5900PB(400070)-RP750*3906132 - AAVID THERMALLOY

TLP552

2009-02-17

TOSHIBA Photocoupler GaAℓAs IRED & Photo IC

TLP552

Isolated Line Receiver

Simplex/Multiplex Data Transmission

Computer-Peripheral Interface

Microprocessor System Interface

Digital Isolation for A-D, D-A Conversion

The TOSHIBA TLP552 is a photocoupler which combines a GaAℓAs

IRED LED as the emitter and an integrated high gain, high speed

photodetector. This unit is 8-lead DIP.

The output of the detector circuit is an open collector, schottky clamped

transistor.

• TTL/LSTTL compatible: VCC = 5 V

• Isolation voltage: 2500 Vrms (min)

• Switching speed: tpHL, tpLH = 60 ns (typ.) (@RL = 350 Ω)

• Guaranteed performance over temp.: 0 to 70°C

• UL recognized: UL1577, file no. E67349

Truth Table (positive logic)

Input Enable Output

H H L

L H H

H L H

L L H

Note: A 0.1 μF bypass capacitor must be connected between pins 8 and 5 (see "Instruction for use" on page 3).

Pin Configurations (top view) Schematic

Unit: mm

JEDEC ⎯

JEITA ⎯

TOSHIBA 11-10C4

Weight: 0.54 g (typ.)

1: N.C.

2: Anode

3: Cathode

4: N.C.

5: GND

6: Output

(open collector)

7: Enable

8: VCC

ICC

VCC

7 VE

GND

−

TLP552

2009-02-17

Absolute Maximum Ratings (Ta = 25°C)

Characteristics Symbol Rating Unit

Forward current IF 20 mA

Pulse forward current (Note 1) IFP 40 mA

Peak transient forward current (Note 2) IFPT 0.5 A

Reverse voltage VR 5 V

LED

Diode power dissipation PD 40 mW

Output current IO 50 mA

Output voltage VO 7 V

Supply voltage (Note 3) VCC 7 V

Enable input voltage (Note 4) VE 5.5 V

Detector

Output collector power dissipation PO 85 mW

Operating temperature range Topr 0 to 70 °C

Storage temperature range Tstg −55 to 125 °C

Lead solder temperature (10 s) (Note 5) Tsol 260 °C

Isolation voltage (AC, 1 min., R.H. ≤ 60%)

(Note 6)

BVS 2500 Vrms

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the

significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if

the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum

ratings and the operating ranges.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook

(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report

and estimated failure rate, etc).

Note 1: 50% duty cycle, 1 ms pulse width.

Note 2: Pulse width ≤ 1μs, 300 pps.

Note 3: 1 minute maximum.

Note 4: Not to exceed VCC by more than 500 mV.

Note 5: Soldering portion of lead: up to 2 mm from the body of the device.

Note 6: Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5, 6, 7 and 8 shorted

together.

Recommended Operating Conditions

Characteristics Symbol Min Typ. Max Unit

Input current, low level IFL 0 ⎯ 250 μA

Input current, high level IFH 7 ⎯ 20 mA

Supply voltage, output VCC 4.5 ⎯ 5.5 V

High level enable voltage VEH 2.0 ⎯ VCC V

Low level enable voltage VEL 0 ⎯ 0.8 V

Fan out (TTL load) N ⎯ ⎯ 8 ⎯

Operating temperature Topr 0 ⎯ 70 °C

Note: The recommended operating conditions are given as a design guideline to obtain expected performance of the

device. In addition, each item is an independent guideline. In developing designs using this product, please

confirm the specified characteristics shown in this document.

TLP552

2009-02-17

Electrical Characteristics (unless otherwise specified, for 0°C ≤ Ta ≤ 70°C)

Characteristics Symbol Test Condition Min Typ. Max Unit

Input forward voltage VF I

F = 10 mA, Ta = 25°C ⎯ 1.65 1.8 V

Input diode temperature coefficient ΔVF/ΔTa I F = 10 mA ⎯ −2.0 ⎯ mV/°C

Input reverse current IR VR = 5 V, Ta = 25°C ⎯ ⎯ 10 μA

Input capacitance CT V

F = 0 V, f = 1 MHz, Ta = 25°C ⎯ 45 ⎯ pF

High level output current IOH VCC = 5.5 V, VO = 5.5 V

IF = 250 μA, VE = 2.0 V ⎯ 10 250 μA

Low level output voltage VOL

VCC = 5.5 V, IF = 5 mA

VEH = 2.0 V, IOL = 13 mA

(sinking)

⎯ 0.4 0.6 V

Input current logic low output level IFH

IOL = 13 mA (sinking),

VO = 0.6 V, VCC = 5.5 V,

VEH = 2.0 V

⎯ ⎯ 5 mA

High level enable current IEH V

CC = 5.5 V, VE = 2.0 V ⎯ −1.0 ⎯ mA

Low level enable current IEL V

CC = 5.5 V, VE = 0.5 V ⎯ −1.6 −2.0 mA

High level supply current ICCH V

CC = 5.5 V, IF = 0 mA, VE = 0.5 V ⎯ 7 15 mA

Low level supply current ICCL V

CC = 5.5 V, IF = 10 mA, VE = 0.5 V ⎯ 12 18 mA

Current transfer ratio CTR IF = 5.0 mA, RL = 100 Ω

VCC = 5.0 V, Ta = 25°C ⎯ 1000 ⎯ %

Resistance (input-output) RS V

S = 500 V, R.H. ≤ 60%, Ta = 25°C 5 × 1010 1014 ⎯ Ω

Capacitance (input-output) CS V

S = 0 V, f = 1 MHz, Ta = 25°C ⎯ 0.6 ⎯ pF

Switching Characteristics (Ta = 25°C, VCC = 5 V)

Characteristics Symbol

Te s t

Circuit Test Condition Min Typ. Max Unit

Propagation delay time to high output

level (L → H) tpLH 1

RL = 350 Ω, CL = 15 pF

IF = 7.5 mA ⎯ 60 120 ns

Propagation delay time to low output

level (H → L) tpHL 1

RL = 350 Ω, CL = 15 pF

IF = 7.5 mA ⎯ 60 120 ns

Output rise fall time (10 to 90%) tr, tf 1

RL = 350 Ω, CL = 15 pF

IF = 7.5 mA ⎯ 30 ⎯ ns

Propagation delay time of enable from

VEH to VEL tELH 2

RL = 350 Ω, CL = 15 pF

IF = 7.5 mA, VEH = 3.0 V ⎯ 25 ⎯ ns

Propagation delay time of enable from

VEL to VEH tEHL 2

RL = 350 Ω, CL = 15 pF

IF = 7.5 mA, VEH = 3.0 V ⎯ 25 ⎯ ns

Common mode transient immunity at

logic high output level CMH 3

VCM = 200 V, RL = 350 Ω

VO (min) = 2 V, IF = 0 mA ⎯ 200 ⎯ V / μs

Common mode transient immunity at

logic low output level CML 3

VCM = 200 V, RL = 350 Ω

VO (max) = 0.8 V, IF = 5 mA ⎯ −500 ⎯ V / μs

Instruction for use

1. A ceramic capacitor (0.1 μF) should be connected from pin 8 and pin 5 to stabilize the operation of the high gain

linear amplifier. Failure to provide the bypassing may impair the switching properties. The total lead length

between the capacitor and coupler should not exceed 1 cm.

2. Maximum electrostatic discharge voltage for any pins: 180 V (C = 200 pF, R = 0).

TLP552

2009-02-17

Test Circuit 1: Switching Time Test Circuit

Test Circuit 2: Switching Time Test Circuit

Test Circuit 3: Common Mode Noise Immunity Test Circuit

CMH: The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high

output state (i.e., VO > 2.0 V). Measured in volts per microsecond (V / μs).

CML: The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low

output state (i.e., VO < 0.8 V). Measured in volts per microsecond (V / μs).

Pulse generator

IF = 7.5 mA

5 V

Output VO

Monitoring

node

ZO = 50 Ω

tr = 5 ns

0.1 μF

350 Ω

CL is approximately 15 pF which includes probe and stray

wiring capacitance.

tEHL

1.5 V 1.5 V

VOL

5 V

tELH

3 V

0 V

1.5 V

Pulse generator

51 Ω

5 V

Output VO

Monitoring

node

ZO = 50 Ω

tr = 5 ns

Monitoring

node

0.1 μF

350 Ω

CL is approximately 15 pF which includes probe and stray

wiring capacitance.

1.5 V 1.5 V

VOL

5 V

7.5 mA

0 mA

3.75 mA

0.5 V

4.5 V

VCM

Pulse generator

ZO = 50 Ω

CMH = s)(t

(V)160

rμ, CML = s)(t

(V)160

fμ

5 V

Output VO

Monitoring

node

0.1 μF

350 Ω

VCM

0 V

trt

200 V

90%

10%

5 V

2 V

0.8 V

(IF = 0 mA)

(IF = 5 mA)

VOL

CL is approximately 15 pF which includes probe and stray

wiring capacitance.

TLP552

2009-02-17

TLP552

2009-02-17

TLP552

2009-02-17

RESTRICTIONS ON PRODUCT USE

• Toshiba Corporation, and its subsidiaries and affiliates (collectively “TOSHIBA”), reserve the right to make changes to the information

in this document, and related hardware, software and systems (collectively “Product”) without notice.

• This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with

TOSHIBA’s written permission, reproduction is permissible only if reproduction is without alteration/omission.

• Though TOSHIBA works continually to improve Product’s quality and reliability, Product can malfunction or fail. Customers are

responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and

systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily

injury or damage to property, including data loss or corruption. Before creating and producing designs and using, customers must also

refer to and comply with (a) the latest versions of all relevant TOSHIBA information, including without limitation, this document, the

specifications, the data sheets and application notes for Product and the precautions and conditions set forth in the “TOSHIBA

Semiconductor Reliability Handbook” and (b) the instructions for the application that Product will be used with or for. Customers are

solely responsible for all aspects of their own product design or applications, including but not limited to (a) determining the

appropriateness of the use of this Product in such design or applications; (b) evaluating and determining the applicability of any

information contained in this document, or in charts, diagrams, programs, algorithms, sample application circuits, or any other

referenced documents; and (c) validating all operating parameters for such designs and applications. TOSHIBA ASSUMES NO

LIABILITY FOR CUSTOMERS’ PRODUCT DESIGN OR APPLICATIONS.

• Product is intended for use in general electronics applications (e.g., computers, personal equipment, office equipment, measuring

equipment, industrial robots and home electronics appliances) or for specific applications as expressly stated in this document.

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SALE, USE OF PRODUCT, OR INFORMATION, INCLUDING WARRANTIES OR CONDITIONS OF MERCHANTABILITY, FITNESS

FOR A PARTICULAR PURPOSE, ACCURACY OF INFORMATION, OR NONINFRINGEMENT.

• GaAs (Gallium Arsenide) is used in Product. GaAs is harmful to humans if consumed or absorbed, whether in the form of dust or vapor.

Handle with care and do not break, cut, crush, grind, dissolve chemically or otherwise expose GaAs in Product.

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Please use Product in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances,

including without limitation, the EU RoHS Directive. TOSHIBA assumes no liability for damages or losses occurring as a result of

noncompliance with applicable laws and regulations.