1998-2011 Microchip Technology Inc. DS21290F-page 1
MCP3201
Features
•12-Bit Resolution
±1 LSB max DNL
±1 LSB max INL (MCP3201-B)
±2 LSB max INL (MCP3201-C)
On-chip Sample and Hold
SPI Serial Interface (modes 0,0 and 1,1)
Single Supply Operation: 2.7V - 5.5V
100 ksps Maximum Sampling Rate at VDD = 5V
50 ksps Maximum Sampling Rate at VDD = 2.7V
Low-Power CMOS Technology
500 nA Typical Standby Current, 2 µA Maximum
400 µA Maximum Active Current at 5V
Industrial Temp Range: -40°C to +85°C
8-pin MSOP, PDIP, SOIC and TSSOP Packages
Applications
Sensor Interface
Process Control
Data Acquisition
Battery Operated Systems
Functional Block Diagram
Description
The Microchip Technology Inc. MCP3201 device is a
successive approximation 12-bit Analog-to-Digital
(A/D) Converter with on-board sample and hold
circuitry. The device provides a single pseudo-differen-
tial input. Differential Nonlinearity (DNL) is specified at
±1 LSB, and Integral Nonlinearity (INL) is offered in
±1 LSB (MCP3201-B) and ±2 LSB (MCP3201-C)
versions. Communication with the device is done using
a simple serial interface compatible with the SPI
protocol. The device is capable of sample rates of up to
100 ksps at a clock rate of 1.6 MHz. The MCP3201
device operates over a broad voltage range (2.7V-
5.5V). Low-current design permits operation with
typical standby and active currents of only 500 nA and
300 µA, respectively. The device is offered in 8-pin
MSOP, PDIP, TSSOP and 150 mil SOIC packages.
Package Types
Comparator
Sample
and
Hold
12-Bit SAR
DAC
Control Logic
CS/SHDN
VREF
IN+
IN-
VSS
VDD
CLK DOUT
Shift
Register
VREF
IN+
IN–
VSS
VDD
CLK
DOUT
CS/SHDN
1
2
3
4
8
7
6
5
MSOP, PDIP, SOIC, TSSOP
MCP3201
2.7V 12-Bit A/D Converter with SPI Serial Interface
MCP3201
DS21290F-page 2 1998-2011 Microchip Technology Inc.
NOTES:
1998-2011 Microchip Technology Inc. DS21290F-page 3
MCP3201
1.0 ELECTRICAL
CHARACTERISTICS
1.1 Maximum Ratings†
VDD...................................................................................7.0V
All inputs and outputs w.r.t. VSS ................ -0.6V to VDD +0.6V
Storage temperature .....................................-65°C to +150°C
Ambient temp. with power applied ................-65°C to +125°C
ESD protection on all pins (HBM) .................................> 4 kV
†Notice: Stresses above those listed under “Maximum
ratings” may cause permanent damage to the device. This is
a stress rating only and functional operation of the device at
those or any other conditions above those indicated in the
operational listings of this specification is not implied.
Exposure to maximum rating conditions for extended periods
may affect device reliability.
ELECTRICAL CHARACTERISTICS
Electrical Specifications: All parameters apply at VDD = 5V, VSS = 0V, VREF = 5V, TA = -40°C to +85°C, fSAMPLE = 100 ksps, and
fCLK = 16*fSAMPLE, unless otherwise noted.
Parameter Sym Min Typ Max Units Conditions
Conversion Rate:
Conversion Time tCONV 12 clock
cycles
Analog Input Sample Time tSAMPLE 1.5 clock
cycles
Throughput Rate fSAMPLE 100
50
ksps
ksps
VDD = VREF = 5V
VDD = VREF = 2.7V
DC Accuracy:
Resolution 12 bits
Integral Nonlinearity INL
±0.75
±1
±1
±2
LSB
LSB
MCP3201-B
MCP3201-C
Differential Nonlinearity DNL ±0.5 ±1 LSB No missing codes over
temperature
Offset Error ±1.25 ±3 LSB
Gain Error ±1.25 ±5 LSB
Dynamic Performance:
Total Harmonic Distortion THD -82 dB VIN = 0.1V to 4.9V@1 kHz
Signal to Noise and Distortion
(SINAD)
SINAD 72 dB VIN = 0.1V to 4.9V@1 kHz
Spurious Free Dynamic Range SFDR 86 dB VIN = 0.1V to 4.9V@1 kHz
Reference Input:
Voltage Range 0.25 VDD VNote 2
Current Drain
100
.001
150
3
µA
µA CS = VDD = 5V
Analog Inputs:
Input Voltage Range (IN+) IN+ IN- VREF+IN- V
Input Voltage Range (IN-) IN- VSS-100 VSS+100 mV
Leakage Current 0.001 ±1 µA
Switch Resistance RSS 1K W See Figure 4-1
Sample Capacitor CSAMPLE 20 pF See Figure 4-1
Digital Input/Output:
Data Coding Format Straight Binary
High Level Input Voltage VIH 0.7 VDD —— V
Low Level Input Voltage VIL 0.3 VDD V
Note 1: This parameter is established by characterization and not 100% tested.
2: See graph that relates linearity performance to VREF level.
3: Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity performance,
especially at elevated temperatures. See Section 6.2 “Maintaining Minimum Clock Speed” for more information.
MCP3201
DS21290F-page 4 1998-2011 Microchip Technology Inc.
TEMPERATURE CHARACTERISTICS
High Level Output Voltage VOH 4.1 V IOH = -1 mA, VDD = 4.5V
Low Level Output Voltage VOL ——0.4VI
OL = 1 mA, VDD = 4.5V
Input Leakage Current ILI -10 10 µA VIN = VSS or VDD
Output Leakage Current ILO -10 10 µA VOUT = VSS or VDD
Pin Capacitance
(all inputs/outputs)
CIN, COUT 10 pF VDD = 5.0V (Note 1)
TA = +25°C, f = 1 MHz
Timing Parameters:
Clock Frequency fCLK
1.6
0.8
MHz
MHz
VDD = 5V (Note 3)
VDD = 2.7V (Note 3)
Clock High Time tHI 312 ns
Clock Low Time tLO 312 ns
CS Fall To First Rising CLK Edge tSUCS 100 ns
CLK Fall To Output Data Valid tDO 200 ns See Test Circuits, Figure 1-2
CLK Fall To Output Enable tEN 200 ns See Test Circuits, Figure 1-2
CS Rise To Output Disable tDIS 100 ns See Test Circuits, Figure 1-2
(Note 1)
CS Disable Time tCSH 625 ns
DOUT Rise Time tR 100 ns See Test Circuits, Figure 1-2
(Note 1)
DOUT Fall Time tF 100 ns See Test Circuits, Figure 1-2
(Note 1)
Power Requirements:
Operating Voltage VDD 2.7 5.5 V
Operating Current IDD
300
210
400
µA
µA
VDD = 5.0V, DOUT unloaded
VDD = 2.7V, DOUT unloaded
Standby Current IDDS —0.5 2 µACS = VDD = 5.0V
Electrical Specifications: Unless otherwise indicated, VDD = +2.7V to +5.5V, VSS = GND.
Parameters Sym Min Typ Max Units Conditions
Temperature Ranges
Specified Temperature Range TA-40 +85 °C
Operating Temperature Range TA-40 +85 °C
Storage Temperature Range TA-65 +150 °C
Thermal Package Resistances
Thermal Resistance, 8L-MSOP JA —211°C/W
Thermal Resistance, 8L-PDIP JA —89.5°C/W
Thermal Resistance, 8L-SOIC JA 149.5 °C/W
Thermal Resistance, 8L-TSSOP JA —139°C/W
ELECTRICAL CHARACTERISTICS (CONTINUE D)
Electrical Specifications: All parameters apply at VDD = 5V, VSS = 0V, VREF = 5V, TA = -40°C to +85°C, fSAMPLE = 100 ksps, and
fCLK = 16*fSAMPLE, unless otherwise noted.
Parameter Sym Min Typ Max Units Conditions
Note 1: This parameter is established by characterization and not 100% tested.
2: See graph that relates linearity performance to VREF level.
3: Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity performance,
especially at elevated temperatures. See Section 6.2 “Maintaining Minimum Clock Speed” for more information.
1998-2011 Microchip Technology Inc. DS21290F-page 5
MCP3201
FIGURE 1-1: Serial Timing.
FIGURE 1-2: Test Circuits.
CS
CLK
tSUCS
tCSH
tHI tLO
DOUT
tEN tDO tRtF
LSBMSB OUT
tDIS
NULL BIT
HI-Z HI-Z
VIH
tDIS
CS
DOUT
Waveform 1*
DOUT
Waveform 2
90%
10%
* Waveform 1 is for an output with internal condi-
tions such that the output is high, unless disabled
by the output control.
Waveform 2 is for an output with internal condi-
tions such that the output is low, unless disabled
by the output control.
Voltage Waveforms for tDIS
Te s t P oi n t
1.4V
DOUT
Load circuit for tR, tF
, tDO
3k
CL = 30 pF
Te s t P oi n t
DOUT
Load circuit for tDIS and tEN
3k
30 pF
tDIS Waveform 2
tDIS Waveform 1
CS
CLK
DOUT
tEN
12
B9
Voltage Waveforms for tEN
tEN Waveform
VDD
VDD/2
VSS
34
DOUT
tR
Voltage Waveforms for tR, tF
CLK
DOUT
tDO
Voltage Waveforms for tDO
tF
VOH
VOL
MCP3201
DS21290F-page 6 1998-2011 Microchip Technology Inc.
NOTES:
1998-2011 Microchip Technology Inc. DS21290F-page 7
MCP3201
2.0 TYPICAL PERFORMANCE CHARACTERISTICS
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C.
FIGURE 2-1: Integral Nonlinearity (INL)
vs. Sample Rate.
FIGURE 2-2: Integral Nonlinearity (INL)
vs. VREF.
FIGURE 2-3: Integral Nonlinearity (INL)
vs. Code (Representative Part).
FIGURE 2-4: Integral Nonlinearity (INL)
vs. Sample Rate (VDD = 2.7V).
FIGURE 2-5: Integral Nonlinearity (INL)
vs. VREF (VDD = 2.7V).
FIGURE 2-6: Integral Nonlinearity (INL)
vs. Code (Representative Part, VDD = 2.7V ).
Note: The graphs provided following this note are a statistical summary based on a limited number of samples
and are provided for informational purposes only. The performance characteristics listed herein are not
tested or guaranteed. In some graphs, the data presented may be outside the specified operating range
(e.g., outside specified power supply range) and therefore outside the warranted range.
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
0 25 50 75 100 125 150
Sample Rate (ksps)
INL (LSB )
Positive INL
Negative INL
-2.0
-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
2.0
012345
VREF (V)
INL (LSB )
Positive INL
Ne gative INL
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
0 512 1024 1536 2048 2560 3072 3584 4096
Digi t al Code
INL (LSB)
-2.0
-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
2.0
020406080100
Sample Rate (ksps)
INL (LSB)
VDD = VREF = 2 . 7 V
Positive INL
Negative INL
-2.0
-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
2.0
0.00.51.01.52.02.53.0
VREF (V )
IN L (LSB)
Posi tive INL
Neg ative INL
VDD = 2.7V
FSAMPLE = 50 ksp s
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
0 512 1024 1536 2048 2560 3072 3584 4096
Digital Code
INL (LSB)
V
DD = VREF = 2.7V
F
SAMPLE = 50 ksps
MCP3201
DS21290F-page 8 1998-2011 Microchip Technology Inc.
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C.
FIGURE 2-7: Integral Nonlinearity (INL)
vs. Temperature.
FIGURE 2-8: Differential Nonlinearity
(DNL) vs. Sample Rate.
FIGURE 2-9: Differential Nonlinearity
(DNL) vs. VREF.
FIGURE 2-10: Integral Nonlinearity (INL)
vs. Temperature (VDD = 2.7V).
FIGURE 2-11: Differential Nonlinearity
(DNL) vs. Sample Rate (VDD = 2.7V).
FIGURE 2-12: Differential Nonlinearity
(DNL) vs. VREF (VDD = 2.7V).
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
-50-250 255075100
Temperatu re (°C)
INL (LSB)
Positive INL
Negative INL
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
0 25 50 75 100 125 150
Sample Rate (ksps)
DNL (LSB)
Positive DNL
Negative DNL
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
-50 -25 0 25 50 75 100
Temp erature (°C)
INL (LSB)
Positive INL
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
Negative INL
-2.0
-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
2.0
0 20406080100
Sample Rate (ksps)
DNL (LSB)
VDD = VREF = 2 . 7 V
Po siti ve DN L
Neg ative DNL
1998-2011 Microchip Technology Inc. DS21290F-page 9
MCP3201
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C.
FIGURE 2-13: Differential Nonlinearity
(DNL) vs. Code (Representative Part).
FIGURE 2-14: Differential Nonlinearity
(DNL) vs. Temperature.
FIGURE 2-15: Gain Error vs. VREF.
FIGURE 2-16: Differential Nonlinearity
(DNL) vs. Code (Representative Part,
VDD =2.7V).
FIGURE 2-17: Differential Nonlinearity
(DNL) vs. Temperature (VDD = 2. 7V ).
FIGURE 2-18: Offset Error vs. VREF.
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
0 512 1024 1536 2048 2560 3072 3584 4096
Digital Code
DNL (LSB)
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
-50 -25 0 25 50 75 100
Temperature (°C)
DNL (LSB)
Positive DNL
Negative DNL
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
0 512 1024 1536 2048 2560 3072 3584 4096
Digital Code
DNL (LSB)
VDD = VREF = 2.7 V
FSAMPLE = 50 ks ps
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
-50 -25 0 25 50 75 100
Temp er atu re ( °C )
DNL (LSB)
Positive DNL
VDD = 2.7V
FSAMPLE = 50 ks ps
Nega tive DNL
MCP3201
DS21290F-page 10 1998-2011 Microchip Technology Inc.
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C.
FIGURE 2-19: Gain Error vs. Temperature.
FIGURE 2-20: Signal-to-Noise Ratio (SNR)
vs. Input Frequency.
FIGURE 2-21: Total Harmonic Distortion
(THD) vs. Input Frequency.
FIGURE 2-22: Offset Error vs.
Temperature.
FIGURE 2-23: Signal-to-Noise and
Distortion (SINAD) vs. Input Frequency.
FIGURE 2-24: Signal-to-Noise and
Distortion (SINAD) vs. Input Signal Level.
-1.0
-0.8
-0.6
-0.4
-0.2
0.0
0.2
0.4
0.6
0.8
1.0
-50-250 255075100
Temperature (°C)
Gain E r ro r ( LS B)
VDD = VREF = 5V
FSAMPLE = 100 ksps
VDD = VREF = 2.7 V
FSAMPLE = 50 ksps
0
10
20
30
40
50
60
70
80
90
100
110100
Input Frequenc y (kHz)
SNR (dB)
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
VDD = VREF = 5V
FSAMPLE = 100 k sp s
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
110100
Input Freque ncy (kHz)
THD (dB)
VDD = VREF = 2.7V
FSAMPLE = 50 ks p s
VDD = VREF = 5V, FSAMPLE = 100 ksps
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.0
-50-250 255075100
Temp er at ure (°C )
Offset Error (LSB)
VDD = VREF = 5V
FSAMPLE = 100 ksps
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
0
10
20
30
40
50
60
70
80
90
100
110100
Inp ut Fr e q uency (k H z )
SINAD (dB)
VDD = VREF = 2.7V
FSAMPLE = 50 ksps
VDD = VREF = 5V
FSAMPLE = 100 ksp s
0
10
20
30
40
50
60
70
80
-40 -35 -30 -25 -20 -15 -10 -5 0
Input Signal Level (dB)
SINAD (dB)
VDD = V REF = 2.7V
FSAMPLE = 50 ksps
VDD = VREF = 5 V
FSAMPLE = 1 0 0 ksps
1998-2011 Microchip Technology Inc. DS21290F-page 11
MCP3201
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C.
FIGURE 2-25: Effective Number of Bits
(ENOB) vs. VREF.
FIGURE 2-26: Spurio us Fre e Dynam ic
Range (SFDR) vs. Input Frequency.
FIGURE 2-27: Frequency Spectrum of
10 kHz input (Representative Part).
FIGURE 2-28: Effective Number of Bits
(ENOB) vs. Input Frequency.
FIGURE 2-29: Power Supply Rejection
(PSR) vs. Ripple Frequency.
FIGURE 2-30: Frequenc y Spe ctru m of
1 kHz input (Representative Part, VDD = 2.7V).
0
10
20
30
40
50
60
70
80
90
100
110100
Input Frequency (kHz)
SFDR (dB )
VDD = VREF = 2.7V
FSAMPLE = 50 ksp s
VDD = VREF = 5V, FSAMPLE = 100 ksps
-130
-120
-110
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
0 10000 20000 30000 40000 50000
Frequency (Hz)
Amplitu de (dB)
VDD = VREF = 5V
FSAMPLE = 100 ksps
FINPUT = 9.98 5k H z
40 96 point s
8.0
8.5
9.0
9.5
10.0
10.5
11.0
11.5
12.0
1 10 100
I nput Fr e quenc y ( k Hz)
ENOB (rms)
VDD = 2.7V
FSAMPLE = 50 ksps
VDD = 5V
FSAMPLE = 100 ksps
-80
-70
-60
-50
-40
-30
-20
-10
0
1 10 100 1000 10000
Ripple Frequency (k Hz)
Power Supply Rejection (dB)
-130
-120
-110
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
0 5000 10000 15000 20000 25000
Fr e quenc y (Hz )
Amplitu de (dB)
VDD = V REF = 2.7V
FSAMPLE = 50 ksps
FINPUT = 998.76 Hz
4096 poin ts
MCP3201
DS21290F-page 12 1998-2011 Microchip Technology Inc.
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C.
FIGURE 2-31: IDD vs. VDD.
FIGURE 2-32: IDD vs. Clock Frequency.
FIGURE 2-33: IDD vs. Temperature.
FIGURE 2-34: IREF vs. VDD.
FIGURE 2-35: IREF vs. Clock Frequency.
FIGURE 2-36: IREF vs. Temperature.
0
50
100
150
200
250
300
350
400
450
500
2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0
VDD (V)
IDD (µA)
VREF = VDD
All points at FCLK = 1.6 MHz, except
at VREF = VDD = 2.5V, FCLK
= 800 kHz
0
50
100
150
200
250
300
350
400
10 100 1000 10000
Clock Frequency (kHz)
IDD (µA)
VDD = V REF = 5 V
VDD = VREF = 2.7V
0
50
100
150
200
250
300
350
400
-50 -25 0 25 50 75 100
Te mper at ure (° C)
IDDA)
VDD = VREF = 5V
FCLK = 1.6 MHz
VDD = VREF = 2.7V
FCLK = 800 kHz
0
10
20
30
40
50
60
70
80
90
100
2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0
VDD (V)
IREF (µA)
VREF = VDD
All points at FCLK = 1.6 MHz, except
at V REF = VDD = 2.5V, FCLK
= 800 kHz
0
10
20
30
40
50
60
70
80
90
100
10 100 1000 10000
Cl ock Freque ncy (k Hz)
IREF (µA)
VDD = VREF = 5V
VDD = VREF = 2.7V
0
10
20
30
40
50
60
70
80
90
100
-50-250 255075100
Te mperature (°C)
IREF (µA)
VDD = VREF = 5V
FCLK = 1.6 MHz
VDD = VREF = 2.7V
FCLK = 800 kHz
1998-2011 Microchip Technology Inc. DS21290F-page 13
MCP3201
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE, TA = +25°C.
FIGURE 2-37: IDDS vs. VDD.
FIGURE 2-38: IDDS vs. Temperature.
FIGURE 2-39: Analog Input Leakage
Current vs. Temperature.
0
10
20
30
40
50
60
70
80
2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0
VDD (V)
IDDS (pA)
VREF = CS = VDD
0.01
0.10
1.00
10.00
100.00
-50 -25 0 25 50 75 100
Temperature (°C)
IDDS (nA)
VDD = VREF = CS = 5V
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.0
-50-250 255075100
Temperature (°C)
Analog Input Leakage (nA)
VDD = VREF = 5V
FCLK = 1.6 MHz
MCP3201
DS21290F-page 14 1998-2011 Microchip Technology Inc.
NOTES:
1998-2011 Microchip Technology Inc. DS21290F-page 15
MCP3201
3.0 PIN DESCRIPTIONS
The descriptions of the pins are listed in Table 3 - 1 .
Additional descriptions of the device pins follows.
TABLE 3-1: PIN FUNCTION TABLE
3.1 Positive Analog Input (IN+)
Positive analog input. This input can vary from IN- to
VREF + IN-.
3.2 Negative Analog Input (IN-)
Negative analog input. This input can vary ±100 mV
from VSS.
3.3 Chip Select/Shutdown (CS/SHDN)
The CS/SHDN pin is used to initiate communication
with the device when pulled low and will end a
conversion and put the device in low power standby
when pulled high. The CS/SHDN pin must be pulled
high between conversions.
3.4 Serial Clock (CLK)
The SPI clock pin is used to initiate a conversion and to
clock out each bit of the conversion as it takes place.
See Section 6.2 “Maintaining Minimum Clock
Speed” for constraints on clock speed.
3.5 Serial Data Output (DOUT)
The SPI serial data output pin is used to shift out the
results of the A/D conversion. Data will always change
on the falling edge of each clock as the conversion
takes place.
MCP3201
Symbol Description
MSOP, PDIP, SOIC,
TSSOP
1V
REF Reference Voltage Input
2 IN+ Positive Analog Input
3 IN- Negative Analog Input
4V
SS Ground
5CS
/SHDN Chip Select/Shutdown Input
6D
OUT Serial Data Out
7 CLK Serial Clock
8V
DD +2.7V to 5.5V Power Supply
MCP3201
DS21290F-page 16 1998-2011 Microchip Technology Inc.
NOTES:
1998-2011 Microchip Technology Inc. DS21290F-page 17
MCP3201
4.0 DEVICE OPERATION
The MCP3201 A/D Converter employs a conventional
SAR architecture. With this architecture, a sample is
acquired on an internal sample/hold capacitor for
1.5 clock cycles starting on the first rising edge of the
serial clock after CS has been pulled low. Following this
sample time, the input switch of the converter opens
and the device uses the collected charge on the
internal sample and hold capacitor to produce a serial
12-bit digital output code. Conversion rates of 100 ksps
are possible on the MCP3201 device. See Section 6.2
“Maintaining M ini mum Clock S pe ed” for information
on minimum clock rates. Communication with the
device is done using a 3-wire SPI-compatible interface.
4.1 Analog Inputs
The MCP3201 device provides a single pseudo-differ-
ential input. The IN+ input can range from IN- to VREF
(VREF + IN-). The IN- input is limited to ±100 mV from
the VSS rail. The IN- input can be used to cancel small
signal common-mode noise which is present on both
the IN+ and IN- inputs.
For the A/D Converter to meet specification, the charge
holding capacitor (CSAMPLE) must be given enough
time to acquire a 12-bit accurate voltage level during
the 1.5 clock cycle sampling period. The analog input
model is shown in Figure 4-1.
In this diagram, it is shown that the source impedance
(RS) adds to the internal sampling switch (RSS)
impedance, directly affecting the time that is required to
charge the capacitor (CSAMPLE). Consequently, a
larger source impedance increases the offset, gain,
and integral linearity errors of the conversion.
Ideally, the impedance of the signal source should be
near zero. This is achievable with an operational
amplifier such as the MCP601, which has a closed loop
output impedance of tens of ohms. The adverse affects
of higher source impedances are shown in Figure 4-2.
If the voltage level of IN+ is equal to or less than IN-, the
resultant code will be 000h. If the voltage at IN+ is equal
to or greater than {[VREF + (IN-)] - 1 LSB}, then the
output code will be FFFh. If the voltage level at IN- is
more than 1 LSB below VSS, then the voltage level at
the IN+ input will have to go below VSS to see the 000h
output code. Conversely, if IN- is more than 1 LSB
above VSS, then the FFFh code will not be seen unless
the IN+ input level goes above VREF level.
4.2 Reference Input
The reference input (VREF) determines the analog input
voltage range and the LSB size, as shown below.
EQUATION 4-1:
As the reference input is reduced, the LSB size is
reduced accordingly. The theoretical digital output code
produced by the A/D Converter is a function of the
analog input signal and the reference input as shown
below.
EQUATION 4-2:
When using an external voltage reference device, the
system designer should always refer to the
manufacturer’s recommendations for circuit layout.
Any instability in the operation of the reference device
will have a direct effect on the operation of the
A/D Converter.
LSB Size VREF
4096
-------------=
Digital Output Code 4096*VIN
VREF
-------------------------=
Where:
VIN = Analog Input Voltage = V(IN+) - V(IN-)
VREF = Reference Voltage
MCP3201
DS21290F-page 18 1998-2011 Microchip Technology Inc.
FIGURE 4-1: Analog Input Model.
FIGURE 4-2: Maximum Clock Frequency
vs. Input Resistance (RS) to maintain less than a
0.1 LSB deviation in INL from nominal
conditions.
CPIN
VA
RSS CHx
7pF
VT = 0.6V
VT = 0.6V ILEAKAGE
Sampling
Switch
SS RS = 1 k
CSAMPLE
= DAC capacitance
VSS
VDD
= 20 pF
±1 nA
Legend:
VA = Signal Source
RSS = Source Impedance
CHx = Input Channel Pad
CPIN = Input Pin Capacitance
VT= Threshold Voltage
ILEAKAGE = Leakage Current At The Pin
Due To Various Junctions
SS = Sampling Switch
RS= Sampling Switch Resistor
CSAMPLE = Sample/hold Capacitance
1998-2011 Microchip Technology Inc. DS21290F-page 19
MCP3201
5.0 SERIAL COMMUNICATIONS
Communication with the device is done using a
standard SPI-compatible serial interface. Initiating
communication with the MCP3201 device begins with
the CS going low. If the device was powered up with the
CS pin low, it must be brought high and back low to
initiate communication. The device will begin to sample
the analog input on the first rising edge after CS goes
low. The sample period will end in the falling edge of the
second clock, at which time the device will output a low
null bit. The next 12 clocks will output the result of the
conversion with MSB first, as shown in Figure 5-1. Data
is always output from the device on the falling edge of
the clock. If all 12 data bits have been transmitted and
the device continues to receive clocks while the CS is
held low, the device will output the conversion result
LSB first, as shown in Figure 5-2. If more clocks are
provided to the device while CS is still low (after the
LSB first data has been transmitted), the device will
clock out zeros indefinitely.
FIGURE 5-1: Communication with MCP3201 device using MSB first Format.
FIGURE 5-2: Communication with MCP3201 device using LSB first Format.
CS
CLK
DOUT
tCYC
POWER
DOWN
TSUCS
TSAMPLE tCONV tDATA**
* After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output LSB first data, followed
by zeros indefinitely. See Figure 5-2 below.
** tDATA: during this time, the bias current and the comparator power-down and the reference input becomes a high-impedance
node, leaving the CLK running to clock out the LSB-first data or zeros.
TCSH
NULL
BIT B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0*
HI-Z HI-Z B11 B10 B9 B8
NULL
BIT
CS
CLK
DOUT
tCYC
POWER DOWN
tSUCS
tSAMPLE tCONV tDATA**
* After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output zeros indefinitely.
** tDATA: during this time, the bias current and the comparator power-down and the reference input becomes a high-impedance
node, leaving the CLK running to clock out the LSB-first data or zeros.
tCSH
NULL
BIT B11B10B9 B8 B7 B6 B5 B4 B3 B2 B1 B0
HI-Z B1 B2 B3 B4 B5 B6 B7 B8 B9 B10B11* HI-Z
MCP3201
DS21290F-page 20 1998-2011 Microchip Technology Inc.
NOTES:
1998-2011 Microchip Technology Inc. DS21290F-page 21
MCP3201
6.0 APPLICATIONS INFORMATION
6.1 Using the MCP3201 Device with
Microcontroller SPI Ports
With most microcontroller SPI ports, it is required to
clock out eight bits at a time. If this is the case, it will be
necessary to provide more clocks than are required for
the MCP3201. As an example, Figure 6-1 and
Figure 6-2 show how the MCP3201 device can be
interfaced to a microcontroller with a standard SPI port.
Since the MCP3201 always clocks data out on the
falling edge of clock, the MCU SPI port must be
configured to match this operation. SPI Mode 0,0 (clock
idles low) and SPI Mode 1,1 (clock idles high) are both
compatible with the MCP3201. Figure 6-1 depicts the
operation shown in SPI Mode 0,0, which requires that
the CLK from the microcontroller idles in the ‘low’ state.
As shown in the diagram, the MSB is clocked out of the
A/D Converter on the falling edge of the third clock
pulse. After the first eight clocks have been sent to the
device, the microcontroller’s receive buffer will contain
two unknown bits (the output is at high-impedance for
the first two clocks), the null bit and the highest order
five bits of the conversion. After the second eight clocks
have been sent to the device, the MCU receive register
will contain the lowest-order seven bits and the B1 bit
repeated as the A/D Converter has begun to shift out
LSB first data with the extra clock. Typical procedure
would then call for the lower-order byte of data to be
shifted right by one bit to remove the extra B1 bit. The
B7 bit is then transferred from the high-order byte to the
lower-order byte, and then the higher-order byte is
shifted one bit to the right as well. Easier manipulation
of the converted data can be obtained by using this
method.
Figure 6-2 shows the same thing in SPI Mode 1,1
which requires that the clock idles in the high state. As
with mode 0,0, the A/D Converter outputs data on the
falling edge of the clock and the MCU latches data from
the A/D Converter in on the rising edge of the clock.
FIGURE 6-1: SPI Communication using 8-bit segments (Mode 0,0: SCLK idles low).
FIGURE 6-2: SPI Communication using 8-bit segments (Mode 1,1: SCLK idles high).
CS
CLK 9 10111213141516
DOUT
NULL
BIT B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0
HI-Z
B7 B6 B5 B4 B3 B2 B1 B0B11 B10 B9 B8??0
MCU latches data from A/D
Data is clocked out of A/D
Converter on falling edges
Converter on rising edges of SCLK
12345678
HI-Z
B1
B1
LSB first data begins
to come out
B2
Data stored into MCU receive register
after transmission of first 8 bits
Data stored into MCU receive register
after transmission of second 8 bits
CS
CLK 9 10111213141516
DOUT
NULL
BIT B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0
HI-Z
B7 B6 B5 B4 B3 B2 B1 B0B11 B10 B9 B8??0
MCU latches data from A/D
Data is clocked out of A/D
Converter on falling edges
Converter on rising edges of SCLK
1234567 8
B1
B1
LSB first data begins
to come out
HI-Z
Data stored into MCU receive register
after transmission of first 8 bits
Data stored into MCU receive register
after transmission of second 8 bits
MCP3201
DS21290F-page 22 1998-2011 Microchip Technology Inc.
6.2 Maint aini ng Minimum Clock Speed
When the MCP3201 initiates the sample period, charge
is stored on the sample capacitor. When the sample
period is complete, the device converts one bit for each
clock that is received. It is important for the user to note
that a slow clock rate will allow charge to bleed off the
sample cap while the conversion is taking place. At
85°C (worst-case condition), the part will maintain
proper charge on the sample capacitor for at least
1.2 ms after the sample period has ended. This means
that the time between the end of the sample period and
the time that all 12 data bits have been clocked out
must not exceed 1.2 ms (effective clock frequency of
10 kHz). Failure to meet this criteria may induce
linearity errors into the conversion outside the rated
specifications. It should be noted that during the entire
conversion cycle, the A/D Converter does not require a
constant clock speed or duty cycle, as long as all timing
specifications are met.
6.3 Buffering/Filtering the Analog
Inputs
If the signal source for the A/D Converter is not a low-
impedance source, it will have to be buffered
or inaccurate conversion results may occur.
See Figure 4-2. It is also recommended that a filter be
used to eliminate any signals that may be aliased back
into the conversion results. This is illustrated in
Figure 6-3 where an op amp is used to drive the analog
input of the MCP3201 device. This amplifier provides a
low-impedance source for the converter input and a
low-pass filter, which eliminates unwanted high-
frequency noise.
Low-pass (anti-aliasing) filters can be designed using
Microchip’s interactive FilterLab® software. FilterLab
will calculate capacitor and resistor values, as well as
determine the number of poles that are required for the
application. For more information on filtering signals,
see application note AN699 “Anti-Aliasing Analog
Filters for Data Acquisition Systems.”
FIGURE 6-3: The MCP 601 Operati ona l
Amplifier is used to implement a 2nd order anti-
aliasing filter for the signal being converted by
the MCP3201 device.
MCP3201
VDD
10 µF
IN-
IN+
-
+
VIN
C1
C2
VREF
4.096V
Reference
F
10 µF
0.1 µF
MCP601
R1
R2
R3
R4
MCP1541 CL
1998-2011 Microchip Technology Inc. DS21290F-page 23
MCP3201
6.4 Layout Consider ations
When laying out a printed circuit board for use with
analog components, care should be taken to reduce
noise wherever possible. A bypass capacitor should
always be used with this device and should be placed
as close as possible to the device pin. A bypass
capacitor value of 1 µF is recommended.
Digital and analog traces should be separated as much
as possible on the board and no traces should run
underneath the device or the bypass capacitor. Extra
precautions should be taken to keep traces with high-
frequency signals (such as clock lines) as far as
possible from analog traces.
Use of an analog ground plane is recommended in
order to keep the ground potential the same for all
devices on the board. Providing VDD connections to
devices in a “star” configuration can also reduce noise
by eliminating current return paths and associated
errors. See Figure 6-4. For more information on layout
tips when using A/D Converter, refer to AN688 “Layout
Tips for 12-Bit A/D Converter Applications”.
FIGURE 6-4: VDD traces arranged in a
‘S tar’ configuration in order to reduce errors
caused by current return paths.
VDD
Connection
Device 1
Device 2
Device 3
Device 4
MCP3201
DS21290F-page 24 1998-2011 Microchip Technology Inc.
NOTES:
1998-2011 Microchip Technology Inc. DS21290F-page 25
MCP3201
7.0 PACKAGING INFORMATION
7.1 Package Marking Information
Legend: XX...X Customer-specific information
Y Year code (last digit of calendar year)
YY Year code (last 2 digits of calendar year)
WW Week code (week of January 1 is week ‘01’)
NNN Alphanumeric traceability code
Pb-free JEDEC designator for Matte Tin (Sn)
*This package is Pb-free. The Pb-free JEDEC designator ( )
can be found on the outer packaging for this package.
Note: In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line, thus limiting the number of available
characters for customer-specific information.
3
e
3
e
8-Lead MSOP (3x3 mm) Example
8-Lead PDIP (300 mil) Example
XXXXXXXX
XXXXXNNN
YYWW
8-Lead SOIC (3.90 mm) Example
NNN
8-Lead TSSOP (4.4 mm) Example
3201CI
130256
3201-B
I/P ^^ 256
1130
3
e
3201-BI
SN ^^1130
3
e
201C
I130
256
256
MCP3201
DS21290F-page 26 1998-2011 Microchip Technology Inc.
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D
N
E
E1
NOTE 1
12
e
b
A
A1
A2 c
L1 L
φ
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1998-2011 Microchip Technology Inc. DS21290F-page 27
MCP3201
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP3201
DS21290F-page 28 1998-2011 Microchip Technology Inc.
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 
 

 

 
   

 
 
    
  
   
   
   
   
   
    
   
  
N
E1
NOTE 1
D
123
A
A1
A2
L
b1
b
e
E
eB
c
   
1998-2011 Microchip Technology Inc. DS21290F-page 29
MCP3201
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP3201
DS21290F-page 30 1998-2011 Microchip Technology Inc.
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
1998-2011 Microchip Technology Inc. DS21290F-page 31
MCP3201
!&'"()#$% *
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
MCP3201
DS21290F-page 32 1998-2011 Microchip Technology Inc.
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
 
 
 
 
 
 

 
   

 
 
    
   
 
    
   
   
  
  
  
  
D
N
E
E1
NOTE 1
12
b
e
c
A
A1
A2
L1 L
φ
   
1998-2011 Microchip Technology Inc. DS21290F-page 33
MCP3201
Note: For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
MCP3201
DS21290F-page 34 1998-2011 Microchip Technology Inc.
NOTES:
1998-2011 Microchip Technology Inc. DS21290F-page 35
MCP3201
APPENDIX A: REVIS ION HISTORY
Revision F (August 2011)
Updated Product Identification System section.
- Corrected marking drawings for MSOP
packages.
- Updated PDIP, SOIC, and TSSOP package
specification drawings.
Revision E (November 2008)
The following is the list of modifications:
1. Updated Section 7.0 “Packaging Informa-
tion”.
2. Updated Product Identification System
section.
Revision D (January 2007)
The following is the list of modifications:
1. This revision includes updates to the packaging
diagrams.
Revision C (August 2001)
The following is the list of modifications:
1. This revision includes undocumented changes.
Revision B (August 1999)
The following is the list of modifications:
1. This revision includes undocumented changes.
Revision A (September 1998)
Original release of this document.
MCP3201
DS21290F-page 36 1998-2011 Microchip Technology Inc.
NOTES:
1998-2011 Microchip Technology Inc. DS21290F-page 37
MCP3201
PRODUCT IDENTIFICATION SYSTEM
To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office.
Device: MCP3201: 12-Bit A/D Converter w/SPI Interface
MCP3201T: 12-Bit A/D Converter w/SPI Interface
(Tape and Reel)
Grade: B: = ± LSB max INL (MSOP and TSSOP not available)
C: = ± LSB max INL
Temperature
Range: I = -40°C to+85°C(Industrial)
Package: MS = Plastic Micro Small Outline (MSOP), 8-lead
P = Plastic DIP (300 mil Body), 8-lead
SN = Plastic SOIC (150 mil Body), 8-lead
ST = Plastic TSSOP (4.4 mm), 8-lead
Examples:
a) MCP3201-BI/P: B Grade,
Industrial Temperature,
8LD PDIP package.
b) MCP3201-BI/SN: B Grade,
Industrial Temperature,
8LD SOIC package.
c) MCP3201-CI/P: C Grade,
Industrial Temperature,
8LD PDIP package.
d) MCP3201-CI/MS: C Grade,
Industrial Temperature,
8LD MSOP package.
e) MCP3201-CI/SN: C Grade,
Industrial Temperature,
8LD SOIC package.
f) MCP3201-CI/ST: C Grade,
Industrial Temperature,
8LD TSSOP package.
g) MCP3201T-BI/SN: Tape and Reel, B Grade,
Industrial Temperature,
8LD SOIC package.
h) MCP3201T-CI/MS: Tape and Reel, C Grade,
Industrial Temperature,
8LD MSOP package.
i) MCP3201T-CI/SN: Tape and Reel, C Grade,
Industrial Temperature,
8LD SOIC package.
j) MCP3201T-CI/ST: Tape and Reel, C Grade,
Industrial Temperature,
8LD TSSOP package.
PART NO. X/XXX
Grade PackageTemperature
Range
Device
MCP3201
DS21290F-page 38 1998-2011 Microchip Technology Inc.
NOTES:
1998-2011 Microchip Technology Inc. DS21290F-page 39
Information contained in this publication regarding device
applications and the like is provided only for your convenience
and may be superseded by updates. It is your responsibility to
ensure that your application meets with your specifications.
MICROCHIP MAKES NO REPRESENTATIONS OR
WARRANTIES OF ANY KIND WHETHER EXPRESS OR
IMPLIED, WRITTEN OR ORAL, STATUTORY OR
OTHERWISE, RELATED TO THE INFORMATION,
INCLUDING BUT NOT LIMITED TO ITS CONDITION,
QUALITY, PERFORMANCE, MERCHANTABILITY OR
FITNESS FOR PURPOSE. Microchip disclaims all liability
arising from this information and its use. Use of Microchip
devices in life support and/or safety applications is entirely at
the buyer’s risk, and the buyer agrees to defend, indemnify and
hold harmless Microchip from any and all damages, claims,
suits, or expenses resulting from such use. No licenses are
conveyed, implicitly or otherwise, under any Microchip
intellectual property rights.
Trademarks
The Microchip name and logo, the Microchip logo, dsPIC,
KEELOQ, KEELOQ logo, MPLAB, PIC, PICmicro, PICSTART,
PIC32 logo, rfPIC and UNI/O are registered trademarks of
Microchip Technology Incorporated in the U.S.A. and other
countries.
FilterLab, Hampshire, HI-TECH C, Linear Active Thermistor,
MXDEV, MXLAB, SEEVAL and The Embedded Control
Solutions Company are registered trademarks of Microchip
Technology Incorporated in the U.S.A.
Analog-for-the-Digital Age, Application Maestro, chipKIT,
chipKIT logo, CodeGuard, dsPICDEM, dsPICDEM.net,
dsPICworks, dsSPEAK, ECAN, ECONOMONITOR,
FanSense, HI-TIDE, In-Circuit Serial Programming, ICSP,
Mindi, MiWi, MPASM, MPLAB Certified logo, MPLIB,
MPLINK, mTouch, Omniscient Code Generation, PICC,
PICC-18, PICDEM, PICDEM.net, PICkit, PICtail, REAL ICE,
rfLAB, Select Mode, Total Endurance, TSHARC,
UniWinDriver, WiperLock and ZENA are trademarks of
Microchip Technology Incorporated in the U.S.A. and other
countries.
SQTP is a service mark of Microchip Technology Incorporated
in the U.S.A.
All other trademarks mentioned herein are property of their
respective companies.
© 1998-2011, Microchip Technology Incorporated, Printed in
the U.S.A., All Rights Reserved.
Printed on recycled paper.
ISBN: 978-1-61341-572-6
Note the following details of the code protection feature on Microchip devices:
Microchip products meet the specification contained in their particular Microchip Data Sheet.
Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the
intended manner and under normal conditions.
There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our
knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data
Sheets. Most likely, the person doing so is engaged in theft of intellectual property.
Microchip is willing to work with the customer who is concerned about the integrity of their code.
Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not
mean that we are guaranteeing the product as “unbreakable.
Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our
products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts
allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.
Microchip received ISO/TS-16949:2009 certification for its worldwide
headquarters, design and wafer fabrication facilities in Chandler and
Tempe, Arizona; Gresham, Oregon and design centers in California
and India. The Company’s quality system processes and procedures
are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping
devices, Serial EEPROMs, microperiph erals, nonvolatile memory and
analog products. In addition, Microchip’s quality system for the design
and manufacture of development systems is ISO 9001:2000 certified.
DS21290F-page 40 1998-2011 Microchip Technology Inc.
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08/02/11