
IXYS Reserves the Right to Change Limits, Test Conditions and Dimensions.
IXBF12N300
IXYS MOSFETs and IGBTs are covered 4,835,592 4,931,844 5,049,961 5,237,481 6,162,665 6,404,065 B1 6,683,344 6,727,585 7,005,734 B2 7,157,338B2
by one or more of the following U.S. patents: 4,860,072 5,017,508 5,063,307 5,381,025 6,259,123 B1 6,534,343 6,710,405 B2 6,759,692 7,063,975 B2
4,881,106 5,034,796 5,187,117 5,486,715 6,306,728 B1 6,583,505 6,710,463 6,771,478 B2 7,071,537
Symbol Test Conditions Characteristic Values
(TJ = 25°C Unless Otherwise Specified) Min. Typ. Max.
gfS IC = 12A, VCE = 10V, Note 1 6.5 10.8 S
Cies 1290 pF
Coes VCE = 25V, VGE = 0V, f = 1MHz 56 pF
Cres 19 pF
Qg 62 nC
Qge IC = 12A, VGE = 15V, VCE = 1000V 13 nC
Qgc 8.5 nC
td(on) 64 ns
tr 140 ns
td(off) 180 ns
tf 540 ns
td(on) 65 ns
tr 395 ns
td(off) 175 ns
tf 530 ns
RthJC 1.00 °C/W
RthCS 0.15 °C/W
Resistive Switching Times, TJ = 125°C
IC = 12A, VGE = 15V
VCE = 1250V, RG = 10Ω
Resistive Switching Times, TJ = 25°C
IC = 12A, VGE = 15V
VCE = 1250V, RG = 10Ω
Reverse Diode
Symbol Test Conditions Characteristic Values
(TJ = 25°C Unless Otherwise Specified) Min. Typ. Max.
VF IF = 12A, VGE = 0V 2.1 V
trr 1.4 μs
IRM 21 A
IF = 6A, VGE = 0V, -diF/dt = 100A/μs
VR = 100V, VGE = 0V
ISOPLUS i4-PakTM (HV) Outline
Pin 1 = Gate
Pin2 = Emitter
Pin 3 = Collector
Tab 4 = Isolated
Notes:
1. Pulse test, t ≤ 300μs, duty cycle, d ≤ 2%.
2. Device must be heatsunk for high temperature leakage current
measurements to avoid thermal runaway.