== "=" Semiconductor High Performance E2?CMOS PLD uaneue Corporation Generic Array Logic [Features Functional Block Diagram * HIGH PERFORMANCE E?CMOS TECHNOLOGY vCLK > 7.5 ns Maximum Propagation Delay clk Fmax = 100 MHz 6ns Maximum from Clock Input to Data Output TTL Compatible 12 mA Outputs UltraMOS Advanced CMOS Technology 1 * 50% REDUCTION IN POWER FROM BIPOLAR 75mA Typ Icc ACTIVE PULL-UPS ON ALL PINS (GAL16V8D-7 and GAL16V8D-10) E? CELL TECHNOLOGY | Reconfigurable Logic Reprogrammable Cells 100% Tested/100% Yields High Speed Electrical Erasure (<100ms) 20 Year Data Retention * EIGHT OUTPUT LOGIC MACROCELLS Maximum Flexibility for Complex Logic Designs Programmable Output Polarity Also Emulates 20-pin PAL Devices with Full Function/ Fuse Map/Parametric Compatibility | eS * PRELOAD AND POWER-ON RESET OF ALL REGISTERS 100% Functional Testability * APPLICATIONS INCLUDE: |e DMA Control State Machine Control High Speed Graphics Processing Standard Logic Speed Upgrade ELECTRONIC SIGNATURE FOR IDENTIFICATION Pin Configuration The GAL16V8/883 is a high performance E?CMOS program- +H Latti ce GAL 16V8/883 VO/Q VO/Q VO/Q I h Tp r VOo/Q ec = 9 VO/Q ~ VO/Q ~ VO/Q iia ~ VO/Q VOE mable logic device processed in full compliance to MIL-STD-883. CERDIP This military grade device combines a high performance CMOS process with Electrically Erasable (E*) floating gate technology to Lcc veLK [] 1 7 959 t] vec provide the highest speed/power performance available in the 883 qualified PLD market. The GAL16V8D/883, at 7.5ns maxi- iQ [] vora mum propagation delay time, is the world's fastest military quali- io Hora fied CMOS PLD. The generic GAL architecture provides maximum design flexibil- Vora iq GAL H] vole ity by allowing the Output Logic Macrocell (OLMC) to be config- Vola ifs 16V8 [] vor ured by the user. The GAL16V8/883 is capable of emulating all GAL16V8 v01a standard 20-pin PAL devices with full function/fuse map/para- . iQ 15 |] Vola metric compatibility. Top View tora iC H vole Unique test circuitry and reprogrammable cells allow complete voia IC vole AC, DC, and functional testing during manufacture. Therefore, = Lattice Semiconductor delivers 100% field programmability and 1 GND WOE VOIa Vola iC [] vor functionality of all GAL products. In addition, 100 erase/write 10 4 _ cycles and data retention in excess of 20 years are specified. @np | [] VOE Copyright 1999 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without notice. LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A. February 1999 Tel. (503) 681-0118; 1-888-ISP-PLDS; FAX (503) 681-3037; http:/Avww.latticesemi.com 16v8mil_03 1Lattice gueut= Semiconductor sauuee Corporation Specifications GAL 16V8D-7/10/883 Absolute Maximum Ratings Recommended Operating Conditions SUPPly VOIAGE Vg -ceeeccce cesses esteeeteeteteees -0.5to +7V Input voltage applied ........... ee 2.5 to V,, +1.0V Off-state output voltage applied ......... 2.5 to V,, +1.0V Storage Temperature ............0:::::eeeeeee -65 to 150C Case Temperature with Power Applied ..........:ccececeeeeeestreeeeeeeees 55 to 125C 1.Stresses above those listed under the Absolute Maximum Rat- ings may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications). Case Temperature (T,,) Supply voltage (V,,) with Respect to Ground 55 to 125C +4.50 to +5.50V DC Electrical Characteristics Over Recommended Operating Conditions (Unless Otherwise Specified) SYMBOL |} PARAMETER CONDITION MIN. | TYP* | MAX. | UNITS VIL Input Low Voltage Vss-0.5| 0.8 VIH Input High Voltage 2.0 | Vec+1 HL Input or 1/O Low Leakage Current OV < Vin< Vit (MAX.) _ _ 100 HA HH Input or I/O High Leakage Current 3.5V < Vin< Voc _ _ 10 HA VoL Output Low Voltage lo. = MAX. Vin = Vicor Vio _ _ 0.5 VoH Output High Voltage loH = MAX. Vin= Vicor ViH 2.4 _ _ IoL Low Level Output Current _ _ 12 mA IOH High Level Output Current _ _ -2 mA los? Output Short Circuit Current Vec=5V Vout=0.5V T,= 25C 30 _ 150 mA Icc Operating Power Vit=0.5V Vi=3.0V L-7/-10 _ 75 130 mA Supply Current fioggle = 15MHz Outputs Open 1) The leakage current is due to the internal pull-up on all pins. See Input Buffer section for more information. 2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester ground degradation. Characterized but not 100% tested. 3) Typical values are at Vcc = 5V and Ta = 25 CLattice Specifications GAL16V8D-7/10/883 tuum Corporation AC Switching Characteristics Over Recommended Operating Conditions -7 -10 PARAMETER] cts, | DESCRIPTION UNITS " MIN. |MAX. | MIN. | MAX. tpd A Input or I/O to Combinational Output 1 7.5 2 10 ns tco A Clock to Output Delay 1 6 1 7 ns tof? _ Clock to Feedback Delay _ 6 _ 7 ns tsu Setup Time, Input or Feedback before ClockT 7 10 ns th Hold Time, Input or Feedback after ClockT ) ) ns A Maximum Clock Frequency with 76.9 | |588 | MHz External Feedback, 1/(tsu + tco) fmax? A Maximum Clock Frequency with 76.9 | |588 | MHz Internal Feedback, 1/(tsu + tcf) A Maximum Clock Frequency with 100 |625 | MHz No Feedback twh _ Clock Pulse Duration, High 5 _ 8 _ ns twi _ Clock Pulse Duration, Low 5 _ 8 ns ten B Input or I/O to Output Enabled 1 9 _ 10 ns B OE to Output Enabled 1 7 10 ns tdis Cc Input or I/O to Output Disabled 1 9 _ 10 ns C OE to Output Disabled 1 7 _ 10 ns 1) Refer to Switching Test Conditions section. 2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section. 3) Refer to fmax Descriptions section. Capacitance (T, = 25C, f = 1.0 MHz) SYMBOL PARAMETER MAXIMUM* UNITS TEST CONDITIONS C, Input Capacitance 10 pF Voge = 5.0V, V, = 2.0V Cio /O Capacitance 10 pF Vog = 9-0V, Vo = 2.0V *Characterized but not 100% tested.Lattice Specifications GAL 16V8D/883 sauuee Corporation Absolute Maximum Ratings Recommended Operating Conditions SUPPly VOIAGE Vg -ceeeccce cesses esteeeteeteteees 0.5to +7V Case Temperature (T.,) .....ccccccceccesencnes 55 to 125C Input voltage applied ........... ee 2.5 to V,, +1.0V Supply voltage (V,,) Off-state output voltage applied ......... 2.5 to V,, +1.0V with Respect to Ground ...............008 +4.50 to +5.50V Storage Temperature ............0:::::eeeeeee -65 to 150C Case Temperature with Power Applied ..........:ccececeeeeeestreeeeeeeees 55 to 125C 1.Stresses above those listed under the Absolute Maximum Rat- ings may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications). DC Electrical Characteristics Over Recommended Operating Conditions (Unless Otherwise Specified) SYMBOL | PARAMETER CONDITION MIN. | TYP? | MAX. | UNITS VIL Input Low Voltage Vss-0.5| 0.8 VIH Input High Voltage 2.0 | Vec+1 Vv Hi Input or 1/O Low Leakage Current OV < Vin< Vit (MAX.) _ _ 10 HA IH Input or I/O High Leakage Current 3.5V < Vin < Voc _ _ 10 HA VoL Output Low Voltage lo. = MAX. Vin = Vitor Vio _ _ 0.5 VOH Output High Voltage loH = MAX. Vin = Vitor ViH 2.4 _ _ IOL Low Level Output Current _ _ 12 mA IOH High Level Output Current _ _ -2 mA los' Output Short Circuit Current Vcc =5V Vout =0.5V T,= 25C -30 _ -150 mA Icc Operating Power Vit=0.5V ViH=3.0V L -15/ -20/-30 _ 75 130 mA Supply Current fioggle = 15MHz Outputs Open 1) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester ground degradation. Characterized but not 100% tested. 3) Typical values are at Vcc = 5V and Ta = 25 CLattice uuu Semiconductor sauuee Corporation Specifications GAL 16V8D/883 AC Switching Characteristics Over Recommended Operating Conditions TEST -15 -20 -30 PARAMETER) ,_| DESCRIPTION UNITS COND. MIN. |MAX. | MIN. |MAX.| MIN. | MAX. tpd A Input or I/O to Combinational Output 3 15 3 20 3 30 ns tco A Clock to Output Delay 2 12 2 15 2 20 ns tof? _ | Clock to Feedback Delay | 12 | 15 _ 20 ns tsu | Setup Time, Input or Feedback before ClockT 12| | 15/ | 25] ] nos th | Hold Time, Input or Feedback after ClockT o/]|]oj]]oy] !] ns A Maximum Clock Frequency with 41.6] | 33.3] | 22.2) | MHz External Feedback, 1/(tsu + tco) fmax? A Maximum Clock Frequency with 41.6} | 33.3] | 22.2;| | MHz Internal Feedback, 1/(tsu + tcf) A Maximum Clock Frequency with 50 | | 41.6] | 33.3) | MHz No Feedback twh _ Clock Pulse Duration, High 10); 12 | 15 _ ns twi _ Clock Pulse Duration, Low 10}; 12 | 15 ns ten B Input or I/O to Output Enabled | 15 | 20 = 30 ns B OE to Output Enabled | 15 | 18 _ 25 ns tdis Cc Input or I/O to Output Disabled | 15 | 20 _ 30 ns Cc OE to Output Disabled | 15 | 18 _ 25 ns 1) Refer to Switching Test Conditions section. 2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section. 3) Refer to fmax Descriptions section. Capacitance (T, = 25C, f = 1.0 MHz) SYMBOL PARAMETER MAXIMUM* UNITS TEST CONDITIONS C, Input Capacitance 10 pF Voge = 5.0V, V, = 2.0V Cio /O Capacitance 10 pF Vog = 9-0V, Vo = 2.0V *Characterized but not 100% tested.Lattice gueut= Semiconductor sauuee Corporation Specifications GAL 16V8/883 Switching Waveforms INPUT or V/O FEEDBACK VALID INPUT tpd COMBINATIONAL OUTPUT Combinatorial Output INPUT or V/O FEEDBACK tdis ten COMBINATIONAL OUTPUT Input or I/O to Output Enable/Disable twh twl CLK 1/fmax (w/o fb) Clock Width INPUT or VO FEEDBACK VALID INPUT -tsu th CLK tco REGISTERED OUTPUT 1/imax <_ (external fdbk) Registered Output OE tdis ten REGISTERED OUTPUT OE to Output Enable/Disable CLK 1/fmax (internal fdbk) tef tsu FEEDBACK REGISTERED fmax with FeedbackLattice gueut= Semiconductor sauuee Corporation Specifications GAL 16V8/883 fmax Descriptions LOGIC > ARRAY REGISTER }- tsu _ >| + tco _> fmax with External Feedback 1/(tsu+tco) Note: fmax with external feedback is calculated from measured tsu and tco. je tu + th_ | fmax with No Feedback Note: fmax with no feedback may be less than 1/(twh + tw). This is to allow for a clock duty cycle of other than 50%. CLK | ae +P) Loaic : i ARRAY > REGISTER : fmax with Internal Feedback 1/(tsu+tcf) Note: tcf is a calculated value, derived by subtracting tsu from the period of fmax w/internal feedback (tcf = 1/fmax - tsu). The value of tcf is used primarily when calculating the delay from clocking a register to a combinatorial output (through registered feedback), as shown above. For example, the timing from clock to a combinatorial output is equal to tcf + tpd. Switching Test Conditions GND to 3.0V 3ns 10% 90% Input Pulse Levels Input Rise and Fall Times Input Timing Reference Levels 1.5V Output Timing Reference Levels 1.5V Output Load See Figure 3-state levels are measured 0.5V from steady-state active level. Output Load Conditions (see figure) Test Condition Ri Re CL A 3909, 7509, 50pF B Active High eo 7500. 50pF Active Low 3900 7500. 50pF Cc Active High eo 7500. 5pF Active Low 3900 7500. 5pF +5V Ri FROM OUTPUT (O/Q) UNDER TEST TEST POINT * Ra L *C,_ INCLUDES TEST FIXTURE AND PROBE CAPACITANCELattice Specifications GAL 16V8/883 tuum Corporation GAL16V8 Ordering Information (MIL-STD-883 and SMD) Ordering # Tpd Tsu Tco Icc (ns) (ns) (ns) (mA) Package MIL-STD-883 SMD # 7.5 7 6 130 |20-Pin CERDIP GAL16V8D-7LD/883 5962-8983907RA 130 |20-Pin LCC GAL16V8D-7LR/883 5962-89839072A 10 10 7 130 |20-Pin CERDIP GAL16V8D-10LD/883 5962-8983904RA 130 |20-Pin LCC GAL16V8D-10LR/883 5962-89839042A 15 12 12 130 |20-Pin CERDIP GAL16V8D-15LD/883 5962-8983903RA 130 |20-Pin LCC GAL16V8D-15LR/883 5962-89839032A 20 15 15 130 |20-Pin CERDIP GAL16V8D-20LD/883 5962-8983902RA 130 |20-Pin LCC GAL16V8D-20LR/883 5962-89839022A 30 25 20 130 |20-Pin CERDIP GAL16V8D-30LD/883 5962-8983901RA Note: Lattice Semiconductor recognizes the trend in military device procurement towards using SMD compliant devices, as such, ordering by this number is recom- mended. Part Number Description XXXXXXXX XX X X X GAL16V8D Device Name MIL Process /883 = 883 Process Speed (ns) Package D =CERDIP R=LCC L=Low Power Power