N16D1625LPA 512K x 16Bits x 2Banks Low Power Synchronous DRAM Description These N16D1625LPA are low power 16,777,216 bits CMOS Synchronous DRAM organized as 2 banks of 524,288 words x 16 bits. These products are offering fully synchronous operation and are referenced to a positive edge of the clock. All inputs and outputs are synchronized with the rising edge of the clock input. The data paths are internally pipelined to achieve very high bandwidth. All input and output voltage levels are compatible with LVCMOS. Features JEDEC standard 2.5V power supply. * All inputs and outputs referenced to the positive edge of the * Auto refresh and self refresh. system clock. * All pins are compatible with LVCMOS interface. * Data mask function by DQM. * 4K refresh cycle / 64ms. * Internal dual banks operation. * Programmable Burst Length and Burst Type. * Burst Read Single Write operation. - 1, 2, 4, 8 or Full Page for Sequential Burst. * Special Function Support. - 4 or 8 for Interleave Burst. - PASR(Partial Array Self Refresh) * Programmable CAS Latency : 2,3 clocks. - Auto TCSR(Temperature Compensated Self Refresh) * Programmable Driver Strength Control * Automatic precharge, includes CONCURRENT Auto Precharge - Full Strength or 1/2, 1/4 of Full Strength Mode and controlled Precharge. * Deep Power Down Mode. Table1: Ordering Information Part No. Clock Freq. N16D1625LPAC2-60I 166 MHz N16D1625LPAC2-75I 133 MHz N16D1625LPAC2-10I 100 MHz N16D1625LPAT2-60I 166 MHz N16D1625LPAT2-75I 133 MHz N16D1625LPAT2-10I 100 MHz Ver. A Temperature VDD/VDDQ Interface Package 60-Ball Green FBGA -25C to 85C 2.5V/2.5V LVCMOS Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 50-Pin Green TSOPII 1 N16D1625LPA Enable Semiconductor Corp. Figure1: 60Ball FBGA Ball Assignment 1 2 3 4 5 6 7 A VSS DQ15 DQ0 VDD B DQ14 VSSQ VDDQ DQ1 C DQ13 VDDQ VSSQ DQ2 D DQ12 DQ11 DQ4 DQ3 E DQ10 VSSQ VDDQ DQ5 F DQ9 VDDQ VSSQ DQ6 G DQ8 NC NC DQ7 H NC NC NC NC J NC UDQM LDQM /WE K NC CLK /RAS /CAS L CKE NC NC /CS M A11 A9 NC NC N A8 A7 A0 A10 P A6 A5 A2 A1 R VSS A4 A3 VDD [Top View] Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 2 N16D1625LPA Enable Semiconductor Corp. Figure2: 50Pin TSOPII Pin Assignment VDD 1 50 VSS DQ0 2 49 DQ15 DQ1 3 48 DQ14 VSSQ 4 47 VSSQ DQ2 5 46 DQ13 DQ3 6 45 DQ12 VDDQ 7 44 VDDQ DQ4 8 43 DQ11 DQ5 9 42 DQ10 VSSQ 10 41 VSSQ DQ6 11 40 DQ9 DQ7 12 39 DQ8 VDDQ 13 38 VDDQ LDQM 14 37 N.C /WE 15 36 UDQM /CAS 16 35 CLK /RAS 17 34 CKE /CS 18 33 N.C BA 19 32 A9 A10/AP 20 31 A8 A0 21 30 A7 A1 22 29 A6 A2 23 28 A5 A3 24 27 A4 VDD 25 26 VSS 50 Pin TSOP II [Top View] Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 3 N16D1625LPA Enable Semiconductor Corp. Table2: Pin Descriptions Pin Pin Name Descriptions CLK System Clock The system clock input. All other inputs are registered to the SDRAM on the rising edge CLK. CKE Clock Enable Controls internal clock signal and when deactivated, the SDRAM will be one of the states among power down, suspend or self refresh. /CS Chip Select Enable or disable all inputs except CLK, CKE and DQM. A11 Bank Address Selects bank to be activated during RAS activity. Selects bank to be read/written during CAS activity. A0~A10 Address Row Address Column Address Auto Precharge /RAS, /CAS, /WE Row Address Strobe, Column Address Strobe, Write Enable RAS, CAS and WE define the operation. Refer function truth table for details. LDQM/UDQM Data Input/Output Mask Controls output buffers in read mode and masks input data in write mode. DQ0~DQ15 Data Input/Output Multiplexed data input/output pin. VDD/VSS Power Supply/Ground Power supply for internal circuits and input buffers. VDDQ/VSSQ Data Output Power/Ground Power supply for output buffers. NC No Connection No connection. Ver. A : RA0~RA10 : CA0~CA7 : A10 Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 4 N16D1625LPA Enable Semiconductor Corp. Figure3: Functional Block Diagram EXTENDED MODE REGISTER CLK CLOCK CKE GENERATOR TCSR PASR ADDRESS ROW DECODER ROW DECODER ROW MODE REGISTER ADDRESS BUFFER & REFRESH COUNTER BANK B BANK A SENSE AMPLIFIER /CAS /WE CONTROL LOGIC /RAS COMMAND DECODER /CS COLUMN DECODER & LATCH CIRCUIT COLUMN ADDRESS BUFFER & BURST COUNTER DATA CONTROL CIRCUIT DQM LATCH CIRCUIT INPUT & OUTPUT BUFFER DQ Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 5 N16D1625LPA Enable Semiconductor Corp. Figure4: Simplified State Diagram EXTENDED MODE SELF REGISTER REFRESH EM RS SET LF SE LF SE MRS MODE T CBR REF IDLE REGISTER I EX REFRESH SET CK E D DP IT EX D DP ACT DEEP POWER CK E POWER DOWN DOWN CKE ROW ACTIVE SUSPEND W AU RIT TO E PR WIT EC H HA RG E READ WRITE DOWN READ CKE READ WRITE CKE CKE CKE CKE WRITE A E PR CKE READ A atio n) WRITE A CKE E RG HA EC PR H IT TO EW AU T I WR PRE WRITE SUSPEND POWER BS T T BS WRITE ACTIVE CKE PRECHARGE arg e PR E(P rec h n) atio min ter ON READ A SUSPEND ter min e arg ech (Pr POWER CKE READ SUSPEND PRECHARGE Automatic Sequence Manual Input Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 6 N16D1625LPA Enable Semiconductor Corp. Figure5: Mode Register Definition A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 Address Bus 11 0 10 9 8 WB 0 7 0 6 5 4 CAS Latency 0 3 BT 2 1 0 Mode Register (Mx) Burst Length M9 Write Burst Mode M6 M5 M4 CAS Latency M3 Burst Type 0 Burst Read and Burst Write 0 0 0 Reserved 0 Sequential 1 Burst Read and Single Write 0 0 1 1 1 Interleave 0 1 0 0 1 1 M2 M1 M0 0 0 2 0 1 3 0 0 1 0 1 1 Burst Length M3 = 0 M3 = 1 0 1 1 0 1 2 2 0 1 0 4 4 Reserved 0 1 1 8 8 1 Reserved 1 0 0 Reserved Reserved 1 0 Reserved 1 0 1 Reserved Reserved 1 1 Reserved 1 1 0 Reserved Reserved 1 1 1 Full Page Reserved Note: M11(A11) must be set to "0" to select Mode Register (vs. the Extended Mode Register) Burst Type Accesses within a given burst may be programmed to be either sequential or interleaved; this is referred to as the burst type and is selected via bit M3. The ordering of accesses within a burst is determined by the burst length, the burst type and the starting column address, as shown in Table3. Table 3: Burst Definition Burst Length Starting Column Order of Access Within a Burst Address Sequential Interleaved A2 A1 A0 0 0-1 0-1 1 1-0 1-0 0 0 0-1-2-3 0-1-2-3 0 1 1-2-3-0 1-0-3-2 1 0 2-3-0-1 2-3-0-1 1 1 3-0-1-2 3-2-1-0 0 0 0 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7 0 0 1 1-2-3-4-5-6-7-0 1-0-3-2-5-4-7-6 2 4 8 1. For full-page accesses: y = 256 2. For a burst length of two, A1-A7 select the blockof-two burst; A0 selects the starting column within the block. 3. For a burst length of four, A2-A7 select the blockof-four burst; A0-A1 select the starting column within the block. 4. For a burst length of eight, A3-A7 select the block-of-eight burst; A0-A2 select the starting column within the block. 5. For a full-page burst, the full row is selected and A0-A7 0 1 0 2-3-4-5-6-7-0-1 2-3-0-1-6-7-4-5 0 1 1 3-4-5-6-7-0-1-2 3-2-1-0-7-6-5-4 6. Whenever a boundary of the block is reached within a 1 0 0 4-5-6-7-0-1-2-3 4-5-6-7-0-1-2-3 given sequence above, the following access wraps 1 0 1 5-6-7-0-1-2-3-4 5-4-7-6-1-0-3-2 1 1 0 6-7-0-1-2-3-4-5 6-7-4-5-2-3-0-1 1 1 1 7-0-1-2-3-4-5-6 7-6-5-4-3-2-1-0 Full n=A0-7 Page (Location 0-256) Ver. A Note : select the starting column. within the block. 7. For a burst length of one, A0-A7 select the unique column to be accessed, and mode register bit M3 is ignored. Cn, Cn+1. Cn+2, Cn+3, Cn+4... Not Supported ...Cn-1, Cn... Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 7 N16D1625LPA Enable Semiconductor Corp. Figure6: Extended Mode Register A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 Address Bus 11 1 10 0 9 0 E6 E5 Driver Strength 0 0 Full Strength 0 1 1/2 Strength 1 0 1/4 Strength 1 1 Reserved 8 0 7 6 0 5 4 3 2 TCSR DS 1 PASR 0 Extended Mode Register (Ex) E4 E3 Maximum Case Temp. 0 0 85 0 1 70 1 0 45 1 1 Auto E2 E1 E0 0 0 0 All Banks 0 0 1 One Bank (A11=0) 0 1 0 Reserved 0 1 1 Reserved 1 0 0 Reserved 1 0 1 Half of One Bank (A11=0, Row Address MSB=0) 1 1 0 Quarter of One Bank (A11=0, Row Address 2 MSB=0) 1 1 1 Reserved Self Refresh Coverage Note: E11(A11) must be set to "1" to select Extend Mode Register (vs. the base Mode Register) Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 8 Enable Semiconductor Corp. N16D1625LPA Functional Description In general, this 16Mb SDRAM (512K x 16Bits x 2banks) is a dual-bank DRAM that operates at 2.5V and includes a synchronous interface (all signals are registered on the positive edge of the clock signal, CLK). Each of the 8,388,608-bit banks is organized as 2,048 rows by 256 columns by 16-bits Read and write accesses to the SDRAM are burst oriented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of an ACTIVE command, which is then followed by a READ or WRITE command. The address bits registered coincident with the ACTIVE command are used to select the bank and row to be accessed (A11 select the bank, A0-A10 select the row). The address bits (A11 select the bank, A0-A7 select the column) registered coincident with the READ or WRITE command are used to select the starting column location for the burst access. Prior to normal operation, the SDRAM must be initialized. The following sections provide detailed information covering device initialization, register definition, command descriptions and device operation. Power up and Initialization SDRAMs must be powered up and initialized in a predefined manner. Operational procedures other than those specified may result in undefined operation. Once power is applied to VDD and VDDQ(simultaneously) and the clock is stable(stable clock is defined as a signal cycling within timing constraints specified for the clock pin), the SDRAM requires a 100s delay prior to issuing any command other than a COMMAND INHIBIT or NOP. CKE must be held high during the entire initialization period until the RECHARGE command has been issued. Starting at some point during this 100s period and continuing at least through the end of this period, COMMAND INHIBIT or NOP commands should be applied. Once the 100s delay has been satisfied with at least one COMMAND INHIBIT or NOP command having been applied, a PRECHARGE command should be applied. All banks must then be precharged, thereby placing the device in the all banks idle state. Once in the idle state, two AUTO REFRESH cycles must be performed. After the AUTO REFRESH cycles are complete, the SDRAM is ready for mode register programming. Because the mode register will power up in an unknown state, it should be loaded prior to applying any operational command. And a extended mode register set command will be issued to program specific mode of self refresh operation(PASR). The following these cycles, the Low Power SDRAM is ready for normal operation. Register Definition Mode Register The mode register is used to define the specific mode of operation of the SDRAM. This definition includes the selection of a burst length, a burst type, a CAS latency, an operating mode and a write burst mode. The mode register is programmed via the LOAD MODE REGISTER command and will retain the stored information until it is programmed again or the device loses power. Mode register bits M0-M2 specify the burst length, M3 specifies the type of burst (sequential or interleaved), M4-M6 specify the CAS latency, M7 and M8 specify the operating mode, M9 specifies the write burst mode, and M10 should be set to zero. M11 should be set to zero to prevent extended mode register. The mode register must be loaded when all banks are idle, and the controller must wait the specified time before initiating the subsequent operation. Violating either of these requirements will result in unspecified operation. Extended Mode Register The Extended Mode Register controls the functions beyond those controlled by the Mode Register. These additional functions are special features of the BATRAM device. They include Temperature Compensated Self Refresh (TCSR) Control, and Partial Array Self Refresh (PASR) and Driver Strength (DS). The Extended Mode Register is programmed via the Mode Register Set command (A11=1) and retains the stored information until it is programmed again or the device loses power. The Extended Mode Register must be programmed with M7 through M10 set to "0". The Extended Mode Register must be loaded when all banks are idle and no bursts are in progress, and the controller must wait the specified time before initiating any subsequent operation. Violating either of these requirements results in unspecified operation. Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 9 Enable Semiconductor Corp. N16D1625LPA Burst Length Read and write accesses to the SDRAM are burst oriented, with the burst length being programmable, as shown in Figure 1. The burst length determines the maximum number of column locations that can be accessed for a given READ or WRITE command. Burst lengths of 1, 2, 4 or 8 locations are available for both the sequential and the interleaved burst types, and a full-page burst is available for the sequential type. The full-page burst is used in conjunction with the BURST TERMINATE command to generate arbitrary burst lengths. Reserved states should not be used, as unknown operation or incompatibility with future versions may result. When a READ or WRITE command is issued, a block of columns equal to the burst length is effectively selected. All accesses for that burst take place within this block, meaning that the burst will wrap within the block if a boundary is reached. The block is uniquely selected by A1-A7 when the burst length is set to two; by A2-A7 when the burst length is set to four; and by A3-A7 when the burst length is set to eight. The remaining (least significant) address bit(s) is (are) used to select the starting location within the block. Full-page bursts wrap within the page if the boundary is reached. Bank(Row) Active The Bank Active command is used to activate a row in a specified bank of the device. This command is initiated by activating CS, RAS and deasserting CAS, WE at the positive edge of the clock. The value on the A11 selects the bank, and the value on the A0-A10 selects the row. This row remains active for column access until a precharge command is issued to that bank. Read and write operations can only be initiated on this activated bank after the minimum tRCD time is passed from the activate command. Read The READ command is used to initiate the burst read of data. This command is initiated by activating CS, CAS, and deasserting WE, RAS at the positive edge of the clock. A11 input select the bank, A0-A7 address inputs select the starting column location. The value on input A10 determines whether or not Auto Precharge is used. If Auto Precharge is selected the row being accessed will be precharged at the end of the READ burst; if Auto Precharge is not selected, the row will remain active for subsequent accesses. The length of burst and the CAS latency will be determined by the values programmed during the MRS command. Write The WRITE command is used to initiate the burst write of data. This command is initiated by activating CS, CAS, WE and deasserting RAS at the positive edge of the clock. A11 input select the bank, A0-A7 address inputs select the starting column location. The value on input A10 determines whether or not Auto Precharge is used. If Auto Precharge is selected the row being accessed will be precharged at the end of the WRITE burst; if Auto Precharge is not selected, the row will remain active for subsequent accesses. Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 10 N16D1625LPA Enable Semiconductor Corp. CAS Latency The CAS latency is the delay, in clock cycles, between the registration of a READ command and the availability of the first piece of output data. The latency can be set to two or three clocks. If a READ command is registered at clock edge n, and the latency is m clocks, the data will be available by clock edge n + m. The DQs will start driving as a result of the clock edge one cycle earlier (n + m 1), and provided that the relevant access times are met, the data will be valid by clock edge n + m. For example, assuming that the clock cycle time is such that all relevant access times are met, if a READ command is registered at T0 and the latency is programmed to two clocks, the DQs will start driving after T1 and the data will be valid by T2, as shown in Figure 7. Reserved states should not be used as unknown operation or incompatibility with future versions may result. Figure7: CAS Latency T0 T1 T3 T2 CLK READ COMMAND NOP NOP tOH tLZ DQ Dout tAC CAS Latency=2 T0 T1 T2 T3 T4 CLK COMMAND READ NOP NOP tLZ DQ NOP tOH Dout tAC CAS Latency=3 DON'T CARE UNDEFINED Operating Mode The normal operating mode is selected by setting M7 and M8 to zero; the other combinations of values for M7 and M8 are reserved for future use and/or test modes. The programmed burst length applies to both READ and WRITE bursts. Test modes and reserved states should not be used because unknown operation or incompatibility with future versions may result. Write Burst Mode When M9 = 0, the burst length programmed via M0-M2 applies to both READ and WRITE bursts; when M9 = 1, the programmed burst length applies to READ bursts, but write accesses are single-location (nonburst) accesses. Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 11 N16D1625LPA Enable Semiconductor Corp. Table4: Command Truth Table Function CKEn-1 CKEn /CS /RAS /CAS /WE DQM Command Inhinit (NOP) H X H X X X X X No Operation (NOP) H X L H H H X X Mode Register Set H X L L L L X OP CODE 4 Extended Mode Register Set H X L L L L X OP CODE 4 Active (select bank and activate row) H X L L H H X Bank/Row Read H X L H L H L/H Bank/Col L 5 Read with Autoprecharge H X L H L H L/H Bank/Col H 5 Write H X L H L L L/H Bank/Col L 5 Write with Autoprecharge H X L H L L L/H Bank/Col H 5 Precharge All Banks H X L L H L X X H Precharge Selected Bank H X L L H L X Bank L Burst Stop H H L H H L X X Auto Refresh H H L L L H X X 3 Self Refresh Entry H L L L L H X X 3 Self Refresh Exit L H H X X X L H H H X X 2 Precharge Power Down Entry H L H X X X L H H H X X Precharge Down Exit L H H X X X L H H H X X Clock Suspend Entry H L H X X X L V V V X X Clock Suspend Exit L H X X Deep Power Down Entry H L X X Deep Power Down Exit L H X X X L H H X L Addr A10 Note 6 Note : 1. CKEn is the logic state of CKE at clock edge n; CKEn-1 was the state of CKE at the previous clock edge. H: High Level, L: Low Level, X: Don't Care, V: Valid 2. Exiting Self Refresh occurs by asynchronously bringing CKE from low to high and will put the device in the all banks idle state once tXSR is met. Command Inhibit or NOP commands should be issued on any clock edges occuring during the tXSR period. A minimum of two NOP commands must be provided during tXSR period. 3. During refresh operation, internal refresh counter controls row addressing; all inputs and I/Os are "Don't Care" except for CKE. 4. A0-A10 define OP CODE written to the mode register, and A11 must be issued 0 in the mode register set, and 1 in the extended mode register set. 5. DQM "L" means the data Write/Ouput Enable and "H" means the Write inhibit/Output High-Z. Write DQM Latency is 0 CLK and Read DQM Latency is 2 CLK. 6. Standard SDRAM parts assign this command sequence as Burst Terminate. For Bat Ram parts, the Burst Terminate command is assigned to the Deep Power Down function. Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 12 N16D1625LPA Enable Semiconductor Corp. Table5: Function Truth Table Current State Idle Row Active Read Ver. A Command Action Note Mode Register Set Set the Mode Register 14 X Auto or Self Refresh Start Auto or Self Refresh 5 BA X Precharge No Operation H BA Row Add. Bank Activate Activate the Specified Bank and Row L L BA Col Add./ A10 Write/WriteAP ILLEGAL 4 H L H BA Col Add./ A10 Read/ReadAP ILLEGAL 4 L H H H X X No Operation No Operation 3 H X X X X X Device Deselect No Operation or Power Down 3 L L L L Mode Register Set ILLEGAL 13,14 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge Precharge 7 L L H H BA Row Add. Bank Activate ILLEGAL 4 L H L L BA Col Add./A10 Write/Write AP Start Write : Optional AP(A10=H) 6 L H L H BA Col Add./A10 Read/Read AP Start Read : Optional AP(A10=H) 6 L H H H X X No Operation No Operation H X X X X X Device Deselect No Operation L L L L Mode Register Set ILLEGAL 13,14 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge Termination Burst : Start the Precharge L L H H BA Row Add. Bank Activate ILLEGAL L H L L BA Col Add./A10 Write/WriteAP Termination Burst : Start Write(AP) 8,9 L H L H BA Col Add./A10 Read/Read AP Terimination Burst : Start Read(AP) 8 L H H H X X No Operation Continue the Burst H X X X X X Device Deselect Continue the Burst /CS /RAS /CAS /WE A11 L L L L L L L H X L L H L L L H L H L A0-A10 OP CODE OP CODE OP CODE Description Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 4 13 N16D1625LPA Enable Semiconductor Corp. Table5: Function Truth Table Current State Write Read with Auto Precharge Write with Auto Precharge Ver. A Command /CS /RAS /CAS /WE A11 L L L L L L L H X L L H L L L H L H L A0-A10 Description Action Note Mode Register Set ILLEGAL 13,14 X Auto or Self Refresh ILLEGAL 13 BA X Precharge Termination Burst : Start the Precharge 10 H BA Row Add. Bank Activate ILLEGAL 4 L L BA Col Add./A10 Write/WriteAP Termination Burst : Start Write(AP) 8 H L H BA Col Add./A10 Read/ReadAP Terimination Burst : Start READ(AP) 8,9 L H H H X X No Operation Continue the Burst H X X X X X Device Deselect Continue the Burst L L L L Mode Register Set ILLEGAL 13,14 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge ILLEGAL 4,12 L L H H BA Row Add. Bank Activate ILLEGAL 4,12 L H L L BA Col Add./A10 Write/WriteAP ILLEGAL 12 L H L H BA Col Add./A10 Read/ReadAP ILLEGAL 12 L H H H X X No Operation Continue the Burst H X X X X X Device Deselect Continue the Burst L L L L Mode Register Set ILLEGAL 13,14 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge ILLEGAL 4,12 L L H H BA Row Add. Bank Activate ILLEGAL 4,12 L H L L BA Col Add./A10 Write/WriteAP ILLEGAL 12 L H L H BA Col Add./A10 Read/ReadAP ILLEGAL 12 L H H H X X No Operation Continue the Burst H X X X X X Device Deselect Continue the Burst OP CODE OP CODE OP CODE Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 14 N16D1625LPA Enable Semiconductor Corp. Table5: Function Truth Table Current State Precharging Row Activating Write Recovering Ver. A Command /CS /RAS /CAS /WE A11 L L L L L L L H X L L H L L L H L H L A0-A10 Description Action Note Mode Register Set ILLEGAL 13,14 X Auto or Self Refresh ILLEGAL 13 BA X Precharge No Operation : Bank(s) Idle after tRP H BA Row Add. Bank Activate ILLEGAL 4,12 L L BA Col Add./ A10 Write/WriteAP ILLEGAL 4,12 H L H BA Col Add./ A10 Read/ReadAP ILLEGAL 4,12 L H H H X X No Operation No Operation : Bank(s) Idle after tRP H X X X X X Device Deselect No Operation : Bank(s) Idle after tRP L L L L Mode Register Set ILLEGAL 13,14 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge ILLEGAL 4,12 L L H H BA Row Add. Bank Activate ILLEGAL 4,11,12 L H L L BA Col Add./A10 Write/Write AP ILLEGAL 4,12 L H L H BA Col Add./A10 Read/Read AP ILLEGAL 4,12 L H H H X X No Operation No Operation : ROw Active after tRCD H X X X X X Device Deselect No Operation : ROw Active after tRCD L L L L Mode Register Set ILLEGAL 13,14 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge ILLEGAL 4,13 L L H H BA Row Add. Bank Activate ILLEGAL 4,12 L H L L BA Col Add./A10 Write/WriteAP Start Write : Optional AP(A10=H) L H L H BA Col Add./A10 Read/Read AP Start Write : Optional AP(A10=H) L H H H X X No Operation No Operation : Row Active after tDPL H X X X X X Device Deselect No Operation : Row Active after tDPL OP CODE OP CODE OP CODE Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 9 15 N16D1625LPA Enable Semiconductor Corp. Table5: Function Truth Table Current State Write Recovering with Auto Precharge Refreshing Mode Register Accessing Ver. A Command /CS /RAS /CAS /WE A11 L L L L L L L H X L L H L L L H L H L A0-A10 Description Action Note Mode Register Set ILLEGAL 13,14 X Auto or Self Refresh ILLEGAL 13 BA X Precharge ILLEGAL 4,13 H BA Row Add. Bank Activate ILLEGAL 4,12 L L BA Col Add./ A10 Write/WriteAP ILLEGAL 4,12 H L H BA Col Add./ A10 Read/ReadAP ILLEGAL 4,9,12 L H H H X X No Operation No Operation : Precharge after tDPL H X X X X X Device Deselect No Operation : Precharge after tDPL L L L L Mode Register Set ILLEGAL 13,14 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge ILLEGAL 13 L L H H BA Row Add. Bank Activate ILLEGAL 13 L H L L BA Col Add./A10 Write/Write AP ILLEGAL 13 L H L H BA Col Add./A10 Read/Read AP ILLEGAL 13 L H H H X X No Operation No Operation : Idle after tRC H X X X X X Device Deselect No Operation : Idle after tRC L L L L Mode Register Set ILLEGAL 13,14 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge ILLEGAL 13 L L H H BA Row Add. Bank Activate ILLEGAL 13 L H L L BA Col Add./A10 Write/WriteAP ILLEGAL 13 L H L H BA Col Add./A10 Read/Read AP ILLEGAL 13 L H H H X X No Operation No Operation : Idle after 2 Clock Cycle H X X X X X Device Deselect No Operation : Idle after 2 Clock Cycle OP CODE OP CODE OP CODE Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 16 Enable Semiconductor Corp. N16D1625LPA Note : 1. H: Logic High, L: Logic Low, X: Don't care, A11: Bank Address, AP: Auto Precharge. 2. All entries assume that CKE was active during the preceding clock cycle. 3. If both banks are idle and CKE is inactive, then in power down cycle 4. Illegal to bank in specified states. Function may be legal in the bank indicated by Bank Address, depending on the state of that bank. 5. If both banks are idle and CKE is inactive, then Self Refresh mode. 6. Illegal if tRCD is not satisfied. 7. Illegal if tRAS is not satisfied. 8. Must satisfy burst interrupt condition. 9. Must satisfy bus contention, bus turn around, and/or write recovery requirements. 10. Must mask preceding data which don't satisfy tDPL. 11. Illegal if tRRD is not satisfied 12. Illegal for single bank, but legal for other banks in multi-bank devices. 13. Illegal for all banks. 14. Mode Register Set and Extended Mode Register Set is same command truth table except A11. Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 17 N16D1625LPA Enable Semiconductor Corp. Table6: CKE Truth Table Current State Self Refresh CKE Command /CS /RAS /CAS /WE A11 A0-A10 H X X X X X X X INVALID 2 L H H X X X X X Exit Self Refresh with Device Deselect 3 L H L H H H X X Exit Self Refresh with No Operation 3 L H L H H L X X ILLEGAL 3 L H L H L X X X ILLEGAL 3 L H L L X X X X ILLEGAL 3 L L X X X X X X Maintain Self Refresh H X X X X X X X INVALID 2 L H H X X X X X L H H H X X Power Down Mode Exit, All Banks Idle 3 L X X X X X L X X X X X L X X L All Banks Idle Any State other than listed above Ver. A Note Current Cycle Power Down Deep Power Down Action Prev Cycle H L ILLEGAL 3 L L X X X X X X Maintain Power Down Mode H X X X X X X X INVALID 2 L H X X X X X X Deep Power Down Mode Set 6 L L X X X X X X Maintain Deep Power Down Mode H H H X X X H H L H X X H H L L H X H H L L L H H H L L L L H L H X X X H L L H X X H L L L H X H L L L L H H L L L L L L X X X X X X X Power Down H H X X X X X X Refer to Operations of the Current State Truth Table H L X X X X X X Begin Clock Suspend next cycle L H X X X X X X Exit Clock Suspend next cycle L L X X X X X X Maintain Clock Suspend Refer to the Idle State section of the Current State Truth Table 4 4 4 X X OP CODE Auto Refresh Mode Register Set 5 Refer to the Idle State section of the Current State Truth Table 4 4 4 X X Entry Self Refresh OP CODE Mode Register Set Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 5 5 18 Enable Semiconductor Corp. N16D1625LPA Note : 1. H: Logic High, L: Logic Low, X: Don't care 2. For the given current state CKE must be low in the previous cycle. 3. When CKE has a low to high transition, the clock and other inputs are re-enabled asynchronously. When exiting power down mode, a NOP (or Device Deselect) command is required on the first positive edge of clock after CKE goes high. 4. The address inputs depend on the command that is issued. 5. The Precharge Power Down mode, the Self Refresh mode, and the Mode Register Set can only be entered from the all banks idle state. 6. When CKE has a low to high transition, the clock and other inputs are re-enabled asynchronously. When exiting deep power down mode, a NOP (or Device Deselect) command is required on the first positive edge of clock after CKE goes high and is maintained for a minimum 100usec. Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 19 N16D1625LPA Enable Semiconductor Corp. Table7: Absolute Maximum Rating Parameter Symbol Ambient Temperature (Industrial) Rating -25 ~ 85 TA Ambient Temperature (Commercial) Unit C 0 ~ 70 TSTG -55 ~ 150 C VIN, VOUT -1.0 ~ 3.6 V VDD, VDDQ -1.0 ~ 3.6 V Short Circuit Output Current IOS 50 mA Power Dissipation PD 1 W Storage Temperature Voltage on Any Pin relative to VSS Voltage on VDD relative to VSS Note : Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. Table8: Capacitance (TA=25 C, f=1MHz, VDD=2.5V) Parameter Input Capacitance Pin Symbol Min Max Unit CLK CI1 2 4 pF A0~A11, CKE, /CS, /RAS, /CAS, /WE, L(U)DQM CI2 2 4 pF DQ0~DQ15 CIO 3 5 pF Data Input/Output Capacitance Table9: DC Operating Condition (Voltage referenced to VSS=0V, TA= -25 ~ 85 C) Parameter Symbol Min Typ Max Unit VDD 2.3 2.5 2.7 V VDDQ 2.3 2.5 2.7 V 1 Input High Voltage VIH 0.8 x VDDQ - VDDQ+0.3 V 2 Input Low Voltage VIL -0.3 0 0.3 V 3 Output High Voltage VOH 0.9 x VDDQ - - V IOH= -0.1mA Output Low Voltage VOL - - 0.2 V IOL= +0.1mA Input Leakage Current ILI -1 - 1 uA 4 Output Leakage Current ILO -1.5 1.5 uA 5 Power Supply Voltage Note Note : 1. VDDQ must not exceed the level of VDD 2. VIH(max) = VDDQ+1.5V AC. The overshoot voltage duration is 3ns. 3. VIL(min) = -1.0V AC. The overshoot voltage duration is 3ns. 4. Any input 0V VIN VDDQ. Input leakage currents include Hi-Z output leakage for all bi-directional buffers with tri-state outputs. 5. DOUT is disabled, 0V VOUT VDDQ. Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 20 N16D1625LPA Enable Semiconductor Corp. Table10: AC Operating Condition (TA= -25 ~ 85 C, VDD = 2.5V 0.2V, VSS=0V) Parameter Symbol Typ Unit VIH / VIL 0.9 x VDDQ / 0.2 V Input Timing Measurement Reference Level Voltage VTRIP 0.5 x VDDQ V Input Rise / Fall Time tR / tF 1/1 ns Output Timing Measurement Reference Level Voltage VOUTREF 0.5 x VDDQ V CL 30 pF AC Input High/Low Level Voltage Output Load Capacitance for Access Time Measurement VTT=0.5 x VDDQ VDDQ 500 Output Output 500 Z0=50 30pF DC Output Load Circuit Ver. A 50 30pF AC Output Load Circuit Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 21 N16D1625LPA Enable Semiconductor Corp. Table11: DC Characteristic (DC operating conditions unless otherwise noted) Parameter Speed Sym Test Condition Operating Current ICC1 Burst Length=1, One Bank Active, tRC tRC(min) IOL = 0 mA 35 Precharge Standby Current in Power Down Mode ICC2P CKE VIL(max), tCK = 10ns 60 ICC2PS CKE & CLK VIL(max), tCK = 60 ICC2N CKE VIH(min), /CS VIH(min), tCK = 10ns Input signals are changed one time during 2 clks. 6 ICC2NS CKE VIH(min), CLK VIL(max), tCK = Input signals are stable. 1 Precharge Standby Current in Non Power Down Mode Active Standby Current in Power Down Mode Active Standby Current in Non Power Down Mode 1.0 ICC3PS CKE & CLK VIL(max), tCK = 0.5 ICC3N CKE VIH(min), /CS VIH(min), tCK = 10ns Input signals are changed one time during 2 clks. 12 ICC3NS CKE VIH(min), CLK VIL(max), tCK = Input signals are stable. 6 tCK>tCK(min), IOL = 0 mA, Page Burst All Banks Activated, tCCD = 1 clk Auto Refresh Current (4K Cycle) ICC5 tRC tRFC(min), All Banks Active 2 Banks 1 Bank -10 Unit Note mA 1 uA mA CKE VIL(max), tCK = 10ns ICC4 Self Refresh Current -75 ICC3P Burst Mode Operating Current PASR -60 mA mA 55 45 35 30 mA 1 mA 2 TCSR 45~85C -25~45C 70 ICC6 CKE 0.2V 55 45~85C 65 -25~45C 50 Deep Power Down Mode Current ICC7 10 uA uA Note : 1. Measured with outputs open. 2. Refresh period is 64ms. Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 22 N16D1625LPA Enable Semiconductor Corp. Table12: AC Characteristic (AC operation conditions unless otherwise noted) Parameter Sym CLK Cycle Time Access time from CLK (pos. edge) Min -60 Max Min 7.5 -75 Max Min CL = 3 tCK3 6.0 CL = 2 tCK2 10 CL = 3 tAC3 5.5 6 8 CL = 2 tAC2 8 8 8 1000 10 1000 10 -10 Max 10 Unit 1000 Note 1 2 CLK High-Level Width tCH 2.5 2.5 2.5 3 CLK Low-Level Width tCL 2.5 2.5 2.5 3 tCKS 1.5 2.0 2.0 CKE Hold Time tCKH 1.0 1.0 1.0 /CS, /RAS, /CAS, /WE, DQM Setup Time tCMS 1.5 2.0 2.0 /CS, /RAS, /CAS, /WE, DQM Hold Time tCMH 1.0 1.0 1.0 Address Setup Time tAS 1.5 2.0 2.0 Address Hold Time tAH 1.0 1.0 1.0 Data-In Setup Time tDS 1.5 2.0 2.0 tDH 1.0 CKE Setup Time Data-In Hold Time Data-Out High-Impedance Time from CLK (pos.edge) 1.0 ns 1.0 CL = 3 tHZ3 5.5 6 8 CL = 2 tHZ2 8 8 8 4 Data-Out Low-Impedance Time tLZ 1.0 1.0 1.0 Data-Out Hold Time (load) tOH 2.5 2.5 2.5 Data-Out Hold Time (no load) tOHN 1.8 ACTIVE to PRECHARGE command tRAS 42 tRP 18 22.5 20 ACTIVE bank a to ACTIVE bank a command tRC 60 67.5 64 ACTIVE bank a to ACTIVE bank b command tRRD 12 15 20 ACTIVE to READ or WRITE delay tRCD 18 22.5 20 READ/WRITE command to READ/WRITE command tCCD 1 1 1 WRITE command to input data delay tDWD 0 0 0 6 Data-in to PRECHARGE command tDPL 12 15 20 7 Data-in to ACTIVE command tDAL 30 37.5 40 DQM to data high-impedance during READs tDQZ 2 2 2 6 6 PRECHARGE command period 1.8 100K 45 1.8 100K 40 100K 5 CLK ns 6 7 DQM to data mask during WRITEs tDQM 0 0 0 LOAD MODE REGISTER command to ACTIVE or REFRESH command tMRD 2 2 2 CL = 3 tROH3 3 3 3 CL = 2 tROH2 2 2 2 Last data-in to burst STOP command tBDL 1 1 1 6 Last data-in to new READ/WRITE command tCDL 1 1 1 6 tCKED 1 1 1 Data-out to high-impedance from PRECHARGE command CKE to clock disable or power-down entry mode CKE to clock enable or power-down exit setup mode tPED 1 1 9 64 1 tREF AUTO REFRESH period tRFC 66 67.5 70 Exit SELF REFRESH to ACTIVE command tXSR 66 67.5 70 tT 0.5 Ver. A 6 CLK Refresh period (4,096 rows) Transition time 8 CLK 1.2 64 0.5 1.2 9 64 0.5 ms 5 ns 5 1.2 Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 23 Enable Semiconductor Corp. N16D1625LPA Note : 1. The clock frequency must remain constant (stable clock is defined as a signal cycling within timing constraints specified for the clock pin) during access or precharge states (READ, WRITE, including tDPL, and PRECHARGE commands). CKE may be used to reduce the data rate. 2. tAC at CL = 3 with no load is 5.5ns and is guaranteed by design. Access time to be measured with input signals of 1V/ns edge rate, from 0.8V to 0.2V. If tR > 1ns, then (tR/2-0.5)ns should be added to the parameter. 3. AC characteristics assume tT = 1ns. If tR & tF > 1ns, then [(tR+tF)/2-1]ns should be added to the parameter. 4. tHZ defines the time at which the output achieves the open circuit condition; it is not a reference to VOH or VOL. The last valid data element will meet tOH before going High-Z. 5. Parameter guaranteed by design. A. Target values listed with alternative values in parentheses. B. tRFC must be less than or equal to tRC+1CLK tXSR must be less than or equal to tRC+1CLK 6. Required clocks are specified by JEDEC functionality and are not dependent on any timing parameter. 7. Timing actually specified by tDPL plus tRP; clock(s) specified as a reference only at minimum cycle rate 8. JEDEC and PC100 specify three clocks. 9. Timing actually specified by tCKs; clock(s) specified as a reference only at minimum cycle rate. Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 24 Enable Semiconductor Corp. N16D1625LPA Special Operation for Low Power Consumption Temperature Compensated Self Refresh Temperature Compensated Self Refresh allows the controller to program the Refresh interval during SELF REFRESH mode, according to the case temperature of the Low Power SDRAM device. This allows great power savings during SELF REFRESH during most operating temperature ranges. Only during extreme temperatures would the controller have to select a TCSR level that will guarantee data during SELF REFRESH. Every cell in the DRAM requires refreshing due to the capacitor losing its charge over time. The refresh rate is dependent on temperature. At higher temperatures a capacitor loses charge quicker than at lower temperatures, requiring the cells to be refreshed more often. Historically, during Self Refresh, the refresh rate has been set to accommodate the worst case, or highest temperature range expected. Thus, during ambient temperatures, the power consumed during refresh was unnecessarily high, because the refresh rate was set to accommodate the higher temperatures. Setting M4 and M3, allow the DRAM to accommodate more specific temperature regions during SELF REFRESH. There are four temperature settings, which will vary the SELF REFRESH current according to the selected temperature. This selectable refresh rate will save power when the DRAM is operating at normal temperatures. Partial Array Self Refresh For further power savings during SELF REFRESH, the PASR feature allows the controller to select the amount of memory that will be refreshed during SELF REFRESH. The refresh options are Two Bank;all two banks, One Bank;bank 0. WRITE and READ commands can still occur during standard operation, but only the selected banks will be refreshed during SELF REFRESH. Data in banks that are disabled will be lost. Deep Power Down Deep Power Down is an operating mode to achieve maximum power reduction by eliminating the power of the whole memory array of the devices. Data will not be retained once the device enters Deep Power Down Mode. This mode is entered by having all banks idle then /CS and /WE held low with /RAS and /CAS held high at the rising edge of the clock, while CKE is low. This mode is exited by asserting CKE high. Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 25 N16D1625LPA Enable Semiconductor Corp. Figure8: Deep Power Down Mode Entry CLK CKE /CS /RAS tRP Deep Power Down Entry Precharge if needed Figure9: Deep Power Down Mode Exit CLK CKE /CS /RAS /CAS /WE 100 s Deep Power Down Exit tRP Auto Refresh All Banks Precharge Ver. A tRFC Auto Refresh Mode Register Set New Command Extended Mode Register Set Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 26 N16D1625LPA Enable Semiconductor Corp. Figure10: 60Ball FBGA Configuration 6.40.1 1.25 3.9 0.65 0.65 A B C D E F G J 10.10.1 9.1 H K L M N P R 0.30.05 7 6 5 4 3 2 1 1.0max 0.230.05 [Bottom View] Note: All Dimensions in millimeters Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 27 N16D1625LPA Enable Semiconductor Corp. Figure11: 50Pin TSOPII Configuration #1 1.03MAX 0.80 NOM 11.76 0.20 0~8 0.49 0.27 1.00 0.05 0.80 TYP 0.17 NOM #25 20.95 0.10 0.50 0.10 #26 10.16 0.10 #50 1.20Max 0.05 Min Note: All Dimensions in millimeters Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 28 N16D1625LPA Enable Semiconductor Corp. Ordering Information N 16 D 16 25 LP A X - XX X Enable Semiconductor Corp. Density Temperature 16 = 16Mb C = Commercial (0C to 70C) I = Industrial (-25C to 85C) Product Type Speed D = SDRAM 60 = 6.0ns (166MHz) 75 = 7.5ns (133MHz) 10 = 10ns (100MHz) Package Data I/O Width C2 = FBGA Green (60Ball) T2 = TSOPII Green (50Pin) 16 = 16 I/O Generation A = 1st Generation Power Supply Features 25 = 2.5V LP = Low Power SDRAM Revision History Version Date A August 1st , 2006 Change Description Initial Release (c) 2005 - 2006 Enable Semiconductor Corp. All rights reserved. Enable Semiconductor Corp. ("Enable") reserves the right to change or modify the information contained in this data sheet and the products described therein, without prior notice. Enable does not convey any license under its patent rights nor the rights of others. Charts, drawings and schedules contained in this data sheet are provided for illustration purposes only and they vary depending upon specific applications. Enable makes no warranty or guarantee regarding suitability of these products for any particular purpose, nor does Enable assume any liability arising out of the application or use of any product or circuit described herein. Enable does not authorize use of its products as critical components in any application in which the failure of the Enable product may be expected to result in significant injury or death, including life support systems and critical medical instrument. Ver. A Enable Semiconductor Corp. reserves the right to change products or specifications without notice. 29