 10 C1 0 C2 TO C11 VTEMP1, VTEMP2 -10 -40 -25 -10 5 20 35 50 65 80 95 110 125 TEMPERATURE (C) 3.070 UV THRESHOLD = 2.106V OV THRESHOLD = 4.116V 10 HYST = V REG 6 4 UNDERVOLTAGE DETECTED 2 3.065 VREF (V) VREF (V) 3.065 OVERVOLTAGE DETECTED 0 1 2 3 CELL VOLTAGE (V) 4 5 6 0 50 100 150 200 ILOAD (A) 300 6801 G20 85C 10 20 30 V+ (V) 40 50 60 6801 G15 5.5 NO LOAD VREG Line Regulation IDLE MODE 5.4 NO LOAD 85C 5.3 5 TYPICAL UNITS 5.2 3.060 25C 5.1 5.0 -40C 4.9 4.8 4.7 25C 250 3.050 VREF Output Voltage 3.055 85C -40C 3.055 -40C 3.050 25C 3.060 6801 G14 3.070 3.055 NO LOAD 0 -2 VREF Load Regulation 3.060 VREF Line Regulation 3.065 8 6801 G13 3.070 5.0 6801 G12 VREF (V) C PIN BIAS CURRENT (nA) C12 SOUT CLOCK FREQUENCY (kHz) CELL INPUT = 3.6V 20 5.5 4.0 -40 -25 -10 5 20 35 50 65 80 95 110 125 TEMPERATURE (C) 12 30 6.0 Cell Voltage Measurement Hysteresis Cell Input Bias Current, Idle Mode 40 6.5 6801 G11 6801 G10 50 7.0 4.5 14.0 -40 -25 -10 5 20 35 50 65 80 95 110 125 TEMPERATURE (C) 2 4 6 8 10 EXTERNAL SERIES RESISTANCE, RS (k) CELL INPUT = 3.6V 7.5 VREG (V) 2.5 17.0 C PIN BIAS CURRENT (A) RS IN SERIES WITH Cn AND Cn-1 - 3.5 10nF FROM Cn, Cn-1 TO V Cell Input Bias Current when Measuring Measurement Cycle Time MEASUREMENT CYCLE TIME (ms) ERROR RELATIVE TO RS = 0 (%) 4.0 UV/OV Detection Level Error 4.6 3.050 -40 -25 -10 5 20 35 50 65 80 95 110 125 TEMPERATURE (C) 6801 G16 4.5 10 20 30 V+ (V) 40 50 60 6801 G17 Rev. D For more information www.analog.com LTC6801 TYPICAL PERFORMANCE CHARACTERISTICS 5.5 VREG Line Regulation 5.5 IDLE MODE 5.4 4mA LOAD TO V- VREG Load Regulation 5.5 IDLE MODE 5.4 5.3 5.2 5.0 85C 4.9 4.8 25C 4.7 -40C VREG (V) 5.0 5.1 VREG (V) VREG (V) IDLE MODE 5.3 5.2 4.5 4.6 4.5 VREG Output Voltage 10 20 30 V+ (V) 40 50 4.0 60 0 6801 G18 16 100k LOAD TO V- 4.8 V+ = 60V V+ = 10V 4.6 4.7 4 6 ILOAD (mA) 8 6801 G19 6801 G21 UV/OV Detection Level Thermal Hysteresis 20 TA = 85C TO 25C 18 NUMBER OF UNITS NUMBER OF UNITS 10 8 6 4 20s/DIV 6801 G22 14 12 10 8 6 4 2 0 -100 TA = -40C TO 25C 16 12 SOUT V+ = 60V V+ = 35V V+ = 10V 4.5 -40 -25 -10 5 20 35 50 65 80 95 110 125 TEMPERATURE (C) 10 14 2V/DIV 4mA LOAD 4.9 UV/OV Detection Level Thermal Hysteresis Status Output Operating at 10kHz SOUT 5.0 85C 25C -40C 2 NO LOAD 5.1 2 -50 0 50 100 150 CHANGE IN DETECTION LEVEL (ppm) 200 6801 G23 0 -100 -50 0 50 100 150 CHANGE IN DETECTION LEVEL (ppm) 200 6801 G24 Rev. D For more information www.analog.com 7 LTC6801 PIN FUNCTIONS V+ (Pin 1): Supply Voltage. Tied to the most positive potential in the battery stack. For example, the same potential as C12 when measuring a stack of 12 cells, or the same potential as C7 when measuring a stack of 7 cells. C12, C11, ... C1 (Pin 2 to Pin 13): Cell Voltage Inputs. Up to 12 cells can be monitored. The lowest potential is tied to V-. The next lowest potential is tied to C1 and so forth. Due to internal overvoltage protection, each C input must be tied to a potential equal to or greater than the next lower numbered C input. See the figures in the Applications Information section for more details on connecting batteries to the LTC6801. See Electrical Characteristics table for voltage range and input bias current requirements. V- (Pin 14): Tied to the most negative cell potential (bottom of monitored cell stack). VTEMP1, VTEMP2 (Pin 15, Pin 16): Temperature Sensor Inputs. The ADC will measure the voltages on VTEMP1 and VTEMP2 relative to V-. The ADC measurements are referenced to the VREF pin voltage. Therefore a simple thermistor and resistor combination connected to the VREF pin can be used to monitor temperature. These pins have a fixed undervoltage threshold equal to one half VREF. A filtering capacitor to V- is recommended. Temperature sensor input pins may be tied to VREF to disable. VREF (Pin 17): Reference Output, Nominally 3.058V. Re-quires a 1F bypass capacitor to V-. The VREF pin can drive a 100k resistive load connected to V-. VREF must be buffered with an LT6003 amplifier, or similar device to drive heavier loads. VREF becomes high impedance when the IC is disabled or idle between monitoring events. VREG (Pin 18): Regulator Output, Nominally 5V. Requires a 1F bypass capacitor to V-. The VREG pin is capable of supplying up to 4mA to an external load and is continually enabled. EIN, EIN (Pin 19, Pin 20): Differential Enable Input. A clock signal greater than 2kHz will enable the LTC6801. 8 For operation with a single-ended enable signal (up to 10kHz), drive EIN and connect a 1nF capacitor from EIN to V-. SOUT, SOUT (Pin 21, Pin 22): Differential Status Output. Swings V- to VREG. This output will toggle at the same frequency as EIN/EIN when a valid signal is detected at SIN/ SIN and the battery stack being monitored is within specified parameters, otherwise SOUT is low and SOUT high. SIN, SIN (Pin 23, Pin 24): Differential status input from the IC above. To indicate that the stack is good, SIN must be the same frequency and phase as EIN. See applications circuits for interfacing SIN to the SOUT above. EOUT, EOUT (Pin 25, Pin 26): A Buffered Version of EIN/ EIN. Swings V- to VREG. Must be capacitively coupled to the EIN/EIN inputs of the next higher voltage LTC6801 in a stack, or looped to SIN/SIN of the same chip (pins 23, 24). DC (Pin 27): Duty Cycle Three-Level Input. This pin may be tied to VREG, VREF or V-. The DC pin selects the duty cycle of the monitoring function and has an internal pull-up to VREG. See Table 3. SLTOK (Pin 28): Self Test Logic Output. SLTOK is held HIGH (VREG voltage) upon reset or successful completion of a self test cycle. A LOW output level (V- voltage) indicates the last self test cycle failed. SLT (Pin 29): Self Test Open Collector Input/Output. SLT initiates a self test cycle when it is pulled low externally. When a high to low transition is detected, the next scheduled measurement cycle will be a self test cycle. SLT indicates a self test cycle is in progress when pulled low internally. A self test is automatically initiated after 1024 measurement cycles. This pin has an internal pull-up to VREG. CC0, CC1 (Pin 30, Pin 31): Cell Count Three-Level Inputs. These pins may be tied to VREG, VREF or V-. CC1 and CC0 select the number of cells attached to the device and each pin has an internal pull-up to VREG. See Table 5. Rev. D For more information www.analog.com LTC6801 PIN FUNCTIONS HYST (Pin 32): Hysteresis Three-Level Input. This pin may be tied to VREG, VREF or V-. HYST selects the amount of hysteresis applied to the undervoltage and overvoltage threshold settings and has an internal pull-down to V-. See Table 4. UV0, UV1 (Pin 33, Pin 34): Undervoltage Three-Level Inputs. These pins may be tied to VREG, VREF or V-. UV1 and UV0 select the undervoltage threshold and each pin has an internal pullup to VREG. See Table 2. OV0, OV1 (Pin 35, Pin 36): Overvoltage Three-Level Inputs. These pins may be tied to VREG, VREF or V-. OV1 and OV0 select the overvoltage threshold and each pin has an internal pulldown to V-. See Table 1. Table 3. Duty Cycle Select DC NOMINAL CYCLE TIME* VREG 15.5ms VREF Approximately 130ms V- Approximately 500ms *Cycle time based on LTC6801 measuring 12 cells and 2 temperatures. Table 4. Hysteresis Select HYST UV HYSTERESIS* OV HYSTERESIS VREG 500mV 200mV VREF 250mV 100mV V- 0mV 0mV *UV hysteresis is disabled when the undervoltage threshold is set to 0.766V. Table 1. Overvoltage Inputs Table 5. Cell Count Select OV1 OV0 OVERVOLTAGE THRESHOLD (V) VREG VREG 4.498 CC1 CC0 CELL COUNT VREG VREF 4.403 VREG VREG 12 VREG V- 4.307 VREG VREF 11 VREF VREG 4.211 VREG V- 10 VREG 9 VREF VREF 4.116 VREF VREF V- 4.020 VREF VREF 8 V- 7 VREG 3.924 VREF V- V- VREF 3.828 V- VREG 6 V- V- 3.733 V- VREF 5 V- V- 4 Table 2. Undervoltage Inputs UV1 UV0 UNDERVOLTAGE THRESHOLD (V) VREG VREG 2.871 VREG VREF 2.680 VREG V- 2.489 VREF VREG 2.297 VREF VREF 2.106 VREF V- 1.914 V- VREG 1.723 V- VREF 1.531 V- V- 0.766 Rev. D For more information www.analog.com 9 LTC6801 BLOCK DIAGRAM The LTC6801 measures between 4 and 12 cell voltages and 2 temperature inputs. If all measurements are within an acceptable window, the LTC6801 will produce a differential clock output signal (SOUT, SOUT). If any of the channels exceed user set upper and lower thresholds, a logic low signal is produced at SOUT. V+ VREG REGULATOR C12 HYST C11 CC1 C10 12 ADC C9 C8 + CC0 DC - DIGITAL COMPARATORS C7 C6 - REFERENCE MUX C5 C4 C3 SLT SLTOK + - + SELF TEST REFERENCE (REF2) UV/OV FLAGS AND CONTROL LOGIC EIN EIN EOUT EOUT C2 C1 "GOOD" V- + - SIN SIN SOUT DECODER SOUT VTEMP1 VTEMP2 VREF OV0 OV1 UV0 UV1 6801 BD 10 Rev. D For more information www.analog.com LTC6801 BLOCK DIAGRAM OF ENABLE IN/OUT AND STATUS IN/OUT EOUT EOUT VREG 300k THE FREQUENCY MATCH DETECT OUTPUT GOES HIGH WHEN SIN AND EIN ARE THE SAME FREQUENCY FREQUENCY MATCH DETECT + - VREG SIN 300k 300k SIN 300k THE SIGNAL IS HIGH WHEN ALL READINGS ARE "GOOD" SOUT SOUT SOUT IS ACTIVE WHEN 1) EIN IS ACTIVE 2) SIN AND EIN ARE THE SAME FREQUENCY 3) ALL READINGS ARE "GOOD" VREG 300k + CLK DETECT - THE CLK DETECT OUTPUT GOES HIGH WHEN EIN IS 2kHz TO 40kHz VREG EIN 300k 300k EIN 300k 6801 BDa Rev. D For more information www.analog.com 11 LTC6801 APPLICATIONS INFORMATION OVERVIEW INDEPENDENT OPERATION The LTC6801 is designed as an easy to implement, lowcost battery stack monitor that provides a simple indication of correct battery stack operation without requiring a microcontroller interface. For battery stack monitoring with cell voltage read back and discharge circuitry, refer to the LTC6802 battery stack monitor data sheet. Figure 3 shows how three groups of 12 cells can be monitored independently. The LTC6801 contains a 12-bit ADC, a precision voltage reference, sampled comparator, high voltage multiplexer and timer/sequencer. During normal operation, the sequencer multiplexes the ADC inputs between each of the channel input pins in turn, performing a single comparison to the undervoltage and overvoltage thresholds. The VTEMP inputs are also monitored for an undervoltage at a fixed threshold of VREF /2. REGULATED OUTPUTS A regulated voltage is provided at the VREG pin, biased from the battery stack. The VREG pin can supply up to 4mA at 5V and may be used to power small external circuits. The regulated output remains at 5V continually, as long as the total stack voltage is between 10V and 50V. A low current, precision reference voltage is provided at the VREF pin, which can drive loads of greater than 100k. The VREF output is high impedance when the LTC6801 is idle. The presence of a status output clock indicates the system is "OK". Because the status output is dynamic, it cannot get stuck in the "OK" state. Both the VREG and VREF pins must be bypassed to V- with a 1F capacitor. STACKED OPERATION The LTC6801 thresholds are controlled by the UV1, UV0, OV1 and OV0 pins. These pins are designed to be tied directly to VREG, VREF or V- in order to set the comparison thresholds for all channels simultaneously. The pins are not designed to be variable. In particular, changes made to the pins while the chip is not in idle mode may result in unpredictable behavior. See Table 1 and Table 2 for setting and threshold information. Each LTC6801 monitors a group of up to 12 series connected cells. Groups of cells can be connected in series or parallel to form a large battery pack. The LTC6801s can be daisy chained with simple capacitive or transformer coupling. This allows every cell in a large battery pack to be monitored with a single signal. Figure 2 illustrates monitoring of 36 series connected cells. CONTROL INPUTS To cancel systematic duty cycle distortion through the clock buffers, it is recommended that the clock lines are cross-coupled (EOUT goes to EIN etc.) as they route up and down the stack as shown in Figure 2. 12 Rev. D For more information www.analog.com LTC6801 APPLICATIONS INFORMATION ENABLE INPUTS In order to support stacked operation, the LTC6801 is enabled through a differential signal chain encompassing the EIN/EIN, EOUT/EOUT, and SIN/SIN pins. The LTC6801 will be enabled if a differential square wave with a frequency between 2kHz and 40kHz is applied at EIN/EIN. Otherwise, the LTC6801 will default to a low power idle mode. If the differential signal at SIN/SIN is not equal in frequency to the differential signal output at EOUT/EOUT, the LTC6801 will be enabled but SOUT will be held at 0V and SOUT will be held at VREG. For the simplest operation in a single chip configuration, EOUT should be connected directly to SIN and EOUT should be connected directly to SIN, and a square wave with a frequency between 2kHz and 40kHz should be applied differentially to EIN and EIN. For enable clock frequencies up to 10kHz, a single-ended square wave with a 5V swing may be used at EIN while a 1nF capacitor is connected from EIN to V-. STATUS OUTPUT If the chip is properly enabled (EIN/EIN, SIN/SIN are the same frequency), all cells are within the undervoltage and overvoltage thresholds, and the voltage at VTEMP1 and VTEMP2 is over one half VREF, the differential output at SOUT/SOUT will toggle at the same frequency and in phase with the signal at EIN/EIN. Otherwise, SOUT will be low and SOUT will be high. The maximum delay between when a bad cell voltage occurs and when it is detected depends on the measurement duty cycle setting. The SOUT clock turns on or off at the end of each measurement cycle. Figure 4 shows the maximum detection delay in continuous monitor mode (DC pin tied to VREG). Note: If an internal self test occurs immediately after the fault, the maximum detection delay will be increased by an additional measurement cycle time. FAULT PROTECTION Overview Care should always be taken when using high energy sources such as batteries. There are countless ways that systems can be [mis-]configured during the assembly and service procedures that can impact a battery's long term performance. Table 6 shows various situations to consider when planning protection circuitry. Battery Interconnection Integrity Please note: The last condition shown in the FMEA table could cause catastrophic IC failures. In this case, the battery string integrity is lost within a cell group monitored by an LTC6801. This condition could place excessive stress on certain cell input signal clamp-diodes and probably lead to IC failure. If this scenario seems at all likely in a particular application, series fuses and parallel Schottky diodes should be connected as shown in Figure 5 to limit Rev. D For more information www.analog.com 13 LTC6801 APPLICATIONS INFORMATION TOP OF STACK TOP OF STACK V+ C12 C11 C10 C9 C8 C7 C6 C5 C4 C3 C2 C1 V- LTC6801 SIN SOUT SOUT VREF VREG C12 C11 C10 C9 C8 C7 C6 C5 C4 C3 C2 C1 V- LTC6801 C12 C11 C10 C9 C8 C7 C6 C5 C4 C3 C2 C1 V- EIN EIN VREF VREG OV1 V+ SIN LTC6801 VREF VREG OV1 V+ C12 C11 C10 C9 C8 C7 C6 C5 C4 C3 C2 C1 V- OV0 UV1 UV0 HYST CC1 CC0 SLT SLTOK DC EOUT EOUT SIN SIN SOUT VTEMP2 SOUT CLOCK OUT WHEN ALL CELLS GOOD USER SUPPLIED CLOCK IN EIN EIN 6801 F02 EIN EIN LTC6801 OV1 OV0 UV1 UV0 HYST CC1 CC0 SLT SLTOK DC EOUT EOUT SIN SIN SOUT SOUT EIN EIN LTC6801 OV1 OV0 UV1 UV0 HYST CC1 CC0 SLT SLTOK DC EOUT EOUT SIN ALL CLOCKS OUT WHEN ALL CELLS GOOD SIN SOUT VTEMP2 SOUT USER SUPPLIED CLOCK IN EIN EIN 6801 F03 BOTTOM OF STACK BOTTOM OF STACK Figure 2. Serial Connection of Status Lines for Multiple LTC6801s on the Same PCB (Simplified Schematic, Not All Components Shown) 14 SIN SOUT SOUT VTEMP1 VREF VREG PROGRAMMED CONDITIONS: CONTINUOUS MONITOR MODE OV = 4.116V UV = 2.106V HYST = 250mV (UV), 100mV (OV) CC = 12 OV1 OV0 UV1 UV0 HYST CC1 CC0 SLT SLTOK DC EOUT EOUT SIN VTEMP1 VTEMP2 EIN EIN VTEMP1 VREF VREG C12 C11 C10 C9 C8 C7 C6 C5 C4 C3 C2 C1 V- SOUT SOUT VREF VREG LTC6801 VTEMP1 VTEMP2 OV0 UV1 UV0 HYST CC1 CC0 SLT SLTOK DC EOUT EOUT SIN VTEMP1 VTEMP2 V+ C12 C11 C10 C9 C8 C7 C6 C5 C4 C3 C2 C1 V- OV0 UV1 UV0 HYST CC1 CC0 SLT SLTOK DC EOUT EOUT SIN VTEMP1 VTEMP2 V+ V+ OV1 Figure 3. Independent Status Lines for Multiple LTC6801s on the Same PCB (Simplified Schematic, Not All Components Shown) Rev. D For more information www.analog.com EXAMPLES SOUT C2 C3 C4 C6 C7 C8 C9 C10 WORST CASE ERROR DETECTION DELAY ~29.7ms C5 For more information www.analog.com C12 T2 SOUT REMAINS ACTIVE T1 (SINCE NOTHING ABNORMAL HAS BEEN DETECTED YET) C11 C1 C2 C4 LTC6801 READS A BAD VOLTAGE ON CELL 1 C3 SOUT STATUS UPDATED C5 C6 C7 Figure 4. Cell UV/OV Detection Delay in Continuous Monitor Mode NOTE: SOUT IS NOT TO SCALE SEE ELECTRICAL TABLE FOR MIN/MAX SPECIFICATIONS CELL 1 GOES BAD IMMEDIATELY AFTER IT IS READ ALL CELLS GOOD C1 COMPLETE MEASUREMENT CYCLE 15.4 ms (~1.1ms PER CELL) C8 C9 C10 C11 C12 T1 SOUT STATUS UPDATED T2 C2 C3 6801 F04 SOUT STOPS AT END OF MEASUREMENT CYCLE C1 LTC6801 APPLICATIONS INFORMATION Rev. D 15 LTC6801 APPLICATIONS INFORMATION Table 6. Failure Mechanism Effect Analysis (FMEA) SCENARIO EFFECT DESIGN MITIGATION Cell input open-circuit (random) Power-up sequence at IC inputs Clamp diodes at each pin to V+ & V- (within IC) provide alternate PowerPath. Cell input open-circuit (random) Differential input voltage overstress Zener diodes across each cell voltage input pair (within IC) limit stress. Top cell input connection loss (V+) Power will come from highest connected cell input Clamp diodes at each pin to V+ and V- (within IC) provide alternate PowerPath. Error condition will be indicated by all upstream and downstream units (no clock on SOUT/ SOUT). Bottom cell input connection loss (V-) Power will come from lowest connected cell input Clamp diodes at each pin to V+ and V- (within IC) provide alternate PowerPath. Error condition will be indicated by all upstream and downstream units (no clock on SOUT/ SOUT). Power input disconnection (amongst stacked units) Loss of supply connections Clamp diodes at each pin to V+ and V- (within IC) provide alternate PowerPath. Error condition will be indicated by all upstream and downstream units (no clock on SOUT/ SOUT). Status link disconnection (between stacked units) Break of "daisy chain" communication (no stress to ICs) Daisy chain will be broken and error condition will be indicated by all upstream and downstream units (no clock on SOUT/ SOUT). Short between any two configuration inputs Power supplies connected to pins will be shorted If VREF or VREG is shorted to V-, supply will be removed from internal circuitry and error condition will be indicated by all upstream and downstream units (no clock on SOUT/ SOUT). If VREF is shorted to VREG, a self test error will be flagged. Open connection on configuration input Control input will be pulled towards positive or negative potential depending on pin Control input will be pulled to a more stringent condition (larger number of channels, higher UV threshold, lower OV threshold, shorter duty cycle, etc. ensuring either more stringent monitoring or error condition will be indicated by all upstream and downstream units (no clock on SOUT/ SOUT). Cell-pack integrity, break between stacked units Daisy-chain voltage reversal up to full stack potential Full stack potential may appear across status/ enable isolation devices, but will not be seen by the IC. isolation capacitors should therefore be rated to withstand the full stack potential. Cell-pack integrity, break within stacked unit Cell input reverse overstress Add battery tap fuses and Schottky diodes in parallel with the cell inputs to limit stress on IC. Diode and connections must handle current sufficient to open fuse 16 Rev. D For more information www.analog.com LTC6801 APPLICATIONS INFORMATION V+ Cn PROTECT AGAINST BREAKS HERE LTC6801 C12 EOUT Cn - 1 C11 6801 F05 Figure 5. Using Fuses and Diodes for Cell Input Protection (One Cell Connection Shown) stress on the IC inputs. The diodes used in this situation need current ratings sufficient to open the protective fuse in the battery tap signal. EOUT SIN C10 ZCLAMP SIN SOUT C9 SOUT EIN C8 EIN Internal Protection Structure The LTC6801 incorporates a number of protective structures, including parasitic diodes, Zener-like overvoltage suppressors, and other internal features that provide protection against ESD and certain overstress conditions that could arise in practice. Figure 6 shows a simplified internal schematic that indicates the significant protective structures and their connectivity. The various diodes indicate the approximate current versus voltage characteristics that are intrinsic to the part, which is useful in analyzing responses to certain external stresses, such as during a hot-start scenario. SELF TEST CIRCUITRY The LTC6801 has internal circuitry that performs a periodic self test of all measurement functions. The LTC6801 self test circuitry is intended to prevent undetectable failure modes. Accuracy and functionality of the voltage reference and comparator are verified, as well as functionality of the high voltage multiplexer and ADC decimation VTEMP1 C7 VTEMP2 C6 ZCLAMP VREF VREG C5 OV1 OV0 C4 UV1 UV0 C3 HYST CC1 C2 ZCLAMP CC0 SLT C1 SLTOK V- DC 6801 F06 Figure 6. Internal Protection Structures Rev. D For more information www.analog.com 17 LTC6801 APPLICATIONS INFORMATION filter. Additionally, open connections on the cell input pins C1 to C11 are detected (Open connections on V- or C12/ V+ will cause an undervoltage failure during the normal measurement cycle). Self Test Pins The SLT pin is used to initiate a self test. It is configured as an open collector input/output. The pin should be normally tied to VREG with a resistor greater than or equal to 100k or floated. The pin may be pulled low at any time to initiate a self test cycle. The device will automatically initiate a self test if SLT has not been externally activated for 1024 measurement cycles, and pull down the SLT pin internally to indicate that it is in self test mode. The SLTOK pin is a simple logic output. If the previous self test failed the output is held low, otherwise the output will be high. The SLTOK pin is high upon power-up. The SLTOK output can be connected to a microcontroller through an isolation path. The LTC6801 status output will remain active while the SLTOK pin is low. The LTC6801 will continue to monitor cells if the self test fails. If the next self test passes, the SLTOK output returns high. Reference and Comparator Verification A secondary internal bandgap voltage reference (REF2) is included in the LTC6801 to aid in verification of the reference and comparator. During the self test cycle, the comparator and main reference are used to measure the REF2 voltage. To verify the comparator functionality, the upper and lower thresholds are first set in a close window around 18 the expected REF2 voltage and the comparator output is verified. Then the upper threshold is set below the REF2 voltage and the comparator output is verified again. Lastly, the lower threshold is set above the REF2 voltage and the comparator output is verified a third time. The self test guarantees that VREF is within 5% of the specified nominal value. Also, this test guarantees the analog portion of the ADC is working. High Voltage Multiplexer Verification The most dangerous failure mode of the high voltage multiplexer would be a stuck bit condition in the address decoder. Such a fault would cause some channels to be measured repeatedly while other channels are skipped. A skipped channel could mean a bad cell reading is not detectable. Other multiplexer failures, like the simultaneous selection of multiple channels, or shorts in the signal path, would result in an undervoltage or overvoltage condition on at least one of the channels. The LTC6801 incorporates circuitry to ensure that all requested channels are measured during each measurement cycle and none are skipped. If a channel is skipped, an error is flagged during the self test cycle. ADC Decimation Filter Verification The ADC decimation filter test verifies that the digital circuits in the ADC are working, i.e. there are no stuck bits in the ADC output register. During each self test cycle, the LTC6801 feeds two test waveforms into the ADC. The internally generated waveforms were designed to generate complementary zebra patterns (alternating 0's and 1's) at the ADC output. If either of the waveforms Rev. D For more information www.analog.com LTC6801 APPLICATIONS INFORMATION generates an incorrect output value, an error is flagged during the self test cycle. Open Cell Connection Detection The open connection detection algorithm ensures that an open circuit is not misinterpreted as a valid cell reading. In the absence of external noise filtering, the input resistance of the ADC will cause open wires to produce a near zero reading. This reading will cause an undervoltage failure during the normal measurement cycle. Some applications may include external noise filtering to improve the quality of the voltage comparisons. When an RC network is used to filter noise, an open wire may not produce a zero reading because the comparator input resistance is too large to discharge the capacitors on the input pin. Charge may build up on the open pin during successive measurement cycles to the extent that it could indicate a valid cell voltage reading. During each self test cycle, the LTC6801 will sink 100A to V- from each side of the cell being measured. The undervoltage threshold is not checked during the self test because the 100A pull-down current would cause false failures in some cases. If an input is open, this current will discharge any filtering capacitors and cause the input to C12 C11 C10 C9 C8 C7 C6 C5 C4 CSBO CSBI SDOI SDO SCKO SDI + V SCKI C12 VMODE S12 GPIO2 C11 GPIO1 S11 WDTB C10 MMB LTC6802-1 TOS S10 C9 VREG S9 VREF C8 VTEMP2 S8 VTEMP1 C7 NC S7 V- C6 S1 S6 C1 C5 S2 S5 C2 C4 S3 S4 C3 IN float down to approximately 0.7V below the next lower cell input. In most cases, the cell voltage of the cell above the open input will exceed the overvoltage threshold and flag a self test error. During the normal measurement cycle, the LTC6801 will sink 1A to V- from each side of the cell being measured. If the cell voltages are low enough that an open wire is not detected as an overvoltage during self test, this current will cause the cell input to settle to a voltage low enough to trigger an undervoltage condition during the normal measurement cycle. Note, an open cell connection may not be detected when the UV = 0.766V setting is used. For all other UV settings, an open cell connection will result in either a self test error or no SOUT clock. Using The LTC6801 with Other Battery Monitors When used in combination with an LTC6802-1, it is possible to check the LTC6801 self test result via the LTC6802-1 and its isolated SPI. As shown in Figure 7, the SLTOK output is tied to the GPIO2 pin on the LTC6802-1. SLTOK will remain high as long as it is passing the self test. A self test will occur automatically every 1024 measurement cycles (17 seconds to 9 minutes, depending on measurement duty cycle). A self test can be initiated by a falling edge on SLT, via the LTC6802-1 GPIO1 line. A self test will start after the current measurement cycle CMPD6263 OUT 100k 1M 1F C12 C11 C10 C9 C8 C7 C6 C5 C4 C3 C2 C1 VREF 1F OV1 V+ OV0 C12 UV1 C11 UV0 C10 HYST C9 CC1 C8 LTC6801 CC0 C7 SLT C6 SLTOK C5 DC C4 EOUT C3 EOUT C2 SIN C1 SIN V- SOUT VTEMP1 SOUT VTEMP2 EIN VREF EIN VREG 6801 F07 C3 C2 C1 Figure 7. Interconnection of an LTC6802-1 and LTC6801 for Self Test. Rev. D For more information www.analog.com 19 LTC6801 APPLICATIONS INFORMATION is complete, and the SLTOK status will be valid when the self test completes. The worst case delay before SLTOK is valid in continuous monitor mode is approximately 15ms for the current cycle to complete plus 17ms for the self test to complete. Series resistors of 1k may be inserted in the input paths without introducing measurement error. Shunt capacitors may be added from the cell inputs to V-, creating RC filtering as shown in Figure 8. The combination of 1k and 10nF is recommended as a robust, cost effective noise filter. The 6802-1 can measure the LTC6801 reference, which will independently test the analog circuitry of the LTC6802. CELL-VOLTAGE FILTERING The LTC6801 employs a sampling system to perform its analog-to-digital conversions and provides a conversion result that is essentially an average over the 0.5ms conversion window. If there is significant noise at frequencies near 500kHz there may be aliasing in the delta-sigma modulator. A lowpass filter with 30dB attenuation at 500kHz may be beneficial. Since the delta-sigma integration bandwidth is about 1kHz, the filter corner need not be lower than this to assure accurate conversions. 1k 500k NTC B = 4567 500k NTC B = 4567 100k 1F 1F 100k 6801 F09 Figure 9. Driving Thermistors Directly from VREF. Two Independent Probes With a +60C Trip Point C3 1k 10nF 1k 10nF C2 10k NTC B = 3380 10k NTC B = 3380 0.5F 0.5F C1 2.2k 2.2k V+ OV1 C12 OV0 C11 UV1 C10 UV0 C9 HYST C8 CC1 LTC6801 C7 CC0 C6 SLT C5 SLTOK C4 DC C3 EOUT C2 EOUT C1 SIN - V SIN VTEMP1 SOUT VTEMP2 SOUT VREF EIN VREG EIN 6801 F10 V- + 10nF V+ OV1 C12 OV0 C11 UV1 C10 UV0 C9 HYST C8 CC1 LTC6801 C7 CC0 C6 SLT C5 SLTOK C4 DC C3 EOUT C2 EOUT C1 SIN V- SIN VTEMP1 SOUT VTEMP2 SOUT VREF EIN VREG EIN 6801 F08 LT6003 Figure 8. Adding RC Filtering to the Cell inputs - Figure 10. Buffering VREF for Higher-Current Sensors. Two Independent Probes With a +70C Trip Point 20 Rev. D For more information www.analog.com LTC6801 APPLICATIONS INFORMATION MEASURING VARIOUS CELL COUNTS The LTC6801 is designed to measure up to 12 cells depending on the state of the CC pins (See Table 5). When using an LTC6801 configured for measuring less than 12 cells, for instance choosing to measure 8 cells by tying both CC1 and CC0 to the VREF pin, the highest cell potential (in this case C8) must be connected to the V+ pin for proper operation. Unused cell connection pins (in this case C9 to C12) may be left floating or may also be tied to the highest cell potential. READING EXTERNAL TEMPERATURE PROBES The LTC6801 includes two channels of ADC input, VTEMP1 and VTEMP2, that are intended to monitor thermistors (tempco about -4%/C generally) or diodes (-2.2mV/C typical) located within the cell array. Sensors can be powered directly from VREF as shown in Figure 9 (up to 30A typical). The temperature measurement inputs (VTEMP1, VTEMP2) of the LTC6801 are comparator input channels with a voltage threshold of one-half VREF. Input voltages above half VREF are considered good. Voltages below the onehalf VREF threshold are considered a fault condition. The inputs may be used in combination with resistors, thermistors, or diodes to sense both an upper and lower temperature limit. Figure 9, Figure 10 and Figure 11 illustrate some possibilities. To ignore these inputs simply connect VTEMP1 and VTEMP2 to VREF. A filtering capacitor to V- is recommended to minimize the error caused by the approximately 700k input impedance of the ADC. For sensors that require higher drive currents, a buffer amplifier may be used as shown in Figure 10. Power for the sensor is actually sourced indirectly from the VREG pin in this case. Probe loads up to about 1mA maximum are 500k NTC B = 4567 100k 1F 1150k 100k NTC B = 4250 1F V+ OV1 C12 OV0 C11 UV1 C10 UV0 C9 HYST C8 CC1 LTC6801 C7 CC0 C6 SLT C5 SLTOK C4 DC C3 EOUT C2 EOUT C1 SIN V- SIN VTEMP1 SOUT VTEMP2 SOUT VREF EIN VREG EIN 6801 F11 Figure 11. Sensing Both Upper and Lower Temperature Thresholds. This Example Monitors a -20C to +60C Window Detector. The Thermistors Should Be in Close Proximity supported in this configuration. Since VREF is shut down while the LTC6801 is idle between measurement cycles, the thermistor drive is also shut off and thus power dissipation is minimized. Since VREG remains always-on, the buffer op amp (LT6003 shown) is selected for its ultralow current consumption (10A). For circuits that include filtering capacitance, note that only the fastest DC setting (VREG connection) will keep VREF steady and allow the VTEMP voltages to settle. To use the lower power DC settings, VREF must be buffered (see Figure 10), so that a low impedance is presented to the ADC, with a time constant of no more than about 1ms. ADVANTAGES OF DELTA-SIGMA ADCs The LTC6801 employs a delta-sigma analog to digital converter for voltage measurement. The architecture of delta-sigma converters can vary considerably, but the common characteristic is that the input is sampled many times over the course of a conversion and then filtered or averaged to produce the digital output code. Rev. D For more information www.analog.com 21 LTC6801 APPLICATIONS INFORMATION For a given sample rate, a delta-sigma converter can achieve excellent noise rejection while settling completely in a single conversion. This is particularly important for noisy automotive systems. Other advantages of delta-sigma converters are that they are inherently monotonic, meaning they have no missing codes, and they have excellent DC specifications. The LTC6801's ADC has a second order delta-sigma modulator followed by a SINC2, finite impulse response (FIR) digital filter, with a lowpass bandwidth of 1kHz. The front-end sample rate is 512ksps, which greatly reduces input filtering requirements. A simple 16kHz, 1 pole filter composed of a 1k resistor and a 10nF capacitor at each input will provide adequate filtering for most applications. These component values will not degrade the DC accuracy of the ADC. Each conversion consists of two phases - an autozero phase and a measurement phase. The ADC is autozeroed at each conversion, greatly improving CMRR. USING TRANSFORMERS FOR GALVANIC ISOLATION As shown in Figure 12, small gate-drive signal transformers can be used to interconnect devices and transport the enable and sense signals safely across an isolation barrier. Driving a transformer with a squarewave requires transient currents of several mA and frequency of operation at 20kHz or higher. Since the output pins of the LTC6801 are current limited at <1mA, a small external gate pair (NC7WZ17 dual buffer) is used to provide the needed drive current. 330 resistors are placed in series with each buffer output to optimize current flow into the transformer primary and a coupling capacitor provides prevention of current flow in static conditions. The secondary side is wired in a center-tapped configuration to terminate the common mode voltage and thus suppress noise pickup. The differential signal is terminated into 1500 to optimize the peak signal swing for the IC input (to about 4VP-P). Internal biasing features of the IC inputs maintain an optimal DC common mode level at the transformer secondary. 22 INTERCOMMUNICATION USING DATA ISOLATORS As shown in Figure 13, an inexpensive and compact 2-channel data isolator is used to communicate the enable and the sense clocking signals between devices. The wiring carries isolator power and return plus two single-ended logic signals that are completely isolated at the upper device interface, so the signals are effectively differential from a common mode ingress perspective. The isolator provides excellent rejection of noise between battery groups, but consumes a few mA when operating, so a conventional opto-coupler and a few discretes provide a power-down scheme for periods where no monitoring is needed. Since the required current would load down VREG if used directly, the NPN transistor is used to form a quasi-regulated 4.3V supply drawing from the full battery group potential, also moving significant thermal loading outside the IC. The PMOS FET is a low resistance switch controlled by the opto-coupler output. Since the opto-coupler is used to switch only a small current, the LED need only be driven with ~500A. Powering down the bottom-of-stack isolator on the host P side automatically powers down the entire isolator chain. DEMO BOARD CIRCUIT An LTC6801 demonstration circuit is shown in Figure 15. The circuit includes a 10kHz oscillator (U2) for the enable excitation and an LED (D15, driven by Q1) to indicate the state of the status outputs, plus an assortment of important protection components to ensure robust operation and hot-plugging of cell connections. Series resistors (R14 to R21) provide a controlled coupling capacitor (C14 to C17) current in the inter-IC connections during startup or other abrupt potential changes, and associated clamp diodes (D13 and D14 quad array devices) redirect charge/surge current around the IC. Input filters to each cell (R1, C1 to R12, C12) also use 6.2V Zener diodes (D1 to D12) to prevent overstress to the internal ESD clamps. The V+ input filter (R13, C13) has the same time constant as the ADC input filters so that the V+ and C12 pins tend to track during start-up or transients, minimizing stress and ADC error. Rev. D For more information www.analog.com LTC6801 APPLICATIONS INFORMATION TO NEXT CIRCUIT NC7WZ17 1F OV1 V+ C12 LTC6801 OV0 UV1 C11 UV0 C10 HYST C9 CC1 C8 CC0 C7 C6 SLT C5 SLTOK C4 DC C3 EOUT C2 EOUT C1 SIN V- SIN VTEMP1 SOUT VTEMP2 SOUT VREF EIN EIN VREG 330 GND V+ 100nF 330 ENC2+ ENC2- 10nF * S2+ * 1.5k S2- * P0544NL NC7WZ17 330 GND V+ 100nF 330 * V+ OV1 C12 LTC6801 OV0 UV1 C11 UV0 C10 HYST C9 CC1 C8 CC0 C7 SLT C6 SLTOK C5 DC C4 EOUT C3 EOUT C2 SIN C1 SIN V- VTEMP1 SOUT 1F VTEMP2 VREF VREG * 1.5k 10nF * P0544NL NC7WZ17 330 GND V+ 100nF 330 ENC1+ ENC1- 10nF * S1+ * 1.5k S1- * P0544NL S_HOST+ S_HOST- EN_HOST+ EN_HOST- SOUT EIN EIN 6801 F12 Figure 12. Using Transformers for Galvanic Isolation Rev. D For more information www.analog.com 23 LTC6801 APPLICATIONS INFORMATION 1F OV1 V+ C12 LTC6801 OV0 UV1 C11 UV0 C10 HYST C9 CC1 C8 CC0 C7 C6 SLT SLTOK C5 DC C4 EOUT C3 C2 EOUT SIN C1 SIN V- VTEMP1 SOUT VTEMP2 SOUT VREF EIN EIN VREG TO NEXT CIRCUIT 100 1F COM2 ENABLE2 SENSE2 VISO2 1nF Si8421 VDD1 VDD2 A1 B1 A2 GND1 1nF 1F 100 B2 GND2 6.8k SI2351DS CZT5551 33k MOC207-M 1F OV1 V+ C12 LTC6801 OV0 C11 UV1 C10 UV0 C9 HYST CC1 C8 CC0 C7 SLT C6 SLTOK C5 DC C4 EOUT C3 C2 EOUT C1 SIN SIN V- VTEMP1 SOUT VTEMP2 SOUT VREF EIN EIN VREG 100 1F COM1 ENABLE1 SENSE1 VISO1 1nF Si8421 VDD1 A1 A2 GND1 1nF VDD2 1F VCCHOST 100 SENSEHOST B1 ENABLEHOST B2 GND2 COMHOST 6.8k CZT5551 SI2351DS 33k MOC207-M 6801 F13 Figure 13. IC to IC Communication Using Data Isolators 24 Rev. D For more information www.analog.com J1 HEADER 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 P1 EDGE FINGER 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 D1 TO D12: BZT52C6V28 D1 R1 1k D2 R2 1k D3 R3 1k D4 R4 1k D5 R5 1k D6 R6 1k D7 R7 1k D8 R8 1k D9 D10 R9 1k R10 1k D11 R11 1k D12 C1 10nF 100V C2 10nF 100V C3 10nF 100V C4 10nF 100V C5 10nF 100V C6 10nF 100V C7 10nF 100V C8 10nF 100V C9 10nF 100V C10 10nF 100V C11 10nF 100V C12 10nF 100V 1 3 5 C13 100nF 100V JP12 OSC 3 2 V+ R29 1M DIV SET GND GRD OUT 4 5 6 2 4 6 D15 LED1 (GRN) R22 1.5k 1% C23 1nF 1 3 5 JP10 EINX 2 4 6 SE DIFF R28 1M C22 10nF 50V Q1 2N7002K D16 CMHD457 2 1 1 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 1 3 5 JP3 UV1 1 3 5 SLT V- 2 4 6 6801 F12 R27 10k 1% E3 SLTOK E2 E1 JP4 UV0 2 4 6 1 3 5 JP6 CC1 3 2 1 R15 100 2 4 LOOP 6 LINK R14 100 JP9 TOPI/O JP11 LE0 1 ON 3 5 OFF 1 3 5 1 3 5 JP5 HYST Figure 14. Schematic of LTC6801 Demo Circuit 2 4 ON 6 OFF U2 LTC6906CS6 C21 R26 1nF 1.15M 100V EIN EIN SOUT SOUT SIN SIN EOUT EOUT DC SLTOK SLT CC0 CC1 HYST UV0 UV1 OV0 OV1 C20 1nF 100V 1 C19 1F 50V VREG VREF VTEMP2 VTEMP1 V- C1 C2 C3 C4 C5 C6 C7 C8 C9 C10 C11 LTC6801 LTC6801IG C12 V+ 1 3 5 R23 22.6k R25 100k NTC 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 2 4 6 JP2 OV0 R24 100k NTC C18 1F 50V 1 3 5 JP1 OV1 1 3 For more information www.analog.com 2 R12 1k R13 100 2 4 6 2 4 6 8 10 12 14 D13 PRTR5VOU4D 1 3 5 7 9 11 13 J3 TOP 1 3 5 JP7 CC0 2 4 6 4 5 6 R16 100 JP8 DC E5 C15 820pF 500V 4 5 6 R19 100 SOUT EINX E4 R18 100 R17 100 C14 820pF 500V VREG GND VREF 2 4 6 8 10 12 14 D14 PRTR5VOU4D 1 3 5 7 9 11 13 J2 BOTTOM 3 2 1 E6 R20 100 C16 820pF 500V R21 100 C17 820pF 500V EIN SOUTX E7 NOTE: IF THE DC PIN IS TIED TO VREF OR V-, VTEMP1 AND VTEMP2 WILL HAVE ADDITIONAL MEASUREMENT ERROR DUE TO INSUFFICIENT SETTLING (SEE READING EXTERNAL TEMPERATURE PROBES) LTC6801 APPLICATIONS INFORMATION Rev. D 25 LTC6801 PACKAGE DESCRIPTION G Package 36-Lead Plastic SSOP (5.3mm) (Reference LTC DWG # 05-08-1640) 12.50 - 13.10* (.492 - .516) 1.25 0.12 7.8 - 8.2 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 20 19 5.3 - 5.7 0.42 0.03 7.40 - 8.20 (.291 - .323) 0.65 BSC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 RECOMMENDED SOLDER PAD LAYOUT 2.0 (.079) MAX 5.00 - 5.60** (.197 - .221) 0 - 8 0.09 - 0.25 (.0035 - .010) 0.65 (.0256) BSC 0.55 - 0.95 (.022 - .037) NOTE: 1. CONTROLLING DIMENSION: MILLIMETERS MILLIMETERS 2. DIMENSIONS ARE IN (INCHES) 0.22 - 0.38 (.009 - .015) TYP 0.05 (.002) MIN G36 SSOP 0204 3. DRAWING NOT TO SCALE *DIMENSIONS DO NOT INCLUDE MOLD FLASH. MOLD FLASH SHALL NOT EXCEED .152mm (.006") PER SIDE **DIMENSIONS DO NOT INCLUDE INTERLEAD FLASH. INTERLEAD FLASH SHALL NOT EXCEED .254mm (.010") PER SIDE 26 Rev. D For more information www.analog.com LTC6801 REVISION HISTORY REV DATE DESCRIPTION A 5/10 H-grade part added. Reflected throughout the data sheet B 7/10 Updated VREG Conditions 3 Updated Table 3 9 Web links added ALL Typo correction in Overview section 12 C D 8/15 09/18 PAGE NUMBER 1 to 28 Updated order information to include automotive versions 2 Note added to explain status output timing following internal self test operation 13 Rev. D Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license For is granted implication or otherwise under any patent or patent rights of Analog Devices. more by information www.analog.com 27 LTC6801 TYPICAL APPLICATION VREG SOUT 5V 1.5k LED_GREEN 10k CMHD457 FILTERED STATUS (LOW = OK) 2N7002 10nF 1M 6801 F15 Figure 15. Alarm Qualification Filter/Status Indicator RELATED PARTS PART NUMBER DESCRIPTION COMMENTS LTC6802-1 Multi-Cell Battery Stack Monitor with a Stackable Serial Interface Complete Battery Monitoring IC with 0.25% Cell Measurement Accuracy. Level-Shifting Serial Interface Allows Multiple LTC6802-1 Devices to be DaisyChained without Opto-Couplers or Isolators LTC6802-2 Multi-Cell Battery Stack Monitor with an Individually Functionally Equivalent to LTC6802-1: Parallel Connection Between Addressable Serial Interface Microcontroller and Multiple LTC6802-2 Devices 28 Rev. D 09/18 www.analog.com For more information www.analog.com ANALOG DEVICES, INC. 2010-2018