MCM6206BB
1
MOTOROLA FAST SRAM
Product Preview
32K x 8 Bit Fast Static RAM
The MCM6206BB is a 262,144 bit static random access memory organized as
32,768 words of 8 bits. Static design eliminates the need for external clocks or
timing strobes, while CMOS circuitry reduces power consumption and provides
for greater reliability.
This device meets JEDEC standards for functionality and pinout, and is avail-
able in plastic small–outline J–leaded packages.
Single 5 V ±10% Power Supply
Fully Static No Clock or Timing Strobes Necessary
Fast Access Times: 12/15/20/25 ns
Equal Address and Chip Enable Access Times
Output Enable (G) Feature for Increased System Flexibility and to
Eliminate Bus Contention Problems
Low Power Operation: 125 140 mA Maximum AC
Fully TTL Compatible Three State Output
BLOCK DIAGRAM
AAAAAA
A
A
A
A
A
A
A
A
MEMORY MATRIX
ROW
DECODER
INPUT
DATA
CONTROL
COLUMN I/O
COLUMN DECODER
E
DQ
DQ
W
G
.
.
.
VCC
VSS
A
CIRCUIT
CONTROL
This document contains information on a product under development. Motorola reserves the right to change or discontinue this product without notice.
Order this document
by MCM6206BB/D
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
PIN ASSIGNMENT
MCM6206BB
SS
A
A
A
A
A
A
A
A
A
V
V
A
A
A
CC
A
DQ DQ
A
A
DQ
DQ
DQ
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
DQ
DQ
DQ
G
E
W
A Address Input. . . . . . . . . . . . . . . . . . . .
DQ Data Input/Data Output. . . . . . . . . .
WWrite Enable. . . . . . . . . . . . . . . . . . . .
GOutput Enable. . . . . . . . . . . . . . . . . . .
EChip Enable. . . . . . . . . . . . . . . . . . . . . .
VCC Power Supply (+ 5 V). . . . . . . . . . .
VSS Ground. . . . . . . . . . . . . . . . . . . . . . .
J PACKAGE
300 MIL SOJ
CASE
810B–03
PIN NAMES
6/4/97
Motorola, Inc. 1997
MCM6206BB
2MOTOROLA FAST SRAM
TRUTH TABLE (X = Don’t Care)
EG W Mode VCC Current Output Cycle
H X X Not Selected ISB1, ISB2 High–Z
L H H Output Disabled ICCA High–Z
L L H Read ICCA Dout Read Cycle
L X L Write ICCA High–Z Write Cycle
ABSOLUTE MAXIMUM RATINGS
Rating Symbol Value Unit
Power Supply Voltage VCC 0.5 to + 7.0 V
Voltage Relative to VSS For Any Pin
Except VCC Vin, Vout 0.5 to VCC + 0.5 V
Output Current Iout ±20 mA
Power Dissipation PD1.0 W
Temperature Under Bias Tbias 10 to + 85 °C
Ambient Temperature TA0 to + 70 °C
Storage Temperature—Plastic Tstg 55 to + 125 °C
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
exceeded. Functional operation should be restricted to RECOMMENDED OPER-
ATING CONDITIONS. Exposure to higher than recommended voltages for ex-
tended periods of time could af fect device reliability.
DC OPERATING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ±10%, TA = 0 to 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS
Parameter Symbol Min Typ Max Unit
Supply V oltage (Operating Voltage Range) VCC 4.5 5.0 5.5 V
Input High Voltage VIH 2.2 VCC + 0.3** V
Input Low Voltage VIL 0.5* 0.8 V
*VIL (min) = – 0.5 V dc; VIL (min) = – 2.0 V ac (pulse width 20 ns)
**VIH (max) = VCC + 0.3 V dc; VIH (max) = VCC + 2.0 V ac (pulse width 20 ns)
DC CHARACTERISTICS
Parameter Symbol Min Max Unit
Input Leakage Current (All Inputs, V in = 0 to VCC) Ilkg(I) ±1µA
Output Leakage Current (E = VIH or G = VIH, Vout = 0 to VCC) Ilkg(O) ±1µA
Output High Voltage (IOH = – 4.0 mA) VOH 2.4 V
Output Low Voltage (IOL = 8.0 mA) VOL 0.4 V
POWER SUPPLY CURRENTS
Parameter Symbol –12 –15 –20 –25 Unit
AC Active Supply Current (Iout = 0 mA, VCC = Max, f = fmax) ICCA 140 135 130 125 mA
AC Standby Current (E = VIH, VCC = Max, f = fmax) ISB1 40 35 35 30 mA
CMOS Standby Current (VCC = Max, f = 0 MHz, E VCC – 0.2 V
Vin VSS + 0.2 V, or VCC – 0.2 V) ISB2 10 10 10 10 mA
CAPACITANCE (f = 1 MHz, dV = 3 V, TA = 25°C, Periodically sampled rather than 100% tested)
Characteristic Symbol Max Unit
Address Input Capacitance Cin 6pF
Control Pin Input Capacitance (E, G, W) Cin 8pF
I/O Capacitance CI/O 8pF
This device contains circuitry to protect the
inputs against damage due to high static volt-
ages or electric fields; however, it is advised
that normal precautions be taken to avoid
application of any voltage higher than maxi-
mum rated voltages to this high–impedance
circuit.
This CMOS memory circuit has been de-
signed to meet the dc and ac specifications
shown in the tables, after thermal equilibrium
has been established. The circuit is in a test
socket or mounted on a printed circuit board
and transverse air flow of at least 500 linear
feet per minute is maintained.
MCM6206BB
3
MOTOROLA FAST SRAM
AC OPERATING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ±10%, TA = 0 to + 70°C, Unless Otherwise Noted)
Input Timing Measurement Reference Level 1.5 V. . . . . . . . . . . . . . .
Input Pulse Levels 0 to 3.0 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time 5 ns. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output Timing Measurement Reference Level 1.5 V. . . . . . . . . . . . .
Output Load Figure 1 Unless Otherwise Noted. . . . . . . . . . . . . . . . . .
READ CYCLE (See Note 1)
–12 –15 –20 –25
Parameter Symbol Min Max Min Max Min Max Min Max Unit Notes
Read Cycle T ime tAVAV 12 15 20 25 ns 2
Address Access Time tAVQV 12 15 20 25 ns
Enable Access T ime tELQV 12 15 20 25 ns 3
Output Enable Access T ime tGLQV 6 8 10 12 ns
Output Hold from Address Change tAXQX 3 3 3 3 ns 4,5,6
Enable Low to Output Active tELQX 4 4 4 4 ns 4,5,6
Enable High to Output High–Z tEHQZ 7 8 9 10 ns 4,5,6
Output Enable Low to Output Active tGLQX 0 0 0 0 ns 4,5,6
Output Enable High to Output High–Z tGHQZ 6 7 8 10 ns 4,5,6
Power Up T ime tELICCH 0 0 0 0 ns
Power Down T ime tEHICCL 12 15 20 25 ns
NOTES:
1. W is high for read cycle.
2. All timings are referenced from the last valid address to the first transitioning address.
3. Addresses valid prior to or coincident with E going low.
4. At any given voltage and temperature, tEHQZ (max) is less than tELQX (min), and tGHQZ (max) is less than tGLQX (min), both for a given
device and from device to device.
5. T ransition is measured ±500 mV from steady–state voltage.
6. This parameter is sampled and not 100% tested.
7. Device is continuously selected (E = VIL, G = VIL).
OUTPUT
Z0 = 50
50
VL = 1.5 V
TIMING LIMITS
The table of timing values shows either a
minimum or a maximum limit for each param-
eter. Input requirements are specified from
the external system point of view. Thus, ad-
dress setup time is shown as a minimum
since the system must supply at least that
much time. On the other hand, responses
from the memory are specified from the de-
vice point of view. Thus, the access time is
shown as a maximum since the device never
provides data later than that time.
Figure 1. AC Test Loads
MCM6206BB
4MOTOROLA FAST SRAM
READ CYCLE 1 (See Note 7)
Q (DATA OUT)
A (ADDRESS)
DATA VALIDPREVIOUS DATA V ALID
tAVAV
tAXQX
tAVQV
READ CYCLE 2 (See Note 3)
ISB
ICC
tEHQZ
tEHICCL
DATA VALID
tGHQZ
tAVAV
tELQX
tELQV
E (CHIP ENABLE)
Q (DATA OUT)
A (ADDRESS)
tELICCH
tAVQV
tGLQX
tGLQV
G (OUTPUT ENABLE)
VCC
SUPPLY CURRENT
HIGH Z HIGH Z
MCM6206BB
5
MOTOROLA FAST SRAM
WRITE CYCLE 1 (W Controlled, See Notes 1 and 2)
–12 –15 –20 –25
Parameter Symbol Min Max Min Max Min Max Min Max Unit Notes
Write Cycle Time tAVAV 12 15 20 25 ns 3
Address Setup T ime tAVWL 0 0 0 0 ns
Address Valid to End of Write tAVWH 10 12 15 20 ns
Write Pulse Width tWLWH,
tWLEH 10 12 15 20 ns
Write Pulse Width,
G High tWLWH,
tWLEH 10 10 12 15 ns 4
Data Valid to End of Write tDVWH 6 7 8 10 ns
Data Hold T ime tWHDX 0 0 0 0 ns
Write Low to Output High–Z tWLQZ 6 7 8 10 ns 5,6,7
Write High to Output Active tWHQX 2 2 2 2 ns 5,6,7
Write Recovery Time tWHAX 0 0 0 0 ns
NOTES:
1. A write occurs during the overlap of E low and W low.
2. If G goes low coincident with or after W goes low, the output will remain in a high impedance state.
3. All timings are referenced from the last valid address to the first transitioning address.
4. If G VIH, the output will remain in a high impedance state.
5. At any given voltage and temperature, tWLQZ (max) is less than tWHQX (min), both for a given device and from device to device.
6. T ransition is measured ±500 mV from steady–state voltage.
7. This parameter is sampled and not 100% tested.
WRITE CYCLE 1 (W Controlled, See Notes 1 and 2)
DATA VALID
tDVWH
tAVWL
tAVWH
tAVAV
tWHAX
tWLWH
tWHDX
tWLQZ tWHQX
HIGH Z HIGH Z
A (ADDRESS)
W (WRITE ENABLE)
E (CHIP ENABLE)
Q (DATA OUT)
D (DATA IN)
tWLEH
MCM6206BB
6MOTOROLA FAST SRAM
WRITE CYCLE 2 (E Controlled, See Note 1)
–12 –15 –20 –25
Parameter Symbol Min Max Min Max Min Max Min Max Unit Notes
Write Cycle Time tAVAV 12 15 20 25 ns
Address Setup T ime tAVEL 0 0 0 0 ns
Address Valid to End of Write tAVEH 10 12 15 20 ns
Enable to End of Write tELEH,
tELWH 9 10 12 15 ns 3,4
Data Valid to End of Write tDVEH 6 7 8 10 ns
Data Hold T ime tEHDX 0 0 0 0 ns
Write Recovery Time tEHAX 0 0 0 0 ns
NOTES:
1. A write occurs during the overlap of E low and W low.
2. All timings are referenced from the last valid address to the first transitioning address.
3. If E goes low coincident with or after W goes low, the output will remain in a high impedance state.
4. If E goes high coincident with or before W goes high, the output will remain in a high impedance state.
WRITE CYCLE 2 (E Controlled, See Note 1)
tWLEH
tEHDX
tDVEH
tEHAX
tELWH
tELEH
tAVEL
tAVEH
DATA VALID
tAVAV
HIGH Z
A (ADDRESS)
W (WRITE ENABLE)
E (CHIP ENABLE)
Q (DATA OUT)
D (DATA IN)
MCM6206BB
7
MOTOROLA FAST SRAM
ORDERING INFORMATION
(Order by Full Part Number)
Motorola Memory Prefix
Part Number
Package (J = 300 mil SOJ, E = Evolutionary Pinout)
Shipping Method (R = Tape and Reel, Blank = Rails)
Speed (12 = 12 ns, 15 = 15 ns, 20 = 20 ns,
25 = 25 ns)
MCM 6206BB EJ XX X
Full Part Numbers — MCM6206BBEJ12 MCM6206BBEJ12R
MCM6206BBEJ15 MCM6206BBEJ15R
MCM6206BBEJ20 MCM6206BBEJ20R
MCM6206BBEJ25 MCM6206BBEJ25R
MCM6206BB
8MOTOROLA FAST SRAM
PACKAGE DIMENSIONS
CASE 810B–03
300 MIL SOJ
28 LEAD
0.25 (0.010) T B
S S
0.18 (0.007) T B
S S
0.18 (0.007) T A
MSMIN MINMAX MAX
INCHES MILLIMETERS
DIM
A
B
C
D
E
F
G
H
K
L
M
N
P
R
S
0
°
10
°
1.27 BSC
0.64 BSC
0.050 BSC
0.025 BSC
0
°
10
°
18.29
7.50
3.26
0.39
2.24
0.67
0.89
0.76
8.38
6.60
0.77
18.54
7.74
3.75
0.50
2.48
0.81
0.50
1.14
1.14
8.64
6.86
1.01
0.720
0.295
0.128
0.015
0.088
0.026
0.035
0.030
0.330
0.260
0.030
0.730
0.305
0.148
0.020
0.098
0.032
0.020
0.045
0.045
0.340
0.270
0.040
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. DIMENSION A & B DO NOT INCLUDE MOLD
PROTRUSION. MOLD PROTRUSION SHALL NOT
EXCEED 0.15 (0.006) PER SIDE.
3. CONTROLLING DIMENSION: INCH.
4. DIM R TO BE DETERMINED AT DATUM -T-.
28
1
15
14
L
G
M
KDETAIL Z
DETAIL Z
S RAD
F
-B-
-A- P
R
N
0.10 (0.004)
SEATING PLANE
-T-
M
C
E
D 24 PL
H BRK
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the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit, and
specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters which may be provided in Motorola
data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals”
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arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that
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MCM6206BB/D