intel 2708 8K (1K x 8) UV ERASABLE PROM Max. Power Max. Access 2708 800mW 450ns = 2708L 425mW 450ns 5 2708-1 8s00mw 350ns : 2708-6 s00mW 550ns w Low Power Dissipation 425 mW a Data Inputs and Outputs TTL Max. (2708L) Compatible during both Read and = Fast Access Time 350 ns Max. Program Modes (2708-1) ws Three-State Outputs OR-Tie mw Static No Clocks Required Capability The Intel 2708 is an 8192-bit ultraviolet light erasable and electrically reprogrammabte EPROM, ideally suited where fast turnaround and pattern experimentation are important requirements. All data inputs and outputs are TTL com- patible during both the read and program modes. The outputs are three-state, allowing direct interface with common system bus structures. The 2708L at 425mW is available for systems requiring lower power dissipation than from the 2708. A power dissipation savings of over 50% without any sacrifice in speed is obtained with the 2708L. The 2708L has high input noise immunity and is specified at 10% power supply tolerance. A high-speed 2708-1 is also available at 350ns for microprocessors requiring fast access times. The 2708 family is fabricated with the N-channel silicon gate FAMOS technology and is available in a 24-pin dual in-line package. PIN CONFIGURATION BLOCK DIAGRAM wt DATA OUTPUT ad 24) vec Oo-07 asLJz 23 {7} As as(]3 22[7) as asC6 21,7] Vea awe CHIP SELECT _ Lacic OUTPUT BUFFERS ass 29 FJ coe a2(6 2708 197] oo Ay Ay y aly 18 [_] program Ay DECODER Y GATING 3 (Lsa) Ag Js 17[7) 07 (mse) ADORESS (LSB) Op [Js 16 (7) 06 INPUTS | a, As o,f] 157) 05 As x 64x 128 7 R ROM ARRAY 02 q WY Do, a DECODE ves [7] 12 13] 03 PIN CONNECTION DURING READ OR PROGRAM PIN NAMES PIN NUMBER Ao-Ay | ADDRESS INPUTS ADDRESS 01-Gg_| DATA OUTPUTS/INPUTS DATA WO INPUTS @Siwe | CHIP SELECTWRITE ENABLE INPUT | 911 18, Vss_| PROGRAM | Vpp | CS/WE | Ves | Vee MODE 13-47 22,23 12 18 19 | 20 | 21 | 24 READ Dour Ain GNO| GND |+2| Ww | 5 | DESELECT | HIGH IMPEDANCE | DONTCARE | GND| GND | +12) Vm | 5 | 45 PROGRAM ! Ow Re Gno| PULSED ; +12 | Vw | 5 | +6 i zy 2:32708 FAMILY PROGRAMMING The programming specifications are described in the Data Catalog PROM/R Absolute Maximum Ratings* Temperature Under Bias... 6.2 ee ee ees -25C to +85C Storage Temperature 2... ees -65C to +125C Vop With Respect to Vgg..--- e+e ree +20V to -0.3V Vec and Vgs With Respect to Vag ..- 66-0 - eee ee +15V to -0.3V All Input or Output Voltages With Respect to Vgg During Read... 1 ee +15V to -0.3V CS/WE Input With Respect to Vgg During Programming ....-- 020-225 e rete +20V to -0.3V Program Input With Respect to Vgg .--- +e tee +35V to -0 3V Power Dissipation .. 0... ee ee 71.5W OM Programming Instructions Section. *COMMENT Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these-or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. DC. AND A.C.OPERATING CONDITIONS DURING READ 2708 2708-1 2708-6 2708L Temperature Range 0C-70C | 0C-70C | OC-70C | OC-70C Voc Power Supply 5V+5% 5V+5% 5V+5% 5V+10% Vpp Power Supply 12V45% 12V+5% 12V+5% 12V+10% Vpp Power Supply -5V+5% -5V+5% ~5V+5% | -5V+10% READ OPERATION D.C. AND OPERATING CHARACTERISTICS 2708, 2708-1, 2708-6 Limits 2708L Limits Symbol Parameter Units Test Conditions Min. Typ.@l) Max. | Min. Typ/2] Max. lo Address and Chip Setect input Sink 1 10 1 10 uA [Vin =5.25V oF Vin = Vit Current lLo Output Leakage Current 1 10 1 10 wA |VouT=5-5V, CS/IWE = 5V Ipp{3) Vop Supply Current 50 65 21 28 mA |Worst Case Supply Currents!4] Ioc [3] Voc Supply Current 6 10 2 4 mA {All Inputs High; Ipall Vea Supply Current 30 45 10 14 mA |CSWE=5V; Ta =0C Vit Input Low Voltage Vss 0,65 Vss 0.65 Vi Input High Voltage 03.0 \ Voot! #22) Veott] = tl 7 ' 6) VoL Output Low Voltage 0.45 04 y [lous 1-8mA (2708, 2706-1, 27086) lo. = 2mA (2708L) VoH1 Output High Voltage 3.7 3.7 Vo flow = 100pA Von2 Output High Voltage 2.4 2.4 lon = ~tmA Ty = 76C PD Power Dissipation 800 326 mW_|Ta= 76 425 | mW |T,=0C NOTES: 1. Vgp must be applied prior to Veg and Vpp- Vpp Must also be the last power supply switched off. Le) . Typical values are for Ta = 25C and nominal supply voltages. The total power dissipation is not calc tages since current paths exist between the various power supplies and Vgg. Th mine power supply capacity only. Ipg for the 2708L is specified in the e Fd ulated by summing the various currents (lpp. !cc. and Iga) multiplied by their respective vol- @ Ipp, icc, and Igg currents should be used to deter- programmed state and is 48mA maximum in the unprogrammed state.2708 FAMILY 2708L 2708, 2708-1, AND 2708-6 RANGE OF SUPPLY CURRENTS RANGE OF SUPPLY CURRENTS VS. TEMPERATURE VS. TEMPERATURE ACCESS TIME VS. TEMPERATURE * | Vor = 55V ALL POSSIBLE OPERATING = } ] Sue yoor aev CONDITIONS: 525v 1 TTL LOAD + 100pF - PITTI Han fain Yop + 124 100+ | Wr te . p35 ESE = Low LJ - 2 300 : : | : 2 A 2 Se = my a i a 7 >4 > i E AO \\ nN 200 | : SY \} | 8 5 t 100 Ra eeepc i ee . l 6 20 40 ao a 00 -20 20 0 60 30 Tate) me A.C. CHARACTERISTICS 2708, 2708L Limits 2708-1 Limits 2708-6 Limits Symbol Parameter 2 ymno ara Min. | Max. Min. | Max. | Min. | Max. | Units tacc Address to Output Delay 450 350 550 ns tco Chip Select to Output Delay 120 120 160 ns tor Chip Deselect to Output Float 0 120 0 120 0 160 ns tow Address to Output Hold 0 0 0 ns CAPACITANCE it Ta = 25C, f=1MHz A.C, TEST CONDITIONS: Output Load: 1 TTL gate and C; = 100 pF Symbol Parameter Typ. | Max. | Unit. | Conditions Input Rise and Fail Times: <20 ns 7 _ Timing Measurement Reference Levels: 0.8V and Cin Input Capacitance 4 6 pF Vin = OV 2.8V for inputs; 0.8V and 2.4V for outputs. Cout Output Capacitance | 8 12 pF Vout =0V Input Pulse Levels: 0.65V to 3.0V NOTE: 1. This parameter is periodicatly sampled and is not 100% tested.A.C. WAVEFORMS ! ss oe ADDRESSES ADDRESSES end, a CS/WE a 2 5 tco 13) tor (4) tacc G1 mH eek, & TILULLLLL. " s HIGH Z HIGH OUTPUT WA VALID OUTPUT gunz x 44 Z T rT NOTES: 2. ALL TIMES SHOWN IN PARENTHESES ARE MINIMUM AND ARE NSEG UNLESS OTHERWISE SPECIFIED. 3. GS MAY BE DELAYED UP TO tacc-tco AFTER ADDRESSES ARE VALID WITHOUT IMPACT ON ta 4. tpF iS SPECIFIED FROM FIRST. ERASURE CHARACTERISTICS The erasure characteristics of the 2708 family are such that erasure begins to occur when exposed to light with wave- lengths shorter than approximately 4000 Angstroms (A). It should be noted that suntight and certain types of fluores- cent lamps have wavelengths in the 30004000A range. Data show that constant exposure to room level fluores- cent lighting could erase the typical device in approxi- mately 3 years, while it would take approximately 1 week to cause erasure when exposed to direct sunlight. If the 2708 is to be exposed to these types of lighting conditions for extended periods of time, opaque labels are available from Intel which should be placed over the 2708 window to prevent unintentional erasure. 8or ADDRESS CHANGE, WHICHEVER OCCURS procedure (see Data Catalog PROM/ROM Programming Instructions Section} for the 2708 family is exposure to shortwave ultraviolet light which has a wavelength of 2537 Angstroms (A). The inte- grated dose (i.e., UV intensity X exposure time} for erasure should be a minimum of 15 W-sec/em2, The erasure time with this dosage is approximately 15 to 20 minutes using an ultraviolet lamp with a 12000 pW/em? power rating. The device should be placed within 1 inch of the lamp tubes during erasure. Some lamps have a filter on their tubes which should be removed before erasure. The recommended erasure 2-6