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ON Semiconductor and the ON Semiconductor logo are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor's product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. "Typical" parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including "Typicals" must be validated for each customer application by customer's technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. FDMS3602AS PowerTrench(R) Power Stage Asymmetric Dual N-Channel MOSFET Features General Description Q1: N-Channel This device includes two specialized N-Channel MOSFETs in a Max rDS(on) = 5.6 m at VGS = 10 V, ID = 15 A dual PQFN package. The switch node has been internally Max rDS(on) = 8.5 m at VGS = 4.5 V, ID = 14 A connected to enable easy placement and routing of synchronous buck converters. The control MOSFET (Q1) and synchronous Q2: N-Channel SyncFET (Q2) have been designed to provide optimal power Max rDS(on) = 2.2 m at VGS = 10 V, ID = 26 A efficiency. Max rDS(on) = 3.4 m at VGS = 4.5 V, ID = 22 A Applications Low inductance packaging shortens rise/fall times, resulting in lower switching losses Computing MOSFET integration enables optimum layout for lower circuit inductance and reduced switch node ringing Communications RoHS Compliant General Purpose Point of Load Notebook VCORE G1 Pin 1 D1 D1 D1 D1 PHASE (S1/D2) G2 Top S2 S2 Power 56 S2 Bottom S2 5 S2 6 S2 7 G2 8 Q2 4 D1 PHASE 3 D1 2 D1 1 G1 Q1 MOSFET Maximum Ratings TA = 25C unless otherwise noted Symbol VDS Drain to Source Voltage Parameter VGS Gate to Source Voltage Drain Current ID TJ, TSTG Units V V (Note 3) 20 20 TC = 25 C 30 40 -Continuous (Silicon limited) TC = 25 C 65 135 -Continuous TA = 25 C 151a 261b -Pulsed PD Q2 25 -Continuous (Package limited) Single Pulse Avalanche Energy EAS Q1 25 40 100 504 1445 A mJ Power Dissipation for Single Operation TA = 25C 2.21a 2.51b Power Dissipation for Single Operation TA = 25C 1.01c 1.01d Operating and Storage Junction Temperature Range -55 to +150 W C Thermal Characteristics Thermal Resistance, Junction to Ambient 571a 501b RJA Thermal Resistance, Junction to Ambient 1251c 1201d RJC Thermal Resistance, Junction to Case 3.5 2 RJA C/W Package Marking and Ordering Information Device Marking 22OA N7OC Device Package Reel Size Tape Width Quantity FDMS3602AS Power 56 13" 12 mm 3000 units (c)2011 Fairchild Semiconductor Corporation FDMS3602AS Rev.C4 1 www.fairchildsemi.com FDMS3602AS PowerTrench(R) Power Stage March 2011 Symbol Parameter Test Conditions Type Min 25 25 Typ Max Units Off Characteristics BVDSS Drain to Source Breakdown Voltage ID = 250 A, VGS = 0 V ID = 1 mA, VGS = 0 V Q1 Q2 BVDSS TJ Breakdown Voltage Temperature Coefficient ID = 250 A, referenced to 25C ID = 10 mA, referenced to 25C Q1 Q2 IDSS Zero Gate Voltage Drain Current VDS = 20 V, VGS = 0 V Q1 Q2 1 500 A IGSS Gate to Source Leakage Current, Forward VGS = 20 V, VDS = 0 V Q1 Q2 100 100 nA nA 3 3 V V 20 20 mV/C On Characteristics VGS(th) Gate to Source Threshold Voltage VGS = VDS, ID = 250 A VGS = VDS, ID = 1 mA Q1 Q2 VGS(th) TJ Gate to Source Threshold Voltage Temperature Coefficient ID = 250 A, referenced to 25C ID = 10 mA, referenced to 25C Q1 Q2 -6 -5 VGS = 10 V, ID = 15 A VGS = 4.5 V, ID = 14 A VGS = 10 V, ID = 15 A, TJ = 125C Q1 4.4 6.2 5.9 5.6 8.5 8.7 VGS = 10 V, ID = 26 A VGS = 4.5 V, ID = 22 A VGS = 10 V, ID = 26 A, TJ = 125C Q2 1.7 2.6 2.5 2.2 3.4 3.9 VDD = 5 V, ID = 15 A VDD = 5 V, ID = 26 A Q1 Q2 67 132 Q1 VDS = 13 V, VGS = 0 V, f = 1 MHZ Q1 Q2 1330 3260 1770 4335 pF Q1 Q2 358 892 475 1185 pF Q1 Q2 61 145 90 220 pF 0.6 0.9 2 3 Q1 Q2 7.9 12 16 22 ns Q1 Q2 2 4.2 10 10 ns Q1 Q2 19 31 34 50 ns Q1 Q2 1.8 3.2 10 10 ns Q1 Q2 19 45 27 64 nC Q1 Q2 9 21 13 30 nC Q1 Q2 3.9 9.1 nC Q1 Q2 2.4 5.3 nC rDS(on) gFS Static Drain to Source On Resistance Forward Transconductance 1 1 1.8 1.9 mV/C m S Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance Rg Gate Resistance Q2 VDS = 13 V, VGS = 0 V, f = 1 MHZ Q1 Q2 0.2 0.2 Switching Characteristics td(on) Turn-On Delay Time tr Rise Time td(off) Turn-Off Delay Time tf Fall Time Qg(TOT) Total Gate Charge Qg(TOT) Total Gate Charge Qgs Gate to Source Charge Qgd Gate to Drain "Miller" Charge (c)2011 Fairchild Semiconductor Corporation FDMS3602AS Rev.C4 Q1 VDD = 13 V, ID = 15 A, RGEN = 6 Q2 VDD = 13 V, ID = 26 A, RGEN = 6 VGS = 0V to 10 V Q1 VDD = 13 V, VGS = 0V to 4.5 V ID = 15 A Q2 VDD = 13 V, ID = 26 A 2 www.fairchildsemi.com FDMS3602AS PowerTrench(R) Power Stage Electrical Characteristics TJ = 25C unless otherwise noted Symbol Parameter Test Conditions Type Min Typ Max Units Q1 Q2 0.8 0.8 1.2 1.2 V Q1 Q2 21 28 34 44 ns Q1 Q2 6.6 28 13 44 nC Drain-Source Diode Characteristics VSD Source-Drain Diode Forward Voltage trr Reverse Recovery Time Qrr Reverse Recovery Charge VGS = 0 V, IS = 15 A VGS = 0 V, IS = 26 A (Note 2) (Note 2) Q1 IF = 15 A, di/dt = 100 A/s Q2 IF = 26 A, di/dt = 300 A/s Notes: 1. RJA is determined with the device mounted on a 1 in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. RJC is guaranteed by design while RCA is determined by the user's board design. b. 50 C/W when mounted on a 1 in2 pad of 2 oz copper a. 57 C/W when mounted on a 1 in2 pad of 2 oz copper c. 125 C/W when mounted on a minimum pad of 2 oz copper d. 120 C/W when mounted on a minimum pad of 2 oz copper 2. Pulse Test: Pulse Width < 300 s, Duty cycle < 2.0%. 3. As an N-ch device, the negative Vgs rating is for low duty cycle pulse ocurrence only. No continuous rating is implied. 4. EAS of 50 mJ is based on starting TJ = 25 oC; N-ch: L = 1 mH, IAS = 10 A, VDD = 23 V, VGS = 10 V. 100% test at L= 0.3 mH, IAS = 15 A. 5. EAS of 144 mJ is based on starting TJ = 25 oC; N-ch: L = 1 mH, IAS = 17 A, VDD = 23 V, VGS = 10 V. 100% test at L= 0.3 mH, IAS = 25 A. (c)2011 Fairchild Semiconductor Corporation FDMS3602AS Rev.C4 3 www.fairchildsemi.com FDMS3602AS PowerTrench(R) Power Stage Electrical Characteristics TJ = 25C unless otherwise noted 6 NORMALIZED DRAIN TO SOURCE ON-RESISTANCE 40 ID, DRAIN CURRENT (A) VGS = 10 V VGS = 4.5 V 30 VGS = 4 V VGS = 3.5 V 20 10 VGS = 3 V 0 0.0 0.2 PULSE DURATION = 80 s DUTY CYCLE = 0.5% MAX 0.4 0.6 0.8 PULSE DURATION = 80 s DUTY CYCLE = 0.5% MAX 5 VGS = 3 V 4 3 VGS = 3.5 V 1 VGS = 10 V 0 1.0 0 10 20 ID, DRAIN CURRENT (A) VDS, DRAIN TO SOURCE VOLTAGE (V) Figure 1. On Region Characteristics rDS(on), DRAIN TO 1.4 1.2 1.0 0.8 0.6 -75 -50 SOURCE ON-RESISTANCE (m) NORMALIZED DRAIN TO SOURCE ON-RESISTANCE 40 25 ID = 15 A VGS = 10 V PULSE DURATION = 80 s DUTY CYCLE = 0.5% MAX 20 ID = 15 A 15 TJ = 125 oC 10 5 TJ = 25 oC 0 -25 0 25 50 75 100 125 150 TJ, JUNCTION TEMPERATURE (oC) 2 4 6 8 10 VGS, GATE TO SOURCE VOLTAGE (V) Figure 3. Normalized On Resistance vs Junction Temperature Figure 4. On-Resistance vs Gate to Source Voltage 40 40 PULSE DURATION = 80 s DUTY CYCLE = 0.5% MAX IS, REVERSE DRAIN CURRENT (A) ID, DRAIN CURRENT (A) 30 Figure 2. Normalized On-Resistance vs Drain Current and Gate Voltage 1.6 30 VDS = 5 V TJ = 150 oC 20 TJ = 25 oC 10 TJ = -55 oC 0 VGS = 4.5 V VGS = 4 V 2 1 2 3 TJ = 150 oC 1 TJ = 25 oC TJ = -55 oC 0.1 0.01 0.001 0.0 4 VGS, GATE TO SOURCE VOLTAGE (V) 0.2 0.4 0.6 0.8 1.0 1.2 VSD, BODY DIODE FORWARD VOLTAGE (V) Figure 5. Transfer Characteristics (c)2011 Fairchild Semiconductor Corporation FDMS3602AS Rev.C4 VGS = 0 V 10 Figure 6. Source to Drain Diode Forward Voltage vs Source Current 4 www.fairchildsemi.com FDMS3602AS PowerTrench(R) Power Stage Typical Characteristics (Q1 N-Channel) TJ = 25C unless otherwise noted 2000 VDD = 10 V ID = 15 A Ciss 1000 8 CAPACITANCE (pF) VGS, GATE TO SOURCE VOLTAGE (V) 10 VDD = 13 V 6 VDD = 16 V 4 Coss 100 Crss 2 f = 1 MHz VGS = 0 V 0 0 5 10 15 10 0.1 20 1 10 25 VDS, DRAIN TO SOURCE VOLTAGE (V) Qg, GATE CHARGE (nC) Figure 7. Gate Charge Characteristics Figure 8. Capacitance vs Drain to Source Voltage 20 80 o ID, DRAIN CURRENT (A) IAS, AVALANCHE CURRENT (A) RJC = 3.5 C/W 10 TJ = 25 oC TJ = 100 oC TJ = 125 oC 60 VGS = 10 V 40 VGS = 4.5 V 20 Limited by Package 1 0.01 0.1 1 10 0 25 100 50 P(PK), PEAK TRANSIENT POWER (W) ID, DRAIN CURRENT (A) 150 1000 100 s 10 1 ms 10 ms THIS AREA IS LIMITED BY rDS(on) 100 ms SINGLE PULSE TJ = MAX RATED 1s RJA = 125 oC/W DC 10s TA = 25 oC 0.01 0.01 125 Figure 10. Maximum Continuous Drain Current vs Case Temperature 100 0.1 100 o Figure 9. Unclamped Inductive Switching Capability 1 75 TC, CASE TEMPERATURE ( C) tAV, TIME IN AVALANCHE (ms) 0.1 1 10 100 200 TA = 25 oC 100 10 1 0.5 -4 10 -3 10 -2 10 -1 10 1 10 100 1000 t, PULSE WIDTH (sec) VDS, DRAIN to SOURCE VOLTAGE (V) Figure 11. Forward Bias Safe Operating Area (c)2011 Fairchild Semiconductor Corporation FDMS3602AS Rev.C4 SINGLE PULSE RJA = 125 oC/W Figure 12. Single Pulse Maximum Power Dissipation 5 www.fairchildsemi.com FDMS3602AS PowerTrench(R) Power Stage Typical Characteristics (Q1 N-Channel) TJ = 25C unless otherwise noted 2 NORMALIZED THERMAL IMPEDANCE, ZJA 1 0.1 DUTY CYCLE-DESCENDING ORDER D = 0.5 0.2 0.1 0.05 0.02 0.01 PDM t1 SINGLE PULSE 0.01 t2 o RJA = 125 C/W NOTES: DUTY FACTOR: D = t1/t2 PEAK TJ = PDM x ZJA x RJA + TA (Note 1c) 0.001 -4 10 -3 10 -2 10 -1 10 1 10 100 1000 t, RECTANGULAR PULSE DURATION (sec) Figure 13. Junction-to-Ambient Transient Thermal Response Curve (c)2011 Fairchild Semiconductor Corporation FDMS3602AS Rev.C4 6 www.fairchildsemi.com FDMS3602AS PowerTrench(R) Power Stage Typical Characteristics (Q1 N-Channel) TJ = 25C unless otherwise noted 100 8 ID, DRAIN CURRENT (A) 80 NORMALIZED DRAIN TO SOURCE ON-RESISTANCE VGS = 10 V VGS = 4.5 V VGS = 4 V 60 VGS = 3.5 V 40 PULSE DURATION = 80 s DUTY CYCLE = 0.5% MAX 20 VGS = 3 V 0 0.0 0.2 0.4 0.6 0.8 6 VGS = 3.5 V 4 VGS = 4 V 2 1.0 0 20 40 60 80 100 ID, DRAIN CURRENT (A) Figure 14. On- Region Characteristics Figure 15. Normalized on-Resistance vs Drain Current and Gate Voltage 1.6 rDS(on), DRAIN TO 1.4 1.2 1.0 0.8 -75 -50 SOURCE ON-RESISTANCE (m) 12 ID = 26 A VGS = 10 V NORMALIZED DRAIN TO SOURCE ON-RESISTANCE VGS = 10 V VGS = 4.5 V 0 VDS, DRAIN TO SOURCE VOLTAGE (V) ID = 26 A 8 6 TJ = 125 oC 4 2 TJ = 25 oC 0 -25 0 25 50 75 100 125 150 TJ, JUNCTION TEMPERATURE (oC) 100 IS, REVERSE DRAIN CURRENT (A) TJ = 125 oC TJ = 25 oC 40 TJ = -55 oC 20 2.5 3.0 3.5 8 10 VGS = 0 V 100 TJ = 125 oC 10 1 TJ = 25 oC TJ = -55 oC 0.1 0.0 4.0 VGS, GATE TO SOURCE VOLTAGE (V) 0.2 0.4 0.6 0.8 1.0 1.2 VSD, BODY DIODE FORWARD VOLTAGE (V) Figure 18. Transfer Characteristics (c)2011 Fairchild Semiconductor Corporation FDMS3602AS Rev.C4 6 200 60 2.0 4 Figure 17. On-Resistance vs Gate to Source Voltage 80 0 1.5 2 VGS, GATE TO SOURCE VOLTAGE (V) PULSE DURATION = 80 s DUTY CYCLE = 0.5% MAX VDS = 5 V PULSE DURATION = 80 s DUTY CYCLE = 0.5% MAX 10 Figure 16. Normalized On-Resistance vs Junction Temperature ID, DRAIN CURRENT (A) PULSE DURATION = 80 s DUTY CYCLE = 0.5% MAX VGS = 3 V Figure 19. Source to Drain Diode Forward Voltage vs Source Current 7 www.fairchildsemi.com FDMS3602AS PowerTrench(R) Power Stage Typical Characteristics (Q2 N-Channel) TJ = 25 C unless otherwise noted 10000 ID = 26 A Ciss 8 VDD = 10 V CAPACITANCE (pF) VGS, GATE TO SOURCE VOLTAGE (V) 10 6 VDD = 13 V 4 VDD = 16 V Coss 1000 Crss 2 f = 1 MHz VGS = 0 V 100 0 0 10 20 30 40 50 0.1 50 1 10 25 VDS, DRAIN TO SOURCE VOLTAGE (V) Qg, GATE CHARGE (nC) Figure 21. Capacitance vs Drain to Source Voltage Figure 20. Gate Charge Characteristics 50 150 ID, DRAIN CURRENT (A) IAS, AVALANCHE CURRENT (A) o RJC = 2 C/W TJ = 25 oC 10 TJ = 100 oC TJ = 125 oC 120 VGS = 10 V 90 VGS = 4.5 V 60 30 Limited by Package 1 0.01 0.1 1 10 0 25 100 300 50 P(PK), PEAK TRANSIENT POWER (W) ID, DRAIN CURRENT (A) 10 ms THIS AREA IS LIMITED BY rDS(on) 0.1 SINGLE PULSE TJ = MAX RATED 100 ms 1s 10s RJA = 120 oC/W DC TA = 25 oC 0.01 0.01 0.1 1 10 100200 VDS, DRAIN to SOURCE VOLTAGE (V) SINGLE PULSE o RJC = 2 C/W 1000 100 10 1 -4 10 -3 10 -2 10 -1 10 1 10 100 1000 t, PULSE WIDTH (sec) Figure 24. Forward Bias Safe Operating Area (c)2011 Fairchild Semiconductor Corporation FDMS3602AS Rev.C4 150 10000 1 ms 1 125 Figure 23. Maximum Continuous Drain Current vs Case Temperature 100 s 10 100 o Figure 22. Unclamped Inductive Switching Capability 200 100 75 TC, CASE TEMPERATURE ( C) tAV, TIME IN AVALANCHE (ms) Figure 25. Single Pulse Maximum Power Dissipation 8 www.fairchildsemi.com FDMS3602AS PowerTrench(R) Power Stage Typical Characteristics (Q2 N-Channel) TJ = 25C unless otherwise noted NORMALIZED THERMAL IMPEDANCE, ZJA 2 1 0.1 0.01 DUTY CYCLE-DESCENDING ORDER D = 0.5 0.2 0.1 0.05 0.02 0.01 PDM t1 t2 SINGLE PULSE NOTES: DUTY FACTOR: D = t1/t2 PEAK TJ = PDM x ZJA x RJA + TA o RJA = 120 C/W 0.001 (Note 1d) 0.0001 -4 10 -3 10 -2 10 -1 10 1 10 100 1000 t, RECTANGULAR PULSE DURATION (sec) Figure 26. Junction-to-Ambient Transient Thermal Response Curve (c)2011 Fairchild Semiconductor Corporation FDMS3602AS Rev.C4 9 www.fairchildsemi.com FDMS3602AS PowerTrench(R) Power Stage Typical Characteristics (Q2 N-Channel) TJ = 25 C unless otherwise noted SyncFET Schottky body diode Characteristics Schottky barrier diodes exhibit significant leakage at high temperature and high reverse voltage. This will increase the power in the device. Fairchild's SyncFET process embeds a Schottky diode in parallel with PowerTrench MOSFET. This diode exhibits similar characteristics to a discrete external Schottky diode in parallel with a MOSFET. Figure 27 shows the reverse recovery characteristic of the FDMS3602AS. -2 IDSS, REVERSE LEAKAGE CURRENT (A) 30 25 CURRENT (A) 20 di/dt = 300 A/s 15 10 5 0 -5 0 50 100 150 200 250 TJ = 125 oC -3 10 TJ = 100 oC -4 10 -5 TJ = 25 oC 10 -6 10 0 5 10 15 20 25 VDS, REVERSE VOLTAGE (V) TIME (ns) Figure 27. FDMS3602AS SyncFET body diode reverse recovery characteristic (c)2011 Fairchild Semiconductor Corporation FDMS3602AS Rev.C4 10 Figure 28. SyncFET body diode reverse leakage versus drain-source voltage 10 www.fairchildsemi.com FDMS3602AS PowerTrench(R) Power Stage Typical Characteristics (continued) 1. Switch Node Ringing Suppression Fairchild's Power Stage products incorporate a proprietary design* that minimizes the peak overshoot, ringing voltage on the switch node (PHASE) without the need of any external snubbing components in a buck converter. As shown in the figure 29, the Power Stage solution rings significantly less than competitor solutions under the same set of test conditions. Competitors solution Power Stage Device Figure 29. Power Stage phase node rising edge, High Side Turn on *Patent Pending (c)2011 Fairchild Semiconductor Corporation FDMS3602AS Rev.C4 11 www.fairchildsemi.com FDMS3602AS PowerTrench(R) Power Stage Application Information FDMS3602AS PowerTrench(R) Power Stage Figure 30. Shows the Power Stage in a buck converter topology 2. Recommended PCB Layout Guidelines As a PCB designer, it is necessary to address critical issues in layout to minimize losses and optimize the performance of the power train. Power Stage is a high power density solution and all high current flow paths, such as VIN (D1), PHASE (S1/D2) and GND (S2), should be short and wide for better and stable current flow, heat radiation and system performance. A recommended layout procedure is discussed below to maximize the electrical and thermal performance of the part. Figure 31. Recommended PCB Layout (c)2011 Fairchild Semiconductor Corporation FDMS3602AS Rev.C4 12 www.fairchildsemi.com 1. Input ceramic bypass capacitors C1 and C2 must be placed close to the D1 and S2 pins of Power Stage to help reduce parasitic inductance and high frequency conduction loss induced by switching operation. C1 and C2 show the bypass capacitors placed close to the part between D1 and S2. Input capacitors should be connected in parallel close to the part. Multiple input caps can be connected depending upon the application. 2. The PHASE copper trace serves two purposes; In addition to being the current path from the Power Stage package to the output inductor (L), it also serves as heat sink for the lower FET in the Power Stage package. The trace should be short and wide enough to present a low resistance path for the high current flow between the Power Stage and the inductor. This is done to minimize conduction losses and limit temperature rise. Please note that the PHASE node is a high voltage and high frequency switching node with high noise potential. Care should be taken to minimize coupling to adjacent traces. The reference layout in figure 31 shows a good balance between the thermal and electrical performance of Power Stage. 3. Output inductor location should be as close as possible to the Power Stage device for lower power loss due to copper trace resistance. A shorter and wider PHASE trace to the inductor reduces the conduction loss. Preferably the Power Stage should be directly in line (as shown in figure 31) with the inductor for space savings and compactness. 4. The PowerTrench(R) Technology MOSFETs used in the Power Stage are effective at minimizing phase node ringing. It allows the part to operate well within the breakdown voltage limits. This eliminates the need to have an external snubber circuit in most cases. If the designer chooses to use an RC snubber, it should be placed close to the part between the PHASE pad and S2 pins to dampen the high-frequency ringing. 5. The driver IC should be placed close to the Power Stage part with the shortest possible paths for the High Side gate and Low Side gates through a wide trace connection. This eliminates the effect of parasitic inductance and resistance between the driver and the MOSFET and turns the devices on and off as efficiently as possible. At higher-frequency operation this impedance can limit the gate current trying to charge the MOSFET input capacitance. This will result in slower rise and fall times and additional switching losses. Power Stage has both the gate pins on the same side of the package which allows for back mounting of the driver IC to the board. This provides a very compact path for the drive signals and improves efficiency of the part. 6. S2 pins should be connected to the GND plane with multiple vias for a low impedance grounding. Poor grounding can create a noise transient offset voltage level between S2 and driver ground. This could lead to faulty operation of the gate driver and MOSFET. 7. Use multiple vias on each copper area to interconnect top, inner and bottom layers to help smooth current flow and heat conduction. Vias should be relatively large, around 8 mils to 10 mils, and of reasonable inductance. Critical high frequency components such as ceramic bypass caps should be located close to the part and on the same side of the PCB. If not feasible, they should be connected from the backside via a network of low inductance vias. (c)2011 Fairchild Semiconductor Corporation FDMS3602AS Rev.C4 13 www.fairchildsemi.com FDMS3602AS PowerTrench(R) Power Stage Following is a guideline, not a requirement which the PCB designer should consider: CL B PKG CL 8 A 0.00 (2X) 2.00 5.10 4.90 0.10 C 4.00 5 8 7 6 1.27 TYP 0.65 TYP 5 0.63 6.25 5.90 PKG CL 2.52 1.60 KEEP OUT AREA 2.15 0.00 CL 4.16 1.21 2.13 1 PIN # 1 INDICATOR 4 0.10 C (2X) 1.18 TOP VIEW 2 1 0.63 SEE DETAIL A 3 4 2.31 3.15 0.59 3.18 5.10 RECOMMENDED LAND PATTERN FOR SAWN / PUNCHED TYPE SIDE VIEW 0.10 0.05 0.45 0.25 3.16 2.80 0.65 0.38 1 2 3 (6X) C A B C 0.70 0.36 4 1.34 1.12 0.10 C 8X 0.08 C 1.10 0.90 0.35 0.15 0.66.05 2.25 2.05 4.08 3.70 0.65 0.38 8 0.44 0.24 7 6 5 1.27 3.81 BOTTOM VIEW 1.02 0.82 0.61 (8X) 0.31 (SCALE: 2X) 0.05 0.00 C SEATING PLANE 5.10 4.90 0.10 C (2X) SEE DETAIL B PKG CL 8 0.35 0.15 5 0.28 0.08 PKG 6.25 5.90 CL 1 (SCALE: 2X) 0.10 C (2X) 4 0.41 (8X) 0.21 TOP VIEW 10 5.90 5.70 5.00 4.80 SEE DETAIL C 0.10 C 0.35 0.15 8X 0.08 C C SIDE VIEW 1.10 0.90 0.45 0.25 (6X) 3.16 2.80 0.65 0.38 1 2 3 0.70 0.36 4 0.10 0.05 0.65 0.38 0.44 0.24 2.25 2.05 8 7 6 5 1.27 3.81 BOTTOM VIEW C A B C 1.34 1.12 0.66.05 4.08 3.70 (SCALE: 2X) SEATING PLANE 1.02 0.82 0.61 0.31 (8X) NOTES: UNLESS OTHERWISE SPECIFIED A) PACKAGE STANDARD REFERENCE: JEDEC REGISTRATION, MO-240, VARIATION AA. B) ALL DIMENSIONS ARE IN MILLIMETERS. C) DIMENSIONS DO NOT INCLUDE BURRS OR MOLD FLASH. MOLD FLASH OR BURRS DOES NOT EXCEED 0.10MM. D) DIMENSIONING AND TOLERANCING PER ASME Y14.5M-1994. E) IT IS RECOMMENDED TO HAVE NO TRACES OR VIAS WITHIN THE KEEP OUT AREA. F) DRAWING FILE NAME: PQFN08EREV6. G) FAIRCHILD SEMICONDUCTOR ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor's product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. "Typical" parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including "Typicals" must be validated for each customer application by customer's technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. 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