TL/F/5987
CD40174BM/CD40174BC Hex D Flip-Flop
CD40175BM/CD40175BC Quad D Flip-Flop
February 1988
CD40174BM/CD40174BC Hex D Flip-Flop
CD40175BM/CD40175BC Quad D Flip-Flop
General Description
The CD40174B consists of six positive-edge triggered
D-type flip-flops; the true outputs from each flip-flop are ex-
ternally available. The CD40175B consists of four positive-
edge triggered D-type flip-flops; both the true and comple-
ment outputs from each flip-flop are externally available.
All flip-flops are controlled by a common clock and a com-
mon clear. Information at the D inputs meeting the set-up
time requirements is transferred to the Q outputs on the
positive-going edge of the clock pulse. The clearing opera-
tion, enabled by a negative pulse at Clear input, clears all Q
outputs to logical ‘‘0’’ and Qs (CD40175B only) to logical ‘‘1’’.
All inputs are protected from static discharge by diode
clamps to VDD and VSS.
Features
YWide supply voltage range 3V to 15V
YHigh noise immunity 0.45 VDD (typ.)
YLow power TTL fan out of 2 driving 74L
compatibility or 1 driving 74 LS
YEquivalent to MC14174B, MC14175B
YEquivalent to MM74C174, MM74C175
Connection Diagrams
CD40174B
Dual-In-Line Package
TL/F/59871
Top View
Order Number CD40174B or CD40175B
Truth Table
Inputs Outputs
Clear Clock D Q Q*
LXXLH
H
u
HH L
H
u
LL H
HHXNCNC
HLXNCNC
H
e
High level
LeLow level
XeIrrelevant
u
eTransition from low to high level
NC eNo change
*eQ for CD40175B only
CD40175B
Dual-In-Line Package
TL/F/59872
Top View
C1995 National Semiconductor Corporation RRD-B30M105/Printed in U. S. A.
Absolute Maximum Ratings (Notes1&2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
DC Supply Voltage (VDD)b0.5V to a18V
Input Voltage (VIN)b0.5V to VDD a0.5VDC
Storage Temperature Range (TS)b65§Ctoa
150§C
Power Dissipation (PD)
Dual-In-Line 700 mW
Small Outline 500 mW
Lead Temperature (TL)
(Soldering, 10 seconds) 260§C
Recommended Operating
Conditions (Note 2)
DC Supply Voltage (VDD) 3Vto15V
DC
Input Voltage (VIN) 0VtoV
DD VDC
Operating Temperature Range (TA)
CD40XXXBM b55§Ctoa
125§C
CD40XXXBC b40§Ctoa
85§C
DC Electrical Characteristics CD40174BM/CD40175BM (Note 2)
Symbol Parameter Conditions b55§Ca25§Ca125§CUnits
Min Max Min Typ Max Min Max
IDD Quiescent Device Current VDD e5V, VIN eVDD or VSS 1.0 1.0 30 mA
VDD e10V, VIN eVDD or VSS 2.0 2.0 60 mA
VDD e15V, VIN eVDD or VSS 4.0 4.0 120 mA
VOL Low Level Output Voltage
l
IO
l
k1mA
VDD e5V 0.05 0.05 0.05 V
VDD e10V 0.05 0.05 0.05 V
VDD e15V 0.05 0.05 0.05 V
VOH High Level Output Voltage
l
IO
l
k1mA
VDD e5V 4.95 4.95 5 4.95 V
VDD e10V 9.95 9.95 10 9.95 V
VDD e15V 14.95 14.95 15 14.95 V
VIL Low Level Input Voltage VDD e5V, VOe0.5V or 4.5V 1.5 1.5 1.5 V
VDD e10V, VOe1V or 9V 3.0 3.0 3.0 V
VDD e15V, VOe1.5V or 13.5V 4.0 4.0 4.0 V
VIH High Level Input Voltage VDD e5V, VOe0.5V or 4.5V 3.5 3.5 3.5 V
VDD e10V, VOe1V or 9V 7.0 7.0 7.0 V
VDD e15V, VOe1.5V or 13.5V 11.0 11.0 11.0 V
IOL Low Level Output Current VDD e5V, VOe0.4V 0.64 0.51 0.88 0.36 mA
(Note 3) VDD e10V, VOe0.5V 1.6 1.3 2.25 0.9 mA
VDD e15V, VOe1.5V 4.2 3.4 8.8 2.4 mA
IOH High Level Output Current VDD e5V, VOe4.6V b0.64 b0.51 b0.8.8 b0.36 mA
(Note 3) VDD e10V, VOe9.5V b1.6 b1.3 b2.25 b0.9 mA
VDD e15V, VOe13.5V b4.2 b3.4 b8.8 b2.4 mA
IIN Input Current VDD e15V, VIN e0V b0.1 b10b5b0.1 b1.0 mA
VDD e15V, VIN e15V 0.1 10b50.1 1.0 mA
DC Electrical Characteristics CD40174BC/CD40175BC (Note 2)
Symbol Parameter Conditions b40§Ca25§Ca85§CUnits
Min Max Min Typ Max Min Max
IDD Quiescent Device Current VDD e5V, VIN eVDD or VSS 4430mA
V
DD e10V, VIN eVDD or VSS 8860mA
V
DD e15V, VIN eVDD or VSS 16 16 120 mA
Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices
should be operated at these limits. The tables of ‘‘Recommended Operating Conditions’’ and ‘‘Electrical Characteristics’’ provide conditions for actual device
operation.
Note 2: VSS e0V unless otherwise specified.
Note 3: IOH and IOL are tested one output at a time.
2
DC Electrical Characteristics CD40174BC/CD40175BC (Note 2) (Continued)
Symbol Parameter Conditions b40§Ca25§Ca85§CUnits
Min Max Min Typ Max Min Max
VOL Low Level Output Voltage VDD e5V 0.05 0.05 0.05 V
VDD e10V 0.05 0.05 0.05 V
VDD e15V 0.05 0.05 0.05 V
VOH High Level Output Voltage VDD e5V 4.95 4.95 5 4.95 V
VDD e10V 9.95 9.95 10 9.95 V
VDD e15V 14.95 14.95 15 14.95 V
VIL Low Level Input Voltage VDD e5V, VOe0.5V or 4.5V 1.5 1.5 1.5 V
VDD e10V, VOe1V or 9V 3.0 3.0 3.0 V
VDD e15V, VOe1.5V or 13.5V 4.0 4.0 4.0 V
VIH High Level Input Voltage VDD e5V, VOe0.5V or 4.5V 3.5 3.5 3.5 V
VDD e10V, VOe1V or 9V 7.0 7.0 7.0 V
VDD e15V, VOe1.5V or 13.5V 11.0 11.0 11.0 V
IOL Low Level Output Current VDD e5V, VOe0.4V 0.52 0.44 0.88 0.36 mA
(Note 3) VDD e10V, VOe0.5V 1.3 1.1 2.25 0.9 mA
VDD e15V, VOe1.5V 3.6 3.0 8.8 2.4 mA
IOH High Level Output Current VDD e5V, VOe4.6V b0.52 b0.44 b0.88 b0.36 mA
(Note 3) VDD e10V, VOe9.5V b1.3 b1.1 b2.25 b0.9 mA
VDD e15V, VOe13.5V b3.6 b3.0 b8.8 b2.4 mA
IIN Input Current VDD e15V, VIN e0V b0.30 b10b5b0.30 b1.0 mA
VDD e15V, VIN e15V 0.30 10b50.30 1.0 mA
AC Electrical Characteristics*
TAe25§C, CLe50 pF, RLe200k and tretfe20 ns, unless otherwise specified
Symbol Parameter Conditions Min Typ Max Units
tPHL,t
PLH Propagation Delay Time to a VDD e5V 190 300 ns
Logical ‘‘0’’ or Logical ‘‘1’’ from VDD e10V 75 110 ns
Clock to Q or Q (CD40175 Only) VDD e15V 60 90 ns
tPHL Propagation Delay Time to a VDD e5V 180 300 ns
Logical ‘‘0’’ from Clear to Q VDD e10V 70 110 ns
VDD e15V 60 90 ns
tPLH Propagation Delay Time to a Logical VDD e5V 230 400 ns
‘‘1’’ from Clear to Q (CD40175 Only) VDD e10V 90 150 ns
VDD e15V 75 120 ns
tSU Time Prior to Clock Pulse that VDD e5V 45 100 ns
Data must be Present VDD e10V 15 40 ns
VDD e15V 13 35 ns
tHTime after Clock Pulse that VDD e5V b11 0 ns
Data Must be Held VDD e10V b40 ns
V
DD e15V b30 ns
t
THL,t
TLH Transition Time VDD e5V 100 200 ns
VDD e10V 50 100 ns
VDD e15V 40 80 ns
tWH,t
WL Minimum Clock Pulse Width VDD e5V 130 250 ns
VDD e10V 45 100 ns
VDD e15V 40 80 ns
3
AC Electrical Characteristics*
TAe25§C, CLe50 pF, RLe200k and tretfe20 ns, unless otherwise specified (Continued)
Symbol Parameter Conditions Min Typ Max Units
tWL Minimum Clear Pulse Width VDD e5V 120 250 ns
VDD e10V 45 100 ns
VDD e15V 40 80 ns
tRCL Maximum Clock Rise Time VDD e5V 15 ms
VDD e10V 5.0 ms
VDD e15V 5.0 ms
tfCL Maximum Clock Fall Time VDD e5V 15 50 ms
VDD e10V 5.0 50 ms
VDD e15V 5.0 50 ms
fCL Maximum Clock Frequency VDD e5V 2.0 3.5 MHz
VDD e10V 5.0 10 MHz
VDD e15V 6.0 12 MHz
CIN Input Capacitance Clear Input 10 15 pF
Other Input 5.0 7.5 pF
CPD Power Dissipation Per Package (Note 4) 130 pF
*AC Parameters are guaranteed by DC correlated testing.
Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the
devices should be operated at these limits. The tables of ‘‘Recommended Operating Conditions’’ and ‘‘Electrical Characteristics’’ provide conditions for actual
device operation.
Note 2: VSS e0V unless otherwise specified.
Note 3: IOH and IOL are tested one output at a time.
Note 4: CPD determines the no load AC power consumption of any CMOS device. For complete explanation, see 54C/74C Family Characteristics application
note, AN-90.
Switching Time Waveforms
TL/F/59873
tretfe20 ns
4
Physical Dimensions inches (millimeters)
Ceramic Dual-In-Line Package (J)
Order Number CD40174BMJ, CD40174BCJ, CD40175BMJ or CD40175BCJ
NS Package Number J16A
5
CD40174BM/CD40174BC Hex D Flip-Flop
CD40175BM/CD40175BC Quad D Flip-Flop
Physical Dimensions inches (millimeters) (Continued)
Molded Dual-In-Line Package (N)
Order Number CD40174BMN, CD40174BCN, CD40174BMN or CD40175BCN
NS Package Number N16E
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
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systems which, (a) are intended for surgical implant support device or system whose failure to perform can
into the body, or (b) support or sustain life, and whose be reasonably expected to cause the failure of the life
failure to perform, when properly used in accordance support device or system, or to affect its safety or
with instructions for use provided in the labeling, can effectiveness.
be reasonably expected to result in a significant injury
to the user.
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