SG PARAMETER SYMBOL TEMP. POWER TEST CONDITIONS MIN MAX UNITS
1 Quiescent Current IQ25°C±100V VIN = 0, AV = 100 8.5 mA
1 Input Offset Voltage VOS 25°C±100V VIN = 0, AV = 100 2 mV
1 Input Offset Voltage VOS 25°C±15V VIN = 0, AV = 100 3.7 mV
1 Input Offset Voltage VOS 25°C±150V VIN = 0, AV = 100 3 mV
1 Input Bias Current, +IN +IB25°C±100V VIN = 0 50 pA
1 Input Bias Current, –IN –IB25°C±100V VIN = 0 50 pA
1 Input Offset Current IOS 25°C±100V VIN = 0 50 pA
3 Quiescent Current IQ–55°C±100V VIN = 0, AV = 100 9.5 mA
3 Input Offset Voltage VOS –55°C±100V VIN = 0, AV = 100 4.4 mV
3 Input Offset Voltage VOS –55°C±15V VIN = 0, AV = 100 6.1 mV
3 Input Offset Voltage VOS –55°C±150V VIN = 0, AV = 100 5.4 mV
3 Input Bias Current, +IN +IB–55°C±100V VIN = 0 50 pA
3 Input BiasCurrent, –IN –IB–55°C±100V VIN = 0 50 pA
3 Input Offset Current IOS –55°C±100V VIN = 0 50 pA
2 Quiescent Current IQ125°C±100V VIN = 0, AV = 100 11 mA
2 Input Offset Voltage VOS 125°C±100V VIN = 0, AV = 100 5 mV
2 Input Offset Voltage VOS 125°C±15V VIN = 0, AV = 100 6.7 mV
2 Input Offset Voltage VOS 125°C±150V VIN = 0, AV = 100 6 mV
2 Input Bias Current, +IN +IB125°C±100V VIN = 0 10 nA
2 Input Bias Current, –IN –IB125°C±100V VIN = 0 10 nA
2 Input Offset Current IOS 125°C±100V VIN = 0 10 nA
4 Output Voltage, IO = 150mA VO25°C±31V RL = 100Ω15 V
4 Output Voltage, IO = 29mA VO25°C±150V RL = 5K 145 V
4 Output Voltage, IO = 80mA VO25°C± 90V RL = 1K 80 V
4 Current Limits ICL 25°C±30V RL = 100Ω75 125 mA
4 Stability/Noise EN25°C±100V RL = 5K, AV = 1, CL = 10nF 1 mV
4 Slew Rate SR 25°C±100V RL = 5K 20 100 V/µs
4 Open Loop Gain AOL 25°C±100V RL = 5K, F = 10Hz 96 dB
4 Common Mode Rejection CMR 25°C±32.5V RL = 5K, F = DC, VCM = ±22.5V 90 dB
6 Output Voltage, IO = 100mA VO–55°C±31V RL =100Ω10 V
6 Output Voltage, IO = 29mA VO–55°C±150V RL = 5K 145 V
6 Output Voltage, IO = 70mA VO–55°C±90V RL = 1K 70 V
6 Stability/Noise EN–55°C±100V RL = 5K, AV = 1, CL = 10nF 1 mV
6 Slew Rate SR –55°C±100V RL = 5K 20 100 V/µs
6 Open Loop Gain AOL –55°C±100V RL = 5K, F = 10Hz 96 dB
6 Common Mode Rejection CMR –55°C±32.5V RL = 5K, F = DC, VCM = ±22.5V 90 dB
5 Output Voltage, IO = 150mA VO125°C±31V RL = 100Ω15 V
5 Output Voltage, IO = 29mA VO125°C±150V RL = 5K 145 V
5 Output Voltage, IO = 80mA VO125°C±90V RL = 1K 80 V
5 Stability/Noise EN125°C±100V RL = 5K, AV = 1, CL = 10nF 1 mV
5 Slew Rate SR 125°C±100V RL = 5K 20 100 V/µs
5 Open Loop Gain AOL 125°C±100V RL = 5K, F = 10Hz 96 dB
5 Common Mode Rejection CMR 125°C±32.5V RL = 5K, F = DC, VCM = ±22.5V 90 dB
100K
5Ω
Ω
100K Ω
+50V
–50V
5
6
21
8
3
60
Ω
** *
U.U.T
4
*
5Ω
BURN IN CIRCUIT * These components are used to stabilize device
due to poor high frequency characteristics of
burn in board.
** Input signals are calculated to result in internal
power dissipation of approximately 2.1W at
case temperature = 125°C.
HTTP://WWW.APEXMICROTECH.COM (800) 546-APEX (800) 546-2739
MICROTECHNOLOGY
TABLE 4 GROUP A INSPECTION
PA08M
This data sheet has been carefully checked and is believed to be reliable, however, no responsibility is assumed for possible inaccuracies or omissions. All specifications are subject to change without notice.
PA08MU REV. H FEBRUARY 1998 © 1998 Apex Microtechnology Corp.
