© Semiconductor Components Industries, LLC, 2011
June, 2011 − Rev. 8
1Publication Order Number:
MC14001B/D
MC14001B Series
B-Suffix Series CMOS Gates
MC14001B, MC14011B, MC14023B,
MC14025B, MC14071B, MC14073B,
MC14081B, MC14082B
The B Series logic gates are constructed with P and N channel
enhancement mode devices in a single monolithic structure
(Complementary MOS). Their primary use is where low power
dissipation and/or high noise immunity is desired.
Features
•Supply Voltage Range = 3.0 Vdc to 18 Vdc
•All Outputs Buffered
•Capable of Driving Two Low−power TTL Loads or One Low−power
Schottky TTL Load Over the Rated Temperature Range.
•Double Diode Protection on All Inputs Except: Triple Diode
Protection on MC14011B and MC14081B
•Pin−for−Pin Replacements for Corresponding CD4000 Series
B Suffix Devices
•These Devices are Pb−Free and are RoHS Compliant
MAXIMUM RATINGS (Voltages Referenced to VSS)
Symbol Parameter Value Unit
VDD DC Supply Voltage Range −0.5 to +18.0 V
Vin, Vout Input or Output Voltage Range
(DC or Transient)
−0.5 to VDD + 0.5 V
Iin, Iout Input or Output Current
(DC or Transient) per Pin
±10 mA
PDPower Dissipation, per Package
(Note 1)
500 mW
TAAmbient Temperature Range −55 to +125 °C
Tstg Storage Temperature Range −65 to +150 °C
TLLead Temperature
(8−Second Soldering)
260 °C
VESD ESD Withstand Voltage
Human Body Model
Machine Model
Charged Device Model
> 3000
> 300
N/A
V
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. Temperature Derating:
Plastic “P and D/DW” Packages: – 7.0 mW/_C From 65_C To 125_C
This device contains protection circuitry to guard against damage due to high
static voltages or electric fields. However, precautions must be taken to avoid
applications of any voltage higher than maximum rated voltages to this
high−impedance circuit. For proper operation, Vin and Vout should be constrained
to the range VSS v (Vin or Vout) v VDD.
Unused inputs must always be tied to an appropriate logic voltage level
(e.g., either VSS or VDD). Unused outputs must be left open.
Device Description
DEVICE INFORMATION
MC14001B Quad 2−Input NOR Gate
MC14011B Quad 2−Input NAND Gate
MC14023B Triple 3−Input NAND Gate
MC14025B Triple 3−Input NOR Gate
MC14071B Quad 2−Input OR Gate
MARKING
DIAGRAMS
1
14
PDIP−14
P SUFFIX
CASE 646
MC140xxBCP
AWLYYWWG
SOIC−14
D SUFFIX
CASE 751A
TSSOP−14
DT SUFFIX
CASE 948G
1
14
140xxBG
AWLYWW
14
0xxB
ALYWG
G
1
14
xx = Specific Device Code
A = Assembly Location
WL, L = Wafer Lot
YY, Y = Year
WW, W = Work Week
G or G= Pb−Free Package
SOEIAJ−14
F SUFFIX
CASE 965
1
14
MC140xxB
ALYWG
MC14073B Triple 3−Input AND Gate
MC14081B Quad 2−Input AND Gate
MC14082B Dual 4−Input AND Gate
See detailed ordering and shipping information in the package
dimensions section on page 8 of this data sheet.
ORDERING INFORMATION
http://onsemi.com
(Note: Microdot may be in either location)