Low-Power Static Random Access memory
Features of 16Mb
Low-Power SRAM
2.7V to 3.6V
45ns max.
0.5mA typ./8mA max.
Wide operating voltage range
Fast access
Features/Advantages for User Product Specifications
In mass production
Product Status
Features of Advanced
Low-Power SRAM
Quick Facts About
Static RAM
Renesas Low Power SRAM
Manufactured using 0.13mm CMOS process. Uses 6-transistor memory cells. ECC* for reduced soft errors.
Source: NIKKEI ELECTRONICS, 2004 3-5
R1LV1616H Series
*ECC : Error checking and correction
It goes without saying that semiconductor memory must be fault free. In fact,
however, memory can sometimes malfunction, though this happens very rarely.
If the malfunction is caused by a defect in the hardware it is sufficient to either
discard the faulty device or to not use the defective portion. is is what is
done with flash memory, for example. With DRAM and SRAM, however,
there are some very rare cases in which the contents of the memory become
reversed, even though the hardware is functioning properly. Unlike most faults
or defects, there is no trace left in the physical memory after the error has
occurred. Such errors are called soft errors. As ever finer processing has come to
be employed in the production of DRAM and similar memory devices, their
inherent susceptibility to soft errors has grown.
Broadly speaking, there are two main causes of soft errors. e first is alpha
radiation. Alpha rays consist of a stream of helium nuclei, which emit
radioactive impurities. When they penetrate silicon, an electrical charge is
generated. e charge builds up at the memory nodes and cause the data values
to reverse. e sources of such alpha radiation are materials such as aluminum,
copper, and resin that are used in the memory devices. It is therefore possible
to minimize alpha radiation by carefully scrutinizing the materials used in the
fabrication of memory devices.
e second main cause of soft errors is neutron radiation from outer space.
rough previously not a problem for terrestrial applications, advances in
recent years in the fabrication of ultrafine high-grade SRAM have made it clear
that neutron radiation can in fact have an effect on earthbound electronic
devices. When neutron radiation from outer space penetrates a memory chip,
some of the neutrons collide with the nuclei of the silicon atoms. It is thought
that this causes charged particles to be released and sets the nuclei of the silicon
atoms in motion, generating large electrical charges. is is believed to be the
mechanism that causes the errors. Neutron radiation presents a more difficult
problem than alpha radiation because, unlike the latter, it originates outside the
chip, indeed outside the earth. In addition, neutron radiation easily penetrates
shielding layers. erefore, the first defense against soft errors caused by
neutron radiation is to make the memory cells themselves less susceptible to
having their values reversed. It is also necessary to make sure that errors that do
occur will not affect neighboring cells. is is what Renesas Technology does in
its advanced low-power SRAM products.
Nevertheless, it is important to recognize that soft errors do in fact occur and
to put in place measures to correct them. One approach is to incorporate error
checking and correction (ECC) circuitry into the memory chip. e ECC
circuitry corrects soft errors automatically so that it seems from the outside that
the memory operates flawlessly. e illustration below shows a neutron
radiation evaluation system used by Renesas Technology. e amount of
neutron radiation varies at different locations on the earth, so we collect data
on neutron radiation levels in different regions worldwide. rough a
combination of both basic and applied research we are finding ways to further
improve the performance of our SRAM products.
Low current consumption
in standby mode
Features/Advantages for User
Product Specifications
Advantages of advanced low-power SRAM
Smaller chips (about half the cell size of full CMOS) in smaller packages
Capacitor cells for dramatically improved resistance to soft errors
64 Mb products employ 32 Mb + 32 Mb stacked MCP* technology for
the large density in the industry.
8Mb (1Mx8/512Kx16) 16Mb (2Mx8/1Mx16)4Mb (512Kx8/256Kx16) 32Mb (4Mx8/2Mx16) 64Mb (8Mbx8/4Mbx16)
2.4V to 3.6V 2.7V to 3.6V2.7V to 3.6V 2.7V to 3.6V 2.7V to 3.6V
R1LV0808A/
R1LV0816A R1LV1616R
R1LV0408D/
R1LV0416D/R1LV0414D
R1WV3216R/
R1LV3216R R1WV6416R
35mA(max.)
20mA(typ.)
40mA(max.)
25mA(typ.)
25mA(max.) 55mA(max.)
40mA(typ.)
60mA(max.)
45mA(typ.)
1.2µA typ.
@3.0V, 25°C
2µA typ.
@3.0V, 25°C
1µA typ.
@3.0V, 25°C
4µA max.
@3.0V, 25°C
8µA max.
@3.0V, 25°C
Chip / Wafer
48pin TSOP(I)
44pin TSOP(II)
52pin µTSOP(II)
48ball FBGA
Chip / Wafer
48pin TSOP(I)
52pin µTSOP(II)
48ball FBGA/Wafer Level CSP
Chip / Wafer
32pin SOP
32pin sTSOP(I)/TSOP(II)
44pin TSOP(II)
48ball FBGA/Wafer Level CSP
Chip / Wafer
48pin TSOP(I)
52pin µTSOP(II)
48ball FBGA
48pin TSOP(I)
52pin µTSOP(II)
48ball FBGA
I : -40°C to 85°C
R : 0°C to 70°C
I : -40°C to 85°C
R : 0°C to 70°C
I : -40°C to 85°C
R : 0°C to 70°C
I : -40°C to 85°C
R : 0°C to 70°C
I : -40°C to 85°C
*MCP : Multi Chip Package
A new memory cell design combining SRAM cells and DRAM capacitors.
Cell area is greatly reduced and soft errors are virtually eliminated.
Stack Load Tr.
TFT Transistors
Latch-up free
Smaller Drive Transistors
DRAM Capacitors
Soft Error free
Reduced Cell size
High Reliability
Main Applications
Wide range of applications including industrial, consumer, office,
and communications equipment
Product No.
Operating current
(duty=100%)
Standby current
Operating temperature range
Package
Operating power supply voltage
Density (configuration)
Integrated Core
Technologies
ECC circuit corrects bit faults so data is read correctly.
Hardening against soft errors by incorporating ECC
Data Parity
ECC circuit
Data
Rapid increase in soft errors caused by neutron
radiation in 0.13mm SRAM
Difficult to maintain data storage integrity
Innate susceptibility to bit faults due to soft errors
R1LV1616H
2.7V to 3.6V
20mA max.
45/55ns
8µA max.
8µA max.
-40 to 85
TSOP(I)-48pin*1
FBGA(CSP)-48ball
Part No.
Power supply voltage
Operating current
Access time
Standby current [ISB1]
SI version
Data retention current [ICCDR] SI version
Operating temperature range
Package
Configuration
16Mb
1M×16/2M×8*1
*1 : TSOP version only. Switchable to x 8 mode using BYTE# pin.
Neutron Radiation Evaluation System Diagram
Proton radiation
Sample (test board) Neutron radiation
Li plate target
0605