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POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
DMaximum Throughput 200-KSPS
DBuilt-In Reference, Conversion Clock and
8× FIFO
DDifferential/Integral Nonlinearity Error:
±1.2 LSB at −55°C to 125°C
DSignal-to-Noise and Distortion Ratio:
65 dB, fi = 12-kHz at −55°C to 125°C
DSpurious Free Dynamic Range: 75 dB,
fi = 12- kHz
DSPI/DSP-Compatible Serial Interfaces With
SCLK up to 20-MHz
DSingle Wide Range Supply 3 Vdc to
5.5 Vdc
DAnalog Input Range 0-V to Supply Voltage
With 500 kHz BW
DHardware Controlled and Programmable
Sampling Period
DLow Operating Current (1-mA at 3.3-V,
2-mA at 5.5-V With External Ref, 1.7-mA at
3.3-V, 2.4-mA at 5.5-V With Internal Ref)
DPower Down: Software/Hardware
Power-Down Mode (1 µA Typ, Ext Ref),
Autopower-Down Mode (1 µA Typ, Ext Ref)
DProgrammable Auto-Channel Sweep
DAvailable in Q-Temp Automotive
High Reliability Automotive Applications
Configuration Control/Print Support
Qualification to Automotive Standards
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
SDO
SDI
SCLK
E
OC/(INT)
VCC
A0
A1
A2
A3
A4
CS
REFP
REFM
FS
PWDN
GND
CSTART
A7
A6
A5
TLV2548Q . . . DW PACKAGE
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
SDO
SDI
SCLK
EOC/(INT)
VCC
A0
A1
A2
CS
REFP
REFM
FS
PWDN
GND
CSTART
A3
TLV2544Q ...D PACKAGE
(TOP VIEW)
(TOP VIEW)
1920132
17
18
16
15
14
1312119 10
5
4
6
7
8
REFM
FS
PWDN
GND
CSTART
EOC/(INT)
VCC
A0
A1
A2
SCLK
SDI
SDO
CS
REFP
A
4
A
5
A
6
A
7
A
3
TLV2548M . . . FK PACKAGE
(TOP VIEW)
description
The TLV2544Q, TLV2548Q, and TLV2548M are a family of high performance, 12-bit low power, 3.5 µs, CMOS
analog-to-digital converters (ADC) which operate from a single 3-V to 5.5-V power supply. These devices have
three digital inputs and a 3-state output [chip select (CS), serial input-output clock (SCLK), serial data input
(SDI), and serial data output (SDO)] that provide a direct 4-wire interface to the serial port of most popular host
microprocessors (SPI interface). When interfaced with a DSP, a frame sync (FS) signal is used to indicate the
start of a serial data frame.
Copyright 2009, Texas Instruments Incorporated
! "#$%&'()"%# "* +,&&-#) (* %$ .,/0"+()"%# 1()-
&%1,+)* +%#$%&' )% *.-+"$"+()"%#* .-& )2- )-&'* %$ -3(* #*)&,'-#)*
*)(#1(&1 4(&&(#)5 &%1,+)"%# .&%+-**"#6 1%-* #%) #-+-**(&"05 "#+0,1-
)-*)"#6 %$ (00 .(&('-)-&*
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
2POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
description (continued)
In addition to a high-speed A/D converter and versatile control capability, these devices have an on-chip analog
multiplexer that can select any analog inputs or one of three internal self-test voltages. The sample-and-hold
function is automatically started after the fourth SCLK edge (normal sampling) or can be controlled by a special
pin, CSTART, to extend the sampling period (extended sampling). The normal sampling period can also be
programmed as short (12 SCLKs) or as long (24 SCLKs) to accommodate faster SCLK operation popular
among high-performance signal processors. The TLV2548 and TLV2544 are designed to operate with very low
power consumption. The power-saving feature is further enhanced with software/hardware/autopower-down
modes and programmable conversion speeds. The conversion clock (OSC) and reference are built-in. The
converter can use the external SCLK as the source of the conversion clock to achieve higher (up to 2.8 µs when
a 20 MHz SCLK is used) conversion speed. Two different internal reference voltages are available. An optional
external reference can also be used to achieve maximum flexibility.
The TLV2544Q and the TLV2548Q are characterized for operation from −40°C to 125°C. The TLV2548M is
characterized for operation from −55°C to 125°C.
functional block diagram
Command
Decode
SDI
CS
FS EOC/(INT)
Low Power
12-BIT
SAR ADC
Control Logic
CSTART
PWDN
VCC
GND
REFP
Analog
MUX
4/2 V
Reference
S/H
OSC
Conversion
Clock M
U
X
FIFO
12 Bit × 8
CFR
SCLK
SDO
2548
A0
A1
A2
A3
A4
A5
A6
A7
REFM
2544
A0
X
A1
X
A2
X
A3
X
CMR (4 MSBs)
AVAILABLE OPTIONS
TA20-SOIC
(DW) 16-SOIC
(D) 20-LCCC
(FK)
−40°C to 125°C TLV2548QDW TLV2544QD —
−55°C to 125°C — — TLV2548MFK
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POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
NO. I/O DESCRIPTION
NAME
TLV2544 TLV2548
I/O
DESCRIPTION
A0 A0
A1 A1
A2 A2
A3 A3
A4
A5
A6
A7
6
7
8
9
6
7
8
9
10
11
12
13
IAnalog signal inputs. The analog inputs are applied to these terminals and are internally
multiplexed. The driving source impedance should be less than or equal to 1 kΩ.
For a source impedance greater than 1 kΩ, use the asynchronous conversion start signal CSTART
(CSTART low time controls the sampling period) or program long sampling period to increase the
sampling time.
CS 16 20 I Chip select. A high-to-low transition on the CS input resets the internal 4-bit counter, enables SDI,
and removes SDO from 3-state within a maximum setup time. SDI is disabled within a setup time
after the 4-bit counter counts to 16 (clock edges) or a low-to-high transition of CS whichever
happens first.
NOTE: C S falling and rising edges need to happen when SCLK is low for a microprocessor interface
such as SPI.
CSTART 10 14 I This terminal controls the start of sampling of the analog input from a selected multiplex channel.
Sampling time starts with the falling edge of CSTART and ends with the rising edge of CSTART as
long as CS is held high. In mode 01, select cycle, CSTART can be issued as soon as CHANNEL
is selected which means the fifth SCLK during the select cycle, but the effective sampling time is
not started until CS goes to high. The rising edge of CSTART (when CS = 1) also starts the
conversion. Tie this terminal to VCC if not used.
EOC/(INT) 4 4 O End of conversion or interrupt to host processor.
[PROGRAMMED AS EOC]: This output goes from a high-to-low logic level at the end of the
sampling period and remains low until the conversion is complete and data are ready for transfer.
EOC is used in conversion mode 00 only.
[PROGRAMMED A S I N T ]: This pin can also be programmed as an interrupt output signal to the host
processor. The falling edge of INT indicates data are ready for output. The following CS↓ or FS
clears INT.
FS 13 17 I DSP frame sync input. Indication of the start of a serial data frame in or out of the device. If FS
remains low after the falling edge of CS, SDI is not enabled until an active FS is presented. A
high-to-low transition on the FS input resets the internal 4-bit counter and enables SDI within a
maximum setup time. SDI is disabled within a setup time after the 4-bit counter counts to 16 (clock
edges) or a low-to-high transition of CS whichever happens first.
Tie this terminal to VCC if not used. NOTE: The current silicon will react to FS input irrespective of
the state of CS signal.
GND 11 15 I Ground return for the internal circuitry. Unless otherwise noted, all voltage measurements are with
respect to GND.
PWDN 12 16 I Both analog and reference circuits are powered down when this pin is at logic zero. The device can
be restarted by active CS, FS or CSTART after this pin is pulled back to logic one.
SCLK 3 3 I Input serial clock. This terminal receives the serial SCLK from the host processor. SCLK is used to
clock the input SDI to the input register. When programmed, it may also be used as the source of
the conversion clock.
NOTE: This device supports CPOL (clock polarity) = 0, which is SCLK returns to zero when idling
for SPI compatible interface.
SDI 2 2 I Serial data input. The input data is presented with the MSB (D15) first. The first 4-bit MSBs,
D(15−12) are decoded as one of the 16 commands (12 only for the TLV2544). The configure write
commands require an additional 12 bits of data.
When FS is not used (FS =1), the first MSB (D15) is expected after the falling edge of CS and is
latched in on the rising edges of SCLK (after CS↓).
When FS is used (typical with an active FS from a DSP) the first MSB (D15) is expected after the
falling edge of FS and is latched in on the falling edges of SCLK.
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Terminal Functions (Continued)
TERMINAL
NAME
NO. I/O DESCRIPTION
NAME
TLV2544 TLV2548
I/O
DESCRIPTION
SDO 1 1 O The 3-state serial output for the A/D conversion result. SDO is kept in the high-impedance state
when CS is high and after the CS falling edge and until the MSB (D15) is presented. The output
format is MSB (D15) first.
When FS i s not used (FS = 1 at the falling edge of CS), the MSB (D15) is presented to the SDO pin
after the CS falling edge, and successive data are available at the rising edge of SCLK.
When FS is used (FS = 0 at the falling edge of CS), the MSB (D15) is presented to SDO after the
falling edge of CS and FS = 0 is detected. Successive data are available at the falling edge of SCLK.
(This is typically used with an active FS from a DSP.)
For conversion and FIFO read cycles, the first 12 bits are result from previous conversion (data)
followed by 4 don’t care bits. The first four bits from SDO for CFR read cycles should be ignored.
The register content is in the last 12 bits. SDO is 3-state (float) after the 16th bit.
REFM 14 18 I External reference input or internal reference decoupling.
REFP 15 19 I External reference input or internal reference decoupling. (Shunt capacitors of 10 µF and 0.1 µF
between REFP and REFM.) The maximum input voltage range is determined by the difference
between the voltage applied to this terminal and the REFM terminal when an external reference is
used.
VCC 5 5 I Positive supply voltage
detailed description
analog inputs and internal test voltages
The 4/8 analog inputs and three internal test inputs are selected by the analog multiplexer depending on the
command entered. The input multiplexer is a break-before-make type to reduce input-to-input noise injection
resulting from channel switching.
converter
The TLV2544/48 uses a 12-bit successive approximation ADC utilizing a charge redistribution DAC. Figure 1
shows a simplified version of the ADC.
The sampling capacitor acquires the signal on Ain during the sampling period. When the conversion process
starts, the SAR control logic and charge redistribution DAC are used to add and subtract fixed amounts of charge
from the sampling capacitor to bring the comparator into a balanced condition. When the comparator is
balanced, the conversion is complete and the ADC output code is generated.
Charge
Redistribution
DAC
Control
Logic
_
+
REFM
Ain ADC Code
Figure 1. Simplified Model of the Successive-Approximation System
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detailed description (continued)
serial interface
INPUT DATA FORMAT
MSB LSB
D15−D12 D11−D0
Command Configuration data field
Input data is binary. All trailing blanks can be filled with zeros.
OUTPUT DATA FORMAT READ CFR
MSB LSB
D15−D12 D11−D0
Don’t care Register content
OUTPUT DATA FORMAT CONVERSION/READ FIFO
MSB LSB
D15−D4 D3−D0
Conversion result Don’t care
The output data format is binary (unipolar straight binary).
binary
Zero scale code = 000h, Vcode = VREFM
Full scale code = FFFh, Vcode = VREFP − 1 LSB
control and timing
power up and initialization requirements
DDetermine processor type by writing A000h to the TLV2544/48 (CS must be toggled)
DConfigure the device (CS must make a high-to-low transition, then can be held low if in DSP mode; i.e.,
active FS.)
The first conversion after power up or resuming from power down is not valid.
start of the cycle:
DWhen FS is not used (FS = 1 at the falling edge of CS), the falling edge of CS is the start of the cycle.
DWhen FS is used (FS is an active signal from a DSP), the falling edge of FS is the start of the cycle.
first 4-MSBs: the command register (CMR)
The TLV2544/TLV2548 have a 4-bit command set (see Table 1) plus a 12-bit configuration data field. Most of
the commands require only the first 4 MSBs, i.e., without the 12-bit data field.
NOTE:
The device requires a write CFR (configuration register) with 000h data (write A000h to the serial
input) at power up to initialize host select mode.
The valid commands are listed in Table 1.
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6POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Table 1. TLV2544/TLV2548 Command Set
SDI D(15−12) BINARY TLV2548 COMMAND TLV2544 COMMAND
0000b 0h Select analog input channel 0 Select analog input channel 0
0001b 1h Select analog input channel 1 N/A
0010b 2h Select analog input channel 2 Select analog input channel 1
0011b 3h Select analog input channel 3 N/A
0100b 4h Select analog input channel 4 Select analog input channel 2
0101b 5h Select analog input channel 5 N/A
0110b 6h Select analog input channel 6 Select analog input channel 3
0111b 7h Select analog input channel 7 N/A
1000b 8h SW power down (analog + reference)
1001b 9h Read CFR register data shown as SDO D(11−0)
1010b Ah plus data Write CFR followed by 12-bit data, e.g., 0A100h means external reference,
short sampling, SCLK/4, single shot, INT
1011b Bh Select test, voltage = (REFP+REFM)/2
1100b Ch Select test, voltage = REFM
1101b Dh Select test, voltage = REFP
1110b Eh FIFO read, FIFO contents shown as SDO D(15−4), D(3−0) = 0000
1111b
Fh plus data
Reserved
1111b Fh plus data Reserved
configuration
Configuration data is stored in one 12-bit configuration register (CFR) (see Table 2 for CFR bit definitions). Once
configured after first power up, the information is retained in the H/W or S/W power down state. When the device
is being configured, a write CFR cycle is issued by the host processor. This is a 16-bit write. If the SCLK stops
after the first 8 bits are entered, then the next eight bits can be taken after the SCLK is resumed. The status of
the CFR can be read with a read CFR command when the device is programmed for one-shot conversion mode
(CFR D[6,5] = 00).
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POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
control and timing (continued)
Table 2. TLV2544/TLV2548 Configuration Register (CFR) Bit Definitions
BIT DEFINITION
D11 Reference select
0: External 1: internal
D10 Internal reference voltage select
0: Internal ref = 4 V 1: internal ref = 2 V
D9 Sample period select
0: Short sampling 12 SCLKs (1x sampling time)
1: Long sampling 24 SCLKs (2x sampling time)
D(8−7) Conversion clock source select
00: Conversion clock = internal OSC
01: Conversion clock = SCLK
10: Conversion clock = SCLK/4
11: Conversion clock = SCLK/2
D(6,5) Conversion mode select
00: Single shot mode [FIFO not used, D(1,0) has no effect.]
01: Repeat mode
10: Sweep mode
11: Repeat sweep mode
D(4,3)†TLV2548 TLV2544
D(4,3)
Sweep auto sequence select
00: 0−1−2−3−4−5−6−7
01: 0−2−4−6−0−2−4−6
10: 0−0−2−2−4−4−6−6
11: 0−2−0−2−0−2−0−2
Sweep auto sequence select
00: N/A
01: 0−1−2−3−0−1−2−3
10: 0−0−1−1−2−2−3−3
11: 0−1−0−1−0−1−0−1
D2 EOC/INT − pin function select
0: Pin used as INT
1: Pin used as EOC
D(1,0) FIFO trigger level (sweep sequence length)
00: Full (INT generated after FIFO level 7 filled)
01: 3/4 (INT generated after FIFO level 5 filled)
10: 1/2 (INT generated after FIFO level 3 filled)
11: 1/4 (INT generated after FIFO level 1 filled)
†These bits only take effect in conversion modes 10 and 11.
sampling
The sampling period starts after the first 4 input data are shifted in if they are decoded as one of the conversion
commands. These are select analog input (channel 0 through 7) and select test (channel 1 through 3).
normal sampling
When the converter is using normal sampling, the sampling period is programmable. It can be 12 SCLKs (short
sampling) or 24 SCLKs (long sampling). Long sampling helps when SCLK is faster than 10 MHz or when input
source resistance is high.
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extended sampling
CSTART − An asynchronous (to the SCLK) signal, via dedicated hardware pin, CSTART, can be used in order
to have total control of the sampling period and the start of a conversion. This extended sampling is user-defined
and is totally independent of SCLK. While CS is high, the falling edge of CSTART is the start of the sampling
period and is controlled by the low time of CSTART. The minimum low time for CSTART should be at least equal
to the minimum t(SAMPLE). In a select cycle used in mode 01 (REPEAT MODE), CSTART can be started as soon
as the channel is selected (after the fifth SCLK). In this case the sampling period is not started until CS has
become inactive. Therefore the nonoverlapped CSTART low time must meet the minimum sampling time
requirement. The low-to-high transition of CSTART terminates the sampling period and starts the conversion
period. The conversion clock can also be configured to use either internal OSC or external SCLK. This function
is useful for an application that requires:
DThe use of an extended sampling period to accommodate different input source impedance
DThe use of a faster I/O clock on the serial port but not enough sampling time is available due to the fixed
number of SCLKs. This could be due to a high input source impedance or due to higher MUX ON resistance
at lower supply voltage.
Once the conversion is complete, the processor can initiate a read cycle by using either the read FIFO command
to read the conversion result or by simply selecting the next channel number for conversion. Since the device
has a valid conversion result in the output buffer, the conversion result is simply presented at the serial data
output. To completely get out of the extended sampling mode, CS must be toggled twice from a high-to-low
transition while CSTART is high. The read cycle mentioned above followed by another configuration cycle of
the ADC qualifies this condition and will successfully put the ADC back to its normal sampling mode. This can
be viewed in Figure 9.
Table 3. Sample and Convert Conditions
CONDITIONS SAMPLE CONVERT
CSTART CS = 1
No sampling clock (SCLK) required. Sampling
period is totally controlled by the low time of CSTART.
The high-to-low transition of CSTART (when CS=1)
starts the sampling of the analog input signal. The low
time of CSTART dictates the sampling period. The
low-to-high transition of CSTART ends sampling
period and begins the conversion cycle. (Note: this
trigger only works when internal reference is selected
for conversion modes 01, 10, and 11.)
1) If internal clock OSC is selected a minimum of 3 MHz
CS CSTART = 1
FS = 1
SCLK is required. Sampling period is programmable
under normal sampling. When programmed to sample
under short sampling, 12 SCLKs are generated to
complete sampling period. 24 SCLKs are generated
when programmed for long sampling. A command s e
t
to configure the device requires 4 SCLKs thereby ex
-
tending t o 1 6 o r 28 SCLKs respectively before conver-
1) If internal clock OSC is selected a minimum of 3 MHz
(equivalent to 4.6 µs conversion speed) can be
achieved.
2) If external SCLK is selected, conversion time i
s
tconv = 14 × DIV/f(SCLK), where DIV can be 1, 2
,
or 4.
FS CSTART = 1
CS = 0
tending t o 1 6 o r 28 SCLKs respectively before conver-
sion takes place. (Note: Because the ADC only
bypasses a valid channel select command, the use
r
can use select channel 0, 0000b, as the SDI inpu
t
when either CS or FS is used as trigger for conversion
.
The ADC responds to commands such as SW power
-
down, 1000b.)
!
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POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV2544/TLV2548 conversion modes
The T LV2544 and TLV2548 have four dif ferent conversion modes (mode 00, 01, 10, 11). The operation of each
mode is slightly different, depending on how the converter performs the sampling and which host interface is
used. The trigger for a conversion can be an active CSTART (extended sampling), CS (normal sampling, SPI
interface), or FS (normal sampling, TMS320 DSP interface). When FS is used as the trigger, CS can be held
active, i.e. CS does not need to be toggled through the trigger sequence. SDI can be one of the channel select
commands, such as SELECT CHANNEL 0. Dif ferent types of triggers should not be mixed throughout the repeat
and sweep operations. When CSTART is used as the trigger, the conversion starts on the rising edge of
CSTART. The minimum low time for CSTART is equal to t(SAMPLE). If an active CS or FS is used as the trigger,
the conversion is started after the 16th or 28th SCLK edge. Enough time (for conversion) should be allowed
between consecutive triggers so that no conversion is terminated prematurely.
one shot mode (mode 00)
One shot mode (mode 00) does not use the FIFO, and the EOC is generated as the conversion is in progress
(or INT is generated after the conversion is done).
repeat mode (mode 01)
Repeat mo d e (mode 01) uses the FIFO. This mode setup requires configuration cycle and channel select cycle.
Once the programmed FIFO threshold is reached, the FIFO must be read, or the data is lost when the sequence
starts over again with the SELECT cycle and series of triggers. No configuration is required except for
reselecting the channel unless the operation mode is changed. This allows the host to set up the converter and
continue monitoring a fixed input and come back to get a set of samples when preferred.
Triggered by CSTART: The first conversion can be started with a select cycle or CSTART. To do so, the user
can issue CSTART during the select cycle, immediately after the four-bit channel select command. The first
sample started as soon as the select cycle is finished (i.e., CS returns to 1). If there is enough time (2 µs) left
between the SELECT cycle and the following CSTART, a conversion is carried out. In this case, you will need
one less trigger to fill the FIFO. Succeeding samples are triggered by CSTART.
sweep mode (mode 10)
Sweep mode (mode 10) also uses the FIFO. Once it is programmed in this mode, all of the channels listed in
the selected sweep sequence are visited in sequence. The results are converted and stored in the FIFO. This
sweep sequence may not be completed if the FIFO threshold is reached before the list is completed. This allows
the system designer to change the sweep sequence length. Once the FIFO has reached its programmed
threshold, an interrupt (INT) is generated. The host must issue a read FIFO command to read and clear the FIFO
before the next sweep can start.
repeat sweep mode (mode 11)
Repeat sweep mode (mode 11) works the same way as mode 10 except the operation has an option to continue
even if the FIFO threshold is reached. Once the FIFO has reached its programmed threshold, an interrupt (INT)
is generated. Then two things may happen:
1. The host may choose to act on it (read the FIFO) or ignore it. If the next cycle is a read FIFO cycle, all of
the data stored in the FIFO is retained until it has been read in order.
2. If the next cycle is not a read FIFO cycle, or another CSTART is generated, all of the content stored in the
FIFO is cleared before the next conversion result is stored in the FIFO, and the sweep is continued.
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10 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV2544/TLV2548 conversion modes (continued)
Table 4. TLV2544/TLV2548 Conversion Mode
CONVERSION
MODE CFR
D(6,5) SAMPLING
TYPE OPERATION
One shot 00 Normal •Single conversion from a selected channel
•CS or FS to start select/sampling/conversion/read
•One INT or EOC generated after each conversion
•Host must serve INT by selecting channel, and converting and reading the previous output.
Extended •Single conversion from a selected channel
•CS to select/read
•CSTART to start sampling and conversion
•One INT or EOC generated after each conversion
•Host must serve INT by selecting next channel and reading the previous output.
Repeat 01 Normal •Repeated conversions from a selected channel
•CS or FS to start sampling/conversion
•One INT generated after FIFO is filled up to the threshold
•Host must serve INT by either 1) (FIFO read) reading out all of the FIFO contents up to the
threshold, then repeat conversions from the same selected channel or 2) writing another
command(s) to change the conversion mode. If the FIFO is not read when INT is served, it is
cleared.
Extended •Same as normal sampling except CSTART starts each sampling and conversion when CS is
high.
Sweep 10 Normal •One conversion per channel from a sequence of channels
•CS or FS to start sampling/conversion
•One INT generated after FIFO is filled up to the threshold
•Host must serve INT by (FIFO read) reading out all of the FIFO contents up to the threshold, then
write another command(s) to change the conversion mode.
Extended •Same as normal sampling except CSTART starts each sampling and conversion when CS is
high.
Repeat sweep 11 Normal •Repeated conversions from a sequence of channels
•CS or FS to start sampling/conversion
•One INT generated after FIFO is filled up to the threshold
•Host must serve INT by either 1) (FIFO read) reading out all of the FIFO contents up to the
threshold, then repeat conversions from the same selected channel or 2) writing another
command(s) to change the conversion mode. If the FIFO is not read when INT is served it is
cleared.
Extended •Same as normal sampling except CSTART starts each sampling and conversion when CS is
high.
NOTES: 1. Programming the EOC/INT pin as the EOC signal works for mode 00 only. The other three modes automatically generate an INT
signal irrespective of how EOC/INT is programmed.
2. When using CSTART to sample in extended mode, the falling edge of the next CSTART trigger should occur no more than 2.5 µs
after the falling CS edge (or falling FS edge if FS is active) of the channel select cycle. This is to prevent an ongoing conversion from
being canceled.
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timing diagrams
The timing diagrams can be categorized into two major groups: nonconversion and conversion. The
nonconversion cycles are read and write (configuration). None of these cycles carry a conversion. Conversion
cycles are those four modes of conversion.
read cycle (read FIFO or read CFR)
read CFR cycle:
The read command is decoded in the first 4 clocks. SDO outputs the contents of the CFR after the 4th SCLK.
ÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏ
ÏÏÏÏ
ÏÏÏÏ
ÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏ
SCLK
CS
FS
SDI
INT
EOC
SDO
ID14 ID13 ID12 ID15
OD11 OD10 OD9 OD4 OD3 OD2 OD1 OD0
12 345 6 7131415
16 1
12
ID15
Figure 2. TLV2544/TLV2548 Read CFR Cycle (FS active)
ÏÏÏ
ÏÏÏ
ÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏ
SCLK
CS
FS
SDI
INT
EOC
SDO
ID15 ID14 ID13 ID12 ID14
OD4 OD3 OD2 OD1 OD0
12 345 6 7131415
16 1
12
ÏÏÏ
ÏÏÏÏÏÏ
OD11 OD10 OD9
ID15
Figure 3. TLV2544/TLV2548 Read CFR Cycle (FS = 1)
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
12 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
read cycle (read FIFO or read CFR) (continued)
FIFO read cycle
The first command in the active cycle after INT is generated, if the FIFO is used, is assumed as the FIFO read
command. The first FIFO content is output immediately before the command is decoded. If this command is
not a FIFO read, then the output is terminated but the first data in the FIFO is retained until a valid FIFO read
command is decoded. Use of more layers of the FIFO reduces the time taken to read multiple data. This is
because the read cycle does not generate EOC or INT, nor does it carry out any conversion.
ÏÏÏ
ÏÏÏ
ÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏ
SCLK
CS
FS
SDI
INT
EOC
SDO
ID15 ID14 ID13 ID12
OD7 OD5 OD0
12 345 6 7131415
16
12
OD11 OD10 OD9 OD6
ÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏ
OD8
ID15
12
OD10OD11
ID14
These Devices can Perform Continuous FIFO Read Cycle (FS = 1) Controlled by SCLK, SCLK can Stop Between Each 16 SCLKs.
Figure 4. TLV2544/TLV2548 FIFO Read Cycle (FS = 1)
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
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POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
write cycle (write CFR)
The write cycle is used to write to the configuration register CFR (with 12-bit register content). The write cycle
does not generate an EOC or INT, nor does it carry out any conversion (see power up and initialization
requirements).
ÏÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏÏ
ÏÏÏÏ
ÏÏÏÏ
ÏÏÏÏÏ
ÏÏÏÏÏ
ÏÏÏÏÏÏ
ÏÏÏÏÏÏ
SCLK
CS
FS
SDI
INT
EOC
SDO
ID14 ID13 ID12 ID15
ID11 ID10 ID9 ID4 ID3 ID2 ID1 ID0
12 345 67131415
16 1
12
ÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏ
ID15
Figure 5. TLV2544/TLV2548 Write Cycle (FS Active)
ÏÏÏÏÏÏÏÏ
ÏÏÏ
ÏÏÏÏ
ÏÏÏÏ
ÏÏÏÏÏÏ
ÏÏÏÏÏÏ
SCLK
CS
FS
SDI
INT
EOC
SDO
ID15 ID14 ID13 ID12 ID15
ID11 ID10 ID9 ID4 ID3 ID2 ID1 ID0
12 345 6 7131415
16 1
12
ÏÏÏÏÏ
ÏÏÏÏÏ
ÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏ
ID14
Figure 6. TLV2544/TLV2548 Write Cycle (FS = 1)
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
14 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
conversion cycles
DSP/normal sampling
ÏÏÏ
ÏÏÏ
SCLK
CS
FS
SDI
INT
EOC
SDO
ID15 ID14 ID13 ID12
12345 7
(SDOZ on SCLK16L Regardless
of Sampling Time)
t(sample) (12 or 24 SCLKs)
6
ÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏÏ
ID15
t(conv)
ÏÏÏÏÏÏ
ÏÏÏÏÏÏ
MSB MSB-1 MSB-2 MSB-3 MSB-4 MSB-5 MSB-6 LSB
tc (30 or 42 SCLKs)
16 − Short Sampling
28 − Long Sampling
30 − Short Sampling
42 − Long Sampling
MSB
12
(If CONV
CLK = SCLK0
Figure 7. Mode 00 Single Shot/Normal Sampling (FS Signal Used)
ÏÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏÏ
ÏÏÏÏ
ÏÏÏÏ
SCLK
CS
FS
SDI
INT
EOC
SDO
ID15 ID14 ID13 ID12
12345 7
(SDOZ on SCLK16L Regardless
of Sampling Time)
t(sample) (12 or 24 SCLKs)
6
ÏÏÏÏÏÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏÏÏÏÏÏ
ID15
t(conv)
ÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏ
MSB MSB-1 MSB-2 MSB-3 MSB-4 MSB-5 MSB-6 LSB
tc (30 or 42 SCLKs)
16 − Short Sampling
28 − Long Sampling
30 − Short Sampling
42 − Long Sampling
MSB
112 13
(If CONV
CLK = SCLK0
Figure 8. Mode 00 Single Shot/Normal Sampling (FS = 1, FS Signal not Used)
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
15
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
conversion cycles (continued)
ÏÏ
ÏÏ
ÏÏÏÏÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏÏÏÏÏ
ÏÏÏ
ÏÏÏ
CS
CSTART
SDI
INT
EOC
SDO Hi-Z
Select/Read
Cycle Select/Read
Cycle
t(sample )
t(conv) †
Previous Conversion
Result
Previous Conversion
Result
FS
Hi-Z Hi-Z
Device Going Into
Extended Sampling Mode
ÏÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏÏ
ÏÏÏÏ
Device Get Out
Extended Sampling
Mode
Read
Cycle
ÏÏÏÏÏÏ
ÏÏÏÏÏÏ
†
Normal
Cycle
†This is one of the single shot commands. Conversion starts on next rising edge of CSTART.
Figure 9. Mode 00 Single Shot/Extended Sampling (FS Signal Used, FS Pin Connected to TMS320 DSP)
modes using the FIFO: modes 01, 10, 11 timing
CS
CSTART
SDI
INT
SDO Hi-Z
From Channel 2
FS
†
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏÏÏ
ÏÏÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏÏÏ
ÏÏÏÏ
§‡‡‡‡ §
Hi-Z
Configure Select Conversion #1 Select
Conversion #4
Read FIFO #1 #2 #3 #4 Next #1
Top of FIFO
From Channel 2
¶ ¶ ¶
ÏÏ
ÏÏ
ÏÏÏ
ÏÏÏ
ÏÏÏ
ÏÏÏ
¶
ÏÏÏÏ
ÏÏÏÏ
†Command = Configure write for mode 01, FIFO threshold = 1/2
‡Command = Read FIFO, 1st FIFO read
§Command = Select ch2.
¶Use any channel select command to trigger SDI input.
Figure 10. TLV2544/TLV2548 Mode 01 DSP Serial Interface (Conversions Triggered by FS)
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
16 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
modes using the FIFO: modes 01, 10, 11 timing (continued)
CS
CSTART
SDI
INT
SDO Hi-Z
FS
(DSP)
Configure Select
Conversion #1 From Channel 2 Select
Conversion #4 From Channel 2
Read FIFO
First FIFO Read
ÏÏÏ
ÏÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏ
‡‡‡ ‡ §
#1 #2 #3 #4
ÏÏÏÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏÏÏÏ
ÏÏ
ÏÏ
†
ÏÏ
ÏÏ
§
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
t(sample)
Hi-Z
Sample Times ≥ MIN t(sample)
(See Operating Characteristics)
t(sample)
t(sample)
t(sample)
¶
†Command = Configure write for mode 01, FIFO threshold = 1/2
‡Command = Read FIFO, 1st FIFO read
§Command = Select ch2.
¶Minimum C S low time for select cycle is 6 SCLKs. The same amount of time is required between FS low to CSTART for proper channel decoding.
The low time of CSTART, not overlapped with CS low time, is the valid sampling time for the select cycle (see Figure 18).
Figure 11. TLV2544/TLV2548 Mode 01 µp/DSP Serial Interface (Conversions Triggered by CSTART)
CS
C
START
SDI
INT
SDO
From Channel 0
FS
(DSP)
From Channel 3
Configure
Conversion Conversion
Read FIFO #1 #2 #3 #4
Top of FIFO
‡
ÏÏÏÏ
ÏÏÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
‡
†
ÏÏÏ
ÏÏÏ
‡‡‡
Read FIFO #1
From Channel 0
Conversion From Channel 3
Conversion
Repeat
Second FIFO Read
Repeat
ÏÏÏ
ÏÏÏ
Ï
Ï
First FIFO Read
§ § § §
ÏÏ
ÏÏ
ÏÏÏ
ÏÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
§ § § §
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏÏ
ÏÏÏ
†Command = Configure write for mode 10 or 11, FIFO threshold = 1/2, sweep seq = 0−1−2−3.
‡Command = Read FIFO
§Use any channel select command to trigger SDI input.
Figure 12. TLV2544/TLV2548 Mode 10/11 DSP Serial Interface (Conversions Triggered by FS)
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
17
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
modes using the FIFO: modes 01, 10, 11 timing (continued)
CS
CSTART
SDI
INT
SDO
From Channel 0
FS
(DSP)
Configure
Conversion
Read FIFO #1 #2 #3 #4
Top of FIFO Read FIFO #1
From Channel 0
Conversion
Repeat
First FIFO Read Second FIFO Read
Repeat
‡
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
‡
†‡‡ ‡
ÏÏ
ÏÏ
From Channel 3
Conversion Conversion
From Channel 3
ÏÏÏÏÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏÏÏÏ
ÏÏÏÏÏÏÏÏÏÏÏ
ÏÏ
ÏÏ
t(sample)
t(sample) t(sample)t(sample)
†Command = Configure write for mode 10 or 11, FIFO threshold = 1/2, sweep seq = 0−1−2−3.
‡Command = Read FIFO
Figure 13. TLV2544/TLV2548 Mode 10/11 DSP Serial Interface (Conversions Triggered by CSTART)
CS
CSTART
SDI
INT
SDO
From Channel 0
Configure
Conversion
Conversion
Read FIFO #1 #2 #3 #4
Top of FIFO #1
Conversion Conversion
Repeat First FIFO Read Second FIFO Read
Repeat
‡
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
‡
†
ÏÏ
ÏÏ
‡‡‡
From Channel 3 From Channel 0 From Channel 3
Ï
Ï
Read FIFO
ÏÏÏ
ÏÏÏ
ÏÏ
ÏÏ
ÏÏÏ
ÏÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
ÏÏ
Ï
Ï
ÏÏÏ
ÏÏÏ
§§§ §§
§§§
†Command = Configure write for mode 10 or 11, FIFO threshold = 1/2, sweep seq = 0−1−2−3.
‡Command = Read FIFO
§Use any channel select command to trigger SDI input.
Figure 14. TLV2544/TLV2548 Mode 10/11 µp Serial Interface (Conversions Triggered by CS)
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
18 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
FIFO operation
76543210ADC
12-BIT×8
FIFO
OD
Serial
FIFO Full FIFO 3/4 Full
FIFO 1/2 FullFIFO 1/4 Full
FIFO Threshold Pointer
Figure 15. TLV2544/TLV2548 FIFO
The device has an 8-layer FIFO that can be programmed for different thresholds. An interrupt is sent to the host
after the preprogrammed threshold is reached. The FIFO can be used to store data from either a fixed channel
or a series of channels based on a preprogrammed sweep sequence. For example, an application may require
eight measurements from channel 3. In this case, the FIFO is filled with eight data sequentially taken from
channel 3. Another application may require data from channel 0, channel 2, channel 4, and channel 6 in an
orderly manner. Therefore, the threshold is set for 1/2 and the sweep sequence 0−2−4−6−0−2−4−6 is chosen.
An interrupt is sent to the host as soon as all four data are in the FIFO.
In single shot mode, the FIFO automatically uses a 1/8 FIFO depth. Therefore the CFR bits (D1,0) controlling
FIFO depth are don’t care.
SCLK and conversion speed
There are two ways to adjust the conversion speed.
DThe SCLK can be used as the source of the conversion clock.
The onboard OSC is approximately 4 MHz and 14 conversion clocks are required to complete a conversion.
(Corresponding 3.5 µs conversion time) The devices can operate with an SCLK up to 20 MHz for the supply
voltage range specified. When a more accurate conversion time is desired, the SCLK can be used as the
source of the conversion clock. The clock divider provides speed options appropriate for an application
where a high speed SCLK is used for faster I/O. The total conversion time is 14 ×(DIV/fSCLK) where DIV is 1,
2, or 4. For example a 20 MHz SCLK with the divide by 4 option produces a {14 × (4/20 M)} = 2.8 µs
conversion time. When an external serial clock (SCLK) is used as the source of the conversion clock, the
maximum equivalent conversion clock (fSCLK/DIV) should not exceed 6 MHz.
DAutopower down can be used. This mode is always on. If the device is not accessed (by CS or CSTART),
the converter is powered down to save power. The built-in reference is left on in order to quickly resume
operation within one half SCLK period. This provides unlimited choices to trade speed with power savings.
reference voltage
The device has a built-in reference with a programmable level of 2 V or 4 V. If the internal reference is used,
REFP i s set to 2 V or 4 V and REFM is set to 0 V. An external reference can also be used through two reference
input pins, REFP and REFM, if the reference source is programmed as external. The voltage levels applied to
these pins establish the upper and lower limits of the analog inputs to produce a full-scale and zero-scale
reading respectively. The values of REFP, REFM, and the analog input should not exceed the positive supply
or be lower than GND consistent with the specified absolute maximum ratings. The digital output is at full scale
when the input signal is equal to or higher than REFP and at zero when the input signal is equal to or lower than
REFM.
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
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reference block equivalent circuit
INT REF
Close = Int Ref Used
Open = Ext Ref Used
REFM
Sample Convert
~50 pF
CDAC
External to the Device
10 µF
Internal
Reference
Compensation
Cap
0.1 µF
Decoupling
Cap
REFP
NOTES: A. If internal reference is used, tie REFM to AGND and install a 10 µF (or 4.7 µF) internal reference compensation capacitor between
REFP and REFM to store the charge as shown in the figure above.
B. If external reference is used, the 10 µF (internal reference compensation) capacitor is optional. REFM can be connected to external
REFM or AGND.
C. Internal reference voltage drift, due to temperature variations, is approximately ±10 mV about the nominal 2 V (typically) from −10°C
to 100°C . The nominal value also varies approximately ±50 mV across devices.
D. Internal reference leakage during low ON time: Leakage resistance is on the order of 100 MΩ or more. This means the time constant
is about 1000 s with 10 µF compensation capacitance. Since the REF voltage does not vary much, the reference will come up quickly
after resuming from auto power down. At power up and power down the internal reference sees a glitch of about 500 µV when 2
V internal reference is used (1 mV when 4 V internal reference is used). This glitch settles out after about 50 µs.
power down
Writing 8000h to the device puts the device into a software power down state. For a hardware power-down, the
dedicated PWDN pin provides another way to power down the device asynchronously. These two power-down
modes power down the entire device including the built-in reference to save power. It requires 20 ms to resume
from either a software or hardware power down.
Auto power-down mode is always enabled. This mode maintains the built-in reference if an internal reference
is used so resumption is fast enough to be used between cycles.
The configuration register is not affected by any of the power down modes but the sweep operation sequence
has to be started over again. All FIFO contents are cleared by the power-down modes.
!
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20 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
absolute maximum ratings over operating free-air temperature (unless otherwise noted)†
Supply voltage range, GND to VCC −0.3 V to 6.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Analog input voltage range −0.3 V to VCC + 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Reference input voltage VCC + 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital input voltage range −0.3 V to VCC + 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating virtual junction temperature range, TJ −55°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA: TLV2544/48Q −40°C to 125°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
TLV2548M −55°C to 125°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, Tstg −65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
DISSIPATION RATING TABLE
PACKAGE
TA
≤
25
°
C
DERATING FACTOR
‡
TA = 70
°
C
TA = 85
°
C
TA = 125
°
C
PACKAGE
TA ≤ 25 C
POWER RATING
DERATING FACTOR
ABOVE TA = 25°C‡
TA = 70 C
POWER RATING
TA = 85 C
POWER RATING
TA = 125 C
POWER RATING
D1110 mW 8.9 mW/°C710 mW 577 mW 222 mW
DW 1294 mW 10.4 mW/°C 828 mW 673 mW 259 mW
FK 1375 mW 11.0 mW/°C880 mW 715 mW 275 mW
‡This is the inverse of the traditional junction-to-ambient thermal resistance (RΘJA). Thermal resistance is not production tested and the values
given are for informational purposes only.
!
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recommended operating conditions
MIN NOM MAX UNIT
Supply voltage, VCC 3 3.3 5.5 V
Analog input voltage (see Note 3) 0 VCC V
High level control input voltage, VIH 2.1 V
Low-level control input voltage, VIL 0.6 V
Setup time, tsu(CS-SCLK) CS falling edge before
SCLK rising edge (FS=1) or before SCLK falling
VCC = 4.5 V, SCLK = 20 MHz 20
ns
su(CS-SCLK)
SCLK rising edge (FS=1) or before SCLK falling
edge (when FS is active) VCC = 3 V, SCLK = 20 MHz 30
ns
Hold time, CS rising edge after SCLK rising edge
(FS=1) or after SCLK falling edge (when FS is
VCC = 4.5 V 10
ns
(FS=1) or after SCLK falling edge (when FS is
active), t
h(SCLK-CS)
VCC = 3 V 15
ns
Delay time, delay from CS falling edge to FS rising edge, td(CSL-FSH) 0.5 SCLKs
Delay time, delay time from 16th SCLK falling edge to CS rising edge (FS is active),
td(SCLK16L-CSH) 0.5 SCLKs
Setup time, FS rising edge before SCLK falling edge, tsu(FSH-SCLKL) 20 ns
Hold time, FS hold high after SCLK falling edge, th(FSH-SCLKL) 30 37 ns
Pulse width, CS high time, twH(CS) 100 ns
Pulse width, FS high time, twH(FS) 0.75 1 SCLKs
SCLK cycle time, VCC = 3 V to 3.6V, tc(SCLK) 67 10000 ns
SCLK cycle time, VCC = 4.5 V to 5.5V, tc(SCLK) 50 10000 ns
Pulse width, SCLK low time, twL(SCLK)
VCC = 4.5 V 22
ns
Pulse width, SCLK low time, t
wL(SCLK) VCC = 3 V 27
ns
Pulse width, SCLK high time, twH(SCLK)
VCC = 4.5 V 22
ns
Pulse width, SCLK high time, t
wH(SCLK) VCC = 3 V 27
ns
Setup time, SDI valid before falling edge of SCLK (FS is active) or the rising edge of
SCLK (FS=1), tsu(DI-SCLK) 25 ns
Hold time, SDI hold valid after falling edge of SCLK (FS is active) or the rising edge
of SCLK (FS=1), th(DI-SCLK) 5 ns
Delay time, delay from CS falling edge to SDO valid, td(CSL-DOV) 25 ns
Delay time, delay from FS falling edge to SDO valid, td(FSL-DOV) 25 ns
VCC = 5.5 V
SDO = 0 pF 0.5 SCLK
+ 5
Delay time, delay from SCLK falling edge (FS is
active) or SCLK rising edge (FS=1) to SDO valid,
V
CC
= 5.5 V
SDO = 60 pF 0.5 SCLK
+ 24
ns
active) or SCLK rising edge (FS=1) to SDO valid,
td(SCLK-DOV)
VCC = 3.3 V
SDO = 0 pF 0.5 SCLK
+ 12
ns
V
CC
= 3.3 V
SDO = 60 pF 0.5 SCLK
+ 33
Delay time, delay from CS rising edge to SDO 3-state, td(CSH-DOZ) 80 ns
Delay time, delay from 17th SCLK rising edge (FS is active) or the 16th falling edge
(FS=1) to EOC falling edge, td(SCLK-EOCL) 45 ns
Delay time, delay from 16th SCLK falling edge to INT falling edge (FS =1) or from the
17th rising edge SCLK to INT falling edge (when FS active), td(SCLK-INT)Min t(conv) µs
Delay time, delay from CS falling edge to INT rising edge, td(CSL-INTH) 50 ns
Delay time, delay from CS rising edge to CSTART falling edge, td(CSH-CSTARTL) 100 ns
Delay time, delay from CSTART rising edge to EOC falling edge, td(CSTARTH-EOCL) 50 ns
Pulse width, CSTART low time, twL(CSTART) Min t(sample) µs
NOTE 3: When binary output format is used, analog input voltages greater than that applied to REFP convert as all ones (111111111111), while
input voltages less than that applied to REFM convert as all zeros (000000000000). The device is functional with reference down to
1 V. (VREFP − VREFM − 1); however, the electrical specifications are no longer applicable.
!
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22 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
recommended operating conditions (continued)
MIN NOM MAX UNIT
Delay time, delay from CSTART rising edge to CSTART falling edge,
td(CSTARTH-CSTARTL) Max t(conv) µs
Delay time, delay from CSTART rising edge to INT falling edge, td(CSTARTH-INTL) Max t(conv) µs
Operating free-air temperature, TA
TLV2544Q/TLV2548Q −40 125
°C
Operating free-air temperature, TATLV2548M −55 125 °C
electrical characteristics over recommended operating free-air temperature range, VCC = VREFP =
3 V to 5.5 V, SCLK frequency = 20 MHz at 5 V, 15 MHz at 3 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP†MAX UNIT
VOH
High-level output voltage
VCC = 5.5 V, IOH = −0.2 mA at 30 pF load 2.4
V
VOH High-level output voltage VCC = 3 V, IOH = -20 µA at 30 pF load VCC−0.2 V
VOL
Low-level output voltage
VCC = 5.5 V, IOL = 0.8 mA at 30 pF load 0.4
V
VOL Low-level output voltage VCC = 3 V, IOL = 20 µA at 30 pF load 0.1 V
IOZ Off-state output current
(high-impedance-state) VO = VCC CS = VCC 1 2.5 µA
IOZ Off-state output current
(high-impedance-state) VO = 0 CS = VCC −2.5 −1 µA
IIH High-level input current VI = VCC 0.005 2.5 µA
IIL Low-level input current VI = 0 V −0.005 2.5 µA
CS at 0 V, Ext ref
VCC = 4.5 V to 5.5 V 2
mA
Operating supply current, normal
CS at 0 V, Ext ref
VCC = 3 V to 3.3 V 1 mA
Operating supply current, normal
sampling (short)
CS at 0 V, Int ref
VCC = 4.5 V to 5.5 V 2.4
mA
ICC
sampling (short)
CS at 0 V, Int ref
VCC = 3 V to 3.3 V 1.7 mA
ICC
CS at 0 V, Ext ref
VCC = 4.5 V to 5.5 V 1.1
mA
Operating supply current, extended
CS at 0 V, Ext ref
VCC = 3 V to 3.3 V 1 mA
Operating supply current, extended
sampling
CS at 0 V, Int ref
VCC = 4.5 V to 5.5 V 2.1
mA
sampling
CS at 0 V, Int ref
VCC = 3 V to 3.3 V 1.7 mA
Internal reference supply current
CS at 0 V, VCC = 4.5 V to 5.5 V 1
mA
Internal reference supply current VCC = 3 V to 3.3 V 0.7 mA
ICC(PD)
Power down supply current
for all digital inputs,
VCC = 4.5 V to 5.5 V, Ext clock 1
A
ICC(PD)
for all digital inputs,
0 ≤ VI ≤ 0.3 V or
VI ≥ VCC − 0.3 V, SCLK = 0 VCC = 3 V to 3.3 V, Ext clock 1 µA
ICC(AUTOPWDN)
Auto power-down current for all
digital inputs, 0 ≤ VI ≤ 0.3 V or
VCC = 4.5 V to 5.5 V, Ext clock, Ext ref 1‡
A
ICC(AUTOPWDN)
digital inputs, 0
≤
V
I
≤
0.3 V or
VI ≥ VCC − 0.3 V, SCLK = 0 VCC = 3 V to 3.3 V, Ext ref, Ext clock 1§µA
Selected channel leakage current
Selected channel at VCC 2.5
A
Selected channel leakage current Selected channel at 0 V 2.5 µA
Maximum EXT analog reference
current into REFP (use external
reference) VREFP = VCC = 5.5 V, VREFM = GND 20 µA
Ci
Input capacitance
Analog inputs 45 50
pF
CiInput capacitance Control Inputs 5 25 pF
Zi
Input MUX ON resistance
VCC = 4.5 V 500
Ω
ZiInput MUX ON resistance VCC = 3 V 600 Ω
†All typical values are at VCC = 5 V, TA = 25°C.
‡1.2 mA typical if internal reference is used, 165 µA typical if internal clock is used.
§0.8 mA typical if internal reference is used, 116 µA typical if internal clock is used.
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
23
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range, VCC = VREFP =
3 V to 5.5 V, SCLK frequency = 20 MHz at 5 V, 15 MHz at 3 V (unless otherwise noted) (continued)
ac specifications
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
SINAD Signal-to-noise ratio +distortion fI = 12 kHz at 200 KSPS 65 71 dB
THD
Total harmonic distortion
fI = 12 kHz at 200 KSPS
TA = −55°C −82 −73
dB
THD Total harmonic distortion fI = 12 kHz at 200 KSPS All other temperatures −82 −75 dB
ENOB Effective number of bits fI = 12 kHz at 200 KSPS 11.6 Bits
SFDR Spurious free dynamic range fI = 12 kHz at 200 KSPS −84 −75 dB
Analog input
Full power-bandwidth, −3 dB 1 MHz
Full-power bandwidth, −1 dB 500 kHz
reference specifications (0.1 µF and 10 µF between REFP and REFM pins)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Positive reference input voltage, REFP VCC = 3 V to 5.5 V 2 VCC V
Negative reference input voltage, REFM VCC = 3 V to 5.5 V 0 2 V
VCC = 5.5 V
CS = 1, SCLK = 0, (of f) 100 MΩ
Reference Input impedance
VCC = 5.5 V CS = 0, SCLK = 20 MHz (on) 20 25 kΩ
Reference Input impedance
VCC = 3 V
CS = 1, SCLK = 0 (of f) 100 MΩ
VCC = 3 V CS = 0, SCLK = 20 MHz (on) 20 25 kΩ
Reference Input voltage difference, REFP − REFM VCC = 3 V to 5.5 V 2 VCC V
VCC = 5.5 V VREF SELECT = 4 V 3.85 4 4.15 V
Internal reference voltage, REFP − REFM VCC = 5.5 V VREF SELECT = 2 V 1.925 2 2.075 V
Internal reference voltage, REFP − REFM
VCC = 3 V VREF SELECT = 2 V 1.925 2 2.075 V
Internal reference start-up time VCC = 5.5 V, 3 V with 10 µF compensation cap 20 ms
Internal reference temperature coefficient VCC = 3 V to 5.5 V 16 40†PPM/°C
†Not assured
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
24 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
operating characteristics over recommended operating free-air temperature range, VCC = VREFP
= 3 V to 5.5 V, SCLK frequency = 20 MHz (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP†MAX UNIT
ELIntegral linearity error (INL) (see Note 5) ±1.2 LSB
EDDifferential linearity error (DNL) See Note 4 ±1 LSB
Q Suffix ±2
EOOffset error (see Note 6) See Note 4 M Suffix, TA = 25°C
and 125°C−4 +6 LSB
M Suffix, TA = −55°C −4 +6.2
Q Suffix ±1.1 ±4
EFS Full scale error (see Note 6) See Note 4 M Suffix, TA = 25°C
and 125°C−4 ±1.1 +6 LSB
M Suffix, TA = −55°C −4 ±1.1 +7.6
Self-test output code (see Table 1 and
SDI = B000h 800h
(2048D)
Self-test output code (see Table 1 and
Note 7)
SDI = C000h 000h (0D)
Note 7)
SDI = D000h FFFh
(4095D)
Internal OSC OSC = 3 MHz to 6 MHz 3.2 4.65
t(conv) Conversion time External SCLK (14 DIV)
f
SCLK
µs
t(sample) Sampling time With a maximum of 1-kΩ input source
impedance 600 ns
†All typical values are at TA = 25°C.
NOTES: 4. Analog input voltages greater than that applied to REFP convert as all ones (111111111111), while input voltages less than that
applied to REFM convert as all zeros (000000000000).
5. Linear error is the maximum deviation from the best straight line through the A/D transfer characteristics.
6. Zero error is the difference between 000000000000 and the converted output for zero input voltage: full-scale error is the difference
between 111111111111 and the converted output for full-scale input voltage.
7. Both the input data and the output codes are expressed in positive logic.
77
777777
7777!7
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
•25
twL(SCLK)
ÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
Hi-Z
Hi-Z VO
H
VO
L
VIH
VIL
VIH
VIL
VIH
VIL
VO
H
VO
L
VO
H
VO
L
SCLK
SDI
SDO
EOC
INT
don’t care
td(SCLK-CSH)
tsu(DI-SCLK)
td(SCLK-EOCL)
td(SCLK-INTL)
tWH(FS)
ID1
don’t careOD10
ID0ID14
161521
ID15
OD11
td(SCLK-DOV) t(conv)
CS
ÎÎÎÎÎ
ÎÎÎÎÎ
ÎÎÎÎÎ
td(CSL-DOV)
td(FSL-DOV)
td(FSH-INTH)
ÎÎÎÎÎÎ
ÎÎÎÎÎÎ
ÎÎÎÎÎÎ
OD15
td(CSL-FSH)
tsu(FSH-SCLKL)
th(FSH-SCLKL)
twH(CS)
td(FSL-DOV)
tc(SCLK)
twH(SCLK) td(CSL-INTH)
FS
th(DI-SCLK)
Figure 16. Critical Timing (Normal Sampling, FS is Active)
PARAMETER MEASUREMENT INFORMATION
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
26 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
CS
CSTART
EOC
INT
VOH
VOL
VIH
VIL
VOH
VOL
VIH
VIL
td(CSH-CSTARTL)
twL(CSTART)
tc
td(CSTARTH-EOCL)
td(CSL-INTH)
td(CSTARTH-INTL)
SELECT CYCLE
†
†CSTART falling edge may come before the rising edge of CS but no sooner than the fifth SCLK of the SELECT CYCLE.
Figure 17. Critical Timing (Extended Sampling, Single Shot)
VIH
VIL
VOH
VOL
VOH
VOL
VIH
VIL
CS
CSTART
EOC
INT
td(CSH-CSTARTL)
twL(CSTART) td(CSTARTH−CSTARTL)
td(CSTARTH-EOCL) td(CSTARTH-INTL)
td(CSL-INTH)
SELECT CYCLE
†
†CSTART falling edge may come before the rising edge of CS but no sooner than the fifth SCLK of the SELECT CYCLE.
Figure 18. Critical Timing (Extended Sampling, Repeat/Sweep/Repeat Sweep)
77
777777
7777!7
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
•27
ÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
Hi-Z
Hi-Z VO
H
VO
L
VIH
VIL
VIH
VIL
VIH
VIL
VO
H
VO
L
VO
H
VO
L
CS
SCLK
SDI
SDO
ECO
INT
OD0
twH(CS)
twL(SCLK)
tc(SCLK)
tsu(DI-CLK)
td(CSL-DOV)
td(CLK-EOCL)
td(SCLK-INTL) td(CSL-INTH)
twH(SCLK)
ID1
OD1OD14
ID0ID14
161521
tsu(CS-CLK)
ID15
OD15
td(SCLK-DOV) t(conv)
td(SCLK16L-CSH)
Figure 19. Critical Timing (Normal Sampling, FS = 1)
PARAMETER MEASUREMENT INFORMATION
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
28 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
Figure 20
0.5
0.49
0.48
0.47
−40 25
INL − Integral Nonlinearity − LSB
0.51
0.52
INTEGRAL NONLINEARITY
vs
TEMPERATURE
0.53
85
TA − Temperature − °C
VCC = 2.7 V, Internal Reference = 2 V,
Internal Oscillator, Single Shot,
Short Sample, Mode 00 µP Mode
Figure 21
0.58
0.575
0.565
0.56
−40 25
0.59
0.595
0.6
85
0.585
0.57
INL − Integral Nonlinearity − LSB
INTEGRAL NONLINEARITY
vs
TEMPERATURE
TA − Temperature − °C
VCC = 5.5 V, Internal Reference = 2 V,
Internal Oscillator, Single Shot,
Short Sample, Mode 00 µP Mode
Figure 22
0.49
0.488
0.48
0.478
−40 25
DNL − Differential Nonlinearity − LSB
0.492
0.494
DIFFERENTIAL NONLINEARITY
vs
TEMPERATURE
0.496
85
0.486
0.484
0.482
TA − Temperature − °C
VCC = 2.7 V, Internal Reference = 2 V,
Internal Oscillator, Single Shot,
Short Sample, Mode 00 µP Mode
Figure 23
0.45
0.44
0.43
0.42
−40 25
0.46
0.47
0.48
85
DNL − Differential Nonlinearity − LSB
DIFFERENTIAL NONLINEARITY
vs
TEMPERATURE
TA − Temperature − °C
VCC = 5.5 V, Internal Reference = 2 V,
Internal Oscillator, Single Shot,
Short Sample, Mode 00 µP Mode
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
29
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
Figure 24
0.6
0.4
0.2
0
−40 25
Offset Error − LSB
0.8
1
OFFSET ERROR
vs
TEMPERATURE
1.2
85
TA − Temperature − °C
VCC = 5 V, Internal Reference = 4 V,
External Oscillator = SCLK/4,
Single Shot, Long Sample,
Mode 00 µP Mode
Figure 25
−1
−1.5
−2
−2.5
−40 25
Gain Error − LSB
−0.5
0
GAIN ERROR
vs
TEMPERATURE
0.5
85
TA − Temperature − °C
VCC = 5 V, Internal Reference = 4 V,
External Oscillator = SCLK/4,
Single Shot, Long Sample,
Mode 00 µP Mode
Figure 26
1
0.8
0.6
−40 25
Supply Current − mA
1.2
SUPPLY CURRENT
vs
TEMPERATURE
1.4
85
TA − Temperature − °C
Long Sample
Short Sample
VCC = 5 V, External Reference = 4 V,
Internal Oscillator, Single Shot,
Short Sample, Mode 00 µP Mode
Figure 27
−0.2
−0.6
−0.8
−1
−40 25
Powerdown Current −
0
0.2
POWER DOWN CURRENT
vs
TEMPERATURE
0.4
85
−0.4
Aµ
TA − Temperature − °C
VCC = 2.7 V
VCC = 5 V
VCC = 5.5 V
External Reference = 4 V, Internal Oscillator,
Single Shot, Short Sample, Mode 00 µP Mode
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
30 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
−1.0
−0.5
0.0
0.5
1.0
0 4097
INL − Integral Nonlinearity − LSB
Samples
INTEGRAL NONLINEARITY
vs
SAMPLES
VCC = 2.7 V, Internal Reference = 2 V, Internal Oscillator,
Single Shot, Short Sample, Mode 00 µP Mode
Figure 28
−1.0
−0.5
0.0
0.5
1.0
0 4097
DNL − Differential Nonlinearity − LSB
Samples
DIFFERENTIAL NONLINEARITY
vs
SAMPLES
VCC = 2.7 V, Internal Reference = 2 V, Internal Oscillator,
Single Shot, Short Sample, Mode 00 µP Mode
Figure 29
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
31
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
−1.0
−0.5
0.0
0.5
1.0
0 4097
INL − Integral Nonlinearity − LSB
Samples
INTEGRAL NONLINEARITY
vs
SAMPLES
VCC = 5 V, Internal Reference = 2 V, Internal Oscillator,
Single Shot, Short Sample, Mode 00 µP Mode
Figure 30
−1.0
−0.5
0.0
0.5
1.0
0 4097
DNL − Differential Nonlinearity − LSB
Samples
DIFFERENTIAL NONLINEARITY
vs
SAMPLES
VCC = 5 V, Internal Reference = 2 V, Internal Oscillator,
Single Shot, Short Sample, Mode 00 µP Mode
Figure 31
40
00102030405060
Magnitude − dB
110
120
f − Frequency − kHz
100%
160
70 80 90 100
150
140
130
100
90
80
70
60
50
30
20
10
5 152535455565758595
VCC = 5 V, External Reference = 4 V,
Internal Oscillator , Single Shot, Long Sample, Mode 00 µP
Mode @ 200 KSPS
Figure 32
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
32 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
Figure 33
60
55
45
40 1 250
SINAD − Signal-to-Noise + Distortion − dB
70
75
f − Frequency − kHz
SIGNAL-TO-NOISE + DISTORTION
vs
INPUT FREQUENCY
80
500
65
50 VCC = 5 V, External Reference = 4 V,
Internal Oscillator, Single Shot,
Long Sample, Mode 00 µP Mode
Figure 34
9.9
9.3
8.4
7.5 1 250
ENOB − Effective Number of Bits − BITS
10.5
11.7
f − Frequency − kHz
EFFECTIVE NUMBER OF BITS
vs
INPUT FREQUENCY
12
500
11.4
11.1
10.8
10.2
9.6
9
8.7
8.1
7.8
VCC = 5 V, External Reference = 4 V,
Internal Oscillator, Single Shot,
Long Sample, Mode 00 µP Mode
Figure 35
−75
−80
−85
−90 1
THD − Total Harmonic Distortion − dB
−70
−65
TOTAL HARMONIC DISTORTION
vs
INPUT FREQUENCY
−60
100
f − Frequency − kHz
VCC = 5 V, External Reference = 4 V,
Internal Oscillator, Single Shot,
Long Sample, Mode 00 µP Mode
50
Figure 36
−40
−60
−80
−100 150
Spurious Free Dynamic Range − dB
−20
f − Frequency − kHz
SPURIOUS FREE DYNAMIC RANGE
vs
INPUT FREQUENCY
0
100
VCC = 5 V, External Reference = 4 V,
Internal Oscillator, Single Shot,
Long Sample, Mode 00 µP Mode
!
SGLS119F − FEBRUARY 2002 − REVISED OCTOBER 2009
33
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PRINCIPLES OF OPERATION
GND
CS
XF
TMS320 DSP TLV2544/
TLV2548
SDI
SDO
SCLK
INT
TXD
RXD
CLKR
BIO
10 kΩ
vcc
AIN
VDD
FSR FS
CLKX
FSX
Figure 37. Typical Interface to a TMS320 DSP
PACKAGE OPTION ADDENDUM
www.ti.com 25-Sep-2013
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead/Ball Finish MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
5962-9957001Q2A ACTIVE LCCC FK 20 1 TBD POST-PLATE N / A for Pkg Type -55 to 125 5962-
9957001Q2A
TLV2548
MFKB
TLV2544QD ACTIVE SOIC D 16 40 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 125 TLV2544QD
TLV2544QDG4 ACTIVE SOIC D 16 40 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM V2544QD
TLV2544QDR ACTIVE SOIC D 16 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 125 TLV2544QD
TLV2544QDRG4 ACTIVE SOIC D 16 2500 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM V2544QD
TLV2548MFKB ACTIVE LCCC FK 20 1 TBD POST-PLATE N / A for Pkg Type -55 to 125 5962-
9957001Q2A
TLV2548
MFKB
TLV2548QDW ACTIVE SOIC DW 20 25 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 125 TLV2548QDW
TLV2548QDWG4 ACTIVE SOIC DW 20 25 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM TLV2548QDW
TLV2548QDWR ACTIVE SOIC DW 20 2000 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 125 TLV2548QDW
TLV2548QDWRG4 ACTIVE SOIC DW 20 2000 Green (RoHS
& no Sb/Br) CU NIPDAU Level-1-260C-UNLIM TLV2548QDW
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
PACKAGE OPTION ADDENDUM
www.ti.com 25-Sep-2013
Addendum-Page 2
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF TLV2548M :
•Catalog: TLV2548
•Enhanced Product: TLV2548-EP
NOTE: Qualified Version Definitions:
•Catalog - TI's standard catalog product
•Enhanced Product - Supports Defense, Aerospace and Medical Applications
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device Package
Type Package
Drawing Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0
(mm) B0
(mm) K0
(mm) P1
(mm) W
(mm) Pin1
Quadrant
TLV2544QDR SOIC D 16 2500 330.0 16.4 6.5 10.3 2.1 8.0 16.0 Q1
TLV2544QDRG4 SOIC D 16 2500 330.0 16.4 6.5 10.3 2.1 8.0 16.0 Q1
TLV2548QDWR SOIC DW 20 2000 330.0 24.4 10.8 13.3 2.7 12.0 24.0 Q1
PACKAGE MATERIALS INFORMATION
www.ti.com 14-Mar-2013
Pack Materials-Page 1
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
TLV2544QDR SOIC D 16 2500 367.0 367.0 38.0
TLV2544QDRG4 SOIC D 16 2500 367.0 367.0 38.0
TLV2548QDWR SOIC DW 20 2000 367.0 367.0 45.0
PACKAGE MATERIALS INFORMATION
www.ti.com 14-Mar-2013
Pack Materials-Page 2
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