MC74VHC1GT125 Noninverting Buffer / CMOS Logic Level Shifter with LSTTL-Compatible Inputs http://onsemi.com MARKING DIAGRAMS 5 5 1 M The MC74VHC1GT125 is a single gate noninverting buffer fabricated with silicon gate CMOS technology. It achieves high speed operation similar to equivalent Bipolar Schottky TTL while maintaining CMOS low power dissipation. The MC74VHC1GT125 requires the 3-state control input (OE) to be set High to place the output into the high impedance state. The device input is compatible with TTL-type input thresholds and the output has a full 5 V CMOS level output swing. The input protection circuitry on this device allows overvoltage tolerance on the input, allowing the device to be used as a logic-level translator from 3 V CMOS logic to 5 V CMOS Logic or from 1.8 V CMOS logic to 3 V CMOS Logic while operating at the high-voltage power supply. The MC74VHC1GT125 input structure provides protection when voltages up to 7 V are applied, regardless of the supply voltage. This allows the MC74VHC1GT125 to be used to interface 5 V circuits to 3 V circuits. The output structures also provide protection when VCC = 0 V. These input and output structures help prevent device destruction caused by supply voltage - input/output voltage mismatch, battery backup, hot insertion, etc. SC-88A / SOT-353 / SC-70 DF SUFFIX CASE 419A W1 M G G 1 5 5 W1 M G G 1 TSOP-5 / SOT-23 / SC-59 DT SUFFIX CASE 483 1 Features * * * * * * * * * W1 M G High Speed: tPD = 3.5 ns (Typ) at VCC = 5 V Low Power Dissipation: ICC = 1 mA (Max) at TA = 25C TTL-Compatible Inputs: VIL = 0.8 V; VIH = 2 V CMOS-Compatible Outputs: VOH > 0.8 VCC; VOL < 0.1 VCC @Load = Device Code = Date Code* = Pb-Free Package (Note: Microdot may be in either location) *Date Code orientation and/or position may vary depending upon manufacturing location. Power Down Protection Provided on Inputs and Outputs Balanced Propagation Delays Pin and Function Compatible with Other Standard Logic Families Chip Complexity: FETs = 62; Equivalent Gates = 16 These Devices are Pb-Free and are RoHS Compliant OE 1 5 VCC PIN ASSIGNMENT 1 OE 2 IN A 3 GND 4 OUT Y 5 VCC IN A 2 GND 3 FUNCTION TABLE 4 OUT Y Figure 1. Pinout (Top View) OE OUT Y IN A May, 2011 - Rev. 13 OE Input Y Output L H X L L H L H Z ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 4 of this data sheet. Figure 2. Logic Symbol (c) Semiconductor Components Industries, LLC, 2011 A Input 1 Publication Order Number: MC74VHC1GT125/D MC74VHC1GT125 MAXIMUM RATINGS Symbol Characteristics Value Unit VCC DC Supply Voltage -0.5 to +7.0 V VIN DC Input Voltage -0.5 to +7.0 V -0.5 to 7.0 -0.5 to VCC + 0.5 V -20 mA +20 mA VOUT DC Output Voltage IIK Input Diode Current IOK Output Diode Current IOUT DC Output Current, per Pin +25 mA ICC DC Supply Current, VCC and GND +50 mA PD Power Dissipation in Still Air qJA Thermal Resistance TL VCC = 0 High or Low State VOUT < GND; VOUT > VCC SC-88A, TSOP-5 200 mW SC-88A, TSOP-5 333 C/W Lead Temperature, 1 mm from Case for 10 s 260 C TJ Junction Temperature Under Bias +150 C Tstg Storage Temperature -65 to +150 C > 2000 > 200 N/A V 500 mA VESD ESD Withstand Voltage ILatchup Human Body Model (Note 1) Machine Model (Note 2) Charged Device Model (Note 3) Latchup Performance Above VCC and Below GND at 125C (Note 4) Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. Tested to EIA/JESD22-A114-A 2. Tested to EIA/JESD22-A115-A 3. Tested to JESD22-C101-A 4. Tested to EIA/JESD78 RECOMMENDED OPERATING CONDITIONS Symbol Min Max Unit VCC DC Supply Voltage Characteristics 3.0 5.5 V VIN DC Input Voltage 0.0 5.5 V DC Output Voltage 0.0 VCC V Operating Temperature Range -55 +125 C 0 20 ns/V VOUT TA tr , tf Input Rise and Fall Time VCC = 5.0 V 0.5 V 90 419,300 47.9 100 178,700 20.4 110 79,600 9.4 120 37,000 4.2 130 17,800 2.0 140 8,900 1.0 TJ = 80 C 117.8 TJ = 90 C 1,032,200 TJ = 100 C 80 FAILURE RATE OF PLASTIC = CERAMIC UNTIL INTERMETALLICS OCCUR TJ = 110 C Time, Years TJ = 120 C Time, Hours TJ = 130 C Junction Temperature 5C NORMALIZED FAILURE RATE Device Junction Temperature versus Time to 0.1% Bond Failures 1 1 10 100 TIME, YEARS Figure 3. Failure Rate vs. Time Junction Temperature http://onsemi.com 2 1000 MC74VHC1GT125 IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIII IIII IIIIII IIIIIIIIIIIIIIIIIIIIIIII IIIIIII IIIIIII IIIII IIII IIIIIII IIIIIII III III II III II III IIII III II IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIII IIIIIII IIIIIII III III II III II III IIII III II IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIII IIIIIII IIIIIII III III II III II III IIII III II IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIII IIIIII IIII IIIIII IIIIIIII IIIIIII IIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII IIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIIII DC ELECTRICAL CHARACTERISTICS Symbol Parameter Test Conditions Min 1.4 2.0 2.0 VIH Minimum High-Level Input Voltage 3.0 4.5 5.5 VIL Maximum Low-Level Input Voltage 3.0 4.5 5.5 VOH Minimum High-Level Output Voltage VIN = VIH or VIL VOL Maximum Low-Level Output Voltage VIN = VIH or VIL TA = 25C VCC (V) Typ TA 85C Max Min Max 1.4 2.0 2.0 0.53 0.8 0.8 VIN = VIH or VIL IOH = - 50 mA 3.0 4.5 2.9 4.4 3.0 4.5 VIN = VIH or VIL IOH = - 4 mA IOH = - 8 mA 3.0 4.5 2.58 3.94 VIN = VIH or VIL IOL = 50 mA 3.0 4.5 VIN = VIH or VIL IOL = 4 mA IOL = 8 mA 0.0 0.0 -55 TA 125C Min Max 1.4 2.0 2.0 V 0.53 0.8 0.8 0.53 0.8 0.8 2.9 4.4 2.9 4.4 2.48 3.80 2.34 3.66 Unit V V 0.1 0.1 0.1 0.1 0.1 0.1 3.0 4.5 0.36 0.36 0.44 0.44 0.52 0.52 V IIN Maximum Input Leakage Current VIN = 5.5 V or GND 0 to 5.5 0.10 1.0 1.0 mA ICC Maximum Quiescent Supply Current VIN = VCC or GND 5.5 1.0 20 40 mA ICCT Quiescent Supply Current Input: VIN = 3.4 V Other Input: VCC or GND 5.5 1.35 1.50 1.65 mA IOPD Output Leakage Current VOUT = 5.5 V 0.0 0.5 5.0 10 mA Maximum 3-State Leakage Current VIN = VIH or VIL VOUT = VCC or GND 5.5 0.25 2.5 2.5 mA Output Leakage Current VOUT = 5.5 V 0.0 0.5 5.0 10 mA IOZ IOPD AC ELECTRICAL CHARACTERISTICS Input tr = tf = 3.0 ns TA = 25C Symbol tPLH, tPHL tPZL, tPZH tPLZ, tPHZ Min TA 85C -55 TA 125C Parameter Maximum Propagation Delay, A to Y (Figures 3 and 5.) Typ Max Min Max VCC = 3.3 0.3 V CL = 15pF CL = 50pF 5.6 8.1 8.0 11.5 1.0 1.0 9.5 13.0 12.0 16.0 VCC = 5.0 0.5 V CL = 15pF CL = 50pF 3.8 5.3 5.5 7.5 1.0 1.0 6.5 8.5 8.5 10.5 Maximum Output Enable TIme,OE to Y (Figures 4 and 5) VCC = 3.3 0.3 V RL = RI = 500 W CL = 15pF CL = 50pF 5.4 7.9 8.0 11.5 1.0 1.0 9.5 13.0 11.5 15.0 VCC = 5.0 0.5 V RL = RI = 500 W CL = 15pF CL = 50pF 3.6 5.1 5.1 7.1 1.0 1.0 6.0 8.0 7.5 9.5 Maximum Output Disable Time,OE to Y (Figures 4 and 5) VCC = 3.3 0.3 V RL = RI = 500 W CL = 15pF CL = 50pF 6.5 8.0 9.7 13.2 1.0 1.0 11.5 15.0 14.5 18.0 VCC = 5.0 0.5 V RL = RI = 500 W CL = 15pF CL = 50pF 4.8 7.0 6.8 8.8 1.0 1.0 8.0 10.0 10.0 12.0 10 10 10 Test Conditions Cin Maximum Input Capacitance 4 Cout Maximum Three-State Output Capacitance (Output in High Impedance State) 6 Min Max Unit ns ns ns pF pF Typical @ 25C, VCC = 5.0 V 14 CPD Power Dissipation Capacitance (Note 5) pF 5. CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC(OPR) = CPD VCC fin + ICC / 4 (per buffer). CPD is used to determine the no-load dynamic power consumption; PD = CPD VCC2 fin + ICC VCC. http://onsemi.com 3 MC74VHC1GT125 SWITCHING WAVEFORMS VCC OE 50% VCC GND 50% A tPZL GND tPHL tPLH tPLZ 50% VCC Y 50% VCC tPZH tPHZ Y HIGH IMPEDANCE VOL + 0.3V VOH - 0.3V 50% VCC Y Figure 4. Switching Waveforms TEST POINT TEST POINT OUTPUT DEVICE UNDER TEST HIGH IMPEDANCE Figure 5. DEVICE UNDER TEST CL* *Includes all probe and jig capacitance OUTPUT 1 kW CL * CONNECT TO VCC WHEN TESTING tPLZ AND tPZL. CONNECT TO GND WHEN TESTING tPHZ AND tPZH. *Includes all probe and jig capacitance Figure 6. Test Circuit Figure 7. Test Circuit INPUT Figure 8. Input Equivalent Circuit ORDERING INFORMATION Device Package M74VHC1GT125DF1G SC-88A / SOT-353 / SC-70 (Pb-Free) M74VHC1GT125DF2G SC-88A / SOT-353 / SC-70 (Pb-Free) M74VHC1GT125DT1G TSOP-5 / SOT-23 / SC-59 (Pb-Free) Shipping 3000/Tape & Reel For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. http://onsemi.com 4 MC74VHC1GT125 PACKAGE DIMENSIONS SC-88A (SC-70-5/SOT-353) CASE 419A-02 ISSUE K A NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. 3. 419A-01 OBSOLETE. NEW STANDARD 419A-02. 4. DIMENSIONS A AND B DO NOT INCLUDE MOLD FLASH, PROTRUSIONS, OR GATE BURRS. G 5 4 -B- S 1 2 DIM A B C D G H J K N S 3 D 5 PL 0.2 (0.008) M B M N J C H K http://onsemi.com 5 INCHES MIN MAX 0.071 0.087 0.045 0.053 0.031 0.043 0.004 0.012 0.026 BSC --0.004 0.004 0.010 0.004 0.012 0.008 REF 0.079 0.087 MILLIMETERS MIN MAX 1.80 2.20 1.15 1.35 0.80 1.10 0.10 0.30 0.65 BSC --0.10 0.10 0.25 0.10 0.30 0.20 REF 2.00 2.20 MC74VHC1GT125 PACKAGE DIMENSIONS TSOP-5 CASE 483-02 ISSUE H D 5X NOTE 5 2X 0.10 T 2X 0.20 T NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETERS. 3. MAXIMUM LEAD THICKNESS INCLUDES LEAD FINISH THICKNESS. MINIMUM LEAD THICKNESS IS THE MINIMUM THICKNESS OF BASE MATERIAL. 4. DIMENSIONS A AND B DO NOT INCLUDE MOLD FLASH, PROTRUSIONS, OR GATE BURRS. 5. OPTIONAL CONSTRUCTION: AN ADDITIONAL TRIMMED LEAD IS ALLOWED IN THIS LOCATION. TRIMMED LEAD NOT TO EXTEND MORE THAN 0.2 FROM BODY. 0.20 C A B M 5 1 4 2 L 3 B S K DETAIL Z G A DIM A B C D G H J K L M S DETAIL Z J C 0.05 SEATING PLANE H T MILLIMETERS MIN MAX 3.00 BSC 1.50 BSC 0.90 1.10 0.25 0.50 0.95 BSC 0.01 0.10 0.10 0.26 0.20 0.60 1.25 1.55 0_ 10 _ 2.50 3.00 SOLDERING FOOTPRINT* 0.95 0.037 1.9 0.074 2.4 0.094 1.0 0.039 0.7 0.028 SCALE 10:1 mm inches *For additional information on our Pb-Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. 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