ZXMN10A07F
SEMICONDUCTORS
ISSUE 5 - JULY 2003
4
PARAMETER SYMBOL MIN. TYP. MAX. UNIT CONDITIONS
STATIC
Drain-Source Breakdown Voltage V(BR)DSS 100 V ID=250A, VGS=0V
Zero Gate Voltage Drain Current IDSS 1AV
DS=100V, VGS=0V
Gate-Body Leakage IGSS 100 nA VGS=±20V, VDS=0V
Gate-Source Threshold Voltage VGS(th) 2.0 4.0 V ID=250A, VDS=VGS
Static Drain-Source On-State
Resistance (1) RDS(on) 0.7
0.9
⍀
⍀
VGS=10V, ID=1.5A
VGS=6V, ID=1A
Forward Transconductance (1) (3) gfs 1.6 S VDS=15V,ID=1A
DYNAMIC (3)
Input Capacitance Ciss 138 pF
VDS=50V,V
GS=0V,
f=1MHz
Output Capacitance Coss 12 pF
Reverse Transfer Capacitance Crss 6pF
SWITCHING(2) (3)
Turn-On Delay Time td(on) 1.8 ns
VDD=50V, ID=1A
RG=6.0⍀,V
GS=10V
Rise Time tr1.5 ns
Turn-Off Delay Time td(off) 4.1 ns
Fall Time tf2.1 ns
Total Gate Charge Qg2.9 nC
VDS=50V,VGS=10V,
ID=1A
Gate-Source Charge Qgs 0.7 nC
Gate-Drain Charge Qgd 1nC
SOURCE-DRAIN DIODE
Diode Forward Voltage (1) VSD 0.85 0.95 V Tj=25°C, IS=1.5A,
VGS=0V
Reverse Recovery Time (3) trr 27 ns Tj=25°C, IS=1.8A,
di/dt=100A/µs
Reverse Recovery Charge (3) Qrr 12 nC
ELECTRICAL CHARACTERISTICS (at Tamb = 25°C unless otherwise stated)
NOTES
(1) Measured under pulsed conditions. Pulse width ⱕ300µs; duty cycle ⱕ2% .
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.